WO2004079396A1 - シンチレータパネルおよび放射線イメージセンサの製造方法 - Google Patents
シンチレータパネルおよび放射線イメージセンサの製造方法 Download PDFInfo
- Publication number
- WO2004079396A1 WO2004079396A1 PCT/JP2004/002871 JP2004002871W WO2004079396A1 WO 2004079396 A1 WO2004079396 A1 WO 2004079396A1 JP 2004002871 W JP2004002871 W JP 2004002871W WO 2004079396 A1 WO2004079396 A1 WO 2004079396A1
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- WIPO (PCT)
- Prior art keywords
- scintillator
- substrate
- organic film
- manufacturing
- auxiliary substrate
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
Definitions
- the present invention relates to a radiator image sensor for use in medical and industrial xf spring photography and the like, and a method of manufacturing the same.
- X-ray photosensitive films have been used in medical and industrial X-ray imaging, but a radiation imaging system using a radiation image sensor has been used in terms of convenience and preservation of imaging results. Is becoming popular.
- a radiation image is acquired by a radiation image sensor as data of two-dimensionally arranged pixels in the form of an electric signal, and this signal is processed by a processing device to be displayed on a monitor. indicate.
- This radiation image sensor uses a scintillator panel in which a scintillator component is formed by evaporating a scintillator component on a substrate made of aluminum, glass, fused quartz, or the like. It is disclosed in Japanese Patent No. 267115 and Japanese Patent No. 3034010.
- a conventional method of manufacturing this type of scintillator panel will be described.
- a conventional method of manufacturing this type of scintillator panel will be described with reference to FIG. 38A.
- 61 is inserted, and the end of the substrate 61 is placed on holding jigs 70, 70 provided in a vacuum evaporation apparatus.
- the scintillator deposition surface 61A of the substrate 61 is disposed on the lower side.
- a scintillator material is evaporated on the scintillator evaporation surface 61 A of the substrate 61 to form the scintillator 62.
- FIG. 38B a scintillator panel 60 in which the scintillator 62 is formed on the scintillator deposition surface 61A is manufactured.
- a scintillator panel for a dental radiation image sensor used by being inserted into the oral cavity must be as small as possible, but the imaging area must be large.
- the ends of the scintillator deposition surface 61 A are held by holding jigs 70 and 70 of a vacuum deposition apparatus. keeping. For this reason, the entire scintillator vapor deposition surface 61A is not exposed, and its end is not exposed, so that the scintillator 62 is not formed. As a result, the area of the surface 62A of the scintillator 62 becomes smaller than the area of the scintillator vapor deposition surface 61A of the substrate 61, and the imaging area becomes smaller than the entire area.
- an object of the present invention is to provide a method for manufacturing a scintillator panel and a radiation image sensor that can easily reduce the thickness of a substrate and increase the area ratio of a scintillator-forming surface on the substrate. I do.
- a method of manufacturing a scintillator panel according to the present invention includes: (1) a method of manufacturing a scintillator panel in which a scintillator is deposited on a substrate; An auxiliary substrate is placed at a predetermined position on the surface of the substrate, (2) the superposed substrate and the entire auxiliary substrate are covered with an organic film, and (3) the substrate covered with the organic film and the auxiliary substrate are vapor-deposited.
- a scintillator is formed by vapor deposition on the surface of the organic film covering the second surface opposite to the first surface of the substrate, and (5) A step of obtaining a scintillator panel in which the organic film and the scintillator are formed on the second surface of the substrate by cutting the organic film and separating the auxiliary substrate from the substrate.
- an auxiliary substrate is overlaid on the substrate. Since the auxiliary substrate is superimposed on the substrate in this way, it is possible to prevent the substrate from warping due to its own weight or the weight of the scintillator when forming the scintillator. Further, even when the substrate has a large area, the substrate is similarly prevented from warping. Thereby, even when the substrate is thin and has a large area, the scintillator can be uniformly formed on the substrate.
- the method for manufacturing a scintillator panel according to the present invention includes the method for manufacturing a scintillator panel in which a scintillator is deposited on an organic film, wherein (1) at least the first surface of the predetermined auxiliary substrate is (2) The auxiliary substrate covered with the organic film is held by the holding portion in the vapor deposition apparatus. (3) In this state, the surface of the organic film that is in contact with the first surface of the auxiliary substrate is Vapor-depositing a scintillator at a predetermined position on the exposed surface on the opposite side, and (4) separating the organic film on which the scintillator is formed from the auxiliary substrate. .
- the scintillator is formed on the organic film provided on the auxiliary substrate, and then the organic film on which the scintillator is formed is separated from the auxiliary substrate, whereby the organic film itself is removed.
- a scintillator panel as a substrate can be formed.
- the organic film thin here a state in which the scintillator is formed on a thin substrate can be obtained. Also in this case, the same effect as in the case of manufacturing a scintillator panel by adding an auxiliary substrate to the above-described substrate can be obtained.
- the method further includes a step of further covering the organic film having the scintillator separated from the auxiliary substrate with a protective film.
- a protective film This can prevent physical and chemical deterioration or damage such as the scintillator coming into contact with external air and deliquescent due to moisture contained in the air.
- the substrate On the substrate, the surface of the organic film having the scintillator separated from the auxiliary substrate, which is in contact with the first surface of the auxiliary substrate, or the surface on which the scintillator is formed is turned.
- the method may further include a step of mounting and fixing.
- the scintillator panel can be manufactured by mounting the scintillator forming surface or the scintillator on another substrate. At this time, by preparing a thin substrate, a thin scintillator panel can be manufactured.
- the method further includes a step of forming a protective film covering the scintillator.
- a protective film covering the scintillator.
