PL3037800T3 - Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego - Google Patents

Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego

Info

Publication number
PL3037800T3
PL3037800T3 PL14004425T PL14004425T PL3037800T3 PL 3037800 T3 PL3037800 T3 PL 3037800T3 PL 14004425 T PL14004425 T PL 14004425T PL 14004425 T PL14004425 T PL 14004425T PL 3037800 T3 PL3037800 T3 PL 3037800T3
Authority
PL
Poland
Prior art keywords
midpoints
curvature
measurement
positions
optical system
Prior art date
Application number
PL14004425T
Other languages
English (en)
Inventor
Naoji Oya
Aiko Ruprecht
Eugen Dumitrescu
Original Assignee
Trioptics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trioptics Gmbh filed Critical Trioptics Gmbh
Publication of PL3037800T3 publication Critical patent/PL3037800T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL14004425T 2014-12-24 2014-12-24 Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego PL3037800T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP14004425.6A EP3037800B1 (de) 2014-12-24 2014-12-24 Messung der Positionen von Krümmungsmittelpunkten optischer Flächen eines ein-oder mehrlinsigen optischen Systems

Publications (1)

Publication Number Publication Date
PL3037800T3 true PL3037800T3 (pl) 2018-11-30

Family

ID=52347068

Family Applications (1)

Application Number Title Priority Date Filing Date
PL14004425T PL3037800T3 (pl) 2014-12-24 2014-12-24 Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego

Country Status (4)

Country Link
US (2) US9766155B2 (pl)
EP (1) EP3037800B1 (pl)
CN (1) CN105738078B (pl)
PL (1) PL3037800T3 (pl)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105388000B (zh) * 2015-12-04 2018-01-05 中国科学院长春光学精密机械与物理研究所 有限距成像***垂轴放大率的测量方法
PL3410091T3 (pl) * 2017-06-02 2022-01-17 Trioptics Gmbh Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego
US11340136B2 (en) 2017-06-02 2022-05-24 Trioptics Gmbh Apparatus for detecting a modulation transfer function and centering of an optical system
CN107843213B (zh) * 2017-10-23 2020-06-16 北京理工大学 共焦自准直中心偏和曲率半径测量方法与装置
DE102018121367A1 (de) * 2018-08-31 2020-03-05 Carl Zeiss Ag Optisches System zur Verwendung in einer Unterwasserumgebung
JP7225644B2 (ja) * 2018-09-28 2023-02-21 株式会社ニデック レンズ測定装置
US10670391B2 (en) 2018-10-26 2020-06-02 Northrop Grumman Systems Corporation Confocal optical protractor
FR3093560B1 (fr) * 2019-03-05 2021-10-29 Fogale Nanotech Procédé et dispositif de mesure d’interfaces d’un élément optique
US11448732B2 (en) 2019-05-21 2022-09-20 Northrop Grumman Systems Corporation Frequency modulated scanning LIDAR with 360 degrees field of view
US11531111B2 (en) 2019-05-21 2022-12-20 Northrop Grumman Systems Corporation 360 degrees field of view scanning lidar with no movable parts
US11555891B2 (en) 2019-05-21 2023-01-17 Northrop Grumman Systems Corporation Methods for large angle field of view scanning LIDAR with no movable parts
DE102019133738A1 (de) * 2019-12-10 2021-06-10 AIXEMTEC GmbH Vorrichtung, Verfahren und Verwendung der Vorrichtung zur Justage, Montage und/oder Prüfung eines elektrooptischen Systems
DE102020107298A1 (de) 2020-03-17 2021-09-23 Berliner Glas GmbH Verfahren und Justiervorrichtung zur Ausrichtung optischer Linsen
EP3961180A1 (de) 2020-09-01 2022-03-02 Engelbert Hofbauer Verfahren zur vermessung optischer linsenflächen
EP4377662A1 (en) 2021-07-28 2024-06-05 Zygo Corporation Interferometric lens aligner and method
CN113639665B (zh) * 2021-07-30 2022-11-01 哈尔滨工业大学 基于漂移量反馈的高稳定性纳弧度量级角度测量方法与装置
WO2023160815A1 (de) 2022-02-28 2023-08-31 Engelbert Hofbauer Verfahren zur vermessung optischer linsenflächen
US20230400297A1 (en) * 2022-05-20 2023-12-14 Asmpt Singapore Pte. Ltd. Passive alignment of lens module relative to an image sensor for manufacturing a camera module
TWI836633B (zh) * 2022-09-28 2024-03-21 致茂電子股份有限公司 多自由度誤差校正方法及設備
US11860380B1 (en) 2023-08-15 2024-01-02 Mloptic Corp. Lens assembly alignment tool

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Publication number Priority date Publication date Assignee Title
JPH0812127B2 (ja) * 1988-11-11 1996-02-07 オリンパス光学工業株式会社 曲率半径測定装置及び方法
US5844670A (en) * 1995-07-28 1998-12-01 Ricoh Co., Ltd. Method of and systems for measuring eccentricity of an aspherical lens surface
JP3725817B2 (ja) * 2001-11-20 2005-12-14 オリンパス株式会社 非球面レンズの偏心測定方法及び偏心測定装置
JP4474150B2 (ja) * 2003-11-28 2010-06-02 キヤノン株式会社 偏心測定方法
DE102004029735C5 (de) 2004-06-21 2011-09-15 Trioptics Gmbh Verfahren zur Messung optischer Oberflächen innerhalb einer mehrlinsigen Anordnung
US7643149B2 (en) 2005-05-24 2010-01-05 Carl Zeiss Smt Ag Method of aligning an optical system
CN100588934C (zh) * 2005-06-07 2010-02-10 富士能株式会社 偏芯量测量方法
CN101334334B (zh) * 2007-06-25 2010-06-02 佛山普立华科技有限公司 镜片偏心检测***
FR2939190B1 (fr) * 2008-12-02 2014-11-14 Essilor Int Dispositif et procede pour mesurer une caracteristique geometrique relative a la cambrure d'une lentille ophtalmique
JP2010230578A (ja) * 2009-03-27 2010-10-14 Fujifilm Corp 偏芯量測定方法
JP5222796B2 (ja) * 2009-06-08 2013-06-26 富士フイルム株式会社 光学素子の偏芯調整組立方法および偏芯調整組立装置
US8665425B2 (en) * 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method
DE102010053422B3 (de) * 2010-11-29 2012-03-29 Trioptics Gmbh Messung der Positionen von Krümmungsmittelpunkten optischer Flächen eines mehrlinsigen optischen Systems
CN102175142B (zh) * 2011-02-12 2012-10-31 中国科学院光电技术研究所 透镜中心误差干涉测量***
DE102013001458A1 (de) * 2013-01-23 2014-07-24 Jenoptik Optical Systems Gmbh System zur Lagebestimmung eines Prüfobjektes und zugehöriges Verfahren
US9019485B2 (en) * 2013-03-11 2015-04-28 Lumetrics, Inc. Apparatus and method for evaluation of optical elements

Also Published As

Publication number Publication date
US20170336286A1 (en) 2017-11-23
CN105738078A (zh) 2016-07-06
US9863844B2 (en) 2018-01-09
EP3037800A1 (de) 2016-06-29
CN105738078B (zh) 2019-10-08
US20160187222A1 (en) 2016-06-30
US9766155B2 (en) 2017-09-19
EP3037800B1 (de) 2018-04-04

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