WO2008099662A1 - 磁気検出装置 - Google Patents

磁気検出装置 Download PDF

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Publication number
WO2008099662A1
WO2008099662A1 PCT/JP2008/051184 JP2008051184W WO2008099662A1 WO 2008099662 A1 WO2008099662 A1 WO 2008099662A1 JP 2008051184 W JP2008051184 W JP 2008051184W WO 2008099662 A1 WO2008099662 A1 WO 2008099662A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic field
external magnetic
variation
electric resistance
effect element
Prior art date
Application number
PCT/JP2008/051184
Other languages
English (en)
French (fr)
Inventor
Katsuya Kikuiri
Kiyoshi Sato
Kazuhiro Sasagawa
Original Assignee
Alps Electric Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co., Ltd. filed Critical Alps Electric Co., Ltd.
Priority to JP2008558031A priority Critical patent/JP5184380B2/ja
Publication of WO2008099662A1 publication Critical patent/WO2008099662A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

【課題】　特に、外部磁界の磁極変化に対して動作安定性に優れたラッチ型の磁気検出装置を提供することを目的としている。 【解決手段】　（＋）方向の外部磁界に対して電気抵抗値が変化する第１磁気抵抗効果素子と、（－）方向の外部磁界に対して電気抵抗値が変化する第２磁気抵抗効果素子と、第１磁気抵抗効果素子の電気抵抗値の変化に基づいてＯＮ信号を生成し、第２磁気抵抗効果素子の電気抵抗値の変化に基づいてＯＦＦ信号を生成する集積回路を有する。一旦生成されたＯＮ信号は、（＋）方向の外部磁界、及び、（－）方向の外部磁界のうち、ＯＦＦ信号が生成される磁界強度よりも小さい磁界強度変化に対して保持され、一旦生成されたＯＦＦ信号は、（－）方向の外部磁界、及び、（＋）方向の外部磁界のうち、第１の信号が生成される磁界強度よりも小さい磁界強度変化に対して保持される。
PCT/JP2008/051184 2007-01-31 2008-01-28 磁気検出装置 WO2008099662A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008558031A JP5184380B2 (ja) 2007-01-31 2008-01-28 磁気検出装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-021543 2007-01-31
JP2007021543 2007-01-31

Publications (1)

Publication Number Publication Date
WO2008099662A1 true WO2008099662A1 (ja) 2008-08-21

Family

ID=39689908

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/051184 WO2008099662A1 (ja) 2007-01-31 2008-01-28 磁気検出装置

Country Status (2)

Country Link
JP (1) JP5184380B2 (ja)
WO (1) WO2008099662A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010217161A (ja) * 2009-02-17 2010-09-30 Rohm Co Ltd 磁気センサ、およびこれを備えた電子機器
JP2012109948A (ja) * 2010-10-19 2012-06-07 Yamaha Corp ヒシテリシス装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003262665A (ja) * 2002-03-08 2003-09-19 Asahi Kasei Electronics Co Ltd 磁気センサ
JP2004029007A (ja) * 2002-05-14 2004-01-29 Hewlett-Packard Development Co Lp 磁界検出センサ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003262665A (ja) * 2002-03-08 2003-09-19 Asahi Kasei Electronics Co Ltd 磁気センサ
JP2004029007A (ja) * 2002-05-14 2004-01-29 Hewlett-Packard Development Co Lp 磁界検出センサ

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010217161A (ja) * 2009-02-17 2010-09-30 Rohm Co Ltd 磁気センサ、およびこれを備えた電子機器
JP2012109948A (ja) * 2010-10-19 2012-06-07 Yamaha Corp ヒシテリシス装置
US8564350B2 (en) 2010-10-19 2013-10-22 Yamaha Corporation Hysteresis device

Also Published As

Publication number Publication date
JP5184380B2 (ja) 2013-04-17
JPWO2008099662A1 (ja) 2010-05-27

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