TWM470948U - Inspection stage and optical inspection apparatus - Google Patents
Inspection stage and optical inspection apparatus Download PDFInfo
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- TWM470948U TWM470948U TW102215278U TW102215278U TWM470948U TW M470948 U TWM470948 U TW M470948U TW 102215278 U TW102215278 U TW 102215278U TW 102215278 U TW102215278 U TW 102215278U TW M470948 U TWM470948 U TW M470948U
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Description
本創作是有關於一種檢測台及其光學檢測裝置，特別是有關於一種具有多溝槽設計且具有透光性質之檢測台及其光學檢測裝置。The present invention relates to a test stand and an optical detecting device thereof, and more particularly to a test stand having a multi-groove design and having a light transmitting property and an optical detecting device thereof.
現今之自動光學檢測裝置（AOI）大多為使用一檢測台、一光源模組及一攝像模組。檢測台先利用一吸附溝槽將待測物吸附放置於檢測台上，再利用攝像模組配合光源模組，以對待測物進行影像擷取，隨後再依據擷取之影像進行外觀瑕疵或尺寸量測等檢測項目。現今常見檢測檯面大致可分為真空檯面形式及壓板玻璃形式。真空檯面式，其檯面為非透光材質，且檯面設有複數個吸附孔，藉由該些吸附孔可使待測物平貼於檢測檯面，且由於其非透光之特性，故光源模組需設置於檢測檯面之上，亦可稱作上光源式。壓板玻璃形式，其檯面為透光材質(例如玻璃)，利用另一玻璃板壓設於待測物之上，以使待測物平貼於檢測台，且藉由檯面透光之特性，光源模組可以設置於檢測台下方，進而可使光源穿透待測物，以利於檢測人員進行檢測。Most of today's automatic optical inspection devices (AOI) use a test station, a light source module, and a camera module. The detecting station firstly adsorbs the object to be tested on the detecting platform by using an adsorption groove, and then uses the camera module to cooperate with the light source module to perform image capturing on the object to be tested, and then performs appearance or size according to the captured image. Measurement and other testing items. Today's common test benches can be roughly divided into vacuum table tops and platen glass. The vacuum table type has a non-transparent material on the table surface, and the table surface is provided with a plurality of adsorption holes, and the adsorption holes can make the object to be tested flat on the detection table surface, and the light source mode is due to the non-light transmission property. The group needs to be placed on the test surface, which can also be called the upper light source type. In the form of a platen glass, the table top is made of a light-transmissive material (for example, glass), and the other glass plate is pressed on the object to be tested, so that the object to be tested is flatly attached to the inspection table, and the light source is transmitted through the characteristics of the table surface. The module can be disposed under the inspection platform, so that the light source can penetrate the object to be tested, so as to facilitate detection by the inspection personnel.
然，在實際應用中，若使用下光源式檢測台時，因為須利用另一玻璃壓設於待測物，所以在待測物之種類選擇上會有所限制，為此造成使用者的不便與困擾。換言之，使用者若欲使用下光源式檢測台，則待測物之表面必須是乾燥表面，不可有任何未乾燥或未烘乾之物件，因此造成實際應用上的不便。有鑒於此，如何設計一理想的檢測台及其光學檢測裝置，使待測物能更平貼於檢測台，且同時可配合使用下光源，已成為現今產業極需解決之問題。故，本創作之創作人思索並設計一種檢測台及其光學檢測裝置，以針對現有技術之缺失加以改善，進而增進產業上之實施利用。However, in practical applications, if the lower light source type test bench is used, since another glass is required to be pressed on the object to be tested, there is a limit on the type of the object to be tested, which causes inconvenience to the user. With trouble. In other words, if the user wants to use the lower light source type test stand, the surface of the object to be tested must be a dry surface, and there must be no undried or unbaked objects, thus causing inconvenience in practical application. In view of this, how to design an ideal inspection station and its optical detection device, so that the object to be tested can be more flat on the detection platform, and at the same time can be used together with the light source, has become an urgent problem to be solved in the current industry. Therefore, the creator of this creation thinks about and designs a test stand and its optical detection device to improve the lack of the prior art, thereby enhancing the implementation and utilization of the industry.
有鑑於上述習知技藝之問題，本創作之目的就是在提供一種具有多溝槽設計且具有透光性質之檢測台及其光學檢測裝置，以解決習知下光源式檢測檯面，無法檢測待測物表面具有任何未乾燥或未烘乾物件之問題。In view of the above-mentioned problems of the prior art, the object of the present invention is to provide a test stand having a multi-groove design and having a light-transmissive property and an optical detecting device thereof, so as to solve the conventional light source type test bench and cannot detect the test. The surface of the object has any problem with undried or unbaked items.
