WO2012057215A1 - コージェライト質セラミックスおよびこれを用いた半導体製造装置用部材 - Google Patents
コージェライト質セラミックスおよびこれを用いた半導体製造装置用部材 Download PDFInfo
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- WO2012057215A1 WO2012057215A1 PCT/JP2011/074691 JP2011074691W WO2012057215A1 WO 2012057215 A1 WO2012057215 A1 WO 2012057215A1 JP 2011074691 W JP2011074691 W JP 2011074691W WO 2012057215 A1 WO2012057215 A1 WO 2012057215A1
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- cordierite
- spinel
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- 229910052878 cordierite Inorganic materials 0.000 title claims abstract description 99
- JSKIRARMQDRGJZ-UHFFFAOYSA-N dimagnesium dioxido-bis[(1-oxido-3-oxo-2,4,6,8,9-pentaoxa-1,3-disila-5,7-dialuminabicyclo[3.3.1]nonan-7-yl)oxy]silane Chemical compound [Mg++].[Mg++].[O-][Si]([O-])(O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2)O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2 JSKIRARMQDRGJZ-UHFFFAOYSA-N 0.000 title claims abstract description 99
- 239000000919 ceramic Substances 0.000 title claims abstract description 65
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 26
- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 229910052596 spinel Inorganic materials 0.000 claims abstract description 57
- 239000011029 spinel Substances 0.000 claims abstract description 57
- 239000013078 crystal Substances 0.000 claims abstract description 24
- 239000000203 mixture Substances 0.000 claims abstract description 18
- 229910052684 Cerium Inorganic materials 0.000 claims abstract description 15
- 229910052691 Erbium Inorganic materials 0.000 claims abstract description 14
- 229910052769 Ytterbium Inorganic materials 0.000 claims abstract description 14
- 229910052727 yttrium Inorganic materials 0.000 claims abstract description 14
- 239000000049 pigment Substances 0.000 claims description 23
- 229910052804 chromium Inorganic materials 0.000 claims description 10
- 229910052748 manganese Inorganic materials 0.000 claims description 9
- 229910000684 Cobalt-chrome Inorganic materials 0.000 claims 1
- 239000010952 cobalt-chrome Substances 0.000 claims 1
- 238000013001 point bending Methods 0.000 abstract description 11
- 239000000126 substance Substances 0.000 abstract 1
- 239000000843 powder Substances 0.000 description 38
- 238000000034 method Methods 0.000 description 18
- 239000002245 particle Substances 0.000 description 10
- 238000000149 argon plasma sintering Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 9
- 229910004298 SiO 2 Inorganic materials 0.000 description 8
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 7
- 238000002441 X-ray diffraction Methods 0.000 description 7
- 238000012790 confirmation Methods 0.000 description 7
- -1 disilicate Inorganic materials 0.000 description 6
- 235000012431 wafers Nutrition 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000010304 firing Methods 0.000 description 5
- 230000031700 light absorption Effects 0.000 description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- 239000003086 colorant Substances 0.000 description 4
- 230000001747 exhibiting effect Effects 0.000 description 4
- 238000009616 inductively coupled plasma Methods 0.000 description 4
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 238000005469 granulation Methods 0.000 description 2
- 230000003179 granulation Effects 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 238000001694 spray drying Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000264877 Hippospongia communis Species 0.000 description 1
- 229910020068 MgAl Inorganic materials 0.000 description 1
- 229910016583 MnAl Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001513 hot isostatic pressing Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000011819 refractory material Substances 0.000 description 1
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- C04B2235/9607—Thermal properties, e.g. thermal expansion coefficient
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/96—Properties of ceramic products, e.g. mechanical properties such as strength, toughness, wear resistance
- C04B2235/9646—Optical properties
- C04B2235/9661—Colour
Definitions
- the present invention relates to a cordierite ceramic and a member for a semiconductor manufacturing apparatus using the same.
- Cordierite ceramics are used for filters, honeycombs, refractories, etc. because of their low thermal expansion coefficient. In recent years, it has been proposed to use it as a member for a semiconductor manufacturing apparatus such as a vacuum apparatus structure, a susceptor, a stage, or a jig in a semiconductor manufacturing process. As such cordierite ceramic, 80 to 92 cordierite is proposed.
