M318300 八、新型說明： 【新型所屬之技術領域】 '本創作系關於一種組裝電路板測試治具，尤指一種可提升為進階的ATE測 試真空治具之電路板測試治具，可運用於組裝電路板相對需要之測試治具，該 底針盤固定於治具鋁框架上，利用該針盤線性轴承、對位導柱與該組合針盤做 活動式結合，兩者之間以該緩衝彈簧間隔著，藉由其上、下治具的設計，搭配 行成一套可氣密的架構，而其零組件之材料主要為玻織板、電木、鋁合金、泡 Φ 棉等’驅使良性檢測更為精細而準確，並將治具提升為進階的ate測試真空治 具，同時排除尚未測試時電源意外損壞待測板並有效抑制雜訊及干擾，提升測 試穩定性，進而增加整體測試效能。 【先前技術】 所謂TestJet為檢查SMD 1C是否空焊或冷焊的測試方法，由HP所研發， 將SMD 1C感測板貼近SMD 1C以感應焊接良好與否，當焊接不良時，ic引腳會 產生些微的電容量變化，而以此來判斷SMD 1C良性。 傳統原TestJet的安裝模式（如第一圖所示）是以兩根探針A1(—端為信號 鲁1，一端為地-)，焊接在SMT 1C感測板A3上作為偵測SMD 1C良性之用，當待 ，測1C感測板A3所占面積過大時，則須在左右增加兩支彈簧探針A2作為輔助， 以避免感測板A3搖晃，然，以此結構所成之感測板A3，在測試時，常常因為治 具密合或張開的動作，而隨著彈簧探針A2而伸縮，所以感測板A3還是會有搖 晃不穩定，以及兩根探針A1無法非常密貼於待測1C的表面，而造成測試結果 的不穩定的缺憾存在。 因此，如何解決此種習知配置運用不夠周詳嚴格所造成的不方便、不易實 用之困擾’即是待解決的問題。 M318300 【新型内容】 鑒於上述習知麟所造紅賴，本創作㈣習知麟之發展出一種 .組裝電路板測試治具，其主要目的在於避免感測板產生搖晃，且驅使良性檢測 更為精細而準確，並將治具提升為進階的ATE測試真空治具，進而增加整 試效能。 本創作之另-目的在於可排除尚未測試時電源意外損壞待測板，並有效抑 制雜訊及干擾，提升測試之穩定性。 為達到上述及其它目的，本創作-種組裝電路板測試治具，義於組裝電 路板相對需要之測試治具，尤指一種可提升為進階的舰測試真空治具之電路 ，板測試治具，該測試治具至少包括底針盤，該底針_定於治具_架上，·組 合針盤，該組合針盤由數層厚度㈣或不—的玻纖板，以適當間隔關組成而 各層玻纖板透過高猶的GN(:祕機逐層鑽孔；—針麟_承，該針盤線性 轴承及其對位導柱將該底雜、與該組合針盤做成輯式結合，導引組合針盤 及底針盤職時能舰直準確的密合；_上、下治麟性軸承，該上、下治具 雜及賊轉柱㈣上、下治具于職時可㈣至能齡直準確的密 合，一緩衝彈簧，該緩衝彈簧置設於該底針盤與該組合針盤之間，驅使兩者之 間以該緩衝彈簧間隔著；彈簧探針，該彈簧探針植入於該底針盤内；剛性探針， 該剛性，針合針麟鑽之孔湖；_氣密_，該__泡綿搭 配-塾高以麵複合針盤高度之電木框架，使上下治具可形成密閉空間， 響時以形成真空效果。 、該針盤棒性軸承及其對位導柱在測試時，可導引組合針盤及底針盤能夠垂 直準確的密合，並藉由一氣密罩封閉針盤線性軸承一方的開口，使其達到氣密 的效果。 、 ,該緩衝彈簧于測試時，在壓縮狀態下可提供治具密合時的緩衝，停止測試 後’在舒張狀態時，可以使剛性探針下沉而離開待測電路板並分離剛性探針及 彈黃探針’使其不接觸。 ，該兩種泡棉為壓縮率可達80%以上的軟性材質，其作用為測試時使上下治具 形成一密閉空間，當治具内部空氣被抽走時，由外部的大氣壓力壓迫上下治具 密合而得以測試，並具有下壓時緩衝之功用。 α /、 另外，本創作藉由其上、下治具的設計，搭配行成一套可氣密的架構，而 6 M318300 其零組件之材料主要為玻纖板、電木、鋁合金、泡棉等，驅使良性檢測更為精 細而準確，並將治具提升為進階的ATE測試真空治具，同時排除尚未測試時電 源意外損壞待測板並有效抑制雜訊及干擾，提升測試穩定性，進而增加整體測 試效能。 【實施方式】 以下系藉由特定的具體實例說明搭配本創作之實施方式，熟悉此技藝之人 士可由本說明書所揭示之内容輕易地瞭解本創作之其他優點與功效。本創作亦 可藉由其他不同的具體實例加以施杆或應用，本說明書中的各項細節亦可基於 不同觀點與應用，在不悖離本創作之精神下進行各種修飾與變更。 首先請貴審查委員參閱如第二、第三、第四、第五與第六圖所示者，本 案一種組裝電路板測試治具，主要是以上、下治具91、92模式成形，其構件包 括： ' 下治具92，系可分成底針盤920及組合針盤922，底針盤920植入套管721 後，再插上彈簧針720，並提供彈簧針72〇可壓縮的行程，及保護彈簧針72〇不 會過壓，而組合針盤922主要系由數層厚度相同或不一的玻纖板(FR4)，以適當 間隔隔開組成’各層透過高精密的CNC鑽孔機逐層鑽孔，用以植入剛性探針 及剛性探針71，而達成測試之目的；M318300 VIII. New Description: [New Technology Field] 'This creation is about a test board for assembling circuit boards, especially a circuit board test fixture that can be upgraded to advanced ATE test vacuum fixtures. It can be applied to A test fixture is assembled on the opposite side of the test fixture. The bottom dial is fixed on the aluminum frame of the jig, and the linear bearing of the dial and the alignment guide post are movably combined with the combined dial. The springs are spaced apart, and the design of the upper and lower fixtures is combined to form a set of airtight structures, and the materials of the components are mainly glass woven boards, bakelite, aluminum alloys, foam Φ cotton, etc. The detection is more precise and accurate, and the fixture is upgraded to an advanced ate test vacuum fixture, and the power supply accidentally damages the board to be tested and effectively suppresses noise and interference, improves test stability, and further increases the overall test. efficacy. [Prior Art] TestJet is a test method for checking whether SMD 1C is welded or cold welded. It is developed by HP. The SMD 1C sensor board is close to SMD 1C to sense whether the soldering is good or not. When the soldering is poor, the ic pin will be A slight change in capacitance is produced to determine the benignity of SMD 1C. The traditional original TestJet installation