TWI663391B - Defect inspection method of multilayer optical film, defect inspection method of optical film, and manufacturing method of multilayer optical film - Google Patents
Defect inspection method of multilayer optical film, defect inspection method of optical film, and manufacturing method of multilayer optical film Download PDFInfo
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N2021/8924—Dents; Relief flaws
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Abstract
本發明之一實施形態之積層光學膜之缺陷檢查方法包含：第1檢查步驟，其進行光學膜11之缺陷檢查；積層光學膜形成步驟，其使保護膜12及黏著材料13貼合於光學膜11而形成積層光學膜10A、10B；第1標記步驟，其對應於第1檢查步驟中所檢測出之缺陷20而於積層光學膜10A進行(標記30之)標記；第2檢查步驟，其進行積層光學膜10B之缺陷檢查；及第2標記步驟，其對應於第2檢查步驟中所檢測出之缺陷21而於積層光學膜10B進行(標記31之)標記；且於第2檢查步驟中，不對已於第1標記步驟中標記出之標記30進行檢測。 A defect inspection method of a laminated optical film according to an embodiment of the present invention includes: a first inspection step that performs defect inspection of the optical film 11; a laminated optical film forming step that attaches the protective film 12 and the adhesive material 13 to the optical film 11 to form a laminated optical film 10A, 10B; a first marking step corresponding to the defect 20 detected in the first inspection step and marking (marking 30) on the laminated optical film 10A; a second inspection step, which performs Defect inspection of the laminated optical film 10B; and a second marking step, which corresponds to the defect 21 detected in the second inspection step, and marks (mark 31 of) the laminated optical film 10B; and in the second inspection step, The mark 30 which has been marked in the first marking step is not detected.
Description
本發明係關於一種積層光學膜之缺陷檢查方法及光學膜之缺陷檢查方法，亦係關於一種積層光學膜之製造方法。 The invention relates to a defect inspection method of a laminated optical film and a defect inspection method of an optical film, and also relates to a method for manufacturing a laminated optical film.
作為具有光學特性之光學膜，已知具有偏光特性之偏光板、具有雙折射性之相位差板等。例如，作為偏光板，已知於作為光學膜本體之偏光元件(Polyvinyl Alcohol：PVA，聚乙烯醇)之主面兩側貼合TAC(Triacetyl Cellulose，三乙酸纖維素)膜而成者。作為相位差板，已知相位差板由光學膜本體單獨構成者。此種光學膜亦存在貼合保護膜、或貼合附有分離膜之狀態之黏著材料而形成積層光學膜之情況。 As an optical film having optical characteristics, a polarizing plate having polarizing characteristics, a retardation plate having birefringence, and the like are known. For example, a polarizing plate is known in which a TAC (Triacetyl Cellulose) film is bonded to both sides of a main surface of a polarizing element (Polyvinyl Alcohol: PVA, polyvinyl alcohol) as an optical film body. As a retardation plate, it is known that a retardation plate consists of an optical film main body alone. Such optical films may be laminated with a protective film or an adhesive material in a state where a separation film is attached to form the laminated optical film.
於此種光學膜及積層光學膜中，例如若於上述貼合時於內部或表面混入異物或氣泡，則會產生光學性缺陷。於專利文獻1~2中，揭示有對此種光學膜及積層光學膜之缺陷進行檢查之方法。 In such an optical film and a laminated optical film, for example, if foreign matter or bubbles are mixed into the inside or the surface during the above bonding, optical defects may occur. Patent Documents 1 to 2 disclose methods for inspecting defects of such optical films and laminated optical films.
若藉由此種缺陷檢查方法檢測出缺陷，則對應於缺陷而例如以包圍缺陷之方式於光學膜及積層光學膜之表面上進行標記，被施以標記之區域不作為製品使用。 If a defect is detected by such a defect inspection method, corresponding to the defect, for example, a mark is formed on the surface of the optical film and the laminated optical film in a manner of surrounding the defect, and the marked area is not used as a product.
[專利文獻1]日本專利特開2009-69142號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2009-69142
[專利文獻2]日本專利特開2011-65184號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2011-65184
於此種缺陷檢查方法中，要求不過多或過少而準確地數出缺陷之數量。又，要求所標記出之標記為與缺陷之大小對應之大小。 In such a defect inspection method, it is required that the number of defects is accurately counted not too much or too little. In addition, the mark to be marked is required to have a size corresponding to the size of the defect.
此外，於此種光學膜及積層光學膜之缺陷檢查中，存在進行2次以上之缺陷檢查之情況。例如，存在如下情況，即，每次貼合光學膜及積層光學膜之各層均進行缺陷檢查，或為檢測不同之缺陷而進行不同之檢查方法。 In addition, in the defect inspection of such an optical film and a laminated optical film, the defect inspection may be performed twice or more. For example, there are cases where defect inspection is performed every time the optical film and the laminated optical film are laminated, or different inspection methods are performed to detect different defects.
然而，於進行2次以上之缺陷檢查之情形時存在如下問題，即，於第2次以後之檢查中將於前次以前標記出之標記檢測為缺陷，對應於此而進行(例如以包圍缺陷之方式)標記，其結果，最終標記尺寸變大。 However, when two or more defect inspections are performed, there is a problem that, in the second and subsequent inspections, the marks marked before the previous inspection are detected as defects, and the corresponding inspection is performed (for example, by surrounding the defects). Method) mark, as a result, the final mark size becomes larger.