本創作之目的，係提供一種檢測台，係為一透光結構，可應用於光學檢測裝置，且具有一放置平面以提供一待測物放置。檢測台包含：一第一溝槽及一第二溝槽。第一溝槽圍繞設置於放置平面之週邊，且連接至少一第一氣孔，至少一第一氣孔連接一抽氣模組。第二溝槽圍繞設置於放置平面，且位於第一溝槽之內側，第二溝槽連接至少一第二氣孔，至少一第二氣孔連接抽氣模組。其中，當抽氣模組進行作動時，藉由第一溝槽及第二溝槽，而將待測物與檢測台間之空氣抽出，進而使待測物平貼於放置平面。The purpose of the present invention is to provide a test station which is a light transmissive structure which can be applied to an optical detecting device and has a placement plane to provide a test object to be placed. The inspection station includes: a first trench and a second trench. The first groove is disposed around the periphery of the placement plane, and is connected to at least one first air hole, and the at least one first air hole is connected to a suction module. The second groove is disposed on the placement plane and is located inside the first groove, the second groove is connected to the at least one second air hole, and the at least one second air hole is connected to the air suction module. Wherein, when the air suction module is actuated, the air between the object to be tested and the detection station is extracted by the first groove and the second groove, so that the object to be tested is flatly attached to the placement plane.
其中，第一溝槽及其所圍繞之區域對應待測物之大小。The first trench and the area around it correspond to the size of the object to be tested.
其中，至少一第二氣孔設置於第一溝槽與第二溝槽之間。The at least one second air hole is disposed between the first trench and the second trench.
其中，第一溝槽及第二溝槽之圍繞方式對應於待測物之外形。The manner in which the first trench and the second trench are surrounded corresponds to the shape of the object to be tested.
本創作之另一目的，係提供一種光學檢測裝置，其包含：一檢測台、一攝像模組、至少一光源模組及一抽氣模組。檢測台可為一透光結構，且具有一放置平面以提供一待測物放置，其包含：一第一溝槽及一第二溝槽。第一溝槽圍繞設置於放置平面之週邊，且連接至少一第一氣孔。第二溝槽圍繞設置於放置平面，且位於第一溝槽之內側，第二溝槽連接至少一第二氣孔。攝像模組對應放置平面設置於檢測台之一側，以對待測物進行檢測。至少一光源模組，提供攝像模組檢測待測物所需之光源。抽氣模組連接至少一第一氣孔及至少一第二氣孔。其中，當抽氣模組作動時，藉由第一溝槽及第二溝槽，而將待測物與檢測台間之空氣抽出，進而使待測物平貼於放置平面，以使攝像模組進行檢測動作。Another object of the present invention is to provide an optical detecting device comprising: a detecting station, a camera module, at least one light source module and a pumping module. The inspection station can be a light transmissive structure and has a placement plane to provide a test object placement, comprising: a first trench and a second trench. The first groove is disposed around the periphery of the placement plane and is connected to the at least one first air hole. The second trench is disposed on the placement plane and is located inside the first trench, and the second trench is connected to the at least one second air hole. The corresponding positioning plane of the camera module is disposed on one side of the detection platform to detect the object to be tested. At least one light source module provides a light source required by the camera module to detect the object to be tested. The air suction module connects at least one first air hole and at least one second air hole. Wherein, when the air suction module is actuated, the air between the object to be tested and the detection station is extracted by the first groove and the second groove, so that the object to be tested is flatly attached to the placement plane, so that the image capturing mode The group performs the detection action.
其中，至少一光源模組設置於檢測台之另一側，且相對於放置平面，並藉由檢測台之透光結構，以使攝像模組藉由至少一光源模組所提供之光源，對待測物進行檢測。The at least one light source module is disposed on the other side of the detection platform, and is opposite to the placement plane, and is configured to treat the camera module by the light source provided by the at least one light source module. The test object is tested.
其中，第一溝槽及其所圍繞之區域對應待測物之大小。The first trench and the area around it correspond to the size of the object to be tested.
其中，至少一第二氣孔設置於第一溝槽及第二溝槽之間。The at least one second air hole is disposed between the first trench and the second trench.
其中，第一溝槽及第二溝槽之圍繞方式對應於待測物之外形。The manner in which the first trench and the second trench are surrounded corresponds to the shape of the object to be tested.
