WO2015072223A1 - 光沢評価方法および光沢評価装置 - Google Patents
光沢評価方法および光沢評価装置 Download PDFInfo
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- WO2015072223A1 WO2015072223A1 PCT/JP2014/074397 JP2014074397W WO2015072223A1 WO 2015072223 A1 WO2015072223 A1 WO 2015072223A1 JP 2014074397 W JP2014074397 W JP 2014074397W WO 2015072223 A1 WO2015072223 A1 WO 2015072223A1
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- 230000003595 spectral effect Effects 0.000 claims abstract description 132
- 238000005259 measurement Methods 0.000 claims abstract description 103
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/556—Measuring separately scattering and specular
Definitions
- the present invention relates to a technique for evaluating the gloss of an object.
- a specular gloss measurement method JIS-Z8741
- JIS-Z8741 a specular gloss measurement method
- the specular gloss measurement method is an index indicating only the size of the reflected light beam in the regular reflection direction
- the specular gloss measured by the specular gloss measurement method and the gloss by subjective evaluation by human vision The feeling does not necessarily match.
- a gloss evaluation apparatus for evaluating the gloss of an object is manufactured and shipped so as to output the same evaluation value (measurement value) for the same object.
- the gloss evaluation device may output different evaluation values as it continues to be used. For example, there is a case where a change with time occurs in a light source that emits light for measuring gloss or a light receiving element that receives reflected light. Further, there may be original individual differences in the characteristics of the light source and the light receiving element. Furthermore, the evaluation value may vary depending on the environment in which it is used, for example, the ambient temperature.
- the present invention has been made in view of the above-mentioned circumstances, and its purpose is a gloss evaluation value when an object is measured with a gloss evaluation apparatus, and a reference gloss evaluation apparatus (master machine (reference machine)). It is to provide a gloss evaluation method and a gloss evaluation apparatus that reduce a difference (fluctuation) from a gloss evaluation value when measured by.
- the first irradiation is performed from the intensity a of specular reflection light obtained by irradiating the measurement object with the first irradiation light having the spectral irradiance L ′ ( ⁇ ) of the machine.
- the intensity b of the distributed reflected light obtained by irradiating the measurement object with light, and the spectral reflectance R of diffuse reflected light obtained by irradiating the measurement object with predetermined second irradiation light at different irradiation angles Based on ( ⁇ ), the intensity P of specular reflection light obtained by irradiating the measurement object with the irradiation light having the spectral irradiance L ( ⁇ ) of the reference machine is obtained. Therefore, the gloss evaluation method and the apparatus are different from the gloss evaluation value when measured with a reference gloss evaluation apparatus (master machine (reference machine)) as the gloss evaluation value when measuring the measurement object ( A gloss evaluation value with reduced fluctuation) can be obtained.
- FIG. 1 is an overall schematic diagram illustrating an example of a gloss evaluation apparatus in an embodiment.
- the gloss evaluation apparatus shown in FIG. 1 it is a figure for demonstrating the case where the 1st illumination part is irradiated. It is a figure for demonstrating the case where the 2nd illumination part is irradiated in the glossiness evaluation apparatus shown in FIG.
- FIG. 1 shows an example of the spectral irradiance L ((lambda)) of the irradiation light of the 1st illumination part in the glossiness evaluation apparatus shown in FIG.
- the gloss evaluation apparatus 100 calculates a gloss evaluation value when measured by a master machine determined as a reference machine, so that the difference between the gloss evaluation apparatus which is a so-called mass production machine, the measurement status (ambient temperature) Variation in evaluation values (measured values) due to changes in environment and light source over time) is reduced.
- FIG. 1 is a diagram illustrating an example of the overall configuration of the gloss evaluation apparatus 100.
- the master machine has the same configuration as that of the gloss evaluation apparatus 100.
- 2 is a diagram for explaining a case where the first illumination unit 10 included in the gloss evaluation apparatus 100 is irradiated
- FIG. 3 is a diagram for explaining a case where the second illumination unit 40 is irradiated.
- FIG. 4 is a configuration diagram illustrating an example of the spectroscopic detection unit 22.
- FIG. 5 is a diagram illustrating an example of the spectral irradiance L ( ⁇ ) of the irradiation light.
- the horizontal axis in FIG. 5 indicates the wavelength, and the vertical axis indicates the irradiance.
- FIG. 6 is a diagram illustrating an example of the spectral sensitivity S ( ⁇ ) of the light receiving element.
- the horizontal axis in FIG. 6 indicates the wavelength, and the vertical axis indicates the sensitivity.
- FIG. 7 is a diagram illustrating an example of the spectral transmittance F ( ⁇ ) of the filter.
