TWI484526B - - Google Patents

Info

Publication number
TWI484526B
TWI484526B TW101143573A TW101143573A TWI484526B TW I484526 B TWI484526 B TW I484526B TW 101143573 A TW101143573 A TW 101143573A TW 101143573 A TW101143573 A TW 101143573A TW I484526 B TWI484526 B TW I484526B
Authority
TW
Taiwan
Application number
TW101143573A
Other versions
TW201334022A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW201334022A publication Critical patent/TW201334022A/zh
Application granted granted Critical
Publication of TWI484526B publication Critical patent/TWI484526B/zh

Links

TW101143573A 2011-12-20 2012-11-21 一種應用於等離子處理裝置的氣體分佈系統及驗證方法 TW201334022A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110431014.5A CN103177923B (zh) 2011-12-20 2011-12-20 一种应用于等离子处理装置的气体分布***及验证方法

Publications (2)

Publication Number Publication Date
TW201334022A TW201334022A (zh) 2013-08-16
TWI484526B true TWI484526B (zh) 2015-05-11

Family

ID=48637704

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101143573A TW201334022A (zh) 2011-12-20 2012-11-21 一種應用於等離子處理裝置的氣體分佈系統及驗證方法

Country Status (2)

Country Link
CN (1) CN103177923B (zh)
TW (1) TW201334022A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104916517B (zh) * 2014-03-11 2017-06-09 上海华虹宏力半导体制造有限公司 反应腔与石英管的隔离装置及其控制方法
CN105590825A (zh) * 2014-11-03 2016-05-18 中微半导体设备(上海)有限公司 气体输送装置及等离子体处理装置
CN112563105B (zh) * 2019-09-10 2023-11-03 中微半导体设备(上海)股份有限公司 等离子体处理装置中实现气体流量验证的***及方法
TWI742453B (zh) * 2019-10-23 2021-10-11 樂華科技股份有限公司 氣體檢測裝置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI235902B (en) * 2003-06-20 2005-07-11 Fujikin Kk Gas distribution supply device and gas distribution supply method for supplying air to chamber by gas supply equipment with flow control device
JP2007242976A (ja) * 2006-03-10 2007-09-20 Hitachi High-Technologies Corp 半導体製造装置および分流器診断方法
TW200839870A (en) * 2006-11-17 2008-10-01 Lam Res Corp Methods for performing actual flow verification
US20100297783A1 (en) * 2005-05-17 2010-11-25 Shoji Ikuhara Plasma Processing Method
JP4620537B2 (ja) * 2005-07-21 2011-01-26 東京エレクトロン株式会社 プラズマ処理装置およびプラズマ処理装置の制御方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4550507B2 (ja) * 2004-07-26 2010-09-22 株式会社日立ハイテクノロジーズ プラズマ処理装置
US7846497B2 (en) * 2007-02-26 2010-12-07 Applied Materials, Inc. Method and apparatus for controlling gas flow to a processing chamber

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI235902B (en) * 2003-06-20 2005-07-11 Fujikin Kk Gas distribution supply device and gas distribution supply method for supplying air to chamber by gas supply equipment with flow control device
US20100297783A1 (en) * 2005-05-17 2010-11-25 Shoji Ikuhara Plasma Processing Method
JP4620537B2 (ja) * 2005-07-21 2011-01-26 東京エレクトロン株式会社 プラズマ処理装置およびプラズマ処理装置の制御方法
JP2007242976A (ja) * 2006-03-10 2007-09-20 Hitachi High-Technologies Corp 半導体製造装置および分流器診断方法
TW200839870A (en) * 2006-11-17 2008-10-01 Lam Res Corp Methods for performing actual flow verification

Also Published As

Publication number Publication date
CN103177923B (zh) 2016-05-11
CN103177923A (zh) 2013-06-26
TW201334022A (zh) 2013-08-16

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