WO2016101498A1 - 一种goa电路模块及其测试方法、显示面板和显示装置 - Google Patents

一种goa电路模块及其测试方法、显示面板和显示装置 Download PDF

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WO2016101498A1
WO2016101498A1 PCT/CN2015/078841 CN2015078841W WO2016101498A1 WO 2016101498 A1 WO2016101498 A1 WO 2016101498A1 CN 2015078841 W CN2015078841 W CN 2015078841W WO 2016101498 A1 WO2016101498 A1 WO 2016101498A1
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circuit module
goa circuit
signal
signal line
transparent conductive
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PCT/CN2015/078841
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English (en)
French (fr)
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杨怀伟
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京东方科技集团股份有限公司
合肥京东方光电科技有限公司
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Priority to US15/124,462 priority Critical patent/US9983450B2/en
Publication of WO2016101498A1 publication Critical patent/WO2016101498A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133345—Insulating layers
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13454—Drivers integrated on the active matrix substrate
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13458—Terminal pads
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Definitions

  • Embodiments of the present invention generally relate to the field of display technologies, and in particular, to a GOA circuit module for use in a display device and a test method thereof, and a display panel and display device including the GOA circuit module.
  • display panels In the TFT-LCD production process, display panels often exhibit defects associated with GOA circuits. During the parsing process, it is necessary to test the characteristics of the TFT of the GOA circuit and/or the output signal of the GOA circuit to confirm the cause of the failure. However, due to the difference in mask design of different display panels, the display panel using the GOA circuit is often unable to test the characteristics of each TFT (thin film transistor) inside the GOA circuit and the output signal of the GOA circuit during the analysis process, which is not well judged. The location and cause of the failure. Moreover, at present, when testing the output signal of the GOA circuit, one corner of the color filter substrate must be removed and tested. The success rate of this method is very low, and the GOA circuit of the display panel is often damaged and can no longer be tested.
  • the present invention has been made in order to overcome at least one of the above and other problems and disadvantages of the conventional art.
  • a GOA circuit module comprising: a plurality of TFTs including a gate layer and a gate insulating layer sequentially stacked on a substrate; and a plurality of via holes formed in the gate insulating layer to expose the gate a portion of the pole layer; and a plurality of first transparent conductive portions respectively corresponding to the plurality of via holes, respectively formed in Corresponding vias are electrically isolated from the gate layer, and each of the first transparent conductive portions is configured to be electrically connectable to a portion of the gate layer exposed from the corresponding via.
  • the first transparent conductive portion may be formed of an ITO material.
  • the GOA circuit module may further include a passivation layer covering a position of the plurality of via holes, and the first transparent conductive portion is electrically isolated from the gate layer by the passivation layer.
  • the plurality of TFTs may further include a source/drain layer between the gate layer and the passivation layer in a region where the plurality of via holes are located.
  • the GOA circuit module may further include a signal output lead and a first signal line, the first signal line crossing and electrically isolating from the signal output lead, the first signal line being configured to be capable of interfacing with the signal output lead in the GOA circuit module
  • the other portion is electrically disconnected and electrically connected to the signal output lead by soldering in a region where it intersects the signal output lead.
  • a GOA circuit module including a signal output lead and a first signal line, the first signal line crossing and electrically isolated from a signal output lead, and the first The signal line is configured to be electrically disconnected from a portion of the GOA circuit module other than the signal output lead and electrically connected to the signal output lead by soldering in a region where it intersects the signal output lead.
  • the GOA circuit module described above may further include a second signal line connected to the signal input lead of the GOA circuit module.
  • the GOA circuit module may further include a test pad including a first portion electrically connected to the first signal line and a second portion electrically connected to the second signal line, the first portion and the second portion being separated from each other open.
  • the first signal line may also be connected to a signal input lead of the GOA circuit module, and the first portion and the second portion of the test pad may pass through a second transparent conductive that can be cut
  • the parts are electrically connected to each other.
  • the second transparent conductive portion may be formed of an ITO material.
  • the first and/or second signal lines may include a source power line and/or a drain power line of at least one of the plurality of TFTs.
  • a display panel comprising an array substrate on which the above-described GOA circuit module is integrated.
  • a display device including the above display panel is provided.
