WO2008023620A1 - Dispositif électroluminescent et écran - Google Patents
Dispositif électroluminescent et écran Download PDFInfo
- Publication number
- WO2008023620A1 WO2008023620A1 PCT/JP2007/065908 JP2007065908W WO2008023620A1 WO 2008023620 A1 WO2008023620 A1 WO 2008023620A1 JP 2007065908 W JP2007065908 W JP 2007065908W WO 2008023620 A1 WO2008023620 A1 WO 2008023620A1
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- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- type semiconductor
- light emitting
- light
- emitting layer
- Prior art date
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- 239000004065 semiconductor Substances 0.000 claims abstract description 148
- 239000002245 particle Substances 0.000 claims abstract description 97
- 239000000463 material Substances 0.000 claims description 56
- 239000000758 substrate Substances 0.000 claims description 52
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 31
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 26
- 229910052725 zinc Inorganic materials 0.000 claims description 26
- 239000011701 zinc Substances 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 24
- -1 tube Chemical compound 0.000 claims description 15
- 239000011787 zinc oxide Substances 0.000 claims description 15
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 150000001875 compounds Chemical class 0.000 claims description 11
- 229910052782 aluminium Inorganic materials 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 9
- 229910052733 gallium Inorganic materials 0.000 claims description 8
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 7
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 229910052715 tantalum Inorganic materials 0.000 claims description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 5
- 229910052796 boron Inorganic materials 0.000 claims description 5
- 239000004332 silver Substances 0.000 claims description 5
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 5
- 239000010936 titanium Substances 0.000 claims description 5
- 229910052719 titanium Inorganic materials 0.000 claims description 5
- 229910052721 tungsten Inorganic materials 0.000 claims description 5
- 229910007709 ZnTe Inorganic materials 0.000 claims description 4
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical class [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 229910001009 interstitial alloy Inorganic materials 0.000 claims description 2
- 229910000765 intermetallic Inorganic materials 0.000 claims 2
- 241001201614 Prays Species 0.000 claims 1
- 229910052951 chalcopyrite Inorganic materials 0.000 claims 1
- 239000010410 layer Substances 0.000 description 120
- 239000010408 film Substances 0.000 description 33
- 238000010586 diagram Methods 0.000 description 17
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 14
- 238000010894 electron beam technology Methods 0.000 description 12
- 230000000052 comparative effect Effects 0.000 description 10
- 229910003437 indium oxide Inorganic materials 0.000 description 10
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 10
- 238000001704 evaporation Methods 0.000 description 8
- 230000008020 evaporation Effects 0.000 description 8
- 238000007740 vapor deposition Methods 0.000 description 8
- 239000011521 glass Substances 0.000 description 7
- 238000006073 displacement reaction Methods 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000005381 potential energy Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 239000013078 crystal Substances 0.000 description 5
- 239000000843 powder Substances 0.000 description 5
- 238000005215 recombination Methods 0.000 description 5
- 230000006798 recombination Effects 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000011230 binding agent Substances 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- 239000012212 insulator Substances 0.000 description 4
- 229910052758 niobium Inorganic materials 0.000 description 4
- 239000010955 niobium Substances 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 3
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 3
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 238000005204 segregation Methods 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- 239000000654 additive Substances 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 239000011246 composite particle Substances 0.000 description 2
- 229920001940 conductive polymer Polymers 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- 229910052741 iridium Inorganic materials 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229920000767 polyaniline Polymers 0.000 description 2
- 229920000128 polypyrrole Polymers 0.000 description 2
- 229910052703 rhodium Inorganic materials 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- LLLVZDVNHNWSDS-UHFFFAOYSA-N 4-methylidene-3,5-dioxabicyclo[5.2.2]undeca-1(9),7,10-triene-2,6-dione Chemical compound C1(C2=CC=C(C(=O)OC(=C)O1)C=C2)=O LLLVZDVNHNWSDS-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229920002292 Nylon 6 Polymers 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000007611 bar coating method Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical group [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000013081 microcrystal Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 238000000807 solvent casting Methods 0.000 description 1
- 239000004071 soot Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- QHGNHLZPVBIIPX-UHFFFAOYSA-N tin(II) oxide Inorganic materials [Sn]=O QHGNHLZPVBIIPX-UHFFFAOYSA-N 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/58—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing copper, silver or gold
- C09K11/582—Chalcogenides
- C09K11/584—Chalcogenides with zinc or cadmium
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/14—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
- H05B33/145—Arrangements of the electroluminescent material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/16—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular crystal structure or orientation, e.g. polycrystalline, amorphous or porous
- H01L33/18—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular crystal structure or orientation, e.g. polycrystalline, amorphous or porous within the light emitting region
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
- H01L33/24—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate of the light emitting region, e.g. non-planar junction
Definitions
- the present invention relates to a light emitting element, particularly an electroluminescent element, and also relates to a display device using the light emitting element.
- an electroluminescent device (hereinafter referred to as an EL device) has attracted attention as a light-weight and thin surface-emitting device.
- EL devices can be broadly classified as follows: a direct voltage is applied to a phosphor made of an organic material, an AC voltage is applied to an organic EL device that recombines electrons and holes to emit light, and a phosphor made of an inorganic material.