綜上所述，本創作所提供之檢測台及其光學檢測裝置，其提供下列的優點：In summary, the test stand and its optical detecting device provided by the present invention provide the following advantages:
(1) 此檢測台及其光學檢測裝置，利用透光之檢測台，配合設置複數個吸附溝槽，以使待測物平貼於檢測台，且同時可以使用下光源之照射方式檢測待測物，進而可改善習知技術中無法同時利用真空吸附方式及下光源方式進行檢測之問題。(1) The test stand and its optical detecting device use a light-transmissive test stand to cooperate with a plurality of adsorption grooves to make the object to be tested flat on the test stand, and at the same time, the lower light source can be used to detect the test. The object can further improve the problem that the conventional technology cannot simultaneously detect by the vacuum adsorption method and the lower light source method.
(2) 此檢測台及其光學檢測裝置，將透光之檢測台設置複數個吸附溝槽，以取代習知下光源式檢測裝置中之壓板玻璃，進而可讓使用者對於待測物方面具有更多的選擇。(2) The test stand and its optical detecting device are provided with a plurality of adsorption grooves for the light-transmissive test stand to replace the platen glass in the conventional light source type detecting device, thereby allowing the user to have a test object more choices.
(3) 此檢測台及其光學檢測裝置，利用複數個吸附溝槽，以使待測物平貼於檢測台，進而可以解決習知技術利用吸附孔，而容易干擾檢測影像之問題。(3) The detecting station and the optical detecting device use a plurality of adsorption grooves to make the object to be tested flatly attached to the detecting station, thereby solving the problem that the conventional technique utilizes the adsorption hole and easily interferes with the detection of the image.
1‧‧‧光學檢測裝置
10‧‧‧檢測台
101‧‧‧第一溝槽
1011‧‧‧第一氣孔
102‧‧‧第二溝槽
1021‧‧‧第二氣孔
103‧‧‧放置平面
11‧‧‧抽氣模組
12‧‧‧攝像模組
13‧‧‧光源模組
14‧‧‧顯示模組
15‧‧‧發光單元
16‧‧‧操作電腦
17‧‧‧滑軌
20‧‧‧待測物1‧‧‧Optical inspection device
10‧‧‧Testing station
101‧‧‧First trench
1011‧‧‧ first air hole
102‧‧‧Second trench
1021‧‧‧second vent
103‧‧‧Place plane
11‧‧‧Exhaust module
12‧‧‧ camera module
13‧‧‧Light source module
14‧‧‧Display module
15‧‧‧Lighting unit
16‧‧‧Operating computer
17‧‧‧Slide rails
20‧‧‧Test object
第1圖 係為本創作檢測台之示意圖。
第2圖 係為本創作光學檢測裝置之第一實施例之第一示意圖。
第3圖 係為本創作光學檢測裝置之第一實施例之第二示意圖。
第4圖 係為本創作光學檢測裝置之第一實施例之第三示意圖。
第5圖 係為本創作光學檢測裝置之第一實施例之第四示意圖。
第6圖 係為本創作光學檢測裝置之第二實施例之示意圖。The first picture is a schematic diagram of the creation test station.
Figure 2 is a first schematic view of the first embodiment of the inventive optical detecting device.
Figure 3 is a second schematic view of the first embodiment of the present optical detecting device.
Figure 4 is a third schematic view of the first embodiment of the present optical detecting device.
Figure 5 is a fourth schematic view of the first embodiment of the present optical detecting device.
Fig. 6 is a schematic view showing a second embodiment of the present optical detecting device.
為利 貴審查委員瞭解本創作之技術特徵、內容與優點及其所能達成之功效，茲將本創作配合附圖，並以實施例之表達形式詳細說明如下，而其中所使用之圖式，其主旨僅為示意及輔助說明之用，未必為本創作實施後之真實比例與精準配置，故不應就所附之圖式的比例與配置關係解讀、侷限本創作於實際實施上的權利範圍，合先敘明。In order to understand the technical characteristics, content and advantages of the creation and the effects that can be achieved, the author will use the creation of the drawings in detail with reference to the drawings, and the drawings used therein, The subject matter is only for the purpose of illustration and supplementary explanation. It is not necessarily the true proportion and precise configuration after the implementation of the original creation. Therefore, the scope and configuration relationship of the attached drawings should not be interpreted or limited. First described.