- These substrates are preferably radiation-transmissive substrates, and glass, aluminum, or amorphous carbon may be used as the radiation-transmissive substrate.
- a radiation-transmissive substrate as the substrate, a scintillator panel in which radiation is transmitted from the back side of the substrate can be obtained.
- the method includes a step of forming a metal reflection film between the substrate and the scintillator. May be. Thereby, the brightness of the light emitted from the scintillator can be increased.
- a fiber boutique plate may be used as the substrate. Thereby, the light converted from the radiation by the scintillator can be emitted from the substrate with high spatial resolution.
- the auxiliary substrate includes a protruding portion that protrudes outside the substrate when viewed from the first surface side, and is preferably held by the holding portion in the vapor deposition apparatus using the protruding portion.
- the auxiliary substrate may include a protrusion protruding in a direction opposite to the first surface in the thickness direction of the substrate, and may be held by the holding unit in the vapor deposition apparatus using the protrusion.
- the auxiliary substrate may be provided with an engaging portion on the side wall portion, and may be held by the holding portion in the vapor deposition apparatus using the engaging portion.
- the substrate can be reliably held by the auxiliary substrate.
- a method of manufacturing a radiation image sensor according to the present invention includes a step of attaching the scintillator panel manufactured by the manufacturing method to a light receiving surface of a solid-state imaging device.
- the auxiliary substrate is superimposed at a predetermined position on the first surface of the substrate, (2) the superimposed substrate and the entire auxiliary substrate are covered with an organic film, 3) The substrate covered with the organic film and the auxiliary substrate are held in the holding unit in the vapor deposition device. (4) In this state, the organic film covering the second surface opposite to the first surface of the substrate. (5) The organic film is cut at a predetermined position and the auxiliary substrate is separated from the substrate, thereby forming an organic film and a scintillator on the second surface of the substrate. (6) A step of obtaining a chiller panel and attaching the scintillator panel to a light receiving surface of a solid-state imaging device is provided.
- the scintillator forming surface is attached on the light receiving surface of the solid-state imaging device, and (5a) the organic film is cut at a predetermined position. And separating the auxiliary substrate from the substrate to obtain a radiation image sensor in which a scintillator panel is arranged on the light receiving surface of the solid-state imaging device.
- a scintillator is vapor-deposited and formed at a predetermined position on the exposed surface opposite to the surface of the organic film that is in contact with the first surface of the auxiliary substrate, and (4) the organic film on which the scintillator is formed is removed.
- a radiation image sensor in which the scintillator is uniformly formed on a thin and large-area substrate is provided.
- the scintillator or the substrate is attached to the light receiving surface of the solid-state imaging device, there is a mode in which the scintillator or the substrate is directly attached, and a mode in which the scintillator or the substrate is attached via an organic film or a protective film. It is preferable to cover the scintillator with a protective film in order to prevent deliquescence of the scintillator. In this case, the exposed portion of the scintillator may be covered.
- the scintillator In order to cover the exposed portion of the scintillator, not only a mode in which only the scintillator is covered with the protective film, but also a mode in which at least one of the scintillator forming portion, the substrate, and the solid-state imaging device is covered together with the scintillator.
- FIG. 1A shows a scintillator panel according to the first embodiment of the present invention.
- FIG. 1B is a cross-sectional view of the scintillator panel manufactured by the manufacturing method, and FIG. 1B is a plan view thereof.
- FIG. 2A to 6 illustrate the scintillation device according to the first embodiment. It is a figure explaining the manufacturing method of one panel.
- FIG. 7 and 8 are cross-sectional views illustrating a part of the steps of the method for manufacturing a scintillator panel according to the second embodiment.
- FIG. 9A is a cross-sectional view of a scintillator panel manufactured by the method for manufacturing a scintillator panel according to the third embodiment
- FIG. 9B is a cross-sectional view of a modified example thereof.
- FIGS. 1OA to 12 illustrate steps of a method for manufacturing a scintillator panel according to the third embodiment. It is.
- FIG. 13A is a cross-sectional view of a scintillator panel manufactured by the method for manufacturing a scintillator panel according to the fourth embodiment, and FIG. 13B is a front view thereof.
- FIG. 14A is a cross-sectional view of a scintillator panel manufactured by the method for manufacturing a scintillator panel according to the fifth embodiment, and FIG. 14B is a front view thereof.
- FIG. 15A is a cross-sectional view of a scintillator panel manufactured by the method for manufacturing a scintillator panel according to the sixth embodiment, and FIG. 15B is a front view thereof.
- FIG. 16A, FIG. 16B, and FIG. 17 are diagrams illustrating a method for manufacturing a scintillator panel according to the sixth embodiment.
- FIG. 18A is a cross-sectional view of a radiation detector manufactured by the method for manufacturing a radiation image sensor according to the seventh embodiment, and FIG. 18B is a front view thereof.
- FIG. 19A, FIG. 19B, FIG. 20, and FIG. 21 are diagrams illustrating a method for manufacturing a radiation detector according to the seventh embodiment.
- FIG. 22A is a cross-sectional view of the radiation image sensor according to the eighth embodiment.
- FIG. 22B is a front view thereof.
- FIG. 23A is a cross-sectional view of the radiation image sensor according to the ninth embodiment, and FIG. 23B is a front view thereof.
- FIG. 24A is a cross-sectional configuration diagram of a scintillator panel manufactured by the manufacturing method according to the tenth embodiment of the present invention
- FIG. 24B is a front view thereof.
- FIG. 27B, FIG. 28, and FIG. 29 are diagrams illustrating the manufacturing process of the tenth embodiment.
- FIG. 3OA is a cross-sectional view of a radiation image sensor using the scintillator panel of FIG. 24A
- FIG. 3OB is a cross-sectional view of a corresponding radiation image sensor manufactured by a conventional manufacturing method.