- the horizontal axis in FIG. 7 indicates the wavelength, and the vertical axis indicates the transmittance.
- FIG. 8 is a diagram illustrating an example of the standard spectral luminous efficiency V ( ⁇ ).
- FIG. 9 is a diagram illustrating an example of the spectrum distribution Sc ( ⁇ ) of standard light.
- the horizontal axis in FIG. 9 indicates the wavelength, and the vertical axis indicates the irradiance.
- the broken line is the spectral distribution of the colorimetric auxiliary illuminant C
- the solid line is the spectral distribution of the D65 light
- the alternate long and short dash line is the spectral distribution of the A light.
- the gloss evaluation apparatus 100 includes a first illumination unit 10, a diffuse reflection light receiving unit 20, a regular reflection light receiving unit 30, a second illumination unit 40, and a calculation control unit 50.
- Each of the first illumination unit 10, the diffuse reflection light receiving unit 20, the regular reflection light receiving unit 30, and the second illumination unit 40 is controlled by the calculation control unit 50, and outputs each measured value to the calculation control unit 50. .
- the first illumination unit 10 includes a glossy light source 11 composed of a halogen lamp, an LED (light emitting diode), etc., a glossy light emitting circuit 12 that drives the glossy light source 11, and a glossy light source 11.
- a light beam restricting plate 13 that restricts the output (radiated) light beam and a collimating lens 14 are provided.
- the gloss light source 11 is a light source that emits predetermined light used for obtaining an evaluation value related to gloss, and is a predetermined angle (here, a normal line (measurement surface normal line) G on the measurement surface of the measurement object S). Is fixedly arranged at a position having 60 °.
- the light flux restricting plate 13 is arranged so that the opening 13a thereof coincides with the focal position of the collimating lens 14, and the light flux (optical axis L1) from the glossy light source 11 that has passed through the opening 13a of the light flux restricting plate 13 is It is collimated (collimated) by the collimating lens 14 to be converted into a parallel light beam and guided to the measurement surface of the measurement object S.
- the spectral irradiance of the irradiation light of the first illumination unit 10 is, for example, the spectral irradiance shown in FIG.
- the spectral irradiance of the example shown in FIG. 5 generally has a maximum peak at a wavelength of about 463 nm and a second largest peak at a wavelength of about 550 nm.
- the diffusely reflected light receiving unit 20 includes a light receiving optical system 21 that focuses a light beam (optical axis L2) reflected from the measurement object S and a spectral detection unit 22.
- the spectroscopic detection unit 22 is disposed at the imaging position of the light receiving optical system 21 and measures the spectral intensity of the light transmitted through the light receiving optical system 21 and passed through the incident slit 22a.
- the optical axis L2 of the diffusely reflected light receiving unit 20 and the measurement surface of the measurement object S are orthogonal to each other at an intersection A.
- FIG. 4 is a configuration diagram illustrating an example of the spectroscopic detection unit 22.
- the spectroscopic detection unit 22 includes a lens 22b, a diffraction grating 22c, and a light receiving sensor 22e in a case 22d of a box-shaped housing in which an entrance slit 22a is formed at an appropriate position.
- the lens 22b converts the measured light that has passed through the incident slit 22a into parallel light and guides it to the diffraction grating 22c, and forms a dispersed image of the incident slit 22a dispersed by the diffraction grating 22c on the light receiving surface of the light receiving sensor 22e.
- the diffraction grating 22c has a function of reflecting and dispersing incident measurement light at different angles depending on the wavelength, and forms a dispersion image of the entrance slit 22a on the light receiving sensor 22e.
- the light receiving sensor 22e includes a plurality of light receiving channels (pixels) arranged at a predetermined interval, and is constituted by, for example, a silicon photodiode array in which silicon photodiodes are arranged in one line in one direction.
- the dispersed light (incident slit dispersion image) incident on each light receiving channel of the light receiving sensor 22e is converted into a current by the photoelectric conversion action of each photodiode and is output to the control unit 50.
- the second illumination unit 40 and the diffuse reflection light receiving unit 20 are arranged to have a predetermined geometry, for example, a 45 ° / 0 ° geometry.
- the regular reflection light receiving unit 30 includes a filter 33 that filters (filters) the light beam reflected from the measurement object S, a light receiving optical system 31 that converges, and a gloss detector 32.
- the gloss detector 32 is disposed at the image forming position of the light receiving optical system 31 and outputs the light amount (light intensity) of the light beam incident from the incident slit 32a that restricts the light transmitted through the light receiving optical system 31.
