TWI671520B - 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 - Google Patents

光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 Download PDF

Info

Publication number
TWI671520B
TWI671520B TW105102890A TW105102890A TWI671520B TW I671520 B TWI671520 B TW I671520B TW 105102890 A TW105102890 A TW 105102890A TW 105102890 A TW105102890 A TW 105102890A TW I671520 B TWI671520 B TW I671520B
Authority
TW
Taiwan
Prior art keywords
optical film
defect inspection
alignment angle
transmission
film
Prior art date
Application number
TW105102890A
Other languages
English (en)
Chinese (zh)
Other versions
TW201632869A (zh
Inventor
井村圭太
Original Assignee
日商住友化學股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商住友化學股份有限公司 filed Critical 日商住友化學股份有限公司
Publication of TW201632869A publication Critical patent/TW201632869A/zh
Application granted granted Critical
Publication of TWI671520B publication Critical patent/TWI671520B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
TW105102890A 2015-02-03 2016-01-29 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 TWI671520B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-019450 2015-02-03
JP2015019450A JP6437329B2 (ja) 2015-02-03 2015-02-03 光学フィルムの欠陥検査方法

Publications (2)

Publication Number Publication Date
TW201632869A TW201632869A (zh) 2016-09-16
TWI671520B true TWI671520B (zh) 2019-09-11

Family

ID=56563967

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105102890A TWI671520B (zh) 2015-02-03 2016-01-29 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置

Country Status (3)

Country Link
JP (1) JP6437329B2 (ja)
TW (1) TWI671520B (ja)
WO (1) WO2016125616A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106290384B (zh) * 2016-10-21 2018-11-23 江苏理工学院 无刷直流电机控制线路板在线检测识别方法
NL2020361B1 (en) 2018-01-31 2019-08-07 Airborne Int B V Tape sectioning system and method of sectioning tape
KR102112916B1 (ko) * 2018-05-15 2020-05-19 서울대학교산학협력단 막 결함 분석 방법
CN116465826B (zh) * 2023-03-15 2023-10-24 东阳市诰源闪光材料有限公司 一种用于光学膜偏光率测试装置及测试方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005009919A (ja) * 2003-06-17 2005-01-13 Taiyo Denki Kk 保護膜付き偏光板の検査装置および検査方法
JP2007213016A (ja) * 2006-01-11 2007-08-23 Nitto Denko Corp 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
TWI340835B (ja) * 2008-04-15 2011-04-21 Nitto Denko Corp
WO2011148790A1 (ja) * 2010-05-25 2011-12-01 東レ株式会社 フィルムの欠陥検査装置、欠陥検査方法および離型フィルム
TWI471220B (zh) * 2010-09-03 2015-02-01 Nitto Denko Corp 具有偏光膜之光學薄膜積層體捲體之製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) * 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005009919A (ja) * 2003-06-17 2005-01-13 Taiyo Denki Kk 保護膜付き偏光板の検査装置および検査方法
JP2007213016A (ja) * 2006-01-11 2007-08-23 Nitto Denko Corp 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
TWI340835B (ja) * 2008-04-15 2011-04-21 Nitto Denko Corp
WO2011148790A1 (ja) * 2010-05-25 2011-12-01 東レ株式会社 フィルムの欠陥検査装置、欠陥検査方法および離型フィルム
TWI471220B (zh) * 2010-09-03 2015-02-01 Nitto Denko Corp 具有偏光膜之光學薄膜積層體捲體之製造方法

Also Published As

Publication number Publication date
TW201632869A (zh) 2016-09-16
JP2016142657A (ja) 2016-08-08
JP6437329B2 (ja) 2018-12-12
WO2016125616A1 (ja) 2016-08-11

Similar Documents

Publication Publication Date Title
KR101394690B1 (ko) 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사 데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
TWI671520B (zh) 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置
US8016965B2 (en) Information storing, readout and calculation system for use in a system for continuously manufacturing liquid-crystal display elements, and method for producing the same
US7976657B2 (en) Method and system for continuously manufacturing liquid-crystal display element
US20110086193A1 (en) Roll of continuous web of optical film laminate with predefined slit lines, and method and system for manufacturing the same
JP5899630B2 (ja) 樹脂被膜付き鋼板の表面検査方法及びその表面検査装置
JP5024935B2 (ja) 光透過性部材の欠陥検出装置及び方法
TW201629584A (zh) 光學顯示面板之製造方法及光學顯示面板之製造系統
TWI551913B (zh) A manufacturing method of a liquid crystal display element, and a manufacturing system of a liquid crystal display device
WO2021124645A1 (ja) 検査方法、検査装置、及び検査システム
WO2021124647A1 (ja) 検査方法、検査装置、及び検査システム
CN116519711A (zh) 检查方法
JP2009236826A (ja) 欠陥検出装置及び方法
TWI611223B (zh) 偏光板之製造方法及液晶面板之製造方法
JP4728830B2 (ja) 光学的異方性パラメータ測定方法及び測定装置
WO2023223728A1 (ja) 検査方法
WO2022044952A1 (ja) 検査方法
JP7413211B2 (ja) 検査方法
JP2000310594A (ja) 高分子成形品の検査方法および検査装置
KR20170112435A (ko) 편광판 검사 방법 및 편광판 검사 장치
JP2005283564A (ja) 光学膜のテスト装置
KR20170112436A (ko) 편광판 검사 방법 및 편광판 검사 장치
JP2013097277A (ja) フィルム露光装置
JP2023149821A (ja) 検査方法
JP2011048381A (ja) ロール原反の製造方法及び光学表示装置の製造方法