WO2016002046A1 - クロマトグラフ質量分析装置及びプログラム - Google Patents
クロマトグラフ質量分析装置及びプログラム Download PDFInfo
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- WO2016002046A1 WO2016002046A1 PCT/JP2014/067811 JP2014067811W WO2016002046A1 WO 2016002046 A1 WO2016002046 A1 WO 2016002046A1 JP 2014067811 W JP2014067811 W JP 2014067811W WO 2016002046 A1 WO2016002046 A1 WO 2016002046A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/86—Signal analysis
- G01N30/8696—Details of Software
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/86—Signal analysis
- G01N30/8658—Optimising operation parameters
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/86—Signal analysis
Definitions
- the present invention relates to a chromatograph mass spectrometer combining a chromatograph and a mass spectrometer, such as a gas chromatograph mass spectrometer (GC-MS), a liquid chromatograph mass spectrometer (LC-MS), and more particularly, to a mass
- a chromatographic mass spectrometer that performs measurements such as selected ion monitoring (SIM) measurement, multiple reaction monitoring (MRM) measurement (sometimes referred to as “selective reaction monitoring (SRM) measurement”) for known compounds in an analyzer.
- SIM selected ion monitoring
- MRM multiple reaction monitoring
- SRM selective reaction monitoring
- a chromatograph combining a chromatograph such as a gas chromatograph (GC) or liquid chromatograph (LC) and a mass spectrometer such as a quadrupole mass spectrometer is used.
- a mass spectrometer such as a quadrupole mass spectrometer.
- Graph mass spectrometers are widely used.
- ions having a specific mass to charge ratio (m / z) specified in advance are selectively detected repeatedly. The SIM measurement method is used.
- the first quadrupole is used.
- An ion having a specific mass-to-charge ratio (precursor ion) is selected in the mass filter, the ion is cleaved by collision-induced dissociation (CID) in the collision cell, and a specific mass-to-charge ratio among the product ions generated thereby.
- An MRM measurement method is used in which ions having a are selected and detected in a second-stage quadrupole mass filter.
- the MRM measurement method has the advantage that the signal-to-noise ratio can be improved and the quantification can be performed with higher sensitivity because the influence of the contaminant component can be removed by the two-stage quadrupole mass filter.
- one of the measurement conditions corresponds to the target compound according to the retention time of multiple target compounds. It is necessary to set a mass-to-charge ratio value.
- a mass-to-charge ratio value For example, in the chromatograph mass spectrometers described in Patent Documents 1 and 2, if an analyst prepares a compound table in which information about a compound to be measured is created, measurement conditions can be used based on the description information in the compound table. A function to automatically create a parameter table is provided. The parameter table automatic creation function in the conventional chromatograph mass spectrometer will be described with a specific example.
- FIG. 8 is an example of a setting input screen for allowing an analyst to set measurement conditions.
- a compound table display field 81 in which a compound table is displayed, and a measurement loop time input for allowing an analyst to input a set value of a measurement point time interval called a measurement loop time.
- a column 83 is provided.
- the compound table displayed in the compound table display field 81 includes information such as a compound name, an estimated retention time, a process time, a mass-to-charge ratio of quantitative ions, and a mass-to-charge ratio of confirmation ions for each target compound.
- Quantitative ions are the ions that most characterize the compound.
- Confirmation ions are ions that characterize the compound and have a mass-to-charge ratio different from quantitative ions. This confirmation ion is generally used to confirm that the chromatogram peak of the quantitative ion is derived from the target compound using the relative ratio between the signal intensity of the confirmed ion peak and the signal intensity of the quantitative ion peak on the mass spectrum. Used.
- the retention time is a predicted value of the time to elute from the liquid chromatograph column.
- the process time is a parameter for specifying the time range in which the compound should be measured with the predicted retention time as the center, and the required time width is set including a margin that can absorb fluctuations in peak width and retention time. Is done. Therefore, even when the retention time of a certain compound fluctuates, the peak of the compound appears surely within the range of the retention time of the compound ⁇ process time.
- FIG. 9 shows the relationship between the peak of a certain compound on the chromatogram, the retention time, and the process time.
- segments are set by appropriately dividing the measurement time based on the compound table as described above.
- a segment is a minimum time unit for setting measurement conditions such as an ion condition to be measured, and the measurement conditions can be switched for each segment.
- the segment boundary is automatically set at a time when the retention time interval of the compound to be measured is sufficiently large.
- [Retention time of a certain compound X + A] ⁇ [Retention time of the compound X + 1 eluting next to the compound X ⁇ A] (where ⁇ A: process time)
- ⁇ A process time
- the elution time range for compound X (retention time ⁇ A) and the elution time range for compound X + 1 do not overlap, typically the retention time of compound X and the retention time of compound X + 1
- segment boundary is set at an intermediate time position, and the measurement time is divided into a plurality of segments by the boundary.
- FIG. 10 is a chromatogram for explaining the segmentation technique.
- the segment boundary is not set. That is, in this case, the compound X and the compound X + 1 belong to the same segment.
- a segment boundary is defined between the retention time of Compound X and the retention time of Compound X + 1. Therefore, compound X and compound X + 1 belong to different segments. According to such an algorithm, segments can be defined for all compounds listed in the compound table (or some compounds specified by the analyst).
- FIG. 11 is an example of a parameter table automatically created based on the compound table shown in FIG.
- the measurement conditions for one compound are summarized in one line, and in each line, in addition to the compound name, the number of the segment in which the compound is measured (the segment number is indicated by “#” below). ), Measurement start time, measurement end time, event time, mass-to-charge ratio of ions to be measured, dwell time, and the like.