- the cordierite crystal particles comprise a mixed structure of high-temperature type cordierite and low-temperature type cordierite, and contain 2% by weight to 20% by weight of an oxide of rare earth element (RE).
- a cordierite ceramic is proposed in which the area ratio of the low-temperature cordierite in the crystal particles is 5% or more and the Young's modulus is 120 GPa or more (see Patent Document 1).
- the line width has been increased to a submicron order level due to the rapid progress of circuit miniaturization.
- it is used in an exposure apparatus for forming a high-precision circuit on a Si wafer.
- the positioning accuracy of 100 nm (0.1 ⁇ m) or less is required, and the alignment error due to the thermal expansion coefficient of the member greatly affects the quality and yield of the product.
- the ceramics constituting the above-described stage are required to have a coefficient of thermal expansion from the ppm order to the ppb order. Yes.
- semiconductor device components such as vacuum device structures, susceptors, stages, or jigs in the semiconductor manufacturing process are becoming larger with the increase in size of semiconductor wafers, and are compatible with their own weight and cantilever support structures. Therefore, it is required to improve mechanical strength (four-point bending strength) as well as lower thermal expansion.
- the present invention has been devised to meet the above requirements, and has an object to provide a cordierite ceramic having a low thermal expansion coefficient and excellent mechanical strength, and a member for a semiconductor manufacturing apparatus using the same. To do.
- the cordierite-type ceramic of the present invention has Mg in the range of 12.6 to 14.0% by mass in terms of oxide, Al in the range of 33.4 to 34.4% by mass in terms of oxide, and Si in the range of 52.0 to 53.6% by mass in terms of oxide. It contains 4.5 mass% or more and 15.0 mass% or less of any one of Y, Yb, Er, and Ce as an auxiliary component in terms of oxide with respect to 100 mass% of the main component having a composition range of mass% or less. Cordierite, disilicate and spinel are present.
- the member for a semiconductor manufacturing apparatus of the present invention is characterized by using the cordierite ceramic of the present invention having the above-described configuration.
- Mg is 12.6% by mass to 14.0% by mass in terms of oxide
- Al is 33.4% by mass to 34.4% by mass in terms of oxide
- Si is 52.0% by mass in terms of oxide. More than 4.5 mass% and 15.0 mass% or less in terms of oxide, containing any one of Y, Yb, Er and Ce as a subcomponent with respect to 100 mass% of the main component having a composition range of 53.6 mass% or less,
- the presence of cordierite, disilicate, and spinel as the crystalline phase reduces the abundance ratio of the crystalline phase between cordierite that exhibits a negative coefficient of thermal expansion and disilicate and spinel that exhibits a positive coefficient of thermal expansion.
- the member for semiconductor manufacturing apparatus of the present invention it is possible to achieve positioning accuracy of 100 nm (0.1 ⁇ m) or less by using the cordierite ceramic of the present invention, and high precision to the Si wafer. In forming a circuit, quality and yield can be improved.
- the cordierite-based ceramics of the present embodiment includes Mg of 12.6% by mass to 14.0% by mass in terms of oxide, Al of 33.4% by mass to 34.4% by mass in terms of oxide, and Si of 52.0% by mass or more in terms of oxide.
- Mg 12.6% by mass to 14.0% by mass in terms of oxide
- Al of 33.4% by mass to 34.4% by mass in terms of oxide
- Si 52.0% by mass or more in terms of oxide.
- any one of Y, Yb, Er, and Ce is contained as an accessory component in an amount of 4.5% by mass to 15.0% by mass in terms of oxide.
- the cordierite ceramic of the present embodiment as a crystal phase, MgO and Al 2 O 3 and consists of three components of the SiO 2 cordierite (Mg 2 Al 4 Si 5 O 18), Y, Yb, Er
- a disilicate for example, Yb 2 Si 2 O 7
- a spinel MgAl 2 O 4
- the cordierite ceramic of the present embodiment satisfies the composition range described above, and cordierite, disilicate, and spinel are present as the crystal phase, and therefore, cordierite exhibiting a negative thermal expansion coefficient and It is possible to optimize the abundance ratio of the crystalline phase with the disilicate and spinel showing the positive side thermal expansion coefficient, and the thermal expansion coefficient of the obtained cordierite ceramic can be brought close to 0 (zero).
