WO2013111468A1 - 磁気測定装置 - Google Patents
磁気測定装置 Download PDFInfo
- Publication number
- WO2013111468A1 WO2013111468A1 PCT/JP2012/082277 JP2012082277W WO2013111468A1 WO 2013111468 A1 WO2013111468 A1 WO 2013111468A1 JP 2012082277 W JP2012082277 W JP 2012082277W WO 2013111468 A1 WO2013111468 A1 WO 2013111468A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- magnetic
- magnetic field
- sample
- coercive force
- measurement
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/10—Plotting field distribution ; Measuring field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1215—Measuring magnetisation; Particular magnetometers therefor
Definitions
- the present invention relates to a magnetic field measuring apparatus for measuring magnetic characteristics of a magnetic material sample, in particular, coercive force through measurement of leakage magnetic flux.
- a measuring device capable of measuring the coercive force in a minute region below a submillimeter is required.
- VSM Vibrating Sample Magnetometer
- a method of measuring the coercive force of a minute region by dividing a magnetic material to be measured by cutting and measuring with a VSM or the like is also conceivable.
- the intrinsic coercivity of the magnetic sample cannot be measured due to damage to the magnetic surface layer by processing.
- a magnetic force microscope that scans the sample surface with a probe made of a magnetic material is used. It is used.
- Patent Document 2 discloses a coercive force distribution analysis method and analysis apparatus in a perpendicular magnetic recording medium using a magnetic force microscope, and a sample surface in a state where a magnetic field (magnetic field) is applied substantially perpendicularly to the sample.
- the magnetic flux corresponding to the leakage magnetic flux generated from the magnetic domain is detected.
- measurement in a high magnetic field in a strong magnetic field
- the coercive force of a sample having a high coercive force cannot be evaluated.
- the present invention has been made in view of such a situation, and a magnetic field measuring apparatus capable of evaluating the coercive force of a sample having a high coercive force without applying a magnetic field to a measuring unit that measures the leakage magnetic flux of the magnetic sample.
- the purpose is to provide.
- the present invention is a magnetic field measuring apparatus for measuring a coercive force of a magnetic sample, wherein the magnetic field sample is applied with an external magnetic field in a first direction to be substantially saturated and magnetized, and the magnetic A second magnetic field generator demagnetized by applying a magnetic field in a direction opposite to the first direction to the body sample, and a leakage flux of the magnetic sample after being demagnetized by the second magnetic field generator
- a measurement unit for measuring the magnetic field, the first and second magnetic field generation units, and the measurement unit are controlled to obtain the leakage magnetic flux when the magnitude of the magnetic field in the reverse direction is changed in order.
- the first magnetic field generation unit may also function as the second magnetic field generation unit.
- the second magnetic field generation unit may apply a uniform magnetic field to the magnetic sample.
- a magnetic material sample having a high coercive force for example, a Nd—Fe—B magnet added with Dy or Tb
- a magnetic material sample having a high coercive force for example, a Nd—Fe—B magnet added with Dy or Tb
- FIG. 1 is a schematic perspective view showing the overall configuration of a magnetic field measuring apparatus according to the present invention.
- an X table 11 slidable in the Xt axis direction (parallel to the X axis of the three XYZ orthogonal axes shown in the figure), and a Yt axis (of the three XYZ orthogonal three axes) arranged on the X table 11
- a Y table 12 slidable in the direction parallel to the Y axis
- a Z table 13 arranged on the Y table 12 and slidable in the Zt axis (parallel to the Z axis of the three XYZ orthogonal axes).
- the magnetic field measurement apparatus includes a control unit 40 that controls each part of the measurement apparatus, makes a determination based on the measured leakage magnetic flux, and calculates a coercive force and its distribution.
- Magnetic material samples to be measured in the present invention include rare earth magnets such as RTB and RT systems, oxide magnets such as Ba ferrite and Sr ferrite, and magnets. Includes soft magnetic materials that do not have high coercivity.
- the present invention can be realized with an easy mechanism, but the magnetization direction is in-plane. Also, the present invention functions effectively.
- the drive system of the XYZ table 10 may be driven by a motor or may be driven by a piezo actuator.
- the movement stroke in the XY direction of the XYZ table 10 may be set so as to cover the measurement area of the sample. This makes it possible to measure the entire measurement area of the sample.
- the movement stroke of the XYZ table 10 in the XY direction is, for example, 10 ⁇ 10 mm.