  • a method for testing the above GOA circuit module comprising the steps of: electrically connecting a first transparent conductive portion to a portion of the gate layer exposed from a corresponding via; The transparent conductive portion inputs a gate control signal to the gate layer electrically connected thereto; inputs a test signal to the TFT associated with the gate layer electrically connected to the first transparent conductive portion, and detects an output signal of the TFT to determine the The characteristics of the TFT.
  • the first transparent conductive portion in the via hole may be electrically connected to the gate layer by laser welding.
  • the above method may further include the steps of: cutting off an electrical connection between the first signal line and a portion of the GOA circuit module other than the signal output lead; and the first signal line and the signal output lead Electrically connecting; and detecting an output signal of the GOA circuit module through the first signal line. It should be noted that the technical features described herein are also applicable to a GOA circuit module provided with a first signal line but without a first transparent conductive portion.
  • the electrical connection between the first signal line and other portions of the GOA circuit module other than the signal output lead may be disconnected by laser cutting.
  • the first signal line and the signal output lead may be electrically connected by laser welding.
  • FIG. 1 is a schematic diagram of a GOA circuit module in accordance with an exemplary embodiment of the present invention
  • FIG. 2 is a cross-sectional view showing one example of a structure taken along line B-B of FIG. 1;
  • FIG. 3 is a cross-sectional view showing another example of the structure taken along line B-B of FIG. 1.
  • a GOA circuit module includes: a plurality of TFTs including a gate layer and a gate insulating layer sequentially stacked on a substrate; and a plurality of via holes formed in the gate insulating layer Exposing a portion of the gate layer; and a plurality of first transparent conductive portions corresponding to the plurality of vias in one-to-one correspondence, respectively formed at corresponding via holes and electrically isolated from the gate layer, each of the first transparent conductive portions It is configured to be electrically connectable to a portion of the gate layer exposed from the corresponding via hole by soldering.
  • the first transparent conductive portion and the portion of the gate layer exposed from the via are electrically connected in a suitable manner, and the characteristics of each TFT in the GOA circuit module can be tested.
  • FIG. 1 illustrates a GOA circuit module as a gate switch driving circuit for use in a display device such as a TFT-LCD, according to an exemplary embodiment.
  • the GOA circuit module includes a multi-stage structure or shift register which is usually formed of a plurality of TFTs (Thin Film Transistors) such as the TFTs 1-1, 1-2 shown in FIG.
  • TFTs 1-1, 1-2 Thin Film Transistors
  • the output of each stage of the structure or shift register is connected to a corresponding one of the gate lines in the display panel, so that the display panel can be driven in a progressive scan manner to display an image.
  • the TFTs 1-1, 1-2 are schematically illustrated in Fig. 1 for illustrative purposes only, it being understood that the structure and layout of all TFTs in the GOA circuit module are not limited to the form illustrated in Fig. 1.
  • the TFT is generally formed of a gate layer 11, a gate insulating layer 12, an active layer sequentially formed on a substrate 10 by a semiconductor process such as deposition. (not shown) and the source/drain layer 13 are patterned.
  • a passivation layer or a protective layer 14 may be covered on the TFT structure.
  • a via hole or a via hole 2 is usually formed in the gate insulating layer to expose a portion of the gate layer 11, in which the source/drain layer 13 and the passivation layer 14 are sequentially stacked. (Fig. 2), or the source/drain layer 13 is not formed in the via 2 (Fig. 3).
  • the first transparent conductive portion 15 is also covered on the passivation layer 14, and the first transparent conductive portion 15 is exposed through the passivation layer 14 and the via 2
  • the pole layer 11 is electrically isolated and configured to be electrically connected to a portion of the gate layer 11 exposed from the via 2 by a suitable means such as soldering.
  • the first transparent conductive portion may be formed of an ITO (Indium Tin Oxide) material or other transparent conductive material. It is also possible to provide a mark 3 at a position where the first transparent conductive portion corresponds to the via hole 2 to indicate the position of the via hole 2.
  • the first transparent conductive portion 15 is electrically connected to the portion of the gate layer 11 exposed from the via hole 2, including the first transparent conductive by laser welding.
  • the portion 15 is fused and contacted or welded to a portion of the gate layer 11 exposed from the via 2, for example, by inserting a probe into the first transparent conductive portion; and then, through the first transparent conductive portion 15 to the gate layer electrically connected thereto
  • each TFT further includes a source and a drain, and a passivation layer 14 is overlying the source and the drain, and the passivation layer 14 is located at each of the source and the drain.