- FIGS. 31A and 31B are schematic diagrams showing radiation images obtained by the respective radiation image sensors in FIGS. 30A and 30B, respectively.
- FIG. 32, FIG. 33, FIG. 34A, and FIG. 34B are perspective views illustrating another embodiment of the support substrate.
- 35 and 36 are explanatory views showing a part of a manufacturing process of a scintillator panel using the support substrate shown in FIG. 34A.
- FIG. 37A and FIG. 37B are cross-sectional views showing a modification of the first embodiment.
- FIG. 38A is a cross-sectional view showing a part of the manufacturing process of the conventional scintillator panel
- FIG. 38B is a cross-sectional view of the conventional scintillator panel.
- FIG. 1A shows a scintillator manufactured by the manufacturing method according to the present embodiment.
- FIG. 1B is a cross-sectional view of the panel, and FIG. 1B is a plan view thereof.
- the scintillator panel 1 includes a radiation-transmissive substrate 11 made of glass, amorphous carbon, or another material mainly containing carbon. I have.
- An organic film 12 that covers one surface of the substrate 11 is formed on one surface of the substrate 11 (the upper surface in FIG. 1A). The organic film 12 covers the entire surface of the substrate 11 and The plate 11 is formed continuously over the side surface.
- the substrate 11 is a thin substrate, and has a rectangular shape in plan view, but may have a circular shape in plan view.
- the organic film 12 is made of, for example, a xylene-based resin such as polyparaxylylene (manufactured by ThreeBond, trade name: Parylene) and polyparachloroxylylene (manufactured by the company, trade name: Parylene C).
- a scintillator 13 which converts radiation incident on the substrate 11 through the substrate 11 into light having a predetermined length, for example, visible light.
- T 1 -doped CsI is used for the scintillator 13, and CsI has a structure in which a large number of needle-like crystals (columnar crystals) stand.
- the scintillator 13 is formed by vapor deposition on the surface of the scintillator forming portion 12A at a position corresponding to the substrate 11 in the organic film 12.
- the protective film 14 is made of a xylene-based resin such as polyparaxylylene and polyparachloroxylylene. The provision of the protective film 14 prevents deliquescence of the scintillator 13 due to the scintillator 13 coming into contact with external air.
- the auxiliary substrate 20 shown in FIGS. 2A to 5 is used.
- the manufacturing process of the scintillator panel 1 will be described.
- the substrate 11 is placed on the auxiliary substrate 20, and the substrate 11 and the auxiliary substrate 20 are overlapped.
- the auxiliary substrate 20 has the same rectangular shape as the substrate 11 in plan view, and has a thickness greater than that of the substrate 11. Further, the substrate 11 is only placed on the trapping substrate 20 and is not bonded or the like.
- the substrate 11 and the auxiliary substrate 20 thus superimposed on each other are covered with an organic film 12 as shown in FIGS. 3A and 3B.
- the substrate 11 covered with the organic film 12 and the auxiliary substrate 20 are not bonded, but are tightly attached to the organic film 12 by being tightened. Further, since the substrate 11 and the auxiliary substrate 20 have the same shape in plan view, they are superimposed without displacement.
- the scintillator 13 is formed on the surface of the scintillator forming portion 12 A in the organic film 12.
- the scintillator forming portion 12 A of the organic film 12 is located above the substrate 11.
- the scintillator forming portion 12 A By forming a scintillator on the scintillator forming portion 12 A, the scintillator forming portion 12 A passes through the scintillator forming portion 12 A. A state in which the scintillator 13 is formed on 1 is obtained.
- both ends of the substrate 11 are supported by the holding portion 81 of the vapor deposition device 80.
- the substrate 11 is hung, the scintillator component is evaporated from the lower evaporation chamber 82, and the substrate 11 is evaporated on a portion exposed from the opening 81A of the holding portion 81 of the substrate 11. Needle-like crystals are formed.
- the substrate 11 may be warped due to its own weight or the weight of the scintillator to be deposited. If the substrate 11 is warped in this way, the scintillation may not be formed uniformly on the substrate 11.
- the substrate 11 and the auxiliary substrate 20 are superimposed, and both are wrapped and integrated with the organic film 12 to form the substrate.
- the state where 1 1 and the auxiliary substrate 20 are overlapped is maintained.
- This auxiliary substrate 20 serves as a reinforcing plate Therefore, the warpage of the substrate 11 can be effectively prevented, and the scintillator can be formed uniformly on the position surface of the substrate 11.
- the whole is formed by a vapor deposition device 80.
- the organic film 12 is cut at the boundary between the substrate 11 and the auxiliary substrate 20 as shown in FIG. This cut is indicated by reference numeral 12B.
- the organic film 12 is cut at the cutting portion 12B, so that the scintillator forming portion 12 on which the scintillator 13 is formed is formed.
- a and the substrate 11 are separated from the auxiliary substrate 20.
- a scintillator panel 1a in which the scintillator 13 is formed on the thin substrate 11 via the scintillator forming portion 12A is obtained.
- the auxiliary substrate 20 separated from the substrate 11 or the like can be discarded as it is, or can be cleaned and used again as the auxiliary substrate 20.
- the scintillator panel shown in FIGS. 1A and IB is obtained. 1 can be manufactured.
- the thin substrate 11 is used.
- the auxiliary substrate 20 can suitably prevent the substrate 11 from warping, so that the scintillator 13 can be uniformly formed on the substrate 11.
- the substrate 11, the auxiliary substrate 20, and the organic film 12 are entirely covered. However, these are not entirely covered, and the substrate 11 and the auxiliary are used when the scintillator 13 is formed.