- the gloss detector 32 has, for example, the spectral sensitivity S ( ⁇ ) shown in FIG.
- the spectral sensitivity S ( ⁇ ) of the example shown in FIG. 6 gradually increases as the wavelength becomes longer, reaches a peak (maximum value) at a wavelength of about 880 nm, and then decreases to the removal.
- the filter 33 only needs to be a filter that can transmit a desired wavelength band (for example, a bandpass filter, a cut-off filter, or the like), and is, for example, an absorption optical filter or an interference optical filter.
- the spectral transmittance F ( ⁇ ) of the filter 33 is set so as to satisfy the following relational expression. That is, the multiplication result of the spectral irradiance L ( ⁇ ), the spectral sensitivity S ( ⁇ ), and the spectral transmittance F ( ⁇ ), the standard light spectral distribution Sc ( ⁇ ), and the standard spectral luminous efficiency V ( ⁇ ) There is a proportional relationship with the multiplication result of.
- L ( ⁇ ) is the spectral irradiance of the glossy light source 11 of the first illumination unit 10
- S ( ⁇ ) is the spectral sensitivity of the regular reflection light receiving unit 30
- F ( ⁇ ) is This is the spectral transmittance of the filter 33.
- Sc ( ⁇ ) is the spectral distribution of standard light
- V ( ⁇ ) is the standard spectral luminous efficiency (sensitivity of the human eye) defined by JIS or the like.
- the spectral transmittance F ( ⁇ ) of the filter 33 is obtained by converting the irradiation light of the first illumination unit 10 having the spectral irradiance L ( ⁇ ) that has passed through the filter 33 having the spectral transmittance F ( ⁇ ) to the spectral sensitivity S (
- the response when the regular reflection light receiving unit 30 of [lambda] is received is set to be the sensitivity of human eyes.
- the filter 33 has, for example, the spectral transmittance F ( ⁇ ) shown in FIG.
- the spectral transmittance F ( ⁇ ) of the example shown in FIG. 7 has a peak at a wavelength of about 540 nm.
- An example of the standard spectral luminous efficiency V ( ⁇ ) is shown in FIG.
- the broken line graph shows the standard spectral luminous efficiency, and the solid line graph shows the response of the regular reflection light receiving unit 30.
- An example of the spectrum distribution Sc ( ⁇ ) of the standard light is shown in FIG.
- the color light source 41 of the second illumination unit 40 emits light having a spectral distribution of the colorimetric auxiliary illuminant C indicated by a broken line.
- the continuous line of FIG. 9 shows the spectrum distribution of D65 light source prescribed
- the regular reflection light receiving unit 30 is fixedly disposed at a position in the regular reflection direction (including a position near the regular reflection direction) that is a regular reflection angle with respect to the illumination angle ⁇ (irradiation angle ⁇ ) by the illumination system. That is, the regular reflection light receiving unit 30 has a reflection angle ⁇ (an angle formed between the normal line G and the reflected light beam) with respect to an incident angle ⁇ (an angle formed with respect to the normal line G where the incident light beam stands at the incident point).
- the second illumination unit 40 includes a color light source 41 composed of a halogen lamp, an LED (light emitting diode), etc., a color light emission circuit 42 that drives the color light source 41, and a color light source 41.
- a light flux restricting plate 43 that restricts the light flux output from the light source 41 and a collimating lens 44 are provided.
- the color light source 41 is a light source that emits predetermined light used for obtaining an evaluation value related to gloss, and a position having a predetermined angle (here, 45 °) with respect to the measurement surface normal line G of the measurement object S. It is fixedly arranged.
- the light flux restricting plate 43 is arranged so that its opening 43a coincides with the focal position of the collimating lens 44, and the light flux (optical axis L4) from the color light source 41 that has passed through the opening 43a of the light flux restricting plate 43 is The light is collimated by the collimator lens 44 to be converted into a parallel light beam and guided to the measurement surface of the measurement object S.
- the arithmetic control unit 50 stores, for example, a CPU (Central Processing Unit), a ROM (Read Only Memory) that stores a program that defines the operation of the CPU, and a RAM (Random Access Memory) that temporarily stores data.
- the computer includes a control unit 51, a calculation unit 52, a storage unit 53, an input unit 54, and an output unit 55, and controls the operation of the gloss evaluation apparatus 100.
- the control unit 51 controls the light emission (lighting and extinguishing) operations of the gloss light source 11 and the color light source 41, and controls the driving of the gloss light emitting circuit 12 and the color light emitting circuit 42 to perform this light emission operation. To control.
- the control unit 51 controls the light receiving operation of the diffuse reflection light receiving unit 20 and the regular reflection light receiving unit 30.