因此，本發明之目的在於提供一種積層光學膜之缺陷檢查方法及光學膜之缺陷檢查方法，於進行2次以上之缺陷檢查時，可防止對與於前次以前檢測出之缺陷對應之標記進行檢測。又，本發明之目的亦在於提供一種積層光學膜之製造方法。 Therefore, an object of the present invention is to provide a defect inspection method of a laminated optical film and a defect inspection method of an optical film, which can prevent the marking corresponding to the defect detected before the previous defect when the defect inspection is performed twice or more. Detection. Another object of the present invention is to provide a method for manufacturing a laminated optical film.
本發明之積層光學膜之缺陷檢查方法係一面使保護膜及黏著材料之至少一者貼合於光學膜而獲得積層光學膜，一面對積層光學膜中之缺陷進行檢查之方法，且包含：第1檢查步驟，其進行光學膜之缺陷檢查；積層光學膜形成步驟，其使保護膜及黏著材料之至少一者貼合於光學膜而形成積層光學膜；第1標記步驟，其對應於第1檢查步驟中所檢測出之缺陷而於積層光學膜進行標記；第2檢查步驟，其進行積層光學膜之缺陷檢查；及第2標記步驟，其對應於第2檢查步驟中所檢測出之缺陷而於積層光學膜進行標記；且於第2檢查步驟中，不對已於第1標記步驟中標記出之標記進行檢測。 The defect inspection method of the laminated optical film of the present invention is a method of obtaining a laminated optical film by bonding at least one of a protective film and an adhesive material to the optical film, and inspecting defects in the laminated optical film, and includes: The first inspection step performs defect inspection of the optical film; the laminated optical film formation step attaches at least one of the protective film and the adhesive material to the optical film to form a laminated optical film; the first marking step corresponds to the first 1 Defects detected in the inspection step are marked on the laminated optical film; second inspection step, which inspects the defects of the laminated optical film; and second marking step, which corresponds to the defects detected in the second inspection step Marking is performed on the laminated optical film; and in the second inspection step, the marks already marked in the first marking step are not detected.
根據該積層光學膜之缺陷檢查方法，於第2檢查步驟中，不對已於第1標記步驟中標記出之標記進行檢測。藉此，於進行2次以上之缺陷檢查時，可防止對與於前次以前檢測出之缺陷對應之標記進行檢測。 According to the defect inspection method of the laminated optical film, in the second inspection step, the marks already marked in the first marking step are not detected. Thereby, when the defect inspection is performed more than two times, it is possible to prevent the detection of the mark corresponding to the defect detected before the previous time.
上述第1檢查步驟中之缺陷檢查方法與上述第2檢查步驟中之缺陷檢查方法既可相同，亦可不同。 The defect inspection method in the first inspection step and the defect inspection method in the second inspection step may be the same or different.
本發明之光學膜之缺陷檢查方法係對光學膜之缺陷進行檢查之方法，且包含：第1檢查步驟，其進行光學膜之缺陷檢查；第1標記步驟，其對應於第1檢查步驟中所檢測出之缺陷而於光學膜進行標記；第2檢查步驟，其進行光學膜之缺陷檢查、且為與第1檢查步驟中之缺陷檢查不同之缺陷檢查；第2標記步驟，其對應於第2檢查步驟中所檢測出之缺陷而於光學膜進行標記；且於第2檢查步驟中，不對已於第1標記步驟中標記出之標記進行檢測。 The defect inspection method of an optical film of the present invention is a method for inspecting defects of an optical film, and includes: a first inspection step, which performs defect inspection of the optical film; and a first marking step, which corresponds to the first inspection step. The detected defect is marked on the optical film. The second inspection step is to perform a defect inspection of the optical film and is a defect inspection different from the defect inspection in the first inspection step. The second marking step corresponds to the second inspection step. Defects detected in the inspection step are marked on the optical film; and in the second inspection step, the marks already marked in the first marking step are not inspected.
本發明中之光學膜之概念為不僅包括由光學膜本體構成之單層光學膜，亦包括包含光學膜本體之光學膜、及使保護膜及黏著材料之至少任一者貼合於該光學膜而形成之積層光學膜。 The concept of the optical film in the present invention includes not only a single-layer optical film composed of an optical film body, but also an optical film including the optical film body, and at least one of a protective film and an adhesive material is bonded to the optical film. The formed laminated optical film.
於該光學膜之缺陷檢查方法中，亦於第2檢查步驟中，不對已於第1標記步驟中標記出之標記進行檢測，因此於進行2次以上之缺陷檢查時，可防止對與於前次以前檢測出之缺陷對應之標記進行檢測。 In the defect inspection method of the optical film, also in the second inspection step, the marks that have been marked in the first marking step are not detected. Therefore, when two or more defect inspections are performed, it is possible to prevent confrontation with previous ones. The mark corresponding to the defect previously detected is detected.
本發明之積層光學膜之製造方法係使保護膜及黏著材料之至少一者貼合於光學膜而製造積層光學膜之方法，且包含上述之積層光學膜之缺陷檢查方法。根據該積層光學膜之製造方法，可獲得與上述之積層光學膜之缺陷檢查方法相同之優點。 The manufacturing method of the laminated optical film of the present invention is a method of manufacturing a laminated optical film by bonding at least one of a protective film and an adhesive material to the optical film, and includes the defect inspection method of the laminated optical film described above. According to the manufacturing method of the laminated optical film, the same advantages as the defect inspection method of the laminated optical film described above can be obtained.