- the mass-to-charge ratio of the ions to be measured the mass-to-charge ratio m / z-1 of the quantitative ion and the mass-to-charge ratios m / z-2 and m / z-3 of the confirmation ion of the compound to be measured are set.
- the measurement start time and measurement end time are the start time and end time of the segment.
- the event time is the time taken for one measurement (referred to as “measurement event”) for one compound.
- the dwell time is the time for the detector to actually take in and accumulate ions, that is, the data collection time.
- FIGS. 8 and 11 there is a sufficient time interval satisfying the conditional expression (1) between the compound C and the compound D eluting from the column next, so that a segment boundary is set there.
- the front of the boundary is segment # 1
- the rear is segment # 2.
- a segment boundary is also set there. It becomes segment # 3.
- the compounds A to C are assigned to be measured during the period of the segment # 1 in which the measurement start time is 9.5 [min] and the measurement end time is 10.8 [min]
- the compound D is assigned the measurement start time of 10.8. [min]
- the measurement end time is 12.0 [min]
- FIG. 12 is a schematic diagram showing the correspondence between the segment and the compound shown in FIG. 11 with the horizontal axis representing time.
- the event time is automatically calculated from the set value of the measurement loop time input by the analyst in the measurement loop time input field 83 of the setting input screen 80 and the number of compounds measured in one segment.
- the dwell time is the time when the detector actually takes ions, and the event time is the waiting time until the voltage stabilizes when the applied voltage to the quadrupole mass filter is changed in addition to this dwell time.
- Time hereinafter referred to as “voltage stabilization wait time”.
- the dwell time depends on the number of ions to be measured during one event time (number of ions to be measured).
- dwell time T D for each ion obtained by the following equation (2).
- T D (event time T I -voltage stabilization wait time) / [number of ions to be measured] (2)
- T D (event time T I -voltage stabilization wait time) / [number of ions to be measured] (2)
- the above dwell time affects measurement sensitivity (S / N ratio) and peak area reproducibility.
- the dwell time is too short, the influence of external factors such as drift and noise is relatively likely to appear in the signal intensity data obtained by the detector, making it difficult to ensure sufficient measurement reproducibility. . Therefore, in order to perform accurate quantification, it is necessary to secure a dwell time longer than a certain extent.
- ions derived from each compound must be measured at every measurement time interval determined by the measurement loop time. Therefore, if the number of compounds assigned to one segment is large, the measurement time assigned to one compound (the above event time) is shortened, and accordingly, the dwell time is also shortened.
- the event time is determined by dividing the measurement loop time equally by the number of compounds as described above, and the event time is further determined for each ion (measurement target ion) to be measured for each compound. Since the dwell time is determined by evenly allocating to each other, it is not easy to increase the dwell time for only a specific compound. For example, simply increasing the event time of the compound will result in the measurement loop time not meeting the desired time. It is also possible to adjust the event time of other compounds so as to satisfy the desired measurement loop time, but when the number of compounds to be measured increases, it becomes a very complicated and time-consuming work.
- the present invention has been made in order to solve the above-mentioned problems, and a first object thereof is a part of a plurality of compounds to be measured in a chromatograph mass spectrometer having a parameter table automatic creation function. It is an object of the present invention to provide a chromatographic mass spectrometer that can be easily set to perform high-sensitivity analysis only on the above compounds.
- a second object of the present invention is a chromatograph mass spectrometer equipped with a parameter table automatic creation function, which is highly sensitive to only some of the plurality of ions to be measured for the compound to be measured.
- An object of the present invention is to provide a chromatographic mass spectrometer that can be easily set to perform analysis.
- the chromatograph mass spectrometer according to the first invention which has been made to solve the above problems, comprises a chromatograph for separating a plurality of compounds in a sample in a time direction, and ions derived from the compounds separated by the chromatograph. A selected ion with respect to the mass-to-charge ratio of one or more specific ions before and after the chromatogram peak corresponding to the target compound.
- a compound table holding means for storing a compound table including information for specifying at least an elution time range and a mass-to-charge ratio of one or more ions to be measured for each compound to be measured; b) a high-sensitivity analysis designation receiving means for allowing an analyst to specify whether or not to perform high-sensitivity analysis for each compound included in the compound table; c) A segment that is a measurement time unit by setting a boundary at a time position where the elution time ranges of each compound included in the compound table do not overlap, and each segment is assigned one or more measurement target compounds.
- SIM monitoring
- MRM multiple reaction monitoring
- each compound is divided by dividing a measurement loop time which is a measurement point time interval of each ion given in advance according to the number of compounds allocated to the segment.
- An event time determining means for determining an event time which is a measurement time for, e) dwell time determining means for determining a dwell time that is a data collection time for each mass to charge ratio based on the event time determined by the event time determining means and the number of ions to be measured for each compound;
- the event time determining means includes a target compound for high sensitivity analysis among the compounds assigned to the segment, the high sensitivity analysis for the event time of another compound assigned to the same segment is performed.
- the measurement loop time is divided so that the ratio of the event time of the target compound becomes a predetermined ratio.
- the analyst simply designates the target compound for high-sensitivity analysis by the high-sensitivity analysis designation receiving means without changing the measurement loop time.
- the event time of some compounds can be set to be longer by a predetermined ratio than the event times of other compounds assigned to the same segment. Increasing the event time also increases the dwell time for one or more ions to be measured for the compound, thereby improving the measurement sensitivity of the compound.
- the chromatograph mass spectrometer according to the second invention which has been made to solve the above problems, comprises a chromatograph for separating a plurality of compounds in a sample in a time direction, and ions derived from the compounds separated by the chromatograph. A selected ion with respect to the mass-to-charge ratio of one or more specific ions before and after the chromatogram peak corresponding to the target compound.
