WO2003102610A3 - Verfahren und vorrichtung zur erfassung im frequenzbereich basierend auf einer zeitbereichsmessung - Google Patents
Verfahren und vorrichtung zur erfassung im frequenzbereich basierend auf einer zeitbereichsmessung Download PDFInfo
- Publication number
- WO2003102610A3 WO2003102610A3 PCT/EP2003/004996 EP0304996W WO03102610A3 WO 2003102610 A3 WO2003102610 A3 WO 2003102610A3 EP 0304996 W EP0304996 W EP 0304996W WO 03102610 A3 WO03102610 A3 WO 03102610A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- frequency range
- time range
- detection
- measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Mathematical Physics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10392151T DE10392151B4 (de) | 2002-05-31 | 2003-05-13 | Verfahren und Vorrichtung zur Erfassung im Frequenzbereich basierend auf einer Zeitbereichsmessung |
AU2003240238A AU2003240238A1 (en) | 2002-05-31 | 2003-05-13 | Method and device for detection in the frequency range, based on a time range measurement |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10224096.5 | 2002-05-31 | ||
DE10224096 | 2002-05-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003102610A2 WO2003102610A2 (de) | 2003-12-11 |
WO2003102610A3 true WO2003102610A3 (de) | 2004-03-25 |
Family
ID=29594196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2003/004996 WO2003102610A2 (de) | 2002-05-31 | 2003-05-13 | Verfahren und vorrichtung zur erfassung im frequenzbereich basierend auf einer zeitbereichsmessung |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003240238A1 (de) |
DE (1) | DE10392151B4 (de) |
WO (1) | WO2003102610A2 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005026928B8 (de) * | 2004-07-14 | 2013-05-16 | GAUSS Instruments GmbH Gesellschaft für AUtomatisierte StöremissionsmessSysteme | Verfahren und Vorrichtung zur Analog-Digital-Wandlung eines Eingangssignals mit hoher Dynamik |
DE102006005595B8 (de) * | 2006-02-06 | 2015-03-12 | GAUSS INSTRUMENTS Vertriebs GmbH | Vorrichtung und Verfahren zur Messung von Störemissionen in Echtzeit |
DE102006062995B3 (de) | 2006-02-06 | 2023-06-07 | GAUSS INSTRUMENTS International GmbH | Verfahren und Anordnung zur Messung von Störemissionen in Realzeit |
US7613580B2 (en) * | 2007-04-12 | 2009-11-03 | Sun Microsystems, Inc. | Method and apparatus for generating an EMI fingerprint for a computer system |
US7613576B2 (en) | 2007-04-12 | 2009-11-03 | Sun Microsystems, Inc. | Using EMI signals to facilitate proactive fault monitoring in computer systems |
DE102007042266A1 (de) | 2007-09-06 | 2009-03-12 | Stephan Braun | Verfahren und Anordnung zur umgebungsstörkompensierten Emissionsmessung im Zeitbereich |
DE102010004872A1 (de) | 2010-01-18 | 2011-07-21 | Braun, Stephan Maximilian, 82380 | Anordnung zur Pulsbewertung gegenüber digitalen Diensten |
EP3109646A1 (de) * | 2015-06-23 | 2016-12-28 | Siemens Aktiengesellschaft | Verfahren zur analyse eines signals sowie vorrichtung zur durchführung des verfahrens |
US20170230920A1 (en) * | 2016-02-04 | 2017-08-10 | Qualcomm Incorporated | Detection of interference in wireless communication devices |
DE102016002267B4 (de) * | 2016-02-26 | 2017-09-14 | Gerd Bumiller | Anordnung und Verfahren zur Messung der elektrischen Eigenschaften am Anschlusspunkt eines elektrischen Energieversorgungsnetzes, von daran angeschlossenen Erzeugern, Verbrauchern oder Teilnetzen |
EP3232208A1 (de) * | 2016-04-13 | 2017-10-18 | Universitat Politècnica De Catalunya | Vollzeitbereichsverfahren zur messung und überwachung von elektromagnetischen störsignalen und system |
