TWI524065B - Transparent film detection system and its detection method - Google Patents
Transparent film detection system and its detection method Download PDFInfo
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Description
本發明係與檢測裝置有關；特別是指一種透光膜之檢測系統及其檢測方法。 The invention relates to a detecting device; in particular to a detecting system for a light transmissive film and a detecting method thereof.
隨著光學工業的進步，透光膜之應用已日漸普及於電子工業(如觸控面板之內層)與汽車工業(如隔熱紙)之中。而為方便運送，於透光膜製作完成後，通常將其捲捆於一長筒上，並於捲捆之同時一併檢測透光膜之表面上是否有刮痕、色塊等缺陷，並將透光膜有缺陷之對應部位圈起進行標記，以避免透光膜之使用者(如觸控面板與隔熱紙之製造商)誤用具有缺陷之透光膜，藉以確保透光膜使用時之品質。 With the advancement of the optical industry, the application of light-transmissive films has become increasingly popular in the electronics industry (such as the inner layer of touch panels) and the automotive industry (such as insulation paper). In order to facilitate the transportation, after the light-transmissive film is completed, it is usually bundled on a long cylinder, and at the same time as the bundle is bundled, the surface of the light-transmissive film is detected for scratches, color patches and the like, and Marking the corresponding parts of the transparent film with defects to prevent the user of the transparent film (such as the manufacturer of the touch panel and the thermal insulation paper) from misusing the defective transparent film to ensure the use of the transparent film. Quality.
除上述刮痕、色塊等缺陷會影響到透光膜之光學特性外，透光膜之膜厚是否一致，亦會對透光膜之光學效果造成影響。然而，一般來說，由於製作完成後之透光膜材積過大，而使得透光膜進行膜厚檢測之時機，通常是透光膜待加工而進行裁切成預訂大小後，以目視之方式查看裁切後之透光膜是否有透光不正常的情況，而此方法不僅耗時耗力，且亦常有檢測失誤之情形發生。除此之外，當裁切後之透光膜發現膜厚不正常時，僅能將整份裁切後之透光膜報廢，而易導致原物料之浪費、亦或是將其裁切成更小面積的透光膜，但再度裁切後之透光膜可能有過小或形狀不合之情形發生。是以，由上述說明可知悉，習用檢測膜厚之方法仍 未臻完善，而尚有待改進之處。 In addition to the above-mentioned scratches, color patches and other defects affecting the optical properties of the light-transmissive film, whether the film thickness of the light-transmissive film is uniform or not affects the optical effect of the light-transmissive film. However, in general, since the light-transmissive film material is too large after the production is completed, the film thickness of the light-transmissive film is detected. Usually, the light-transmissive film is processed and cut into a predetermined size, and then viewed visually. Whether the light-transmissive film after cutting has abnormal light transmission, and this method is not only time-consuming and labor-intensive, but also often has a detection error. In addition, when the film thickness after the cutting is found to be abnormal, only the entire cut light film can be scrapped, which may easily lead to waste of the original material or cut into A lighter film of a smaller area, but the light film after re-cutting may be too small or the shape is not suitable. Therefore, it can be known from the above description that the method of detecting the film thickness is still used. Not perfect, but there is still room for improvement.
有鑑於此，本發明之目的用於提供一種透光膜之檢測系統及其檢測方法，於透光膜製作完成而進行捲捆之同時即可進行檢測，不僅簡便快速，亦不會導致原物料過度浪費的情形。 In view of the above, the object of the present invention is to provide a detection system for a light-transmissive film and a detection method thereof, which can be detected at the same time as the light-transparent film is completed, which is not only simple and fast, but also does not cause raw materials. Excessive waste.