- an inorganic EL device that emits light from an inorganic phosphor during the relaxation process, in which an electron accelerated by a high electric field of about 10 6 V / cm collides with the emission center of the inorganic phosphor and is excited.
- the inorganic EL element includes a dispersed EL element in which inorganic phosphor particles are dispersed in a binder made of a polymer organic material to form a light emitting layer, and a thin film light emitting layer having a thickness of about 1 ⁇ m.
- a dispersed EL element in which inorganic phosphor particles are dispersed in a binder made of a polymer organic material to form a light emitting layer, and a thin film light emitting layer having a thickness of about 1 ⁇ m.
- thin-film EL elements with insulating layers on both sides or one side.
- distributed EL devices are attracting attention as they have the advantage of low power consumption and low manufacturing costs due to simple manufacturing.
- a conventional distributed EL element has a laminated structure, and is constructed by laminating a substrate, a first electrode, a light emitting layer, an insulator layer, and a second electrode in this order from the substrate side.
- the light emitting layer has a configuration in which inorganic phosphor particles such as ZnS: Mn are dispersed in an organic binder, and the insulator layer has a configuration in which a strong insulator such as BaTiO is dispersed in an organic binder.
- An AC power supply is installed between the first electrode and the second electrode, and the distributed EL element emits light when a voltage is applied between the first electrode and the second electrode from the AC power supply.
- the light-emitting layer is a layer that determines the luminance and efficiency of the dispersion-type EL element, and the inorganic phosphor particles of the light-emitting layer have a particle size of 15 to 35 Hm.
- the emission color of the light-emitting layer of the dispersion-type EL element is determined by the inorganic phosphor particles used in the light-emitting layer. For example, when ZnS: Mn is used for the inorganic phosphor particles, orange light is emitted. ZnS: C on body particles When U is used, blue-green light is emitted.
- the emission color is determined by the inorganic phosphor particles used, so when obtaining other emission colors such as white, for example, the emission color is converted to another color by mixing an organic dye with an organic binder.
- the target emission color is obtained (see, for example, Patent Document 2).
- the illuminant used in the dispersion-type EL element has a problem that the luminance is low and the lifetime is short.
- the half-life of the light output of the light emitter is reduced in inverse proportion to the applied voltage.
- the method of reducing the applied voltage to the light-emitting layer is considered.
- the emission luminance and the half-life are in a reciprocal relationship that when one is improved by increasing or decreasing the voltage applied to the light emitting layer, the other is worsened. Therefore, it is necessary to select either emission luminance or lifetime (half-life of light output).
- the half-life is the time until the light output of the light emitter is reduced to half of the original light emission luminance.
- this EL element 50 includes a light emitting layer 53 in which phosphor particles 61 of CdSe microcrystals are dispersed in a medium of indium tin oxide 63, which is a transparent conductor, between electrodes 52 and 54. In this method, light is emitted by applying a voltage. Since this EL element 50 is a current injection type light emitting element, it can be driven at a low voltage.
- Patent Document 1 International Publication No. WO03 / 020848 Pamphlet
- Patent Document 2 JP-A-7-216351
- Patent Document 3 Japanese Patent No. 3741157
- the above method has a problem that high luminance cannot be obtained because a conductive film is used as a medium.
- An object of the present invention is to solve the above-mentioned problems, emit light at a low voltage, and have a high light emission luminance.
- the long life is to provide a light emitting element.
- an object of the present invention is to solve the above-mentioned problems, and to provide a display device that emits light at a low voltage, has a high strength, and has a long emission life.
- the above object is achieved by a light emitting device according to the present invention. That is, the light emitting device according to the present invention includes a first electrode,
- a second electrode disposed opposite to the first electrode
- Another embodiment of the light-emitting device according to the present invention includes a first electrode,
- a second electrode disposed opposite to the first electrode
- the ⁇ -type semiconductor particles are electrically bonded to the first and second electrodes via the ⁇ -type semiconductor! /.
- each of the ⁇ -type semiconductor particles and the ⁇ -type semiconductor may be a compound semiconductor. Still further, the ⁇ -type semiconductor particle may be a Group 12 or Group 16 compound semiconductor. The ⁇ -type semiconductor particles may be a Group 13 Group 15 compound semiconductor. The ⁇ -type semiconductor particles may be chalcopyrite type compound semiconductors. Furthermore, the ⁇ -type semiconductor material is Cu S, ZnS, ZnSe, ZnSSe, ZnSeTe, Z
- nTe, GaN, and InGaN may be used.
- n-type semiconductor particles are a zinc-based material containing zinc
- At least one of the first electrode and the second electrode is preferably made of a material containing zinc.
- the zinc-containing material constituting the one electrode is composed mainly of zinc oxide, and at least one selected from the group consisting of aluminum, gallium, titanium, niobium, tantalum, tandastene, copper, silver, and boron. May contain Yes.
- a support substrate may be further provided that supports the first electrode or the second electrode so as to face at least one of the electrodes.
- a color conversion layer may be further provided opposite to each of the first electrode and the second electrode, and in front of the light emission extraction direction from the light emitting layer.
