ATE540287T1 - Verfahren zum messen der exzentrizitätsmenge - Google Patents

Verfahren zum messen der exzentrizitätsmenge

Info

Publication number
ATE540287T1
ATE540287T1 AT10157604T AT10157604T ATE540287T1 AT E540287 T1 ATE540287 T1 AT E540287T1 AT 10157604 T AT10157604 T AT 10157604T AT 10157604 T AT10157604 T AT 10157604T AT E540287 T1 ATE540287 T1 AT E540287T1
Authority
AT
Austria
Prior art keywords
indicator
specified
maximum peak
eccentricity
measuring
Prior art date
Application number
AT10157604T
Other languages
English (en)
Inventor
Zongtao Ge
Kenichi Takahashi
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Application granted granted Critical
Publication of ATE540287T1 publication Critical patent/ATE540287T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
AT10157604T 2009-03-27 2010-03-24 Verfahren zum messen der exzentrizitätsmenge ATE540287T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009080213A JP2010230578A (ja) 2009-03-27 2009-03-27 偏芯量測定方法

Publications (1)

Publication Number Publication Date
ATE540287T1 true ATE540287T1 (de) 2012-01-15

Family

ID=42270596

Family Applications (1)

Application Number Title Priority Date Filing Date
AT10157604T ATE540287T1 (de) 2009-03-27 2010-03-24 Verfahren zum messen der exzentrizitätsmenge

Country Status (4)

Country Link
US (1) US7792366B1 (de)
EP (1) EP2233884B1 (de)
JP (1) JP2010230578A (de)
AT (1) ATE540287T1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2481476B (en) * 2010-11-29 2012-07-04 Ophir Optronics Ltd Centring method for optical elements
DE102014208636B4 (de) * 2014-05-08 2018-06-28 Asphericon Gmbh Verfahren und Vorrichtung zur Messung einer Dezentrierung und Verkippung von Flächen eines optischen Elements
PL3037800T3 (pl) * 2014-12-24 2018-11-30 Trioptics Gmbh Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego
CN109668528A (zh) * 2018-12-29 2019-04-23 武汉重型机床集团有限公司 一种超长床身直线度检测方法
JP6581325B1 (ja) * 2019-06-12 2019-09-25 株式会社アサヒビジョン レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体。
WO2021059355A1 (ja) * 2019-09-24 2021-04-01 株式会社レクザム レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4038727A1 (de) * 1990-12-05 1992-06-11 Ilmenau Tech Hochschule Anordnung zur justierung von linsen
DE69332042T2 (de) * 1992-12-18 2003-01-02 Koninklijke Philips Electronics N.V., Eindhoven Ortungszurückstellung von relativ elastisch verformten räumlichen Bildern durch übereinstimmende Flächen
WO1998020454A1 (fr) * 1996-11-01 1998-05-14 Yamatake Corporation Appareil d'extraction de structure
JPH11144054A (ja) * 1997-11-06 1999-05-28 Fuji Xerox Co Ltd 画像認識方法および画像認識装置ならびに記録媒体
JP3019086B1 (ja) * 1998-11-09 2000-03-13 富士ゼロックス株式会社 画像処理装置および画像処理方法、画像形成装置
US6806899B1 (en) * 1999-07-17 2004-10-19 David F. Schaack Focusing systems for perspective dimensional measurements and optical metrology
JP4549468B2 (ja) * 1999-12-28 2010-09-22 株式会社トプコン レンズメータ
JP3893829B2 (ja) * 2000-01-14 2007-03-14 富士ゼロックス株式会社 画像処理装置および画像処理方法ならびに画像形成装置
US6507713B2 (en) * 2000-03-27 2003-01-14 Ricoh Company, Ltd. Image-formation apparatus, controlling method thereof and image-formation method
JP2002107309A (ja) * 2000-09-28 2002-04-10 Toshiba Corp 欠陥検査装置及び欠陥検査方法
US6951392B2 (en) * 2003-07-09 2005-10-04 3M Innovative Properties Company Lens having at least one lens centration mark and methods of making and using same
JP4774332B2 (ja) * 2006-06-06 2011-09-14 富士フイルム株式会社 偏芯量測定方法
JP4943946B2 (ja) * 2007-06-04 2012-05-30 富士フイルム株式会社 偏芯量測定装置

Also Published As

Publication number Publication date
US7792366B1 (en) 2010-09-07
US20100245804A1 (en) 2010-09-30
JP2010230578A (ja) 2010-10-14
EP2233884B1 (de) 2012-01-04
EP2233884A1 (de) 2010-09-29

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