- An embodiment in which the substrates 20 are covered with the organic film 12 to such an extent that the substrates 20 are not separated can also be adopted.
- the substrate 11 and the auxiliary substrate 20 are overlapped (FIGS. 2A and 2B), and the substrate 11 and the auxiliary substrate 20 are formed with the organic film 12. (FIGS. 3A and 3B), and a scintillator 13 is formed on the surface of the scintillator forming portion 12A of the organic film 12 (FIGS. 4A, 4B, 5A, and 5C). 5B).
- the procedure up to this point is the same as in the first embodiment.
- the organic film 12 covering the substrate 11 and the auxiliary substrate 20 and the scintillator forming portion is entirely covered with the protective film 14.
- the organic film 12 and the protective film 14 are placed at the boundary between the substrate 11 and the auxiliary substrate 20 (cut portions 12 B, 12 B, 14 A, 14 A). Disconnect. Since the substrate 11 and the auxiliary substrate 20 are not bonded to each other, the auxiliary substrate 20 is separated from the scintillator forming portion 12A on which the scintillator 13 is formed, the substrate 11 and the auxiliary substrate 20. As a result, the scintillator 13 is formed on the thin substrate 11 via the scintillator forming portion 12A, and the scintillator panel 2 in which the scintillator 13 is covered with the protective film 14 is manufactured.
- the auxiliary substrate 20 can suitably prevent the substrate 11 from warping, so that the scintillator 13 can be uniformly formed on the substrate 11.
- FIG. 9A is a cross-sectional view of a scintillator panel manufactured by the manufacturing method according to the present embodiment
- FIG. 9B is a cross-sectional view of a modified example thereof.
- the scintillator panel 3 according to the present embodiment has a scintillator 13 formed on one surface of an organic film 1′2 made of a xylene-based material such as polyparaxylylene and polyparachloroxylene.
- the organic film 1 2 and scintillator 13 are entirely covered by protective film 14. That is, in the present embodiment, the organic film 12 also serves as the substrate 11.
- an auxiliary substrate 20 for forming a scintillator is prepared. Is covered with an organic film 12. It is needless to say that the auxiliary substrate 20 preferably has a certain thickness, in particular, is thicker than the organic film 12 to be formed.
- a scintillator 13 is formed on the scintillator forming portion 12A on the surface of the organic film 12, as shown in FIGS. 11A and 11B.
- the scintillator forming portion 12A of the organic film 12 is placed on the lower side.
- the auxiliary substrate 20 is suspended in the vapor deposition device 30 to deposit a scintillator component.
- the scintillator 13 may not be formed uniformly.
- the auxiliary substrate 20 having a sufficient thickness is used, it is possible to prevent the scintillator formation portion 12 A in the organic film 12 from warping and to form the scintillator 13 uniformly. it can.
- the organic film 12 on the auxiliary substrate 20 is then transferred to the scintillator 13 as shown in FIG. Cut at the cut portion 1 2 B, 1 2 B outside the forming surface.
- the organic film 12 is cut to form the scintillator in the organic film 12.
- the part 12 A and the scintillator 13 are separated from the auxiliary substrate 20 and the lower part of the organic film 12.
- the organic film 12 and the scintillator 13 are entirely covered with a protective film 14 to form a scintillator panel 30 using the organic film 12 as a substrate.
- the organic film 1 2 is used as it is as a substrate. Therefore, by making the organic film 12 thin, a scintillator panel having a thin substrate can be manufactured.
- the organic film 12 is formed on the thick auxiliary substrate 20. Since the thickness of the organic film 12 is added by the auxiliary substrate 20, the organic film 12 can be prevented from being warped or torn when the scintillator 13 is formed. For this reason, the scintillator can be formed uniformly in the scintillator forming portion 12A of the organic film 12.
- the scintillator forming portion 12A of the organic film 12 has a large area, the scintillator forming portion 12A can be prevented from warping and tearing by the auxiliary substrate 20, so that the scintillator forming portion can be formed.
- the scintillator 13 can be formed uniformly in the section 12A.
- the scintillator 13 is formed after the whole of the auxiliary substrate 20 is covered with the organic film 12.
- one surface thereof is formed.
- the scintillator 13 is formed by covering a part including the scintillator, the scintillator forming portion 12A may be prevented from falling off the auxiliary substrate 20.
- FIG. 9B an embodiment shown in FIG. 9B can be adopted.
- the end of the organic film 12 serving as the substrate is folded toward the scintillator 13 side, and folded along the side surface of the scintillator 13.
- the area on the front side of the scintillator panel 30 can be made substantially the same as the area on the front side of the scintillator 13.
- FIG. 13A is a cross-sectional view of the scintillator panel 32 according to the present embodiment
- FIG. 13B is a front view thereof.
- a scintillator forming portion 12A is placed on a substrate 11. These substrate 11, scintillator forming section 12A, and scintillator 13 are It is entirely covered with a protective film 14.
- the scintillator forming portion 12A of the organic film 12 is used as it is as a substrate, whereas in the present embodiment, a separate substrate is provided.
- the method of manufacturing the scintillator panel 32 according to the present embodiment will be described.
- the third embodiment first, as shown in FIGS. 0 is prepared, and the entire auxiliary substrate 20 is covered with the organic film 14.
- a scintillator component is deposited on the scintillator forming portion 12A of the organic film 12 to form a scintillator 13 as shown in FIGS. 11A and 11B.
- the organic film 12 is cut at the cut portions 12 B and 12 B, and the organic film 12 is cut up and down to form the organic film 12.
- the scintillator forming part 12 A and the auxiliary substrate 20 are separated.
- the manufacturing steps so far are the same as those in the third embodiment.
