WO2001021356A1 - Procede et dispositif de meulage des deux faces d'un disque fin - Google Patents
Procede et dispositif de meulage des deux faces d'un disque fin Download PDFInfo
- Publication number
- WO2001021356A1 WO2001021356A1 PCT/JP2000/006250 JP0006250W WO0121356A1 WO 2001021356 A1 WO2001021356 A1 WO 2001021356A1 JP 0006250 W JP0006250 W JP 0006250W WO 0121356 A1 WO0121356 A1 WO 0121356A1
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- WIPO (PCT)
- Prior art keywords
- grinding
- work
- workpiece
- wheels
- grinding wheels
- Prior art date
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/10—Single-purpose machines or devices
- B24B7/16—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
- B24B7/17—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings for simultaneously grinding opposite and parallel end faces, e.g. double disc grinders
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
Definitions
- the present invention relates to a method and apparatus for double-sided grinding of a thin disk-shaped work, and more particularly, to a method and apparatus for simultaneously grinding both surfaces of a thin disk-shaped work such as a semiconductor wafer.
- a thin disk-shaped work such as a semiconductor wafer.
- a rotating disc-shaped carrier pocket is placed between a pair of rotating grinding wheels, which are arranged so that the grinding surfaces on the end faces face each other. It has been known to pass a work placed in a hole. In this case, the outer diameter (diameter) of the grinding surface of the grinding wheel must be larger than the outer diameter of the workpiece.
- a carrier generally has a plurality of pockets formed at equal intervals on a circumference near the outer periphery, and a part of the carrier is also paired with a piano. The thickness of the carrier at this point must, of course, be smaller than the distance between a pair of grinding wheels during grinding, that is, the finished thickness of the workpiece. Absent.
- the semiconductor wafers currently used include those with an outer diameter of about 200 mm (8 inches) and those with an outer diameter of about 300 mm (12 inches).
- the thickness (finished dimensions) is about 0.8 mm, which is extremely thin compared to the outer diameter. Grind such wafers with the equipment described above. In such a case, since the outer diameter of the wafer is relatively large, the outer diameter of the grinding wheel becomes large, and the carrier which accommodates and rotates the wafer becomes large. For this reason, the device becomes large. In addition, since the thickness of the wafer is thin, it is necessary to make the portion of the carrier between the grinding wheel together with the wafer extremely thin.
- the present applicant has been arranged and rotated so that the annular grinding surfaces of the end faces face each other and move relatively in the axial direction 1
- the machined surfaces on both sides of the pair of annular grinding wheels and the thin disk-shaped workpiece face the grinding surfaces of the paired grinding wheels, respectively, and the outer periphery of the workpiece intersects the outer periphery of the ground surface and the workpiece
- a double-sided grinding machine for thin disk-shaped workpieces which is equipped with a means for rotating the workpiece so that the center is located within the grinding surface and the workpiece is rotated at the grinding position between the grinding faces.
- a pair of grinding wheels are usually set so that the opposing grinding surfaces are parallel. Then, the double-sided grinding of the thin disk-shaped workpiece is performed as follows. That is, by rotating a pair of grinding wheels and moving them in a direction approaching each other while the workpiece is rotated at the grinding processing position, each grinding surface is brought into contact with the corresponding processing surface to a predetermined position. To the position After stopping the cutting of each grinding wheel and performing spark-part grinding for a predetermined time, a pair of grinding wheels are moved in the direction away from each other to machine each ground surface. Remove from surface.
- the workpiece rotates by itself while the outer circumference of the workpiece intersects with the outer circumference of the grinding surface and the center of the workpiece is positioned within the grinding surface.
- the entire surface of the work surface of the workpiece passes between the ground surfaces and comes into contact with the ground surface, the entire surface of the work surface on both sides of the workpiece can be simultaneously ground.
- the part other than the vicinity of the center of the work is in contact with the grinding surface for a part of the time during which the work rotates once, but the vicinity of the center is always in contact with the grinding surface.
- the grinding amount near the center is larger than that of other parts, and the thickness of the workpiece after grinding is thicker on the outer circumference side, thinner near the center, and the work thickness varies greatly. There is a problem.
