FI20116329A - Mittauskohteen mittaus - Google Patents

Mittauskohteen mittaus Download PDF

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Publication number
FI20116329A
FI20116329A FI20116329A FI20116329A FI20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A
Authority
FI
Finland
Prior art keywords
sensor
measured
row
sensor row
measurement
Prior art date
Application number
FI20116329A
Other languages
English (en)
Swedish (sv)
Other versions
FI125119B (fi
Inventor
Markku Maentylae
Jussi Graeffe
Karri Niemelae
Heimo Keraenen
Pekka Suopajaervi
Lauri Kurki
Original Assignee
Metso Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metso Automation Oy filed Critical Metso Automation Oy
Priority to FI20116329A priority Critical patent/FI125119B/fi
Priority to PCT/FI2012/051293 priority patent/WO2013098482A1/en
Priority to US14/368,882 priority patent/US20150008346A1/en
Priority to CN201280070883.2A priority patent/CN104136884B/zh
Priority to CA 2861690 priority patent/CA2861690A1/en
Priority to EP12861226.4A priority patent/EP2805130B1/en
Publication of FI20116329A publication Critical patent/FI20116329A/fi
Application granted granted Critical
Publication of FI125119B publication Critical patent/FI125119B/fi

Links

Classifications

    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21B—FIBROUS RAW MATERIALS OR THEIR MECHANICAL TREATMENT
    • D21B1/00—Fibrous raw materials or their mechanical treatment
    • D21B1/04—Fibrous raw materials or their mechanical treatment by dividing raw materials into small particles, e.g. fibres
    • D21B1/12—Fibrous raw materials or their mechanical treatment by dividing raw materials into small particles, e.g. fibres by wet methods, by the use of steam
    • D21B1/30—Defibrating by other means
    • D21B1/32—Defibrating by other means of waste paper
    • D21B1/325—Defibrating by other means of waste paper de-inking devices
    • D21B1/327—Defibrating by other means of waste paper de-inking devices using flotation devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
    • D21F7/00—Other details of machines for making continuous webs of paper
    • D21F7/06—Indicating or regulating the thickness of the layer; Signal devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/125—Digital circuitry
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00—Technologies for solid waste management
    • Y02W30/50—Reuse, recycling or recovery technologies
    • Y02W30/64—Paper recycling

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Wood Science & Technology (AREA)
  • Mechanical Engineering (AREA)
  • Mathematical Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
FI20116329A 2011-12-28 2011-12-28 Tasomaisen mittauskohteen mittaus FI125119B (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20116329A FI125119B (fi) 2011-12-28 2011-12-28 Tasomaisen mittauskohteen mittaus
PCT/FI2012/051293 WO2013098482A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
US14/368,882 US20150008346A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
CN201280070883.2A CN104136884B (zh) 2011-12-28 2012-12-21 待测对象的测量
CA 2861690 CA2861690A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
EP12861226.4A EP2805130B1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20116329A FI125119B (fi) 2011-12-28 2011-12-28 Tasomaisen mittauskohteen mittaus
FI20116329 2011-12-28

Publications (2)

Publication Number Publication Date
FI20116329A true FI20116329A (fi) 2013-06-29
FI125119B FI125119B (fi) 2015-06-15

Family

ID=48696399

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20116329A FI125119B (fi) 2011-12-28 2011-12-28 Tasomaisen mittauskohteen mittaus

Country Status (6)

Country Link
US (1) US20150008346A1 (fi)
EP (1) EP2805130B1 (fi)
CN (1) CN104136884B (fi)
CA (1) CA2861690A1 (fi)
FI (1) FI125119B (fi)
WO (1) WO2013098482A1 (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351791A (zh) * 2018-12-24 2020-06-30 韦伯斯特生物官能(以色列)有限公司 编织物的节距的非侵入式测量

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9147405B2 (en) * 2013-12-05 2015-09-29 Seagate Technology Llc Light source alignment
WO2016100986A1 (en) * 2014-12-19 2016-06-23 University Of Utah Research Foundation Interferometry system and associated methods
US9470514B2 (en) * 2015-02-11 2016-10-18 Southwest Research Institute System and method for using laser scan micrometer to measure surface changes on non-concave surfaces
JP6398950B2 (ja) * 2015-11-09 2018-10-03 東芝三菱電機産業システム株式会社 板状体側面の表面疵撮影装置
JP6801573B2 (ja) * 2017-05-10 2020-12-16 日立金属株式会社 ケーブルの止水構造及びワイヤハーネス
EP3450184B1 (en) * 2017-09-01 2021-04-21 Canon Production Printing Holding B.V. Deformation detection for print media
CN113358066B (zh) * 2021-07-09 2024-06-18 中国工程物理研究院机械制造工艺研究所 楔形长带的角度误差检测装置及方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06273162A (ja) 1993-03-18 1994-09-30 Sumitomo Metal Ind Ltd 平坦度測定装置
EP0843155B1 (en) 1996-11-15 2002-02-20 Kabushiki Kaisha Toshiba Optical distance measuring equipment and method therefor
DE10361161A1 (de) * 2003-12-22 2005-07-21 Voith Paper Patent Gmbh Messvorrichtung
US7199884B2 (en) * 2004-12-21 2007-04-03 Honeywell International Inc. Thin thickness measurement method and apparatus
CN101379366A (zh) * 2005-12-22 2009-03-04 霍尼韦尔国际公司 三角测量位置测量的光学平移
US7880156B2 (en) * 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography
CA2884632C (en) 2007-08-31 2016-10-25 Abb Ltd. Web thickness measurement device
EP2449339A1 (de) 2009-07-02 2012-05-09 Voith Patent GmbH Verfahren zur berührungslosen bestimmung der dicke einer materialbahn
CN102483322A (zh) * 2009-07-02 2012-05-30 沃依特专利有限责任公司 通过修正定向误差无接触地确定料幅厚度的方法和装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351791A (zh) * 2018-12-24 2020-06-30 韦伯斯特生物官能(以色列)有限公司 编织物的节距的非侵入式测量
CN111351791B (zh) * 2018-12-24 2023-12-05 韦伯斯特生物官能(以色列)有限公司 编织物的节距的非侵入式测量

Also Published As

Publication number Publication date
EP2805130B1 (en) 2020-05-06
CA2861690A1 (en) 2013-07-04
FI125119B (fi) 2015-06-15
EP2805130A1 (en) 2014-11-26
CN104136884B (zh) 2017-06-09
CN104136884A (zh) 2014-11-05
EP2805130A4 (en) 2015-04-15
US20150008346A1 (en) 2015-01-08
WO2013098482A1 (en) 2013-07-04

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