mode (as shown in the first figure) is based on two probes A1 (the end is the signal Lu 1 and the end is the ground -), and is soldered on the SMT 1C sensing board A3 as the detection SMD 1C benign For use, when the area occupied by the 1C sensing board A3 is too large, two spring probes A2 must be added to the left and right as an aid to avoid the shaking of the sensing board A3. However, the sensing is formed by the structure. The plate A3, in the test, often telescopes with the spring probe A2 due to the fitting or opening action of the jig, so the sensing plate A3 is still unstable, and the two probes A1 cannot be very dense. It is attached to the surface of the 1C to be tested, and the unstable defect of the test result exists. Therefore, how to solve the inconvenience and difficulty of practical use caused by such a complicated configuration is not a problem to be solved. M318300 [New Content] In view of the above-mentioned novels created by Xizhilin, this creation (4) Xizhi Lin developed a kind of assembled circuit board test fixture, whose main purpose is to avoid the shaking of the sensing board and to drive the benign detection to be more precise and accurate. The jig is upgraded to an advanced ATE test vacuum fixture, which increases the overall test efficiency. Another purpose of this creation is to eliminate the power supply accidentally damaging the board to be tested when not tested, and to effectively suppress noise and interference, and improve the stability of the test. In order to achieve the above and other purposes, the present invention-assembled circuit board test fixture is suitable for assembling test boards with relatively required test fixtures, especially a circuit that can be upgraded to advanced ship test vacuum fixtures. The test fixture comprises at least a bottom needle plate, which is set on the fixture_frame, and a combination dial, which is closed by a plurality of layers (four) or not - of the fiberglass board at appropriate intervals. The GG of each layer is passed through the high-heavy GN (the secret machine is drilled layer by layer; the needle-necked _ bearing, the dial linear bearing and its alignment guide post make the bottom miscellaneous, and the combined dial Combined, guiding the combination dial and the bottom needle to be able to directly and accurately close the ship; _ upper and lower ruled bearing, the upper and lower ruled and the thief turn column (four) upper and lower fixtures (4) to a straight and accurate closeness of the energy age, a buffer spring disposed between the bottom dial and the combined dial to drive the buffer springs therebetween; the spring probe, The spring probe is implanted in the bottom dial; a rigid probe, the rigid, needle-punched hole lake; _ airtight _, the __ The bakelite is matched with the bakelite frame with the height of the composite dial, so that the upper and lower jigs can form a confined space, and the vacuum effect is formed when the needle is mounted. When the pin bearing and its alignment guide are tested, The combined dial and the bottom dial can be vertically and accurately adhered, and an airtight cover closes the opening of one side of the linear bearing of the dial to achieve an airtight effect. The buffer spring is tested. In the compressed state, the buffer can be provided when the jig is tight. After the test is stopped, in the diastolic state, the rigid probe can be sunk