- the auxiliary substrate 2 of the scintillator forming section 12A is placed on the substrate 11 as shown in FIG. 13A. Place with the side that was in contact with 0 facing up. Then, the substrate 11, the scintillator forming portion 12 A, and the scintillator 13 are entirely covered with the protective film 14, thereby manufacturing the scintillator panel 32.
- the thickness of the scintillator panel 32 itself can be reduced. it can. Further, even when a thin substrate is used as the substrate 11, when forming the scintillator 13, the thick auxiliary substrate 20 is used to prevent the scintillator forming portion 12A from warping and tearing. Therefore, the scintillator 13 can be formed uniformly on the scintillator forming part 12A.
- FIG. 14A is a cross-sectional view of a scintillator panel manufactured by the manufacturing method according to the present embodiment
- FIG. 14B is a front view thereof.
- the scintillator panel 33 the force of the scintillator 13 placed on the substrate 11
- the scintillator 13 is formed in the scintillator forming section 12A, and has a configuration in which the scintillator 13 is sandwiched between the scintillator forming section 12A and the substrate 11.
- the substrate 11, the scintillator 13, and the scintillator forming portion 12 A are covered with a protective film 14.
- the scintillator forming portion 12A is not used as a substrate as it is, but another substrate is provided separately.
- the auxiliary substrate 20 is entirely organically formed. Cover with membrane 12.
- the scintillator 13 is formed in the scintillator forming section 12A.
- the scintillator forming portion 12A of the organic film 12 is separated from the auxiliary substrate 20 as shown in FIG.
- the scintillator 13 is placed so that the exposed surface of the scintillator 13 faces the substrate 11 side so that the scintillator 13 contacts the surface of the substrate 11.
- the substrate 11, the scintillator 13, and the scintillator forming portion 12 A are covered with a protective film 14.
- the scintillator panel 33 can be manufactured in this manner. Then, the scintillator panel 33 manufactured in this manner can use the thin substrate 11 similarly to the above embodiment, and even when the thin substrate is used, the scintillator 13 is formed uniformly. can do.
- FIG. 15A is a cross-sectional view of a scintillator panel manufactured by the manufacturing method according to the present embodiment
- FIG. 15B is a front view thereof.
- the scintillator panel 35 has a substrate 11.
- a scintillator forming portion 12A is placed on the substrate 11, and a scintillator 13 is formed on the scintillator forming portion 12A.
- the surfaces of the scintillator 13 and the scintillator forming portion 12A are covered with a protective film 14.
- a method of manufacturing the scintillator panel 35 according to the present embodiment will be described. First, as shown in FIGS.
- an auxiliary substrate 20 is prepared.
- the auxiliary substrate 20 is covered with the organic film 12.
- a scintillator component is deposited on the scintillator forming portion 12A of the organic film 12 to form a scintillator 13 as shown in FIGS. 11A and 11B. Up to this point, it is the same as in the third to fifth embodiments.
- the organic film 12 covering the auxiliary substrate 20 and the scintillator 13 are covered with the protective film 14. cover. Then, as shown in FIG.
- the organic film 12 and the protective film 14 are cut to separate the scintillator forming portion 12 A and the scintillator 13 of the organic film 12 from the auxiliary substrate 20. Then, as shown in FIG. 15A, the scintillator forming portion 12A is placed on the substrate 11.
- the scintillator panel shown in FIG. 17 in which the scintillator forming portion 12A and the scintillator 13 separated from the auxiliary substrate 20 and the scintillator 13 are covered with the protective film 14 can be used as it is.
- the scintillator forming portion 12A functions as a substrate.
- the scintillator panel 35 manufactured as described above has a thin scintillator panel 35 itself by using a thin substrate as the substrate 11 similarly to the above embodiments. Things. Even when a thin substrate is used as the substrate 11, when forming the scintillator 13, the thick auxiliary substrate 20 is used to prevent the scintillator forming portion 12A from being warped or torn. The scintillator 13 can be uniformly formed on the scintillator forming portion 12A.
- a seventh embodiment of the present invention will be described.
- a method for manufacturing a radiation image sensor using a scintillator panel will be described.
- FIG. 18A is a cross-sectional view of the radiation detector manufactured by the manufacturing method according to the present embodiment
- FIG. 18B is a front view of the radiation detector viewed from the scintillator panel side. is there.
- the radiation image sensor 40 according to the present embodiment includes: Substrate 11 is provided. The substrate 11 is covered with the organic film 12 from the upper surface to the side surface. A scintillator 13 is formed in a scintillator forming portion 12 A corresponding to an upper portion of the organic film 12. An imaging element 41 is attached to the scintillator 13. Then, the substrate 11, the organic film 12, the scintillator 13, and the image sensor 41 are covered with the protective film 14. further.
- a sealing material 42 made of a moisture-resistant resin is provided on the protective film 14 covering the side wall of the scintillator 13.
- FIGS. 2A and 2B A method for manufacturing the radiation image sensor according to the present embodiment having the above configuration will be described.
- the substrate 11 and the auxiliary substrate 20 are overlapped (see FIGS. 2A and 2B), and the substrate 11 and the auxiliary substrate 20 are combined with the organic film 12.
- scintillator 13 is formed on the surface of scintillator forming part 12A (see Fig. 4A, Fig. 4B, Fig. 5A and Fig. 5B) .
- the auxiliary substrate 20 is superimposed on the substrate 11, and therefore, as in the above embodiments, the weight of the substrate 11 The substrate 11 is prevented from warping due to the weight of 3, and the scintillator 13 can be formed uniformly.
- the exposed surface of the scintillator 13 and the light receiving surface of the image sensor 41 face each other, and the image sensor 4
- the scintillator 13 is placed on 1.
- the light emitted by the scintillator 13 by the scintillator 13 can be detected by the imaging device 41.