- the thermal expansion coefficient of the cordierite ceramic at room temperature (20 to 25 ° C.) is satisfied by satisfying the above composition range and having cordierite, disilicate and spinel as crystal phases. It can be in the range of 120 ppb / ° C.
- the value of the thermal expansion coefficient of the disilicate is larger on the positive side than the spinel.
- the content of the subcomponent with respect to 100% by mass of the main component is set to 4.5% by mass or more and 15.0% by mass or less in terms of oxide of any one of Y, Yb, Er and Ce. Is less than 4.5% by mass, the abundance ratio of disilicate is reduced, and the thermal expansion coefficient of cordierite ceramics at room temperature (20 to 25 ° C.) is less than ⁇ 120 ppb / ° C. Further, if the content of the subcomponent exceeds 15.0% by mass, the abundance ratio of disilicate increases, and the thermal expansion coefficient of the cordierite ceramic at room temperature (20 to 25 ° C.) exceeds +120 ppb / ° C.
- the presence of spinel as the crystal phase suppresses the grain growth of the cordierite crystal phase and allows the cordierite ceramic to be a highly dense body made of fine crystals. Can be improved.
- the 4-point bending strength can be set to 170 MPa or more. If it has a strength of 170 MPa or more, such as damage due to its own weight, damage due to load due to a cantilever support structure, which was a problem when the size of the semiconductor wafer increased in size, Since there is little possibility, it can be used suitably for members for semiconductor manufacturing devices such as vacuum device structures, susceptors, stages, jigs in semiconductor manufacturing processes.
- the four-point bending strength may be measured according to JIS R 1601-2008. Needless to say, the spinel is preferably dispersed between the crystalline phases of cordierite.
- a part of the cordierite ceramic is pulverized, and the obtained powder is dissolved in a solution such as hydrochloric acid. Thereafter, measurement is performed using an ICP (Inductively Coupled Plasma) emission spectroscopic analyzer (manufactured by Shimadzu Corporation: ICPS-8100), and the obtained value of each metal element is used to obtain an oxide value. be able to.
- ICP Inductively Coupled Plasma
- a prism or cylinder sample having a length of 10 to 20 mm and a side or a diameter of about 5 mm is prepared, and as a measuring device in accordance with JIS R 1618-2002, for example, laser thermal expansion Using the total LIX-1 (manufactured by Vacuum Riko Co., Ltd.), the coefficient of thermal expansion in the desired temperature range can be measured in the constant temperature rise measurement mode and at the temperature rise rate of 1 ° C./min. .
- the ratio A / B between A and B is preferably 0.5 or more and 24.0 or less.
- the thermal expansion coefficient of the cordierite ceramic at room temperature (20 to 25 ° C.) can be set within a range of ⁇ 100 ppb / ° C.
- the ratio of each crystal phase of cordierite, disilicate and spinel may be calculated by analyzing the X-ray diffraction measurement result using the Rietveld analysis program RIEtan. And about ratio A / B of content of disilicate and spinel, what is necessary is just to calculate from each calculated content.
- the content of disilicate is A and the content of spinel is B
- the amount of disilicate is about 2.6 to 12.7% by mass
- the amount of spinel is about 0.53 to 5.1% by mass
- the balance is cordierite.
- the content of disilicate is 4.5% by mass or more and 7.0% by mass or less, and the content of spinel is 1.4% by mass or more and 3.3% by mass or less.
- the absolute value of the thermal expansion coefficient of the cordierite ceramics at room temperature (20 to 25 ° C.) can be further reduced.
- the content of disilicate is 4.9 mass% or more and 5.6 mass% or less and the content of spinel is 2.2 mass% or more and 2.8 mass% or less
- the cordierite ceramics at room temperature (20 to 25 ° C. The absolute value of the thermal expansion coefficient can be reduced and approached to zero.
- the cordierite ceramic of the present embodiment further includes a pigment component.
- a pigment component As described above, when the pigment component is included, it is possible to bring about a visual effect such as harmonizing the colors or making them stand out by combining with other color ceramics.
- cordierite ceramics are used as a support member for optical systems such as a lens barrel for analysis that is affected by light scattering, for example, if cordierite ceramics are prepared using a pigment component having a color tone such as gray Since cordierite ceramics exhibit a grayish color tone, light scattering is suppressed, and degradation in analysis accuracy can be reduced.
- Mn, Cr and Co are contained as pigment components, and Mn, Cr and Co are contained with respect to 100% by mass of the main components. It is preferable that the total content converted to MnO 2 , Cr 2 O 3 and CoO is 0.05% by mass or more and 3% by mass or less.
- Mn, Cr and Co are included as pigment components, and the total content of Mn, Cr and Co converted to MnO 2 , Cr 2 O 3 and CoO is 0.05% by mass with respect to 100% by mass of the main components. % Or less and 3% by mass or less, the effect on the thermal expansion coefficient and mechanical properties is small, and different phases (for example, MnAl 2 O 4 , MnCr) are caused by the reaction between the pigment components or the reaction between the main component and the pigment component. By increasing the amount of 2 O 4 ), it is possible to obtain a cordierite ceramic exhibiting a grayish color tone capable of suppressing light scattering without losing the color tone and impairing the appearance.
- the lightness index L * in the CIE1976L * a * b * color space is preferably 50 or more and 70 or less.
- the lightness index L * can be measured according to JIS Z 8722-2000.
- cordierite ceramics with a low coefficient of thermal expansion and excellent mechanical strength are used as members for semiconductor manufacturing equipment, positioning accuracy of 100 nm (0.1 ⁇ m) or less can be achieved, and Si wafers can be achieved. In the formation of a high-precision circuit, quality and yield can be improved.
- the synthetic cordierite powder and the spinel powder constitute the main component in the present embodiment, and any one oxide powder of Y, Yb, Er and Ce constitutes the subcomponent.
- Synthetic cordierite powder means that Mg is 11.7 mass% or more and 13.3 mass% or less in terms of oxide, and Al is 29.1 mass% or more in terms of oxide, excluding the addition amount of spinel powder from 100 mass% of the main component. It is a powder synthesized in advance in a composition range of 5% by mass or more and 53.6% by mass or less of Si in terms of oxide.
- a predetermined amount of synthetic cordierite powder and spinel powder are weighed, for example, 93.5 mass% to 99.9 mass% of synthetic cordierite powder and 0.01 mass% to 6.5 mass% of spinel powder.
- the subcomponents are weighed so as to be in the range of 4.5% by mass to 15.0% by mass, pure water and various binders are added, and a ball mill is used. A slurry is obtained that has been wet-mixed and pulverized for 5 to 30 hours until the average particle size becomes 2 ⁇ m or less.
- composition range of the cordierite ceramics after firing is as follows: Mg is 12.6% by mass to 14.0% by mass in terms of oxide, and Al is 33.4% by mass to 34.4% by mass in terms of oxide. % Or less and Si is 52.0 mass% or more and 53.6 mass% or less in terms of oxide.
- the pigment component when adding a pigment component, for example, 0.05% by mass to 3.0% by mass with respect to 100% by mass of the main component, and any of synthetic cordierite powder, spinel powder, Y, Yb, Er, and Ce What is necessary is just to put in a ball mill with such 1 type oxide powder, and to wet-mix by the method mentioned above.
- the pigment component preferably contains Mn, Cr and Co.
- the slurry is sprayed and granulated by a spray granulation method (spray drying method) to obtain a secondary material.
- the secondary raw material is molded by an isostatic press molding (rubber press) method or a powder press molding method, and subjected to cutting as necessary. Hold at a maximum temperature of 1440 ° C for 1 to 10 hours.
- the baking conditions to 1000 ° C. at a rate of 10 ° C./min or less, disilicate produced by the reaction between the subcomponent and SiO 2 in the synthetic cordierite can be present.
- a maximum temperature of 1350 to 1420 ° C is required. do it.
- the cordierite ceramic of this embodiment can be obtained by grinding as needed. Further, after the sintering, further densification may be achieved by HP method (hot press method) or HIP method (hot isostatic press method). Thereby, the 4-point bending strength can be set to 190 MPa or more.
- Y, Yb changes to any one of the oxide powders of Er and Ce, or for some, disilicate (Y 2 Si 2 O 7, Yb 2 Si 2 O 7, Er 2 Si 2 O 7, may be added in the form of Ce 2 Si 2 O 7).
- a synthetic cordierite powder having an average particle size of 2 ⁇ m (previously synthesized in the composition range of MgO, Al 2 O 3 and SiO 2 shown in Table 1), a spinel powder having an average particle size of 1 ⁇ m, Powders of Yb 2 O 3 , Y 2 O 3 , Er 2 O 3 and Ce 2 O 3 having an average particle diameter of 1 ⁇ m, which are subcomponents, were prepared. Then, the spinel powder was weighed so as to have an addition amount shown in Table 1, and the synthetic cordierite powder was an amount obtained by removing the addition amount of the spinel powder from 100% by mass.
- the subcomponents having the ratios shown in Table 1 are weighed with respect to the total of 100% by mass of the synthetic cordierite powder and the spinel powder, and 2% with respect to 100% by mass of the total of pure water, the main component, and the subcomponents.
- a binder having a mass% or less was added, and a slurry that was wet-mixed and pulverized for 24 hours until the average particle size became 2 ⁇ m or less using a ball mill was obtained.
- this slurry was sprayed and granulated by a spray granulation method (spray drying method) to obtain a secondary raw material. And it shape
- Sample No. 5 was prepared by the same manufacturing method described above except that no spinel powder was added. 24, 36, 40, 46 were obtained. Furthermore, sample No. 2 was prepared by the same production method described above except that Yb 2 O 3 , Y 2 O 3 , Er 2 O 3 and Ce 2 O 3 were not added as subcomponents. 16 was obtained.
- sample no. For 1 to 46, a part of the sample was pulverized, and the obtained powder was dissolved in a solution such as hydrochloric acid, and then measured using an ICP emission spectrophotometer (manufactured by Shimadzu Corporation: ICPS-8100). In addition, each metal element content was converted into an oxide. Then, using this oxide-converted value, the mass ratio of MgO, Al 2 O 3 and SiO 2 after firing at a total mass of 100% by mass, and the subordinate to the total 100% by mass of MgO, Al 2 O 3 and SiO 2 are obtained. The mass ratio of the components was determined. The results are shown in Table 2.
- each sample was cut to a length of 10 mm, and a test piece was prepared by rounding both ends of the cut sample.
- a laser thermal expansion meter LIX-1 (manufactured by Vacuum Riko Co., Ltd.) was measured by measuring the coefficient of thermal expansion in the temperature range of 20 to 25 ° C. under the condition of the rate of temperature increase: 1 ° C./min. It was shown to.
- sample No. 1,5,6,10,11,15,31-34 have cordierite, disilicate and spinel as crystal phases, but the main component composition of cordierite ceramics is Mg in oxide conversion Thermal expansion because it does not satisfy the range of 12.6% to 14.0% by mass, Al from 33.4% to 34.4% by mass in terms of oxide, and Si from 52.0% to 53.6% by mass in terms of oxide The coefficient exceeded the range of ⁇ 120 ppb / ° C.
- sample no. 2 ⁇ 4, 7 ⁇ 9, 12 ⁇ 14, 18 ⁇ 22, 25 ⁇ 30, 37, 41, 45, Mg is 12.6 mass% or more and 14.0 mass% or less in terms of oxide
- Al is 33.4 mass in terms of oxide % To 34.4% by mass and 100% by mass of the main component consisting of 52.0% to 53.6% by mass of Si in terms of oxide
- any one of Y, Yb, Er, and Ce is used as an accessory component.
