WO2012015173A3 - 부품 공급장치 및 부품 검사장비 - Google Patents

부품 공급장치 및 부품 검사장비 Download PDF

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Publication number
WO2012015173A3
WO2012015173A3 PCT/KR2011/004791 KR2011004791W WO2012015173A3 WO 2012015173 A3 WO2012015173 A3 WO 2012015173A3 KR 2011004791 W KR2011004791 W KR 2011004791W WO 2012015173 A3 WO2012015173 A3 WO 2012015173A3
Authority
WO
WIPO (PCT)
Prior art keywords
parts
inspecting
supplying
equipment
transferring
Prior art date
Application number
PCT/KR2011/004791
Other languages
English (en)
French (fr)
Other versions
WO2012015173A2 (ko
Inventor
나승우
유필상
염충호
Original Assignee
주식회사 서울금속
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020100074280A external-priority patent/KR101399287B1/ko
Priority claimed from KR1020110009249A external-priority patent/KR101067641B1/ko
Priority claimed from KR1020110015900A external-priority patent/KR101240898B1/ko
Priority claimed from KR1020110037092A external-priority patent/KR101183872B1/ko
Application filed by 주식회사 서울금속 filed Critical 주식회사 서울금속
Priority to CN201180047833.8A priority Critical patent/CN103140323B/zh
Publication of WO2012015173A2 publication Critical patent/WO2012015173A2/ko
Publication of WO2012015173A3 publication Critical patent/WO2012015173A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
    • B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

본 발명은 머리부와 몸체부를 가지는 부품을 거꾸로 세워진 자세로 정렬하여 공급위치에 한 개씩 일정한 속도로 공급하는 공급장치, 위에 부품이 놓이는 회전식 공급원판에 의하여 상기 공급장치로부터의 부품을 거꾸로 세워진 자세 그대로 배출위치로 이송하는 이송장치, 이송장치에 의하여 이송되는 부품을 카메라로 촬영하고 카메라로부터의 영상신호를 분석하여 촬영된 부품에 대한 불량 여부를 검사하는 검사장치를 포함하는 부품 검사장비를 제공한다.
PCT/KR2011/004791 2010-07-30 2011-06-30 부품 공급장치 및 부품 검사장비 WO2012015173A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201180047833.8A CN103140323B (zh) 2010-07-30 2011-06-30 用于供应零件的装置和用于检查零件的设备

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
KR1020100074280A KR101399287B1 (ko) 2010-07-30 2010-07-30 부품 검사 장치
KR10-2010-0074280 2010-07-30
KR10-2011-0009249 2011-01-31
KR1020110009249A KR101067641B1 (ko) 2011-01-31 2011-01-31 부품 선별 시스템
KR1020110015900A KR101240898B1 (ko) 2011-02-23 2011-02-23 부품 정속공급장치 및 이것을 포함하는 부품 검사장비
KR10-2011-0015900 2011-02-23
KR1020110037092A KR101183872B1 (ko) 2011-04-21 2011-04-21 부품 공급장치
KR10-2011-0037092 2011-04-21

Publications (2)

Publication Number Publication Date
WO2012015173A2 WO2012015173A2 (ko) 2012-02-02
WO2012015173A3 true WO2012015173A3 (ko) 2012-04-19

Family

ID=45530563

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/004791 WO2012015173A2 (ko) 2010-07-30 2011-06-30 부품 공급장치 및 부품 검사장비

Country Status (2)

Country Link
CN (1) CN103140323B (ko)
WO (1) WO2012015173A2 (ko)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103394952B (zh) * 2013-06-13 2016-05-11 江苏沙龙机电科技有限公司 数控滚齿机自动上料工艺
CN104897686A (zh) * 2015-05-25 2015-09-09 张家港市锐正精密工具有限公司 一种检测锯片铣刀质量的方法
CN105783730B (zh) * 2016-03-01 2018-08-07 珠海格力电器股份有限公司 螺钉的检测方法、装置、***及检测机
CN106733679B (zh) * 2016-11-23 2019-01-08 上海永太汽车零部件厂 一种零配件分选***以及零配件分选方法
CN108513126A (zh) * 2017-02-24 2018-09-07 日本电产株式会社 自动检查装置和自动检查方法
CN108513127A (zh) * 2017-02-28 2018-09-07 日本电产株式会社 自动检查装置和自动检查方法
CN107234412B (zh) * 2017-07-18 2023-07-25 河北工程大学 一种检测套筒正反的装置及套筒分拣装配的装置
CN107756120B (zh) * 2017-10-25 2019-08-06 宁波市奉化智牛自动化设备设计有限公司 一种振动盘弹簧片钻孔装置的传送机构
CN107985932A (zh) * 2017-12-01 2018-05-04 西南交通大学 一种用于辅助检测和辅助下料的旋转运动装置
CN108672313B (zh) * 2018-05-15 2020-07-03 舟山市普陀宝弘精密机械有限公司 螺栓自动检测机
JP6917399B2 (ja) * 2018-11-30 2021-08-11 台達電子工業股▲ふん▼有限公司Delta Electronics, Inc. 柱状部品外観検査装置
CN110000532A (zh) * 2019-04-23 2019-07-12 深圳市久巨工业设备有限公司 一种送料机构及装配设备
CN110346375B (zh) * 2019-08-19 2024-03-08 珠海格力智能装备有限公司 电容检测装置
CH717472B1 (it) 2020-05-29 2022-07-15 Dimac S R L Apparecchiatura a caricamento semiautomatico per il controllo statistico, l'ispezione, la misura, la verifica e la selezione automatica minuterie di qualunque genere in metallo, plastica e altri materiali.
CN111701878A (zh) * 2020-07-02 2020-09-25 武汉森赛睿科技有限公司 陶瓷穿孔识别装置
CN112170215B (zh) * 2020-09-22 2023-03-31 上海兹懋仪器科技有限公司 一种螺栓生产用废品检测机构
CN114012520B (zh) * 2021-11-09 2022-10-21 杭州汽车发动机零部件有限公司 一种气门挺柱加工设备及其加工工艺

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0891548A (ja) * 1994-09-17 1996-04-09 J C C Eng Kk 電子部品の整列供給装置
JPH11227933A (ja) * 1998-02-10 1999-08-24 Toyo Denji Kikai Seisakusho:Kk 端子部品供給装置
JP2005214751A (ja) * 2004-01-28 2005-08-11 Tsunehiro Yoshida ネジの検査装置
JP2007167949A (ja) * 2005-12-19 2007-07-05 Yoshitaka Aoyama 軸状部品の供給装置
JP2008073653A (ja) * 2006-09-25 2008-04-03 Nitto Seiko Co Ltd 部品検査装置
KR100899361B1 (ko) * 2008-12-10 2009-05-26 (주)진합 나사검사선별장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4446588B2 (ja) * 2000-12-13 2010-04-07 日東精工株式会社 部品検査装置
CN201291209Y (zh) * 2008-10-23 2009-08-19 锐志科技有限公司 物件检测机结构

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0891548A (ja) * 1994-09-17 1996-04-09 J C C Eng Kk 電子部品の整列供給装置
JPH11227933A (ja) * 1998-02-10 1999-08-24 Toyo Denji Kikai Seisakusho:Kk 端子部品供給装置
JP2005214751A (ja) * 2004-01-28 2005-08-11 Tsunehiro Yoshida ネジの検査装置
JP2007167949A (ja) * 2005-12-19 2007-07-05 Yoshitaka Aoyama 軸状部品の供給装置
JP2008073653A (ja) * 2006-09-25 2008-04-03 Nitto Seiko Co Ltd 部品検査装置
KR100899361B1 (ko) * 2008-12-10 2009-05-26 (주)진합 나사검사선별장치

Also Published As

Publication number Publication date
CN103140323B (zh) 2015-10-14
CN103140323A (zh) 2013-06-05
WO2012015173A2 (ko) 2012-02-02

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