ATE313086T1 - Digitales system und entsprechendes verfahren zur fehlererkennung - Google Patents

Digitales system und entsprechendes verfahren zur fehlererkennung

Info

Publication number
ATE313086T1
ATE313086T1 AT02733102T AT02733102T ATE313086T1 AT E313086 T1 ATE313086 T1 AT E313086T1 AT 02733102 T AT02733102 T AT 02733102T AT 02733102 T AT02733102 T AT 02733102T AT E313086 T1 ATE313086 T1 AT E313086T1
Authority
AT
Austria
Prior art keywords
parity
error detection
signal representing
mut
output
Prior art date
Application number
AT02733102T
Other languages
English (en)
Inventor
Richard P Kleihorst
Adrianus J M Denissen
Andre K Nieuwland
Nico F Benschop
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE313086T1 publication Critical patent/ATE313086T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Detection And Correction Of Errors (AREA)
  • Error Detection And Correction (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Communication Control (AREA)
  • Hardware Redundancy (AREA)
AT02733102T 2001-06-01 2002-05-30 Digitales system und entsprechendes verfahren zur fehlererkennung ATE313086T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01202090 2001-06-01
PCT/IB2002/001969 WO2002097457A2 (en) 2001-06-01 2002-05-30 A digital system and a method for error detection thereof

Publications (1)

Publication Number Publication Date
ATE313086T1 true ATE313086T1 (de) 2005-12-15

Family

ID=8180407

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02733102T ATE313086T1 (de) 2001-06-01 2002-05-30 Digitales system und entsprechendes verfahren zur fehlererkennung

Country Status (10)

Country Link
US (1) US8560932B2 (de)
EP (1) EP1435005B1 (de)
JP (1) JP4090988B2 (de)
KR (1) KR100962858B1 (de)
CN (1) CN100421081C (de)
AT (1) ATE313086T1 (de)
AU (1) AU2002304317A1 (de)
DE (1) DE60208062T2 (de)
ES (1) ES2253534T3 (de)
WO (1) WO2002097457A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7234120B1 (en) * 2004-10-06 2007-06-19 Xilinx, Inc. Fault isolation in a programmable logic device
JP5179726B2 (ja) * 2006-06-27 2013-04-10 マーベル ワールド トレード リミテッド 半導体デバイス
KR101451461B1 (ko) * 2007-10-19 2014-10-15 가부시키가이샤 엘피텍스 돈 케어 비트 추출 방법 및 돈 케어 비트 추출 프로그램을 기록한 컴퓨터로 판독 가능한 기록매체
US8762818B1 (en) * 2009-03-05 2014-06-24 Marvell International Ltd. System and methods for performing decoding error detection in a storage device
US9118351B2 (en) * 2012-02-15 2015-08-25 Infineon Technologies Ag System and method for signature-based redundancy comparison
US9575125B1 (en) * 2012-10-11 2017-02-21 Everspin Technologies, Inc. Memory device with reduced test time
US9722632B2 (en) * 2014-09-22 2017-08-01 Streamscale, Inc. Sliding window list decoder for error correcting codes
US10153757B2 (en) * 2015-03-06 2018-12-11 Microchip Technology Incorporated Three input comparator
US10911181B2 (en) * 2019-04-02 2021-02-02 Hangzhou Fabu Technology Co., Ltd. Method for checking address and control signal integrity in functional safety applications, related products
US10890622B2 (en) * 2019-04-29 2021-01-12 International Business Machines Corporation Integrated circuit control latch protection

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US3585378A (en) * 1969-06-30 1971-06-15 Ibm Error detection scheme for memories
US3883801A (en) * 1973-11-07 1975-05-13 Bell Telephone Labor Inc Fault testing of logic circuits
JPS5283046A (en) * 1975-12-30 1977-07-11 Fujitsu Ltd Check system of error detection circuit
US4251884A (en) * 1979-02-09 1981-02-17 Bell Telephone Laboratories, Incorporated Parity circuits
US4291407A (en) * 1979-09-10 1981-09-22 Ncr Corporation Parity prediction circuitry for a multifunction register
US4312070A (en) * 1979-12-07 1982-01-19 Motorola, Inc. Digital encoder-decoder
JPS61133873A (ja) * 1984-12-03 1986-06-21 Mitsubishi Electric Corp 半導体試験装置
US4884273A (en) * 1987-02-03 1989-11-28 Siemens Aktiengesellschaft Method and apparatus for monitoring the consistency of successive binary code signal groups in data processing equipment
JPS63204170A (ja) 1987-02-18 1988-08-23 Nec Corp 試験機構付半導体集積回路
CA1296103C (en) 1987-06-02 1992-02-18 Theodore Jay Goodlander High-speed, high capacity, fault-tolerant, error-correcting storage system
JPH01187475A (ja) 1988-01-21 1989-07-26 Nec Corp 半導体集積回路の試験装置
US4924423A (en) * 1988-04-25 1990-05-08 International Business Machines Corporation High speed parity prediction for binary adders using irregular grouping scheme
US4928280A (en) * 1988-04-29 1990-05-22 International Business Machines Corporation Fast processor for multi-bit error correction codes
JPH0447569A (ja) * 1990-06-15 1992-02-17 Canon Inc ディジタル記録再生装置
JPH04177700A (ja) * 1990-11-13 1992-06-24 Toshiba Corp メモリ不良解析装置
US5377148A (en) * 1990-11-29 1994-12-27 Case Western Reserve University Apparatus and method to test random access memories for a plurality of possible types of faults
JPH05324375A (ja) 1992-05-21 1993-12-07 Fujitsu Ltd Ｃｐｕシステムにおける故障情報通知装置
US5559506A (en) * 1994-05-04 1996-09-24 Motorola, Inc. Method and apparatus for encoding and decoding a digital radio signal
DE69534182T2 (de) * 1994-05-17 2006-01-12 Nippon Telegraph And Telephone Corp. Endgerät in SDH Netzwerken unter Verwendung fehlerkorrigierender Codes
JPH088760A (ja) * 1994-06-16 1996-01-12 Toshiba Corp 誤り訂正装置
US5857103A (en) * 1996-06-14 1999-01-05 Sun Microsystems, Inc. Method and apparatus for addressing extended registers on a processor in a computer system
US5982681A (en) 1997-10-10 1999-11-09 Lsi Logic Corporation Reconfigurable built-in self test circuit
US6308292B1 (en) * 1998-12-08 2001-10-23 Lsi Logic Corporation File driven mask insertion for automatic test equipment test pattern generation
JP2003529998A (ja) * 2000-03-31 2003-10-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ エラー訂正集積回路および方法
US6718494B1 (en) * 2000-12-22 2004-04-06 Intel Corporation Method and apparatus for preventing and recovering from TLB corruption by soft error
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Also Published As

Publication number Publication date
JP2004531141A (ja) 2004-10-07
ES2253534T3 (es) 2006-06-01
US20040177314A1 (en) 2004-09-09
CN100421081C (zh) 2008-09-24
KR100962858B1 (ko) 2010-06-09
WO2002097457A3 (en) 2004-04-29
JP4090988B2 (ja) 2008-05-28
KR20030020951A (ko) 2003-03-10
AU2002304317A1 (en) 2002-12-09
DE60208062T2 (de) 2006-08-03
DE60208062D1 (de) 2006-01-19
WO2002097457A2 (en) 2002-12-05
EP1435005B1 (de) 2005-12-14
EP1435005A2 (de) 2004-07-07
CN1526077A (zh) 2004-09-01
US8560932B2 (en) 2013-10-15

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