- a display device includes a substrate,
- a plurality of scan electrodes extending in parallel with each other in the first direction on the substrate; a plurality of data electrodes extending in parallel with each other in a second direction perpendicular to the first direction;
- At least one of the scanning electrode and the data electrode is transparent or semi-transparent, and the light emitting layer is configured such that n-type semiconductor particles are dispersed in a P-type semiconductor medium. To do.
- Another display device includes a substrate,
- a plurality of scan electrodes extending in parallel with each other in the first direction on the substrate; a plurality of data electrodes extending in parallel with each other in a second direction perpendicular to the first direction;
- At least one of the scanning electrode and the data electrode is transparent or semi-transparent
- the light emitting layer is composed of an aggregate of n-type semiconductor particles, and a p-type semiconductor is prayed between the particles. It is characterized by.
- the n-type semiconductor particles may be electrically joined to the first and second electrodes through the p-type semiconductor.
- the n-type semiconductor particles and the p-type semiconductor may each be a compound semiconductor. Still further, the n-type semiconductor particles may be a group 12 group 16 interstitial compound semiconductor. The n-type semiconductor particles are Group 13 Group 15 compound semiconductors. May be. The n-type semiconductor particles may be chalcopyrite type compound semiconductors. Still further, the p-type semiconductor material may be Cu S, ZnS, ZnSe, ZnSSe, ZnSeTe, ZnTe.
- GaN GaN
- InGaN may be used.
- the n-type semiconductor particles are a zinc-based material containing zinc
- at least one of the first electrode and the second electrode is made of a material containing zinc.
- the material containing zinc that constitutes the one electrode is composed mainly of zinc oxide and includes at least one selected from the group consisting of aluminum, gallium, titanium, niobium, tantalum, tungsten, copper, silver, and boron. It is preferable to include.
- a support substrate may be further provided that supports the first electrode or the second electrode so as to face at least one of the electrodes.
- a color conversion layer may be further provided in front of each of the first electrode and the second electrode and in the direction in which light is extracted from the light emitting layer.
- the light emitting layer has (i) a structure in which n type semiconductor particles are dispersed in a p type semiconductor medium, or (ii) a collection of n type semiconductor particles. And has any force of a structure in which a p-type semiconductor is segregated between the particles.
- the light emitting layer has the above-described structure, holes can be efficiently injected into the n-type semiconductor particles or into the interface, and light can be efficiently injected at a low voltage with high brightness.
- a display device can be realized.
- FIG. 1 is a schematic configuration diagram seen from a direction perpendicular to a light emitting surface of a light emitting element according to Embodiment 1 of the present invention.
- FIG. 2 is a schematic configuration diagram seen from a direction perpendicular to the light emitting surface of another example of the light emitting element according to Embodiment 1 of the present invention.
- FIG. 3 (a) is a schematic diagram of the vicinity of the interface between the light-emitting layer made of ZnS and the transparent electrode (or back electrode) made of AZO, and (b) shows the displacement of potential energy in (a).
- FIG. 4 (a) is a schematic diagram of an interface between a light-emitting layer made of ZnS and a transparent electrode made of ITO as a comparative example, and (b) is a schematic diagram explaining the displacement of potential energy in (a).
- a is a schematic diagram of an interface between a light-emitting layer made of ZnS and a transparent electrode made of ITO as a comparative example
- (b) is a schematic diagram explaining the displacement of potential energy in (a).
- FIG. 5 is a schematic configuration diagram perpendicular to the light emitting surface of a light emitting element of still another example according to Embodiment 1 of the present invention.
- FIG. 6 is a block diagram showing a configuration of a passive matrix display device according to a second embodiment of the present invention.
- FIG. 7 is a perspective view showing a configuration of a display unit that constitutes the display device of FIG. 6.
- FIG. 7 is a perspective view showing a configuration of a display unit that constitutes the display device of FIG. 6.
- FIG. 8 is a cross-sectional view perpendicular to the light emitting surface along the line AA in FIG.
- FIG. 9 is a schematic diagram showing the configuration when each pixel C in FIG. 8 is considered as one EL element.
- FIG. 10 is a schematic view showing a configuration of an EL element of another example of FIG.
- FIG. 11 is a schematic diagram showing a configuration of still another example in which each pixel C in FIG. 8 is considered as one EL element.
- FIG. 12 is a schematic diagram showing a configuration of a color display device according to another example of the present invention.
- FIG. 13 is a schematic configuration diagram viewed from a direction perpendicular to the light emitting surface of a conventional inorganic EL element.
- FIG. 1 is a schematic configuration diagram seen from a direction perpendicular to the light emitting surface of the light emitting element 10 according to Embodiment 1 of the present invention.
- the light-emitting element 10 includes a substrate 1, a transparent electrode 2 provided on the substrate 1, a light-emitting layer 3 provided on the transparent electrode 2, and a back electrode 4 provided on the light-emitting layer 3. .
- the light emitting layer 3 is sandwiched between the transparent electrode 2 and the back electrode 4.