為使本創作之上述目的、特徵和優點能更明顯易懂，下文依本創作之檢測台及其光學檢測裝置，特舉較佳實施例，並配合所附相關圖式，作詳細說明如下，其中相同的元件將以相同的元件符號加以說明。In order to make the above objects, features and advantages of the present invention more obvious and easy to understand, the following description of the test stand and its optical detecting device according to the present invention will be described in detail with reference to the accompanying drawings. The same elements will be described with the same element symbols.
請參閱第1圖，其係為本創作之檢測台之示意圖。如圖所示，檢測台10包含：一第一溝槽101及一第二溝槽102。其中，檢測台10係為透明結構(例如玻璃或壓克力)。第一溝槽101連接第一氣孔1011。第二溝槽102連接第二氣孔1021。檢測台10具有一放置平面103，以提供一平面放置一待測物20。其中，待測物20可以是軟式印刷電路板、硬式印刷電路板、軟硬結合式之印刷電路板或是銀漿薄膜。第一氣孔1011及第二氣孔1021分別連接至一抽氣模組11。其中抽氣模組11可以是真空幫浦。當待測物20放置於放置平面103時，藉由抽氣模組11利用第一溝槽101與第一氣孔1011及第二溝槽102與第二氣孔1021，將待測物20及檢測台10間之空氣抽出，以使待測物20確實地平貼於該放置平面103。Please refer to Figure 1, which is a schematic diagram of the test bench of this creation. As shown, the inspection station 10 includes a first trench 101 and a second trench 102. The test station 10 is a transparent structure (for example, glass or acrylic). The first groove 101 is connected to the first air hole 1011. The second groove 102 is connected to the second air hole 1021. The inspection station 10 has a placement plane 103 to provide a test object 20 in a plane. The object to be tested 20 may be a flexible printed circuit board, a hard printed circuit board, a hard and soft printed circuit board or a silver paste film. The first air hole 1011 and the second air hole 1021 are respectively connected to an air suction module 11 . The pumping module 11 can be a vacuum pump. When the object to be tested 20 is placed on the placement plane 103, the object to be tested 20 and the detection station are used by the pumping module 11 by using the first groove 101 and the first air hole 1011 and the second groove 102 and the second air hole 1021. The air of 10 is drawn out so that the object to be tested 20 is surely leveled on the placement plane 103.
請參閱第2圖至第5圖。第2圖係為本創作之光學檢測裝置之第一實施例之第一示意圖；第3圖係為本創作之光學檢測裝置之第一實施例之第二示意圖；第4圖係為本創作之光學檢測裝置之第一實施例之第三示意圖；第5圖係為本創作之光學檢測裝置之第一實施例之第四示意圖。如第2圖及第3圖所示，光學檢測裝置1係應用於檢測一待測物20，於本實施例中，待測物20係以軟式印刷電路板作為示範態樣，但不以此為限。光學檢測裝置1包含：一檢測台10、一抽氣模組11、攝像模組12及一光源模組13。檢測台10可以為一透光結構(如強化玻璃或壓克力)。檢測台10包含一第一溝槽101及一第二溝槽102。其中第一溝槽101及第二溝槽102可以是V形槽、梯形槽、方形槽或半圓槽(如第4圖之(a)、(b)、(c)及(d)所示)，可依據實際需求加以選擇，並不以此為限。第一溝槽101連接一第一氣孔1011，第二溝槽102連接一第二氣孔1021，且第一氣孔1011與第二氣孔1021分別連接至抽氣模組11。攝像模組12對應放置平面103設置於檢測台10之一側。其中攝像模組12可包含鏡頭、感光元件如面型感光元件（Area CCD）、線型感光元件（Line Scan CCD）、類比/數位電路、影像處理器等。光源模組13對應放置平面103設置於檢測台10之一側。其中光源模組13可以是高亮度發光二極體(Light-Emitting Diode, LED)或白熾燈，可依實際需求加以置換。Please refer to Figures 2 to 5. 2 is a first schematic view of a first embodiment of the optical detecting device of the present invention; FIG. 3 is a second schematic view of the first embodiment of the optical detecting device of the present invention; A third schematic view of the first embodiment of the optical detecting device; FIG. 5 is a fourth schematic view of the first embodiment of the optical detecting device of the present invention. As shown in FIG. 2 and FIG. 3, the optical detecting device 1 is applied to detect an object to be tested 20. In the embodiment, the object to be tested 20 is a flexible printed circuit board as an exemplary embodiment, but not Limited. The optical detecting device 1 includes a detecting station 10, an air extracting module 11, a camera module 12, and a light source module 13. The inspection station 10 can be a light transmissive structure (such as tempered glass or acrylic). The inspection station 10 includes a first trench 101 and a second trench 102. The first trench 101 and the second trench 102 may be V-shaped grooves, trapezoidal grooves, square grooves or semi-circular grooves (as shown in (a), (b), (c) and (d) of FIG. 4) , can be selected according to actual needs, not limited to this. The first groove 101 is connected to a first air hole 1011, the second groove 102 is connected to a second air hole 1021, and the first air hole 1011 and the second air hole 1021 are respectively connected to the air suction module 11. The camera module 12 is disposed on one side of the detection table 10 corresponding to the placement plane 103. The camera module 12 can include a lens, a photosensitive element such as an area CCD, a line scan CCD, an analog/digital circuit, an image processor, and the like. The light source module 13 is disposed on one side of the detection table 10 corresponding to the placement plane 103. The light source module 13 can be a high-brightness light-emitting diode (LED) or an incandescent lamp, which can be replaced according to actual needs.