根據本發明，於進行2次以上光學膜及積層光學膜之缺陷檢查時，可防止對與於前次以前檢測出之缺陷對應之標記進行檢測，其結 果，可防止最終標記尺寸變大，從而可防止光學膜之產率降低。 According to the present invention, when the defect inspection of the optical film and the laminated optical film is performed more than two times, it is possible to prevent the detection of the mark corresponding to the defect detected before the previous time, and the result As a result, it is possible to prevent the final mark size from becoming large, thereby preventing a decrease in the yield of the optical film.
10A‧‧‧積層光學膜 10A‧‧‧Laminated Optical Film
10B‧‧‧積層光學膜 10B‧‧‧Laminated Optical Film
10a‧‧‧積層光學膜之一主面 10a‧‧‧ One of the main faces of laminated optical film
10b‧‧‧積層光學膜之另一主面 10b‧‧‧ The other main surface of laminated optical film
11‧‧‧光學膜 11‧‧‧ Optical Film
11a‧‧‧光學膜之一主面 11a‧‧‧ one of the main faces of optical film
11b‧‧‧光學膜之另一主面 11b‧‧‧ The other main surface of the optical film
12‧‧‧保護膜 12‧‧‧ protective film
13‧‧‧附有分離膜之黏著材料 13‧‧‧ Adhesive material with separation membrane
14‧‧‧分離膜 14‧‧‧ separation membrane
15‧‧‧黏著材料 15‧‧‧ Adhesive material
20‧‧‧缺陷 20‧‧‧ Defect
21‧‧‧缺陷 21‧‧‧ defects
25‧‧‧缺陷 25‧‧‧ Defect
30‧‧‧標記 30‧‧‧ mark
31‧‧‧標記 31‧‧‧Mark
101‧‧‧原片輥 101‧‧‧Original film roll
102‧‧‧原片輥 102‧‧‧Original film roll
103‧‧‧貼合輥 103‧‧‧ Laminating roller
104‧‧‧原片輥 104‧‧‧Original film roll
105‧‧‧原片輥 105‧‧‧Original film roll
106‧‧‧貼合輥 106‧‧‧ Laminating roller
107‧‧‧原片輥 107‧‧‧Original film roll
111‧‧‧透過檢查器 111‧‧‧ through the inspector
113‧‧‧噴墨印刷器 113‧‧‧ Inkjet Printer
115‧‧‧檢查器(透過檢查器或反射檢查器) 115‧‧‧Inspector (transmission inspector or reflection inspector)
119‧‧‧噴墨印刷器 119‧‧‧ Inkjet Printer
圖1係表示本發明之第1實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。 FIG. 1 is a diagram showing a defect inspection method and a manufacturing method of a laminated optical film according to a first embodiment of the present invention.
圖2係表示本發明之第1實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。 FIG. 2 is a diagram showing a defect inspection method and a manufacturing method of the laminated optical film according to the first embodiment of the present invention.
圖3係用以說明本發明之第1實施形態之積層光學膜之缺陷檢查方法中之第1標記步驟之圖，且係表示積層光學膜之一主面之圖。 FIG. 3 is a diagram for explaining a first marking step in the defect inspection method of the laminated optical film according to the first embodiment of the present invention, and is a diagram showing one principal surface of the laminated optical film.
圖4係沿圖3之IV-IV線之積層光學膜之剖視圖。 FIG. 4 is a cross-sectional view of the laminated optical film taken along line IV-IV in FIG. 3.
圖5係用以說明本發明之第1實施形態之積層光學膜之缺陷檢查方法中之第2標記步驟之圖，且係表示積層光學膜之一主面之圖。 FIG. 5 is a diagram for explaining a second marking step in the defect inspection method of the laminated optical film according to the first embodiment of the present invention, and is a diagram showing one principal surface of the laminated optical film.
圖6係沿圖5之VI-VI線之積層光學膜之剖視圖。 FIG. 6 is a cross-sectional view of the laminated optical film taken along line VI-VI of FIG. 5.
圖7係用以說明先前之缺陷檢查方法中之最初之標記步驟之圖，且係表示先前之缺陷檢查方法中之積層光學膜之一主面之圖。 FIG. 7 is a diagram for explaining the initial marking steps in the previous defect inspection method, and is a diagram showing one principal surface of the laminated optical film in the previous defect inspection method.
圖8係沿圖7之VIII-VIII線之積層光學膜之剖視圖。 FIG. 8 is a cross-sectional view of the laminated optical film taken along the line VIII-VIII of FIG. 7.
圖9係用以說明先前之缺陷檢查方法中之圖7所示之標記步驟之後之標記步驟之圖，且係表示先前之缺陷檢查方法中之積層光學膜之一主面之圖。 FIG. 9 is a diagram for explaining a marking step after the marking step shown in FIG. 7 in the previous defect inspection method, and is a view showing one principal surface of a laminated optical film in the previous defect inspection method.
圖10係沿圖9之X-X線之積層光學膜之剖視圖。 FIG. 10 is a cross-sectional view of the laminated optical film taken along the line X-X in FIG. 9.
圖11係表示本發明之第2實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。 11 is a view showing a defect inspection method and a manufacturing method of a laminated optical film according to a second embodiment of the present invention.
圖12係表示本發明之第2實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。 FIG. 12 is a diagram showing a defect inspection method and a manufacturing method of a laminated optical film according to a second embodiment of the present invention.
圖13係用以說明本發明之第2實施形態之積層光學膜之缺陷檢查方法中之第1標記步驟之圖，且係表示積層光學膜之一主面之圖。 13 is a diagram for explaining a first marking step in a defect inspection method of a laminated optical film according to a second embodiment of the present invention, and is a diagram showing one principal surface of the laminated optical film.