- the moving stroke in the Z direction of the XYZ table 10 may be set sufficiently larger than the thickness of the sample. Thereby, it is possible to easily bring the magnetic material sample 5 closer to the measurement unit 2 and the magnetic field generation unit 6.
- the magnetic field generator 6 applies a magnetic field in the first direction by one magnetic pole 7 to perform substantially saturated magnetization, and decreases by applying a magnetic field in the direction opposite to the first direction. Do magnetism. Therefore, in the present embodiment, the magnetic field generation unit 6 serves as both the first magnetic field generation unit and the second magnetic field generation unit, but the first magnetic field generation unit and the second magnetic field generation unit are provided separately. Also good.
- the positioning resolution in the XY direction of the XYZ table 10 may be set sufficiently smaller than the size of the magnetic domain of the magnetic sample 5. Thereby, the leakage magnetic flux distribution measurement of a micro area
- the positioning resolution in the XY direction is, for example, 10 nm.
- the positioning resolution in the Z direction of the XYZ table 10 may be set to be sufficiently smaller than the surface roughness of the magnetic sample 5. This makes it possible to measure the coercive force of the sample without being affected by the surface form. *
- a Z arm 23 that is slidable in the Zs axis direction (parallel to the Z axis of the XYZ orthogonal three axes) is erected and fixed to the base 1, and the Xs axis direction (XYZ orthogonal 3
- the holder arm 4 is installed on the bottom surface of the Y arm 22, and the measuring unit 2 is installed on the bottom surface of the tip of the holder arm 4.
- the drive system of the XYZ arm 20 may be driven by a motor or may be driven by a piezo actuator.
- the moving stroke of the XYZ arm 20 in the XY direction may be set so as to cover the measurement area of the sample. This makes it possible to measure the entire measurement area of the sample.
- the movement stroke of the XYZ arm 20 in the XY direction is, for example, 100 ⁇ 100 mm.
- the movement stroke of the XYZ arm 20 in the Z direction may be set sufficiently larger than the thickness of the sample. Thereby, the magnetic material sample 5 can be easily brought close to the measurement unit 2.
- the positioning resolution of the XYZ arm 20 in the XY direction may be set to be sufficiently smaller than the size of the magnetic domain of the magnetic sample 5.
- the positioning resolution in the XY direction is, for example, 10 nm.
- the positioning resolution of the XYZ arm 20 in the Z direction may be set sufficiently smaller than the surface roughness of the magnetic sample 5. Thereby, the coercive force can be measured without being affected by the surface form.
- the two mechanisms of the XYZ stage 10 and the XYZ arm 20 perform the same operation in the relative positional relationship between the magnetic material sample 5 and the measurement unit 2, but select different driving methods for the respective mechanisms.
- the driving method of the XYZ stage 10 may be a coarse movement operation using a motor
- the driving method of the XYZ arm 20 may be a fine movement operation using a piezo actuator.
- a Zm-axis drive system 30 that is slidable in the Zm-axis direction (parallel to the Z-axis among the three axes orthogonal to XYZ) is erected and fixed to the base 1, and a magnetic field generator is provided on the front surface of the Zm-axis drive system 30. 6 is installed.
- the magnetized position (the phantom line position in FIG. 1) where the magnetic pole 7 radiating the magnetic field from the magnetic field generator 6 and the surface of the magnetic sample 5 face each other. )
- FIG. 2 is a flowchart showing the coercive force distribution measuring operation of the magnetic sample 5.
- the magnetic sample 5 is moved to the magnetized position (the phantom line position in FIG. 1) by the XYZ table and the Zm axis drive system (step 1).
- a magnetic field is radiated from the magnetic pole 7 by the magnetic field generator 6, and the magnetic sample 5 is magnetized in the positive direction (for example, the direction in which the upper surface of the magnetic sample becomes the N pole) (step 2).
- the magnetic field radiated from the magnetic pole 7 has a sufficient strength (for example, 6400 kA / m) to saturationly magnetize the magnetic material sample 5 and is a uniform magnetic field having no spatial distribution.
- step 3 the magnetic material sample 5 is magnetized in the direction opposite to the magnetization direction in step 2.
- the magnetic field radiated from the magnetic pole 7 is a uniform magnetic field having no spatial distribution.
- the intensity of the magnetic field may be set to a value smaller than the expected coercive force (for example, 160 kA / m) because the magnetization and measurement are repeated while gradually increasing to the coercive force of the magnetic sample 5 in the subsequent steps.