- a compound table holding means for storing a compound table including information for specifying at least an elution time range and a mass-to-charge ratio of one or more ions to be measured for each compound to be measured; b) high-sensitivity analysis designation receiving means for allowing an analyst to designate whether or not to perform high-sensitivity analysis for each mass-to-charge ratio included in the compound table; c) A segment that is a measurement time unit by setting a boundary at a time position where the elution time ranges of each compound included in the compound table do not overlap, and each segment is assigned one or more measurement target compounds.
- SIM monitoring
- MRM multiple reaction monitoring
- each segment set by the segment setting means measurement for each compound is performed based on a measurement loop time that is a measurement point time interval of each ion given in advance and the number of compounds assigned to the segment.
- An event time determining means for determining an event time which is a time; e) Data collection for each mass to charge ratio by dividing the event time determined for each compound by the event time determining means according to the number of mass to charge ratios to be measured for the compound corresponding to the event time.
- Dwell time determining means for determining a dwell time which is a time; Have The dwell time determining means measures the same compound when the mass-to-charge ratio to be measured for the compound corresponding to the event time includes the mass-to-charge ratio designated as the target of the sensitive analysis.
- the event time is divided so that the ratio of the dwell time of the mass-to-charge ratio designated as the target of the high-sensitivity analysis to the dwell time of other power-to-mass ratio becomes a predetermined ratio. .
- the analyzer automatically designates the mass-to-charge ratio to be subjected to the high-sensitivity analysis by the high-sensitivity analysis designation receiving means, and the measurement loop time is automatically set. And without changing the event time, the dwell time of some mass to charge ratios can be set to be longer than the dwell time of other mass to charge ratios to be measured for the same compound by a predetermined ratio. it can.
- a chromatograph mass spectrometer for solving the above problems includes a chromatograph for separating a plurality of compounds in a sample in a time direction, and ions derived from the compounds separated by the chromatograph. A selected ion with respect to the mass-to-charge ratio of one or more specific ions before and after the chromatogram peak corresponding to the target compound.
- each segment set by the segment setting means measurement for each compound is performed based on a measurement loop time that is a measurement point time interval of each ion given in advance and the number of compounds assigned to the segment.
- An event time determining means for determining an event time which is a time;
- Data collection for each mass to charge ratio by dividing the event time determined for each compound by the event time determining means according to the number of mass to charge ratios to be measured for the compound corresponding to the event time.
- Dwell time determining means for determining a dwell time which is a time; Have When the compound corresponding to the event time is designated as a target for high sensitivity analysis, the dwell time determining means measures the compound with respect to the dwell time of the mass-to-charge ratio of the confirmation ion to be measured for the compound. The event time is divided so that the dwell time ratio of the mass-to-charge ratio of the power quantitative ion becomes a ratio given in advance.
- the mass of the quantitative ion to be measured for the designated compound The charge ratio is automatically designated as the target for high sensitivity analysis. Then, without changing the measurement loop time and the event time, the dwell time related to the mass-to-charge ratio of the quantitative ion of the compound is made longer than the dwell time related to the mass-to-charge ratio of the confirmation ion of the compound by a predetermined ratio. It becomes possible.
- the “elution time range” of a certain compound is assumed to be the peak width, peak position fluctuation, etc. before and after the predicted retention time of the compound. This is a time range set by securing a predetermined time width (that is, the above-described process time). Since the time width varies depending on how much the margin is taken into consideration, the time width may be set as a default in advance, but may be set by an analyst.
- the value of the elution time range itself may be described as the information for specifying the elution time range, but in addition, for example, the predicted retention time and the time width are described. Alternatively, only the predicted holding time may be described.
- the elution time range can be uniquely determined. If only the retention time is defined in association with each compound in the compound table, the elution time range of each compound can be calculated from the retention time and the default or externally specified time width. is there.
- the above-mentioned “measurement loop time that is the measurement point time interval of each ion given in advance” and “predetermined ratio” may be set as defaults in advance, but can be input and set by the analyst. You may do it.
- the chromatograph mass spectrometer in the chromatograph mass spectrometer equipped with the parameter table automatic creation function, among the plurality of compounds to be measured, only a part of the compounds is high. Sensitivity analysis can be set with a simple operation. Further, according to the chromatograph mass spectrometer according to the second invention or the third invention, in the chromatograph mass spectrometer equipped with the parameter table automatic creation function, some of the plurality of ions to be measured for each compound It becomes possible to set a highly sensitive analysis for only ions with a simple operation. *
- FIG. 9 is a schematic diagram showing a correspondence relationship between a segment created from the compound table shown in FIG. 8 and a compound.
- FIG. 1 is a block diagram of the main part of the LC-MS according to the first embodiment.
- the LC-MS of this example includes a liquid chromatograph unit (LC unit) 10 that separates various compounds contained in a sample in a time direction, and a mass spectrometer unit (MS unit) 20 that performs mass analysis of the separated various compounds.
- a system controller 30 connected to the LC unit 10 and the MS unit 20, and a control for controlling the LC unit 10 and the MS unit 20 through the system controller 30 and processing data output from the MS unit 20.
- Processing unit 40 is a block diagram of the main part of the LC-MS according to the first embodiment.
- LC unit 10 liquid chromatograph unit
- MS unit mass spectrometer unit
- the LC unit 10 includes a mobile phase container 11 that stores a mobile phase, a liquid feed pump 12 that sucks the mobile phase and sends it at a constant flow rate, an injector 13 that injects a sample into the mobile phase at a predetermined timing, and various compounds in the sample. It includes a column 14 that separates in the time direction.
- the MS unit 20 includes a spray nozzle 21 for electrospraying and ionizing an eluate containing a compound eluting from the column 14 in an air atmosphere, a heating capillary 22 for guiding ions derived from the compound in the sample into a vacuum atmosphere, and ions.
