WO2008114312A1 - 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ - Google Patents

拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ Download PDF

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Publication number
WO2008114312A1
WO2008114312A1 PCT/JP2007/000243 JP2007000243W WO2008114312A1 WO 2008114312 A1 WO2008114312 A1 WO 2008114312A1 JP 2007000243 W JP2007000243 W JP 2007000243W WO 2008114312 A1 WO2008114312 A1 WO 2008114312A1
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WO
WIPO (PCT)
Prior art keywords
terminal pair
input
pair
sample
output
Prior art date
Application number
PCT/JP2007/000243
Other languages
English (en)
French (fr)
Inventor
Masato Yoshioka
Original Assignee
Fujitsu Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Limited filed Critical Fujitsu Limited
Priority to PCT/JP2007/000243 priority Critical patent/WO2008114312A1/ja
Priority to KR1020097019571A priority patent/KR101158177B1/ko
Priority to JP2009504905A priority patent/JP4750206B2/ja
Publication of WO2008114312A1 publication Critical patent/WO2008114312A1/ja
Priority to US12/556,739 priority patent/US7969336B2/en

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1023—Offset correction
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

　入力差動信号をサンプルホールドして出力差動信号を出力するサンプルホールド回路において，入力差動信号を増幅し第１の出力端子対とを有する入力増幅回路と，第１の出力端子対を反転または非反転に切り換えるトランジスタスイッチ群を有する拡散スイッチとを有し，更に，第１の出力端子対に拡散スイッチを経由して接続される第２の入力端子対と，第２の入力端子対の差動信号に応じて増幅した出力差動信号を第２の出力端子対に出力する出力増幅器と，第２の入力端子対と第２の出力端子対との間にそれぞれ設けられ第２の入力端子対に入力される電流をそれぞれチャージ又はディスチャージするキャパシタ対と，キャパシタ対のチャージ状態をリセットするリセット回路とを有する積分器を有する。第１の出力端子対と第２の入力端子対とが同電位に保たれるので，拡散スイッチでの信号歪みが防止できる。
PCT/JP2007/000243 2007-03-16 2007-03-16 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ WO2008114312A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
PCT/JP2007/000243 WO2008114312A1 (ja) 2007-03-16 2007-03-16 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ
KR1020097019571A KR101158177B1 (ko) 2007-03-16 2007-03-16 확산 스위치를 갖는 샘플홀드 회로 및 그것을 이용한 아날로그-디지털 컨버터
JP2009504905A JP4750206B2 (ja) 2007-03-16 2007-03-16 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ
US12/556,739 US7969336B2 (en) 2007-03-16 2009-09-10 Sample-hold circuit having spreading switch and analog-digital converter using same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000243 WO2008114312A1 (ja) 2007-03-16 2007-03-16 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/556,739 Continuation US7969336B2 (en) 2007-03-16 2009-09-10 Sample-hold circuit having spreading switch and analog-digital converter using same

Publications (1)

Publication Number Publication Date
WO2008114312A1 true WO2008114312A1 (ja) 2008-09-25

Family

ID=39765433

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000243 WO2008114312A1 (ja) 2007-03-16 2007-03-16 拡散スイッチを有するサンプルホールド回路及びそれを利用したアナログデジタルコンバータ

Country Status (4)

Country Link
US (1) US7969336B2 (ja)
JP (1) JP4750206B2 (ja)
KR (1) KR101158177B1 (ja)
WO (1) WO2008114312A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013031055A (ja) * 2011-07-29 2013-02-07 Fujitsu Semiconductor Ltd Ａｄｃ

