TW593973B - Exterior inspection apparatus for workpieces and exterior inspection method - Google Patents

Exterior inspection apparatus for workpieces and exterior inspection method Download PDF

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Publication number
TW593973B
TW593973B TW092115090A TW92115090A TW593973B TW 593973 B TW593973 B TW 593973B TW 092115090 A TW092115090 A TW 092115090A TW 92115090 A TW92115090 A TW 92115090A TW 593973 B TW593973 B TW 593973B
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TW
Taiwan
Prior art keywords
workpiece
workpieces
image
pick
space
Prior art date
Application number
TW092115090A
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Chinese (zh)
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TW200404988A (en
Inventor
Takuya Hara
Toru Ishii
Takeshi Ito
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Yamaha Fine Tech Co Ltd
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Publication of TW200404988A publication Critical patent/TW200404988A/en
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Publication of TW593973B publication Critical patent/TW593973B/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02Measures preceding sorting, e.g. arranging articles in a stream orientating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36Sorting apparatus characterised by the means used for distribution
    • B07C5/363Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B07C5/366Sorting apparatus characterised by the means used for distribution by means of air using a single separation means during free fall of the articles

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Sorting Of Articles (AREA)

Abstract

A workpiece is transported by a feeder to a sloping block. As the workpieces pass along a sloping portion of the sloping block, their attitudes are corrected so that all workpieces have the same attitude. They are then discharged into a free space, and images are picked up by CCD cameras of the four side surfaces of each workpiece as it is falling through the space along a downward curve. Images of the top surface and bottom surface of each falling workpiece are also picked up by CCD cameras positioned away from the downward curve of the workpiece.

Description

593973 玫、發明說明: 【發明所屬之技術領域】 本發明係關於一用於工件之外部檢查裝置、及一用以對 工件各表面進行外部檢查之外部檢查方法,其作法係利用 一影像拾取單元執行影像之拾取。 【先前技術】 傳統上,諸如電子設備中所用之電容器及感應器等晶片 係以一使用電荷耦r合裝置(C CD)攝影機之影像處理單元進 行外部檢查。日本專利特許公開申請案(JP_A)第〇7_88442 號即揭示該種可進行外部檢查之外部檢查裝置之一實例。 此外部檢查裝置係以下列程序進行工件之外部檢查。矩形 之平行六面體工件係由一零件進給器送至一管狀產品滑槽 之一頂端部分,然後穿過該產品’滑槽之内部。一設於該產 品滑槽底端之產品切割裝置可使該等工件之姿熊一致,然 表面,該等攝 後各工件便墜入一空間。四台攝影機係面對墜落工件之路 徑,且位於孩工件路徑上、與該路徑垂直之 影機可拾取工件四個側面之影像。 然而,在上述之傳統外部檢查裝置中,由於 垂直方向墜落,四個平行於該墜落方向〈係七― 部檢查’但其缺點則為:垂直於該 纟可接”卜 將無法接受外部檢查。此外,進向爻頂面及底面 工件之輸送及移動,作 域拾取檢查時需控制 控制該壓力銷之錯緊及釋^ ^限於—壓力銷;若欲 一r、及釋放時機、 、 之速度,動作將十分複雜。 二工件輸往該滑槽 593973 【發明内容】 構思本發明之目的即為胖決上述問題,本浓 、 ,、 係提供—種工件用之外部檢查裝置及 俾以簡 、、 夂種外邵檢查方法, 件上與工件墜落 面 〇 易方式進行外邵檢查,並使檢查之對务 ί象不僅止於工 工件墜落方向平行之表面,而係針對工件之所有$ 本發明之-工件外部檢查裝置具有:―用以輸送工件次 啦件:-修正暨排放元件’其可令來自該輸送元件之 工件通過一向下傾斜之傾斜路徑,並修正久 … / σ工件,使各工 態-致’然後將各工件排放至一空間;及一影像於 =件,其係由複數個影像拾取單元所形成,各影像拾^ 早兀均可拾取一排放自該修正暨排放元件、炊 曲線墜落並通過一空間之工件其·. 一表面之影像 &gt;。七一στ 在本發明具有上述結構之工件用外部檢查裝置中,今於 正暨排放元件設有一向下傾斜之傾斜路徑,來自該輸: 件之工件便將通過該傾斜路徑。當工件通過該傾斜路徑時 口工件 &lt; 妥悲均將被修正,致使各工件均具有一固Α次 悲。然後便可將該等工件(全部具有-相同姿態)以傾斜方: 向下排放土-空間内’使其沿—向下曲線墜^並通過該^ 間在此例中,當工件剛從該修正暨排放元件排出時,今 向下曲線之方向係與該傾斜路徑之斜率一致,但 :: 為一逐漸逼近一垂直方向之曲線。 又 因此,若影像拾取位置係設定在工件墜落路徑之弧形立 刀σ人便可暑景&gt; 像拾取單元設在特定之位置,使註等篆, 83903 -8 - 593973 像拾取單元可從該等影像拾取位置以正面相對 »· j ^万式分別 面對一工件之各表面。如此一來便可直接拾取— 工件任一 表面之影像。此外,吾人可在一工件墜落並通 、α唼芝間時 ,同時拾取其各表面之影像,因而提高檢查之速户 種情況下,若令該輸送元件連續輸出工件,檢3 ~ Α 高。 -且双率將更 —工件外部檢查裝置具有:一用以輸送工件;… \·馬、〗送元件 ;—修正暨排放元件,其可修正來自該輸送元 , T &lt;工件, 使各工件之方向一致,然後將各工件排放介 工間;及_ 由影像拾取單元所形成之影像拾取元件,該等与 一' 、 心1冢拾取單 兀^位置不致阻礙孩修正暨排放元件所排放之 T7 彳千 &lt; 墜蘇 硌挺,且該等影像拾取單元可拾取沿該墜落路徑隊y、, 、M ' 二土洛並通 ^ 空間之工件其頂面與底面至.少其中一面之影像。 在本發明具有上述結構之工件用外部檢查裝置中,倘4 (舉例而言)一被排放至該空間之工件所行經之墜落路徑2 一條沿一向下曲線之弧形路徑,吾人可將影像拾取單元設 於特疋位置,期使工件到達影像拾取位置時,該墜落路徑 在可與工件底面及頂面(亦即垂直於該弧形路徑線之表面) γ相对」&lt; 方向上不致受到阻礙,如此一來便可拾取 件頂面及底面之影像。 工 在此例中,一墜落工件之墜落路徑係由一傾斜之向下方 向漸變為—垂直方向,因此,吾人可利用一設於上方之= 依払取7L件、從正面相對之角度直接拾取工件頂面之影僻 並利用叹於下方之影像拾取元件、從正面相對之角 593973 &amp; '乜取f件底面之影像。吾人亦可為一影像拾取元件增 射射鍉,亚利用該影像拾取元件拾取由該等反射鏡所反 二乂正面用度呈現之工件頂面及底面之影像。此外,倘 垂被排攻至琢空間之工件所行經之墜落路徑係一條沿一 俨 向〜筆直路徑,吾人亦可為影像拾取元件增設反射 該等反射鏡之位置不可阻礙該墜落路徑),並利用該影 旦1又兀件拾取由該等反射鏡所反射之工件頂面及底面之 ::像二在此例中’吾人亦可將影像拾取元件設於一不致阻 &amp;:各路之位置’並直接拾取工件頂面及底面之影像。 二工件外部檢查裝置具有:-輸送元件,其可輸送被製 ,:开:平行六面體之工件;一修正暨排放元件,其可令來 24运凡件之工件通過—向下賴斜之傾斜路徑,並修正 :工件’使各工件之方向-致,'然後將各工件排放至一空 側面⑹像拾取元件,其係由四個影像拾取單元所形 、’孩等影像拾取單元可在各個排放自該修正賴元件 ;:件沿—向下曲線墜落並通過-空間時,分別拾取該工 像心平:於該向下曲線之表面之影像;及-頂、底面影 其係由—或兩個影像拾取單元所形成,該等 :、 兀所在之位置不致阻礙該修正暨排放元件所排 曲Γ工件沿該向下曲線墜落並通過—空間時所行經之向下 ::’且該等影像拾取單元可在工件沿該向下曲線墜落並 間時’拾取工件頂面與底面至少其中-面之影像。 正 構件用外邵檢查裝置中,該修 旦排放w用-傾斜路徑修正來自該輸送元件&lt;工 «S3 901 -10 - 593973 件之方向,使各工件之方向一致,然後將工件以傾斜方式 餮· * 向下排放至該空間,使其沿一向下曲線墜落。因此,若在 影像拾取位置周圍設置四個影像拾取單元,吾人便可在工 件墜落並通過該空間時,以正面相對之方式拾取工件上四 個平行於該向下曲線之側面之影像。此外,若令影像拾取 單元之方向係以正面相對之方式朝向一到達影像拾取位置 之工件之頂面及底面,吾人亦可拾取該工件頂面及底面之 影像。此時若使用一結構,其中設有反射鏡,且工件頂面 g 及底面之影像即經由該等反射鏡拾取,吾人便可選擇影像 拾取單元之設置位置(因為可供設置影像拾取單元以拾取 工件頂面及底面影像之位置甚多),並藉以提高該裝置之設 計自由度。 一工件外部檢查裝置具有:一斜坡,其具有一上端及一 下端;一修正元件,其位於該斜坡,且可控制工件之方向 ,使其方向一致;一工件供應器,其可將工件供應至該斜 坡之上端;及至少一個影像拾取單元,其可拾取從該斜坡 _ 下端排出之工件其一表面之影像。 在本發明具有上述結構之工件用外部檢查裝置中,該斜 坡即為該修正元件,其可修正來自該工件供應器之工件之 方向,使各工件之姿態一致,並將工件以傾斜方式向下排 放至一空間,使工件沿一向下曲線墜落。 在此例中並未設置一預定作為驅動振動產生裝置之輸送 元件,故可簡化該外部檢查裝置之構造。 一工件外部檢查方法具有:一輸送步驟,其中將進行工 -11 - 件 &lt; 輸送;一修 ,俾使各1件之方二排放步驟,其Μ修正已到達之工件 排放至一⑽,並致,且其中工件將以傾斜方式向下 ’其中將拾取—被曲線墜落’·及-影像拾取步驟 工件其各表面之影像:…間、亚沿-向下曲線墜落之 Ζ本:明具有上逑結構之工件用外部檢查方法中,工件 I…下曲線墜落,且吾人可在 時’拾取其各表面之影像,因此,五人;二…1間 表面之# 。人如可拾取工件所有 彻:】高&quot;查效率咖吾人可拾取工件所有表面 件:=卜=查Γ具有:―輸送步驟,其中將進行工 正暨排放步驟’其中將修正已到達之工件 門俾使各工件之方向-致,且其中各工件將被排放至―: 茨及—影像拾取步驟,其中將針對各個排放至該空間之 仗不致阻礙孩工件墜落路徑之位置拾取該工 件頂面與底面至少其中—面之影像。 在本發明具有上述結構之工件用外部檢查方法中,若工 。r、。向下曲線墜洛’當一工件到達影像拾取位置時, 可與該工件之頂面及底面正面相對之位置並不在墜落路徑 中。因此’吾人可將影像拾取元件設於面向工件頂面及底 面之位置’並拾取工件頂面及底面之影像。在此例中亦可 =反射鏡拾取影像。此外,若工件係沿一垂直方向坚落 吾人亦可將反射鏡設於不致阻礙墜落路徑之位置,並以 影像拾取單元透過該等反射鏡拾取工件頂面及底面之影像 -12 - :抑或將影像拾取單元設於不 直接拾取影像。 土/口各k孓位置,並 —工件外部檢查方法具有:一輸 製成矩形平行六面體之工件…修正既排0中將輸送被 修正已到、4、 I正旦排放步驟,其中將 已到達〈工件,俾使各工件之方向一致 將以傾44 士 / 且其中工件 一例面二排放至—空間,並沿-向下曲線墜落; …T取步驟中將針對各個排放至讀空間之墜 :像及拾取其四個平行於該向下曲線之表面中各表面之 Γ二影像拾取步驟,纟中將針對各個排放至該空間 :二Γ 一不致阻礙該工件墜落路徑之位置拾取該 、面Μ甩面至少其中—面之影像。 本發明具有上述結構之工、^ 一矩 、㈣万法可同時檢查 y 丁 ”面工件又六個表.面,故可執行高效率+幹 查。此外,所有表面均可受檢,亦將改良檢杳 【實施方式】 卞確技 /下私参圖式以說明本發明之具體實例。圖1顯示一根 抓本發明〈外部檢查裝置10。此外部檢查裝置10之一底部 4由正万形板狀基座部分n所形成,該基座部分之一頂 ®成有執II (未圖示)。在基座部分η之頂面上設有—工件供 應單元』、一檢查單元30、及一分類單元⑽,I單元在該 等軌道上之位置均可調整(亦即朝圖1之左或右側調整)。 工件ί、應單元2〇&lt;底部係由一活動基座2 |所形成,該活 動基座係與基座部分11之軌道接合。活動基座21上設有多 種調整螺絲及固定螺絲(未圖示)。若欲固定活動基座2丨之位 SVJO.^ 置,作法係令活動基座2 1沿軌道移動,使其到達基座部分 丨1上之任一位置’然後鎖緊固定螺絲。此外,藉由調替該 等調整螺絲即可調整活動基座2 1在一垂直方向及前一後方 向(圖式中最靠近讀者之部分為前方)上、相對於基座部分1 1 之位置。 一振動產生元件22係安裝於活動基座21之頂面,且其内 裝有一具有一馬達或類似物之振動產生機構。此外,/用 以將工件5 0 (參見圖5 )進給至檢查單元3 〇之進給器2 3係安裝 於振動產生元件22之頂面。進給器23上方則設有一可暫時 盛1工件50之漏斗24。在漏斗24某一端之一底部設有/供 應滑槽2 5,其可3^漏斗24内之工件50供應至進給器23。 一用以將工件5 0排放至供應滑槽2 5之排放開口係設於漏 斗24中與供應滑槽25相連之部分。此外,漏斗24在活動基 座2 1頂面後端部分上之設置位置係高於進給器23在該後端 邵分上以一支撐部分進行安裝之位置。圖2係進給器23、漏 斗24、及供應滑槽25之結構平面圖。 換言之’進給器23係水平設置,且係由一形成於進給器 23可端邵分(亦即圖2下方部分)之寬闊、平面狀工件接收部 分23a、及一形成於進給器23後端部分之狹窄、溝槽狀工件 輸运邵分23b所形成。工件輸送部分23b之剖面構造在其縱 向上足一實質中段部分形成一凹槽部分23c之位置點係製 成一 V形溝槽構造。形成此v形溝槽之兩側面均與一水平面 成43度角’因此,該兩側面間之角度係設為90度。工件接 收4 + 2 j a及工件輸送部分2 3 b係獨立之個體,且工件輸送 -14 - 部分23b$末端部分係朝檢查單元3〇向外延伸並超過工件 接收部分2 3 a之末端部分。 工件接收部分23a可因振動產生元件22之驅動而振動,俾 將漏斗24經由供應滑槽25所供應之工件5〇移至工件輸送部 分23b足後端邯分。工件輸送部分23b可因振動產生元件 之驅動而振動,俾使來自工件接收部分23a之工件5〇在溝槽 之凹槽部分23c内排成一列,並將其移至工件輸送部分2儿 之末端。在供應滑槽25之一侧邊部分設有一感測器%,其 可偵測進給器23内之工件50。當感測器26偵測出進給器23 内之工件50減少時,一振動元件(未圖示)可使漏斗24產生振 動,俾將一工件50釋放至供應滑槽25。 再者,除進給器23外,吾人亦可以皮帶輸送器、橡膠輸 送器、空氣輸送器…等作為一輸送元件。 此外,該輸送元件並不限於一驅動振動產生裝置之構造 ’亦可改用一斜坡之構造。換言之,一工件供應單元可設 置· 一具有 上^及一下知之斜坡;一修正元件,其係設 於該斜坡,且可控制一具有均一姿態之工件;及一工件供 應器,其可將工件供應至該斜坡之上端。 檢查單元30之形成方式係將一可執行檢查作業之主體部 分置於一下活動基座31之一頂面。該活動基座31係與基座 部分Π上之軌道接合,且可固定於基座部分丨丨軌道上之任 一位置。活動基座3 1之上端部分係朝工件供應單元2〇中進 給器23之末端部分折曲’其頂端則設有一平面狀基座板32 ,基座板3 2之頂面係朝進給詻2 3傾、斜。如圖3 (圖1中符號a 83903 -15- 所指區域之放大圖)所示,在基座板32之 .. &lt;甲央5又有—排放滑 ma’其可排放在檢查單元3〇内已完成影像拾取作業之工 件50,且基座板32亦設有一用以拾取工件5〇底面影 送開口 32b。 〜 當基座板32底面之一末端側邊部分到達活動基座3〗頂端 表面上之正確位置時,基座板32便已固定。排放滑槽= 安裝於活動基座31之一側、開口321)之—周邊部分上,且其 形成表面部分之部分具有半圓形溝槽狀之剖面。開口中 面向排放滑槽3 2 a溝槽表面之部分形成一空間。 基座板j 2之頂面設有一用以拾取影像之連接部分μ,其 所形成之通道可連接進給部分23中工件輸送部分Bb之溝 槽與排放滑槽32a之溝槽,且該連接部分設有可分別拾取— 工件50各表面影像之對應構件及其類似物。該影像拾取連 接部分33係由下列各部分所形成:一矮、但形成一圓柱形 空間〈邯分33a,一底面部分33b,其係安裝於空間形成部 分33ai底面,一外殼邵分33c,其位於空間形成部分與 底面部分33b之外周邊;及一頂面部分33d,其係安裝於空 間形成邵分33a與外殼部分33(:之頂面。 在空間形成部分33a與外殼部分33c所形成之一側邊部分 上共設有四個沿圓周等距排列之傳送開口 33e(圖3僅顯示 其中兩開口)’其係從空間形成部分33a之内圍表面貫穿至 外殼部分33c之外圍表面。此外,底面部分33b之中央設有 一開口 33f ’其直徑既小於基座板32中開口迅之直徑,亦 小於空間形成部分33a之開口。排放滑道32a之一頂端部分 -16 - 係穿過開,口 33f,且—直延伸至空間形成部分33a之中心附 近。此外,頂面部分33d之中央設有— :; 、 J 同口 j g,其直π 於空間形成邵分33a之開口直徑,但太 、I 7、 —之於辰面邵分33b中 口 33f之直徑。-傾斜塊體34係安裝於開口 ^之邊开 傾斜塊J 4之一頂面係由—水平 ,7 、 卩分3ZU及一傾、斜部八 3 4 b所形成,且該傾斜部分係由水平部八、、 刀 刀4 a又末端向下傾 斜。