away from the circuit board to be tested and the rigid probe and the yellow probe can be separated from each other. The two types of foams are soft materials with a compression ratio of 80% or more. The function of the two foams is to form a closed space for the upper and lower fixtures. When the air inside the fixture is removed, the external atmospheric pressure is pressed up and down. The fixture is tested and sealed, and has the function of buffering when pressed. α /, In addition, this creation is designed with a set of airtight structures by its upper and lower fixtures, while 6 M318300 has zero The material of the component is mainly glass Fiberboard, bakelite, aluminum alloy, foam, etc., drive the benign detection to be more precise and accurate, and upgrade the fixture to an advanced ATE test vacuum fixture, while eliminating the power supply accidentally damaging the board to be tested and not effective when not tested. Suppresses noise and interference, improves test stability, and increases overall test performance. [Embodiment] The following is a specific example to illustrate the implementation of this creation, and those skilled in the art can easily disclose the contents disclosed in this specification. Understand the other advantages and functions of this creation. This creation can also be applied or applied by other specific examples. The details in this manual can also be based on different viewpoints and applications, without departing from the spirit of this creation. Various modifications and changes are made below. First, please refer to the review committee as shown in the second, third, fourth, fifth and sixth figures. In this case, a test board assembly jig is mainly used for the above and lower fixtures 91. 92-formed, the components include: 'The lower fixture 92 can be divided into a bottom dial 920 and a combined dial 922. After the bottom dial 920 is implanted into the sleeve 721, the insert is inserted. The spring pin 720 provides a spring pin 72 〇 compressible stroke and protects the spring pin 72 from overpressure, and the combined dial 922 is mainly composed of several layers of the same or different thickness of the fiberglass (FR4). The layers are appropriately spaced apart to form a layer-by-layer drilling through a high-precision CNC drilling machine for implanting rigid probes and rigid probes 71 for testing purposes;
上治具91 ,其組合針盤912因為考慮TestJet安裝，而將原來下治具組合 針盤922其中三片的組合改為一片，其餘各層架構均與下治具犯相同； •針舰性滅24及其齡雜25、螺母26，主要纟可將上、下治具9卜 92的底針盤910、920與組合針盤912、922做成活動式結合，而于測試時，可 導引組合健及底針盤賴垂直準確的密合，並齡—氣 轴承24—方的開口，使其達到氣密的效果· -上、下治具線性轴承20及其對位導柱2卜内六角螺絲22，可將該上、 下治具91、92于測試時導引至能夠垂直準確的密合，並 下治具線錄承20-方賴口，使其達職賴效果；封閉上 真空Γ緖供測賴或㈣抽氣時所需的孔洞，以達到治具9内部形成 -緩衝彈簧6，置設於底針盤91G、92G與組 者之間以該緩衝彈簧6間隔著，該键徐· β•祕肉 緩衝彈簧6于測试時，在壓縮狀態下可提供 7 M318300 治具密合時的緩衝，停賴試後，在舒張狀麟，可以使剛性探針7G、71下沉 而離開待測電频8並分離職麟7()、71及探針，使其不接觸； /剛性探針70，系以高剛性高硬度的鋼材製成(如琴鋼線；涨4)，其尖端以銳 角幵>/成用以接觸待測電路板的焊點或導通孔，其尾端測試時接觸到彈簧探針 72，而將電路板8 _健傳遞至職機，完雜號舰，如此謂以測試，· 剛性探針71，系釆針頭710與針身711分離組合式，針頭710材質是高剛 ，高硬度的鋼材(如琴鋼線；SK4)，針身711材質為破銅，中空管狀，針頭710 可以植入針身711内，形成一完整探針71，用以接觸待測電路板DIP的零件腳,· 彈簧探針72，具一彈簧針720與套管72卜套管721經氣密處理，當套管 21敲入底針盤91〇、920底板後，可達到氣密效果，套管72ι内植入彈筹針72〇 形成一體而成為彈簧探針72 ; ’ 兩種，密泡棉3卜32，主要系以壓縮率可達_以上的軟性材質製成，其 =用=試時使上、下治具9卜92形成—密閉空間，當治具9内部空氣被抽走 成部的大氣壓力驗上下治具密合崎關試，並具有下騎緩衝之功 用； #7Π薄1棉95 ’主要以厚度為111〜1,0麵的軟性材質製成，用以固定剛性探 針70、ρ，當組合針盤取出時，剛性探針7〇、71便不致掉落。 