  • a first transparent conductive portion 15 may also be formed on the upper portion, so that when a TFT is to be tested, the three first transparent conductive portions 15 and the TFT may be respectively separated by, for example, soldering, such as laser welding.
  • the gate layer, the source and the drain are electrically connected, and test signals and/or control information are input to the TFT through the three first transparent conductive portions, and the characteristics of the TFT are tested. It can be understood that the manner of testing the TFT characteristics is not limited thereto.
  • the gate layer and its corresponding first transparent conductive portion may be electrically connected to input a control signal, and the signal line of the GOA circuit is directed to the source of the TFT and/or The drain inputs a test signal to test the characteristics of the TFT.
  • the GOA circuit module may further include a signal output lead 4 and a signal line 5.
  • the signal output lead 4 is for outputting a gate line driving signal generated by the GOA circuit module to the display area AA of the display panel.
  • the TFT 1-2 may be the TFT of the last stage in the GOA circuit and is electrically connected to the signal output lead 4.
  • the signal line 5 may include a source power line and/or a drain power line of the TFT, or a clock signal line of the GOA circuit module.
  • the signal line 5 may be electrically connected to at least one of the plurality of TFTs and crossed and electrically isolated from the signal output lead 4. Although only one signal output lead 4 and one set of signal lines 5 are shown in FIG. 1, it can be understood that each stage structure or shift register of the GOA circuit can correspond to one signal output lead and one set of signal lines, A progressive drive of the gate is achieved.
  • the signal line 5 includes at least two sub-signal lines, such as the first signal line 5-1 and the second signal line 5-2, which may be parallel to each other.
  • the first and second signal lines 5-1, 5-2 can be electrically connected to the signal input leads in the GOA circuit module through vias or vias 6-1, 6-2, respectively, such as with the input terminals.
  • the leads 8 at 1-3 are electrically connected.
  • At least one sub-signal line of the signal line 5, such as the first signal line 5-1 is configured to be disconnected to be disconnected from all of the TFTs 1-1, 1-2 or other portions of the GOA circuit module, and is capable of being passed
  • the soldering method is electrically connected to the signal output lead 4.
  • the GOA circuit module may further include a signal line 5, specifically a letter Test pads 7 electrically connected to lines 5-1, 5-2.
  • the test pad 7 can be used to input a suitable test signal to the GOA circuit module as needed to test the characteristics of the GOA circuit module or the TFT therein.
  • the test pad 7 includes a first portion 7-1 electrically coupled to the first signal line 5-1 and a second portion 7-2 electrically coupled to the other signal line 5-2.
  • the first portion 7-1 and the second portion 7-2 of the test pad 7 are spaced apart from each other and electrically connected to each other through the second transparent conductive portion 7-3, that is, the second transparent conductive portion 7-3 is covered and overlapped On part 7-1 and second part 7-2, the electrical connection between the two is achieved.
  • the second transparent conductive portion 7-3 may include or be made of an ITO material.
  • the second transparent conductive portion 7-3 can be cut, for example, by a laser cutting method, so that the electrical connection between the signal line 5-1 and other signal lines, TFTs, and other parts of the GOA circuit module can be broken, so that the signal line 5-1 is in an independent state, and does not affect the signal input of other signal lines at this time.
  • the signal line 5-1 is configured such that it can be electrically connected to the signal output lead 4 in the region 5-4 where it intersects the signal output lead 4, so that the signal output can be detected by the independent signal line 5-1.
  • the output signal on lead 4 For example, the portions where the signal lines 5-1 and the signal output leads 4 cross each other can be joined by soldering, such as laser welding.
  • one sub-signal line (such as the first signal line 5-1) in the signal line 5 and other signal lines, TFTs, and other parts in the GOA circuit module are cut off.
  • Electrical connection For example, a second transparent conductive portion 7-3 electrically connecting the two portions to each other is cut at a gap between the first portion 7-1 and the second portion 7-2 of the test pad 7 by a suitable cutting means such as a laser.
  • a suitable cutting method such as laser, such as in a via or via 6-
  • the input lead 8 is cut between 1, 6-2.
  • the cut signal line 5-1 is electrically connected to the signal output lead 4 to be tested by laser welding; then, the test signal is input to the GOA circuit module through the other sub-signal line at the test pad 7, and the signal is passed.
  • the signal line 5-1 electrically connected to the output lead 4 detects the output signal of the GOA circuit module.