值得注意的是，於本實施例中第二氣孔1021（如第2圖所示）係設置於第一溝槽101與第二溝槽102之間，以利於避免第二氣孔1021設置於第二溝槽102的內側，可能對檢測造成的干擾，然而，在實際運用中，對應於待測物20的不同，第二氣孔1021亦可設置於第二溝槽102之內側或其他適當處，故應不以此作為局限。It should be noted that in the embodiment, the second air hole 1021 (shown in FIG. 2 ) is disposed between the first trench 101 and the second trench 102 to prevent the second air hole 1021 from being disposed in the second hole. The inner side of the trench 102 may interfere with the detection. However, in actual use, the second air hole 1021 may be disposed inside the second trench 102 or other suitable location corresponding to the object 20 to be tested. Should not be used as a limitation.
當待測物20放置於放置平面103時，藉由抽氣模組11透過第一氣孔1011及第二氣孔1021，以抽出第一溝槽101及第二溝槽102內之空氣，此時，待測物20與檢測台10間之空氣亦逐漸的流向第一溝槽101及第二溝槽102並被抽出。當第一氣孔1011與第一溝槽101間及第二氣孔1021與第二溝槽102間之空氣被大量抽出後，使得第一氣孔1011至第一溝槽101與第二氣孔1021至第二溝槽102產生一吸力，進而使得待測物20被吸附且確實地平貼於檢測台10。換言之，當待測物20放置於檢測台10時，待測物20與放置平面103間會有些許之空氣。為使待測物20確實地平貼於放置平面103，可藉由抽氣模組11透過第一氣孔1011，先將待測物20與第一溝槽101及其所包含之範圍與外界空氣阻隔，再透過第二氣孔1021，將待測物20與放置平面103內之空氣抽出，以使待測物20確實地達到平貼於放置平面103之目的。需注意的是，第一氣孔1011及第二氣孔1021可以是分別連接抽氣模組11，進而利用第一溝槽101及第二溝槽102，使待測物20與檢測台10間產生負壓，以使待測物20平貼於放置平面103，此僅為其中一實施態樣，在實際應用中可依需求加以選擇不同之吸附方式。When the object to be tested 20 is placed on the placement plane 103, the first air hole 1011 and the second air hole 1021 are transmitted through the air suction module 11 to extract the air in the first groove 101 and the second groove 102. The air between the test object 20 and the test stand 10 also gradually flows toward the first trench 101 and the second trench 102 and is extracted. After the air between the first air hole 1011 and the first groove 101 and between the second air hole 1021 and the second groove 102 is largely extracted, the first air hole 1011 to the first air groove 101 and the second air hole 1021 to the second The groove 102 generates a suction force, so that the object to be tested 20 is adsorbed and surely affixed to the inspection table 10. In other words, when the object to be tested 20 is placed on the inspection table 10, there is a slight amount of air between the object to be tested 20 and the placement plane 103. In order to ensure that the object to be tested 20 is correctly affixed to the placement plane 103, the object to be tested 20 and the first groove 101 and the range thereof are firstly blocked from the outside air by the air suction module 11 through the first air hole 1011. Then, through the second air hole 1021, the air to be tested 20 and the air in the placement plane 103 are extracted, so that the object to be tested 20 is surely flattened to the placement plane 103. It should be noted that the first air hole 1011 and the second air hole 1021 may be respectively connected to the air suction module 11 , and then the first groove 101 and the second groove 102 are used to generate a negative between the object to be tested 20 and the detection station 10 . The pressure is applied to make the object to be tested 20 flat on the placement plane 103. This is only one embodiment. In practical applications, different adsorption modes can be selected according to requirements.