- Ion guides 23 and 24 that are transported to the subsequent stage while being converged, a quadrupole mass filter 25 that passes only ions having a specific mass-to-charge ratio, and a detector that detects ions that have passed through the quadrupole mass filter 25 26.
- the detection signal obtained by the detector 26 of the MS unit 20 is converted into a digital value by an A / D converter (not shown) and then input to the control / processing unit 40 via the system controller 30.
- the control / processing unit 40 performs a predetermined calculation process to create a mass spectrum and a chromatogram and to perform a quantitative analysis.
- the entity of the control / processing unit 40 is a computer such as a personal computer, a central processing unit (CPU) 41, which is a central processing unit 41, a memory 42, an input unit 43 including a keyboard and a mouse, an LCD (Liquid Crystal Display). Are connected to each other, and a storage unit 50 composed of a large-capacity storage device such as a hard disk or an SSD (Solid State Drive).
- the storage unit 50 stores an OS (Operating System) 51, a parameter table creation program 52 (program according to the present invention), a setting content storage unit 53 (corresponding to the compound table holding unit in the present invention), and parameters.
- a table storage unit 54 is provided.
- the control / processing unit 40 further includes an interface (I / F) 45 for managing direct connection with an external device and connection with the external device via a network such as a LAN (Local Area Network).
- the interface 45 is connected to the system controller 30 via the network cable NW (or wireless LAN).
- FIG. 1 shows a setting input receiving unit 55, a segment setting unit 56, an event time determining unit 57, and a dwell time determining unit 58 as related to the parameter table creation program 52.
- the parameter table creation program 52 is not necessarily a single program, and may be a function incorporated in a part of a program for controlling the LC unit 10 and the MS unit 20, for example. It doesn't matter.
- the quadrupole mass filter 25 of the MS unit 20 is driven in the SIM measurement mode so as to selectively pass a mass-to-charge ratio of ions derived from a compound to be quantified (hereinafter referred to as a target compound).
- the injector 13 injects a sample into the mobile phase while the mobile phase is being fed to the column 14 at a substantially constant flow rate by the liquid feed pump 12.
- the injected sample is introduced into the column 14 along the flow of the mobile phase, and various compounds in the sample are temporally separated while passing through the column 14.
- the target compound elutes from the outlet of the column 14 near the time when a predetermined time has passed with respect to the sample injection time (that is, near the retention time of the target compound), and the target compound reaches the spray nozzle 21 of the MS section 20 and Ions derived from the compound are generated.
- the ions are introduced into the quadrupole mass filter 25 through the heating capillary 22 and the ion guides 23 and 24.
- the quadrupole mass filter 25 selectively passes only ions having a specific mass-to-charge ratio derived from the target compound, and the passed ions reach the detector 26 and are detected.
- the control / processing unit 40 creates a mass chromatogram (also referred to as an extracted ion chromatogram) indicating the relationship between the ion intensity and the time passage at the specific mass-to-charge ratio based on the data based on the detection signal obtained from the detector 26. .
- the control / processing unit 40 extracts a peak derived from the target compound on the mass chromatogram, and calculates the peak area value. Then, the concentration of the target compound is calculated with reference to a calibration curve showing the relationship between the peak area value and the concentration (content) of the target compound, which are created in advance based on the results of measuring a standard sample or the like. If there are multiple compounds to be quantified, create a mass chromatogram based on the data obtained by performing SIM measurement for different mass-to-charge ratios for each compound, and in the same way as above, the peak area value derived from the target compound. And the concentration of the compound is calculated from the area value.
- the control / processing unit 40 controls the operations of the LC unit 10 and the MS unit 20 according to the parameter table stored in the parameter table storage unit 54 of the storage unit 50.
- the control / processing unit 40 includes a parameter table creation program 52 that automatically creates a parameter table from the compound table, and this parameter table creation program 52 has a characteristic function that is different from conventional parameter table automatic generation. have.
- FIG. 2 is a flowchart of the parameter table creation process in the LC-MS of this embodiment.
- the setting input receiving unit 55 displays a setting input screen 60 as shown in FIG. (Step S11).
- the setting input screen 60 is provided with a compound table display field 61 for displaying a compound table for which a parameter table is to be created, a measurement loop time input field 63, and an improvement ratio input field 64.
- a compound table display field 61 for displaying a compound table for which a parameter table is to be created
- a measurement loop time input field 63 for measuring a measurement loop time input field 63
- an improvement ratio input field 64 a compound table displayed in the compound table display column 61
- one line corresponds to one compound, and a plurality of compounds to be measured are measured for the compound name, retention time, process time, and the compound, respectively.
- each row of the compound table is provided with a check box 62 for designating whether or not a compound corresponding to each row is a target of the high sensitivity mode as a characteristic element of the present embodiment.
- the analyst inputs the compound name, retention time, process time, and mass-to-charge ratio (m / z-1, m / z-2, and m / z-3) of each target compound into the compound table via the input unit 43. Is input (step S12). In the example of FIG. 3, the same contents as those of the compound table shown in FIG. In addition, the analyst checks the check box 62 of the target compound in the high sensitivity mode among the target compounds input in the compound table (step S13), and further enters the measurement loop time input field 63 and the improvement ratio input field 64. Appropriate numerical values are respectively input (steps S14 and S15). In the example of FIG.
- the compound B is selected as the target compound in the high sensitivity mode
- the measurement loop time TL is set to 300 [msec]
- the improvement ratio K is set to 3 [times].
- the “improvement ratio” is the ratio between the event time of the target compound in the high sensitivity mode and the event time of other compounds among a plurality of compounds belonging to the same segment.