- the magnetic sample 5 is moved to the measurement position by the XYZ table and the Zm-axis drive system (step 4).
- the XYZ table 10 is moved, the relative position between the magnetic material sample 5 and the measurement unit 2 is changed (step 5), and the magnetic field of the magnetic material sample 5 is measured by the measurement unit 2 (step 6).
- the relative position between the magnetic sample 5 and the measurement unit 2 may be changed by the XYZ arm 20.
- the movement by the XYZ table 10 (XYZ arm 20) and the measurement by the measurement unit 2 are repeated until the measurement of the entire measurement region is completed (step 7).
- the controller 40 analyzes the measured magnetic flux distribution map and displays a region showing a pattern that appears when a magnetic field corresponding to the coercive force is applied to a thin plate-like magnetic sample. It discriminate
- the magnetic material sample 5 is moved to the magnetization position (virtual line position in FIG. 1) by the XYZ table and the Zm-axis drive system (step 10).
- the magnetization, measurement, and analysis are repeated.
- the increment of the magnetized output may be determined from the magnetic characteristics of the magnetic material sample 5. In the case of a sample having a high squareness and a demagnetization curve changing rapidly near the coercive force, a small value (for example, 160 kA / m).
- FIG. 3 shows an example of the magnetization-magnetic field curve of the magnetic sample 5 used for the coercive force distribution measurement operation.
- the magnetic sample 5 is an Nd2Fe14B thin film having a size of 6 mm ⁇ 6 mm and a thickness of 100 nm, prepared by a sputtering method.
- the magnetization-magnetic field curve was measured by VSM, and the magnetic field was applied perpendicularly to the surface of the thin film sample.
- the coercive force of the magnetic sample 5 is 1120 kA / m. That is, it is considered that half of the magnetization in the magnetic sample 5 is reversed by the external magnetic field 1120 kA / m.
- FIG. 4 is an illustration of a leakage magnetic flux distribution diagram of the magnetic sample 5 obtained by the coercive force distribution measuring operation shown in the flowchart of FIG.
- the magnetic sample 5 first applied a magnetic field of 6400 kA / m in the positive direction (6400 kA / m), then measured the leakage magnetic flux distribution on the sample surface, and then applied a magnetic field of 160 kA / m in the negative direction (160 kA / m). ) Later, the surface leakage magnetic flux distribution was measured. Furthermore, the measurement was repeated while increasing the magnetic field applied in the negative direction by 160 kA / m up to 1600 kA / m.
- Table 1 shows the relationship between the average value of the leakage magnetic flux of the magnetic material sample 5 obtained by the coercive force distribution measurement operation shown in the flowchart of FIG. 2 and the applied magnetic field.
- the average value of the magnetic flux leakage is the absolute value of the magnetic flux density obtained from each point (XY: 0.1 ⁇ m pitch) shown in the magnetic flux distribution diagram illustrated in FIG. The average is shown.
- the magnetic sample 5 is saturated and magnetized in a state where a magnetic field of 6400 kA / m is applied in the positive direction (6400 kA / m), the average value of the detected leakage magnetic flux is small. This is considered to be caused by the fact that the magnetic flux does not leak from the magnetic material sample 5 having a thin plate shape uniformly magnetized due to the influence of the demagnetizing field Hd.
- the average value of the leakage magnetic flux in the measurement region decreases. This is considered to be due to the fact that the magnetic reversal region in the magnetic sample 5 is enlarged and the demagnetizing factor is increased, so that the magnetic field leaked from the magnetic sample 5 to the outside is reduced.
- the demagnetizing factor due to the shape of the sample, magnetism based on the applied magnetic field of 1120 kA / m where the maximum leakage magnetic field was observed. It can be shown that the value taking into account the recoil permeability of the body sample 5 is the coercivity of the magnetic sample 5. This result agrees with the coercive force obtained from the magnetization-magnetic field curve obtained by measuring the magnetic sample 5 shown in FIG. 3 with the VSM.
