ATE465419T1 - Prüfbare integrierte schaltung und ic- prüfverfahren - Google Patents
Prüfbare integrierte schaltung und ic- prüfverfahrenInfo
- Publication number
- ATE465419T1 ATE465419T1 AT07826254T AT07826254T ATE465419T1 AT E465419 T1 ATE465419 T1 AT E465419T1 AT 07826254 T AT07826254 T AT 07826254T AT 07826254 T AT07826254 T AT 07826254T AT E465419 T1 ATE465419 T1 AT E465419T1
- Authority
- AT
- Austria
- Prior art keywords
- circuit portion
- integrated circuit
- power supply
- coupling
- conductive tracks
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
- G01R31/3008—Quiescent current [IDDQ] test or leakage current test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06120187 | 2006-09-06 | ||
PCT/IB2007/053558 WO2008029348A2 (en) | 2006-09-06 | 2007-09-04 | Testable integrated circuit and ic test method |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE465419T1 true ATE465419T1 (de) | 2010-05-15 |
Family
ID=39095968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07826254T ATE465419T1 (de) | 2006-09-06 | 2007-09-04 | Prüfbare integrierte schaltung und ic- prüfverfahren |
Country Status (6)
Country | Link |
---|---|
US (1) | US8138783B2 (de) |
EP (1) | EP2064562B1 (de) |
CN (1) | CN101512361B (de) |
AT (1) | ATE465419T1 (de) |
DE (1) | DE602007006031D1 (de) |
WO (1) | WO2008029348A2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7898278B2 (en) * | 2007-11-05 | 2011-03-01 | Arm Limited | Power control circuitry, circuitry for analysing a switched power rail, and method of controlling connection of a power source to a switched power rail |
US8476917B2 (en) * | 2010-01-29 | 2013-07-02 | Freescale Semiconductor, Inc. | Quiescent current (IDDQ) indication and testing apparatus and methods |
TWI408390B (zh) * | 2010-06-25 | 2013-09-11 | Princeton Technology Corp | 用於類比量測模組之控制電路與相關控制模組 |
CN102375113B (zh) * | 2010-08-11 | 2014-08-27 | 普诚科技股份有限公司 | 用于模拟测试模块的控制电路及控制*** |
CN102288898A (zh) * | 2011-05-17 | 2011-12-21 | 上海华岭集成电路技术股份有限公司 | 源复用测试方法 |
TW201248383A (en) * | 2011-05-25 | 2012-12-01 | Hon Hai Prec Ind Co Ltd | Power supplying circuit |
US9103877B2 (en) | 2012-04-03 | 2015-08-11 | Sandisk Technologies Inc. | Apparatus and method for IDDQ tests |
CN103115752B (zh) * | 2013-01-29 | 2015-11-18 | 杭州远方光电信息股份有限公司 | 一种光源在线检测装置 |
KR101536111B1 (ko) * | 2013-12-20 | 2015-07-13 | 동부대우전자 주식회사 | 오전압 검출장치 및 방법 |
CN104931759B (zh) * | 2014-03-21 | 2018-07-06 | 中芯国际集成电路制造(上海)有限公司 | 一种标准单元漏电流的测试电路及测试方法 |
US10095825B2 (en) | 2014-09-18 | 2018-10-09 | Samsung Electronics Co., Ltd. | Computer based system for verifying layout of semiconductor device and layout verify method thereof |
US9811626B2 (en) | 2014-09-18 | 2017-11-07 | Samsung Electronics Co., Ltd. | Method of designing layout of semiconductor device |
US9704862B2 (en) | 2014-09-18 | 2017-07-11 | Samsung Electronics Co., Ltd. | Semiconductor devices and methods for manufacturing the same |
US10026661B2 (en) | 2014-09-18 | 2018-07-17 | Samsung Electronics Co., Ltd. | Semiconductor device for testing large number of devices and composing method and test method thereof |
US9767248B2 (en) | 2014-09-18 | 2017-09-19 | Samsung Electronics, Co., Ltd. | Semiconductor having cross coupled structure and layout verification method thereof |
US10304500B2 (en) * | 2017-06-29 | 2019-05-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Power switch control for dual power supply |
CN113051853B (zh) * | 2021-03-05 | 2022-05-31 | 奥特斯科技(重庆)有限公司 | 受损部件载体确定方法、计算机程序、计算机可读介质以及检测*** |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5428297A (en) * | 1993-06-15 | 1995-06-27 | Grace; James W. | Precision integrated resistors |
EP0672911A1 (de) * | 1994-02-25 | 1995-09-20 | ALCATEL BELL Naamloze Vennootschap | Prüfeinrichtung für Ruheversorgungsstrom |
US5789933A (en) * | 1996-10-30 | 1998-08-04 | Hewlett-Packard Co. | Method and apparatus for determining IDDQ |
JPH10206499A (ja) | 1997-01-17 | 1998-08-07 | Sony Corp | 半導体素子 |
US6043672A (en) * | 1998-05-13 | 2000-03-28 | Lsi Logic Corporation | Selectable power supply lines for isolating defects in integrated circuits |
JP3187019B2 (ja) * | 1998-12-10 | 2001-07-11 | 沖電気工業株式会社 | 半導体集積回路及びその試験方法 |
US6628126B2 (en) * | 2001-06-14 | 2003-09-30 | International Business Machines Corporation | Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysis |
US6677774B2 (en) * | 2001-06-26 | 2004-01-13 | International Business Machines Corporation | Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester |
US20040085059A1 (en) * | 2002-10-31 | 2004-05-06 | Smith Edward E. | Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment |
CN100547425C (zh) * | 2003-02-10 | 2009-10-07 | Nxp股份有限公司 | 集成电路的测试 |
JP4262996B2 (ja) * | 2003-02-14 | 2009-05-13 | パナソニック株式会社 | 半導体装置 |
US7376001B2 (en) * | 2005-10-13 | 2008-05-20 | International Business Machines Corporation | Row circuit ring oscillator method for evaluating memory cell performance |
-
2007
- 2007-09-04 EP EP07826254A patent/EP2064562B1/de not_active Not-in-force
- 2007-09-04 US US12/440,448 patent/US8138783B2/en not_active Expired - Fee Related
- 2007-09-04 AT AT07826254T patent/ATE465419T1/de not_active IP Right Cessation
- 2007-09-04 WO PCT/IB2007/053558 patent/WO2008029348A2/en active Application Filing
- 2007-09-04 CN CN2007800329784A patent/CN101512361B/zh not_active Expired - Fee Related
- 2007-09-04 DE DE602007006031T patent/DE602007006031D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
WO2008029348A2 (en) | 2008-03-13 |
US20090315583A1 (en) | 2009-12-24 |
CN101512361A (zh) | 2009-08-19 |
EP2064562A2 (de) | 2009-06-03 |
CN101512361B (zh) | 2011-10-05 |
EP2064562B1 (de) | 2010-04-21 |
US8138783B2 (en) | 2012-03-20 |
DE602007006031D1 (de) | 2010-06-02 |
WO2008029348A3 (en) | 2008-05-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |