TWI429485B - A part sorting device and an electronic component meaning checking and sorting device using the same - Google Patents
A part sorting device and an electronic component meaning checking and sorting device using the same Download PDFInfo
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Description
本發明是關於一種可吸附搬運著小型又極薄且質量小的零件能夠不損傷零件確實讓零件收納在收納箱的零件分類裝置及使用該裝置之電子零件特性檢查分類裝置。The present invention relates to a component sorting device capable of adsorbing and transporting a small, extremely thin and small-sized component capable of accommodating a component in a storage box without damaging a component, and an electronic component characteristic inspection and sorting device using the same.
習知，針對零件搬運裝置及搬運零件使零件收納在收納箱的分類裝置等已經有多數提案。專利文獻1中記載的「物品移動排出裝置」是對電子零件進行搬運利用重力排出。專利文獻2中記載的「小型零件供應搬運裝置」是利用負壓吸附搬運零件加以分類。專利文獻3中記載的「石英晶體振子的頻率分類裝置及真空吸附裝置」的發明是提案一種可吸附搬運著小型又極薄且質量小的零件讓零件收納在收納箱所謂使用P&P裝置於排出時進行真空抽取和空氣送出之轉換的裝置。It is known that many proposals have been made for a component transporting device and a sorting device for transporting components to a storage box. In the "item movement and discharge device" described in Patent Document 1, the electronic components are conveyed by gravity discharge. The "small parts supply and conveyance device" described in Patent Document 2 is classified by a vacuum suction conveying member. The invention of the "frequency classification device and vacuum adsorption device for a quartz crystal resonator" described in Patent Document 3 proposes a device that can adsorb and transport small, extremely thin, and small-sized components, and store the components in a storage box, so that the P&P device is used for discharge. A device for performing vacuum extraction and air delivery conversion.
[專利文獻1]日本特許第3998296號公報[專利文獻2]日本特許第3532124號公報[專利文獻3]日本特開2001－165978號公報[Patent Document 1] Japanese Patent No. 3, 998, 296 (Patent Document 2) Japanese Patent No. 3532124 (Patent Document 3) Japanese Patent Laid-Open Publication No. 2001-165978
上述專利文獻3中記載的裝置，在吸附著零件的吸附嘴帶有靜電時為了僅只要在關閉吸附的狀況下利用靜電就 能夠讓零件不脫落吸附在吸附嘴是對吸附開關進行閉關的同時並用吐出空氣。該吐出空氣會讓零件順勢飛出至收納箱內，碰撞到收納箱壁面或已經收納在收納箱內的零件，因此會有損傷到零件的問題點。In the device described in Patent Document 3, when the adsorption nozzle that adsorbs the component is electrostatically charged, it is only necessary to use static electricity in the case of closing the adsorption. It is possible to let the parts not fall off and adsorb on the adsorption nozzle to close the adsorption switch and use the air to be discharged. This spitting air causes the parts to fly out into the storage box and collide with the wall surface of the storage box or the parts already stored in the storage box, which may cause damage to the parts.
本發明第1目的是解決上述問題點，提供一種可吸附搬運著小型又極薄且質量小的零件能夠不損傷零件確實讓零件收納在收納箱的零件分類裝置。A first object of the present invention is to solve the above problems and to provide a component sorting device capable of adsorbing and transporting a small, extremely thin, and small-sized component so that components can be stored in a storage box without damaging the components.
本發明第2目的是提供一種使用上述零件分類裝置之電子零件特性檢查分類裝置。A second object of the present invention is to provide an electronic component characteristic inspection and classification device using the above-described component sorting device.
為了解決上述問題點，本發明申請專利範圍第1項記載的零件分類裝置，是由：複數收納箱；由網眼板和吸排出部形成，配置在上述各收納箱上暫時承接位置的暫時承接手段；在搬出位置對零件進行吸附搬運直到零件位於面對著上述暫時承接手段網眼板一面的位置為止才退縮的吸附嘴；及對上述吸附嘴和吸排出部的壓力進行控制以暫時承接手段承接著零件讓零件落入收納箱的壓力控制手段所構成。In order to solve the above problems, the component sorting device according to the first aspect of the present invention is characterized in that: the plurality of storage boxes are formed by the mesh plate and the suction and discharge portion, and are temporarily placed at the temporary receiving positions of the respective storage boxes. a means for adsorbing and transporting a part at a carry-out position until the part is located at a position facing one side of the mesh panel of the temporary receiving means; and controlling the pressure of the suction nozzle and the suction discharge portion to temporarily take over means It is composed of pressure control means for the parts to fall into the storage box.
本發明申請專利範圍第2項記載的零件分類裝置，是於申請專利範圍第1項記載的零件分類裝置中，上述吸附嘴的基部和上述暫時承接手段是支撐在共同的移動托座設置成可從上述搬出位置移動至暫時承接位置，上述吸附嘴是可在上述暫時承接位置移動至接近上述網眼板的位置及 離開上述網眼板的位置。In the component sorting device according to the first aspect of the invention, the base of the nozzle and the temporary receiving means are supported by a common moving bracket. Moving from the unloading position to the temporary receiving position, the suction nozzle is movable to a position close to the mesh panel at the temporary receiving position and Leave the position of the above mesh plate.
本發明申請專利範圍第3項記載的零件分類裝置，是於申請專利範圍第1項記載的零件分類裝置中，其特徵為，透過對上述吸排出部選擇連接負壓或正壓就可構成電子零件從暫時承接位置脫離。The component sorting device according to the third aspect of the present invention is characterized in that the component sorting device according to the first aspect of the invention is characterized in that the negative or negative pressure is selectively connected to the suction and discharge portion to constitute an electron. The part is detached from the temporary receiving position.
本發明申請專利範圍第4項記載的電子零件特性檢查分類裝置，其是一種對電子零件的特性進行檢查加以分類的裝置，其構成為；具有：可將供應斗所供應的電子零件搭載在供應平台上加以旋轉的供應平台部；可對散落在上述供應平台上的上述電子零件進行照相加以圖像處理的照相機部；根據上述電子零件圖像處理後的資訊從上述供應平台的上述電子零件搬出位置一個一個地吸附上述電子零件搬運配置至配送位置的供應P&P部；在上述配送位置於測定平台部的測定平台上承接電子零件對電子零件進行測定產生分類訊號的測定部；及由1個以上的收納箱，和網眼板及吸排出部所形成配置在上述各收納箱上暫時承接位置的暫時承接手段，和從上述測定部的搬出位置吸附電子零件進行搬運直到電子零件位於面對著根據上述分類訊號所選出的收納箱的上述暫時承接手段網眼板一面的位置為止才退縮的吸附嘴，及對上述吸附嘴和吸排出部的壓力進行控制以暫時承接手段承接著零件讓零件落入收納箱的壓力控制手段所構成的零件分類部。The electronic component characteristic inspection and classification device according to the fourth aspect of the invention is the device for inspecting and classifying the characteristics of the electronic component, and configured to: mount the electronic component supplied from the supply bucket on the supply a supply platform portion that rotates on the platform; a camera portion that can perform image processing on the electronic component scattered on the supply platform; and image information processed from the electronic component is carried out from the electronic component of the supply platform a supply P&P unit that adsorbs and transports the electronic component to the delivery position one by one; and a measurement unit that measures the electronic component to measure the electronic component by the electronic component at the measurement platform on the measurement platform; and one or more The storage box, the mesh plate and the suction discharge portion are formed by temporary receiving means disposed at the temporary receiving positions of the storage boxes, and the electronic components are sucked from the carrying-out position of the measuring unit until the electronic components are placed facing each other. The above temporary storage box selected by the above classification signal a nozzle that is retracted from the position of one side of the mesh plate, and a part classification that controls the pressure of the suction nozzle and the suction discharge portion to temporarily receive the pressure control means for the component to drop the component into the storage box unit.
本發明申請專利範圍第5項記載的電子零件特性檢查分類裝置，其是於申請專利範圍第4項記載的電子零件特 性檢查分類裝置中，其特徵為，上述供應平台部的供應平台具有圓環狀淺溝槽，賦有和驅動馬達主要旋轉方向反方向的旋轉振動，構成為可消除上述淺溝槽內電子零件的重疊。The electronic component characteristic inspection and classification device according to the fifth aspect of the invention is the electronic component described in claim 4 The inspection type classification device is characterized in that the supply platform of the supply platform portion has an annular shallow groove and is provided with a rotational vibration in a direction opposite to a main rotation direction of the drive motor, and is configured to eliminate the electronic components in the shallow groove. overlapping.
本發明申請專利範圍第6項記載的電子零件特性檢查分類裝置，係於申請專利範圍第4項記載的電子零件特性檢查分類裝置中，其特徵為，上述測定平台部的測定平台設有定位機構，該定位機構具有可讓上述電子零件定位在由上述供應P&P部將上述電子零件搬運至上述測定平台上一定位置的一對定位爪。The electronic component characteristic inspection and classification device according to the fourth aspect of the invention is characterized in that the measurement platform of the measurement platform unit is provided with a positioning mechanism. The positioning mechanism has a pair of positioning claws for positioning the electronic component at a predetermined position on the measurement platform by the supply P&P unit.
本發明申請專利範圍第7項記載的電子零件特性檢查分類裝置，係於申請專利範圍第4項記載的電子零件特性檢查分類裝置中，其特徵為，於上述測定部，為了讓上電極和上述測定平台上測定的上述電子零件表面之間保持一定間隙構成有和上電極支架成一體配置可對上述測定平台表面為止的距離進行測定的檢測器。The electronic component characteristic inspection and classification device according to the fourth aspect of the invention is characterized in that, in the measuring unit, the upper electrode and the upper electrode are A detector having a constant gap between the surfaces of the electronic components measured on the measurement platform and integrated with the upper electrode holder is provided to measure the distance from the surface of the measurement platform.
本發明申請專利範圍第8項記載的電子零件特性檢查分類裝置，係於申請專利範圍第4項記載的電子零件特性檢查分類裝置中，其特徵為，為了強制排除留在上述測定平台上檢查完畢的上述電子零件，構成為設有可在上述測定部的測定平台的搬出位置時常退縮在上方，於排出時下降至測定平台的搬出位置表面利用排出斜面的排出爪。The electronic component characteristic inspection and classification device according to the invention of claim 4 is characterized in that the electronic component characteristic inspection and classification device according to the fourth aspect of the invention is characterized in that the inspection is completed in order to be forcibly excluded from the measurement platform. The electronic component is configured to be provided with a discharge claw that can be retracted upward at the time of carrying out the measurement platform of the measurement unit, and that is lowered to the surface of the removal position of the measurement platform at the time of discharge.
本發明申請專利範圍第9項記載的電子零件特性檢查分類裝置，係於申請專利範圍第4項記載的電子零件特性 檢查分類裝置中，其特徵為，在由上述供應P&P部將電子零件從上述供應平台搬運往上述測定平台的搬運路徑下方設有上述電子零件圖像處理用的照相機和照明，構成為可對上述路徑移動中的上述電子零件進行照相，根據上述圖像處理檢查上述電子零件的外觀。The electronic component characteristic inspection and classification device according to the ninth aspect of the present invention is the electronic component characteristic described in claim 4 The inspection sorting device is characterized in that the camera and the illumination for image processing of the electronic component are provided below the conveyance path for transporting the electronic component from the supply platform to the measurement platform by the supply P&P unit, and the illumination device is configured to be The electronic component in the path movement is photographed, and the appearance of the electronic component is inspected based on the image processing described above.
根據本發明申請專利範圍第1項至第3項記載的零件分類裝置時，小型又極薄且質量小的零件是能夠由吸附嘴從上述零件搬出位置吸附搬往收納位置，能夠讓零件收納在上述收納位置上設置的收納箱。即，利用上述裝置，能夠獲得不損傷到零件讓零件確實收納在收納箱的效果。再加上，更詳細地說，根據申請專利範圍第1項記載的構成時，是以暫時承接手段承接著零件讓零件落入收納箱，因此零件不會因空氣原故造成加速能夠安靜落下形成分類。根據申請專利範圍第2項記載的構成時，能夠讓上述吸附嘴和上述暫時承接手段的位置關係保持正確。根據申請專利範圍第3項記載的構成時，能夠讓零件確實從暫時承接部脫離。另，值得注意的是脫離方向並非下方向。According to the component sorting device according to the first to third aspects of the present invention, the small, extremely thin, and small-sized component can be sucked from the component carrying position to the storage position by the suction nozzle, and the component can be stored in the container. a storage box provided at the storage position. In other words, with the above-described apparatus, it is possible to obtain an effect that the parts are not stored in the storage box without damaging the parts. In addition, in more detail, according to the configuration described in the first paragraph of the patent application, the parts are placed under the temporary receiving means to allow the parts to fall into the storage box, so that the parts are not accelerated by the air, and can be quietly dropped to form a classification. . According to the configuration described in the second aspect of the patent application, the positional relationship between the suction nozzle and the temporary receiving means can be kept correct. According to the configuration described in the third paragraph of the patent application, the component can be surely detached from the temporary receiving portion. In addition, it is worth noting that the direction of departure is not the downward direction.
根據具備有上述零件分類裝置組入形成的分類部之申請專利範圍第4項至第9項記載的電子零件特性檢查分類裝置時，可提供一種具有能夠不損傷零件確實讓零件收納在收納箱效果的電子零件特性檢查分類裝置。又，更詳細地說，根據申請專利範圍第4項記載的構成時，能夠在不 損傷石英晶體振子片等電子零件的狀況下連續進行電子零件檢查分類。根據申請專利範圍第5項記載的構成時，能夠消除上述供應平台部的供應平台上電子零件的重疊。根據申請專利範圍第6項記載的構成時，能夠讓上述電子零件定位在上述測定平台的一定位置。根據申請專利範圍第7項記載的構成時，能夠保持正確的電極間距離。根據申請專利範圍第8項記載的構成時，能夠確實排除其餘檢查完畢的零件。根據申請專利範圍第9項記載的構成時，能夠進行測定前的電子零件外觀檢查。According to the electronic component characteristic inspection and classification device described in Items 4 to 9 of the patent application scope of the classification unit formed by the above-described component classification device, it is possible to provide an effect of accommodating the components in the storage box without damaging the components. Electronic component characteristic inspection classification device. Further, in more detail, according to the configuration described in the fourth item of the patent application, it is possible to The electronic component inspection and classification are continuously performed under the condition of damage to the electronic components such as the quartz crystal oscillator piece. According to the configuration described in the fifth aspect of the patent application, it is possible to eliminate the overlap of the electronic components on the supply platform of the supply platform unit. According to the configuration described in the sixth aspect of the patent application, the electronic component can be positioned at a predetermined position on the measurement platform. According to the configuration described in the seventh aspect of the patent application, the correct distance between the electrodes can be maintained. According to the configuration described in the eighth aspect of the patent application, it is possible to surely exclude the remaining parts that have been inspected. According to the configuration described in the ninth application patent range, the appearance inspection of the electronic component before the measurement can be performed.
以下，參照圖面等說明本發明的零件分類裝置及使用該零件分類裝置的電子零件特性檢查分類裝置之實施形態。Hereinafter, an embodiment of the component sorting apparatus of the present invention and the electronic component characteristic inspection and sorting apparatus using the component sorting apparatus will be described with reference to the drawings and the like.
第1圖是組入有本發明分類部的電子零件特性檢查分類裝置實施例正面圖。第2圖是表示本發明電子零件特性檢查分類裝置實施例電子零件散落在供應平台溝槽時的狀況平面圖。第3圖是表示電子零件特性檢查分類裝置實施例供應平台上設置的照相機和照明的正面圖。Fig. 1 is a front elevational view showing an embodiment of an electronic component characteristic inspection and classification device incorporating the classification unit of the present invention. Fig. 2 is a plan view showing the state in which the electronic component of the embodiment of the electronic component characteristic inspection and classification device of the present invention is scattered on the supply platform groove. Fig. 3 is a front elevational view showing the camera and illumination provided on the supply platform of the embodiment of the electronic component characteristic inspection and classification device.
上述實施例是一種對電子零件特性進行檢查加以分類的裝置，從供應斗102供應電子零件101(參照第2圖)。設置成可旋轉的供應平台部1是搭載著來自供應斗102所供應的電子零件101進行旋轉。照相機暨照明部2是配 置在供應平台部1的供應平台103上，對供應平台103上搭載的電子零件101進行照相加以圖像處理。供應P&P部3是根據電子零件101經圖像處理後的資訊從供應平台103的電子零件101取出位置一個一個地吸附電子零件101進行搬運配置在指定位置。另，P&P是PICKUP AND PLACE的簡稱，為該當業者的慣用詞。測定部5是在上述指定位置將電子零件承接在旋轉平台(測定平台部4)上對電子零件特性進行測定產生分類訊號。The above embodiment is a device for inspecting and classifying the characteristics of electronic components, and supplies the electronic component 101 from the supply hopper 102 (see Fig. 2). The supply platform unit 1 that is provided to be rotatable is mounted with the electronic component 101 supplied from the supply hopper 102 and rotated. Camera and lighting department 2 is equipped The electronic component 101 mounted on the supply platform 103 is imaged and placed on the supply platform 103 of the supply platform unit 1. The supply P&P unit 3 adsorbs the electronic component 101 one by one from the position where the electronic component 101 of the supply platform 103 is taken out from the position where the electronic component 101 has been image-processed, and is transported and disposed at a predetermined position. In addition, P&P is the abbreviation of PICKUP AND PLACE, which is the idiom of the practitioner. The measuring unit 5 receives the electronic component on the rotating platform (measuring platform unit 4) at the predetermined position to measure the characteristics of the electronic component to generate a classification signal.
零件分類裝置(分類部6、第1圖)，是由：1個以上的收納箱；網眼板及吸排出部所形成配置在上述各收納箱上暫時承接位置的暫時承接手段；從測定部5吸附電子零件101進行搬運直到電子零件位於面對著根據分類訊號所選出的收納箱的上述暫時承接手段網眼板一面的位置為止才退縮的吸附嘴601(參照第12圖)；及對吸附嘴601和吸排出部605(參照第12圖)的壓力進行控制以暫時承接手段承接著零件讓零件落入收納箱的壓力控制手段所構成。The part sorting device (the sorting unit 6 and the first drawing) is composed of one or more storage boxes, and the mesh plate and the suction and discharge unit are configured to temporarily receive the positions temporarily placed on the storage boxes; 5, the adsorption electronic component 101 is transported until the electronic component is located facing the position of the temporary receiving means mesh panel facing the storage box selected according to the classification signal (see FIG. 12); The pressure of the nozzle 601 and the suction/discharge portion 605 (see Fig. 12) is controlled so that the temporary receiving means receives the pressure control means for the component to drop the component into the storage box.
以下，參照第11圖至第14圖對上述的零件分類裝置(分類部6、第1圖)進行說明。第11圖是本發明電子零件特性檢查分類裝置實施例測定平台和分類部的位置關係說明用平面圖。第12圖是第11圖所示測定部和分類部的正面圖。如第11圖所示，複數收納箱614是配置在輔 助底座617的上列，收納箱其中之一是根據分類訊號選出。第13圖是本發明分類裝置利用在本發明電子零件特性檢查分類裝置時電子零件收納順序說明用的正面圖。第14圖是第13圖所示裝置從圖中箭頭符號Y－Y方向看時的收納箱剖面圖。第11圖及第13圖所示的吸附嘴601是固定在旋轉式液壓缸602的輸出軸。吸附嘴601是在第13圖假想線所示的位置吸附電子零件後，移動至第11圖圖中下方根據分類訊號所選出的收納箱614上，利用旋轉式液壓缸602的旋轉驅動使電子零件面對著配置在收納箱614右壁上的網眼板615的網眼部。Hereinafter, the above-described part sorting device (classification unit 6, first figure) will be described with reference to Figs. 11 to 14 . Fig. 11 is a plan view for explaining the positional relationship between the measurement platform and the classification unit of the embodiment of the electronic component characteristic inspection and classification device of the present invention. Fig. 12 is a front elevational view showing the measuring unit and the sorting unit shown in Fig. 11. As shown in Fig. 11, the plurality of storage boxes 614 are arranged in the auxiliary One of the auxiliary bases 617, one of the storage boxes is selected according to the classification signal. Fig. 13 is a front elevational view showing the electronic component storage sequence when the classification device of the present invention is used in the electronic component characteristic inspection and classification device of the present invention. Fig. 14 is a cross-sectional view showing the storage box when the apparatus shown in Fig. 13 is seen from the direction of the arrow Y-Y in the figure. The suction nozzle 601 shown in Figs. 11 and 13 is fixed to the output shaft of the rotary hydraulic cylinder 602. The suction nozzle 601 moves the electronic component to the position indicated by the imaginary line in Fig. 13, and moves to the storage box 614 selected by the classification signal in the lower portion of Fig. 11, and the electronic component is driven by the rotation of the rotary hydraulic cylinder 602. The mesh portion of the mesh plate 615 disposed on the right wall of the storage box 614 is faced.
於該零件分類裝置中，第13圖的吸附嘴601、網眼板615、吸排出部605是構成任一收納箱614上配置在暫時承接位置的暫時承接手段。網眼板615是設置在每一個收納箱614，吸附嘴601和吸排出部605是設置成可一體移動。分類對象的零件是以被吸附在吸附嘴601的狀態從移動至接近收納箱614裡側壁面即網眼板615表面的位置。零件是以位於網眼板615表面起算0.5mm程度的接近位置為佳。網眼板615的小徑孔是比零件尺寸還小的複數小徑孔，網眼板15的板厚以0.5mm程度的薄度為佳。在吸附嘴601相向的直線上且接近網眼板615背面的位置設有吸排出部605，該吸排出部605具有吸附功能和排出功能兼備的吸排出孔606。吸排出孔606的開口是以位於網眼板615背面起算0.5mm程度的接近位置為佳。吸排出部605，於此是連接在第11圖所示的真空(吸附空氣607 )及壓縮空氣(排出空氣608)的控制裝置。In the part sorting device, the suction nozzle 601, the mesh plate 615, and the suction discharge portion 605 of Fig. 13 constitute a temporary receiving means that is disposed at a temporary receiving position on any of the storage boxes 614. The mesh plate 615 is provided in each of the storage boxes 614, and the suction nozzle 601 and the suction discharge portion 605 are provided to be integrally movable. The parts to be classified are moved from the state of being adsorbed to the suction nozzle 601 to a position close to the side wall surface of the storage box 614, that is, the surface of the mesh plate 615. The part is preferably in an approximate position of about 0.5 mm from the surface of the mesh plate 615. The small diameter hole of the mesh plate 615 is a plurality of small diameter holes smaller than the size of the part, and the thickness of the mesh plate 15 is preferably 0.5 mm. A suction discharge portion 605 having a suction discharge hole 606 having both an adsorption function and a discharge function is provided on a straight line facing the suction nozzle 601 and close to the back surface of the mesh plate 615. The opening of the suction discharge hole 606 is preferably an approximate position of about 0.5 mm from the back surface of the mesh plate 615. The suction discharge portion 605 is here connected to the vacuum shown in Fig. 11 (adsorption air 607) And a control device for compressed air (exhaust air 608).
於上述關係位置中，將吸附嘴601的吸附為OFF的同時將吸排除部605的吸排出孔606的吸附功能為ON藉此使零件吸附嘴601脫離吸附在網眼板615表面。在吸附嘴601離開圖示位置(參照第13圖)的同時將吸排出部605的吸排出孔606的排出功能為ON藉此使零件從網眼板615表面脫離落下收納在收納箱614內。In the above-described relational position, the adsorption function of the suction and discharge port 606 of the suction and discharge portion 605 is turned ON while the adsorption of the adsorption nozzle 601 is OFF, whereby the component adsorption nozzle 601 is desorbed and adsorbed on the surface of the mesh plate 615. When the nozzle 601 is separated from the position shown in the drawing (see FIG. 13), the discharge function of the suction/discharge hole 606 of the suction/discharge portion 605 is turned ON, whereby the component is detached from the surface of the mesh panel 615 and stored in the storage box 614.
此外，吸附嘴601和吸排出部605是設置在同一托座609(參照第11圖)，可一體從零件的搬出位置移動往收納位置。根據該暫時承接方式時，即使吸附著小型又極薄且質量小的零件(例如石英晶體振子片)之吸附嘴帶有靜電，在吸附搬運零件時還是能夠不損傷到零件讓零件確實收納在收納箱。Further, the suction nozzle 601 and the suction/discharge portion 605 are provided in the same holder 609 (see FIG. 11), and can be integrally moved from the removal position of the component to the storage position. According to this temporary receiving method, even if the adsorption nozzle of a small, extremely thin and small-sized component (for example, a quartz crystal oscillator piece) is electrostatically charged, it is possible to store the component without damaging the component, and the component can be stored in the storage. box.
首先，對已簡單說明的電子零件特性檢查分類裝置的構成進行更詳細的說明。第1圖中，供應斗102，是對於電子零件供應在測定平台部4測定平台401(參照第4圖)上用的供給平台部1的供應平台103(參照第2圖)進行電子零件供應。供應平台部1具備有可對來自於供應斗102的供應搭載在供應平台103上的電子零件進行圖像處理的照相機暨照明部2。供應P&P部3是根據供應平台部1上搭載的電子零件已圖像處理的資訊，從供應平台部1 的電子零件取出位置一個一個地吸附電子零件搬往測定平台部4的事先訂定位置。電子零件是由供應P&P部3搬運至測定部5的測定平台部4，如下述，在測定平台部4的事先訂定位置，具有電子零件特性檢查用下電極，又具有和測定平台部4下電極成對的電子零件特性檢查用上電極。上述分類裝置是使用本發明裝置的分類部6。分類部6，如上述具有電子零件收納用的複數個收納箱和將測定平台上檢查完畢的電子零件於測定部5根據特性檢查結果搬運收納至指定收納箱用的機構。First, the configuration of the electronic component characteristic inspection and classification device which has been briefly described will be described in more detail. In the first embodiment, the supply hopper 102 supplies electronic components to the supply platform 103 (see FIG. 2) of the supply platform unit 1 for measuring the platform 401 (see FIG. 4) of the measurement platform unit 4. The supply platform unit 1 is provided with a camera and illumination unit 2 that can perform image processing on the electronic components mounted on the supply platform 103 from the supply hopper 102. The supply P&P unit 3 is based on the image processing information of the electronic components mounted on the supply platform unit 1, from the supply platform unit 1 The electronic component take-out position moves the electronic component one by one to the predetermined position of the measurement platform unit 4. The electronic component is the measurement platform unit 4 that is transported to the measurement unit 5 by the P&P unit 3, and has a lower electrode for electronic component characteristic inspection at a predetermined position of the measurement platform unit 4 as described below, and has a measurement platform unit 4 The electrode is used to check the characteristics of the electronic component for the upper electrode. The above classification device is the classification unit 6 using the device of the present invention. The classification unit 6 has a plurality of storage boxes for storing electronic components and a mechanism for transporting and storing the electronic components that have been inspected on the measurement platform to the measurement storage unit 5 based on the result of the characteristic inspection.
如第2圖、第3圖所示，振動型的供應斗102是在供應平台103的a位置供應電子零件101讓電子零件101散落在供應平台103的環狀溝槽104。As shown in FIGS. 2 and 3, the vibration type supply hopper 102 is an annular groove 104 in which the electronic component 101 is supplied to the supply platform 103 at the position a of the supply platform 103.
供應平台上電子零件重疊的去除：如上述，供應斗102的供應可能會造成散落在供應平台103溝槽104上的電子零件重疊。該重疊的產生是會導致下述照相機201在執行圖像處理時判斷為異常狀態，避免該狀態的電子零件搬運至測定部，重疊的電子零件101就會被留在供應平台103溝槽104，因此有必要消除該重疊現象。基於此，對此供應平台103通常朝逆時針方向(參照第2圖及第3圖)旋轉驅動用的脈衝馬達105進行小刻度的左右旋轉使供應平台103振動。利用該振動就能夠 消除產生重疊現象的電子零件的重疊。上述供應平台103的溝槽104是形成為能夠確實承接來自供應斗102供應的電子零件101和能夠讓電子零件101受到供應平台103振動時不會從供應平台103振落的深度淺溝槽(相當於電子零件厚度的2~3倍)。利用上述溝槽和上述供應平台的振動消除電子零件的重疊。Removal of Overlap of Electronic Parts on the Supply Platform: As noted above, the supply of supply hoppers 102 may cause electronic components that are scattered on the grooves 104 of the supply platform 103 to overlap. This overlap occurs when the camera 201 described below determines that the image processing is abnormal, and the electronic component in this state is prevented from being transported to the measuring unit, and the overlapped electronic component 101 is left in the groove 104 of the supply platform 103. It is therefore necessary to eliminate this overlap. Based on this, the supply platform 103 normally rotates the supply platform 103 by rotating the pulse motor 105 for rotational driving in the counterclockwise direction (see FIGS. 2 and 3). Use this vibration to Eliminate the overlap of electronic parts that create overlap. The groove 104 of the above-described supply platform 103 is formed to be able to surely receive the electronic component 101 supplied from the supply hopper 102 and a shallow shallow groove (which is equivalent to the fact that the electronic component 101 does not vibrate from the supply platform 103 when it is vibrated by the supply platform 103 (equivalent 2 to 3 times the thickness of the electronic parts). The overlap of the electronic components is eliminated by the above-described grooves and the vibration of the above supply platform.
電子零件的位置姿勢等資訊取得：供應平台103上設有照相機201和照明202(參照第3圖)。照相機201，是配置在供應平台103的b位置(參照第2圖)正上方，對電子零件101進行照相加以圖像處理。脈衝馬達105(參照第3圖)是對供應平台103進行逆時針方向(參照第2圖)旋轉驅動。為了在供應平台103的c位置(參照第2圖)吸附搬運電子零件101，配置有成為供應P&P部3一部份的吸附嘴301。Information acquisition such as position and posture of the electronic component: The supply platform 103 is provided with a camera 201 and an illumination 202 (see FIG. 3). The camera 201 is disposed directly above the b position (see FIG. 2) of the supply platform 103, and performs image processing on the electronic component 101. The pulse motor 105 (see FIG. 3) is a rotational drive of the supply platform 103 in a counterclockwise direction (see FIG. 2). In order to adsorb and transport the electronic component 101 at the c position (see FIG. 2) of the supply platform 103, a suction nozzle 301 that supplies a part of the P&P section 3 is disposed.
如第3圖所示，利用照相機201執行位於照相機201照相範圍內的電子零件101的照相圖像處理，藉此取得電子零件101各個在供應平台103的位置、姿勢、重疊的資訊。如此一來，就能夠獲得從供應斗102透過供應平台103的旋轉依順序送過來的全部電子零件101的資訊。該等資訊是輸送至第1圖所示的供應P&P部3的控制部7，如下述，由供應P&P部3的吸附嘴301根據上述資訊從供應平台103的c位置吸附電子零件101進行搬運將電子零件101移載至第1圖示的測定平台部4。As shown in FIG. 3, the photographic image processing of the electronic component 101 located within the photographing range of the camera 201 is performed by the camera 201, whereby information on the position, posture, and overlap of the electronic component 101 on the supply platform 103 is obtained. In this way, it is possible to obtain information on all the electronic components 101 that are sequentially sent from the supply hopper 102 through the rotation of the supply platform 103. The information is transmitted to the control unit 7 of the supply P&P unit 3 shown in Fig. 1, and the suction nozzle 301 supplied from the P&P unit 3 adsorbs the electronic component 101 from the position c of the supply platform 103 based on the above information. The electronic component 101 is transferred to the measurement platform unit 4 of the first diagram.
供應P&P部3是操作吸附嘴301，藉此將電子零件從供應平台103供應至測定平台401。第4圖是表示該等的位置關係。The supply P&P section 3 operates the adsorption nozzle 301, whereby the electronic components are supplied from the supply platform 103 to the measurement platform 401. Figure 4 is a diagram showing the positional relationship of these.
對吸附嘴301的負壓供應：吸附嘴301是設置在旋轉軸302的下端。由供應P&P部3基礎構造(支撐板A、B、C為一體設置)的支撐板A上設置的引導用的導箱303支撐著旋轉軸302使旋轉軸302能夠旋轉及昇降。旋轉軸302為管狀，其上端設有旋轉式接頭308，旋轉式接頭308所結合的空氣管309是連接於真空產生裝置(未圖示)，使負壓供應至吸附嘴301。Negative pressure supply to the suction nozzle 301: The suction nozzle 301 is disposed at the lower end of the rotary shaft 302. The guide guide 303 provided on the support plate A for supplying the P&P portion 3 basic structure (the support plates A, B, and C are integrally provided) supports the rotary shaft 302 to rotate and lift the rotary shaft 302. The rotating shaft 302 has a tubular shape, and its upper end is provided with a rotary joint 308. The air pipe 309 coupled to the rotary joint 308 is connected to a vacuum generating device (not shown) to supply a negative pressure to the suction nozzle 301.
吸附嘴301的旋轉控制：旋轉軸302在支撐板A上部的位置，固定著同步皮帶輪304B。於支撐板A，又設有脈衝馬達306。脈衝馬達306的輸出軸設有同步皮帶輪304A，同步皮帶輪304B是透過同步皮帶305傳達脈衝馬達306的旋轉。Rotation control of the suction nozzle 301: The timing of the rotation shaft 302 at the upper portion of the support plate A is fixed to the timing pulley 304B. A pulse motor 306 is further provided on the support plate A. The output shaft of the pulse motor 306 is provided with a timing pulley 304A, and the timing pulley 304B transmits the rotation of the pulse motor 306 through the timing belt 305.
吸附嘴301的昇降控制：於供應P&P部3基礎構造的支撐板C設有可對一體設置在上下用掛鉤307的承板311進行引導，對與該承板 311成一體的上下用掛鉤307的上下方向直線前進加以引導的直線前進導件310。上下用掛鉤307是連結於旋轉軸302。擺動桿312是固定在供應P&P部3基礎構造的支撐板B上設置的脈衝馬達313的輸出軸。擺動桿312是利用脈衝馬達313的左右旋轉進行上下擺動運動。該擺動運動是透過承板311、上下用掛鉤307，傳達至旋轉軸302，結果就可執行吸附嘴301的昇降控制。Lifting control of the suction nozzle 301: a support plate C for supplying the P&P portion 3 basic structure is provided with a support plate 311 integrally provided with the upper and lower hooks 307, and the support plate A straight forward guide 310 that is linearly advanced in the vertical direction of the upper and lower hooks 307 by the 311 is integrated. The upper and lower hooks 307 are coupled to the rotating shaft 302. The swing lever 312 is an output shaft of the pulse motor 313 provided to be fixed to the support plate B of the base structure of the P&P section 3. The swing lever 312 performs a vertical swing motion by the right and left rotation of the pulse motor 313. This oscillating motion is transmitted to the rotating shaft 302 through the carrier plate 311 and the upper and lower hooks 307, and as a result, the lifting and lowering control of the suction nozzle 301 can be performed.
供應P&P部3的基礎構造水平移動：如上述，第4圖所示的脈衝馬達306和313是一體設置在基礎構造的基板，利用未圖示的驅動源形成可左右(第1圖、第4圖中的左右)驅動。The basic structure of the P&P unit 3 is horizontally moved. As described above, the pulse motors 306 and 313 shown in Fig. 4 are integrally provided on the base structure, and are formed by a drive source (not shown) (Fig. 1 and 4). The left and right drive in the figure.
供應P&P部3的的綜合動作：在構成如以上所述的供應P&P部3其各驅動源的控制裝置輸入指令，該指令是根據第2圖所示位於供應平台103的c位置上的電子零件101資訊，根據該指令吸附嘴301會移動下降在應吸附的電子零件101上吸附著該電子零件101然後上昇搬運至測定平台401事先訂定的位置。再加上，根據從該供應平台103往測定平台401吸附移動中所吸附的電子零件101的姿勢資訊加以旋轉修正成事先訂定的姿勢。另，電子零件101為重疊時則該電子零件101會被略過不吸附，留在供應平台103。The integrated operation of the P&P unit 3 is input to a control unit that constitutes each of the drive sources of the supply P&P unit 3 as described above, and the command is an electronic part located at the c position of the supply platform 103 according to Fig. 2 According to the instruction, the suction nozzle 301 moves and descends according to the instruction, and the electronic component 101 is adsorbed on the electronic component 101 to be adsorbed, and then lifted and transported to a position set in advance by the measurement platform 401. In addition, the posture information of the electronic component 101 adsorbed during the movement from the supply platform 103 to the measurement platform 401 is rotationally corrected to a predetermined posture. Further, when the electronic components 101 are overlapped, the electronic component 101 is slightly adsorbed and remains on the supply platform 103.
第5圖、第6圖及第7圖是圖示著測定平台部4。第5圖為測定平台部4的平面圖，第6圖為其側面圖。測定平台401是連接在脈衝馬達403的輸出軸形成可旋轉。此外，於測定平台401埋設有絕緣材405，於此設有電子零件電特性檢查用的具吸附孔下電極404。電子零件101是在下電極404位於圖中d所示位置的狀態下，由第4圖所示的吸附嘴301吸附搬運放置在位於測定平台401事先訂定位置的下電極404上形成被吸附保持著。The fifth, sixth, and seventh diagrams illustrate the measurement platform unit 4. Fig. 5 is a plan view of the measurement platform portion 4, and Fig. 6 is a side view thereof. The measurement stage 401 is connected to the output shaft of the pulse motor 403 to form a rotatable shaft. Further, an insulating material 405 is embedded in the measurement platform 401, and an adsorption hole lower electrode 404 for electrical property inspection of the electronic component is provided. The electronic component 101 is placed on the lower electrode 404 located at a predetermined position of the measurement platform 401 by the adsorption nozzle 301 shown in FIG. .
電子零件的定位保持機構之1：測定平台401設有供應P&P部3所搬運的電子零件定位在測定平台401一定位置的電子零件定位用的定位機構。電子零件由第4圖所示的吸附嘴301吸附搬運放置在位於測定平台401事先訂定位置的下電極404上形成被吸附保持時會產生微妙的偏位。於是，測定平台401就具有可使電子零件定位在下電極404上一定位置的定位機構。電子零件的測定檢查精度若要良好，則該定位機構是不可或缺的要素。Positioning and Holding Mechanism of Electronic Component 1: The measuring platform 401 is provided with a positioning mechanism for positioning the electronic component positioned at a predetermined position on the measuring platform 401 by the electronic component carried by the P&P section 3. When the electronic component is adsorbed and transported by the adsorption nozzle 301 shown in FIG. 4 and placed on the lower electrode 404 located at a predetermined position of the measurement platform 401 to form a suction holding, a subtle bias occurs. Thus, the measurement platform 401 has a positioning mechanism that positions the electronic component at a certain position on the lower electrode 404. The positioning mechanism is an indispensable element if the measurement accuracy of the electronic component is good.