- the calculation unit 52 is based on the output signals from the diffuse reflection light receiving unit 20 and the regular reflection light receiving unit 30, and the reflection characteristic value of the measuring object S, that is, an evaluation value relating to gloss (hereinafter referred to as "gloss evaluation value"). ) Is calculated.
- gloss evaluation value an evaluation value relating to gloss
- the calculated gloss evaluation value is displayed on the output unit 55. Details of how to obtain the gloss evaluation value performed by the calculation unit 52 will be described later in the section ⁇ How to obtain the gloss evaluation value>.
- the control unit 51 and the calculation unit 52 are functionally provided in the CPU.
- the storage unit 53 uses the spectral irradiance L ( ⁇ ) of the first illuminating unit 10 of the master machine (reference machine) and the spectroscopic light of the regular reflected light receiving unit 30 that are used when the calculation unit 52 calculates the gloss evaluation value. Sensitivity S ( ⁇ ) is stored in advance.
- the input unit 54 is a device that inputs various commands such as gloss evaluation start and various data to the gloss evaluation apparatus 100, and is, for example, a keyboard or a mouse.
- the output unit 55 is a device that outputs a command and data input from the input unit 54, a calculation result of the gloss evaluation device 100, and the like.
- a display device such as a CRT (Cathode Ray Tube) display or an LCD (Liquid Crystal Display)
- a printing device such as a printer.
- the gloss evaluation apparatus 100 uses the following equation (1) to measure irradiation light having a spectral irradiance L ( ⁇ ) when the measurement object S is measured by a master machine (reference machine). An index value I of specular reflection light intensity when irradiated is obtained.
- the gloss evaluation apparatus 100 uses the equation (2) to measure the measurement object S with the gloss evaluation apparatus (the machine, the own machine) 100, that is, the spectral irradiance L ′ ( ⁇ ). An index value I ′ of the specular reflection light intensity when the irradiation light is irradiated is obtained.
- the gloss evaluation apparatus 100 calculates the coefficient K from the ratio between the index value I and the index value I ′, that is, using the following equation (3), and the regular reflection light using the equation (4).
- the regular reflection light intensity a which is the output of the light receiving unit 30 is corrected to obtain the regular reflection light intensity P when measured by the master machine.
- the gloss evaluation value is calculated based on the regular reflection light intensity P. For example, the gloss evaluation value is calculated by normalizing the regular reflection light intensity P with the output value of the calibration plate (standard sample).
- I c ⁇ L ( ⁇ ) S ( ⁇ ) d ⁇ + b ⁇ L ( ⁇ ) R ( ⁇ ) S ( ⁇ ) d ⁇ (1)
- I ′ c ⁇ L ′ ( ⁇ ) S ( ⁇ ) d ⁇ + b ⁇ L ′ ( ⁇ ) R ( ⁇ ) S ( ⁇ ) d ⁇ ...
- K I ⁇ I '(3)
- P K ⁇ a (4)
- L ( ⁇ ) is the spectral irradiance of the gloss light source 11 of the first illumination unit 10 of the master machine
- L ′ ( ⁇ ) is for the gloss of the first illumination unit 10 of the gloss evaluation apparatus 100.
- This is the spectral irradiance of the light source 11.
- S ( ⁇ ) is the spectral sensitivity of the gloss detector 32 of the regular reflection light receiving unit 30.
- the spectral irradiance L ( ⁇ ) and spectral sensitivity S ( ⁇ ) are measured in advance and stored in the storage unit 53 when the gloss evaluation apparatus 100 is shipped. Note that the spectral sensitivity of the gloss detector 32 of the master machine and the gloss detector 32 of the gloss evaluation apparatus 100 are substantially equal.
- the spectral irradiance L ′ ( ⁇ ) is measured using a diffuse reflection light receiving unit 20 with a white plate placed as the measurement object S.
- the spectral irradiance L ′ ( ⁇ ) may be measured directly from the light source using the diffuse reflection light receiving unit 20.
- Equation (4) is the light intensity obtained by measuring the specularly reflected light of the measuring object S with the gloss detector 32 when irradiated with the irradiation light from the first illumination unit 10 as shown in FIG. .
- the spectral detection unit 22 measures the diffuse reflected light of the measurement object S when the irradiation light is irradiated from the first illumination unit 10. , The light intensity obtained by calculating the sum of the outputs.
- the light intensity b is calculated by taking the sum of the outputs of the spectral detector 22, but the light intensity may be measured by providing a photodiode separately from the spectral detector 22. Further, the light intensity b may be used with an output of a certain wavelength as a representative value.