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
2 測定部
4 ホルダアーム
5 磁性体試料
6 磁場発生装置
7 磁極
10 XYZテーブル
11 Xテーブル
12 Yテーブル
13 Zテーブル
20 XYZアーム
21 Xアーム
22 Yアーム
23 Zアーム
30 Zm軸駆動系
40 制御部
Claims (3)
- 磁性体試料の保磁力を測定する磁場測定装置であって、
前記磁性体試料に第1の方向の磁場を印加して略飽和磁化する第1の磁場発生部と、
前記磁性体試料に前記第1の方向とは逆方向の磁場を印加して減磁する第2の磁場発生部と、
前記第2の磁場発生部によって減磁された後の前記磁性体試料の残留磁化に起因する漏洩磁束を測定する測定部と、
前記第1及び第2の磁場発生部および前記測定部の動作を制御して、前記逆方向の磁場の大きさを順に変更したときの前記漏洩磁束を得、当該漏洩磁束が最大となったときの前記磁場の大きさを基に前記磁性体試料の保磁力として出力する保磁力判定部と
を備えることを特徴とする磁場測定装置。 - 前記第1の磁場発生部は、前記第2の磁場発生部の機能を兼ねる
ことを特徴とする請求項1に記載の磁場測定装置。 - 前記第2の磁場発生部は、前記磁性体試料に対して一様な磁場を印加する
ことを特徴とする請求項1に記載の磁場測定装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/374,786 US9354285B2 (en) | 2012-01-26 | 2012-12-13 | Magnetic measurement device |
JP2013555149A JP5641157B2 (ja) | 2012-01-26 | 2012-12-13 | 磁気測定装置 |
CN201280068265.4A CN104081218B (zh) | 2012-01-26 | 2012-12-13 | 磁测量装置 |
EP12866665.8A EP2808692B1 (en) | 2012-01-26 | 2012-12-13 | Magnetic measurement device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012-014551 | 2012-01-26 | ||
JP2012014551 | 2012-01-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013111468A1 true WO2013111468A1 (ja) | 2013-08-01 |
Family
ID=48873208
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2012/082276 WO2013111467A1 (ja) | 2012-01-26 | 2012-12-13 | 磁気測定装置 |
PCT/JP2012/082277 WO2013111468A1 (ja) | 2012-01-26 | 2012-12-13 | 磁気測定装置 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2012/082276 WO2013111467A1 (ja) | 2012-01-26 | 2012-12-13 | 磁気測定装置 |
Country Status (5)
Country | Link |
---|---|
US (2) | US9354285B2 (ja) |
EP (2) | EP2808691A4 (ja) |
JP (2) | JP5713120B2 (ja) |
CN (2) | CN104081218B (ja) |
WO (2) | WO2013111467A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015042975A (ja) * | 2013-07-23 | 2015-03-05 | 株式会社四国総合研究所 | 非破壊検査方法および非破壊検査装置 |
JP2016024099A (ja) * | 2014-07-22 | 2016-02-08 | 株式会社四国総合研究所 | 非破壊検査方法 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010016153A1 (de) | 2010-03-26 | 2011-09-29 | Arno Friedrichs | Hydrodynamisch geführtes Kreissägeblatt |
KR20140035013A (ko) * | 2012-09-12 | 2014-03-21 | 삼성전자주식회사 | 자기장 생성부 및 이것을 포함하는 반도체 테스트 장치 |
JP6233722B2 (ja) * | 2015-06-22 | 2017-11-22 | Tdk株式会社 | 磁界発生体、磁気センサシステムおよび磁気センサ |
CN109613457B (zh) * | 2018-12-29 | 2020-12-25 | 陕西宝成航空仪表有限责任公司 | 磁钢性能检测方法 |
KR102281293B1 (ko) * | 2019-07-11 | 2021-07-26 | 에코피아 주식회사 | 플렉시블 소자 물성 측정 장치 |
JP7297306B2 (ja) * | 2019-10-11 | 2023-06-26 | 国立研究開発法人物質・材料研究機構 | テラヘルツ磁気光学センサ、これを用いた高性能非破壊検査装置及び方法、並びにこれに用いる磁気光学撮像センサ |
CN111999688B (zh) * | 2020-08-26 | 2023-01-24 | 河北工业大学 | 一种单片级叠片铁心漏磁通测量装置 |
CN112729622B (zh) * | 2020-12-17 | 2022-07-22 | 上海电气集团股份有限公司 | 一种应力无损检测方法、装置及设备 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06180304A (ja) * | 1992-12-11 | 1994-06-28 | Glory Ltd | 磁気質検知方法 |
JPH097133A (ja) * | 1995-06-23 | 1997-01-10 | Toshiba Corp | 漏れ磁界強度測定装置 |
JP2001141701A (ja) * | 1999-11-11 | 2001-05-25 | Nkk Corp | 保磁力の測定方法 |
JP2006017557A (ja) | 2004-06-30 | 2006-01-19 | Japan Science & Technology Agency | 磁気力顕微鏡を利用した垂直磁気記録媒体中の保磁力分布解析法並びにその解析装置 |
WO2008123251A1 (ja) | 2007-03-27 | 2008-10-16 | Hitachi Metals, Ltd. | 永久磁石式回転機およびその製造方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3490033A (en) * | 1968-03-11 | 1970-01-13 | Western Electric Co | Methods of and apparatus for measuring the coercive force of piece parts |