- the substrate 1 is provided adjacent to the transparent electrode 2 to support the entire light emitting element 10. In this case, since light is extracted from the substrate 1 side, the substrate 1 is made of a transparent material. Further, the transparent electrode 2 and the back electrode 4 are electrically connected via the power source 5.
- a DC power source is used as the power source 5!
- the light emitting layer 3 is composed of an aggregate of n-type semiconductor particles 21 as shown in FIG. 1, and the p-type semiconductor 23 is segregated between the particles.
- the light emitting layer 3 is characterized in that the n-type semiconductor particles 21 are dispersed in the medium of the p-type semiconductor 23. In this way, by forming many interfaces between the n-type semiconductor particles and the p-type semiconductor, the hole injection property is improved, and recombination-type light emission of electrons and holes is efficiently generated. It is possible to realize a light-emitting element that emits high-intensity light. Furthermore, the light emission efficiency can be improved by adopting a configuration in which the n-type semiconductor particles are electrically connected to the electrode through the p-type semiconductor.
- the light emitting element 10 is not limited to the above-described configuration, and a plurality of light emitting layers 3 are provided. A plurality of thin dielectric layers are provided between the electrodes 2 and 4 and the light emitting layer 3 for the purpose of current limitation.
- Install transparent electrode 2 and back electrode 4 replace both transparent electrode 2 and back electrode 4 with a transparent electrode for light emission, or use power source 5 as an AC power source, and back electrode 4 with a black electrode
- the substrate 1 one that can support each layer formed thereon is used.
- the material be light transmissive with respect to the wavelength of light emitted from the light emitter.
- a material for example, glass such as Couting 1737, quartz, ceramic or the like can be used. It may be non-alkali glass or soda lime glass in which alumina or the like is coated on the glass surface as an ion barrier layer so that alkali ions contained in ordinary glass do not affect the light emitting element.
- polyester poly A combination of ethylene terephthalate, polychloroethylene and nylon 6, fluorine resin materials, resin films such as polyethylene, polypropylene, polyimide, and polyamide can also be used.
- a resin film it is preferable to use a material excellent in durability, flexibility, transparency, electrical insulation, and moisture resistance. Note that the description of the above material is an example, and the material of the substrate 1 is not particularly limited thereto.
- the electrodes there are a transparent electrode 2 on the light extraction side and a back electrode 4 on the other side.
- the transparent electrode 2 is provided on the substrate 1 as shown in FIG. 1
- the present invention is not limited to this.
- a back electrode 4 may be provided on 1 and a light emitting layer 3 and a transparent electrode 2 may be laminated on the back electrode 4 in this order.
- both the transparent electrode 2 and the back electrode 4 may be transparent electrodes.
- the material of the transparent electrode 2 is not particularly limited as long as it has a light transmitting property so that the emitted light 7 generated in the light emitting layer 3 can be extracted to the outside, and preferably has a high transmittance in the visible light region. Moreover, it is preferable that the electrode has a low resistance, and further, it is preferable that the electrode has excellent adhesion to the substrate 1 and the light emitting layer 3.
- a particularly suitable material for the transparent electrode 2 is ITO (InO doped with SnO.
- These transparent electrodes 2 can be formed by a film forming method such as sputtering, electron beam evaporation, or ion plating for the purpose of improving the transparency or reducing the resistivity. Further, after film formation, surface treatment such as plasma treatment may be performed for the purpose of resistivity control. The film thickness of the transparent electrode 2 is determined from the required sheet resistance value and visible light transmittance.
- the carrier concentration of the transparent electrode 2 is preferably in the range of lE17 ⁇ lE22cm_ 3. Ma
- the transparent electrode 2 has a volume resistivity of 1E ⁇ 3 ⁇ ′cm or less and a transmittance of 75% or more at a wavelength of 380 to 780 nm.
- the refractive index of the transparent electrode 2 is preferably 1.85 to 1.95.
- the film thickness of the transparent electrode 2 is 30 nm or less, a dense and stable film can be realized.
- the back electrode 4 can be any conductive material that is generally well known. Furthermore, it is preferable that the adhesiveness with the light emitting layer 3 is excellent. Suitable examples include, for example, metal oxides such as ITO, InZnO, ZnO, SnO, Pt, Au, Pd, Ag, Ni, Cu,
- Metals such as Al, Ru, Rh, Ir, Cr, Mo, W, Ta, Nb, laminated structures of these, or polyaniline, polypyrrole, PEDOT [poly (3,4-ethylenedioxythiophene) ] / Use of conductive polymer such as PSS (polystyrene sulfonic acid) or conductive carbon.
- PSS polystyrene sulfonic acid
- the transparent electrode 2 and the back electrode 4 may be configured to cover the entire surface of each layer, or a plurality of electrodes may be configured in a stripe shape in the layer. Furthermore, both the transparent electrode 2 and the back electrode 4 are configured as a plurality of stripes, and each stripe-like electrode of the transparent electrode 2 and all the stripe-like electrodes and the force S of the back electrode 4 are twisted. And each of the striped electrodes of the transparent electrode 2 projected onto the light emitting surface and all the striped electrodes of the back electrode 4 projected onto the light emitting surface intersect each other. You may comprise. In this case, by applying a voltage between a pair of electrodes selected from each of the striped electrodes of the transparent electrode 2 and each of the striped electrodes of the back electrode 4, a display that emits light at a predetermined position is configured. It becomes possible.