如第5圖所示，光學檢測裝置1具有一檢測台10，且檢測台10為一透光結構。檢測台10具有一放置平面103，以提供使用者放置一待測物20；且放置平面103具有一第一溝槽101及一第二溝槽102。第一溝槽101及第二溝槽102分別連接一第一氣孔1011及一第二氣孔1021。第一氣孔1011及第二氣孔1021分別連接至一抽氣模組11。檢測台10之上方設有一攝像模組12，以對放置於放置平面103之待測物20進行攝像檢測；檢測台10之下方設有一光源模組13。藉由檢測台10之透光性質，光源模組13所產生之光線可以投射至待測物20，以提供攝像模組12拍攝時所需之光源。As shown in Fig. 5, the optical detecting device 1 has a detecting station 10, and the detecting table 10 is a light transmitting structure. The test station 10 has a placement plane 103 for the user to place a test object 20; and the placement plane 103 has a first trench 101 and a second trench 102. The first trench 101 and the second trench 102 are respectively connected to a first air hole 1011 and a second air hole 1021. The first air hole 1011 and the second air hole 1021 are respectively connected to an air suction module 11 . A camera module 12 is disposed above the detecting platform 10 for detecting the image of the object to be tested 20 placed on the placement plane 103. A light source module 13 is disposed below the detecting platform 10. By detecting the light transmission property of the stage 10, the light generated by the light source module 13 can be projected onto the object to be tested 20 to provide a light source required for the camera module 12 to shoot.
當攝像模組12對待測物20進行攝像檢測時，若待測物20與檢測台10間具有空氣或待測物20本身具有撓曲現象時，則會使待測物20表面凹凸不平，進而造成攝像模組12對待測物20表面進行攝像時，在待測物20具有高低差距處(凸起處、凹陷處或是撓曲處)，所得到之影像不清晰。故，當待測物20放置於放置平面103時，先利用抽氣模組11，透過第一氣孔1011及第二氣孔1021，以使第一溝槽101及第二溝槽102產生吸力，進而將待測物20及檢測台10間之空氣抽出，以使待測物20平貼於放置平面103，此時再利用光源模組13，由檢測台10之下方向放置平面103投射光線，以提供攝像模組12所需之光源，進而對待測物20進行攝像檢測。其中光學檢測裝置1可設有一顯示模組14，顯示模組14電性連接攝像模組12，以顯示攝像模組12所拍攝之影像。具體地說，假設欲檢測軟性電路板(待測物20)之導線是否有缺陷時，可將其放置於檢測台10，先利用抽氣模組11使軟性電路板平貼於放置平面103，再利用檢測台10之透光性質，使光源模組13產生之光線投射至軟性電路板，進而可藉由導線不透光之特性，檢測出軟性電路板導線之缺陷處。When the camera module 12 performs image detection on the object to be tested 20, if the air between the object to be tested 20 and the test table 10 or the object to be tested 20 itself has a deflection phenomenon, the surface of the object to be tested 20 may be uneven. When the camera module 12 is to be imaged on the surface of the object to be tested 20, the image to be tested 20 has a height difference (protrusion, depression, or deflection), and the obtained image is not clear. Therefore, when the object to be tested 20 is placed on the placement plane 103, the first air hole 1011 and the second air hole 1021 are firstly transmitted through the air suction module 11 to cause the first groove 101 and the second groove 102 to generate suction force. The air between the object to be tested 20 and the test station 10 is extracted, so that the object to be tested 20 is flatly attached to the placement plane 103. At this time, the light source module 13 is used, and the light is projected from the lower plane 103 of the detection table 10 to The light source required by the camera module 12 is provided, and the object to be tested 20 is image-detected. The optical detecting device 1 can be provided with a display module 14 , and the display module 14 is electrically connected to the camera module 12 to display the image captured by the camera module 12 . Specifically, if it is determined that the wire of the flexible circuit board (the object to be tested 20) is defective, it can be placed on the inspection table 10, and the flexible circuit board is first flattened on the placement plane 103 by using the air suction module 11. The light-transmitting property of the detecting station 10 is utilized to cause the light generated by the light source module 13 to be projected onto the flexible circuit board, thereby detecting the defects of the flexible circuit board wires by the opaque characteristics of the wires.