緣以達成上述目的，本發明所提供透光膜之檢測系統用以檢測一透光膜的膜厚是否異常，該檢測系統包括一基準件、一驅動裝置、一攝像裝置以及一處理器。其中，該基準件位於該透光膜之一側，且具有一檢測面朝向該透光膜，而該檢測面上設有複數條間隔排列的檢測線，且該等檢測線之顏色不同於該檢測面之顏色。該驅動裝置係與該透光膜連接，以帶動該透光膜相對該基準件移動者。該攝像裝置位於該透光膜之另一側，且朝向該透光膜以及該基準件，並用以持續地拍攝該透光膜受該驅動裝置帶動而移動時，該基準件透過該透光膜所顯示具有間隔排列之線條的影像。該處理器電性連接該攝像裝置，並比對該攝像裝置持續拍攝取得之線條影像是否產生歪曲，藉以判斷該透光膜的膜厚是否異常。 In order to achieve the above object, the detection system of the transparent film provided by the present invention is used to detect whether the film thickness of a light transmissive film is abnormal. The detection system includes a reference member, a driving device, a camera device and a processor. The reference member is located on one side of the transparent film, and has a detecting surface facing the transparent film, and the detecting surface is provided with a plurality of detecting lines arranged at intervals, and the colors of the detecting lines are different from the Detect the color of the face. The driving device is connected to the light transmissive film to drive the light transmissive film to move relative to the reference member. The image pickup device is disposed on the other side of the light transmissive film, and faces the light transmissive film and the reference member, and is used to continuously capture that the light transmissive film is moved by the driving device, and the reference member passes through the transparent film. An image with spaced lines is displayed. The processor is electrically connected to the imaging device and determines whether the film thickness of the light transmissive film is abnormal or not due to distortion of the line image obtained by continuously capturing the imaging device.
依據上述構思，本發明更提供有一種檢測方法，用以檢測一透光膜的膜厚是否異常，且包括下列步驟：A.帶動該透光膜相對複數條間隔排列的檢測線移動；B.持續地拍攝該等檢測線透過該透光膜所顯示具有間隔排列之線條的影像；C.比對該攝像裝置持續拍攝取得之線條影像是否產生歪曲； 若是，則表示歪曲之線條所對應之該透光膜的部位的膜厚異常；若否，則表示該透光膜的膜厚正常。 According to the above concept, the present invention further provides a detecting method for detecting whether the film thickness of a light transmissive film is abnormal, and comprising the following steps: A. driving the light transmissive film to move relative to a plurality of spaced detection lines; Continuously capturing images of the lines arranged by the detection lines through the transparent film; C. Whether the line images obtained by continuously capturing the camera are distorted; If so, it means that the film thickness of the portion of the light-transmissive film corresponding to the curved line is abnormal; if not, it means that the film thickness of the light-transmissive film is normal.
藉此，透過上述之設計，透光膜製作完成而進行捲捆之同時，即可進行膜厚之檢測，不僅檢測簡便快速，亦不會導致原物料過度浪費的情形。 Thereby, through the above design, the light-transmissive film is completed and bundled, and the film thickness can be detected, which is not only simple and rapid, but also causes excessive waste of raw materials.
10‧‧‧驅動裝置 10‧‧‧ drive
20‧‧‧基準件 20‧‧‧ benchmark
22‧‧‧檢測面 22‧‧‧Detection surface
24‧‧‧檢測線 24‧‧‧Test line
30‧‧‧攝像裝置 30‧‧‧ Camera
40‧‧‧處理器 40‧‧‧ processor
50‧‧‧標記裝置 50‧‧‧ marking device
100‧‧‧透光膜 100‧‧‧Transparent film
P‧‧‧點 P‧‧‧ points
L‧‧‧線條 L‧‧‧ lines
L’‧‧‧線條 L’‧‧‧ lines
X‧‧‧標記 X‧‧‧ mark
H‧‧‧凹陷 H‧‧‧ dent
圖1為本發明較佳實施例之檢測系統的立體圖；圖2為本發明攝像裝置每次拍攝所取得之影像畫面；圖3係將攝像裝置拍攝取得之影像畫面組合後的影像；圖4係一側視圖，用以顯示透光膜之膜厚異常處；圖5為本發明之檢測系統於膜厚異常處所顯示的影像。 1 is a perspective view of a detection system according to a preferred embodiment of the present invention; FIG. 2 is an image of the image taken by the camera device of the present invention; FIG. 3 is an image obtained by combining the image frames captured by the camera device; A side view for showing an abnormal film thickness of the light-transmissive film; and FIG. 5 is an image displayed by the detection system of the present invention at an abnormal film thickness.
