WO1999040446A8 - Current measuring method, current sensor, and ic tester using the same current sensor - Google Patents
Current measuring method, current sensor, and ic tester using the same current sensorInfo
- Publication number
- WO1999040446A8 WO1999040446A8 PCT/JP1998/000479 JP9800479W WO9940446A8 WO 1999040446 A8 WO1999040446 A8 WO 1999040446A8 JP 9800479 W JP9800479 W JP 9800479W WO 9940446 A8 WO9940446 A8 WO 9940446A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- current
- measuring method
- current sensor
- tester
- phase
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9923232A GB2340233A (en) | 1998-02-05 | 1998-02-05 | Current measuring method,current sensor,and IC tester using the same current sensor |
PCT/JP1998/000479 WO1999040446A1 (en) | 1998-02-05 | 1998-02-05 | Current measuring method, current sensor, and ic tester using the same current sensor |
DE19882306T DE19882306T1 (en) | 1998-02-05 | 1998-02-05 | Current measurement method, current sensor and IC tester working using the current sensor |
CN98803958.3A CN1252130A (en) | 1998-02-05 | 1998-02-05 | Current measurement, current sensor and IC tester using the sensor |
KR1019997009086A KR20010006008A (en) | 1998-02-05 | 1998-02-05 | Current measuring method, current sensor, and ic tester using the same current sensor |
TW087103066A TW359753B (en) | 1998-02-05 | 1998-03-03 | Current measuring method, current sensor, and IC tester using the same current sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1998/000479 WO1999040446A1 (en) | 1998-02-05 | 1998-02-05 | Current measuring method, current sensor, and ic tester using the same current sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1999040446A1 WO1999040446A1 (en) | 1999-08-12 |
WO1999040446A8 true WO1999040446A8 (en) | 1999-12-16 |
Family
ID=14207551
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1998/000479 WO1999040446A1 (en) | 1998-02-05 | 1998-02-05 | Current measuring method, current sensor, and ic tester using the same current sensor |
Country Status (6)
Country | Link |
---|---|
KR (1) | KR20010006008A (en) |
CN (1) | CN1252130A (en) |
DE (1) | DE19882306T1 (en) |
GB (1) | GB2340233A (en) |
TW (1) | TW359753B (en) |
WO (1) | WO1999040446A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101958263B (en) * | 2009-07-14 | 2013-01-02 | 致茂电子(苏州)有限公司 | Semiconductor grain point measurement machine test method and semiconductor grain point measurement machine |
US9733133B2 (en) * | 2013-10-07 | 2017-08-15 | Xiaotian Steve Yao | Faraday current and temperature sensors |
WO2015185133A1 (en) * | 2014-06-04 | 2015-12-10 | Telefonaktiebolaget L M Ericsson (Publ) | An optical electrical measurement system, a measurement probe and a method therefor |
CN107091950B (en) | 2016-02-16 | 2021-01-19 | 姚晓天 | Reflective current and magnetic field sensor integrating temperature sensing based on optical sensing principle |
CN107861045A (en) * | 2017-10-13 | 2018-03-30 | 天津市英贝特航天科技有限公司 | Short-circuit chip searching device and method based on direct current CT technology |
CN109709384B (en) * | 2018-12-13 | 2021-10-01 | 北京航天时代光电科技有限公司 | Current sensor adopting integrated light path structure |
KR102451032B1 (en) * | 2020-09-29 | 2022-10-05 | 엘아이지넥스원 주식회사 | APPARATUS AND METHOD FOR DETECTING A MALFUNTION OF FET(Field Effect Transistor) |
CN115856396B (en) * | 2022-12-09 | 2023-08-29 | 珠海多创科技有限公司 | Sensing probe module, non-contact voltage measurement circuit, non-contact voltage measurement method and electronic equipment |
KR102535830B1 (en) * | 2023-04-11 | 2023-05-26 | 주식회사 수산이앤에스 | A system for testing optical converter |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5224389B2 (en) * | 1974-03-11 | 1977-06-30 | ||
JPS59155764A (en) * | 1983-02-24 | 1984-09-04 | Yokogawa Hokushin Electric Corp | Photovoltometer |
JPS59218915A (en) * | 1983-05-27 | 1984-12-10 | Yokogawa Hokushin Electric Corp | Light guide type sensor |
JPS6237940A (en) * | 1985-08-12 | 1987-02-18 | Nippon Denshi Zairyo Kk | Probe card |
JPS6246268A (en) * | 1985-08-23 | 1987-02-28 | Nippon Denshi Zairyo Kk | Probe card |
JPH07104365B2 (en) * | 1987-09-19 | 1995-11-13 | 株式会社安川電機 | Optical sensor device |
JPH04172260A (en) * | 1990-11-05 | 1992-06-19 | Toyota Central Res & Dev Lab Inc | Apparatus for measuring strength of electromagnetic field |
JP2603380B2 (en) * | 1991-09-13 | 1997-04-23 | 日本電信電話株式会社 | Test apparatus and test method for integrated circuit |
JPH0989961A (en) * | 1995-09-26 | 1997-04-04 | Tokin Corp | Electric field detecting device |
-
1998
- 1998-02-05 WO PCT/JP1998/000479 patent/WO1999040446A1/en not_active Application Discontinuation
- 1998-02-05 CN CN98803958.3A patent/CN1252130A/en active Pending
- 1998-02-05 DE DE19882306T patent/DE19882306T1/en not_active Withdrawn
- 1998-02-05 GB GB9923232A patent/GB2340233A/en not_active Withdrawn
- 1998-02-05 KR KR1019997009086A patent/KR20010006008A/en not_active Application Discontinuation
- 1998-03-03 TW TW087103066A patent/TW359753B/en active
Also Published As
Publication number | Publication date |
---|---|
GB2340233A (en) | 2000-02-16 |
KR20010006008A (en) | 2001-01-15 |
CN1252130A (en) | 2000-05-03 |
TW359753B (en) | 1999-06-01 |
DE19882306T1 (en) | 2000-04-27 |
GB9923232D0 (en) | 1999-12-08 |
WO1999040446A1 (en) | 1999-08-12 |
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