HUE038881T2 - Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére - Google Patents

Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére

Info

Publication number
HUE038881T2
HUE038881T2 HUE11728326A HUE11728326A HUE038881T2 HU E038881 T2 HUE038881 T2 HU E038881T2 HU E11728326 A HUE11728326 A HU E11728326A HU E11728326 A HUE11728326 A HU E11728326A HU E038881 T2 HUE038881 T2 HU E038881T2
Authority
HU
Hungary
Prior art keywords
thickness
coating layer
continuously measuring
running strip
strip
Prior art date
Application number
HUE11728326A
Other languages
English (en)
Inventor
Pierre Gauje
Original Assignee
Arcelormittal
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arcelormittal filed Critical Arcelormittal
Publication of HUE038881T2 publication Critical patent/HUE038881T2/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Coating With Molten Metal (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
HUE11728326A 2010-05-31 2011-05-30 Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére HUE038881T2 (hu)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/FR2010/051046 WO2011151530A1 (fr) 2010-05-31 2010-05-31 Procede et dispositif de mesure de l'epaisseur d'une couche de revetement sur une bande en defilement

Publications (1)

Publication Number Publication Date
HUE038881T2 true HUE038881T2 (hu) 2018-12-28

Family

ID=42983645

Family Applications (1)

Application Number Title Priority Date Filing Date
HUE11728326A HUE038881T2 (hu) 2010-05-31 2011-05-30 Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére

Country Status (10)

Country Link
US (1) US10203194B2 (hu)
EP (1) EP2577226B1 (hu)
JP (2) JP6212388B2 (hu)
KR (1) KR101890439B1 (hu)
CN (1) CN103080695B (hu)
BR (1) BR112012030475B1 (hu)
ES (1) ES2666211T3 (hu)
HU (1) HUE038881T2 (hu)
PL (1) PL2577226T3 (hu)
WO (2) WO2011151530A1 (hu)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10234261B2 (en) * 2013-06-12 2019-03-19 Applied Materials, Inc. Fast and continuous eddy-current metrology of a conductive film
CN104677852A (zh) * 2013-11-27 2015-06-03 上海宝钢工业技术服务有限公司 带钢氧化镁涂层质量在线检测***
CN104266619B (zh) * 2014-09-12 2017-05-17 首钢总公司 一种测定热镀锌钢板表面锌渣位置及密度分布的方法
CN104502446B (zh) * 2014-11-27 2018-10-16 北京华清燃气轮机与煤气化联合循环工程技术有限公司 基于无损检测技术预测高温合金涂层服役状况的方法
USD766930S1 (en) 2014-12-31 2016-09-20 Samsung Electronics Co., Ltd. Display screen or portion thereof with animated graphical user interface
ITUB20153041A1 (it) * 2015-08-10 2017-02-10 Danieli Automation Spa Dispositivo per la misura a caldo, durante la laminazione, di una dimensione di profili metallici
CN105506548B (zh) * 2016-03-01 2018-05-25 京东方科技集团股份有限公司 一种掩膜板修复装置、修复方法及蒸镀***
US10641842B2 (en) * 2017-05-26 2020-05-05 Allegro Microsystems, Llc Targets for coil actuated position sensors
CN107504925A (zh) * 2017-09-30 2017-12-22 江苏瑞腾涂装科技有限公司 一种管道内壁涂层厚度及其光滑度检测***
JPWO2019102578A1 (ja) * 2017-11-24 2020-11-19 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 金属板の形状計測装置、板反り矯正装置及び連続めっき処理設備並びに金属板の板反り矯正方法
EP3731736B1 (en) * 2017-12-26 2022-07-13 Robert Bosch GmbH System and method for detecting a thickness of a layer
CN108680127B (zh) * 2018-05-21 2020-11-27 北京核夕菁科技有限公司 镀层测量方法和装置
CN109084719A (zh) * 2018-08-24 2018-12-25 南通亿能彩钢板有限公司 一种彩钢板涂层厚度在线检测***及其使用方法
DE102018122391A1 (de) * 2018-09-13 2020-03-19 Sikora Ag Vorrichtung und Verfahren zum Detektieren eines Gegenstandes
CN109580722B (zh) * 2018-12-25 2021-07-06 国网陕西省电力公司电力科学研究院 一种基于交流导纳法的接地网腐蚀监测方法和装置
KR20220038451A (ko) * 2019-08-29 2022-03-28 아르셀러미탈 에지 빌드-업 측정
CN110823151B (zh) * 2019-10-15 2021-05-28 武汉船用机械有限责任公司 水下拉绳传感器的测试工装