圖14係沿圖13之XIV-XIV線之積層光學膜之剖視圖。 14 is a cross-sectional view of the laminated optical film taken along the line XIV-XIV in FIG. 13.
圖15係用以說明本發明之第2實施形態之積層光學膜之缺陷檢查方法中之第2標記步驟之圖，且係表示積層光學膜之一主面之圖。 FIG. 15 is a diagram for explaining a second marking step in a defect inspection method of a laminated optical film according to a second embodiment of the present invention, and is a diagram showing one principal surface of the laminated optical film.
圖16係沿圖15之XVI-XVI線之積層光學膜之剖視圖。 16 is a cross-sectional view of the laminated optical film taken along the line XVI-XVI in FIG. 15.
以下，參照圖式對本發明之較佳實施形態詳細地進行說明。於各圖式中對於相同或相當之部分標註相同之符號。 Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In the drawings, the same or equivalent parts are marked with the same symbols.
[第1實施形態] [First Embodiment]
圖1及圖2係表示本發明之第1實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。圖3及圖5係表示圖1所示之缺陷檢查方法之不同步驟中的積層光學膜之一主面之圖，圖4及圖6係圖3及圖5所示之積層光學膜之剖視圖。於圖1~圖6中，表示XY平面座標。X方向表示積層光學膜之寬度方向，Y方向表示積層光學膜之長度方向。 1 and 2 are diagrams showing a defect inspection method and a manufacturing method of the multilayer optical film according to the first embodiment of the present invention. FIGS. 3 and 5 are diagrams showing a main surface of a laminated optical film in different steps of the defect inspection method shown in FIG. 1, and FIGS. 4 and 6 are sectional views of the laminated optical film shown in FIGS. 3 and 5. In Figs. 1 to 6, coordinates in the XY plane are shown. The X direction indicates the width direction of the laminated optical film, and the Y direction indicates the length direction of the laminated optical film.
首先，如圖1所示，自原片輥101送出光學膜11。光學膜11包含具有光學特性之光學膜本體。作為光學膜11，可列舉具有偏光特性之偏光板、具有雙折射性之相位差板等。例如，於光學膜11為偏光板之情形時，包含作為光學膜本體之偏光元件(Polyvinyl Alcohol：PVA)，且於該偏光元件之主面兩側貼合有TAC(Triacetyl Cellulose)膜。另一方面，於光學膜11為相位差板之情形時，相位差板相當於光學膜本體。 First, as shown in FIG. 1, the optical film 11 is fed out from the original sheet roll 101. The optical film 11 includes an optical film body having optical characteristics. Examples of the optical film 11 include a polarizing plate having polarizing characteristics, and a retardation plate having birefringence. For example, when the optical film 11 is a polarizing plate, a polarizing element (Polyvinyl Alcohol: PVA) as the optical film body is included, and a TAC (Triacetyl Cellulose) film is bonded to both sides of the main surface of the polarizing element. On the other hand, when the optical film 11 is a retardation plate, the retardation plate corresponds to the optical film body.
繼而，藉由配置於光學膜11之另一主面11b側之光源(未圖示)而對光學膜11照射光，且藉由配置於光學膜11之一主面11a側之透過檢查器111而接收透過光學膜11之光，並基於所接收之透過光而進行光學膜11之缺陷檢查(第1檢查步驟，透過檢查)。 Then, the optical film 11 is irradiated with light by a light source (not shown) disposed on the other main surface 11 b side of the optical film 11, and the transmission inspector 111 is disposed on one main surface 11 a side of the optical film 11. The light transmitted through the optical film 11 is received, and a defect inspection of the optical film 11 is performed based on the received transmitted light (first inspection step, transmission inspection).
繼而，自原片輥102送出保護膜12，並將保護膜12積層於光學膜11之一主面11a側。作為保護膜12，可使用PET(Polyethylene Terephthalate，聚對苯二甲酸乙二酯)膜等。繼而，藉由貼合輥103使光學膜11與保護膜12貼合而形成積層光學膜10A。 Then, the protective film 12 is sent out from the original sheet roll 102, and the protective film 12 is laminated on one main surface 11a side of the optical film 11. As the protective film 12, a PET (Polyethylene Terephthalate) film or the like can be used. Then, the optical film 11 and the protective film 12 are bonded by the bonding roller 103 to form a laminated optical film 10A.
繼而，使用配置於積層光學膜10A之保護膜12側之噴墨印刷器113(藉由滴液法)，對應於第1檢查步驟中所檢測出之缺陷而於積層光學膜10A之保護膜12側的表面進行標記(第1標記步驟)。 Next, the inkjet printer 113 (by the drip method) disposed on the protective film 12 side of the laminated optical film 10A was used to correspond to the defect detected in the first inspection step to the protective film 12 of the laminated optical film 10A. The side surface is marked (first marking step).
例如，如圖3及圖4所示，於檢測出因異物混入於積層光學膜10A內部而產生之3個缺陷20之情形時，對該等缺陷20之各者於X方向之兩側分別沿Y方向標記出線狀之標記30，藉此以夾入缺陷20之方式，換言之以包圍缺陷20之方式，於積層光學膜10A之保護膜12側之表面進行標記。 For example, as shown in FIG. 3 and FIG. 4, when three defects 20 generated due to the incorporation of a foreign substance into the laminated optical film 10A are detected, each of the defects 20 is along both sides of the X direction. A linear mark 30 is marked in the Y direction, thereby marking the surface of the protective film 12 side of the laminated optical film 10A by sandwiching the defect 20, in other words, by surrounding the defect 20.