- An object of the present invention is to solve the above-mentioned problems and to provide a method and an apparatus for double-sided grinding of a thin disk-shaped workpiece having a small variation in the thickness of the workpiece after grinding. Disclosure of the invention
- the method according to the present invention is a method for simultaneously grinding the work surfaces on both sides of a thin disk-shaped work by using an annular grinding surface at an end surface of a pair of grinding wheels arranged opposite to each other. While rotating the grindstone, at least one of the grinding grindstones is moved while the work is supported and rotated at a predetermined grinding position between the grinding grindstones. Accordingly, each of the grinding surfaces is processed so that the outer periphery of the work intersects with the outer periphery of each grinding wheel and the center of the work is located within each of the grinding surfaces. The grinding wheel and the work are cut into a predetermined position by contacting the surface, and the cutting of each of the grinding wheels is stopped until the center of the work is displaced from the grinding surface.
- the method is characterized in that the ground surface is moved relatively in a direction parallel to the processing surface, and the ground surfaces are separated from the processing surface.
- Each grinding wheel rotates at a higher speed than the workpiece.
- each grinding wheel and the workpiece are relatively moved in a direction parallel to the processing surface.
- the spark grinding may be continued so that each grinding surface is separated from the processing surface after the spark grinding is completed.
- each grinding surface may be separated from the processing surface by relatively moving the grinding wheel and the work until the work comes out of between the pair of grinding wheels.
- the grinding surface of the rotating grinding wheel is brought into contact with the processing surface of the workpiece to give a cut, whereby the processing surface is ground, and the outer periphery of the workpiece intersects the outer circumference of the grinding surface and the workpiece is cut.
- the size of the device can be reduced.
- the entire grinding surface of the workpiece can be ground using a grinding wheel with a slightly larger outer diameter of the grinding surface than the workpiece half diameter, and the large grinding surface has a larger outer diameter than the workpiece outer diameter. Since it is not necessary to use a grinding wheel of this type, the size of the apparatus can be reduced from this point as well.
- the respective grinding wheels and the workpiece are relatively moved in a direction parallel to the processing surface while the rotation speed of the workpiece is lower than that at the time of the previous grinding.
- each of the grinding wheels and the work are moved forward. It is relatively moved in a direction parallel to the processing surface.
- the apparatus includes a pair of grinding wheels that are arranged and rotated so that the annular grinding surfaces of the end surfaces face each other and move relatively in the axial direction.
- a work rotation means for supporting the work between the grinding surfaces so that the processing surfaces on both sides of the thin disk-shaped work face the grinding surfaces of the grinding wheels, respectively;
- a moving means for relatively moving the work rotating means in a direction parallel to the processing surface of the work supported by the work means, and when each of the grinding wheels is rotated.
- at least one of the grinding wheels is moved in a state where the work is supported and rotated at a predetermined grinding position, so that the outer circumference of the work is adjusted to the respective positions.
- Crosses the outer periphery of the grinding wheel and Each of the ground surfaces is brought into contact with each of the processing surfaces so that the center of the tool is located within each of the grinding surfaces, and is cut into a predetermined position, and the cutting of each of the grinding wheels is stopped.
- the grinding wheels and the work are relatively moved in a direction parallel to the processing surface until the center of the work is displaced from the grinding surfaces, and the grinding surfaces are processed as described above. It is characterized by being separated from the surface.
- the work is supported at the grinding position by the work rotating means, and is rotated, and the pair of grinding wheels is rotated at a higher speed than the work.
- each ground surface is brought into contact with each machined surface and cut into a predetermined position. Then, with the cutting of each grinding wheel stopped, each grinding wheel and the workpiece are moved by the moving means in a direction parallel to the processing surface until the center of the workpiece is displaced from each grinding surface. And each ground surface is separated from the machined surface.
- the method according to the present invention can be performed, and therefore, as described above, both surfaces of the thin disk-shaped work can be simultaneously and easily ground.
- the size of the apparatus can be reduced, and the variation in the thickness of the workpiece after grinding can be reduced.
- the moving means moves the workpiece in a direction parallel to the processing surface, thereby moving each of the grinding wheels and the workpiece relatively in a direction parallel to the processing surface. That is what makes them do it.
- FIG. 1 is a perspective view of a main part of a double-sided grinding apparatus showing an embodiment of the present invention.