  • the first transparent conductive portion 15 and the first signal line 5-1 may be simultaneously disposed in the GOA circuit module of the present invention, or only the first transparent conductive portion or only the first signal line is disposed at In the GOA circuit module of the present invention.
  • a first signal line may be disposed in a GOA circuit module in which the first transparent conductive portion is not disposed, the first signal line crossing and electrically isolating from the signal output lead, the first signal line being configured to be capable of The other part except the signal output lead is electrically disconnected and electrically connected to the signal output lead by soldering in a region crossing the signal output lead for signal output
  • the first signal line electrically connected to the lead detects the output signal of the GOA circuit module.
  • a plurality of via holes exposing the gate layer are formed in the gate insulating layer, and a first transparent conductive portion such as an ITO layer is covered over each via hole, and the first transparent conductive portion may be formed in the TFT.
  • the gate is led out of the structure; at least one signal line of the GOA circuit can also be divided into two sub-signal lines, which are respectively connected at one end to the separated two parts of the test pad, in the separated The two transparent conductive portions are overlapped or covered on the two portions. In this way, when performing display panel analysis or poor analysis, the first transparent conductive portion above the via hole can be connected to the gate insulating layer exposed in the via hole by laser welding, and the TFTs of the GOA circuit can be conveniently tested.
  • the second transparent conductive portion of the separated two portions of the lap test pad can be cut by the laser to separate one of the sub-signal lines independently.
  • Signal input of the GOA circuit and then connect the independent sub-signal line to the signal output line to be tested, thereby using the test pad input test and detecting the output of the GOA circuit outside the display panel without the need for color film