於圖4中，概略性地僅表示圖3中之1個缺陷20，並且概略性地表示與該缺陷20對應之2個線狀之標記30。於圖1中，概略性地僅表示圖3中之1個缺陷20、及與該缺陷20對應之2個線狀之標記30。 In FIG. 4, only one defect 20 in FIG. 3 is schematically shown, and two linear marks 30 corresponding to the defect 20 are schematically shown. In FIG. 1, only one defect 20 in FIG. 3 and two linear marks 30 corresponding to the defect 20 are schematically shown.
繼而，將積層光學膜10A捲取於原片輥104上。 Then, the laminated optical film 10A is wound on the original sheet roll 104.
繼而，如圖2所示，自原片輥104送出積層光學膜10A，又，自原片輥105送出分離膜(脫模膜)14貼合於黏著材料15而成之附有分離膜之黏著材料13，並將附有分離膜之黏著材料13積層於積層光學膜10A之光學膜11側。作為分離膜之材料，可使用PET(Polyethylene Terephthalate)等。繼而，藉由貼合輥106使積層光學膜10A與附有分離膜之黏著材料13貼合，而形成積層光學膜10B。 Then, as shown in FIG. 2, the laminated optical film 10A is sent out from the original film roll 104, and the separation film (release film) 14 is sent out from the original film roll 105, and the adhesive with the separation film is attached to the adhesive material 15. Material 13, and an adhesive material 13 with a separation film is laminated on the optical film 11 side of the laminated optical film 10A. As a material of the separation membrane, PET (Polyethylene Terephthalate) can be used. Then, the laminated optical film 10A and the adhesive material 13 with a separation film are laminated together by the laminating roller 106 to form a laminated optical film 10B.
繼而，藉由配置於積層光學膜10B之另一主面10b側(附有分離膜之黏著材料13側)之光源(未圖示)對積層光學膜10B照射光，且藉由配置於積層光學膜10B之一主面10a側(保護膜12側)之檢查器115而接收透過積層光學膜10B之光，並基於所接收之透過光而進行積層光學膜10B之缺陷檢查(第2檢查步驟，透過檢查)。於第1實施形態中，檢查器115為透過檢查器。 Then, the laminated optical film 10B is irradiated with light by a light source (not shown) disposed on the other main surface 10b side of the laminated optical film 10B (the side of the adhesive material 13 with a separation film attached), and is disposed on the laminated optical film 10B. The inspector 115 on the main surface 10a side (the protective film 12 side) of one of the films 10B receives light transmitted through the laminated optical film 10B, and performs a defect inspection of the laminated optical film 10B based on the received transmitted light (second inspection step, Through inspection). In the first embodiment, the inspector 115 is a transmission inspector.
於第2檢查步驟中，不對已於第1標記步驟中標記出之標記30進行檢測。例如，藉由使用噴墨印刷器之滴液法而形成之標記30通常較 欲藉由使用透過檢查器之檢查而檢測之缺陷大。因此，於檢查器115中，能夠根據例如大小而識別標記30。或者，檢查器115亦可基於第1標記步驟中所標記出之標記30之形狀而辨別標記30。檢查器115可具備過濾器部，該過濾器部將檢查器115所接收之上述透過光具有之資訊中與標記30相關之資訊除去。 In the second inspection step, the marks 30 already marked in the first marking step are not detected. For example, a mark 30 formed by a dripping method using an inkjet printer is generally The defect to be detected by using the inspection through the inspector is large. Therefore, in the inspector 115, the mark 30 can be identified based on, for example, the size. Alternatively, the checker 115 may recognize the mark 30 based on the shape of the mark 30 marked in the first marking step. The inspector 115 may include a filter unit that removes information related to the mark 30 from the information that the transmitted light received by the inspector 115 has.
繼而，使用配置於積層光學膜10B之一主面10a側之噴墨印刷器119(藉由滴液法)，對應於第2檢查步驟中所檢測出之缺陷而於積層光學膜10B之一主面10a側的表面進行標記(第2標記步驟)。 Next, an inkjet printer 119 (by a dripping method) disposed on one of the main surfaces 10a of the laminated optical film 10B was used to correspond to a defect detected in the second inspection step to one of the laminated optical films 10B. The surface on the side of the surface 10a is marked (second marking step).
例如，如圖5及圖6所示，於檢測出因異物混入於積層光學膜10B內部而產生之2個缺陷21之情形時，對該等缺陷21之各者於X方向之兩側分別沿Y方向標記出線狀之標記31，藉此以夾入缺陷21之方式，換言之以包圍缺陷21之方式，於積層光學膜10B之一主面10a側之表面進行標記。 For example, as shown in FIG. 5 and FIG. 6, when two defects 21 caused by foreign matter mixed in the laminated optical film 10B are detected, each of the defects 21 is along two sides of the X direction, respectively. A linear mark 31 is marked in the Y direction, thereby marking the surface of one side of the main surface 10a of the laminated optical film 10B by sandwiching the defect 21, in other words, by surrounding the defect 21.