- the c in the equations (1) and (2) is Fresnel reflection in the regular reflection component from the surface of the measuring object S when the irradiation light is irradiated from the first illumination unit 10 as shown in FIG. It is strength.
- FIG. 10 is a diagram showing the intensity distribution of reflected light reflected by the measurement surface when the measurement surface of the measurement object S is illuminated by the first illumination unit 10 in terms of the distance from the intersection A.
- the white arrow 10 indicates the irradiation direction (optical axis L1) of the irradiation light from the first illumination unit 10 in FIG. 2, the white arrow 20 indicates the dispersion reflection direction (optical axis L2), and the white arrow 30 indicates The regular reflection direction (optical axis L3) is shown.
- the protruding portion indicates regular reflection light (regular reflection light component a), and the other portion indicates diffused light (regular reflection light component b).
- d is an intensity ratio (known coefficient) between the specular reflection measurement angle intensity and the diffuse reflection measurement angle intensity of the cos characteristic.
- the reflection angle ⁇ 60 degrees
- R ( ⁇ ) is a spectral intensity (spectral reflectance) obtained by irradiating the irradiation light from the second illumination unit 40 and measuring the diffuse reflection light of the measurement object S by the spectral detection unit 22. .
- the spectral irradiance L ′ ( ⁇ ) of the glossy light source 11 may vary depending on the light source having the same product number. For example, when a white LED is used as the light source, white is produced by combining blue excitation light and a yellow phosphor, and blue may shift in the wavelength direction. Individual differences may also occur due to changes over time, temperature of the use environment, and the like.
- the spectral irradiance L ′ ( ⁇ ) By measuring the spectral irradiance L ′ ( ⁇ ) for each measurement, it is possible to correct the output fluctuation and change with time of the glossy light source 11 of the first illumination unit 10. Note that the spectral irradiance L ′ ( ⁇ ) may be corrected at appropriate times instead of every time. In this case, the spectral irradiance L ′ ( ⁇ ) is also stored in the storage unit 53.
- the regular reflection light receiving unit 30 measures the regular reflection light that has passed through the filter 33, if the spectral transmittance F ( ⁇ ) of the filter 33 varies, the regular reflection light intensity a also varies. By performing the correction as described above, the variation can be reduced.
- Table 1 shows a parameter table summarizing the parameters used in the above formulas (1) and (2).
- the parameter table includes a “number” field, a “parameter content” field, a “parameter name” field, an “target machine” field, a “light source” field, an “irradiation target” field, a “measurement light” field, and “ It consists of a "detector” field.
- parameter numbers “1” to “6” indicating parameters are set. That is, six parameters are registered in this parameter table.
- the parameter content is set in the “parameter content” field of the number registered in the “number” field, and the “parameter name” field contains The names of parameters used in equations (1) and (2) are set.
- the “target machine” field a device (master machine / correction target machine) that measures the parameter of this number is set.
- the “light source” field a light source that emits light to measure the parameter of this number ( (For gloss / color) is set, and in the “irradiation target” field, a target to be irradiated with light (reference plate / no irradiation target / sample) is set in order to measure the parameter of this number.
- measurement light In the “measurement light” field, light (diffuse reflection light / direct light source / specular reflection light) measured to measure the parameter of this number is set. In the “detector” field, “measurement light” is set. A device (for color / gloss) that measures light registered in the field is set.
- Master machine set in the “target machine” field indicates a master machine that is a reference machine
- correction target machine indicates a gloss evaluation apparatus 100 that is a so-called mass production machine.
- Reference plate set in the “irradiation target” field indicates a white reference plate
- no irradiation target indicates that there is no irradiation target
- sample indicates the measurement object S.
- the “diffuse reflected light” set in the “measurement light” field indicates diffuse reflected light from the white reference plate or the measuring object S
- “direct light source” indicates direct irradiation light from the light source
- “Specular reflection light” indicates regular reflection light from the white reference plate or the measuring object S.
- “spectral irradiance of the glossy light source 11” is set in the “parameter contents” field of the parameter of parameter number “1”, and “L ( ⁇ )” is set in the “parameter name” field.
- “Master machine” is set
- “Glossy” is set in the “Light source” field
- “Reference plate” and “No irradiation target” are set in the “Irradiation target” field.
- ”Is set,“ diffuse reflected light ”and“ direct light source ” are set in the“ measurement light ”field, and“ for color ”is set in the“ detector ”field.
- the parameter with parameter number “1” is the parameter “L ( ⁇ )” used in the equations (1) and (2), and the content is “spectral irradiance of the glossy light source 11”.