US10411816B2 (en) | 2016-11-30 | 2019-09-10 | Rohde & Schwarz Gmbh & Co. Kg | Method for searching a spur in a signal received and device for searching a spur in a signal received |
WO2019043874A1 (ja) * | 2017-08-31 | 2019-03-07 | 株式会社東陽テクニカ | 放射妨害波測定方法及び放射妨害波測定システム |
DE102021120462A1 (de) * | 2021-08-06 | 2023-02-09 | Schaeffler Technologies AG & Co. KG | Verfahren und Vorrichtung zur Drehmomentmessung |
CN114166253B (zh) * | 2021-12-07 | 2023-05-19 | 上海海纳信达数据技术有限公司 | 一种基于非线性回归数据处理的提高马赫-泽德型传感器测量范围的方法及*** |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0379050A1 (de) * | 1989-01-10 | 1990-07-25 | Anritsu Corporation | Gerät zur Spektralanalyse mit Funktionen zur simultanen Durchführung mehrerer Arten von Erfassung und Darstellung der Ergebnisse davon |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1072897B1 (de) * | 1995-04-05 | 2009-06-24 | Nippon Telegraph And Telephone Corporation | Verfahren und Vorrichtung zum Suchen nach der Quelle einer elektromagnetischen Störung und kontaktlose Sonde dafür |
-
2003
- 2003-05-13 WO PCT/EP2003/004996 patent/WO2003102610A2/de not_active Application Discontinuation
- 2003-05-13 DE DE10392151T patent/DE10392151B4/de not_active Expired - Fee Related
- 2003-05-13 AU AU2003240238A patent/AU2003240238A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0379050A1 (de) * | 1989-01-10 | 1990-07-25 | Anritsu Corporation | Gerät zur Spektralanalyse mit Funktionen zur simultanen Durchführung mehrerer Arten von Erfassung und Darstellung der Ergebnisse davon |
Non-Patent Citations (7)
Title |
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BRONAUGH E L: "Instrumentation and associated uncertainty for measuring EMI disturbances above 1 GHz", 2001 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY. EMC. SYMPOSIUM RECORD. MONTREAL, CANADA, AUG. 13 - 17, 2001, INTERNATIONL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, NEW YORK, NY: IEEE, US, vol. 1 OF 2, 13 August 2001 (2001-08-13), pages 980 - 984, XP010557353, ISBN: 0-7803-6569-0 * |
DUNKER L ET AL: "MESSUNG VON IBBANDSTORERN", NTZ (NACHRICHTENTECHNISCHE ZEITSCHRIFT), VDE VERLAG GMBH. BERLIN, DE, vol. 48, no. 6, 1 June 1995 (1995-06-01), pages 58 - 62, XP000523115, ISSN: 0027-707X * |
KAMMEYER, K.D., KROSCHEL, K.: "Digitale Signalverarbeitung", 1989, B.G. TEUBNER, STUTTGART, XP002259891 * |
KELLER, C., FESER, K.: "Fast emission measurement in time domain", CONF-EMC 2001, 2001, Zürich, XP000802386 * |
KELLER, C., FESER, K.: "Schnelle Emissionsmessung im Zeitbereich", EMV 2002, 10. INTERNATIONALE FACHMESSE UND KONGRESS FÜR ELEKTROMAGNETISCHE VERTRÄGLICHKEIT, 9 April 2002 (2002-04-09) - 11 April 2002 (2002-04-11), Düsseldorf, pages 347 - 354, XP001172816 * |
SCHUETTE A: "NANOSEKUNDEN-IMPULSE FUER DIE EMV-PRUEFTECHNIK", ELEKTROTECHNISCHE ZEITSCHRIFT - ETZ, VDE VERLAG GMBH. BERLIN, DE, vol. 114, no. 4, 1 February 1993 (1993-02-01), pages 270 - 272,274-27, XP000350028, ISSN: 0948-7387 * |
SCHUTTE A ET AL: "Comparison of time domain and frequency domain electromagnetic susceptibility testing", ELECTROMAGNETIC COMPATIBILITY, 1994. SYMPOSIUM RECORD. COMPATIBILITY IN THE LOOP., IEEE INTERNATIONAL SYMPOSIUM ON CHICAGO, IL, USA 22-26 AUG. 1994, NEW YORK, NY, USA,IEEE, 22 August 1994 (1994-08-22), pages 64 - 67, XP010133113, ISBN: 0-7803-1398-4 * |
Also Published As
Publication number | Publication date |
---|---|
WO2003102610A2 (de) | 2003-12-11 |
AU2003240238A1 (en) | 2003-12-19 |
DE10392151D2 (de) | 2004-09-16 |
DE10392151B4 (de) | 2013-04-25 |
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