- the light emitting layer 3 is sandwiched between the transparent electrode 2 and the back electrode 4 and has one of the following two structures.
- the material of the n-type semiconductor particles 21 is an n-type semiconductor material in which majority carriers are electrons and exhibit n-type conduction.
- the material may be a Group 12-Group 16 compound semiconductor. Further, it may be a Group 13 Group 15 Group 15 compound semiconductor.
- the optical band gap is a material having a visible light size, for example, ZnS, ZnSe, GaN, InGaN, AlN, GaAlN, GaP, CdSe, CdTe, SrS, and CaS
- the power to be used as it is, or as an additive, one or more elements selected from Ag, Al, Ga, In, Cu, Mn, and ⁇ are added and used.
- the material of the p-type semiconductor 23 is a p-type semiconductor material in which majority carriers are holes and exhibits p-type conduction.
- This p-type semiconductor material is, for example, 'Cu S, ZnS, ZnSe, ZnSS.
- e compounds such as ZnSeTe and ZnTe, and nitrides such as GaN and InGaN.
- p-type semiconductor materials Cu S and the like inherently show p-type conduction, but other materials are added.
- the light-emitting element 10 is characterized in that the light-emitting layer 3 has a structure in which the P-type semiconductor 23 is segregated between (i) n-type semiconductor particles 21 (Fig. 1), (ii) p That is, it has a structure where the n-type semiconductor particles 21 are dispersed in the medium of the type semiconductor 23 (FIG. 5).
- the medium that is electrically joined to the semiconductor particles 61 is indium tin oxide 63
- the force that allows the electrons to reach the semiconductor particles 61 to emit light is indium tin. Since the hole concentration of the oxide is small, holes for recombination are insufficient.
- the present inventor has focused on a structure that can efficiently inject holes with the injection of electrons in the light-emitting layer 3 in order to obtain particularly high brightness and efficient radiating power and continuous light emission.
- a large number of holes reach the inside or the interface of the phosphor particles, and further, holes are rapidly injected from the electrode facing the electron injection electrode, and the phosphor particles Or it must reach the interface. Therefore, as a result of intensive studies, the present inventor has made the light-emitting layer 3 a structure of any one of the above (i) and (ii), thereby injecting electrons into the n-type semiconductor particles or into the interface.
- holes can be injected efficiently. That is, according to the light-emitting layer 3 having each structure described above, electrons injected from the electrode reach the n-type semiconductor particle 21 through the p-type semiconductor 23, while many positive holes from the other electrode become phosphor particles. The light can be efficiently emitted by recombination of electrons and holes. As a result, a light emitting element that emits light with high luminance at a low voltage can be realized, and the present invention has been achieved. In addition, by introducing a donor or acceptor, recombination of free electrons and holes captured by the acceptor, recombination of free holes and electrons captured by the donor, and donor-acceptor pair emission are also possible. It is. Furthermore, light emission by energy transfer is possible as well because other ion species are in the vicinity.
- n-type semiconductor particles 21 of the light emitting layer 3 at least one of the transparent electrode 2 and the back electrode 4, for example, ZnO, AZO (for example, zinc oxide) It is preferable to use an electrode made of a metal oxide containing zinc, such as one doped with aluminum) or GZO (zinc oxide doped with gallium, for example).
- ZnO zinc oxide
- AZO zinc oxide
- GZO zinc oxide doped with gallium, for example.
- the present inventor has found that light can be emitted with high efficiency by employing a combination of specific n-type semiconductor particles 21 and specific transparent electrode 2 (or back electrode 4).
- the work function of Z ⁇ is 5.8 eV
- ITO indium oxide
- the work function of tin is 7. OeV.
- the work function of the zinc-based material that is the n-type semiconductor particle 21 of the light-emitting layer 3 is 5 to 6 eV
- the work function of ZnO is closer to the work function of the zinc-based material than that of ITO.
- electron injection into layer 3 is good.
- AZO and GZO which are zinc-based materials, are used as the transparent electrode 2 (or the back electrode 4).
- FIG. 3 (a) is a schematic view of the vicinity of the interface between the light-emitting layer 3 made of ZnS and the transparent electrode 2 (or the back electrode 4) made of AZO.
- Fig. 3 (b) is a schematic diagram for explaining the potential energy displacement of Fig. 3 (a).
- FIG. 4 (a) is a schematic diagram of an interface between the light emitting layer 3 made of ZnS and the transparent electrode made of ITO as a comparative example.
- Fig. 4 (b) is a schematic diagram for explaining the displacement of the potential energy in Fig. 4 (a).
- the n-type semiconductor particles constituting the light emitting layer 3 are used.
- the zinc oxide-based (AZO) transparent electrode 2 (or back electrode 4) has a hexagonal crystal structure, but is a zinc-based material (ZnS) that is the n-type semiconductor material 21 constituting the light-emitting layer 3. ) Also has a hexagonal or cubic crystal structure, so the strain is small and the energy barrier is small at the interface between the two. As a result, the displacement of potential energy is small as shown in Fig. 3 (b).