- the improvement ratio K is “3”. In this case, it means that the event time of the high sensitivity mode target compound is three times the event time of the other compounds.
- the segment setting unit 56 reads out the compound table from the setting content storage unit 53, and based on the retention time of each compound listed in the compound table and the set process time, the same as in the conventional case Then, a segment is set by appropriately dividing the entire measurement time or a part thereof (step S17). Specifically, two compounds having adjacent retention times satisfying the conditional expression shown in the above equation (1) are searched, and the time is divided using the midpoint of the retention times of the two compounds as a segment boundary. In the compound table shown in FIG.
- segment boundary is set at 10.8 (min), which is the intermediate point of the retention times of the compounds C and D.
- the front of the boundary is segment # 1
- segment # 2 is segment # 2.
- segment # 3 follows the segment boundary.
- all of the compounds A to C are assigned to be measured during the period of segment # 1 in which the measurement start time is 9.5 [min] and the measurement end time is 10.8 [min]
- the compound D is assigned the measurement start time Is assigned to be measured during the period of segment # 2 in which the measurement end time is 12.0 [min].
- the relationship between the segment and the compound at this time is as shown in FIG.
- the parameter table creation program 52 sets the variable N to 1 (step S18), and determines whether or not the number m of compounds assigned to the segment #N set in step S17 is 1 ( Step S19). If m is not 1, that is, if a plurality of compounds are assigned to segment #N, the process proceeds to step S20 to calculate the event time.
- the event time calculation method in step S20 will be described.
- the measurement for one or more compounds assigned to the segment is repeatedly performed, and the length of the execution time per time of this repeated measurement is the measurement loop time TL .
- the recurring event time T I is a time taken for the measurement of the compound per one of the one portion of the measurement is determined .
- the measurement loop time TL is divided so that the event time of the target compound in the high sensitivity mode is K times (K is an improvement ratio) of the event time of the other compounds.
- K is an improvement ratio
- the compounds A to C are allocated to the segment # 1 as described above, and the compound B is designated as the target of the high sensitivity mode.
- the measurement loop time TL is 300 [msec]
- Event time of other compounds: T I (T L ⁇ ((m ⁇ n) ⁇ 1 + n ⁇ K)) ⁇ 1 (Where m is the number of compounds assigned to segment #N, and n is the number of compounds designated as targets for the high sensitivity mode among the compounds assigned to segment #N).
- the event time determination unit 57 determines whether or not the compound is a target of the high sensitivity mode. though, the value equal to the measured loop time T L the event time T I (step S21). For example, in the example of FIG. 3, since only one compound (compound D) is assigned to segment # 2, the event time T I for the compound is 300 [msec], which is the same as the measurement loop time TL .
- the event time is the same regardless of whether the compound is designated in the high sensitivity mode.
- the effect of the sensitivity mode cannot be obtained. Therefore, in such a case, it is desirable to notify the analyst to that effect through the display unit 44 or the like.
- the dwell time determination unit 58 calculates a dwell time (data accumulation time) for the mass-to-charge ratio of a plurality of ions to be measured for each target compound (step S22).
- each ion of compound B dwell time T D with respect to the (180-1 ⁇ 3)
- ⁇ 3 59 [msec]
- step S20 when all of the plurality of compounds assigned to the same segment are designated in the high sensitivity mode, the event times of these compounds are all equal, and the effect of the high sensitivity mode cannot be obtained. . Therefore, in such a case, it is desirable to notify the analyst in the same manner as described above.
- the parameter table creation program 52 determines whether or not the segment #N is the last segment (step S23), and if it is not the last segment, increments the variable N (step S24) and returns to step S19. Therefore, processing is performed in time order for all the segments set in step S17, and when the final segment is reached, Yes is determined in step S23. Then, a parameter table including the event time and dwell time calculated as described above is created (step S25) and stored in the parameter table storage unit 54.
- FIG. 4 is an example of a parameter table automatically created based on the contents of the setting input screen shown in FIG.
- the event time and dwell time of the compound B which is the target compound in the high sensitivity mode are the events of other compounds (compounds A and C). It is longer than the time and dwell time.
- an analyzer can perform measurement simply by specifying a target compound in the high sensitivity mode on the setting input screen 60 and inputting an improvement ratio.
- the event time of the specified compound can be set longer than the event time of other compounds without affecting the loop time.
- the parameter table creation program 52 can exhibit more excellent effects when performing multi-component simultaneous analysis.
- the number of compounds eluting from the LC unit 10 in close proximity in time increases, so the number of compounds belonging to the same segment increases.
- 10 types of compounds A to J among a large number of components contained in the sample are assigned to the same segment, and among these, compound B is in the high sensitivity mode. Suppose that it is specified as the target compound of.
- the dwell time is (25 ⁇ 1 ⁇ 3) ⁇ 3 ⁇ 7.3 [msec].
- the dwell time of the target compound in the high sensitivity mode is 24 ⁇ 9 ⁇ 2.7 [times] the dwell time obtained by the conventional method, and the dwell time of other compounds Is 7.3 ⁇ 9 ⁇ 0.81 [times] the dwell time required by the conventional method. Therefore, the S / N ratio is as high as 2.7 times that of the conventional method for the high sensitivity mode target compound, and about 0.8 times that of the conventional method for other compounds, the decrease in the S / N ratio is minimized. This is because the demerits (that is, the decrease in dwell time of other compounds) caused by measuring some compounds in the high sensitivity mode are dispersed by many compounds.
- FIG. 5 is a flowchart showing a processing procedure by the parameter table creation program in the LC-MS of the present embodiment
- FIG. 6 is an example of a setting input screen in the present embodiment
- FIG. 7 is a diagram showing a parameter table created by executing the parameter table automatic creation processing in the LC-MS of this embodiment based on the setting contents shown in FIG.