- the organic film 12 covering the substrate 11 and the auxiliary substrate 20, the scintillator 13, and the image sensor 41 are covered with a protective film 14, as indicated by reference numeral 20.
- the organic film 12 and the protective film 14 are cut from the boundary between the substrate 11 and the auxiliary substrate 20 (cut portions 12B and 14A) to cut the substrate 1 By separating 1 from the auxiliary substrate 20, the radiation image sensor 40 can be manufactured.
- the thus manufactured radiation image sensor 40 has a thin substrate 1 Although 1 is used, when forming the scintillator 13, the warpage of the substrate 11 is prevented by the auxiliary substrate 20. For this reason, the scintillator 13 can be formed uniformly. Further, since the scintillator 13 is formed uniformly, the scintillator light obtained by the action of the scintillator 13 becomes uniform, and a suitable image can be obtained by the imaging device 41.
- the radiation image sensor is not limited to this mode, and is manufactured by attaching the scintillator panel manufactured according to the first to sixth embodiments to the light receiving surface of a solid-state imaging device. can do.
- the surface of the scintillator 13 in the scintillator panel 1 according to the first embodiment shown in FIG. 1 is attached to the light-receiving surface of a solid-state imaging device, and a radiation detector is provided via an organic film 14. be able to.
- the surface of the scintillator panel 13 in the scintillator panel 2 shown in FIG. 8 the surface of the scintillator panel 3, 30 according to the third embodiment shown in FIG. 9A and FIG.
- the surface of the scintillator panel 35 according to the sixth embodiment shown in FIG. 15A and FIG.
- the radiation detector can be attached to the light receiving surface of the solid-state imaging device via the organic film 14.
- the layer interposed between the scintillator and the light receiving surface of the solid-state imaging device can be thinned.
- a radiation image sensor By attaching to the light receiving surface of the solid-state imaging device via 14, a radiation image sensor can be obtained.
- FIGS. 22A and 22B are cross-sectional views of a radiation detector according to the eighth embodiment of the present invention.
- the solid-state imaging device is attached to the completed scintillator panel.
- the scintillator panel before completion is mounted.
- a radiation detector is manufactured by attaching a solid-state imaging device to a chiller.
- the radiation spring image sensor 51 according to the present embodiment is similar to the scintillator 13 used in manufacturing the scintillator panel 3 (FIG. 9B) according to the third embodiment.
- the surface is attached to the solid-state imaging device 41.
- the scintillator panel 3 is formed by covering the scintillator 13 and the scintillator forming portion 31 shown in FIG. 12 with the organic film 14.
- the scintillator shown in FIG. After attaching the exposed surface of 13 to the light-receiving surface of the solid-state imaging device 41, the scintillator 13, the scintillator forming portion 31, and the solid-state imaging device 41 are covered with an organic film 14.
- the radiation image sensor 51 shown in FIGS. 22A and 22B can be manufactured. According to this method, a thin radiation detector 51 can be manufactured.
- the scintillator 13 shown in FIG. 12 or the scintillator 13 shown in FIG. 6 is attached to the light receiving surface of the solid-state imaging device as in the present embodiment.
- a protective film When directly attaching to the light receiving surface of the solid-state imaging device, it is preferable to cover the scintillator and the solid-state imaging device with a protective film.
- the method disclosed in International Publication WO98 / 36290 can be used.
- the protective film is composed of a first organic film made of an organic film such as parylene, an inorganic film made of an aluminum film, and a second organic film also made of an organic film such as parylene.
- a first organic film is formed so as to cover the entire scintillator 13.
- the first organic film covers the entire scintillator 13 and is attached to the surface of the scintillator forming portion 12 1.
- the first organic film is in close contact with the scintillator 13.
- an aluminum film is deposited on the surface of the first organic film to form an inorganic film, and a second organic film is formed thereon.
- the inorganic film can be prevented from corroding by the second organic film, and the scintillator 13 can be protected from physical and scientific deterioration and damage such as deliquescence.
- the protective film includes a first organic film made of an organic film such as parylene, an inorganic film made of an aluminum film, and a second organic film made of an organic film such as parylene.
- an elongated frame-like resin frame is formed at a position surrounding the scintillator 13 in the scintillator forming section 12A.
- This resin frame is preferably subjected to a roughening treatment in order to improve the adhesion with the protective film. This roughening treatment is performed by making streaks or forming small depressions on the surface.
- the entire surface of the scintillator forming portion 12A is covered with the first organic film together with the scintillator and the resin frame so as to cover the scintillator 13.
- the first organic film is in close contact with the scintillator 13.
- an aluminum layer is formed on the surface of the first organic film to form an inorganic film, and a second organic film is formed on the surface of the inorganic film.
- a protective film covering the scintillator can be suitably formed.
- FIG. 23A is a cross-sectional view of the radiation detector according to the ninth embodiment of the present invention
- FIG. 23 is a front view of the radiation detector as viewed from the scintillator side.
- the radiation detector 52 according to the present embodiment includes a scintillator panel (see FIGS. 15A and 15B) according to the sixth embodiment.
- the surface of a scintillator 13 used for manufacturing is attached to a solid-state imaging device.
- FIG. 24A is a cross-sectional configuration diagram of a scintillator panel manufactured by the manufacturing method of this embodiment, and FIG.
- the scintillator panel 36 has the same configuration as that of the first embodiment, except that the scintillator 13 is formed on substantially the entire surface of the scintillator formation surface. Therefore, the incident radiation can be converted into visible light or the like over the entire surface of the substrate 11.
- a support substrate 20 shown in FIGS. 25A and 25B is used as an auxiliary substrate.