- the transparent electrode is ITO which is not a zinc-based material, so that the oxide film (ZnO) formed at the interface has a crystal structure different from that of ITO. Therefore, the energy barrier at the interface increases. Therefore, as shown in FIG. 4 (b), the displacement of potential energy increases at the interface, and the light emission efficiency of the light emitting element decreases.
- the transparent electrode 2 (or the back electrode 4) made of a zinc oxide-based material is used.
- a light-emitting element with high light emission efficiency can be provided.
- the transparent electrode 2 (or the back electrode 4) containing zinc
- the force described by taking AZO doped with aluminum and GZO doped with gallium as examples.
- the light emitting layer 23 is prepared by melting a p-type semiconductor material in a vacuum or in an inert gas, and dispersing n-type semiconductor particles having a higher melting point in the molten P-type semiconductor. Then, by cooling, it is possible to obtain the light emitting layer 3 (configuration (ii)) having a structure in which the n-type semiconductor particles 21 are dispersed in the medium of the p-type semiconductor 23. (c) Also, the p-type semiconductor material and the n-type semiconductor material are mixed in advance, melted in a vacuum, and then cooled to precipitate n-type semiconductor crystal particles 21 in the medium of the p-type semiconductor 23. Then, it is possible to obtain the light emitting layer 3 (another configuration of the above (ii)) having a structure in which the n-type semiconductor crystal particles 21 are precipitated in the medium of the p-type semiconductor 23.
- the n-type semiconductor particles 24 are dispersed in the medium of the p-type semiconductor 23 according to the above (b), or the n-type semiconductor is precipitated in the medium of the p-type semiconductor according to the above (c) and then pulverized.
- composite particle powder in which the n-type semiconductor is dispersed or precipitated in the P-type semiconductor medium is obtained.
- the composite particle powder is dispersed in an arbitrary organic solvent or the like, and then formed into a film using an ink jet method, a dating method, a spin coating method, a screen printing method, a bar coating method, or other known solvent casting methods.
- the organic solvent is volatilized to form an aggregate of n-type semiconductor particles, and a p-type semiconductor is prayed between the particles to obtain a light-emitting layer 3 (configuration (i) above). That's the power S.
- a manufacturing method of another example of the light emitting device 10a shown in FIG. 2 will be described.
- a back electrode 4 is formed on a substrate 1, and a light emitting layer 3 and a transparent electrode 2 are sequentially laminated thereon.
- the light emitting layer 3 is composed of an aggregate of n-type semiconductor particles, and has a structure in which a P-type semiconductor is prayed between the particles (configuration (i) above).
- the light emitting layer 3 was formed by the soot vapor deposition method.
- a substrate 1 (4) in which a Pt film was formed on a silicon substrate was prepared.
- the silicon substrate corresponds to the substrate 1 and the Pt film corresponds to the back electrode 4.
- the light emitting layer 3 was formed on the Pt film 4 of the silicon substrate 1 by the following two steps by EB vapor deposition.
- the substrate temperature was 200 ° C.
- the film was a mixture of fine ZnS particles and Cu S segregating between the particles.
- ZnS particles are n-type semiconductor particles
- Cu S that segregates between the particles is a p-type semiconductor.
- the transparent electrode 2 was formed on the light emitting layer 3 with a 1 mm square pattern by sputtering.
- the light emitting element 10a was evaluated by connecting the power source 5 between the electrode 4 and the transparent electrode 2. Although a DC power source is used here as the power source 5, an AC power source can also be used. When a voltage was applied between electrode 2 and electrode 4, light emission was observed at an applied voltage of about 10 V, and a luminance of about 1000 cd / m 2 was obtained at about 30 V.
- the light emitting element according to this embodiment can obtain higher luminance than the conventional light emitting element at a low applied voltage.
- the light-emitting element according to the present embodiment was able to obtain higher brightness / longer brightness / half-life than the conventional electroluminescence sensor.
- a light emitting device was fabricated by EB vapor deposition using the same manufacturing method as in Example 1.
- a substrate having a transparent conductive film formed on a glass substrate was prepared.
- the glass substrate corresponds to the substrate
- the transparent conductive film corresponds to the transparent electrode.
- a light emitting layer was formed on the transparent conductive film on the glass substrate by EB vapor deposition.
- Example 2 the same electron beam (EB) vapor deposition apparatus as the evaporation source power was used as in Example 1.
- ZnS Each evaporation source was placed powder indium tin oxide, is irradiated with an electron beam in each material in 10- 6 T OT r stand vacuum film was formed on the transparent conductive film 2 by evaporation of the material .
- various conditions such as introduction of oxygen and change in oxygen partial pressure were changed.
- the substrate temperature was 200 ° C.
- the film structure was examined by X-ray diffraction and SEM observation of the cross section. As a result, the film was a mixture of fine ZnS particles and indium tin oxide (Fig. 13).
- a Pt electrode 4 was formed in a 1 mm square pattern on the light emitting layer by sputtering.
- the light-emitting element of the comparative example was manufactured through the above steps.