- the LC-MS according to the present embodiment has the same configuration as the LC-MS according to the first embodiment shown in FIG. 1, and includes a setting input reception unit 55 and an event time determination unit of the parameter table creation program 52. 57 and only the operation of the dwell time determination unit 58 is different from the first embodiment.
- the target of the high sensitivity mode is designated not in compound units as in Example 1 but in ion units. That is, in this example, the analyst designates a target of the high sensitivity mode from among a plurality of mass to charge ratios to be measured for each target compound.
- the parameter table creation processing in the present embodiment will be described in detail.
- the setting input receiving unit 55 displays the setting input screen 70 on the screen of the display unit 44 (step S31).
- An example of the setting input screen 70 in this embodiment is shown in FIG.
- the setting input screen 70 is provided with a compound table display field 71, a measurement loop time input field 73, and an improvement ratio input field 74.
- the compound table displayed in the compound table display field 71 is the same as in the first embodiment.
- the analyst inputs the compound name, retention time, process time, and mass-to-charge ratio (m / z-1, m / z-2, and m / z-3) is input (step S32).
- the same contents as those of the compound table shown in FIGS. 3 and 8 are input as these items.
- the analyst checks the check boxes 72a to 72c corresponding to the mass-to-charge ratio (m / z-1) of the quantitative ions of each target compound and the mass-to-charge ratio (m / z-2, m / z-3) of the confirmation ions.
- Step S33 Check the check box for the mass-to-charge ratio of the ions to be subjected to the high sensitivity mode (step S33), and further input appropriate numerical values in the measurement loop time input field 73 and the improvement ratio input field 74, respectively.
- Step S34 and S35 the mass-to-charge ratio of the quantitative ion of compound B is selected as the target of the high sensitivity mode
- the measurement loop time TL is set to 300 [msec]
- the improvement ratio K is set to 3 [times].
- the “improvement ratio” is the ratio of the dwell time for the target ion in the high sensitivity mode to the dwell time for the other ions among a plurality of ions to be measured for a certain compound.
- K is “3”, it means that the dwell time of the target ion in the high sensitivity mode is set to three times the dwell time of other ions.
- step S36 the segment setting unit 56 first sets a segment in the same manner as in the first embodiment (step S37).
- the parameter table creating program 52 sets a variable N to 1 (step S38), and calculates the event time T I by the event time determination unit 57 (step S39).
- the measurement loop time TL is 300 [msec]
- three compounds of compounds A to C are allocated to the segment # 1.
- each event time T I of Compound A ⁇ C, the 300 ⁇ 3 100 [msec] .
- the dwell time determination unit 58 calculates a dwell time (data accumulation time) for a plurality of ions to be measured for each target compound (step S40).
- dwell time determining unit 58 so as to be approximately K times the dwell time T D of the dwell time T D of ions specified in the high sensitivity mode and other ions (K is increased ratio), for example, the following The calculation is performed based on the following formula.
- T D ((T I -w ⁇ a) ⁇ ((a ⁇ b) ⁇ 1 + b ⁇ K)) ⁇ K
- T D ((T I ⁇ w ⁇ a) ⁇ ((a ⁇ b) ⁇ 1 + b ⁇ K)) ⁇ 1
- the “non-target ion of the same compound” refers to a plurality of ions to be measured for the same compound when at least one of the plurality of ions to be measured for a certain compound is designated as a target in the high sensitivity mode.
- step S40 when all of the plurality of ions to be measured for the same compound are target ions in the high sensitivity mode, the dwell times of these ions are all equal, and the effect of the high sensitivity mode cannot be obtained. Become. Therefore, when the analyst designates the target ion in the high sensitivity mode in step S33 so that such designation cannot be performed, a predetermined number per row is selected in the check boxes 72a to 72c provided in the setting input screen 70. When the (one or two) check boxes are checked, it is desirable to invalidate the remaining check boxes in the same row (for example, clicks do not check).
- the parameter table creation program 52 determines whether or not the segment #N is the last segment (step S41), and if it is not the last segment, increments the variable N (step S42) and returns to step S39. Therefore, processing is performed in time order for all the segments set in step S37, and when the final segment is reached, Yes is determined in step S41. Then, a parameter table including the event time and dwell time calculated above is created (step S43) and stored in the parameter table storage unit 54.
- FIG. 7 is an example of a parameter table automatically created based on the contents of the setting input screen 70 shown in FIG.
- the dwell time is individually determined for a plurality of ions to be measured for each compound.
- the dwell time for the quantitative ion (m / z-1) designated as the target of the high sensitivity mode is the remaining ion (confirmed ions m / z-2, m longer than the dwell time for / z-3).
- the dwell time for the quantitative ion (m / z-1) designated as the target of the high sensitivity mode is the remaining ion (confirmed ions m / z-2, m longer than the dwell time for / z-3).
- the total dwell time in the compound B T D and the voltage stabilization time w, a 58.2 + 19.4 + 19.4 + 1 ⁇ 3 100 [msec], the same compound which is set in step S39 equal to the event time T I.
- the analyst specifies each target ion in the high sensitivity mode and inputs the improvement ratio on the setting input screen 70, thereby performing each operation.
- the dwell time of some ions can be automatically set longer than the dwell time of other ions without affecting the compound event time. Therefore, for example, for compounds with poor sensitivity, by setting the quantitative ions as targets in the high sensitivity mode, the dwell time of confirmation ions not used for quantification is shortened, and the dwell time of quantitative ions is increased accordingly, Highly accurate quantification can be performed.
- step S31 of FIG. 5 a setting input screen 60 similar to that of FIG.