為能更清楚地說明本發明，茲舉較佳實施例並配合圖示詳細說明如後。請參圖1所示，本發明較佳實施例之檢測系統用以檢測一透光膜100的膜厚是否異常，且包含有一驅動裝置10、一基準件20、一攝像裝置30、一處理器40以及一標記裝置50。其中：該驅動裝置10係與該透光膜100連接，以帶動該透光膜100依一移動路徑移動。於本實施例中，該驅動裝置10為一滾動筒，用以將製作完成之該透光膜100滾捲成捆，且於滾捲之同時帶動該透光膜100移動。 In order that the present invention may be more clearly described, the preferred embodiments are illustrated in the accompanying drawings. As shown in FIG. 1 , the detection system of the preferred embodiment of the present invention is configured to detect whether the film thickness of a transparent film 100 is abnormal, and includes a driving device 10 , a reference member 20 , an imaging device 30 , and a processor . 40 and a marking device 50. The driving device 10 is connected to the transparent film 100 to drive the transparent film 100 to move according to a moving path. In the embodiment, the driving device 10 is a rolling cylinder for rolling the fabricated transparent film 100 into a bundle, and driving the transparent film 100 to move while rolling.
該基準件20位於該透光膜100之移動路徑下 方，且於本實施例中，該基準件20為一長條狀之光源，其發光面形成一檢測面22，且檢測面22上設有複數條沿該基準件20延伸方向等間隔地排列的檢測線24，而該等檢測線24相互平行，且該等檢測線24之排列方向垂直於該透光膜100之移動方向。另外，於本實施例中，該光源之光色為白光，使檢測面22呈現白色表面，而該等檢測線24之顏色為黑色，並以具有遮光特性之材料製成，而使得該檢測面22於該等檢測線24之間產生有光線射往該透光膜100。值得一提的是，該等檢測線24選用黑色不透光的原因，在於黑色為白色(即該檢測面22所呈現之顏色)之對比色，而使得該等檢測線24可明顯地呈現於該檢測面22上。當然，在實際實施上，該檢測面22與該檢測線24亦可選用其他顏色，並不以上述之黑色與白色為限。 The reference member 20 is located under the moving path of the transparent film 100 In the present embodiment, the reference member 20 is an elongated light source, and the light emitting surface thereof forms a detecting surface 22, and the detecting surface 22 is provided with a plurality of strips arranged at equal intervals along the extending direction of the reference member 20. The detection lines 24 are parallel to each other, and the arrangement direction of the detection lines 24 is perpendicular to the moving direction of the light transmissive film 100. In addition, in this embodiment, the light color of the light source is white light, so that the detecting surface 22 presents a white surface, and the color of the detecting lines 24 is black, and is made of a material having a light blocking property, so that the detecting surface A light is generated between the detection lines 24 to be incident on the light transmissive film 100. It is worth mentioning that the reason why the detection lines 24 are black and opaque is that the contrast color of black is white (that is, the color of the detection surface 22), so that the detection lines 24 can be clearly presented in the On the detection surface 22. Of course, in actual implementation, the detecting surface 22 and the detecting line 24 may also be of other colors, and are not limited to the above black and white.
該攝像裝置30電性連接該處理器40，且位於該透光膜100之移動路徑上方，並正對該基準件20，用以持續地拍攝該透光膜100受該驅動裝置10帶動而移動時，該基準件20透過該透光膜100所顯示的影像，並將所拍攝之影像傳送予該處理器40。 The camera device 30 is electrically connected to the processor 40 and located above the moving path of the transparent film 100, and is facing the reference member 20 for continuously capturing that the transparent film 100 is moved by the driving device 10 The reference member 20 transmits the image displayed by the transparent film 100 and transmits the captured image to the processor 40.
另外，請參閱圖2，該攝像裝置30每次拍攝所取得之影像畫面係呈線狀，且該線狀係沿該等檢測線24之排列方向延伸，而於該線狀之影像畫面中，各該檢測線24對應形成有一點P，而使得該攝像裝置30持續拍攝後，該等點P如圖3所示般連接組合而對應形成平行之線條L的影像。 In addition, referring to FIG. 2, the image frame obtained by the imaging device 30 is linear in a line shape, and the line is extended along the arrangement direction of the detection lines 24, and in the linear image frame, Each of the detection lines 24 is formed with a point P, and after the imaging device 30 continues to capture, the points P are connected and combined as shown in FIG. 3 to correspond to the images forming the parallel lines L.
再者，請參閱圖4，當該透光膜100之膜厚異常(如凹陷H)時，該基準件20上之檢測線24透過該凹陷H處所形成的點P，將因為膜厚差異所造成之光學特性的改變而位移(如相互接近)，進而使得該透光膜100異常處所 對應之線條L’的影像將如圖5所示般歪曲。 Furthermore, referring to FIG. 4, when the film thickness of the transparent film 100 is abnormal (such as the depression H), the detection line 24 on the reference member 20 passes through the point P formed at the depression H, because of the difference in film thickness. Displacement (such as proximity to each other) caused by changes in optical characteristics, thereby causing the transparent film 100 to be abnormally placed The image of the corresponding line L' will be distorted as shown in FIG.
