ATE180065T1 - Fabrikationsfehleranalysator mit verbesserter fehlererfassung - Google Patents

Fabrikationsfehleranalysator mit verbesserter fehlererfassung

Info

Publication number
ATE180065T1
ATE180065T1 AT96905308T AT96905308T ATE180065T1 AT E180065 T1 ATE180065 T1 AT E180065T1 AT 96905308 T AT96905308 T AT 96905308T AT 96905308 T AT96905308 T AT 96905308T AT E180065 T1 ATE180065 T1 AT E180065T1
Authority
AT
Austria
Prior art keywords
fault
analyzer
fabrication
improved
printed circuit
Prior art date
Application number
AT96905308T
Other languages
English (en)
Inventor
Timothy W Sheen
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of ATE180065T1 publication Critical patent/ATE180065T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Stereo-Broadcasting Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT96905308T 1995-03-16 1996-02-02 Fabrikationsfehleranalysator mit verbesserter fehlererfassung ATE180065T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/405,478 US5578930A (en) 1995-03-16 1995-03-16 Manufacturing defect analyzer with improved fault coverage

Publications (1)

Publication Number Publication Date
ATE180065T1 true ATE180065T1 (de) 1999-05-15

Family

ID=23603869

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96905308T ATE180065T1 (de) 1995-03-16 1996-02-02 Fabrikationsfehleranalysator mit verbesserter fehlererfassung

Country Status (8)

Country Link
US (1) US5578930A (de)
EP (1) EP0815460B1 (de)
JP (1) JP3784412B2 (de)
KR (1) KR100363753B1 (de)
CN (1) CN1072362C (de)
AT (1) ATE180065T1 (de)
DE (1) DE69602432T2 (de)
WO (1) WO1996029610A2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6242923B1 (en) * 1997-02-27 2001-06-05 International Business Machines Corporation Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards
US5821759A (en) * 1997-02-27 1998-10-13 International Business Machines Corporation Method and apparatus for detecting shorts in a multi-layer electronic package
US6107806A (en) 1997-07-30 2000-08-22 Candescent Technologies Corporation Device for magnetically sensing current in plate structure
US6118279A (en) 1997-07-30 2000-09-12 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
DE19837169A1 (de) * 1998-08-17 2000-02-24 Reinhold Wein Verfahren und Vorrichtung zum Prüfen von bestückten und unbestückten Leiterplatten
JP2000171504A (ja) * 1998-12-04 2000-06-23 Nec Corp 半導体評価装置
US6316949B1 (en) * 1999-01-19 2001-11-13 Nidec-Read Corporation Apparatus and method for testing electric conductivity of circuit path ways on circuit board
JP3285568B2 (ja) * 1999-05-24 2002-05-27 日本電産リード株式会社 基板の配線検査装置および配線検査方法
DE10004649A1 (de) * 2000-02-03 2001-08-09 Infineon Technologies Ag Verfahren und Vorrichtung zur Anpassung/Abstimmung von Signallaufzeiten auf Leitungssystemen oder Netzen zwischen integrierten Schaltungen
JP4620848B2 (ja) * 2000-09-12 2011-01-26 イビデン株式会社 プリント配線板の電気検査装置及び電気検査方法
US6844747B2 (en) * 2001-03-19 2005-01-18 International Business Machines Corporation Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting
US6734681B2 (en) * 2001-08-10 2004-05-11 James Sabey Apparatus and methods for testing circuit boards
JP2005055422A (ja) * 2003-07-23 2005-03-03 Fuji Xerox Co Ltd 故障診断用検知信号取得装置、故障診断装置、および支持基板
US6964205B2 (en) * 2003-12-30 2005-11-15 Tekscan Incorporated Sensor with plurality of sensor elements arranged with respect to a substrate
KR101038014B1 (ko) * 2004-02-11 2011-05-30 (주)제너시스템즈 그룹 관리 기능을 이용한 다자간 동시 통화 방법 및 시스템
JP4726606B2 (ja) 2005-10-26 2011-07-20 ヤマハファインテック株式会社 プリント基板の電気検査装置、検査治具および検査治具の固定確認方法
CN101226222B (zh) * 2008-02-02 2013-03-20 上海盈龙电子科技有限公司 Pcb多功能测试***及实现方法
DE102008029679B4 (de) * 2008-06-23 2016-01-21 Eaton Industries Gmbh System, Verfahren und elektronische Schaltung für mindestens eine elektronische Schaltungseinheit
EP2344899B1 (de) * 2008-11-14 2015-06-10 Teradyne, Inc. Schnelle erkennung von unterbrochenen strom-und masse- pins
US8643539B2 (en) * 2008-11-19 2014-02-04 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool
JP5350885B2 (ja) * 2009-05-19 2013-11-27 株式会社エヌエフ回路設計ブロック 電極の分離状態検査方法、その装置及び電子デバイスの製造方法
US9157954B2 (en) * 2011-06-03 2015-10-13 Apple Inc. Test system with temporary test structures
JP2014235119A (ja) * 2013-06-04 2014-12-15 日本電産リード株式会社 基板検査装置、基板検査方法および基板検査用治具
US9523729B2 (en) * 2013-09-13 2016-12-20 Infineon Technologies Ag Apparatus and method for testing electric conductors
CN103592596A (zh) * 2013-10-22 2014-02-19 徐州市恒源电器有限公司 一种输出隔离式电源pcb连板测试电路
WO2018148497A1 (en) 2017-02-10 2018-08-16 Checksum, Llc Functional tester for printed circuit boards, and associated systems and methods
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US10612992B2 (en) 2017-11-03 2020-04-07 Lockheed Martin Corporation Strain gauge detection and orientation system
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
CN112131826B (zh) * 2020-08-28 2023-08-15 上海望友信息科技有限公司 Pcb检测评审方法、评审装置、电子设备及存储介质

