TWI671520B - 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 - Google Patents
光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 Download PDFInfo
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- TWI671520B TWI671520B TW105102890A TW105102890A TWI671520B TW I671520 B TWI671520 B TW I671520B TW 105102890 A TW105102890 A TW 105102890A TW 105102890 A TW105102890 A TW 105102890A TW I671520 B TWI671520 B TW I671520B
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- Taiwan
- Prior art keywords
- optical film
- defect inspection
- alignment angle
- transmission
- film
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-019450 | 2015-02-03 | ||
JP2015019450A JP6437329B2 (ja) | 2015-02-03 | 2015-02-03 | 光学フィルムの欠陥検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201632869A TW201632869A (zh) | 2016-09-16 |
TWI671520B true TWI671520B (zh) | 2019-09-11 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW105102890A TWI671520B (zh) | 2015-02-03 | 2016-01-29 | 光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6437329B2 (ja) |
TW (1) | TWI671520B (ja) |
WO (1) | WO2016125616A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106290384B (zh) * | 2016-10-21 | 2018-11-23 | 江苏理工学院 | 无刷直流电机控制线路板在线检测识别方法 |
NL2020361B1 (en) | 2018-01-31 | 2019-08-07 | Airborne Int B V | Tape sectioning system and method of sectioning tape |
KR102112916B1 (ko) * | 2018-05-15 | 2020-05-19 | 서울대학교산학협력단 | 막 결함 분석 방법 |
CN116465826B (zh) * | 2023-03-15 | 2023-10-24 | 东阳市诰源闪光材料有限公司 | 一种用于光学膜偏光率测试装置及测试方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005009919A (ja) * | 2003-06-17 | 2005-01-13 | Taiyo Denki Kk | 保護膜付き偏光板の検査装置および検査方法 |
JP2007213016A (ja) * | 2006-01-11 | 2007-08-23 | Nitto Denko Corp | 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置 |
TWI340835B (ja) * | 2008-04-15 | 2011-04-21 | Nitto Denko Corp | |
WO2011148790A1 (ja) * | 2010-05-25 | 2011-12-01 | 東レ株式会社 | フィルムの欠陥検査装置、欠陥検査方法および離型フィルム |
TWI471220B (zh) * | 2010-09-03 | 2015-02-01 | Nitto Denko Corp | 具有偏光膜之光學薄膜積層體捲體之製造方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005062165A (ja) * | 2003-07-28 | 2005-03-10 | Nitto Denko Corp | シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置 |
JP4869053B2 (ja) * | 2006-01-11 | 2012-02-01 | 日東電工株式会社 | 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置 |
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2015
- 2015-02-03 JP JP2015019450A patent/JP6437329B2/ja active Active
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2016
- 2016-01-25 WO PCT/JP2016/052020 patent/WO2016125616A1/ja active Application Filing
- 2016-01-29 TW TW105102890A patent/TWI671520B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005009919A (ja) * | 2003-06-17 | 2005-01-13 | Taiyo Denki Kk | 保護膜付き偏光板の検査装置および検査方法 |
JP2007213016A (ja) * | 2006-01-11 | 2007-08-23 | Nitto Denko Corp | 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置 |
TWI340835B (ja) * | 2008-04-15 | 2011-04-21 | Nitto Denko Corp | |
WO2011148790A1 (ja) * | 2010-05-25 | 2011-12-01 | 東レ株式会社 | フィルムの欠陥検査装置、欠陥検査方法および離型フィルム |
TWI471220B (zh) * | 2010-09-03 | 2015-02-01 | Nitto Denko Corp | 具有偏光膜之光學薄膜積層體捲體之製造方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201632869A (zh) | 2016-09-16 |
JP2016142657A (ja) | 2016-08-08 |
JP6437329B2 (ja) | 2018-12-12 |
WO2016125616A1 (ja) | 2016-08-11 |
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