S查委員參閲如六圖搭配前圖所示；本創作—種組裝電路 tii具i如ϊ二圖所示）藉由讓Test;et的ic感測板8峽住，使其無晃 _丨ί算出Ic的高度，在需要安裝的位置上利用高精度的*加工機 而金人^ 度’在把感敵8安裝固定住，即可達成測試時與制ic的表 面密合並且完全不晃動的效果； 、人it第六圖所表現者，即在於將Testjet安裝方式運用在真空框架下的 梢;广奶你-測试時，先用測試機或幫浦於抽氣孔4内抽出氣體，加以氣密泡 密罩3的密封效果，以制治具9内部形成真空之狀態，而此時 斜51缝_尾部1彈魏針72規定行糊壓轉絲針72，使彈簧探 針頭梢囉探針尾端緊密接觸，達_試域正確傳輸的效果； 忉二臟出一上治具轉接撕之觀念，其實就是彈簧針™及套管 再轉^丨心針7卜因此而可將上治具91所測試到的信號轉接至下治具92， 再轉讀上，以絲上治具91職信號_遞，而完成整體_試流程。 罐例示性綱本創作之原理及其功效，及其部分運用 例’而非胁關捕作之界定。任何㈣之人 M318300 。因此，本創作之權利保護 1之精神及範疇下，對上述實施例進行修飾與改變 範圍，應如後述之申請專利範圍所列。 、 【圖式簡單說明】 第一圖是傳統的TestJet安裝方式。 第二圖是新的TestJet安裝方式（也即是第六、七圖的編號 圖）。 ^之局部放大 .第三圖是第六、七圖中的部分零件結構圖。 第四圖是剛性探針71的局部放大圖。 第五圖是彈簧探針的局部放大圖。 第六圖是真空複合式組裝電路板測試治具待測時的組裝圖。 第七圖是真空複合式組裝電路板測試治具測試時的組裝圖。 【主要元件符號說明】 上、下治具線性軸承20 對位導柱21 内六角螺絲22 針盤線性轴承24 對位導柱25 螺母26 氣密罩3 兩種氣密泡棉31、32 抽氣孔4 緩衝彈簧6 剛性探針70 剛性探針71 剛性探針針頭710 剛性探針針身711 彈簧探針72 彈簧針720 套管721 M318300 電路板8 治具9 上治具91 上治具底針盤910 上治具組合針盤912 下治具92 下治具底針盤920 下治具組合針盤922 薄泡棉95The upper jig 91, the combination dial 912 is changed to the TestJet installation, and the combination of the three pieces of the original lower fixture combination 922 is changed into one piece, and the other layers are the same as the lower fixture; 24 and its age miscellaneous 25, nut 26, the main 纟 can be the upper and lower fixture 9 92 92, the bottom dial 910, 920 and the combination dial 912, 922 into a movable combination, and can be guided during the test The combination of the health and the bottom plate is perpendicular to the exact tightness, and the opening of the age-air bearing 24-square makes it achieve the airtight effect. - The upper and lower fixtures are linear bearings 20 and their alignment guides 2 The hexagonal screw 22 can guide the upper and lower jigs 91 and 92 to the vertical and accurate closeness during the test, and the lower line of the ruler is recorded to the 20-square slab, so that the effect is achieved; The vacuum is used to measure or (4) the holes required for pumping to achieve the internal formation of the jig 9 - the buffer spring 6, which is disposed between the bottom dials 91G, 92G and the group by the buffer spring 6, The key Xu·β• Secret Meat Buffer Spring 6 can provide 7 M318300 cushioning when it is compressed under test. In the diastolic lining, the rigid probes 7G, 71 can be sunk away from the electrical frequency 8 to be tested and the occupational lining 7(), 71 and the probe can be separated from contact; the rigid probe 70 is high Made of rigid high-hardness steel (such as steel wire; up 4), its tip is at an acute angle 幵>/ into contact with the solder joint or via hole of the board to be tested, and the tail end is tested to contact the spring probe. 72, and the circuit board 8 _ health transfer to the job, the finished ship, so that the test, · rigid probe 71, the 釆 needle 710 and the needle body 711 separate combination, the needle 710 material is high, high Hardness steel (such as piano steel wire; SK4), the needle body 711 is made of broken copper, hollow tubular, the needle 710 can be implanted in the needle body 711 to form a complete probe 71 for contacting the DIP part of the circuit board to be tested. The foot, the spring probe 72, has a spring pin 720 and the sleeve 72 and the sleeve 721 are hermetically treated. When the sleeve 21 is knocked into the bottom plate 91 〇, 920, the airtight effect can be achieved. In 72, the implanted needles 72〇 are integrated into a spring probe 72; 'two kinds of dense foam 3 32, mainly soft materials with a compression ratio of _ or more Made of quality, it = use = test time to make the upper and lower fixtures 9 92 