對放置吸附保持在下電極404上的電子零件進行位置修正使電子零件位於一定位置用的定位爪1(圖號406)和定位爪2(圖號411)，是組入在正交的位置。該等定位爪，是由：各自獨立的爪支架407；搭載有爪支架407的直線前進導件408；直線前進導件408驅動用的氣缸 410；及氣缸410驅動復位用的拉伸彈簧409所構成，固定在同一托座412，搭載在測定平台401上。對上述偏位的產生進行預測，由供應P&P部3將電子零件吸附保持在下電極404上的位置位於靠近定位爪1及定位爪2的位置。利用該2個定位爪406和411的動作，讓放置吸附保持在下電極404上的電子零件其位置被修正成經常位於一定位置。位置修正動作完成後，各定位爪就回到原來的位置。The positioning claw 1 (Fig. 406) and the positioning claw 2 (Fig. 411) for positionally correcting the electronic component held by the adsorption holding on the lower electrode 404 are placed in orthogonal positions. The positioning claws are: independent claw holders 407; linear advancement guides 408 on which the claw holders 407 are mounted; cylinders for driving the linear advancement guides 408 410; and the cylinder 410 is configured to drive the tension spring 409 for resetting, and is fixed to the same bracket 412 and mounted on the measurement platform 401. The occurrence of the above-described misalignment is predicted, and the position at which the supply P&P portion 3 adsorbs and holds the electronic component on the lower electrode 404 is located close to the positioning claw 1 and the positioning claw 2. By the action of the two positioning claws 406 and 411, the position of the electronic component placed and held by the lower electrode 404 is corrected so as to be constantly located at a certain position. After the position correction operation is completed, the positioning claws return to the original position.
第7圖是表示測定平台401旋轉至既定3個位置上時的狀態平面圖。圖中所示的d位置是承接上述電子零件的位置，e位置是第1圖所示測定部5的設置位置，該測定部5搭載有和電子零件電特性檢查用下電極404成對的上電極，f位置是電特性檢查完畢的電子零件被取出至收納用的第1圖所示分類部6時的搬出位置。第7(a)圖為測定平台401的下電極404位於d位置時的狀態圖，於該狀態下承接電子零件。第7(b)圖為測定平台401的下電極404位於e位置時的狀態圖，於該狀態下對電子零件的電特性進行檢查。第7(c)圖為測定平台401的下電極404位於f位置時的狀態圖，為了收納電特性檢查完畢的電子零件而將電子零件取出至第1圖所示的分類部6。由第6圖所示的脈衝馬達403使測定平台401從d往e，又從e往f形成右旋轉，從f往d左旋轉回到原位承接下一個電子零件。重覆執行上述循環動作。Fig. 7 is a plan view showing a state in which the measurement platform 401 is rotated to a predetermined three positions. The d position shown in the figure is the position at which the electronic component is received, and the e position is the installation position of the measuring unit 5 shown in Fig. 1, and the measuring unit 5 is mounted on the upper surface of the lower electrode 404 for electronic component electrical property inspection. In the electrode, the f-position is a carry-out position when the electronic component whose electrical characteristics have been checked is taken out to the sorting unit 6 shown in Fig. 1 for storage. Fig. 7(a) is a view showing a state in which the lower electrode 404 of the measuring stage 401 is at the d position, and the electronic component is received in this state. Fig. 7(b) is a state diagram of the lower electrode 404 of the measurement platform 401 at the e position, in which the electrical characteristics of the electronic component are inspected. Fig. 7(c) is a view showing a state in which the lower electrode 404 of the measurement stage 401 is at the f position, and the electronic component is taken out to the sorting unit 6 shown in Fig. 1 in order to accommodate the electronic components whose electrical characteristics have been checked. The pulse motor 403 shown in Fig. 6 causes the measurement stage 401 to rotate right from d to e, and from e to f, and rotates from f to d to return to the original position to take the next electronic component. Repeat the above loop action.
第8圖是上述第7(b)圖所說明的設置在測定平台 401的e位置上的測定部5的平面圖。第9圖是第8圖中從箭頭符號X-X方向看時的測定部5正面圖。第10圖是第9圖的側面圖。上電極501是固定在支架503，支架503是搭載在直線前進導件506，又加上，直線前進導件506是搭載在由滾珠螺桿509構成上下運動的滑動平台508。滾珠螺桿509是透過聯軸節510連結於脈衝馬達511的輸出軸。透過該機構能夠讓上電極501利用脈衝馬達511的旋轉進行上下運動。對上電極501進行下降時即使是於上電極501接觸電子零件後還持續執行下降的狀況時，由於搭載在滑動平台508的直線前進導件506能夠形成減速動作因此不會損傷到電子零件。Figure 8 is the setting of the measurement platform described in Figure 7(b) above. A plan view of the measuring unit 5 at the e position of 401. Fig. 9 is a front elevational view of the measuring unit 5 as seen from the direction of the arrow X-X in Fig. 8. Figure 10 is a side view of Figure 9. The upper electrode 501 is fixed to the holder 503, and the holder 503 is mounted on the linear advancement guide 506. Further, the linear advancement guide 506 is mounted on a slide platform 508 that is moved up and down by the ball screw 509. The ball screw 509 is coupled to the output shaft of the pulse motor 511 through the coupling 510. The upper electrode 501 can be moved up and down by the rotation of the pulse motor 511 through this mechanism. When the upper electrode 501 is lowered, even if the upper electrode 501 is continuously lowered after the electronic component is contacted, the linear advancement guide 506 mounted on the slide table 508 can be decelerated, so that the electronic component is not damaged.
上電極501和測定平台401上電子零件表面之間的間隙是能夠在保持一定間隙的狀況下進行電子零件的特性檢查。於搭載有上電極501的支架503搭載可測定距離的檢測器502(參照第9圖)就能夠達到上述需求。The gap between the upper electrode 501 and the surface of the electronic component on the measurement platform 401 is such that the characteristic inspection of the electronic component can be performed while maintaining a certain gap. The above-described demand can be achieved by mounting the detector 502 capable of measuring the distance on the holder 503 on which the upper electrode 501 is mounted (see FIG. 9).
測定平台401設有供應P&P部3所搬運的電子零件定位在測定平台401一定位置的電子零件定位用的定位機構已於上述進行了說明，但該需求也可透過第15圖、第16圖及第17圖所示的構成加以實現。第15圖是表示定位機構的平面圖。第16圖是第15圖所示箭頭符號Z1-Z1 方向看時的側面圖。第17圖，是第15圖所示箭頭符號Z2－Z2方向看時的側面圖。The measurement platform 401 is provided with a positioning mechanism for positioning electronic components that are placed at a certain position on the measurement platform 401 by the electronic components that are transported by the P&P unit 3, but the requirements are also shown in FIGS. 15 and 16 The composition shown in Fig. 17 is realized. Figure 15 is a plan view showing the positioning mechanism. Figure 16 is the arrow symbol Z1-Z1 shown in Figure 15. Side view when looking in the direction. Fig. 17 is a side view showing the arrow symbol Z2-Z2 shown in Fig. 15.
和上述第5圖的說明相同，對上述偏位的產生進行預測，由供應P&P部3將電子零件吸附保持在下電極404上的位置位於靠近定位爪1(圖號406)及定位爪2(圖號411)的位置。於測定平台401的d－f線上搭載著具有圖號411定位爪2的機構。該機構是和上述定位保持機構之1所說明的機構相同。於定位爪2(圖號411)在正交方向從測定平台401外側配置具有定位爪1(圖號406)的機構。定位爪1(圖號406)是由爪支架407和搭載有爪支架407的直動式單元413所構成，以托座412固定在測定平台401外側。吸附保持在下電極404上的電子零件是利用定位爪2(圖號411)的前進和測定平台401的左旋轉將電子零件推壓在定位爪1(圖號406)的方法使其位置修正成位於一定位置。於此，測定平台401的左旋轉角度是事先算出的位置修正必要值。As in the description of Fig. 5 described above, the occurrence of the above-described offset is predicted, and the position where the supply P&P unit 3 adsorbs and holds the electronic component on the lower electrode 404 is located close to the positioning claw 1 (Fig. 406) and the positioning claw 2 (Fig. No. 411). A mechanism having the positioning claw 2 of the figure 411 is mounted on the d-f line of the measurement platform 401. This mechanism is the same as the one described in the above-described positioning and holding mechanism. A mechanism having the positioning claw 1 (reference numeral 406) is disposed outside the measuring platform 401 in the orthogonal direction from the positioning claw 2 (reference numeral 411). The positioning claw 1 (reference numeral 406) is composed of a claw holder 407 and a direct-acting unit 413 on which the claw holder 407 is mounted, and is fixed to the outside of the measurement platform 401 by a bracket 412. The electronic component adsorbed and held on the lower electrode 404 is corrected by the advancement of the positioning claw 2 (Fig. 411) and the left rotation of the measuring platform 401 to push the electronic component to the positioning claw 1 (Fig. 406). Certain location. Here, the left rotation angle of the measurement platform 401 is a position correction necessary value calculated in advance.