請參閱第6圖，其係為本創作之光學檢測裝置之第二實施例之示意圖。如圖所示，光學檢測裝置1包含：一檢測台10、一抽氣模組11、一攝像模組12、一光源模組13及一操作電腦16。檢測台10具有一放置平面103，以供使用者放置一待測物20，且檢測台10具有一第一溝槽101及一第二溝槽102。第一溝槽101連接一第一氣孔1011，第二溝槽102連接一第二氣孔1021，且第一氣孔1011及第二氣孔1021可以是相互連通後再連接至抽氣模組11，或可以是分別連接至抽氣模組11。抽氣模組11設置於檢測台10下方，且連接第一氣孔1011及第二氣孔1021。攝像模組12設置於檢測台10之上方，且攝像模組12設置於一滑軌17。其中可於檢測台10之上方增設一發光單元15，以使光學檢測裝置1，可利用發光單元15對待測物20進行表面檢測。於本實施例中，光學檢測裝置1之相關連接或作動關係，與上述類似，在此為了簡略說明便不再敘述。Please refer to FIG. 6, which is a schematic diagram of a second embodiment of the optical detecting device of the present invention. As shown in the figure, the optical detecting device 1 includes a detecting station 10, a pumping module 11, a camera module 12, a light source module 13, and an operating computer 16. The inspection station 10 has a placement plane 103 for the user to place a test object 20, and the inspection station 10 has a first trench 101 and a second trench 102. The first groove 101 is connected to a first air hole 1011, and the second groove 102 is connected to a second air hole 1011, and the first air hole 1011 and the second air hole 1011 may be connected to each other and then connected to the air suction module 11, or They are connected to the pumping module 11 respectively. The air suction module 11 is disposed below the detection platform 10 and connects the first air hole 1011 and the second air hole 1021. The camera module 12 is disposed above the detection platform 10 , and the camera module 12 is disposed on a slide rail 17 . A light emitting unit 15 may be added above the detecting station 10 to enable the optical detecting device 1 to perform surface detection on the object to be tested 20 by using the light emitting unit 15. In the present embodiment, the related connection or actuation relationship of the optical detecting device 1 is similar to the above, and will not be described here for the sake of brevity.
值得一提的是，使用者將一待測物20放置於放置平面103後，可藉由抽氣模組11透過第一氣孔1011、第一溝槽101、第二氣孔1021及第二溝槽102，將待測物20與檢測台10間之空氣抽出，以使待測物20平貼於放置平面103。當待測物20平貼於放置平面103後，藉由光源模組13由檢測台10下方投射光線，並利用檢測台10之透光性質，以提供攝像模組12攝像時所需之光源，再藉由攝像模組12對待測物20進行攝像，並將影像呈現於操作電腦16。使用者更可利用發光單元15由待測物20上方投射光線，以進行相關表面檢測。使用者可藉由操作電腦16使攝像模組12於滑軌17上進行位移，以位移至需檢測之位置。It is worth mentioning that after the user places the object to be tested 20 on the placement plane 103, the first air hole 1011, the first groove 101, the second air hole 1021 and the second groove can be transmitted through the air suction module 11. 102. The air between the object to be tested 20 and the detection station 10 is extracted to make the object to be tested 20 flat on the placement plane 103. After the object to be tested 20 is flatly attached to the placement plane 103, the light source module 13 projects light from under the detection platform 10, and utilizes the light transmission property of the detection platform 10 to provide a light source required for imaging by the camera module 12, The object to be tested 20 is imaged by the camera module 12, and the image is presented to the operating computer 16. The user can further use the light-emitting unit 15 to project light from above the object to be tested 20 to perform related surface detection. The user can operate the computer 16 to displace the camera module 12 on the slide rail 17 to be displaced to the position to be detected.
以上所述之實施例僅係為說明本創作之技術思想及特點，其目的在使熟習此項技藝之人士能夠瞭解本創作之內容並據以實施，當不能以之限定本創作之專利範圍，即大凡依本創作所揭示之精神所作之均等變化或修飾，仍應涵蓋在本創作之專利範圍內。The embodiments described above are only for explaining the technical idea and characteristics of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement them according to the scope of the patent. That is, the equivalent changes or modifications made by the people in accordance with the spirit revealed by this creation should still be covered by the scope of the patent of this creation.