- FIG. 2 is a left side view, partially cut away, of FIG.
- FIG. 3 is a partially cutaway left side view showing a main part of FIG. 2 in an enlarged manner.
- Figure 4 shows the relationship between the grinding wheel and the workpiece during grinding.
- FIG. 5 is an explanatory diagram showing the time change of the cutting of the grinding wheel and the vertical position of the workpiece during the grinding operation.
- FIG. 6 is a graph showing a radial thickness distribution of the wafer after double-side grinding in the example.
- FIG. 7 is a graph showing the radial thickness distribution of the wafer after double-side grinding in the comparative example.
- BEST MODE FOR CARRYING OUT THE INVENTION An embodiment in which the present invention is applied to double-side grinding of a semiconductor wafer will be described below with reference to the drawings.
- FIGs 1 and 2 show the main parts of a double-sided grinding machine.
- the double-sided grinding machine is obtained by adding a work rotating device (1) as a work rotating means and a moving device (2) as a moving means to a horizontal shaft double-sided surface grinder.
- FIG. 2 shows only a pair of grinding wheels (3) and (4) of the grinder.
- the front side of FIG. 2 is left, the back side is right, and the right side of the figure is front and the left side is rear.
- Fig. 3 shows the relationship between the thin disk-shaped workpiece ( ⁇ wafer) (W) supported by the rotating device (1) and the grindstones (3) and (4)
- Fig. 4 shows the workpiece ( The relationship between W) and the whetstone (3) (4) is shown.
- the work (W) which is a target of this embodiment has no positioning flat portion, and has a perfect circular outer diameter.
- the work (W) is rotated about the center (c) thereof by the rotation device (1) in such a manner that both processing surfaces (a) and (b) face left and right.
- the machining surface (a) facing left is called the left machining surface
- the machining surface (b) facing right is called the right machining surface.
- the grinding machine is equipped with a bead and left and right whetstone heads fixed to the upper surface of the bead, and a whetstone shaft that extends horizontally in the left and right direction in each whetstone head. Are rotatably supported.
- the positions of the left and right grinding wheel heads are adjusted so that the axes of the left and right grinding wheel axes coincide with one common horizontal axis extending in the left and right direction.
- a left cup-shaped base (5) is fixed concentrically to the tip of the left wheel shaft protruding to the right from the left wheel head.
- Whetstone (3) is fixed concentrically.
- the right end surface of the grinding wheel (3) is a left annular grinding surface (3a) orthogonal to the axis of the left grinding wheel axis and centered on the axis of the bracket.
- a left-hand base (5) and a left-right symmetrical right-handed base (6) are fixed concentrically to the tip of the right-hand grinding wheel shaft protruding to the left from the right-hand grinding head.
- An annular right grinding wheel (4) which is symmetrical to the left grinding wheel (3), is concentrically fixed to the left open end face of ().
- the left end surface of the grinding wheel (4) is a right grinding surface (4a) orthogonal to the axis of the right wheel axis and centered on the axis of the bracket.
- the left and right grinding surfaces (3a) and (4a) are parallel to each other.
- the left and right grinding wheels (3) and (4) relatively move in the axial direction as the left and right grinding wheel axes move in the axial direction.
- the left and right grinding wheel shafts are rotated at the same speed in the same direction by driving means (not shown).
- driving means not shown
- the left and right grinding wheels (3) and (4) are rotated at the same speed in the same direction as each other.
- the rotation direction and rotation speed of the left and right grinding wheels (3) and (4) may be different from each other.
- the other parts of the grinder can be configured in the same manner as a known horizontal-axis double-ended surface grinder.
- the work rotation device (1) is connected to the grinder by the moving device (2). It is attached to the ladder.
- the moving device (2) moves the rotating device (1) and the work (W) supported by the rotating device (1) in a substantially vertical direction parallel to the processing surfaces (a) and (b).
- the configuration is as follows.
- the rear end of the vertical plate-shaped support member (7) which is wider than the vertical width, can rotate up and down around the horizontal axis (8) in the horizontal direction.
- the front end of the support member (7) is attached to the bed via a suitable actuator (9).
- the support member (7) is turned up and down around the horizontal axis (8) by the operation of the actuator (9).