- the "diffuse reflected light” measured by the "master machine” and irradiated by the "glossy” light source (second illumination unit 40) is applied to the "reference plate” and reflected by the reference plate, It is shown that the light is measured by the “for” detector (diffuse reflected light receiving unit 20), and the light emitted from the “glossy” light source (second illumination unit 40) directly detects “for color”. It shows that it is obtained by measuring with a measuring device (diffuse reflected light receiving unit 20).
- FIG. 11 is a flowchart of the reference machine measurement process of the master machine
- FIG. 12 is a flowchart of the gloss evaluation process of the gloss evaluation apparatus 100.
- This reference machine measurement process is performed in the master machine that serves as a reference for the gloss evaluation value.
- the spectral irradiance L ( ⁇ ) of the glossy light source 11 of the first illumination unit 10 in the master machine is measured (step S10).
- the measurement method may be a method in which a white reference plate is set as the measurement object S and measurement is performed using the diffuse reflection light receiving unit 20, and the irradiation light from the gloss light source 11 is measured. May be.
- step S11 the spectral sensitivity S ( ⁇ ) of the regular reflection light receiving unit 30 is measured.
- the measured spectral irradiance L ( ⁇ ) and spectral sensitivity S ( ⁇ ) are stored in the storage unit 53 (step S12).
- the stored spectral irradiance L ( ⁇ ) and spectral sensitivity S ( ⁇ ) are stored in the storage unit 53 of each gloss evaluation apparatus 100 before shipment.
- the spectral irradiance L ( ⁇ ) and the spectral sensitivity S ( ⁇ ) in the master machine are stored in the storage unit 53. It shall be.
- the measurer uses the input unit 54 to input a command or the like for instructing preparation for the gloss evaluation process.
- the arithmetic control unit 50 that has detected that a command for instructing the preparation for the gloss evaluation process is input via the input unit 54 reads the spectral irradiance L ( ⁇ ) and the spectral sensitivity S ( ⁇ ) from the storage unit 53. And stored in the working memory (step S20).
- the arithmetic control unit 50 energizes the first illuminating unit 10, the diffusely reflected light receiving unit 20, the regular reflected light receiving unit 30, and the second illuminating unit 40, and instructs the preparation necessary for the measurement. Make necessary preparations for measurement such as initial settings.
- the measurer sets the measuring object S at a predetermined location and inputs a command for instructing the start of gloss measurement (step S21).
- the calculation control unit 50 that has detected that a command instructing the start of gloss measurement is input instructs the control unit 51 to start the irradiation of the gloss light source 11.
- control unit 51 drives the glossy light emitting circuit 12 to start irradiation of the glossy light source 11 (step S22).
- the calculation control unit 50 receives the spectral intensity (spectral irradiance L ′ ( ⁇ )) from the spectral detection unit 22 (step S23), stores it in the work memory, and sums the output from the spectral detection unit 22.
- the light intensity b is calculated (step S24) and stored in the work memory.
- the calculation control unit 50 inputs the specular reflection light intensity a from the gloss detector 32 (step S25) and stores it in the work memory.
- the calculation control unit 50 stops the irradiation of the glossy light source 11 and instructs the control unit 51 to start the irradiation of the color light emitting circuit 42.
- control unit 51 drives the glossy light emitting circuit 12 to stop the irradiation of the glossy light source 11, and then drives the color light emitting circuit 42 to start the irradiation of the color light source 41. (Step S26).
- the calculation control unit 50 receives the spectral intensity (spectral reflectance R ( ⁇ )) from the spectral detection unit 22 (step S27) and stores it in the work memory.
- the calculation control unit 50 requests the calculation unit 52 to calculate a gloss evaluation value.
- the calculation unit 52 that has received the request calculates the specular reflection light intensity P using the formulas (1) to (4) as described in the section ⁇ How to obtain the gloss evaluation value>, and the specular reflection light intensity P
- the gloss evaluation value is calculated based on (Step S28).
- the calculation unit 52 that has calculated the gloss evaluation value displays the calculated gloss evaluation value on the input unit 54 (step S29).
- the measurer sets the measurement object S to be measured next, and inputs a measurement instruction to the input unit 54.
- the calculation control unit 50 that has detected the measurement instruction starts the processing from step S22.
- a gloss measurement method is a gloss evaluation method for obtaining an evaluation value related to the gloss of a measurement object based on specular reflection light and diffuse reflection light obtained from the measurement object, the spectral emission from a first light source. From the intensity a of the specularly reflected light obtained by irradiating the measurement object with the first irradiation light having the illuminance L ′ ( ⁇ ), the distributed reflected light obtained by irradiating the measurement object with the first irradiation light. Based on the intensity b and the spectral reflectance R ( ⁇ ) of diffusely reflected light obtained by irradiating the measurement object with predetermined second irradiation light at an irradiation angle different from that of the first light source from the second light source. The intensity P of specularly reflected light obtained by irradiating the measurement object with irradiation light having a spectral irradiance L ( ⁇ ) is obtained.