- the analyst checks one of the check boxes 62 on the setting input screen 70, so that the quantitative ions of the compound corresponding to the row provided with the check box are the target ions in the high sensitivity mode. It is specified. After that, segment setting (step S37), event time calculation (step S39), dwell time calculation (step S40), etc. are executed in the same manner as described above, and a parameter table as shown in FIG. 7 is created. Is done.
- the MS unit 20 is a single-type quadrupole mass spectrometer, but in the LC-MS / MS in which the MS unit 20 is a triple quadrupole mass spectrometer.
- SIM measurement the present invention is naturally applicable to MRM measurement in which it is necessary to set measurement conditions such as the elution time range and the mass-to-charge ratio to be measured for each compound. It is also clear that the present invention can be applied to GC-MS and GC-MS / MS using GC instead of LC.
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Abstract
Description
[或る化合物Xの保持時間+A]<[化合物Xの次に溶出する化合物X+1の保持時間-A] (ただし、±A:プロセス時間) …(1)
という条件式を満たす場合に、化合物Xに対する溶出時間範囲(保持時間±A)と化合物X+1に対する溶出時間範囲とが重ならない時間位置、典型的には、化合物Xの保持時間と化合物X+1の保持時間との中間の時間位置にセグメント境界が設定され、該境界により測定時間は複数のセグメントに分割される。
TD=(イベント時間TI-電圧安定待ち時間)/[測定対象イオン数] …(2)
図11の例では、一つの測定対象イオン当たりの電圧安定待ち時間を1[msec]としており、その結果、セグメント#1では各イオンに対するドウェル時間TDは(100-1×3)÷3≒32[msec]、である。また、セグメント#2では各イオンに対するドウェル時間TDは(300-1×3)÷3=99[msec]、である。
a)測定対象である化合物毎に少なくとも、溶出時間範囲、及び測定すべき1又は複数のイオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる化合物毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間を当該セグメントに割り当てられた化合物の数に応じて分割することにより、各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により決定されたイベント時間と、各化合物について測定すべきイオンの数とに基づいて各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記イベント時間決定手段が、前記当該セグメントに割り当てられた化合物の中に高感度分析の対象化合物が含まれている場合に、同じセグメントに割り当てられた他の化合物のイベント時間に対する該高感度分析の対象化合物のイベント時間の比率が予め定められた比率となるように前記測定ループ時間を分割することを特徴としている。
a)測定対象である化合物毎に少なくとも、溶出時間範囲、及び測定すべき1又は複数のイオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる質量電荷比毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間と、当該セグメントに割り当てられた化合物の数とに基づいて各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により各化合物について決定されたイベント時間を、当該イベント時間に対応する化合物について測定すべき質量電荷比の数に応じて分割することにより、各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記ドウェル時間決定手段が、前記当該イベント時間に対応する化合物について測定すべき質量電荷比の中に高感度分析の対象として指定された質量電荷比が含まれている場合に、同じ化合物について測定すべき他の質量電荷比のドウェル時間に対する該高感度分析の対象として指定された質量電荷比のドウェル時間の比率が予め与えられた比率となるように前記当該イベント時間を分割することを特徴としている。
a)測定対象である化合物毎に少なくとも、溶出時間範囲、測定すべき定量イオンの質量電荷比、及び測定すべき確認イオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる化合物毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間と、当該セグメントに割り当てられた化合物の数とに基づいて各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により各化合物について決定されたイベント時間を、当該イベント時間に対応する化合物について測定すべき質量電荷比の数に応じて分割することにより、各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記ドウェル時間決定手段が、前記当該イベント時間に対応する化合物が高感度分析の対象として指定されている場合に、該化合物について測定すべき確認イオンの質量電荷比のドウェル時間に対する該化合物について測定すべき定量イオンの質量電荷比のドウェル時間の比率が予め与えられた比率となるように前記当該イベント時間を分割することを特徴としている。
高感度モードの対象化合物のイベント時間:TI=(TL÷((m-n)×1+n×K))×K
その他の化合物のイベント時間:TI=(TL÷((m-n)×1+n×K))×1
(ただし、m:セグメント#Nに割り当てられた化合物の数、n:セグメント#Nに割り当てられた化合物のうち高感度モードの対象に指定された化合物の数)。
高感度モード対象イオン:TD=((TI-w×a)÷((a-b)×1+b×K))×K
同一化合物の非対象イオン:TD=((TI-w×a)÷((a-b)×1+b×K))×1
その他のイオン:TD=(TI-w×a)÷a
(aは測定すべきイオンの数、bは高感度モードの対象イオン数、wは電圧安定待ち時間)