  • the corner angle of the substrate greatly improves the resolution efficiency and success rate of the display panel, and reduces the complexity of the testing process.
  • the present invention provides a display panel including an array substrate on which the GOA circuit module described in the above embodiment is integrated.
  • the present invention also provides a display device comprising the above display panel.
  • the display device may include a liquid crystal display device such as a liquid crystal television, a mobile phone, an electronic book, a tablet computer, or the like.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

一种GOA电路模块，包括：多个TFT（1-1，1-2），包括依次层叠在基板（10）上的栅极层（11）和栅绝缘层（12）；多个过孔（2），形成在栅绝缘层（12）中以露出栅极层（11）的一部分；和与所述多个多孔（2）一一对应的多个第一透明导电部（15），分别形成在对应的过孔（2）处并与栅极层（11）电隔离，每个第一透明导电部（15）被构造成能够通过焊接方式与栅极层（11）的从对应的过孔（2）露出的部分电连接。还提供测试GOA电路模块的方法、以及包括该GOA电路模块的显示面板和显示装置。

Description

一种GOA电路模块及其测试方法、显示面板和显示装置 技术领域
本发明的实施例一般地涉及显示技术领域，并且具体地，涉及一种用在显示装置中的GOA电路模块及其测试方法、以及包括该GOA电路模块的显示面板和显示装置。
背景技术
近年来，显示器的发展呈现出了高集成度、低成本的发展趋势。随着TFT-LCD(薄膜晶体管-液晶显示器)面板的技术发展，特别是小尺寸屏幕对窄边框的要求越来越高，GOA(Gate On Array，阵列基板行驱动)技术的使用更加频繁。GOA技术可以将栅极开关驱动电路集成在显示面板的阵列基板上，从而可以省掉单独的栅极驱动集成电路部分，以降低显示装置的材料成本和制作成本，并减小面板的边框设计，使得面板更加符合技术的发展趋势。
TFT-LCD生产过程中，显示面板经常出现与GOA电路有关的不良。在解析过程中，需要测试GOA电路的TFT的特性和/或GOA电路的输出信号，以确认不良发生的原因。但是，由于不同显示面板掩模设计的差异，使用GOA电路的显示面板在解析过程中，经常无法测试GOA电路内部的各个TFT(薄膜晶体管)的特性以及GOA电路的输出信号，不能很好的判断不良发生的位置和原因。而且，目前，在测试GOA电路的输出信号时，必须将彩膜基板的一个角撬掉再进行测试，此方法成功率非常低，经常损伤显示面板的GOA电路而无法再进行测试。
发明内容
为了克服传统技术存在的上述和其它问题和缺陷中的至少一种，提出了本发明。
根据本发明的一个方面，提出了一种GOA电路模块，包括：多个TFT，包括依次层叠在基板上的栅极层和栅绝缘层；多个过孔，形成在栅绝缘层中以露出栅极层的一部分；和与所述多个过孔一一对应的多个第一透明导电部，分别形成在 对应的过孔处并与栅极层电隔离，每个第一透明导电部被构造成能够通过焊接方式与栅极层的从对应的过孔露出的部分电连接。
在上述GOA电路模块中，第一透明导电部可以由ITO材料形成。
上述GOA电路模块还可以包括覆盖所述多个过孔所在位置的钝化层，第一透明导电部通过所述钝化层与栅极层电隔离。
在上述GOA电路模块中，所述多个TFT还可以包括源/漏极层，源/漏极层在所述多个过孔所在的区域内位于栅极层和钝化层之间。
上述GOA电路模块还可以包括信号输出引线和第一信号线，所述第一信号线与信号输出引线交叉且电隔离，所述第一信号线被构造成能够与GOA电路模块中除信号输出引线之外的其它部分断开电连接并在它与所述信号输出引线相交叉的区域中通过焊接方式与信号输出引线电连接。
可替换地，根据本发明的另一个方面，提供了一种GOA电路模块，包括信号输出引线和第一信号线，所述第一信号线与信号输出引线交叉且电隔离，并且所述第一信号线被构造成能够与GOA电路模块中除信号输出引线之外的其它部分断开电连接并在它与所述信号输出引线相交叉的区域中通过焊接方式与信号输出引线电连接。