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU582340B2 (en) * 1981-08-13 1989-03-23 John Lysaght (Australia) Limited Coating thickness gauge
JPS599552A (ja) 1982-07-08 1984-01-18 Sumitomo Metal Ind Ltd 電磁誘導試験装置
US4641092A (en) 1982-07-08 1987-02-03 Sumitomo Metal Industries, Ltd. Rotary probe apparatus for detecting flaws in a test object
NZ205098A (en) * 1982-08-06 1997-01-29 Australian Wire Ind Pty Wire, conductive coating on magnetic substrate: thickness determination
FR2572175A1 (fr) 1984-10-24 1986-04-25 Stein Heurtey Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur
JPS61120961A (ja) * 1984-11-19 1986-06-09 Teijin Ltd 導電性フイルムの検査装置
CA2043347A1 (en) * 1990-05-30 1991-12-01 Yukio Kohmura Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system
DE4119903C5 (de) * 1991-06-17 2005-06-30 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Verfahren und Vorrichtung zur Messung dünner Schichten
DE4128882C2 (de) * 1991-08-30 1994-07-14 Nix Steingroeve Elektro Physik Rollsonde für die kontinuierliche Messung der Dicke von Schichten oder Bändern
DE69425023T2 (de) * 1993-05-07 2001-02-22 Nordson Corp Pulverbeschichtungssystem und Pulverbeschichtungsdicke-Sensor
JPH0732510U (ja) 1993-11-16 1995-06-16 功 山邊 巻取式距離検出器
FR2752294B1 (fr) * 1996-08-12 1998-11-27 Lorraine Laminage Procede et dispositif de mesure en continu d'epaisseur de revetement isolant
AU1405199A (en) * 1997-11-14 1999-06-07 Jentek Sensors, Inc. Multiple frequency quantitative coating characterization
JP2000227422A (ja) 1999-02-08 2000-08-15 Nkk Corp 渦流探傷法
US6366083B1 (en) * 1999-09-17 2002-04-02 Framatome Anp Inc. Method for measuring the thickness of oxide layer underlying crud layer containing ferromagnetic material on nuclear fuel rods
JP4874465B2 (ja) * 2000-03-28 2012-02-15 株式会社東芝 渦電流損失測定センサ
TWI241398B (en) * 2000-03-28 2005-10-11 Toshiba Corp Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium
JP2001318080A (ja) * 2000-05-09 2001-11-16 Kaisei Engineer Kk 検出コイルとこの検出コイルを用いた検査装置
US6950196B2 (en) * 2000-09-20 2005-09-27 Kla-Tencor Technologies Corp. Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen
US6802946B2 (en) 2000-12-21 2004-10-12 Nutool Inc. Apparatus for controlling thickness uniformity of electroplated and electroetched layers
JP3587822B2 (ja) 2001-07-23 2004-11-10 株式会社荏原製作所 渦電流センサ
US20040050323A1 (en) * 2001-08-24 2004-03-18 Hong-Kook Chae Apparatus for controlling coating weight on strip in continuous galvanizing process
JP4812203B2 (ja) 2001-09-25 2011-11-09 トヨタ自動車株式会社 アレイ型センサ
JP2004334977A (ja) 2003-05-07 2004-11-25 Sony Corp 原盤露光装置および光学系衝突回避露光方法
JP4617677B2 (ja) 2004-02-04 2011-01-26 Ｊｆｅスチール株式会社 層厚測定方法、システム及び層厚測定方法のプログラム
JP4598425B2 (ja) 2004-03-30 2010-12-15 新日本製鐵株式会社 渦流式センサの補正方法、溶融メッキの目付け量制御装置及び制御方法
DE102004034081A1 (de) * 2004-07-15 2006-02-09 Robert Bosch Gmbh Verfahren zur berührungsfreien Bestimmung einer Dicke einer Schicht aus elektrisch leitendem Material
US7877888B2 (en) * 2007-10-25 2011-02-01 General Electric Company System and method for measuring installation dimensions for flow measurement system
JP5200513B2 (ja) 2007-11-30 2013-06-05 新日鐵住金株式会社 溶接部の非破壊検査装置、及び溶接部の非破壊検査方法
JP5615831B2 (ja) 2008-11-14 2014-10-29 アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ 縁部分解能強化渦電流センサ