JPS607375A (ja) * | 1983-06-27 | 1985-01-16 | Daido Steel Co Ltd | 強磁性体試験片の保磁力測定方法および装置 |
JPS61210976A (ja) * | 1985-03-15 | 1986-09-19 | Kawasaki Steel Corp | 残留磁気測定装置 |
JPS62294987A (ja) * | 1986-06-13 | 1987-12-22 | Sumitomo Metal Ind Ltd | 磁気特性測定方法及び装置 |
CN1115384A (zh) | 1995-06-02 | 1996-01-24 | 冶金工业部钢铁研究总院 | 微机控制软磁材料测量方法和装置 |
JPH1025658A (ja) * | 1996-05-10 | 1998-01-27 | Ykk Corp | 非磁性製品中の磁性体の検知方法及び検知装置 |
JP4252150B2 (ja) * | 1999-03-24 | 2009-04-08 | 富士通株式会社 | 磁気記録媒体特性測定装置および方法 |
JP4104923B2 (ja) * | 2002-07-04 | 2008-06-18 | 株式会社東芝 | 磁性体検出装置 |
JP2004206316A (ja) * | 2002-12-25 | 2004-07-22 | Fuji Electric Retail Systems Co Ltd | 磁気検出装置 |
WO2005091315A1 (ja) | 2004-03-23 | 2005-09-29 | Japan Science And Technology Agency | R−Fe−B系薄膜磁石及びその製造方法 |
TWI259285B (en) * | 2005-04-07 | 2006-08-01 | Univ Nat Yunlin Sci & Tech | Method of measuring sub-micrometer hysteresis loops of magnetic films |
ITTO20050758A1 (it) * | 2005-10-26 | 2007-04-27 | Fiat Ricerche | Dispositivo di rilevazione di grandezze fisiche in particolare un campo magnetico a film sottile e relativo procedimento di rilevazione |
US8884617B2 (en) * | 2008-06-23 | 2014-11-11 | The Regents Of The University Of California | Magnetic particle imaging devices and methods |
CN101408596B (zh) * | 2008-11-28 | 2010-05-12 | 清华大学 | 弱磁材料相对磁导率和电工纯铁矫顽力的测量方法及装置 |
US8432164B2 (en) * | 2009-10-05 | 2013-04-30 | University Of Delaware | Ferromagnetic resonance and memory effect in magnetic composite materials |
WO2011114415A1 (ja) * | 2010-03-15 | 2011-09-22 | トヨタ自動車株式会社 | 保磁力分布磁石の保磁力特定方法 |
-
2012
- 2012-12-13 US US14/374,786 patent/US9354285B2/en not_active Expired - Fee Related
- 2012-12-13 JP JP2013555148A patent/JP5713120B2/ja not_active Expired - Fee Related
- 2012-12-13 EP EP12866514.8A patent/EP2808691A4/en not_active Withdrawn
- 2012-12-13 WO PCT/JP2012/082276 patent/WO2013111467A1/ja active Application Filing
- 2012-12-13 EP EP12866665.8A patent/EP2808692B1/en not_active Not-in-force
- 2012-12-13 WO PCT/JP2012/082277 patent/WO2013111468A1/ja active Application Filing
- 2012-12-13 JP JP2013555149A patent/JP5641157B2/ja not_active Expired - Fee Related
- 2012-12-13 US US14/374,640 patent/US9702945B2/en active Active
- 2012-12-13 CN CN201280068265.4A patent/CN104081218B/zh not_active Expired - Fee Related
- 2012-12-13 CN CN201280068264.XA patent/CN104081217B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06180304A (ja) * | 1992-12-11 | 1994-06-28 | Glory Ltd | 磁気質検知方法 |
JPH097133A (ja) * | 1995-06-23 | 1997-01-10 | Toshiba Corp | 漏れ磁界強度測定装置 |
JP2001141701A (ja) * | 1999-11-11 | 2001-05-25 | Nkk Corp | 保磁力の測定方法 |
JP2006017557A (ja) | 2004-06-30 | 2006-01-19 | Japan Science & Technology Agency | 磁気力顕微鏡を利用した垂直磁気記録媒体中の保磁力分布解析法並びにその解析装置 |
WO2008123251A1 (ja) | 2007-03-27 | 2008-10-16 | Hitachi Metals, Ltd. | 永久磁石式回転機およびその製造方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2808692A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015042975A (ja) * | 2013-07-23 | 2015-03-05 | 株式会社四国総合研究所 | 非破壊検査方法および非破壊検査装置 |
JP2016024099A (ja) * | 2014-07-22 | 2016-02-08 | 株式会社四国総合研究所 | 非破壊検査方法 |