上述GOA电路模块还可以包括第二信号线，所述第二信号线连接到GOA电路模块的信号输入引线。
上述GOA电路模块还可以包括测试垫，所述测试垫包括与第一信号线电连接的第一部分和与第二信号线电连接的第二部分，所述第一部分和所述第二部分彼此隔开。
在上述GOA电路模块中，所述第一信号线也可以连接到GOA电路模块的信号输入引线，所述测试垫的所述第一部分和所述第二部分可以通过能够被切断的第二透明导电部彼此电连接。
在上述GOA电路模块中，所述第二透明导电部可以由ITO材料形成。
在上述GOA电路模块中，第一和/或第二信号线可以包括所述多个TFT中的至少一个的源极电源线和/或漏极电源线。
根据本发明的另一个方面，还提供了一种显示面板，其包括阵列基板，该阵列基板上集成有上述GOA电路模块。
根据本发明的再一个方面，提供了一种包括上述显示面板的显示装置。
根据本发明的又一个方面，提供了一种测试上述GOA电路模块的方法，包括下述步骤：将第一透明导电部与栅极层的从对应的过孔露出的部分电连接；通过第一透明导电部向与它电连接的栅极层输入栅极控制信号；向与第一透明导电部电连接的栅极层相关联的TFT输入测试信号，并检测该TFT的输出信号，以确定该TFT的特性。
在上述方法中，可以采用激光焊接方式将过孔中的第一透明导电部与栅极层电连接。
上述方法还可以包括下述步骤：切断所述第一信号线与所述GOA电路模块中除所述信号输出引线以外的其他部分之间的电连接；将所述第一信号线与信号输出引线电连接；以及通过所述第一信号线检测GOA电路模块的输出信号。需要说明的是，这里说明的技术特征也适用于设置有第一信号线但是未设置第一透明导电部的GOA电路模块。
在上述方法，可以采用激光切断方式断开所述第一信号线与所述GOA电路模块中除所述信号输出引线以外的其他部分之间的电连接。
在上述方法，可以采用激光焊接方式将所述第一信号线与所述信号输出引线电连接。
通过下文中参照附图对本发明所作的详细描述，本发明的其它目的和优点将显而易见，并可帮助对本发明有全面的理解。
附图说明
通过参考附图能够更加清楚地理解本发明的特征和优点，附图是示意性的而不应理解为对本发明进行任何限制，在附图中：
图1是根据本发明的一个示例性实施例的GOA电路模块的示意图；
图2是示出沿图1中的B-B线截取的结构的一个示例的剖视图；以及
图3是示出沿图1中的B-B线截取的结构的另一个示例的剖视图。
具体实施方式
为使本发明的目的、技术方案和优点更加清楚明白，以下结合具体实施例，并参照附图，对本发明进一步详细说明。
另外，在下面的详细描述中，为便于说明，阐述了许多具体的细节以提供对本发明的实施例的全面理解。然而明显地，一个或多个实施例在没有这些具体细节的情况下也可以被实施。在其它情况下，公知的结构和装置以图示的方式体现以简化附图。
根据本发明的一个总的构思，提供了一种GOA电路模块，包括：多个TFT，包括依次层叠在基板上的栅极层和栅绝缘层；多个过孔，形成在栅绝缘层中以露出栅极层的一部分；和与所述多个过孔一一对应的多个第一透明导电部，分别形成在对应的过孔处并与栅极层电隔离，每个第一透明导电部被构造成能够通过焊接方式与栅极层的从对应的过孔露出的部分电连接。从而，在测试时，以合适的方式将第一透明导电部与栅极层的从过孔露出的部分电连接，能够对GOA电路模块中的各个TFT的特性进行测试。
图1示出了根据一种示例性的实施例的GOA电路模块，其作为栅极开关驱动电路用在诸如TFT-LCD之类的显示装置中。如本领域技术人员已知的那样，GOA电路模块包括通常由多个TFT(薄膜晶体管)(如图1中示出的TFT 1-1、1-2)形成的多级结构或移位寄存器，每一级结构或移位寄存器的输出端连接至显示面板中的对应的一条栅线，从而能够以逐行扫描方式驱动显示面板以显示图像。在图1中仅为了说明目的示意性地示出了TFT 1-1、1-2，可以理解，GOA电路模块中的所有TFT的结构和布局不限于图1中图示的形式。
如本领域技术人员可以理解的那样，并且如图2和3所示，TFT通常由采用诸如沉积之类的半导体工艺依次形成在基板10上的栅极层11、栅绝缘层12、有源层(未示出)和源/漏极层13构图而成。此外，在TFT结构上还可以覆盖一层钝化层或保护层14。通常，为了将TFT的栅极引出，通常在栅绝缘层中形成过孔或通孔2以露出栅极层11的一部分，在过孔2中源/漏极层13和钝化层14依次层叠(图2)，或者在过孔2中不形成源/漏极层13(图3)。
根据本发明的一个实施例，至少在每个过孔2处，还在钝化层14上覆盖第一透明导电部15，第一透明导电部15通过钝化层14与过孔2中露出栅极层11电隔离，并被构造成能够通过合适的手段(如焊接)与栅极层11的从过孔2露出的部分电连接。在一个示例中，第一透明导电部可以由ITO(氧化铟锡)材料或其它透明导电材料形成。还可以在第一透明导电部与过孔2对应的位置处设置标志3，以指示过孔2的位置。