Also Published As

Publication number Publication date
BR112012030475A2 (pt) 2016-08-09
JP6212388B2 (ja) 2017-10-11
WO2011151585A2 (fr) 2011-12-08
ES2666211T3 (es) 2018-05-03
PL2577226T3 (pl) 2018-08-31
CN103080695A (zh) 2013-05-01
WO2011151585A3 (fr) 2012-03-29
BR112012030475B1 (pt) 2020-02-04
KR101890439B1 (ko) 2018-08-21
EP2577226A2 (fr) 2013-04-10
EP2577226B1 (fr) 2018-02-21
CN103080695B (zh) 2016-08-03
US20130133575A1 (en) 2013-05-30
US10203194B2 (en) 2019-02-12
JP2013527466A (ja) 2013-06-27
JP2016106217A (ja) 2016-06-16
WO2011151530A1 (fr) 2011-12-08
KR20140008997A (ko) 2014-01-22

Similar Documents

Publication Publication Date Title
HUE038881T2 (hu) Eljárás és eszköz egy futószalagon lévõ bevonóréteg vastagságának folyamatos mérésére
EP2530183A4 (en) DEVICE FOR PRODUCING A THIN LAYER, METHOD FOR PRODUCING A THIN LAYER AND SUBSTRATE CONVEYING ROLLERS
TWI562395B (en) Method of forming nanostructures on a substrate and use of the same
HK1158740A1 (zh) 用於探詢碳層厚度的方法和系統
PL3036352T3 (pl) Sposób otrzymywania podłoża wyposażonego w powłokę zawierającą cienką nieciągłą warstwę metaliczną
PL2440503T3 (pl) Sposób osadzania cienkiej powłoki i powstały produkt
IL215159A0 (en) Thin film coating and method of making the same
EP2537886A4 (en) COATING LAYER FOR ANTIREFLECTION FILM AND ANTIREFLECTION FILM COMPRISING THE SAME
EP2772723A4 (en) METHOD FOR MEASURING A FILM THICKNESS
EP2503282A4 (en) METHOD FOR CONTINUOUSLY MEASURING ACHOME COATING THICKNESS ON STEEL STRIP SURFACE
EP2554977A4 (en) SURFACE DETECTING METHOD FOR STEEL PLATE WITH RESIN COATING FILM AND SURFACE DETECTING DEVICE THEREOF
EP2544220A4 (en) SEMICONDUCTOR SUBSTRATE, PRODUCTION METHOD FOR THE SINGLE CRYSTAL SUBSTRATE, PRODUCTION PROCESS FOR A SINGLE CRYSTAL SUBSTRATE WITH A MULTILAYER FILM AND DEVICE MANUFACTURING METHOD
EP2629051A4 (en) THICKNESS MEASURING DEVICE AND MEASURING METHOD THEREFOR
SG11201403231TA (en) Device and method for the coating of a surface area of a gap in the coating of a pipeline
EP2762240A4 (en) METHOD FOR PRODUCING A COATING FILM AND COATED SUBJECT
PL2540910T3 (pl) Sposób wytwarzania i urządzenie do wytwarzania papieru powlekanego
EP2419697A4 (en) System and method of measuring the thickness of a layer of coating
EP2698597A4 (en) FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
GB201111918D0 (en) Device and method for the production of a metallic strip
IL209811A0 (en) Hard coating layer and method for forming the same
EP2711177A4 (en) COATING LAYER AND METHOD FOR FORMING COATING LAYER
EP2590860A4 (en) Device and method for measuring ice thickness
EP2792764A4 (en) ALUMINUM-BASED PLATED STEEL SHEET MATERIAL AND PROCESS FOR PRODUCING THE SAME
GB201012902D0 (en) Sensor coating layer, device and method
EP3062094A4 (en) On-line plating adhesion determination device for galvannealed steel sheet and galvannealed steel sheet production line