TW359753B - Current measuring method, current sensor, and IC tester using the same current sensor - Google Patents
Current measuring method, current sensor, and IC tester using the same current sensorInfo
- Publication number
- TW359753B TW359753B TW087103066A TW87103066A TW359753B TW 359753 B TW359753 B TW 359753B TW 087103066 A TW087103066 A TW 087103066A TW 87103066 A TW87103066 A TW 87103066A TW 359753 B TW359753 B TW 359753B
- Authority
- TW
- Taiwan
- Prior art keywords
- current
- measuring method
- current sensor
- tester
- phase
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A current measuring method which has the steps of converting a current to be measured into a voltage signal, phase-modulating the light, which permeates through an optical modulator, by this voltage signal, obtaining interference light by allowing the phase-modulated light to interfere with non-phase-modulated light, and measuring the object current on the basis of the intensity of the interference light. An IC tester is also proposed which is adapted to measure a current flowing in a power source terminal of an IC to be tested, by using this current measuring method, and judge that the object IC is defective when the resultant current value is larger than a predetermined value.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1998/000479 WO1999040446A1 (en) | 1998-02-05 | 1998-02-05 | Current measuring method, current sensor, and ic tester using the same current sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
TW359753B true TW359753B (en) | 1999-06-01 |
Family
ID=14207551
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087103066A TW359753B (en) | 1998-02-05 | 1998-03-03 | Current measuring method, current sensor, and IC tester using the same current sensor |
Country Status (6)
Country | Link |
---|---|
KR (1) | KR20010006008A (en) |
CN (1) | CN1252130A (en) |
DE (1) | DE19882306T1 (en) |
GB (1) | GB2340233A (en) |
TW (1) | TW359753B (en) |
WO (1) | WO1999040446A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101958263B (en) * | 2009-07-14 | 2013-01-02 | 致茂电子(苏州)有限公司 | Semiconductor grain point measurement machine test method and semiconductor grain point measurement machine |
US9733133B2 (en) * | 2013-10-07 | 2017-08-15 | Xiaotian Steve Yao | Faraday current and temperature sensors |
WO2015185133A1 (en) * | 2014-06-04 | 2015-12-10 | Telefonaktiebolaget L M Ericsson (Publ) | An optical electrical measurement system, a measurement probe and a method therefor |
CN107091950B (en) | 2016-02-16 | 2021-01-19 | 姚晓天 | Reflective current and magnetic field sensor integrating temperature sensing based on optical sensing principle |
CN107861045A (en) * | 2017-10-13 | 2018-03-30 | 天津市英贝特航天科技有限公司 | Short-circuit chip searching device and method based on direct current CT technology |
CN109709384B (en) * | 2018-12-13 | 2021-10-01 | 北京航天时代光电科技有限公司 | Current sensor adopting integrated light path structure |
KR102451032B1 (en) * | 2020-09-29 | 2022-10-05 | 엘아이지넥스원 주식회사 | APPARATUS AND METHOD FOR DETECTING A MALFUNTION OF FET(Field Effect Transistor) |
CN115856396B (en) * | 2022-12-09 | 2023-08-29 | 珠海多创科技有限公司 | Sensing probe module, non-contact voltage measurement circuit, non-contact voltage measurement method and electronic equipment |
KR102535830B1 (en) * | 2023-04-11 | 2023-05-26 | 주식회사 수산이앤에스 | A system for testing optical converter |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5224389B2 (en) * | 1974-03-11 | 1977-06-30 | ||
JPS59155764A (en) * | 1983-02-24 | 1984-09-04 | Yokogawa Hokushin Electric Corp | Photovoltometer |
JPS59218915A (en) * | 1983-05-27 | 1984-12-10 | Yokogawa Hokushin Electric Corp | Light guide type sensor |
JPS6237940A (en) * | 1985-08-12 | 1987-02-18 | Nippon Denshi Zairyo Kk | Probe card |
JPS6246268A (en) * | 1985-08-23 | 1987-02-28 | Nippon Denshi Zairyo Kk | Probe card |
JPH07104365B2 (en) * | 1987-09-19 | 1995-11-13 | 株式会社安川電機 | Optical sensor device |
JPH04172260A (en) * | 1990-11-05 | 1992-06-19 | Toyota Central Res & Dev Lab Inc | Apparatus for measuring strength of electromagnetic field |
JP2603380B2 (en) * | 1991-09-13 | 1997-04-23 | 日本電信電話株式会社 | Test apparatus and test method for integrated circuit |
JPH0989961A (en) * | 1995-09-26 | 1997-04-04 | Tokin Corp | Electric field detecting device |
-
1998
- 1998-02-05 WO PCT/JP1998/000479 patent/WO1999040446A1/en not_active Application Discontinuation
- 1998-02-05 CN CN98803958.3A patent/CN1252130A/en active Pending
- 1998-02-05 DE DE19882306T patent/DE19882306T1/en not_active Withdrawn
- 1998-02-05 GB GB9923232A patent/GB2340233A/en not_active Withdrawn
- 1998-02-05 KR KR1019997009086A patent/KR20010006008A/en not_active Application Discontinuation
- 1998-03-03 TW TW087103066A patent/TW359753B/en active
Also Published As
Publication number | Publication date |
---|---|
GB2340233A (en) | 2000-02-16 |
KR20010006008A (en) | 2001-01-15 |
CN1252130A (en) | 2000-05-03 |
WO1999040446A8 (en) | 1999-12-16 |
DE19882306T1 (en) | 2000-04-27 |
GB9923232D0 (en) | 1999-12-08 |
WO1999040446A1 (en) | 1999-08-12 |
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