- a substrate 11 is prepared, and a first surface 2 OA of the support substrate 20 is brought into contact with the first surface 11B of the substrate 11 so that the substrate 1 1 and support substrate 20 are overlapped.
- the support substrate 20 is thinner than the substrate 11 and wider than the substrate 11 in plan view.
- the side portion 20 B that is the portion protrudes laterally from the outer peripheral end 11 C of the substrate 11.
- the organic film 1 covering the entire substrate 11 and the support substrate 20 is formed.
- Form 2 The organic film 12 is formed by putting the substrate 11 in a CVD device (not shown) and using a CVD method in the CVD device.
- the substrate 11 and the support substrate 20 are wrapped in a state where the substrate 11 and the support substrate 20 are overlapped to form the organic film 12, so that the substrate 11 and the support substrate 20 are overlapped and adhered without bonding or the like. Kept in state.
- the organic film 12 is formed in a state where the substrate 11 and the support substrate 20 are overlapped, this is introduced into the vacuum evaporation apparatus 80.
- a holding jig 81C shown in FIG. 27A is provided inside the vacuum evaporation apparatus 80. Then, the side portion 20B of the support substrate 20 is placed on the holding jig 81C. At this time, by disposing the substrate 11 below the support substrate 20, the substrate 11 becomes the support substrate 20. It will be in a suspended state. Thus, the substrate 11 is held by the holding jig 81C of the vacuum evaporation apparatus 80. As a result, the surface covered with the organic film 12 of the substrate 11 from the opening 81A of the holding jig 81C projects into the vapor deposition chamber 82 of the vacuum vapor deposition device 80. Is done.
- the scintillator material M is supplied into the evaporation chamber 80 below the substrate 11 as shown in FIG. Therefore, the scintillator 13 is formed by growing (depositing) on the surface of the substrate 11.
- the surface of the organic film 12 corresponding to the one surface 11A of the substrate 11 is exposed over the entire surface without contacting the holding jig 81C as described above.
- the scintillator material M is deposited over the entire surface of the organic film 12 corresponding to the substrate 11.
- the scintillator 13 can be formed over the entire surface of the organic film 12 corresponding to the substrate 11.
- the end of the surface of the organic film 12 corresponding to the substrate 11 is not held by the holding jig 81C. Therefore, since the end of the scintillator 13 is substantially perpendicular to the surface thereof, the end of the scintillator 13 does not have a slope shape.
- the substrate 11 and the support substrate 20 wrapped in the organic film 12 are removed from the holding jig 81 C, and the outside of the vacuum evaporation device 80 is removed. To take out. Thereafter, as shown in FIG. 29, the vicinity of the overlapping portion of the substrate 11 and the support substrate 20 in the organic film 12 is cut. When the organic film 12 is cut along the entire circumference of the overlapping portion of the substrate 11 and the support substrate 20, the substrate 11 and the support substrate 20 are released from the superimposed state. At this time, since the support substrate 20 is merely superposed on the substrate 11, the support substrate 20 is removed as it is by cutting the organic film 12 as it is. .
- the protective film 14 is the same as the organic film 12 described above. Then, it is formed by a CVD method using a CVD apparatus. By forming this protective film 14 continuously from the portion of the scintillator 13 to the portion of the substrate 11, the scintillator 13 is prevented from coming into contact with external air.
- the scintillator panel 36 is manufactured.
- the surface of the organic film 12 corresponding to the substrate 11 does not come in contact with the holding jig of the vacuum deposition apparatus, and the The surface can be left completely exposed. Therefore, the scintillator 13 can be formed over the entire surface of the organic film 12 corresponding to the substrate 11.
- the scintillator panel can be particularly preferably used for a dental scintillator panel which is required to obtain an image in a wide range as possible with a small substrate.
- the end of the scintillator 13 is almost perpendicular to its surface and does not have a slope shape. Therefore, the image sensor is bonded to the scintillator 13 via the organic film 12.
- bonding with an adhesive it is possible to prevent the adhesive from concentrating and causing distortion when the adhesive is solidified.
- a radiation image sensor 44 having an imaging element 43 made of CCD attached to one surface 11A side of the scintillator panel 36 according to the present embodiment described above was manufactured.
- An object D having substantially the same area as the substrate 11 is arranged on the other surface 1 1B side of the substrate 11 of the radiation image sensor 44, and X-rays are applied to the object D to cause the imaging element 4 In step 3, an image of the object D was captured.
- FIG. 30B the conventional scintillator panel 60 shown in FIG. 38B was covered with an organic film 12 for protecting the scintillator.
- 6 One surface (scintillator vapor deposition surface) 6 1 CCD side image sensor 4 3
- the attached radiation image sensor 45 was manufactured.
- An object D is arranged on one surface (scintillator vapor deposition surface) 61 A of the radiation image sensor 45 opposite to the other surface 61 B facing the surface A, and X-rays are applied to the object D.
- An image of the object D was captured by the image sensor 43.
- FIGS. 31A and 31B are schematic diagrams of images captured by the respective image sensors 43.
- the image P1 captured by the radiation image sensor 44 using the scintillator panel 36 according to the present embodiment includes three dark lines L, L , L was clearly projected.
- the image P2 captured by the radiation image sensor 45 using the conventional scintillator panel 60 three clear dark lines L, L, and L are seen at the center.
- F, F, ... where this line was blurred. This part was found to be a region with low sensitivity.
- the radiation image sensor 45 using the conventional scintillator panel 60 is more effective than the radiation image sensor 45 using the conventional scintillator panel 60 for the substrate. It has become possible to shoot clear images over the entire area.
- a board that is wider in the vertical and horizontal directions than the board is used as the support board.
- the board 2 that projects from the board 11 in at least one direction is used.
- the substrate 11 can be suspended and supported in the vapor deposition device 80 using the protruding portion 20B.
