NO20033051L - Testmoduskrets for inngangs-/utgangskontinuitet - Google Patents
Testmoduskrets for inngangs-/utgangskontinuitetInfo
- Publication number
- NO20033051L NO20033051L NO20033051A NO20033051A NO20033051L NO 20033051 L NO20033051 L NO 20033051L NO 20033051 A NO20033051 A NO 20033051A NO 20033051 A NO20033051 A NO 20033051A NO 20033051 L NO20033051 L NO 20033051L
- Authority
- NO
- Norway
- Prior art keywords
- test mode
- continuity
- circuit
- input
- mode circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
En testmoduskrets for kontinuitet (20) i en integrert kretsanordning har organer for å svitsje (28) mellom en kontinuitetstestmodus og en normal driftsmodus. Testmodusen er særmerket med at et eller flere inngangsbein (22) er i direkte elektrisk forbindelse med et eller flere utgangsbein (32) for å tillate beina og brikkepakken og brikkesokkelen og kretskortet å testes for kontinuitet. I normal driftsmodus er ikke operasjonen av brikken påvirket av testmoduskretsen. Testmoduskretsen for kontinuitet tillater testing av kontinuitet i anordningssokkel og/eller anordningskort for å sikre nøyaktig testing og programmering av anordningen.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/764,169 US6694463B2 (en) | 2001-01-16 | 2001-01-16 | Input/output continuity test mode circuit |
PCT/US2001/044694 WO2002057802A1 (en) | 2001-01-16 | 2001-11-28 | Input/output continuity test mode circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
NO20033051D0 NO20033051D0 (no) | 2003-07-03 |
NO20033051L true NO20033051L (no) | 2003-07-03 |
Family
ID=25069875
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20033051A NO20033051L (no) | 2001-01-16 | 2003-07-03 | Testmoduskrets for inngangs-/utgangskontinuitet |
Country Status (10)
Country | Link |
---|---|
US (1) | US6694463B2 (no) |
EP (1) | EP1358498B1 (no) |
JP (1) | JP2004518130A (no) |
KR (1) | KR20030075160A (no) |
CN (1) | CN1254690C (no) |
CA (1) | CA2432889A1 (no) |
DE (1) | DE60106300T2 (no) |
NO (1) | NO20033051L (no) |
TW (1) | TW523596B (no) |
WO (1) | WO2002057802A1 (no) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8572446B2 (en) * | 2000-06-30 | 2013-10-29 | Texas Instruments Incorporated | Output circuitry with tri-state buffer and comparator circuitry |
US6717429B2 (en) * | 2000-06-30 | 2004-04-06 | Texas Instruments Incorporated | IC having comparator inputs connected to core circuitry and output pad |
TW530525B (en) * | 2001-07-27 | 2003-05-01 | Via Tech Inc | Method of disposing buffer and its chip |
US20030131275A1 (en) * | 2002-01-09 | 2003-07-10 | Jong-Hong Bae | Microcontroller and system having a clock generator |
US7032146B2 (en) * | 2002-10-29 | 2006-04-18 | International Business Machines Corporation | Boundary scan apparatus and interconnect test method |
DE10254390B4 (de) * | 2002-11-21 | 2016-05-12 | Dr. Johannes Heidenhain Gmbh | Schaltungsanordnung sowie mit dieser Schaltungsanordnung ausgestattetes Winkel- bzw. Längenmessgerät |
US6944265B2 (en) * | 2002-11-25 | 2005-09-13 | Ge Medical Systems Global Technology Company, Llc | Image pasting using geometry measurement and a flat-panel detector |
KR100746228B1 (ko) * | 2006-01-25 | 2007-08-03 | 삼성전자주식회사 | 반도체 메모리 모듈 및 반도체 메모리 장치 |
KR101593603B1 (ko) | 2009-01-29 | 2016-02-15 | 삼성전자주식회사 | 반도체 장치의 온도 감지 회로 |
KR101145312B1 (ko) * | 2010-07-06 | 2012-05-14 | 에스케이하이닉스 주식회사 | 반도체 집적회로 |
JP6171264B2 (ja) * | 2012-03-30 | 2017-08-02 | 株式会社デンソー | 撮像装置 |
CN103490957B (zh) * | 2013-09-24 | 2016-09-14 | 深圳市数智国兴信息科技有限公司 | 一卡通平台***及其应用方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2659095B2 (ja) | 1987-06-30 | 1997-09-30 | 富士通株式会社 | ゲートアレイ及びメモリを有する半導体集積回路装置 |