- the solid line indicates a state in which the support member (7) is at the lower end position
- the chain line indicates a state in which the support member (7) is at a slightly higher intermediate position.
- the rotation device (1) vertically supports the work (W) between the left and right grinding surfaces (3a) and (4a) so that the axis of the work (W) is parallel to the axis of the grinding wheels (3) and (4). And has three guide rollers (10), a drive roller (11), and three holding rollers (12). Although not shown in detail, the rollers (10), (11), and (12) are all attached to the support member (7). The rollers (10), (11), and (12) are required to have a working position for supporting and rotating the work (W), a work (w) being loaded into the rotation device (1), Switches to the standby position for unloading.
- Figures 1 to 3 show a state in which all such rollers (10), (11), (12) are in the operating position.
- Fig. 3 shows the positional relationship of the grindstones (3) and (4), the rollers (10), (11) and (12) of the rotation device (1), and the work (W) supported by the rotation device (1) as viewed from the left. Is shown. Spinning device (1) and its supporting ⁇ The work (W) moves up and down on an arc-shaped trajectory centered on the horizontal axis (8) as the support member (7) rotates up and down.
- the solid line in FIG. 2 and the dashed line in FIG. 3 show the state where the workpiece (W) is at the grinding position at the lower end, and the dashed line in FIG. 2 and the solid line in FIG. This shows a state in a slightly upper intermediate position.
- the outer diameter of the grindstones (3) and (4) is about 2/3 of the outer diameter of the work (W), and the center (c) of the work (W) supported at the grinding position Is located above the center of whetstones (3) and (4).
- the guide roller (10) regulates the radial position of the workpiece (W) by contacting the outer surface of the part of the workpiece (W) protruding from between the grinding wheels (3) and (4).
- the work (W) is divided into three equal parts in the circumferential direction, that is, at one location above the center of the work (W) in the front-rear direction and at two locations before and after the lower part of the work (W). It is provided.
- the driving roller (11) and the presser roller (12) form a pair, and the three parts of the work (W) projecting from between the grinding wheels (3) and (4) are driven by the driving roller (3).
- the holding roller (12) sandwich it from the left and right to regulate the position of the workpiece in the axial direction (left and right direction).
- the holding roller (12) is pressed against the right processing surface (b) of the work (W) by a spring (not shown), and the left processing surface (a) of the work (W) is pressed against the drive roller (11). Let it.
- the drive roller (11) is rotated by an electric motor (13) Then, the work (W) is rotated by being pressed against the processing surface (a) of the work (W).
- the press roller (12) rotates freely by pressing against the work surface (b) of the work (W).
- the drive roller (11) and the presser roller (12) are located at three positions that divide the work (W) into four equal parts in the circumferential direction, that is, one at the upper center in the front-rear direction of the work (W). It is installed at the front and rear two places in the vertical center of the work (W).
- FIG. 5 shows the cutting of the grindstones (3) and (4) and the time change in the vertical position of the work (W) during the grinding operation.
- the solid line shows the cutting of the grindstones (3) and (4).
- the broken line indicates the position of the work (W).
- the required rollers (10), (11), (12) of the spinning device (1) are moved to the standby position with the grinding wheels (3) and (4) stopped at the standby position left and right, not shown.
- the work (W) is carried into the rolling device (1) by the work transfer device, and the required rollers (10), (11), and (12) are moved to the operation position, and the work (W) is moved. Supported.
- the work (W) is supported at the grinding position as shown by the solid line in Fig. 2 (dotted line in Fig. 3), and the upper part of the work (W) is ),
- the center (c) of the work (W) is located between the outer periphery and the inner periphery of the upper part of the grinding surfaces (3a) and (4a).
- Fig. 4 (a) shows the positional relationship between the grindstones (3) and (4) and the work (W) when viewed from the front.
- the drive roller (11) starts rotating.
- the drive roller (11) rotates, With the work (W) restricted in the radial and axial positions by the rollers (10), (11), and (12), as shown by arrows in FIGS.
- the wheel can be rotated around its center (c) at a lower speed than the grindstones (3) and (4) in the direction determined by the rotation direction of 11).
- FIG. 4 (b) shows the positional relationship between the grinding wheels (3) and (4) and the work (W) when the grinding surfaces (3a) and (4a) contact the processing surfaces (a) and (b) as viewed from the front. It is shown.