- the light emitting device of this comparative example was evaluated by applying a voltage between the electrodes. As a result, light emission could not be confirmed even when a DC voltage of 20 V was applied, and destruction of the light emitting element occurred when the voltage was further increased.
- Example 1 of the present invention When the light-emitting device obtained in Example 1 of the present invention was compared with the light-emitting device of the comparative example, the light-emitting device of the present invention emitted light more stably than the light-emitting device of the comparative example. It was. That is, the light-emitting element of Example 1 of the present invention has a light emission luminance of about lOOOcd / m 2 at a DC voltage of about 30 V, whereas the light-emitting element of the comparative example can confirm light emission by applying a DC voltage. The light emitting device of Example 1 was clearly superior.
- FIG. 6 is a block diagram showing a schematic configuration of passive matrix display device 100 according to Embodiment 1 of the present invention.
- the passive matrix display device 100 includes a display unit 101, a drive unit 102 that selectively drives the EL elements, and a control unit 103 that controls the drive unit 102 and supplies power.
- a DC power source is used as shown in FIG.
- the driving unit 102 includes a data electrode driving circuit 121 that drives the data electrode X and a scanning electrode driving circuit 122 that drives the scanning electrode Y.
- FIG. 7 is a perspective view showing the configuration of the display unit 101.
- the display unit 101 includes a substrate 1 and a plurality of data electrodes X, X, X,... Arranged in parallel with each other along the first direction (column direction in FIGS. 6 and 7). ⁇ ⁇ ⁇ ⁇ , the light emitting layer 3, and the second direction perpendicular to the first direction
- a plurality of scanning electrodes Y, Y, Y ⁇ are arranged so as to extend in parallel to each other along the direction (row direction in FIGS. 6 and 7).
- a portion where the pair of data electrodes X and scanning electrodes Y intersect is called a pixel C.
- the display unit 101 has N ⁇ M pixels C-power three-dimensional array.
- Each pixel C represents the pixel position by its subscripts i and j.
- pixel C in Figure 6 is data
- 21 2 ⁇ represents the pixel where electrode Y intersects, and pixel C represents data electrode X and scan electrode Y.
- pixel c and pixel c are connected to scan electrode ⁇ .
- the pixel C is connected to the scan electrode Y.
- pixel C and pixel C are
- FIG. 8 is a cross-sectional view perpendicular to the light emitting surface along the line AA in FIG.
- each pixel C includes a data electrode X (back electrode 4), a light emitting layer 3, and a scanning electrode Y (transparent electrode 2), which are sequentially stacked on the substrate 1.
- Each pixel C corresponds to one EL element. Therefore, the display unit 101 can think that a plurality of EL elements are two-dimensionally arranged.
- the force in which the light-emitting layer 3 is provided as a continuous layer over each pixel C is not limited to such a configuration, and the light-emitting layer 3 is provided separately for each pixel C. It may be a configuration.
- the light emitting layer 3 may be separated for each pixel C.
- an EL element array in which EL elements are separated for each pixel C except for the data electrode X and the scanning electrode Y and each EL element is two-dimensionally arranged may be used. In this case, it is only necessary to configure EL elements for all of the intersecting pixels C of the N data electrodes X and the M scan electrodes Y.
- FIG. 9 is a schematic schematic diagram when one pixel C in FIG. 8 is considered as one EL element 10.
- This EL element 10 is configured by laminating a back electrode 4, a light emitting layer 3, and a transparent electrode 2 in this order on a substrate 1, and a voltage is applied to the light emitting layer 3 by a DC power source 5 to cause the light emitting layer 3 to emit light.
- the back electrode 4 corresponds to the data electrode X
- the transparent electrode 2 corresponds to the scanning electrode Y.
- the light emitting layer 3 is composed of an aggregate of n-type semiconductor particles 21 as shown in FIG. 9, and the p-type semiconductor 23 is segregated between the particles.
- the force for explaining the case where the back electrode 4 is provided on the substrate 1 is not limited to this.
- a transparent electrode 2 may be provided on 1 and a light emitting layer 3 and a back electrode 4 may be laminated on the transparent electrode 2 in this order.
- another EL element 10b shown in FIG. 11 is characterized in that the light emitting layer 3 is configured by dispersing n-type semiconductor particles 21 in a medium of p-type semiconductor 23.
- a color display device by forming the light emitting layer 3 by color-coding the phosphors of RGB colors.
- a light emitting unit for each color of RGB such as transparent electrode / light emitting layer / back electrode may be laminated.
- FIG. 12 is an example of a display unit of a color display device.
- a color conversion layer 115 and a color filter 116 are further provided between the substrate 1 and the plurality of data electrodes.
- the color conversion layer 115 is provided between the light emitting layer 3 and the color filter 116, and converts the light from the emission layer 3 into white light.
- the color filter 116 includes one of a red filter R, a green filter G, and a blue filter B for each data electrode.
- White light from the color conversion layer 115 is transmitted through the red filter R, the green filter G, and the blue filter B, respectively, and is displayed through the red light, the green light, and the blue light.