- a rectangular plate is used, but an H-shaped or ladder-shaped support substrate can also be used.
- the projecting portion is not limited to the horizontal direction.
- the surface of the support substrate 20 opposite to the substrate 11 is opposite to the substrate 11 as shown in FIG.
- a protrusion 25 protruding in the direction may be provided.
- the holding portion 25A is provided on the protruding portion 25, and the substrate 11 is attached to the inside of the vapor deposition device 80 using the holding portion 25A. It is good to support it.
- a support substrate having no protruding portion can also be used.
- a shape having a groove 26 parallel to the surface at the opposing side wall 2OD, or as shown in FIG. A support substrate 20 having grooves 26 parallel to the surface on all four sides of D is available.
- the support substrate 20 shown in FIG. 34A When the support substrate 20 shown in FIG. 34A is used, the support substrate 20 and the substrate 11 are overlapped with each other, and the whole is covered with the organic film 12. , Adhere both.
- the groove (engaging portion) 26 is engaged and held by the holder 85, thereby suspending and supporting the substrate 11 in the vapor deposition device 80, and The scintillator 13 is formed on the surface covered with the organic film 12 of 11. After the formation, the organic film 12 is cut, the support substrate 20 is separated, and covered with the protective film 14, the scintillator panel 36 shown in FIGS. 24A and 24B is obtained.
- the organic film 12 is formed directly on the substrate 11 (the scintillator forming portion 12A), but a thin film is formed between the substrate 11 and the organic film 12.
- An embodiment in which the metal reflective film 17 is formed can also be adopted (see FIG. 37A).
- the metal reflective film 17 can be formed by vapor deposition on one surface of the substrate 11 before forming the organic film 12 on the surface of the substrate 11.
- Various metals can be used as the metal reflection film 17, such as A1, Ag, Cr, Cu, Ni, Ti, Mg, Rh, Pt and A material containing a substance in the group consisting of Au can be used.
- such a metal reflection film 17 can be formed between the organic film 12 and the scintillator 13 in addition to being formed between the substrate 11 and the organic film 12.
- a metal can be formed on the surface of the organic film 12 by vapor deposition.
- the metal reflection film 17 a material containing the metal substances listed above can be used. If a metal reflective film 17 is formed between the organic film 12 and the scintillator 13, the metal reflective film 17 and the scintillator 13 come into contact with each other, and the metal reflected by the moisture contained in the scintillator 13 slightly.
- a waterproof film 18 can be formed between the metal reflective film 17 and the scintillator 13 to prevent this (see FIG. 37B).
- the waterproof film 18 the same material as the organic film 12 can be used. Further, an oxide film can be formed on the metal reflection film, and this can be used as the waterproof film 18.
- the metal reflective film 17 is arranged in the direction opposite to the direction of taking out the scintillator emission with respect to the scintillator.
- a radiation-transmissive substrate is used as the substrate 11, but a plate-like image composed of a plurality of optical fibers is used instead of the radiation-transmissive substrate.
- a fiber optic plate (FOP), which is a transmitter, can also be used.
- the radiation image sensor the one in which the imaging element is attached to the scintillator has been described.
- the substrate transmits light of the emission wavelength of the scintillator like glass or FOP. If so, a mode in which the imaging element is mounted on the substrate 11 can be adopted. Further, by attaching an image pickup device to the scintillator panel manufactured according to each of the above embodiments, it is also possible to form a radiation image sensor.
- a force s drawn while cutting a cut portion such as an organic film (a scintillator forming portion) and a protective film, for example, polishing or the like is applied.
- the cut portion can be smoothed.
- polishing or the like it is preferable to perform polishing or the like so as to smooth these cut portions.
- C s I (T 1) is used as the scintillator.
- the present invention is not limited to this.
- C si (Na), Na I (Tl), L i I (Eu ), K i (T 1), etc. can also be used.
- the present invention is suitable for manufacturing a radiation image sensor or scintillator panel for large-area or thin radiation imaging, for example, a radiation image sensor used in industrial or medical fields, It is suitable for manufacturing a scintillator panel.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
- Luminescent Compositions (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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US10/547,780 US7618511B2 (en) | 2003-03-07 | 2004-03-05 | Scintillator panel and method of manufacturing radiation image sensor |
EP04717768.8A EP1607768A4 (en) | 2003-03-07 | 2004-03-05 | SCINTILLING PANEL AND METHOD FOR MANUFACTURING RADIATION IMAGE SENSOR |
JP2005503142A JP4451843B2 (ja) | 2003-03-07 | 2004-03-05 | シンチレータパネルの製造方法及び放射線イメージセンサの製造方法 |
Applications Claiming Priority (4)
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JP2003-062321 | 2003-03-07 | ||
JP2003062308 | 2003-03-07 | ||
JP2003-062308 | 2003-03-07 | ||
JP2003062321 | 2003-03-07 |
Publications (1)
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WO2004079396A1 true WO2004079396A1 (ja) | 2004-09-16 |
Family
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PCT/JP2004/002871 WO2004079396A1 (ja) | 2003-03-07 | 2004-03-05 | シンチレータパネルおよび放射線イメージセンサの製造方法 |
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US (1) | US7618511B2 (ja) |
EP (1) | EP1607768A4 (ja) |
JP (1) | JP4451843B2 (ja) |
WO (1) | WO2004079396A1 (ja) |
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US20060263521A1 (en) | 2006-11-23 |
JP4451843B2 (ja) | 2010-04-14 |
EP1607768A1 (en) | 2005-12-21 |
EP1607768A4 (en) | 2015-08-26 |
US7618511B2 (en) | 2009-11-17 |
JPWO2004079396A1 (ja) | 2006-06-08 |
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