於圖6中，與圖4同樣地，概略性地僅表示圖3中之1個缺陷20，並且概略性地表示與該缺陷20對應之2個線狀之標記30。於圖6中，概略性地僅表示圖5中之1個缺陷21，並且概略性地表示與該缺陷21對應之2個線狀之標記31。又，於圖2中，與圖1同樣地，概略性地僅表示圖5中之1個缺陷20或21、及與該缺陷20或21對應之2個線狀之標記30或31。 In FIG. 6, similarly to FIG. 4, only one defect 20 in FIG. 3 is schematically shown, and two linear marks 30 corresponding to the defect 20 are schematically shown. In FIG. 6, only one defect 21 in FIG. 5 is schematically shown, and two linear marks 31 corresponding to the defect 21 are schematically shown. In FIG. 2, like FIG. 1, only one defect 20 or 21 in FIG. 5 and two linear marks 30 or 31 corresponding to the defect 20 or 21 are schematically shown.
繼而，將積層光學膜10B捲取於原片輥107。 Then, the laminated optical film 10B is wound on the original sheet roll 107.
圖7及圖9係表示先前之缺陷檢查方法之不同步驟中的積層光學膜之一主面之圖，圖8及圖10係圖7及圖9所示之積層光學膜之剖視圖。 FIG. 7 and FIG. 9 are views showing one main surface of the laminated optical film in different steps of the previous defect inspection method, and FIGS. 8 and 10 are sectional views of the laminated optical film shown in FIGS. 7 and 9.
於先前之缺陷檢查方法中，於不具備如下功能之點與本實施形態之缺陷檢查方法不同，即，該功能為於第2檢查步驟中，不對已於第1標記步驟中標記出之標記進行檢測。 The previous defect inspection method differs from the defect inspection method of the present embodiment in that it does not have the following function, that is, the function does not perform the marking performed in the first marking step in the second inspection step. Detection.
即，如圖9及圖10所示，於先前之缺陷檢查方法中，會於第2檢查步驟中將於第1標記步驟中形成之標記30檢測為缺陷。其結果，於第2標記步驟中，會對應於第1檢查步驟中所檢測出之缺陷20及第1標記步驟中所形成之標記30，而以夾入該等缺陷20及標記30之方式，換言之以包圍缺陷20及標記30之方式形成標記31。 That is, as shown in FIGS. 9 and 10, in the previous defect inspection method, the mark 30 formed in the first marking step is detected as a defect in the second inspection step. As a result, in the second marking step, the defects 20 and marks 30 formed in the first marking step correspond to the defects 20 detected in the first inspection step and the defects 20 and the marks 30 are sandwiched. In other words, the mark 31 is formed so as to surround the defect 20 and the mark 30.
如此，於先前之缺陷檢查方法中，於進行2次以上之缺陷檢查之情形時存在如下問題，即，於第2次以後之檢查中將於前次以前標記出之標記檢測為缺陷，且對應於此而於缺陷之附近進而進行標記，其結果，最終標記尺寸變大，從而光學膜之產率降低。 Thus, in the previous defect inspection method, when two or more defect inspections were performed, there was a problem that, in the second and subsequent inspections, the marks marked before the previous time were detected as defects and corresponded to the defects. Here, marking is performed in the vicinity of the defect. As a result, the final mark size becomes large, and the yield of the optical film decreases.
然而，根據第1實施形態之積層光學膜之缺陷檢查方法及製造方法，於第2檢查步驟中，不對已於第1標記步驟中標記出之標記30進行檢測，因此於進行2次以上之缺陷檢查時，可防止對與於前次以前檢測出之缺陷對應之標記30進行檢測。其結果，可精度良好地求出缺陷率，又，可防止最終標記尺寸變大，從而可防止光學膜之產率降低。 However, according to the defect inspection method and manufacturing method of the laminated optical film according to the first embodiment, in the second inspection step, the marks 30 that have been marked in the first marking step are not detected, and therefore the defects are performed more than twice. During the inspection, it is possible to prevent the detection of the mark 30 corresponding to the defect detected before the previous time. As a result, the defect rate can be obtained with high accuracy, and the final mark size can be prevented from increasing, which can prevent the yield of the optical film from decreasing.
[第1實施形態之變化例] [Modification of the first embodiment]
於第1實施形態中，例示了於使保護膜12及附有分離膜之黏著材料13貼合於光學膜11之步驟之前與之後進行複數次同一種類之缺陷檢查(透過檢查)之方法，但本發明之思想如以下所詳細說明般，亦可應用於組合進行不同種類之缺陷檢查之形態，例如於第1實施形態中進行透過檢查作為第1檢查步驟、且進行反射檢查作為第2檢查步驟之形態。 In the first embodiment, a method of performing a defect inspection (transmission inspection) of the same type several times before and after the step of bonding the protective film 12 and the adhesive material 13 with a separation film to the optical film 11 is exemplified. As described in detail below, the idea of the present invention can also be applied to a combination of different types of defect inspection. For example, in the first embodiment, a transmission inspection is performed as the first inspection step, and a reflection inspection is performed as the second inspection step. The form.
[第2實施形態] [Second Embodiment]
於第1實施形態中，例示了於使保護膜12及附有分離膜之黏著材料13貼合於光學膜11之步驟之前與之後進行複數次缺陷檢查之方法，但本發明之思想亦可應用於對同一積層光學膜進行複數次缺陷檢查之方法。 In the first embodiment, the method of performing multiple defect inspections before and after the step of bonding the protective film 12 and the adhesive material 13 with a separation film to the optical film 11 is exemplified, but the idea of the present invention can also be applied A method for performing multiple defect inspections on the same laminated optical film.