- cordierite, disilicate, and spinel are present as crystalline phases, so cordierite that exhibits a negative thermal expansion coefficient and positive heat
- the existence ratio of the crystal phase with disilicate and spinel showing the expansion coefficient was optimized, and the thermal expansion coefficient of the obtained cordierite ceramic was able to be a very small value of ⁇ 120 ppb / ° C.
- a semiconductor manufacturing apparatus such as a vacuum apparatus structure, a susceptor, a stage, and a jig in a semiconductor manufacturing process.
- a semiconductor manufacturing apparatus such as a vacuum apparatus structure, a susceptor, a stage, and a jig in a semiconductor manufacturing process.
- sample no. When 2-4, 7-9, 12-14, 18-22, 25-30, 37, 41, 45 were treated by the HIP method (hot isostatic pressing method), the 4-point bending strength was 190 MPa or more. Thus, the mechanical properties were further improved.
- the manufacturing method was the same as the manufacturing method in Example 1.
- the mass ratio and thermal expansion coefficient of each component of cordierite ceramics were measured by the same method as in Example 1.
- the ratio A / B between the disilicate content (A) and the spinel content (B) in each sample was calculated.
- X′PertPRO X-ray diffractometer
- CuK ⁇ 1 X-ray diffraction measurement is performed under the conditions of 1 measurement, and X-ray diffraction measurement results are analyzed using the Rietveld analysis program Rietan, so that it is contained from the ratio of the crystalline phases of cordierite, disilicate and spinel.
- the amount was calculated.
- the ratio A / B was calculated by dividing the calculated disilicate content (A) by the spinel content (B).
- Specimen No. 2 has a disilicate content of 4.5 mass% to 7.0 mass% and a spinel content of 1.4 mass% to 3.3 mass%. 54 to 61 had a thermal expansion coefficient in the range of ⁇ 50 ppb / ° C., which is even smaller.
- sample No. 2 having a disilicate content of 4.9% by mass to 5.6% by mass and a spinel content of 2.2% by mass to 2.8% by mass.
- the thermal expansion coefficient was within the range of ⁇ 20 ppb / ° C., and the thermal expansion coefficient was able to approach zero.
- Mg is 12.6% by mass to 14.0% by mass in terms of oxide
- Al is 33.4% by mass to 34.4% by mass in terms of oxide
- Si is 52.0% by mass in terms of oxide.
- % Of the main component having a composition range of 5% to 53.6% by mass, and any one of Y, Yb, Er and Ce as an accessory component is contained in an amount of 4.5% to 15.0% by mass in terms of oxide.
- sample Nos. Shown in Table 3 of Example 2 were used.
- the pigment components shown in Table 5 were each added in an amount of 1% by mass in terms of oxides, and sample No. 79-86 were produced. And about these samples, the color tone confirmation by visual observation and the measurement of the lightness index L * were implemented.
- a sample was prepared by the same manufacturing method as in Example 1 except that the pigment component was added together with the synthetic cordierite powder, spinel powder, and Yb oxide powder.
- the sample No. containing the pigment component. 79-83 can be made into ceramics of various colors depending on the pigment component, and by combining with ceramics of other colors, visual effects such as harmonizing colors and making them stand out can be brought about I understood.
- Sample No. containing no pigment component was used. Since the value of the brightness index L * is smaller than 56, it was confirmed that light scattering can be suppressed.
- Sample No. containing Mn, Cr and Co as pigment components was used.
- 85 has a lightness index L * range of 65, and it is found that it falls within the range of 50 to 70, which is a preferable value of the brightness index L *, which can suppress light scattering and light absorption. It was.
- Example 2 sample Nos. Shown in Table 3 of Example 2 were used.
- samples with various pigment component contents as shown in Table 6 were prepared, and the brightness index L * was measured.
- a sample was prepared by the same manufacturing method as in Example 1 except that the pigment component was added together with the synthetic cordierite powder, spinel powder, and Yb oxide powder. Then, the content of the pigment component was measured using an ICP emission spectroscopic analyzer (manufactured by Shimadzu Corporation: ICPS-8100) in the same manner as shown in Example 1, and a value with respect to 100% by mass of the main component was calculated. .
- the brightness index L * was measured in the same manner as in Example 3. The results are shown in Table 6.
- sample No. 87 to 94 are within the range of 50 to 70, which is a preferable value of the lightness index L *, which can suppress light scattering and light absorption, and the lightness index L * is within this range.
- Mn, Cr and Co are included as pigment components, and the total content of Mn, Cr and Co converted to MnO 2 , Cr 2 O 3 and CoO with respect to 100% by mass of the main component is 0.05. It has been confirmed that the content may be not less than 0.3% and not more than 0.3% by mass.
- sample No. 95 Although slight color variation was confirmed, sample no. For 87 to 94, no variation in color tone was confirmed, and the appearance was not impaired. Furthermore, sample no. When the thermal expansion coefficient and the 4-point bending strength were measured for 87 to 94, the thermal expansion coefficient was +2 ppb / ° C. and the 4-point bending strength was ⁇ 4 MPa as compared with the case where no pigment component was contained. From this result, sample no. Nos. 87 to 94 were found to be cordierite ceramics having a small thermal expansion coefficient, excellent mechanical strength, and suppressing light scattering and color tone capable of suppressing light absorption.
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Abstract
Description
Claims (6)
- Mgを酸化物換算で12.6質量%以上14.0質量%以下、Alを酸化物換算で33.4質量%以上34.4質量%以下およびSiを酸化物換算で52.0質量%以上53.6質量%以下の組成範囲からなる主成分100質量%に対し、副成分としてY,Yb,ErおよびCeのいずれか1種を酸化物換算で4.5質量%以上15.0質量%以下含んでなり、結晶相としてコージェライト、ダイシリケートおよびスピネルが存在していることを特徴とするコージェライト質セラミックス。
- 前記ダイシリケートの含有量をA、前記スピネルの含有量をBとしたとき、AとBとの比率A/Bが0.5以上24.0以下であることを特徴とする請求項1に記載のコージェライト質セラミックス。
- 前記ダイシリケートの含有量が4.5質量%以上7.0質量%以下であり、前記スピネルの含有量が1.4質量%以上3.3質量%以下であることを特徴とする請求項1または請求項2に記載のコージェライト質セラミックス。
- 顔料成分をさらに含んでなることを特徴とする請求項1乃至請求項3のいずれかに記載のコージェライト質セラミックス。
- 前記顔料成分としてMn,CrおよびCoCrを含み、前記主成分100質量%に対して、Mn,CrおよびCoをそれぞれMnO2,Cr2O3およびCoOに換算した合計の含有量が0.05質量%以上3質量%以下であることを特徴とする請求項4に記載のコージェライト質セラミックス。
- 請求項1乃至請求項5のいずれかに記載のコージェライト質セラミックスを用いたことを特徴とする半導体製造装置用部材。
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EP11836348.0A EP2634156A4 (en) | 2010-10-26 | 2011-10-26 | CORDIERIC CERAMICS AND ELEMENT FOR SEMICONDUCTOR MANUFACTURERS THEREWITH |
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US10207948B2 (en) | 2016-07-10 | 2019-02-19 | Schott Ag | Cordierite glass-ceramic |
US20200161167A1 (en) * | 2017-07-28 | 2020-05-21 | Kyocera Corporation | Substrate holding member and semiconductor manufacturing device |
US20230137894A1 (en) | 2020-01-27 | 2023-05-04 | Heraeus Conamic North America Llc | High purity cordierite material for semiconductor applications |
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- 2011-10-26 EP EP11836348.0A patent/EP2634156A4/en not_active Withdrawn
- 2011-10-26 US US13/881,908 patent/US20130225392A1/en not_active Abandoned
- 2011-10-26 CN CN2011800508437A patent/CN103180262A/zh active Pending
- 2011-10-26 JP JP2012540910A patent/JP5744045B2/ja active Active
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Also Published As
Publication number | Publication date |
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EP2634156A4 (en) | 2014-10-29 |
JP5744045B2 (ja) | 2015-07-01 |
CN103180262A (zh) | 2013-06-26 |
US20130225392A1 (en) | 2013-08-29 |
JPWO2012057215A1 (ja) | 2014-05-12 |
EP2634156A1 (en) | 2013-09-04 |
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