檢查完畢的電子零件強制性排除用排出機構：留在測定平台上檢查完畢的電子零件是有必要強制性排除。第18圖是上述定位機構配置有留在測定平台上檢查完畢的電子零件強制性排除用的排出機構平面圖。第19圖是第18圖所示排出機構的側面圖。在測定平台401位於第18圖中f位置的狀態下，由分類部6的吸附嘴601(參照第11圖)吸附檢查完畢的電子零件搬運往分類 部6。此時產生吸附疏失則電子零件會遺留在測定平台401上。該遺留的電子零件上勢必會重疊放置下一個循環作業的另一電子零件。為了避免上述狀況發生，有必要強制性排除遺留下來的電子零件。Excluded discharge mechanism for electronic parts that have been inspected: It is necessary to remove the electronic parts that have been inspected on the measurement platform. Fig. 18 is a plan view showing the discharge mechanism in which the positioning mechanism is disposed with the electronic component that has been inspected on the measuring platform for the mandatory removal. Figure 19 is a side view of the discharge mechanism shown in Figure 18. In the state where the measurement platform 401 is at the f position in FIG. 18, the electronic component that has been adsorbed and inspected by the adsorption nozzle 601 (see FIG. 11) of the classification unit 6 is transported to the classification. Department 6. At this time, the adsorption component is lost, and the electronic component remains on the measurement platform 401. The remaining electronic parts are bound to overlap another electronic part of the next cycle. In order to avoid the above situation, it is necessary to oblige to exclude the remaining electronic parts.
排出機構的排出爪701是保持在爪支架702，爪支架702是固定在空氣驅動的直動式單元703，構成為透過托座704固定在未圖示的底座板。接著，排出機構是設置在圖中所示的e和f間接近f的位置並且在測定平台上電子零件旋轉軌跡上位於不會干涉到測定平台401上定位機構的位置。在檢查完畢的電子零件從圖中所示的e位置旋轉往f位置時，排出爪701是由直動式單元703退回上方，當電子零件到達圖中所示的f位置時就由直動式單元703將排出爪701下降至可接觸測定平台401表面的位置。另，排出爪701是構成為由未圖示彈簧推壓在測定平台401表面的構造。排出爪701的前端，如圖所示是裁切加工成斜面。於該狀態下當測定平台401從圖中所示的f位置旋轉至d位置時因上述理由在測定平台401上若遺留有電子零件時，電子零件會抵接於排出爪701的斜切面，沿著該斜切面排出至測定平台401的外側。排出的電子零件會被收納在測定平台401外側設置的承接箱705。The discharge claw 701 of the discharge mechanism is held by the claw holder 702, and the claw holder 702 is fixed to the air-driven direct-acting unit 703, and is configured to be fixed to a base plate (not shown) through the bracket 704. Next, the discharge mechanism is disposed at a position close to f between e and f shown in the drawing and is located at a position on the measurement platform on the rotational path of the electronic component that does not interfere with the positioning mechanism on the measurement platform 401. When the inspected electronic component is rotated from the e position shown in the drawing to the f position, the discharge claw 701 is retracted upward by the direct acting unit 703, and is directly operated when the electronic component reaches the f position shown in the drawing. The unit 703 lowers the discharge claw 701 to a position where it can contact the surface of the measurement platform 401. Further, the discharge claw 701 is configured to be pressed against the surface of the measurement platform 401 by a spring (not shown). The front end of the discharge claw 701 is cut into a slope as shown in the drawing. When the measurement platform 401 is rotated from the f position shown in the figure to the d position in this state, if the electronic component is left on the measurement platform 401 for the above reasons, the electronic component abuts on the oblique surface of the discharge claw 701. The chamfered surface is discharged to the outside of the measurement platform 401. The discharged electronic components are housed in a receiving box 705 provided outside the measuring platform 401.
於上述電子零件特性檢查分類裝置中，在由供應P&P部3將電子零件從供應平台103搬運往測定平台401的搬 運路徑下方設置電子零件圖像處理用的照相機和照明。如此一來，就能夠在電子零件的上述路徑移動中利用圖像處理對電子零件的外觀瑕疵進行檢查。In the electronic component characteristic inspection and classification device described above, the electronic component is transported from the supply platform 103 to the measurement platform 401 by the supply P&P unit 3. A camera and illumination for image processing of electronic parts are set under the transport path. In this way, it is possible to inspect the appearance of the electronic component by image processing in the above-described path movement of the electronic component.
第20圖是表示由供應P&P部3將電子零件從供應平台103搬運往測定平台401的搬運路徑下方設有電子零件圖像處理用照相機801和照明802的變形例平面圖。於該變形例，是由設置在供應P&P部3所吸附的電子零件搬運往圖中測定平台部4的i位置的搬運路徑移動中的j位置上的照相機801進行照相圖像處理。根據圖像處理就能夠檢查出電子零件外觀的瑕疵進行篩選。FIG. 20 is a plan view showing a modification in which the electronic component image processing camera 801 and the illumination 802 are provided under the conveyance path in which the electronic component is transported from the supply platform 103 to the measurement platform 401 by the supply P&P unit 3. In this modification, the camera 801 is placed at the j position in which the electronic component sucked by the supply P&P unit 3 is transported to the transport path of the i position of the measurement platform unit 4 in the drawing, and the photographic image processing is performed. According to the image processing, it is possible to check the flaws of the appearance of the electronic parts for screening.
以上詳細說明的實施例，可在本發明主旨範圍內加以各種變形實施。電子零件的例子雖然是以石英晶體振子為例子進行了說明，但也可利用在其他的電子零件例如陶瓷振子的素板分類。The embodiments described in detail above can be modified in various ways within the spirit and scope of the invention. Although the example of the electronic component has been described by taking a quartz crystal resonator as an example, it is also possible to use a plain plate classification of other electronic components such as a ceramic vibrator.