例如，存在對同一積層光學膜組合進行不同檢查(例如，透過檢查及反射檢查)之情形。例如，透過檢查適於混入至光學膜內部之黑色系之異物之檢測，但難以檢測出混入至光學膜表面之小氣泡。另一方面，反射檢查適於混入至光學膜表面之小氣泡之檢測，但難以檢測出混入至光學膜內部之黑色系之異物。 For example, there are cases where different inspections (for example, transmission inspection and reflection inspection) are performed on the same laminated optical film combination. For example, through inspection is suitable for the detection of black foreign matter mixed into the optical film, but it is difficult to detect small air bubbles mixed into the surface of the optical film. On the other hand, reflection inspection is suitable for the detection of small air bubbles mixed into the surface of the optical film, but it is difficult to detect black foreign matter mixed into the inside of the optical film.
以下，例示對同一積層光學膜組合進行不同檢查之缺陷檢查方法。於該第2實施形態中，例示積層光學膜之缺陷檢查方法，但本發明之思想亦可應用於對單層光學膜組合進行不同檢查之缺陷檢查方法。 Hereinafter, a defect inspection method for performing different inspections on the same laminated optical film combination will be exemplified. In this second embodiment, a defect inspection method of a laminated optical film is exemplified, but the idea of the present invention can also be applied to a defect inspection method of performing a different inspection on a single-layer optical film combination.
圖11及圖12係表示本發明之第2實施形態之積層光學膜之缺陷檢查方法及製造方法之圖。圖13及圖15係表示圖11及圖12所示之缺陷檢查方法之不同步驟中的積層光學膜之一主面之圖，圖14及圖16係圖13及圖15所示之積層光學膜之剖視圖。 11 and 12 are diagrams showing a defect inspection method and a manufacturing method of a laminated optical film according to a second embodiment of the present invention. FIG. 13 and FIG. 15 are views showing one main surface of the laminated optical film in different steps of the defect inspection method shown in FIG. 11 and FIG. 12, and FIGS. 14 and 16 are laminated optical films shown in FIGS. 13 and 15. Cutaway view.
首先，如圖11所示，自原片輥101送出積層光學膜10B。然後，藉由配置於積層光學膜10B之另一主面10b側之光源(未圖示)而對積層光學膜10B照射光，且藉由配置於積層光學膜10B之一主面10a側之透過檢查器111而接收透過積層光學膜10B之光，並基於所接收之透過光而進行積層光學膜10B之缺陷檢查(第1檢查步驟，透過檢查)。 First, as shown in FIG. 11, the laminated optical film 10B is fed from the original sheet roll 101. Then, the laminated optical film 10B is irradiated with light by a light source (not shown) disposed on the other main surface 10b side of the laminated optical film 10B, and transmitted through a main surface 10a side of the laminated optical film 10B. The inspector 111 receives light transmitted through the laminated optical film 10B, and performs defect inspection of the laminated optical film 10B based on the received transmitted light (first inspection step, transmission inspection).
繼而，使用配置於積層光學膜10B之一主面10a側之噴墨印刷器113(藉由滴液法)，對應於第1檢查步驟中所檢測出之缺陷而於積層光學膜10A之一主面10a側的表面進行標記(第1標記步驟)。 Next, an inkjet printer 113 (by a dripping method) disposed on one of the main surfaces 10a of the laminated optical film 10B was used to correspond to the defect detected in the first inspection step to one of the laminated optical films 10A. The surface on the surface 10a side is marked (first marking step).
例如，如圖13及圖14所示，於檢測出因異物混入於積層光學膜10B內部而產生之3個缺陷20之情形時，對該等缺陷20之各者於X方向之兩側分別沿Y方向標記出線狀之標記30，藉此以夾入缺陷20之方式，換言之以包圍缺陷20之方式於積層光學膜10B之一主面10a側之表面進行標記。 For example, as shown in FIG. 13 and FIG. 14, when three defects 20 caused by foreign matter mixed in the laminated optical film 10B are detected, each of the defects 20 is along the two sides of the X direction, respectively. A linear mark 30 is marked in the Y direction, thereby marking the surface of one side of the main surface 10 a of the laminated optical film 10B by sandwiching the defect 20, in other words, by surrounding the defect 20.
於圖14中，概略性地僅表示圖13中之1個缺陷20，並且概略性地表示與該缺陷20對應之2個線狀之標記30。於圖11中，概略性地僅表示圖13中之1個缺陷20、及與該缺陷20對應之2個線狀之標記30。 In FIG. 14, only one defect 20 in FIG. 13 is schematically shown, and two linear marks 30 corresponding to the defect 20 are schematically shown. In FIG. 11, only one defect 20 in FIG. 13 and two linear marks 30 corresponding to the defect 20 are schematically shown.
繼而，將積層光學膜10B捲取於原片輥104上。 Then, the laminated optical film 10B is wound on the original sheet roll 104.
繼而，如圖12所示，自原片輥104送出積層光學膜10B。繼而，藉由配置於積層光學膜10B之一主面10a側之光源(未圖示)而對積層光學膜10B照射光，且藉由配置於積層光學膜10B之一主面10a側之檢查器115而接收於積層光學膜10B之一主面10a反射之光，並基於所接收之反射光而進行積層光學膜10B之缺陷檢查(第2檢查步驟，反射檢查)。於第2實施形態中，檢查器115為反射檢查器。 Then, as shown in FIG. 12, the laminated optical film 10B is fed out from the original sheet roll 104. Next, the laminated optical film 10B is irradiated with light by a light source (not shown) disposed on a main surface 10a side of the laminated optical film 10B, and an inspector disposed on a main surface 10a side of the laminated optical film 10B. 115, the light reflected from the main surface 10a of the laminated optical film 10B is received, and a defect inspection of the laminated optical film 10B is performed based on the received reflected light (second inspection step, reflection inspection). In the second embodiment, the inspector 115 is a reflection inspector.