- a gloss evaluation apparatus includes a first light source that irradiates a measurement object with light having spectral sensitivity L ′ ( ⁇ ), and irradiates the measurement object with an irradiation angle different from that of the first light source.
- the measurement object is irradiated with the second irradiation light at an intensity b of the distributed reflected light obtained by irradiating the measurement object with the first irradiation light and an irradiation angle different from that of the first light source from the second light source.
- the intensity P of the regular reflected light obtained when the first light source irradiates light with spectral sensitivity L ( ⁇ ) is calculated.
- the gloss measurement method and the gloss evaluation apparatus calculate the intensity P of specularly reflected light at a constant spectral irradiance L ( ⁇ ) even if the spectral irradiance L ′ ( ⁇ ) varies from apparatus to apparatus.
- the intensity of the specularly reflected light can be calculated. Since the gloss evaluation value is calculated based on the regular reflection light intensity P, it is possible to calculate a gloss evaluation value that does not vary due to machine differences.
- the intensity P of the specular reflection light is equal to the intensity a of the specular reflection light, and the irradiation light having the spectral irradiance L ( ⁇ ) obtained by the above formula (1).
- the measurement object is irradiated with the first irradiation light of the specular irradiance L ′ ( ⁇ ) obtained by the above-mentioned formula (2) and the index value I of the specular reflection light obtained by irradiating the measurement object with It is preferable to obtain by multiplying by a coefficient K which is a ratio to the index value I ′ of the regular reflection light obtained in this way.
- the coefficient K is obtained from the ratio between the index value I when the spectral irradiance L ( ⁇ ) is irradiated and the index value I ′ when the spectral irradiance L ′ ( ⁇ ) is irradiated. Therefore, even when the spectral irradiance L ′ ( ⁇ ) of the light source varies, the intensity P of specularly reflected light at a constant spectral irradiance L ( ⁇ ) can be calculated.
- the intensity a of the specularly reflected light is applied to the measurement object with first irradiation light having a spectral irradiance L ′ ( ⁇ ) from a first light source. It is preferable that the specularly reflected light of the measurement object caused by the first irradiation light is received by a light receiving sensor having a light receiving sensitivity S ( ⁇ ) through a filter having a spectral transmittance F ( ⁇ ) and measured.
- Such a gloss measurement method can calculate the intensity P of specularly reflected light at a constant spectral irradiance L ( ⁇ ) even if there is a difference in the spectral transmittance F ( ⁇ ) of the filter.
- the spectral irradiance L ′ ( ⁇ ) is preferably measured every time the gloss evaluation value of the measurement object is obtained.
- the spectral irradiance L ( ⁇ ) is preferably the spectral irradiance of the irradiation light irradiated from the first light source of the reference machine.
- the evaluation value of the measurement object is preferably obtained by normalizing the intensity P of the regular reflection light with the evaluation value of the standard measurement object.
- Such a gloss measurement method can calculate an evaluation value that reduces the difference from the gloss evaluation value when measured with a reference machine, regardless of which device is used to calculate the gloss evaluation value of the measurement object.
- a gloss evaluation method and a gloss evaluation apparatus can be provided.