根据该实施例，在需要对GOA电路模块进行测试时，首先，将第一透明导电部15与栅极层11的从过孔2露出的部分电连接，包括采用激光焊接方式使第一透明导电部15熔融并与栅极层11从过孔2露出的部分接触或熔接，例如采用探针***第一透明导电部中；然后，通过第一透明导电部15向与它电连接的栅极层输入栅极控制信号，并向与第一透明导电部电连接的栅极层相关联的TFT输入测试信号，并检测该TFT的输出信号，从而确定该TFT的特性，例如，用于判断该TFT是否存在故障，或者判断GOA电路模块中不良发生的位置和/或原因。
在一个未示出的示例中，每个TFT还包括源极和漏极，钝化层14覆盖在源极和漏极上，在钝化层14位于源极和漏极中的每一个的正上方的部分上也可以形成有一个第一透明导电部15，从而在需要对一个TFT进行测试时，可以通过例如焊接，如激光焊接的方式，将三个第一透明导电部15分别与该TFT的栅极层、源极和漏极电连接，通过这三个第一透明导电部向该TFT输入测试信号和/或控制信息，测试该TFT的特性。可以理解，测试TFT特性的方式不限于此，例如，可以仅将栅极层与它对应的第一透明导电部电连接以输入控制信号，并通过GOA电路的信号线向TFT的源极和/漏极输入测试信号，以测试TFT的特性。
如图1所示，GOA电路模块还可以包括信号输出引线4和信号线5。信号输出引线4用于向显示面板的显示区域AA输出由GOA电路模块产生的栅极行驱动信号。在图1的示例中，TFT 1-2可以是GOA电路中最后一级的TFT并与信号输出引线4电连接。信号线5可以包括TFT的源极电源线和/或漏极电源线、或GOA电路模块的时钟信号线。信号线5可以与多个TFT中的至少一个电连接，并与信号输出引线4交叉且电隔离。虽然图1中仅示出了一条信号输出引线4和一组信号线5，但可以理解，GOA电路的每一级结构或移位寄存器都可以对应于一条信号输出引线和一组信号线，以实现栅极的逐行驱动。
根据本发明的另一个示例性实施例，信号线5包括至少两条子信号线，如第一信号线5-1和第二信号线5-2，它们可以是彼此平行的。如图1所示，第一和第二信号线5-1、5-2可以分别通过过孔或通路6-1、6-2与GOA电路模块中的信号输入引线电连接，如与输入端1-3处的引线8电连接。信号线5的至少一条子信号线，如第一信号线5-1被构造成能够被切断以与所有的TFT1-1、1-2或GOA电路模块中的其它部分断开连接，并能够通过焊接方式与信号输出引线4电连接。
在图1中示出的示例中，GOA电路模块还可以包括与信号线5，具体是与信 号线5-1、5-2电连接的测试垫7。根据需要，可以利用测试垫7向GOA电路模块输入合适的测试信号，以测试GOA电路模块或其中的TFT的特性。
在一个示例中，如图1所示，测试垫7包括与第一信号线5-1电连接的第一部分7-1和与其它信号线5-2电连接的第二部分7-2。测试垫7的第一部分7-1和第二部分7-2是彼此隔开的并通过第二透明导电部7-3彼此电连接，即第二透明导电部7-3覆盖并搭接在第一部分7-1和第二部分7-2上，实现二者的电连接。示例性地，第二透明导电部7-3可以包括ITO层或由ITO材料制成。第二透明导电部7-3是能够被切断的，例如通过激光切断方式，从而能够断开信号线5-1与其它信号线、TFT以及GOA电路模块中的其它部分的电连接，使信号线5-1处于独立状态，此时并不影响其它信号线的信号输入。
在本发明，信号线5-1被构造成使得在它与信号输出引线4相交叉的区域5-4中能够与信号输出引线4电连接，从而可以利用独立的信号线5-1检测信号输出引线4上的输出信号。例如，可以通过焊接方式，如激光焊接，将信号线5-1与信号输出引线4之间相互交叉的部位连接在一起。
根据本发明的实施例，在需要测试GOA电路模块时，首先切断信号线5中的一条子信号线(如第一信号线5-1)与其它信号线、TFT以及GOA电路模块中的其它部分的电连接。例如，采用合适的切断方式(如激光)在测试垫7的第一部分7-1和第二部分7-2之间的间隙处切断将这两部分彼此电连接的第二透明导电部7-3，以断开信号线5-1与其它信号线的电连接；此外，采用激光等合适的切断方式切断输入引线8与信号线5-1之间的电连接，如在过孔或通路6-1、6-2之间将输入引线8切断。接着，如通过激光焊接的方式将切断的信号线5-1与需要测试的信号输出引线4电连接；然后，在测试垫7处通过其它子信号线向GOA电路模块输入测试信号，通过与信号输出引线4电连接的信号线5-1检测GOA电路模块的输出信号。
需要说明的是，根据需要，上述第一透明导电部15和第一信号线5-1可以同时设置在本发明的GOA电路模块中，或者仅第一透明导电部或仅第一信号线设置在本发明的GOA电路模块中。例如，可以在未设置第一透明导电部的GOA电路模块中设置第一信号线，所述第一信号线与信号输出引线交叉且电隔离，所述第一信号线被构造成能够与所述信号输出引线以外的其他部分断开电连接并在与信号输出引线相交叉的区域通过焊接方式与信号输出引线电连接，以便通过与信号输出 引线电连接的第一信号线检测GOA电路模块的输出信号。