10‧‧‧檢測台 10‧‧‧Testing station
101‧‧‧第一溝槽 101‧‧‧First trench
1011‧‧‧第一氣孔 1011‧‧‧ first air hole
102‧‧‧第二溝槽 102‧‧‧Second trench
1021‧‧‧第二氣孔 1021‧‧‧second vent
103‧‧‧放置平面 103‧‧‧Place plane
11‧‧‧抽氣模組 11‧‧‧Exhaust module
20‧‧‧待測物 20‧‧‧Test object
Claims (9)
一第一溝槽，係圍繞設置於該放置平面之週邊，且連接至少一第一氣孔，該至少一第一氣孔連接一抽氣模組；以及
一第二溝槽，係圍繞設置於該放置平面，且位於該第一溝槽之內側，該第二溝槽連接至少一第二氣孔，該至少一第二氣孔連接該抽氣模組；
其中，當該抽氣模組進行作動時，藉由該第一溝槽及該第二溝槽，而將該待測物與該檢測台間之空氣抽出，進而使該待測物平貼於該放置平面。A test station is a light transmissive structure applied to an optical detecting device and has a placement plane to provide a test object placement, which comprises:
a first groove is disposed around the periphery of the placement plane, and is connected to at least one first air hole, the at least one first air hole is connected to a suction module; and a second groove is disposed around the placement a plane is located on the inner side of the first trench, the second trench is connected to the at least one second air hole, and the at least one second air hole is connected to the air suction module;
Wherein, when the air suction module is actuated, the air between the object to be tested and the detection station is extracted by the first groove and the second groove, so that the object to be tested is flatly attached to This placement plane.
一檢測台，係為一透光結構，其具有一放置平面以提供一待測物放置，其包含：
一第一溝槽，係圍繞設置於該放置平面之週邊，且連接至少一第一氣孔；
一第二溝槽，係圍繞設置於該放置平面，且位於該第一溝槽之內側，該第二溝槽連接至少一第二氣孔；
一攝像模組，係對應該放置平面設置於該檢測台之一側，以對該待測物進行檢測；
至少一光源模組，係提供該攝像模組檢測該待測物時所需之光源；以及
一抽氣模組，係連接該至少一第一氣孔及該至少一第二氣孔；
其中，當該抽氣模組作動時，藉由該第一溝槽及該第二溝槽，而將該待測物與該檢測台間之空氣抽出，進而使該待測物平貼於該放置平面，以使該攝像模組進行檢測動作。An optical detecting device comprising:
A test station is a light transmissive structure having a placement plane to provide a test object placement, comprising:
a first groove is disposed around the periphery of the placement plane and connected to the at least one first air hole;
a second trench is disposed around the placement plane and located inside the first trench, the second trench connecting at least a second air hole;
a camera module is disposed on a side of the test bench corresponding to a plane to detect the object to be tested;
The at least one light source module is configured to provide a light source required for the camera module to detect the object to be tested; and a pumping module connecting the at least one first air hole and the at least one second air hole;
When the air suction module is actuated, the air between the object to be tested and the detection station is extracted by the first groove and the second groove, so that the object to be tested is flatly attached thereto. A plane is placed to enable the camera module to perform a detection action.
The optical detecting device of claim 5, wherein the first groove and the second groove are surrounded by a shape corresponding to the object to be tested.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102215278U TWM470948U (en) | 2013-08-14 | 2013-08-14 | Inspection stage and optical inspection apparatus |
| CN201320552968.6U CN203551476U (en) | 2013-08-14 | 2013-09-06 | Detection table and optical detection device thereof |
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| TW102215278U TWM470948U (en) | 2013-08-14 | 2013-08-14 | Inspection stage and optical inspection apparatus |
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| TWI529380B (en) * | 2013-12-31 | 2016-04-11 | 玉晶光電股份有限公司 | Optical auxiliary measuring device and measuring method for applying the same |
| CN104914113B (en) * | 2015-05-18 | 2019-03-08 | 东莞市威力固电路板设备有限公司 | Printed circuit board automatic optical detection method |
| CN106441093A (en) * | 2016-09-07 | 2017-02-22 | 齐泰兴精工科技（苏州）有限公司 | Automobile component hole position verification device |
| CN106501276B (en) * | 2016-10-17 | 2019-03-12 | 安徽华东光电产业研究院有限公司 | Apply the device and method of pressure in optical detection to FPD screen back light source |
| CN107917913A (en) * | 2017-11-16 | 2018-04-17 | 南京日托光伏科技股份有限公司 | A kind of detection method of MWT photovoltaic modulies conduction core plate |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4K | Annulment or lapse of a utility model due to non-payment of fees |