- the grindstones (3) and (4) are cut to a predetermined position (time t3), they are further moved in the cutting direction at a lower speed of the fine grinding feed.
- the grindstones (3) and (4) are cut to a predetermined position (time t4), the cutting of the grindstones (3) and (4) is stopped, and spark pet grinding is started.
- the cutting unit (9) of the moving device (2) is driven with the cutting of the grinding wheels (3) and (4) stopped.
- the support member (7) is rotated upward, whereby the rotation device (1) and the work (W) supported by the rotation device (1) are moved upward from the grinding position.
- at least 1/2 of the width of the grinding surface (3a) (3b) must be moved so that the center (c) of the work (W) deviates from the grinding surface (3a) (3b). Need to be done.
- the center (c) of the work (W) is displaced upward from the grinding surface (3a) (4a)
- the actuator (9) is stopped, the rotation of the rotation device (1) and the work (W) is stopped, and the spark Grinding continues.
- the spark-out grinding is completed (time t7), the grindstones (3) and (4) are moved to the left and right standby positions, and the ground surface
- the grindstones (3) and (4) rotate, so that their ground surfaces (3a) (
- the work surface (a) (b) of the work (W) in contact with 4a) is ground, and the outer periphery of the work (W) intersects the outer periphery of the ground surface (3a) (4a) and the work (W)
- the rotation of the work (W) while the center (c) is positioned within the grinding surface (3a) (4a) causes the work (W) to rotate while the work (W) makes one revolution.
- the entire surface of the machined surfaces (a) and (b) passes between the ground surfaces (3a) and (4a) and contacts the ground surfaces (3a) and (4a).
- the moving speed and moving distance of the work (W) in the direction parallel to the processing surfaces (a) and (b) are determined based on the accuracy required for the thickness of the work (W).
- each part such as a grinding machine, a work rotating device, a moving device, and the like, which constitute the double-sided grinding device, and a method of the grinding operation are not limited to those of the above-described embodiment, and can be appropriately changed.
- the present invention is applicable not only to a horizontal type in which a pair of grinding wheels are horizontally opposed as in the above embodiment, but also to a vertical type in which a pair of grinding wheels are vertically opposed. Applicable.
- the present invention can also be applied to double-side grinding of a work having a flat portion for positioning formed at one place on the outer periphery. In that case, in the Park rotation device, at three places around the work,
- Two outer guide rollers are provided at intervals slightly larger than the circumferential dimension of the positioning flat portion.
- the work (W) is located between the left and right grinding surfaces (3a) and (4a), and the outer periphery of the grinding surfaces (3a) and (4a) intersects the outer periphery of the processing surfaces (a) and (b).
- the spark-part grinding is completed in a state where the grinding wheels (3) and (4) are moved left and right
- the grinding surfaces (3a) and (4a) are moved to the machining surfaces (a) and (4).
- the ground surfaces (3a) and (4a) may be separated from the processed surfaces (a) and (b).
- the cut is given by moving both the grindstones (3) and (4) in the axial direction.
- one of the grindstones (3) and (4) and the work (W) are separated.
- the cut may be provided by moving in the axial direction.
- double-side grinding of a semiconductor silicon substrate was performed using the double-side grinding apparatus shown in FIG.
- the silicon wafer has a thickness of about lmm and a diameter of 200 mm (8 mm) sliced using a wire from silicon single crystal ingots manufactured by the CZ method. Inch) and those with plane orientation (100) were used.
- the grinding conditions used were a grinding wheel # 200 00 (wheel width: 3 mm), the rotation speed of the grinding wheel was 250 rpm, and the rotation speed of the wheel was 25 rpm.
- the grindstones were moved in a cutting direction that approached each other at a relatively high rapid traverse speed. . Furthermore, the grinding wheel was moved in the cutting direction, and after the grinding wheel contacted the surface to be machined, the fine grinding feed speed was reduced to 50 ⁇ m on one side. // Switched to mmin, and when the wafer was ground at 10 ⁇ m on one side, the cutting of the grindstone was stopped and spark pet grinding was started.
- the thickness was measured by measuring the flatness of both surfaces.