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2571168B1 (en) * 2010-05-14 2016-12-14 Toyota Jidosha Kabushiki Kaisha Sample-and-hold circuit and a/d converter
JP5062293B2 (ja) * 2010-05-14 2012-10-31 トヨタ自動車株式会社 サンプルホールド回路及びａ／ｄ変換装置
US9252799B2 (en) 2010-09-09 2016-02-02 Spatial Digital Systems, Inc. Receiver with orthogonal beam forming technique
US8395418B2 (en) 2010-11-04 2013-03-12 Robert Bosch Gmbh Voltage sensing circuit with reduced susceptibility to gain drift
EP2783368B1 (en) * 2011-11-22 2019-04-17 Robert Bosch GmbH Voltage sensing circuit with reduced susceptibility to gain drift
JP5851285B2 (ja) * 2012-03-02 2016-02-03 ラピスセミコンダクタ株式会社 Ａｄ変換回路とマイクロコントローラ及びサンプリング時間調整方法
DE102012203670A1 (de) * 2012-03-08 2013-09-12 Robert Bosch Gmbh Analog-Digital-Wandleranordnung und zugehöriges Verfahren zur Überprüfung eines Multiplexers für einen Analog-Digital-Wandler
US10192630B1 (en) * 2012-04-12 2019-01-29 Hittite Microwave Llc Track-and-hold circuit with acquisition glitch suppression
KR102034089B1 (ko) * 2012-11-15 2019-10-18 엘지이노텍 주식회사 제어기 및 이를 포함하는 제어 시스템
CN103036569A (zh) * 2012-11-28 2013-04-10 四川和芯微电子股份有限公司 采样保持电路
FR3004875B1 (fr) * 2013-04-22 2016-09-09 E2V Semiconductors Convertisseur analogique-numerique differentiel avec commutation periodique des voies
TWI488023B (zh) * 2013-04-29 2015-06-11 Ili Technology Corp 電流電壓轉換器及其電子裝置
US11092656B2 (en) * 2015-05-12 2021-08-17 Texas Instruments Incorporated Fluxgate magnetic field detection method and circuit
WO2017059970A1 (de) * 2015-10-05 2017-04-13 Heimann Sensor Gmbh Hochauflösendes thermopile infrarot sensorarray mit monolithisch integrierter signalverarbeitung
KR101811283B1 (ko) 2016-05-31 2017-12-22 고려대학교 산학협력단 시분할 아날로그-디지털 변환기 및 그 캘리브레이션 방법
US10236765B2 (en) * 2017-01-31 2019-03-19 Infineon Technologies Ag Switched-capacitor circuit and method of operating a switched-capacitor circuit
DE102018104547A1 (de) * 2018-02-28 2019-08-29 Universität Paderborn Integrier- und Halteschaltung
US10291247B1 (en) * 2018-03-07 2019-05-14 Xilinx, Inc. Chopping switch time-skew calibration in time-interleaved analog-to-digital converters
KR102349324B1 (ko) 2020-09-03 2022-01-07 한양대학교 에리카산학협력단 평균 전류 센싱 회로 및 그 제어방법
KR20220119905A (ko) 2021-02-22 2022-08-30 에스케이하이닉스 주식회사 샘플 앤 홀드 증폭 회로 및 이를 포함하는 반도체 장치
US11489536B1 (en) * 2021-06-25 2022-11-01 Intel Corporation Input circuitry for an analog-to-digital converter, receiver, base station and method for operating an input circuitry for an analog-to-digital converter

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912423A (en) * 1989-02-27 1990-03-27 General Electric Company Chopper-stabilized operational transconductance amplifier
US6201835B1 (en) * 1999-03-05 2001-03-13 Burr-Brown Corporation Frequency-shaped pseudo-random chopper stabilization circuit and method for delta-sigma modulator
US7026804B2 (en) * 2002-06-25 2006-04-11 Zarlink Semiconductor (U.S.) Inc. Sample and hold circuit
US7088147B2 (en) * 2003-04-16 2006-08-08 Cirrus Logic, Inc. Sample and hold circuits and methods with offset error correction and systems using the same
US7239183B2 (en) * 2003-09-29 2007-07-03 Nokia Corporation Active current mode sampling circuit
KR100711824B1 (ko) * 2005-05-27 2007-04-30 노키아 코포레이션 능동 전류 모드 샘플링 회로
KR20070009750A (ko) * 2005-07-14 2007-01-19 (주)에프씨아이 직렬 샘플링 커패시터 및 이를 이용한 아날로그 디지털컨버터
US7545296B2 (en) * 2006-08-22 2009-06-09 Broadcom Corporation Interleaved track and hold circuit

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JAMAL S.M. ET AL.: "A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 37, no. 12, 2002, pages 1618 - 1627, XP001222716 *
JAMAL S.M. ET AL.: "A 10b 120MSample/s time-interleaved analog-to-digital converter with digital background calibration", SOLID-STATE CIRCUITS CONFERENCE, 2002. DIGEST OF TECHNICAL PAPERS. ISSCC. 2002 IEEE INTERNATIONAL, vol. 2, 2002, pages 132 - 133, 436, XP010584990 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013031055A (ja) * 2011-07-29 2013-02-07 Fujitsu Semiconductor Ltd Ａｄｃ

Also Published As

Publication number Publication date
KR101158177B1 (ko) 2012-06-19
US20100026536A1 (en) 2010-02-04
JP4750206B2 (ja) 2011-08-17
KR20100005038A (ko) 2010-01-13
US7969336B2 (en) 2011-06-28
JPWO2008114312A1 (ja) 2010-06-24

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