於第2檢查步驟中，不對已於第1標記步驟中標記出之標記30進行檢測。即，於第2檢查步驟中，對未於第1檢查步驟中檢測出而於第2檢查步驟中首次檢測出之缺陷25進行檢測(參照圖15及圖16)。於檢查器115中，用以不對標記30進行檢測之方法可與第1實施形態相同。即，檢查器115亦可根據標記30之大小、形狀等而對其進行辨別。檢查器115可具備過濾器部，該過濾器部自被接收之反射光中所含之資訊將與標記30相關之資訊除去。 In the second inspection step, the marks 30 already marked in the first marking step are not detected. That is, in the second inspection step, a defect 25 that is not detected in the first inspection step and is first detected in the second inspection step is detected (see FIGS. 15 and 16). In the inspector 115, the method for not detecting the mark 30 may be the same as that of the first embodiment. That is, the inspector 115 can also distinguish the mark 30 based on the size, shape, and the like of the mark 30. The inspector 115 may include a filter section that removes information related to the mark 30 from the information contained in the received reflected light.
繼而，使用配置於積層光學膜10B之一主面10a側之噴墨印刷器119(藉由滴液法)，對應於第2檢查步驟中所檢測出之缺陷而於積層光學膜10B之一主面10a側的表面進行標記(第2標記步驟)。 Next, an inkjet printer 119 (by a dripping method) disposed on one of the main surfaces 10a of the laminated optical film 10B was used to correspond to a defect detected in the second inspection step to one of the laminated optical films 10B. The surface on the side of the surface 10a is marked (second marking step).
例如，如圖15及圖16所示，於檢測出因氣泡混入於積層光學膜10B表面而產生之2個缺陷25之情形時，對該等缺陷25之各者於X方向之兩側分別沿Y方向標記出線狀之標記31，藉此以夾入缺陷25之方式，換言之以包圍缺陷25之方式於積層光學膜10B之一主面10a側之表面進行標記。 For example, as shown in FIG. 15 and FIG. 16, when two defects 25 generated due to air bubbles mixed into the surface of the laminated optical film 10B are detected, each of these defects 25 is along the two sides of the X direction, respectively. A linear mark 31 is marked in the Y direction, thereby marking the surface of one side of the main surface 10a of the laminated optical film 10B by sandwiching the defect 25, in other words, by surrounding the defect 25.
於圖16中，與圖14同樣地，概略性地僅表示圖13中之1個缺陷 20，並且概略性地表示與該缺陷20對應之2個線狀之標記30。於圖16中，概略性地僅表示圖15中之1個缺陷25，並且概略性地表示與該缺陷25對應之2個線狀之標記31。於圖12中，與圖11同樣地，概略性地僅表示圖15中之1個缺陷20或25、及與該缺陷20或25對應之2個線狀之標記30或31。 In FIG. 16, like FIG. 14, only one defect in FIG. 13 is schematically shown. 20, and two linear marks 30 corresponding to the defect 20 are schematically shown. In FIG. 16, only one defect 25 in FIG. 15 is schematically shown, and two linear marks 31 corresponding to the defect 25 are schematically shown. In FIG. 12, like FIG. 11, only one defect 20 or 25 in FIG. 15 and two linear marks 30 or 31 corresponding to the defect 20 or 25 are schematically shown.
繼而，藉由原片輥107捲取積層光學膜10B。 Then, the laminated optical film 10B is wound by the original sheet roll 107.
於該第2實施形態之積層光學膜之缺陷檢查方法及製造方法中，亦可獲得與第1實施形態之積層光學膜之缺陷檢查方法及製造方法相同之優點。 The defect inspection method and manufacturing method of the multilayer optical film of the second embodiment also have the same advantages as the defect inspection method and manufacturing method of the multilayer optical film of the first embodiment.
本發明並不限定於上述本實施形態而可進行各種變化。例如，於本實施形態中，例示了進行2次缺陷檢查之形態，但本發明之思想亦可應用於進行3次以上缺陷檢查之形態。 The present invention is not limited to the above-mentioned embodiment and can be variously modified. For example, in this embodiment, a mode in which defect inspection is performed twice is exemplified, but the idea of the present invention can also be applied to a mode in which defect inspection is performed three or more times.
於本實施形態中，作為缺陷檢查之種類例示了透過檢查及反射檢查，但缺陷檢查之種類並不限定於此。本發明之思想亦可應用於包含正交偏光檢查等之缺陷檢查方法。 In this embodiment, examples of the type of defect inspection include transmission inspection and reflection inspection, but the type of defect inspection is not limited to this. The idea of the present invention can also be applied to defect inspection methods including orthogonal polarization inspection and the like.
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| KR20210035210A (en) * | 2018-07-30 | 2021-03-31 | 닛뽄 가야쿠 가부시키가이샤 | Marking device, marking method, polarizing plate manufacturing method, and polarizing plate |
| CN109212023A (en) * | 2018-09-07 | 2019-01-15 | 深圳市哈德胜精密科技股份有限公司 | A kind of graphite method of detection |
| CN111452514B (en) * | 2020-04-26 | 2021-01-12 | 杭州利珀科技有限公司 | Whole-line marking system and method for polarizing film |
| JP2022107419A (en) * | 2021-01-08 | 2022-07-21 | 日東電工株式会社 | Method for inspecting optical laminate film, and method for manufacturing film product |
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