如此一來，該處理器40於接收該攝像裝置30所持續拍攝取得之線條L的影像後，便可比對線條L的影像是否產生歪曲之現象，進而判斷該透光膜100的膜厚是否異常。另外，透過上述之該基準件20朝向該透光膜100發光之設計，更可同時比對該攝像裝置30所持續拍攝取得之影像是否有陰影之現象，而可判斷出該透光膜100是否有刮痕、色塊等會造成陰影產生之缺陷。 In this way, after receiving the image of the line L continuously captured by the imaging device 30, the processor 40 can compare whether the image of the line L is distorted or not, and further determine whether the film thickness of the transparent film 100 is abnormal. . In addition, through the above-mentioned design of the reference member 20 emitting light toward the transparent film 100, it is possible to determine whether the transparent film 100 is shadowed or not by a phenomenon that the image obtained by the image capturing device 30 is continuously captured. There are scratches, color blocks, etc. that can cause shadow defects.
該標記裝置50與該處理器40電性連接，用以當該處理器40判斷出該透光膜100的膜厚異常、或是該透光膜100有刮痕、色塊等缺陷時，產生一標記X於該透光膜100對應該異常處的位置上。而於本實施例中，該標記裝置50係以點墨之方式產生該標記X於該透光膜100之邊緣上，當該透光膜100待進行二次加工時，便可將依據該標記之位置，直接將該透光膜100對應膜厚異常的部位切除即可，而非裁切後才進行膜厚之比對，如此一來，便不會造成原物料過度浪費的情形。 The marking device 50 is electrically connected to the processor 40, and is configured to generate when the processor 40 determines that the film thickness of the transparent film 100 is abnormal or the light-transmissive film 100 has defects such as scratches and color patches. A mark X is at a position where the light-transmissive film 100 corresponds to an abnormality. In the embodiment, the marking device 50 generates the marking X on the edge of the transparent film 100 by means of spot ink. When the transparent film 100 is to be subjected to secondary processing, the marking can be performed according to the marking. The position of the light-transmissive film 100 corresponding to the abnormal film thickness can be directly cut off, and the film thickness is not compared after the cutting, so that the original material is not excessively wasted.
另外，該透光膜100對應膜厚異常的部位切除後，被切除之部份中，膜厚正常的區域仍可被切成更小面積的該透光膜100使用，而該透光膜100於二次切除時，其邊緣通常會一併切除，而將該標記X形成於邊緣，便具有不會影響到二次切除作業之優點。 In addition, after the light-transmissive film 100 is cut away from the portion where the film thickness is abnormal, the region where the film thickness is normal can be cut into a smaller area of the light-transmissive film 100, and the light-transmissive film 100 is used. When the second resection is performed, the edges thereof are usually cut off together, and the mark X is formed at the edge, which has the advantage that the secondary resection operation is not affected.
藉此，透過上述檢測系統之設計，該透光膜100製作完成而進行捲捆之同時，除進行刮痕、色塊等缺陷之檢測外，亦可同步進行膜厚之檢測，不僅檢測簡便快速，亦不會導致原物料過度浪費的情形。 Therefore, through the design of the detection system, the light-transmissive film 100 is completed and bundled, and in addition to detecting defects such as scratches and color patches, the film thickness can be detected simultaneously, which is not only simple and quick to detect. It will not cause excessive waste of raw materials.
以上所述僅為本發明較佳可行實施例而已，舉凡應用本發明說明書及申請專利範圍所為之等效變化，理應 包含在本發明之專利範圍內。 The above description is only for the preferred embodiments of the present invention, and the equivalent changes should be applied to the application of the present specification and the scope of the patent application. It is included in the scope of the patent of the present invention.
10‧‧‧驅動裝置 10‧‧‧ drive
20‧‧‧基準件 20‧‧‧ benchmark
22‧‧‧檢測面 22‧‧‧Detection surface
24‧‧‧檢測線 24‧‧‧Test line
30‧‧‧攝像裝置 30‧‧‧ Camera
40‧‧‧處理器 40‧‧‧ processor
50‧‧‧標記裝置 50‧‧‧ marking device
100‧‧‧透光膜 100‧‧‧Transparent film
X‧‧‧標記 X‧‧‧ mark
H‧‧‧凹陷 H‧‧‧ dent
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