- a plurality of light-emitting layers 3 are provided, a plurality of thin dielectric layers are provided between the electrodes and the light-emitting layers for the purpose of current limitation, driven by an AC power source, and scanning power
- Both the electrode and the data electrode are transparent electrodes, and one of the electrodes is a black electrode.
- the display device 100 further includes a structure for sealing all or part of the display device 100. It is possible to make appropriate changes, such as further providing a structure for color conversion of the emission color of
- control means 103 drives the data electrode drive circuit 121 and the scan electrode drive circuit 122 based on information such as whether or not each pixel emits light.
- the scan electrode driving circuit 122 applies a voltage to the scan electrode corresponding to the pixel C to emit light.
- the data electrode driving circuit 121 applies a voltage to the data electrode corresponding to the pixel C that emits light.
- a method of emitting an arbitrary pixel from a plurality of pixels a method of applying a voltage to one selected scanning electrode and one selected data electrode to emit light for each pixel, or selecting For example, a line sequential scanning method in which a voltage is applied to one scan electrode and one or more selected data electrodes to emit light for each scan electrode can be applied.
- the data electrode X is the back electrode 4 and the scanning electrode Y is the transparent electrode 2 as in FIG.
- the same manufacturing method can be used for the light emitting layer made of the other materials described above.
- the data electrode X (back electrode 4) is formed on the substrate 1.
- A1 is used, and patterns are formed substantially in parallel at a predetermined interval by a photolithographic method.
- the film thickness is 20 Onm.
- the light emitting layer 3 is formed on the substrate 1.
- ZnS and Cu S powders for multiple evaporation sources are formed on the substrate 1.
- the substrate temperature is 200 ° C and ZnS and Cu S are co-evaporated.
- the light emitting layer 3 After the light emitting layer 3 is formed, it is baked at 700 ° C for about 1 hour in a sulfur atmosphere. By examining this film by X-ray diffraction and SEM, the polycrystalline structure of small ZnS grains and Cu S
- the scan electrode Y transparent electrode 2
- the data electrode 114 is substantially parallel to the data electrode at a predetermined interval and is substantially straight to the data electrode. Form to intersect.
- the film thickness is 200 nm.
- a transparent insulator layer such as silicon nitride is formed as a protective layer (not shown in the figure).
- the display device of this embodiment can be obtained.
- This display device can obtain a necessary and sufficient light emission luminance with a direct current of about 5 to 10V, which does not require a high voltage with an alternating current as in a conventional EL element.
- the light emitting layer may be formed by color-coding with RGB phosphors.
- light emitting units for each RGB color such as transparent electrode / light emitting layer / back electrode may be laminated.
- a RGB color can be displayed using a color filter and / or a color conversion filter after creating a display device with a single color or two color light emitting layers.
- the display device can obtain necessary and sufficient light emission luminance with a low DC voltage that does not require an AC high voltage, unlike a conventional display device.
- the light-emitting element of the present invention has high light emission luminance, it can be used for LCD backlight, illumination, display, and the like.
- the display device provides a display device capable of obtaining high-luminance display by low voltage driving. It is particularly useful as a display device for digital cameras, car navigation systems, televisions, etc.
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Description
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US12/438,062 US8207545B2 (en) | 2006-08-22 | 2007-08-15 | Light-emitting device and display |
JP2008530875A JP4943440B2 (ja) | 2006-08-22 | 2007-08-15 | 発光素子及び表示装置 |
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JP2008159521A (ja) * | 2006-12-26 | 2008-07-10 | Matsushita Electric Works Ltd | 無機エレクトロルミネッセント素子 |
WO2009116259A1 (ja) * | 2008-03-17 | 2009-09-24 | パナソニック株式会社 | 発光素子 |
US20110175098A1 (en) * | 2008-09-25 | 2011-07-21 | Masayuki Ono | Light emitting element and display device |
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US8329485B2 (en) * | 2011-05-09 | 2012-12-11 | Hong Kong Applied Science and Technology Research Institute Company Limited | LED phosphor ink composition for ink-jet printing |
TW201438199A (zh) * | 2013-03-29 | 2014-10-01 | Hon Hai Prec Ind Co Ltd | 主動式固態發光顯示器 |
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JP2006127884A (ja) * | 2004-10-28 | 2006-05-18 | Matsushita Electric Ind Co Ltd | 発光素子および表示装置 |
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JP2008159521A (ja) * | 2006-12-26 | 2008-07-10 | Matsushita Electric Works Ltd | 無機エレクトロルミネッセント素子 |
WO2009116259A1 (ja) * | 2008-03-17 | 2009-09-24 | パナソニック株式会社 | 発光素子 |
US8450766B2 (en) | 2008-03-17 | 2013-05-28 | Panasonic Corporation | Light emitting device |
JP5351882B2 (ja) * | 2008-03-17 | 2013-11-27 | パナソニック株式会社 | 発光素子 |
US20110175098A1 (en) * | 2008-09-25 | 2011-07-21 | Masayuki Ono | Light emitting element and display device |
Also Published As
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JPWO2008023620A1 (ja) | 2010-01-07 |
US8207545B2 (en) | 2012-06-26 |
US20100231487A1 (en) | 2010-09-16 |
JP4943440B2 (ja) | 2012-05-30 |
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