- the flatness was measured using an Ultra Gage 970+ (capacitance type flatness meter) manufactured by ADE.
- Fig. 6 shows the thickness distribution in the radial direction of one cylinder. As can be seen from FIG. 6, according to the embodiment, the thickness did not become particularly thin at the center of the wafer.
- double-sided grinding of silicon-ano was performed under the same conditions as in the example, except that the wafer was not moved during spark-part grinding.
- the average value of GBIR of the 20 wafers was 0.69 im, and the standard deviation was 0.042 x m. Further, the average value of the above SBI R at the center of the wafer was 0.40 ⁇ m, and the standard deviation was 0.02411.
- FIG. 7 shows the thickness distribution in the radial direction of the wafer based on the measured values of the thickness measurement performed for the comparative example. As is clear from FIG. 7, according to the comparative example, the thickness was sharply reduced at the center of the wafer. Industrial applicability
- the method and apparatus for double-sided grinding of a thin disk-shaped work according to the present invention are suitable for being used for double-sided grinding of a thin disk-shaped work such as semiconductors and wafers.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00960972A EP1193029B1 (en) | 1999-09-24 | 2000-09-13 | Double side grinding process for thin disklike work |
DE60022356T DE60022356T2 (de) | 1999-09-24 | 2000-09-13 | Doppelseitenpolierverfahren für dünne scheibenförmige Werkstücke |
JP2001524765A JP3829239B2 (ja) | 1999-09-24 | 2000-09-13 | 薄板円板状ワークの両面研削方法および装置 |
US09/831,893 US6726525B1 (en) | 1999-09-24 | 2000-09-13 | Method and device for grinding double sides of thin disk work |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26997999 | 1999-09-24 | ||
JP11/269979 | 1999-09-24 |
Publications (1)
Publication Number | Publication Date |
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WO2001021356A1 true WO2001021356A1 (fr) | 2001-03-29 |
Family
ID=17479893
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2000/006250 WO2001021356A1 (fr) | 1999-09-24 | 2000-09-13 | Procede et dispositif de meulage des deux faces d'un disque fin |
Country Status (7)
Country | Link |
---|---|
US (1) | US6726525B1 (ja) |
EP (1) | EP1193029B1 (ja) |
JP (1) | JP3829239B2 (ja) |
KR (1) | KR100706626B1 (ja) |
DE (1) | DE60022356T2 (ja) |
TW (1) | TW450875B (ja) |
WO (1) | WO2001021356A1 (ja) |
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EP4047635A1 (de) | 2021-02-18 | 2022-08-24 | Siltronic AG | Verfahren zur herstellung von scheiben aus einem zylindrischen stab aus halbleitermaterial |
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- 2000-09-13 JP JP2001524765A patent/JP3829239B2/ja not_active Expired - Fee Related
- 2000-09-13 US US09/831,893 patent/US6726525B1/en not_active Expired - Lifetime
- 2000-09-13 EP EP00960972A patent/EP1193029B1/en not_active Expired - Lifetime
- 2000-09-13 KR KR1020017006269A patent/KR100706626B1/ko active IP Right Grant
- 2000-09-13 DE DE60022356T patent/DE60022356T2/de not_active Expired - Lifetime
- 2000-09-21 TW TW089119442A patent/TW450875B/zh not_active IP Right Cessation
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DE10142400B4 (de) * | 2001-08-30 | 2009-09-03 | Siltronic Ag | Halbleiterscheibe mit verbesserter lokaler Ebenheit und Verfahren zu deren Herstellung |
CN112223020A (zh) * | 2020-10-13 | 2021-01-15 | 苏州青众创业服务有限公司 | 一种数控加工用打磨装置 |
Also Published As
Publication number | Publication date |
---|---|
DE60022356D1 (de) | 2005-10-06 |
KR20010082307A (ko) | 2001-08-29 |
EP1193029B1 (en) | 2005-08-31 |
DE60022356T2 (de) | 2006-06-22 |
US6726525B1 (en) | 2004-04-27 |
JP3829239B2 (ja) | 2006-10-04 |
EP1193029A4 (en) | 2004-05-06 |
TW450875B (en) | 2001-08-21 |
KR100706626B1 (ko) | 2007-04-13 |
EP1193029A1 (en) | 2002-04-03 |
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