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Abstract
Description
図1は、光沢評価装置100の全体構成の一例を示す図である。なお、マスター機は、光沢評価装置100と同様の構成を備える。図2は、光沢評価装置100が備える第1照明部10を照射した場合を説明するための図であり、図3は、第2照明部40を照射した場合を説明するための図である。図4は、分光検出部22の一例を示す構成図である。
L(λ)×S(λ)×F(λ)∝Sc(λ)×V(λ)
ここで、L(λ)は、第1照明部10の光沢用光源11の分光放射照度であり、S(λ)は、正反射光受光部30の分光感度であり、F(λ)は、フィルタ33の分光透過率である。Sc(λ)は、標準光のスペクトル分布であり、V(λ)は、JIS等で定められた標準分光視感効率(人間の眼の感度)である。つまり、フィルタ33の分光透過率F(λ)は、分光透過率F(λ)のフィルタ33を通過した、分光放射照度L(λ)の第1照明部10の照射光を、分光感度S(λ)の正反射光受光部30が受光した場合の応答度が、人間の眼の感度になるように設定されている。
光沢評価装置100は、まず、以下の式(1)を用いて、測定対象物Sをマスター機(基準機)で測定したとする場合の、つまり、分光放射照度L(λ)の照射光を照射した場合の、正反射光強度の指標値Iを求める。次に、光沢評価装置100は、式(2)を用いて、測定対象物Sを光沢評価装置(当該機、自機)100で測定した場合の、つまり、分光放射照度L’(λ)の照射光を照射した場合の、正反射光強度の指標値I’を求める。
I=c∫L(λ)S(λ)dλ+b∫L(λ)R(λ)S(λ)dλ ・・・(1)
I’=c∫L’(λ)S(λ)dλ+b∫L’(λ)R(λ)S(λ)dλ
・・・(2)
K=I÷I’ ・・・(3)
P=K×a ・・・(4)
c=a-b×d
なお、dは、cos特性の正反射測定角度強度と拡散反射測定角度強度の強度比(既知係数)であり、反射角θが60度の場合、d=cos60度=0.5である。
次に、本実施形態の動作について、図11および図12を用いて説明する。図11は、マスター機の基準機測定処理のフローチャートであり、図12は、光沢評価装置100の光沢評価処理のフローチャートである。
Claims (7)
- 測定対象物から得られる正反射光と拡散反射光とに基づいて前記測定対象物の光沢に関する評価値を求める光沢評価方法であって、
第1光源から分光放射照度L‘(λ)の第1照射光を前記測定対象物に照射して得られる正反射光の強度aから、前記第1照射光を前記測定対象物に照射して得られる分散反射光の強度bと、第2光源から前記第1光源とは異なる照射角で前記測定対象物に所定の第2照射光を照射して得られる拡散反射光の分光反射率R(λ)とに基づいて、分光放射照度L(λ)の照射光を前記測定対象物に照射して得られる正反射光の強度Pを求める、
光沢評価方法。 - 前記正反射光の強度Pは、前記正反射光の強度aに、以下の式(1)で求められる分光放射照度L(λ)の照射光を前記測定対象物に照射して得られる正反射光の指標値Iと、以下の式(2)で求められる分光放射照度L’(λ)の第1照射光を前記測定対象物に照射して得られる正反射光の指標値I’との比である係数Kをかけて求める、
請求項1の光沢評価方法。
I=c∫L(λ)S(λ)dλ+b∫L(λ)R(λ)S(λ)dλ ・・・(1)
I’=c∫L’(λ)S(λ)dλ+b∫L’(λ)R(λ)S(λ)dλ ・・・(2)
I:分光放射照度L(λ)の照射光を前記測定対象物に照射して得られる正反射光の指標値I
I’:分光放射照度L’(λ)の第1照射光を前記測定対象物に照射して得られる正反射光の指標値I’
S(λ):前記測定対象物に照射して得られる正反射光を受光し、強度aを測定する受光センサの受光感度
c:分光放射照度L’(λ)の照射光を前記測定対象物に照射して得られる正反射光中のフレネル反射強度 - 前記正反射光の強度aは、第1光源から分光放射照度L‘(λ)の第1照射光を前記測定対象物に照射し、前記第1照射光に起因した前記測定対象物の正反射光を分光透過率F(λ)のフィルタを介して受光感度S(λ)の受光センサで受光して測定される、
請求項1または請求項2に記載の光沢評価方法。 - 分光放射照度L‘(λ)は、前記測定対象物の光沢評価値を求める都度、測定される、
請求項1乃至請求項3のいずれかに記載の光沢評価方法。 - 分光放射照度L(λ)は、基準機の第1光源から照射される照射光の分光放射照度である、
請求項1乃至請求項4のいずれかに記載の光沢評価方法。 - 前記測定対象物の前記評価値は、前記正反射光の強度Pを、標準測定対象物の評価値で規格化して求める、
請求項1乃至請求項5のいずれかに記載の光沢評価方法。 - 測定対象物に分光感度L‘(λ)の光を照射する第1光源と、
前記第1光源とは異なる照射角で前記測定対象物に光を照射する第2光源と、
前記測定対象物から得られる前記第1光源の正反射光の強度aを検出する分光感度S(λ)の第1検出部と、
前記測定対象物から得られる前記第2光源の拡散反射光の分光反射率R(λ)を検出する第2検出部と、
前記測定対象物から得られる前記第1光源の拡散反射光の強度bを検出する第3検出部と、
前記正反射光の強度aから、前記分光反射率R(λ)と拡散反射光の強度bとに基づいて、第1光源が分光感度L(λ)の光を照射した場合に得られる正反射光の強度Pを算出する演算部とを備える、
光沢評価装置。
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