1‧‧‧供應平台部1‧‧‧Supply Platform Division
2‧‧‧照相機暨照明部2‧‧‧Photography and Lighting Department
3‧‧‧供應P&P部3‧‧‧Supply P&P Department
4‧‧‧測定平台部4‧‧‧Measurement Platform Department
5‧‧‧測定部5‧‧‧Determination Department
6‧‧‧分類部6‧‧‧Classification Department
7‧‧‧控制部7‧‧‧Control Department
101‧‧‧電子零件101‧‧‧Electronic parts
102‧‧‧供應斗102‧‧‧ supply bucket
103‧‧‧供應平台103‧‧‧Supply platform
104‧‧‧溝槽104‧‧‧ trench
105、306、313、403、511、613‧‧‧脈衝馬達105, 306, 313, 403, 511, 613‧‧ pulse motor
201、801‧‧‧照相機201, 801‧‧‧ camera
202、802‧‧‧照明202, 802‧‧‧ illumination
301、601‧‧‧吸附嘴301, 601‧‧ ‧ adsorption nozzle
302‧‧‧旋轉軸302‧‧‧Rotary axis
303‧‧‧導箱303‧‧ ‧ guide box
304A、304B、612‧‧‧同步皮帶輪304A, 304B, 612‧‧‧Synchronous Pulleys
305、611‧‧‧同步皮帶305, 611‧‧‧ Timing belt
307‧‧‧上下用掛鉤307‧‧‧ hooks up and down
308、603‧‧‧旋轉式接頭308, 603‧‧‧Rotary joints
309、604‧‧‧空氣管309, 604‧‧‧ air tube
310、408、506、610‧‧‧直線前進導件310, 408, 506, 610‧‧‧ straight forward guides
311‧‧‧承板311‧‧‧ board
312‧‧‧擺動桿312‧‧‧swing rod
401‧‧‧測定平台401‧‧‧Measurement platform
402、616、617‧‧‧輔助底座402, 616, 617‧‧‧Auxiliary base
404‧‧‧下電極404‧‧‧ lower electrode
405‧‧‧絕緣材405‧‧‧Insulation
406‧‧‧定位爪1406‧‧‧Positioning claw 1
407、702‧‧‧爪支架407, 702‧‧‧ claw bracket
409、504‧‧‧拉伸彈簧409, 504‧‧‧ stretching spring
410‧‧‧氣缸410‧‧‧ cylinder
411‧‧‧定位爪2411‧‧‧Positioning claw 2
412、609、704‧‧‧托座412, 609, 704‧‧‧ brackets
413、703‧‧‧直動式單元413, 703‧‧‧Directional units
501‧‧‧上電極501‧‧‧Upper electrode
502‧‧‧檢測器502‧‧‧Detector
503‧‧‧支架503‧‧‧ bracket
505‧‧‧掛簧板505‧‧‧ hanging spring board
507‧‧‧止動件507‧‧‧stops
508‧‧‧滑動平台508‧‧‧ sliding platform
509‧‧‧滾珠螺桿509‧‧‧Rolling screw
510‧‧‧聯軸節510‧‧‧Coupling
512‧‧‧支撐板512‧‧‧support board
602‧‧‧旋轉式液壓缸602‧‧‧Rotary hydraulic cylinder
605‧‧‧吸排出部605‧‧‧Sucking and discharge department
606‧‧‧吸排出孔606‧‧‧ suction drain
607‧‧‧吸附空氣607‧‧‧Adsorption air
608‧‧‧排出空氣608‧‧‧Exhaust air
614‧‧‧收納箱614‧‧‧ storage box
615‧‧‧網眼板615‧‧‧Mesh plate
701‧‧‧排出爪701‧‧‧Exhaust claws
705‧‧‧承接箱705‧‧‧ undertake box
第1圖為組入有本發明分類部的電子零件特性檢查分類裝置實施例正面圖。Fig. 1 is a front elevational view showing an embodiment of an electronic component characteristic inspection and classification device incorporating the classification unit of the present invention.
第2圖為表示本發明電子零件特性檢查分類裝置實施例電子零件散落在供應平台溝槽時的狀況平面圖。Fig. 2 is a plan view showing a state in which an electronic component is scattered on a supply platform groove in the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第3圖為表示本發明電子零件特性檢查分類裝置實施例供應平台上設置的照相機和照明的正面圖。Fig. 3 is a front elevational view showing the camera and illumination provided on the supply platform of the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第4圖為本發明電子零件特性檢查分類裝置實施例供應P&P部正面圖。Fig. 4 is a front elevational view showing the supply of the P&P portion of the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第5圖為本發明電子零件特性檢查分類裝置實施例測定平台部平面圖。Fig. 5 is a plan view showing the measuring platform portion of the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第6圖為第5圖所示測定平台部的側面圖。Fig. 6 is a side view of the measurement platform unit shown in Fig. 5.
第7圖為表示第5圖所示測定平台旋轉至既定3個位置上時的狀態平面圖。Fig. 7 is a plan view showing a state in which the measurement platform shown in Fig. 5 is rotated to a predetermined three positions.
第8圖為第5圖所示測定平台e位置上設置的測定部平面圖。Fig. 8 is a plan view of the measuring unit provided at the position of the measuring platform e shown in Fig. 5.
第9圖為第8圖中從箭頭符號X－X方向看時的測定部正面圖。Fig. 9 is a front elevational view of the measuring unit when viewed from the direction of the arrow X-X in Fig. 8.
第10圖為第9圖所示測定部的側面圖。Fig. 10 is a side view showing the measuring unit shown in Fig. 9.
第11圖為本發明電子零件特性檢查分類裝置實施例測定平台和分類部的平面圖。Fig. 11 is a plan view showing the measurement platform and the classification unit of the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第12圖為第11圖所示測定部和分類部的正面圖。Fig. 12 is a front elevational view showing the measuring unit and the sorting unit shown in Fig. 11.
第13圖為本發明分類裝置實施例收納順序說明用的正面圖。Figure 13 is a front elevational view showing the storage sequence of the embodiment of the sorting apparatus of the present invention.
第14圖為第13圖所示裝置從圖中箭頭符號Y－Y方向看時的收納箱剖面圖。Figure 14 is a cross-sectional view of the storage box when the device shown in Figure 13 is viewed from the direction of the arrow Y-Y in the figure.
第15圖為表示本發明電子零件特性檢查分類裝置實施例測定平台部上設置的定位保持機構其另一實施例的定位保持機構平面圖。Fig. 15 is a plan view showing the positioning and holding mechanism of another embodiment of the positioning and holding mechanism provided on the measuring platform portion of the embodiment of the electronic component characteristic inspection and classification device of the present invention.
第16圖為第15圖所示箭頭符號Z1－Z1方向視圖。Fig. 16 is a view showing the direction of the arrow symbol Z1-Z1 shown in Fig. 15.
第17圖為第15圖所示箭頭符號Z2－Z2方向視圖。Figure 17 is a view of the arrow symbol Z2-Z2 direction shown in Fig. 15.
第18圖為表示電子零件排出機構的平面圖。Figure 18 is a plan view showing the electronic component discharge mechanism.
第19圖為第18圖所示排出機構的側面圖。Figure 19 is a side view of the discharge mechanism shown in Figure 18.
第20圖為表示本發明電子零件特性檢查分類裝置在圖像處理方面使用的另一照相機和照明的正面圖。Fig. 20 is a front elevational view showing another camera and illumination used in image processing of the electronic component characteristic inspection and classification device of the present invention.
1‧‧‧供應平台部1‧‧‧Supply Platform Division
2‧‧‧照相機暨照明部2‧‧‧Photography and Lighting Department
3‧‧‧供應P&P部3‧‧‧Supply P&P Department
4‧‧‧測定平台部4‧‧‧Measurement Platform Department
5‧‧‧測定部5‧‧‧Determination Department
6‧‧‧分類部6‧‧‧Classification Department
7‧‧‧控制部7‧‧‧Control Department
102‧‧‧供應斗102‧‧‧ supply bucket
Claims (9)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008009606A JP5183220B2 (en) | 2008-01-18 | 2008-01-18 | Component classification device and electronic component characteristic inspection and classification device using the device |
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| Publication Number | Publication Date |
|---|---|
| TW200932649A TW200932649A (en) | 2009-08-01 |
| TWI429485B true TWI429485B (en) | 2014-03-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW97108735A TWI429485B (en) | 2008-01-18 | 2008-03-12 | A part sorting device and an electronic component meaning checking and sorting device using the same |
Country Status (3)
| Country | Link |
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| JP (1) | JP5183220B2 (en) |
| CN (1) | CN101486035B (en) |
| TW (1) | TWI429485B (en) |
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| CN102698966B (en) * | 2012-06-06 | 2013-09-25 | 显亮(昆山)汽车配件有限公司 | Automatic key form separating machine |
| CN103785618A (en) * | 2012-11-01 | 2014-05-14 | 凯吉凯精密电子技术开发（苏州）有限公司 | Automatic capturing detection device for circuit boards and detection method |
| CN104841640B (en) * | 2015-04-30 | 2017-04-19 | 清华大学 | Automatic sorting device for irradiated particles |
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| Publication number | Publication date |
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| CN101486035B (en) | 2014-05-07 |
| CN101486035A (en) | 2009-07-22 |
| JP2009166003A (en) | 2009-07-30 |
| JP5183220B2 (en) | 2013-04-17 |
| TW200932649A (en) | 2009-08-01 |
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