另一方面，在栅绝缘层中形成有露出栅极层的多个过孔，在每个过孔上方覆盖一层第一透明导电部，如ITO层，第一透明导电部可以是在形成TFT的栅极引出结构时留下的；还可以将GOA电路的至少一条信号线分为两条子信号线，这两条子信号线在一端处分别连接至测试垫的分离的两部分，在分离的这两部分上搭接或覆盖第二透明导电部。这样，在进行显示面板解析或不良分析时，可以通过激光焊接的方法，将过孔上方的第一透明导电部与过孔中露出的栅极绝缘层相连，便捷地测试GOA电路的各个TFT的特性；另外，在需要测试GOA电路的输出信号时，可以通过激光将搭接测试垫的分离的两部分的第二透明导电部切断，将子信号线中的一条独立出来，此时并不影响GOA电路的信号输入，然后将这条独立的子信号线与需要测试的信号输出线相连，由此可以在显示面板的外部使用测试垫输入测试并检测GOA电路的输出，而不需要将彩膜基板撬角，大大提高显示面板的解析效率和成功率，降低测试过程的复杂性。
此外，本发明还提供了一种显示面板，其包括阵列基板，在该阵列基板上集成有在上述实施例中描述的GOA电路模块。
进一步，本发明还提供了一种显示装置，其包括上述显示面板。该显示装置可以包括液晶显示装置，如液晶电视、手机、电子书、平板电脑等。
尽管已经示出和描述了本发明的实施例，对于本领域的普通技术人员而言，可以理解在不脱离本发明的原理和精神的情况下可以对这些实施例进行变化，本发明的范围由所附权利要求及其等同物限定。

Claims (16)

  1. 一种GOA电路模块，包括：
    多个TFT，包括依次层叠在基板上的栅极层和栅绝缘层；
    多个过孔，形成在栅绝缘层中以露出栅极层的一部分；和
    与所述多个过孔一一对应的多个第一透明导电部，分别形成在对应的过孔处并与栅极层电隔离，每个第一透明导电部被构造成能够通过焊接方式与栅极层的从对应的过孔露出的部分电连接。
  2. 根据权利要求1所述的GOA电路模块，其中第一透明导电部由ITO材料形成。
  3. 根据权利要求1所述的GOA电路模块，还包括覆盖所述多个过孔所在位置的钝化层，第一透明导电部通过所述钝化层与栅极层电隔离。
  4. 根据权利要求3所述的GOA电路模块，其中所述多个TFT还包括源/漏极层，源/漏极层在所述多个过孔所在的区域内位于栅极层和钝化层之间。
  5. 根据权利要求1-4中任一项所述的GOA电路模块，包括信号输出引线和第一信号线，
    所述第一信号线与信号输出引线交叉且电隔离，并且
    所述第一信号线被构造成能够与GOA电路模块中除信号输出引线之外的其它部分断开电连接并在它与所述信号输出引线相交叉的区域中通过焊接方式与信号输出引线电连接。
  6. 根据权利要求5所述的GOA电路模块，还包括第二信号线，所述第二信号线连接到GOA电路模块的信号输入引线。
  7. 根据权利要求6所述的GOA电路模块，还包括测试垫，所述测试垫包括与第一信号线电连接的第一部分和与第二信号线电连接的第二部分，所述第一部分和所述第二部分彼此隔开。
  8. 根据权利要求7所述的GOA电路模块，其中，所述第一信号线也连接到GOA电路模块的信号输入引线，所述测试垫的所述第一部分和所述第二部分通过能够被切断的第二透明导电部彼此电连接。
  9. 根据权利要求8所述的GOA电路模块，其中所述第二透明导电部由ITO材料形成。
  10. 一种显示面板，包括阵列基板，该阵列基板上集成有权利要求1-9中任一项所述的GOA电路模块。
  11. 一种显示装置，包括权利要求10所述的显示面板。
  12. 一种测试权利要求1所述的GOA电路模块的方法，包括下述步骤：
    将第一透明导电部与栅极层的从对应的过孔露出的部分电连接；
    通过第一透明导电部向与它电连接的栅极层输入栅极控制信号；
    向与第一透明导电部电连接的栅极层相关联的TFT输入测试信号，并检测该TFT的输出信号，以确定该TFT的特性。
  13. 根据权利要求12所述的方法，包括采用激光焊接方式将过孔处的第一透明导电部与栅极层电连接。
  14. 根据权利要求12或13所述的方法，所述GOA电路模块包括信号输出引线和第一信号线，所述第一信号线与信号输出引线交叉且电隔离，所述第一信号线被构造成能够与所述GOA电路模块中除所述信号输出引线以外的其他部分断开电连接并在它与所述信号输出引线相交叉的区域中通过焊接方式与信号输出引线电连接，所述方法包括下述步骤：
    切断所述第一信号线与所述GOA电路模块中除所述信号输出引线以外的其他部分之间的电连接；
    将所述第一信号线与信号输出引线电连接；以及通过所述第一信号线检测GOA电路模块的输出信号。
  15. 根据权利要求14所述的方法，包括采用激光切断方式断开所述第一信号线与所述GOA电路模块中除所述信号输出引线以外的其他部分之间的电连接。
  16. 根据权利要求14所述的方法，包括采用激光焊接方式将所述第一信号线与所述信号输出引线电连接。
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