US6304987B1 (en) * | 1995-06-07 | 2001-10-16 | Texas Instruments Incorporated | Integrated test circuit |
JPH0682325B2 (ja) * | 1990-05-29 | 1994-10-19 | 株式会社東芝 | 情報処理装置のテスト容易化回路 |
JPH04159752A (ja) | 1990-10-23 | 1992-06-02 | Nec Corp | 半導体集積回路及びその装置 |
JP3059024B2 (ja) * | 1993-06-15 | 2000-07-04 | 沖電気工業株式会社 | 半導体記憶回路 |
US5553070A (en) * | 1994-09-13 | 1996-09-03 | Riley; Robert E. | Data link module for time division multiplexing control systems |
US5699554A (en) * | 1994-10-27 | 1997-12-16 | Texas Instruments Incorporated | Apparatus for selective operation without optional circuitry |
US5561614A (en) * | 1995-01-30 | 1996-10-01 | Motorola Inc. | Method and apparatus for testing pin isolation for an integrated circuit in a low power mode of operation |
US5656953A (en) * | 1995-05-31 | 1997-08-12 | Texas Instruments Incorporated | Low overhead memory designs for IC terminals |
US5589777A (en) * | 1995-06-21 | 1996-12-31 | Hewlett-Packard Company | Circuit and method for testing a disk drive head assembly without probing |
US5744967A (en) * | 1995-08-24 | 1998-04-28 | Sorensen; Brent A. | Apparatus for detecting intermittent and continuous faults in multiple conductor wiring and terminations for electronic systems |
KR0172347B1 (ko) | 1995-12-23 | 1999-03-30 | 김광호 | 반도체 메모리장치의 병렬테스트 회로 |
US5713445A (en) | 1996-07-22 | 1998-02-03 | Eaton Corporation | Transmission inertia brake with self energizing |
DE69724575T2 (de) | 1996-11-25 | 2004-06-24 | Texas Instruments Inc., Dallas | Integrierte Schaltung |
US6060897A (en) * | 1997-02-11 | 2000-05-09 | National Semiconductor Corporation | Testability method for modularized integrated circuits |
US5983377A (en) | 1997-11-17 | 1999-11-09 | Ncr Corporation | System and circuit for ASIC pin fault testing |
US6223313B1 (en) * | 1997-12-05 | 2001-04-24 | Lightspeed Semiconductor Corporation | Method and apparatus for controlling and observing data in a logic block-based asic |
US6119249A (en) | 1998-03-27 | 2000-09-12 | Cypress Semiconductor Corp. | Memory devices operable in both a normal and a test mode and methods for testing same |
US6550031B1 (en) * | 1999-10-06 | 2003-04-15 | Advanced Micro Devices Inc. | Transparently gathering a chips multiple internal states via scan path and a trigger |
-
2001
- 2001-01-16 US US09/764,169 patent/US6694463B2/en not_active Expired - Lifetime
- 2001-11-28 CA CA002432889A patent/CA2432889A1/en not_active Abandoned
- 2001-11-28 KR KR10-2003-7009496A patent/KR20030075160A/ko not_active Application Discontinuation
- 2001-11-28 WO PCT/US2001/044694 patent/WO2002057802A1/en active IP Right Grant
- 2001-11-28 JP JP2002558031A patent/JP2004518130A/ja active Pending
- 2001-11-28 DE DE60106300T patent/DE60106300T2/de not_active Expired - Fee Related
- 2001-11-28 CN CNB018220495A patent/CN1254690C/zh not_active Expired - Fee Related
- 2001-11-28 EP EP01273374A patent/EP1358498B1/en not_active Expired - Lifetime
- 2001-12-10 TW TW090130545A patent/TW523596B/zh not_active IP Right Cessation
-
2003
- 2003-07-03 NO NO20033051A patent/NO20033051L/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
NO20033051D0 (no) | 2003-07-03 |
TW523596B (en) | 2003-03-11 |
JP2004518130A (ja) | 2004-06-17 |
DE60106300D1 (de) | 2004-11-11 |
WO2002057802A1 (en) | 2002-07-25 |
US6694463B2 (en) | 2004-02-17 |
CN1486431A (zh) | 2004-03-31 |
CN1254690C (zh) | 2006-05-03 |
DE60106300T2 (de) | 2005-03-24 |
US20020095631A1 (en) | 2002-07-18 |
EP1358498B1 (en) | 2004-10-06 |
CA2432889A1 (en) | 2002-07-25 |
EP1358498A1 (en) | 2003-11-05 |
KR20030075160A (ko) | 2003-09-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FC2A | Withdrawal, rejection or dismissal of laid open patent application |