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3719883A (en) * 1970-09-28 1973-03-06 North American Rockwell Magnetic core circuit for testing electrical short circuits between leads of a multi-lead circuit package
US3925784A (en) * 1971-10-27 1975-12-09 Radiation Inc Antenna arrays of internally phased elements
US3906514A (en) * 1971-10-27 1975-09-16 Harris Intertype Corp Dual polarization spiral antenna
US3949407A (en) * 1972-12-25 1976-04-06 Harris Corporation Direct fed spiral antenna
US4517511A (en) * 1981-10-16 1985-05-14 Fairchild Camera And Instrument Corporation Current probe signal processing circuit employing sample and hold technique to locate circuit faults
GB2143954A (en) * 1983-07-22 1985-02-20 Sharetree Ltd A capacitive method and apparatus for checking connections of a printed circuit board
US5254953A (en) * 1990-12-20 1993-10-19 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5124660A (en) * 1990-12-20 1992-06-23 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5365163A (en) * 1992-09-29 1994-11-15 Minnesota Mining And Manufacturing Company Sensor array for circuit tracer
US5420500A (en) * 1992-11-25 1995-05-30 Hewlett-Packard Company Pacitive electrode system for detecting open solder joints in printed circuit assemblies
US5406209A (en) * 1993-02-04 1995-04-11 Northern Telecom Limited Methods and apparatus for testing circuit boards
US5426372A (en) * 1993-07-30 1995-06-20 Genrad, Inc. Probe for capacitive open-circuit tests
US5391993A (en) * 1994-01-27 1995-02-21 Genrad, Inc. Capacitive open-circuit test employing threshold determination

Also Published As

Publication number Publication date
DE69602432D1 (de) 1999-06-17
US5578930A (en) 1996-11-26
KR19980702943A (ko) 1998-09-05
WO1996029610A2 (en) 1996-09-26
JP3784412B2 (ja) 2006-06-14
CN1178582A (zh) 1998-04-08
EP0815460A2 (de) 1998-01-07
EP0815460B1 (de) 1999-05-12
JPH11502309A (ja) 1999-02-23
WO1996029610A3 (en) 1996-12-05
KR100363753B1 (ko) 2003-01-24
DE69602432T2 (de) 1999-11-11
CN1072362C (zh) 2001-10-03

Similar Documents

Publication Publication Date Title
ATE180065T1 (de) Fabrikationsfehleranalysator mit verbesserter fehlererfassung
DE69004830D1 (de) Anordnung zum Ermitteln eines Ruhestroms einer integrierten monolithischen digitalen Schaltung, integrierte monolithische digitale Schaltung mit einer derartigen Anordnung und Prüfgerät mit einer derartigen Anordnung.
TWI264074B (en) Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
TW347467B (en) Method and apparatus for testing an electrically conductive substrate
ATE293806T1 (de) Schaltungsanordnung und verfahren zum detektieren eines unerwünschten angriffs auf eine integrierte schaltung
WO2003067941A3 (en) Circuit and method for determining the location of defect in a circuit
WO2002008773A3 (en) Apparatus and method for electrical testing of electrical circuits
ATE241798T1 (de) Einrichtung zur inspektion einer dreidimensionalen oberflächenstruktur
DE50109393D1 (de) Verfahren und vorrichtung zum prüfen von leiterplatten mit einem paralleltester
SE9602564L (sv) Kretskortstest
EP0428465A3 (en) Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (lssd) system
JPS62187258A (ja) 回路板の検査方法
DE60107881D1 (de) Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen
JPH01100474A (ja) 回路基板検査装置
JPS6430255A (en) Large scale integrated circuit provided with failure detection circuit
KR970011879A (ko) 반도체 소자 테스트용 탐침 카드 검사 방법
JPH05264676A (ja) 故障検出方法及び検出装置
KR960028787A (ko) 인쇄회로기판 검사시 검사증지방법
JPH04355378A (ja) コンタクトプローブ接触確認法
AU2001285859A1 (en) Method and device for testing the operativeness of printed circuit boards
KR910006945Y1 (ko) 웨이퍼 자동 감지장치
KR970051406A (ko) 반도체 메모리의 기능시험방법
JPS578463A (en) Method and apparatus for inspecting printed circuit board
JPH0235383A (ja) ハイインピーダンス出力の検査回路
JP2001235502A (ja) 回路基板検査装置

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties