WO2008114312A1 - 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ - Google Patents
拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ Download PDFInfo
- Publication number
- WO2008114312A1 WO2008114312A1 PCT/JP2007/000243 JP2007000243W WO2008114312A1 WO 2008114312 A1 WO2008114312 A1 WO 2008114312A1 JP 2007000243 W JP2007000243 W JP 2007000243W WO 2008114312 A1 WO2008114312 A1 WO 2008114312A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- terminal pair
- input
- pair
- sample
- output
- Prior art date
Links
- 238000009792 diffusion process Methods 0.000 title abstract 4
- 239000003990 capacitor Substances 0.000 abstract 2
- 230000000717 retained effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/1023—Offset correction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
- H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/000243 WO2008114312A1 (ja) | 2007-03-16 | 2007-03-16 | 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ |
KR1020097019571A KR101158177B1 (ko) | 2007-03-16 | 2007-03-16 | 확산 스위치를 갖는 샘플홀드 회로 및 그것을 이용한 아날로그-디지털 컨버터 |
JP2009504905A JP4750206B2 (ja) | 2007-03-16 | 2007-03-16 | 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ |
US12/556,739 US7969336B2 (en) | 2007-03-16 | 2009-09-10 | Sample-hold circuit having spreading switch and analog-digital converter using same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/000243 WO2008114312A1 (ja) | 2007-03-16 | 2007-03-16 | 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/556,739 Continuation US7969336B2 (en) | 2007-03-16 | 2009-09-10 | Sample-hold circuit having spreading switch and analog-digital converter using same |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008114312A1 true WO2008114312A1 (ja) | 2008-09-25 |
Family
ID=39765433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/000243 WO2008114312A1 (ja) | 2007-03-16 | 2007-03-16 | 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ |
Country Status (4)
Country | Link |
---|---|
US (1) | US7969336B2 (ja) |
JP (1) | JP4750206B2 (ja) |
KR (1) | KR101158177B1 (ja) |
WO (1) | WO2008114312A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013031055A (ja) * | 2011-07-29 | 2013-02-07 | Fujitsu Semiconductor Ltd | Adc |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2571168B1 (en) * | 2010-05-14 | 2016-12-14 | Toyota Jidosha Kabushiki Kaisha | Sample-and-hold circuit and a/d converter |
JP5062293B2 (ja) * | 2010-05-14 | 2012-10-31 | トヨタ自動車株式会社 | サンプルホールド回路及びa/d変換装置 |
US9252799B2 (en) | 2010-09-09 | 2016-02-02 | Spatial Digital Systems, Inc. | Receiver with orthogonal beam forming technique |
US8395418B2 (en) | 2010-11-04 | 2013-03-12 | Robert Bosch Gmbh | Voltage sensing circuit with reduced susceptibility to gain drift |
EP2783368B1 (en) * | 2011-11-22 | 2019-04-17 | Robert Bosch GmbH | Voltage sensing circuit with reduced susceptibility to gain drift |
JP5851285B2 (ja) * | 2012-03-02 | 2016-02-03 | ラピスセミコンダクタ株式会社 | Ad変換回路とマイクロコントローラ及びサンプリング時間調整方法 |
DE102012203670A1 (de) * | 2012-03-08 | 2013-09-12 | Robert Bosch Gmbh | Analog-Digital-Wandleranordnung und zugehöriges Verfahren zur Überprüfung eines Multiplexers für einen Analog-Digital-Wandler |
US10192630B1 (en) * | 2012-04-12 | 2019-01-29 | Hittite Microwave Llc | Track-and-hold circuit with acquisition glitch suppression |
KR102034089B1 (ko) * | 2012-11-15 | 2019-10-18 | 엘지이노텍 주식회사 | 제어기 및 이를 포함하는 제어 시스템 |
CN103036569A (zh) * | 2012-11-28 | 2013-04-10 | 四川和芯微电子股份有限公司 | 采样保持电路 |
FR3004875B1 (fr) * | 2013-04-22 | 2016-09-09 | E2V Semiconductors | Convertisseur analogique-numerique differentiel avec commutation periodique des voies |
TWI488023B (zh) * | 2013-04-29 | 2015-06-11 | Ili Technology Corp | 電流電壓轉換器及其電子裝置 |
US11092656B2 (en) * | 2015-05-12 | 2021-08-17 | Texas Instruments Incorporated | Fluxgate magnetic field detection method and circuit |
WO2017059970A1 (de) * | 2015-10-05 | 2017-04-13 | Heimann Sensor Gmbh | Hochauflösendes thermopile infrarot sensorarray mit monolithisch integrierter signalverarbeitung |
KR101811283B1 (ko) | 2016-05-31 | 2017-12-22 | 고려대학교 산학협력단 | 시분할 아날로그-디지털 변환기 및 그 캘리브레이션 방법 |
US10236765B2 (en) * | 2017-01-31 | 2019-03-19 | Infineon Technologies Ag | Switched-capacitor circuit and method of operating a switched-capacitor circuit |
DE102018104547A1 (de) * | 2018-02-28 | 2019-08-29 | Universität Paderborn | Integrier- und Halteschaltung |
US10291247B1 (en) * | 2018-03-07 | 2019-05-14 | Xilinx, Inc. | Chopping switch time-skew calibration in time-interleaved analog-to-digital converters |
KR102349324B1 (ko) | 2020-09-03 | 2022-01-07 | 한양대학교 에리카산학협력단 | 평균 전류 센싱 회로 및 그 제어방법 |
KR20220119905A (ko) | 2021-02-22 | 2022-08-30 | 에스케이하이닉스 주식회사 | 샘플 앤 홀드 증폭 회로 및 이를 포함하는 반도체 장치 |
US11489536B1 (en) * | 2021-06-25 | 2022-11-01 | Intel Corporation | Input circuitry for an analog-to-digital converter, receiver, base station and method for operating an input circuitry for an analog-to-digital converter |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4912423A (en) * | 1989-02-27 | 1990-03-27 | General Electric Company | Chopper-stabilized operational transconductance amplifier |
US6201835B1 (en) * | 1999-03-05 | 2001-03-13 | Burr-Brown Corporation | Frequency-shaped pseudo-random chopper stabilization circuit and method for delta-sigma modulator |
US7026804B2 (en) * | 2002-06-25 | 2006-04-11 | Zarlink Semiconductor (U.S.) Inc. | Sample and hold circuit |
US7088147B2 (en) * | 2003-04-16 | 2006-08-08 | Cirrus Logic, Inc. | Sample and hold circuits and methods with offset error correction and systems using the same |
US7239183B2 (en) * | 2003-09-29 | 2007-07-03 | Nokia Corporation | Active current mode sampling circuit |
KR100711824B1 (ko) * | 2005-05-27 | 2007-04-30 | 노키아 코포레이션 | 능동 전류 모드 샘플링 회로 |
KR20070009750A (ko) * | 2005-07-14 | 2007-01-19 | (주)에프씨아이 | 직렬 샘플링 커패시터 및 이를 이용한 아날로그 디지털컨버터 |
US7545296B2 (en) * | 2006-08-22 | 2009-06-09 | Broadcom Corporation | Interleaved track and hold circuit |
-
2007
- 2007-03-16 WO PCT/JP2007/000243 patent/WO2008114312A1/ja active Application Filing
- 2007-03-16 KR KR1020097019571A patent/KR101158177B1/ko not_active IP Right Cessation
- 2007-03-16 JP JP2009504905A patent/JP4750206B2/ja not_active Expired - Fee Related
-
2009
- 2009-09-10 US US12/556,739 patent/US7969336B2/en not_active Expired - Fee Related
Non-Patent Citations (2)
Title |
---|
JAMAL S.M. ET AL.: "A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 37, no. 12, 2002, pages 1618 - 1627, XP001222716 * |
JAMAL S.M. ET AL.: "A 10b 120MSample/s time-interleaved analog-to-digital converter with digital background calibration", SOLID-STATE CIRCUITS CONFERENCE, 2002. DIGEST OF TECHNICAL PAPERS. ISSCC. 2002 IEEE INTERNATIONAL, vol. 2, 2002, pages 132 - 133, 436, XP010584990 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013031055A (ja) * | 2011-07-29 | 2013-02-07 | Fujitsu Semiconductor Ltd | Adc |
Also Published As
Publication number | Publication date |
---|---|
KR101158177B1 (ko) | 2012-06-19 |
US20100026536A1 (en) | 2010-02-04 |
JP4750206B2 (ja) | 2011-08-17 |
KR20100005038A (ko) | 2010-01-13 |
US7969336B2 (en) | 2011-06-28 |
JPWO2008114312A1 (ja) | 2010-06-24 |
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