formed - confined space, when the internal air of the fixture 9 is pumped into the Ministry of atmospheric pressure test upper and lower fixtures close the test, and has the next The function of riding cushioning; #7Π薄1棉95' is mainly made of soft material with thickness of 111~1, 0 surface, used to fix rigid probe 70, ρ, rigid probe 7〇 when combined dial is taken out 71 will not fall. The S-chasing committee refers to the six figures as shown in the previous figure; this creation—the assembly circuit tii has the same as shown in Figure 2), by letting the Test; et ic sensing plate 8 glide, so that it does not slosh _丨ί Calculate the height of Ic, use the high-precision* processing machine at the position where it needs to be installed, and the gold person's degree is installed and fixed in the enemy's 8 to achieve the test and the surface of the ic is tight and not at all. The effect of shaking; The person who is shown in the sixth figure is the tip of the testjet installation method under the vacuum frame; the wide milk you-test, first use the test machine or pump to extract the gas in the suction hole 4. The sealing effect of the airtight bulb 3 is used to form a vacuum inside the fixture 9, and at this time, the oblique 51 slit_tail 1 elastic needle 72 defines a paste pressure rotary needle 72 to make the spring probe head The tip end of the tip probe is in close contact, and the effect of the correct transmission of the _ test field is achieved; the concept of the transfer of the upper and lower organs is transferred, and the concept is that the spring needle TM and the sleeve are rotated again. The signal tested by the upper fixture 91 can be transferred to the lower fixture 92, and then read, and the signal is completed on the wire. Body _ trial process. The principle and effectiveness of the canister's exemplary creation, and some of its application examples, rather than the definition of threats. Any (four) person M318300. Therefore, the scope of the modifications and variations of the above embodiments in the spirit and scope of the present invention should be as set forth in the appended claims. [Simplified description of the diagram] The first picture is the traditional TestJet installation method. The second picture shows the new TestJet installation method (that is, the numbering diagrams of the sixth and seventh figures). Partial enlargement of ^. The third figure is a partial part structure diagram in the sixth and seventh figures. The fourth figure is a partial enlarged view of the rigid probe 71. The fifth figure is a partial enlarged view of the spring probe. The sixth figure is an assembled view of the vacuum composite assembled circuit board test fixture to be tested. The seventh figure is an assembly diagram of the vacuum composite assembled circuit board test fixture test. [Main component symbol description] Upper and lower fixture linear bearing 20 Alignment guide post 21 Hexagon socket screw 22 Dial linear bearing 24 Alignment guide post 25 Nut 26 Airtight cover 3 Two kinds of airtight foam 31, 32 Exhaust hole 4 Buffer Spring 6 Rigid Probe 70 Rigid Probe 71 Rigid Probe Needle 710 Rigid Probe Needle Body 711 Spring Probe 72 Spring Needle 720 Sleeve 721 M318300 Circuit Board 8 Fixture 9 Upper Fixture 91 Upper Fixture Bottom Plate 910 upper fixture combination dial 912 lower fixture 92 lower fixture bottom needle 920 lower fixture combination dial 922 thin foam 95