Also Published As
Publication number | Publication date |
---|---|
US9702945B2 (en) | 2017-07-11 |
JP5641157B2 (ja) | 2014-12-17 |
CN104081218A (zh) | 2014-10-01 |
CN104081217B (zh) | 2017-09-01 |
JPWO2013111467A1 (ja) | 2015-05-11 |
EP2808692A1 (en) | 2014-12-03 |
US20140375308A1 (en) | 2014-12-25 |
CN104081218B (zh) | 2015-11-25 |
EP2808692A4 (en) | 2015-10-28 |
US20150070005A1 (en) | 2015-03-12 |
EP2808692B1 (en) | 2016-11-16 |
JPWO2013111468A1 (ja) | 2015-05-11 |
WO2013111467A1 (ja) | 2013-08-01 |
JP5713120B2 (ja) | 2015-05-07 |
EP2808691A4 (en) | 2016-01-27 |
CN104081217A (zh) | 2014-10-01 |
EP2808691A1 (en) | 2014-12-03 |
US9354285B2 (en) | 2016-05-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5641157B2 (ja) | 磁気測定装置 | |
Calin et al. | Temperature influence on magnetic characteristics of NdFeB permanent magnets | |
Khlopkov et al. | Evolution of interaction domains in textured fine-grained Nd2Fe14B magnets | |
Xiong et al. | Permanent-magnet demagnetization design and validation | |
US20120229129A1 (en) | Probe station with magnetic measurement capabilities | |
EP2560015B1 (en) | Method for determining coercivity of coercivity distribution magnet | |
CN103605089A (zh) | 永磁材料室温和高温不合格产品的快速无损检测方法 | |
CN102103194A (zh) | 一种磁路可调式电工钢片二维磁特性测量装置及方法 | |
Jacimovic et al. | Self-organized giant magnetic structures via additive manufacturing in NdFeB permanent magnets | |
US20070262771A1 (en) | Method and System for Perpendicular Magnetic Media Metrology | |
JP2008039736A (ja) | 永久磁石の磁気特性評価方法 | |
Töpfer et al. | Multi-pole magnetization of NdFeB sintered magnets and thick films for magnetic micro-actuators | |
Volkov et al. | Magnetic field calibration of a transmission electron microscope using a permanent magnet material | |
JP6091312B2 (ja) | 永久磁石の特性検査方法および永久磁石の特性検査装置 | |
Nishio et al. | Desirable measurement on accurate hysteresis curve for large Nd–Fe–B sintered magnets at elevated temperatures | |
Matsuura et al. | Coercivity mechanism of Ga-doped Nd-Fe-B sintered magnets | |
JP3926356B2 (ja) | 磁気力顕微鏡用の磁性探針及びその製造方法 | |
Hahn et al. | Evaluation of a linear hybrid microstep motor by means of magnetic flux measurements | |
CN117630057A (zh) | 透射电镜原位磁学实验*** | |
CN113744950A (zh) | 一种可编程充磁设备的充磁方法 | |
JP2005168692A (ja) | 永久磁石対向型磁気回路およびその磁場を調整する方法 | |
Yazid | Magnetic domain microstructure analysis of sintered rare earth magnet materials with high coercivity | |
Bai et al. | An in-situ magnetising holder achieving 1.5 T in-plane field in 200 kV transmission electron microscope | |
CN103091513B (zh) | 强磁材料动态微磁结构观测装置及观测方法 | |
Aiso et al. | In situ Lorentz microscopy and electron holography of magnetization process in ferrite magnets |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 12866665 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2013555149 Country of ref document: JP Kind code of ref document: A |
|
WWE | Wipo information: entry into national phase |
Ref document number: 14374786 Country of ref document: US |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
REEP | Request for entry into the european phase |
Ref document number: 2012866665 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2012866665 Country of ref document: EP |