JPS5224389B2 - - Google Patents
Info
- Publication number
- JPS5224389B2 JPS5224389B2 JP49028740A JP2874074A JPS5224389B2 JP S5224389 B2 JPS5224389 B2 JP S5224389B2 JP 49028740 A JP49028740 A JP 49028740A JP 2874074 A JP2874074 A JP 2874074A JP S5224389 B2 JPS5224389 B2 JP S5224389B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49028740A JPS5224389B2 (en) | 1974-03-11 | 1974-03-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49028740A JPS5224389B2 (en) | 1974-03-11 | 1974-03-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50120980A JPS50120980A (en) | 1975-09-22 |
| JPS5224389B2 true JPS5224389B2 (en) | 1977-06-30 |
Family
ID=12256807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49028740A Expired JPS5224389B2 (en) | 1974-03-11 | 1974-03-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5224389B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57202753A (en) * | 1981-06-08 | 1982-12-11 | Seiko Instr & Electronics Ltd | Tester for ic |
| WO1999040446A1 (en) * | 1998-02-05 | 1999-08-12 | Advantest Corporation | Current measuring method, current sensor, and ic tester using the same current sensor |
-
1974
- 1974-03-11 JP JP49028740A patent/JPS5224389B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50120980A (en) | 1975-09-22 |