なお、前記「同一化合物の非対象イオン」とは、ある化合物について測定すべき複数のイオンのうち少なくとも1つが高感度モードの対象に指定されている場合において、同化合物について測定すべき複数のイオンのうちの残りのイオン(高感度モードの対象に指定されていないイオン)を意味する。図6に示した化合物テーブルの場合、化合物Bの2つの確認イオン(m/z-2、m/z-3)が前記「同一化合物の非対象イオン」に相当する。また、前記「その他のイオン」とは、ある化合物について測定すべき複数のイオンがいずれも高感度モードの対象に指定されていない場合における、該複数のイオンを意味する。図6に示した化合物テーブルの場合、化合物A、C、D、Eの定量イオン(m/z-1)及び確認イオン(m/z-2、m/z-3)が前記「その他のイオン」に相当する。
また、「同一化合物の非対象イオン」である化合物Bの確認イオン(m/z-2、m/z-3)に対するドウェル時間TDは、それぞれ((100-1×3)÷((3-1)×1+1×3))×1=19.4[msec]、となる。更に、「その他のイオン」である、化合物A及びCの定量イオンと確認イオンに対するドウェル時間は、(100-1×3)÷3=32.3[msec]、となる。また、セグメント#2に属する化合物Dの各イオンに対するドウェル時間TDは(300-1×3)÷3=99[msec]となる。
20…MS部
25…四重極マスフィルタ
26…検出器
40…制御/処理部
41…CPU
42…メモリ
43…入力部
44…表示部
45…インターフェース
50…記憶部
52…パラメータテーブル作成プログラム
53…設定内容格納部
54…パラメータテーブル格納部
55…設定入力受付部
56…セグメント設定部
57…イベント時間決定部
58…ドウェル時間決定部
60、70、80…設定入力画面
61、71、81…化合物テーブル表示欄
62、72a~c…チェックボックス
63、73、83…測定ループ時間入力欄
64、74…向上比入力欄
Claims (5)
- 試料中の複数の化合物を時間方向に分離するクロマトグラフと、該クロマトグラフで分離された化合物由来のイオンを質量電荷比に応じて分離して検出する質量分析装置とを組み合わせて成り、前記質量分析装置が目的化合物に対応するクロマトグラムピークの前後で1乃至複数の特定のイオンの質量電荷比に対する選択イオンモニタリング(SIM)測定又は多重反応モニタリング(MRM)測定を実行するクロマトグラフ質量分析装置において、
a)測定対象である化合物毎に少なくとも、溶出時間範囲、及び測定すべき1又は複数のイオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる化合物毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間を当該セグメントに割り当てられた化合物の数に応じて分割することにより、各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により決定されたイベント時間と、各化合物について測定すべきイオンの数とに基づいて各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記イベント時間決定手段が、前記当該セグメントに割り当てられた化合物の中に高感度分析の対象化合物が含まれている場合に、同じセグメントに割り当てられた他の化合物のイベント時間に対する該高感度分析の対象化合物のイベント時間の比率が予め定められた比率となるように前記測定ループ時間を分割することを特徴とするクロマトグラフ質量分析装置。 - 試料中の複数の化合物を時間方向に分離するクロマトグラフと、該クロマトグラフで分離された化合物由来のイオンを質量電荷比に応じて分離して検出する質量分析装置とを組み合わせて成り、前記質量分析装置が目的化合物に対応するクロマトグラムピークの前後で1乃至複数の特定のイオンの質量電荷比に対する選択イオンモニタリング(SIM)測定又は多重反応モニタリング(MRM)測定を実行するクロマトグラフ質量分析装置において、
a)測定対象である化合物毎に少なくとも、溶出時間範囲、及び測定すべき1又は複数のイオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる質量電荷比毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間と、当該セグメントに割り当てられた化合物の数とに基づいて各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により各化合物について決定されたイベント時間を、当該イベント時間に対応する化合物について測定すべき質量電荷比の数に応じて分割することにより、各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記ドウェル時間決定手段が、前記当該イベント時間に対応する化合物について測定すべき質量電荷比の中に高感度分析の対象として指定された質量電荷比が含まれている場合に、同じ化合物について測定すべき他の質量電荷比のドウェル時間に対する該高感度分析の対象として指定された質量電荷比のドウェル時間の比率が予め与えられた比率となるように前記当該イベント時間を分割することを特徴とするクロマトグラフ質量分析装置。 - 試料中の複数の化合物を時間方向に分離するクロマトグラフと、該クロマトグラフで分離された化合物由来のイオンを質量電荷比に応じて分離して検出する質量分析装置とを組み合わせて成り、前記質量分析装置が目的化合物に対応するクロマトグラムピークの前後で1乃至複数の特定のイオンの質量電荷比に対する選択イオンモニタリング(SIM)測定又は多重反応モニタリング(MRM)測定を実行するクロマトグラフ質量分析装置において、
a)測定対象である化合物毎に少なくとも、溶出時間範囲、測定すべき定量イオンの質量電荷比、及び測定すべき確認イオンの質量電荷比を特定する情報を含む化合物テーブルを記憶しておく化合物テーブル保持手段と、
b)前記化合物テーブルに含まれる化合物毎に高感度分析を行うか否かを分析者に指定させる高感度分析指定受付手段と、
c)前記化合物テーブルに含まれる各化合物の溶出時間範囲が重ならない時間位置に境界を定めることで測定時間単位であるセグメントを設定し、各セグメントにそれぞれ1又は複数の測定対象の化合物を割り当てるセグメント設定手段と、
d)前記セグメント設定手段により設定された各セグメントにおいて、予め与えられた各イオンの測定点時間間隔である測定ループ時間と、当該セグメントに割り当てられた化合物の数とに基づいて各化合物についての測定時間であるイベント時間を決定するイベント時間決定手段と、
e)前記イベント時間決定手段により各化合物について決定されたイベント時間を、当該イベント時間に対応する化合物について測定すべき質量電荷比の数に応じて分割することにより、各質量電荷比についてのデータ収集時間であるドウェル時間を決定するドウェル時間決定手段と、
を有し、
前記ドウェル時間決定手段が、前記当該イベント時間に対応する化合物が高感度分析の対象として指定されている場合に、該化合物について測定すべき確認イオンの質量電荷比のドウェル時間に対する該化合物について測定すべき定量イオンの質量電荷比のドウェル時間の比率が予め与えられた比率となるように前記当該イベント時間を分割することを特徴とするクロマトグラフ質量分析装置。 - 前記高感度分析指定受付手段が、更に前記比率を分析者に指定させることを特徴とする請求項1~3のいずれかに記載のクロマトグラフ質量分析装置。
- コンピュータを請求項1~3のいずれかに記載されたクロマトグラフ質量分析装置の各手段として機能させるためのプログラム。
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