TW200745575A - IC tester - Google Patents
IC testerInfo
- Publication number
- TW200745575A TW200745575A TW095144129A TW95144129A TW200745575A TW 200745575 A TW200745575 A TW 200745575A TW 095144129 A TW095144129 A TW 095144129A TW 95144129 A TW95144129 A TW 95144129A TW 200745575 A TW200745575 A TW 200745575A
- Authority
- TW
- Taiwan
- Prior art keywords
- tester
- dut
- converter
- output
- reference voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
This invention aims to provide an IC tester capable of conducting a high-resolution and high-accuracy measurement without using an offset subtracter. This invention makes some improvement to an IC tester that measures the output of a DUT (device under test) by an A/D converter. The IC tester of this invention is characterized by including a voltage generation section that variably provides the A/D converter with an upper limit reference voltage and an lower limit reference voltage based on the output of the DUT.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005343096A JP2007147469A (en) | 2005-11-29 | 2005-11-29 | Ic tester |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200745575A true TW200745575A (en) | 2007-12-16 |
TWI310840B TWI310840B (en) | 2009-06-11 |
Family
ID=38125659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095144129A TWI310840B (en) | 2005-11-29 | 2006-11-29 | Ic tester |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2007147469A (en) |
KR (1) | KR100798837B1 (en) |
CN (1) | CN1975450A (en) |
TW (1) | TWI310840B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101354414B (en) * | 2007-07-26 | 2011-03-16 | 联华电子股份有限公司 | System and method for detecting defect with multi-step output function |
CN109343516A (en) * | 2018-12-11 | 2019-02-15 | 广西玉柴机器股份有限公司 | A method of measurement assessment engine controller AD conversion precision |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5810919A (en) * | 1981-07-13 | 1983-01-21 | Nippon Telegr & Teleph Corp <Ntt> | Analog-to-digital converter |
JPH03205921A (en) * | 1990-01-08 | 1991-09-09 | Hitachi Denshi Ltd | Digitizer circuit |
JP3144563B2 (en) * | 1991-02-18 | 2001-03-12 | 横河電機株式会社 | Waveform measuring device |
KR100499368B1 (en) * | 1997-12-30 | 2005-09-14 | 엘지전자 주식회사 | Apparatus for regulating reference voltage of analog/digital convertor |
KR20000004592A (en) * | 1998-06-30 | 2000-01-25 | 김영환 | Analog-to-digital converting apparatus utilizing comparison window of variable size |
JP2002098738A (en) * | 2000-09-27 | 2002-04-05 | Yokogawa Electric Corp | Ic tester |
JP3874164B2 (en) * | 2000-10-26 | 2007-01-31 | 横河電機株式会社 | IC tester |
JP2002250754A (en) * | 2001-02-26 | 2002-09-06 | Yokogawa Electric Corp | Semiconductor test apparatus |
JP4059174B2 (en) * | 2003-09-09 | 2008-03-12 | 村田機械株式会社 | Image processing device |
JP2005229257A (en) * | 2004-02-12 | 2005-08-25 | Toshiba Corp | Analog/digital converter and microcomputer mounted with it |
JP2005265612A (en) * | 2004-03-18 | 2005-09-29 | Kawasaki Microelectronics Kk | Test circuit |
JP2005300287A (en) * | 2004-04-09 | 2005-10-27 | Yokogawa Electric Corp | Ic tester |
-
2005
- 2005-11-29 JP JP2005343096A patent/JP2007147469A/en active Pending
-
2006
- 2006-09-25 KR KR1020060092839A patent/KR100798837B1/en not_active IP Right Cessation
- 2006-11-29 CN CNA2006101631904A patent/CN1975450A/en active Pending
- 2006-11-29 TW TW095144129A patent/TWI310840B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2007147469A (en) | 2007-06-14 |
CN1975450A (en) | 2007-06-06 |
KR100798837B1 (en) | 2008-01-28 |
KR20070056929A (en) | 2007-06-04 |
TWI310840B (en) | 2009-06-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |