ATE540287T1 - Verfahren zum messen der exzentrizitätsmenge - Google Patents
Verfahren zum messen der exzentrizitätsmengeInfo
- Publication number
- ATE540287T1 ATE540287T1 AT10157604T AT10157604T ATE540287T1 AT E540287 T1 ATE540287 T1 AT E540287T1 AT 10157604 T AT10157604 T AT 10157604T AT 10157604 T AT10157604 T AT 10157604T AT E540287 T1 ATE540287 T1 AT E540287T1
- Authority
- AT
- Austria
- Prior art keywords
- indicator
- specified
- maximum peak
- eccentricity
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009080213A JP2010230578A (ja) | 2009-03-27 | 2009-03-27 | 偏芯量測定方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE540287T1 true ATE540287T1 (de) | 2012-01-15 |
Family
ID=42270596
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT10157604T ATE540287T1 (de) | 2009-03-27 | 2010-03-24 | Verfahren zum messen der exzentrizitätsmenge |
Country Status (4)
Country | Link |
---|---|
US (1) | US7792366B1 (de) |
EP (1) | EP2233884B1 (de) |
JP (1) | JP2010230578A (de) |
AT (1) | ATE540287T1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2481476B (en) * | 2010-11-29 | 2012-07-04 | Ophir Optronics Ltd | Centring method for optical elements |
DE102014208636B4 (de) * | 2014-05-08 | 2018-06-28 | Asphericon Gmbh | Verfahren und Vorrichtung zur Messung einer Dezentrierung und Verkippung von Flächen eines optischen Elements |
PL3037800T3 (pl) * | 2014-12-24 | 2018-11-30 | Trioptics Gmbh | Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego |
CN109668528A (zh) * | 2018-12-29 | 2019-04-23 | 武汉重型机床集团有限公司 | 一种超长床身直线度检测方法 |
JP6581325B1 (ja) * | 2019-06-12 | 2019-09-25 | 株式会社アサヒビジョン | レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体。 |
WO2021059355A1 (ja) * | 2019-09-24 | 2021-04-01 | 株式会社レクザム | レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4038727A1 (de) * | 1990-12-05 | 1992-06-11 | Ilmenau Tech Hochschule | Anordnung zur justierung von linsen |
DE69332042T2 (de) * | 1992-12-18 | 2003-01-02 | Koninklijke Philips Electronics N.V., Eindhoven | Ortungszurückstellung von relativ elastisch verformten räumlichen Bildern durch übereinstimmende Flächen |
WO1998020454A1 (fr) * | 1996-11-01 | 1998-05-14 | Yamatake Corporation | Appareil d'extraction de structure |
JPH11144054A (ja) * | 1997-11-06 | 1999-05-28 | Fuji Xerox Co Ltd | 画像認識方法および画像認識装置ならびに記録媒体 |
JP3019086B1 (ja) * | 1998-11-09 | 2000-03-13 | 富士ゼロックス株式会社 | 画像処理装置および画像処理方法、画像形成装置 |
US6806899B1 (en) * | 1999-07-17 | 2004-10-19 | David F. Schaack | Focusing systems for perspective dimensional measurements and optical metrology |
JP4549468B2 (ja) * | 1999-12-28 | 2010-09-22 | 株式会社トプコン | レンズメータ |
JP3893829B2 (ja) * | 2000-01-14 | 2007-03-14 | 富士ゼロックス株式会社 | 画像処理装置および画像処理方法ならびに画像形成装置 |
US6507713B2 (en) * | 2000-03-27 | 2003-01-14 | Ricoh Company, Ltd. | Image-formation apparatus, controlling method thereof and image-formation method |
JP2002107309A (ja) * | 2000-09-28 | 2002-04-10 | Toshiba Corp | 欠陥検査装置及び欠陥検査方法 |
US6951392B2 (en) * | 2003-07-09 | 2005-10-04 | 3M Innovative Properties Company | Lens having at least one lens centration mark and methods of making and using same |
JP4774332B2 (ja) * | 2006-06-06 | 2011-09-14 | 富士フイルム株式会社 | 偏芯量測定方法 |
JP4943946B2 (ja) * | 2007-06-04 | 2012-05-30 | 富士フイルム株式会社 | 偏芯量測定装置 |
-
2009
- 2009-03-27 JP JP2009080213A patent/JP2010230578A/ja not_active Ceased
-
2010
- 2010-03-24 EP EP10157604A patent/EP2233884B1/de not_active Not-in-force
- 2010-03-24 AT AT10157604T patent/ATE540287T1/de active
- 2010-03-26 US US12/732,836 patent/US7792366B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US7792366B1 (en) | 2010-09-07 |
US20100245804A1 (en) | 2010-09-30 |
JP2010230578A (ja) | 2010-10-14 |
EP2233884B1 (de) | 2012-01-04 |
EP2233884A1 (de) | 2010-09-29 |
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