傾斜鬼體34係安裝於影像拾取連' 〜 咖,且水平部分版後端部分係位於進給器23中工二 送部分2如末端。在傾斜塊體34之水平部分w及倾^ 分34b内設有V形溝槽’其剖面構造係與工件輸送部分 内所形成之溝槽完全相同,且該形溝槽係 刀人」、, ,、w ^ »T w-i 1¾. 部分23b之溝槽。位於傾斜塊體34傾斜部分3 Ί \溝槽, 其下端部分大體上係延伸至影像.拾取連接部分3 3内部空間 之中心附近、排放滑槽32a之上方。 工 位於傾斜塊體_34傾斜部分34b内之溝槽及排放滑槽仏係 彼此平行。位於傾斜塊體34傾斜部分3仆内之溝槽及排放滑 槽32a均垂直於影像拾取連接部分33之頂面及基座板32。請 注意,傾斜塊體34之安裝方式係令其後端部分極靠近但未 實際接觸工件輸送部分2313之末端部分’如此—來,工件輸 送部分23b之振動便不致傳送至傾斜塊體34。因此,傾斜塊 體34可使來自進給器23、且到達時仍在振動之成列工件5〇 .停止振動,並將其送往水平部分34a之末端部分。而後該等 工件將沿傾斜邵分34b下滑。工件50將從傾斜部分34b之底 端排放至一空間,並掉落至排放滑槽32a之溝槽部分。此外 cS39()3 17 - ’亦可以—傾斜管取代傾斜塊體3 4。 如圖4所示,四個照明元件35^ 3讣、35〇、及其類似物 (圖4僅顯示三個照明元件)係沿影像拾取連接部分33之圓周 等距叹且。涊四個照明元件可照亮一從傾斜塊體$ 4墜落之 工件5 0又側面。一可作為影像拾取啟動器之傳送感測器% 係安裝於影像拾取連接部分33其空間形成部分33a之—内 圓周表面上。該傳送感測器可偵測出一從傾斜塊體34墜落 〜工件5 0。照明元件3 5 a及其類似物可在傳送感測器3 6測得 一工件50時,執行其照明之動作。 此外,四個CCD攝影機37a、37b、37c、及37d係設於影 像拾取連接邵分33之周邊。當一工件5〇從傾斜塊體Μ墜落 時,琢四個CCD攝影機可透過四個傳送開口 33e拾取其側面 心影像。此外,兩CCD攝影機37e.及37f係設於影像拾取連接 4刀J J又上、η、方,其可拾取工件5 〇頂面及底面之影像。 一反射鏡39a係經由一托架38a而裝設於影像拾取連接部 分3 3之一頂面上。CCD攝影機37e可利用此反射鏡3%之反 射,拾取一工件50頂面之影像。此外,一反射鏡3讣係經由 一托架38b而裝設於基座板32之一底面上,CCD攝影機37f 可利用此反射鏡39b之反射,拾取一工件50底面之影像。此 時,照明元件35a及其類似物之照明效果可使CCD攝影機 3 7 a及其類似物所攝取之影像明亮而清晰。 分類單元4 0係由一活動基座4 1及一旋轉台4 2所形成,前 者形成該分類單元之下端部分,後者則形成其上端部分。 活動基座4〗係與基座部分1丨之軌道接合,以利吾人調整活 -IS- 593973 動基座4 1之位置。活動基座4 1内設有一驅動機構,其具有 «* 一可使旋轉台42轉動之電馬達或其類似物。旋轉台42係透 過一轉軸43連接至活動基座41之驅動機構。旋轉台42之頂 面係由一圓板狀之橡膠板42a所形成。橡膠板422之一外圍 部分係面向排放滑道32a之一底端部分,且旋轉台42係水平 安裝於活動基座4 1上。 兩空氣喷射元件(未圖示)係以預定之間距安裝於旋轉台 42上万d、圍侧邊邵分上。—無缺點物件容納盒及一缺 點物件容納盒(未圖#,兩者均^容納工件5〇)係位於旋轉台 42-面向該等空氣噴射元件之末端部分下方。心偵測對 應工件50之感測器即安裝於該等空氣噴射元件附近。 分類單元40可利用旋轉台42之旋轉,接收已接受檢查、 且已從排放滑槽3 2 a墜落之工件s o ^ // 忤50。然後分類單元40將使工 件5 0在方疋轉台4 2頂面之一外圍部八μ I凶口f5刀上、以預定之間距排成 一列,之後再將其送往該兩物件交 奶忏各納盒。當一無缺點工件 )〇從該無缺點物件容納盒旁經過 . 万 '、工心時’感測器將偵得該工件 :)0,而空氣噴射元件則將 匕俏,則結果而開始運作。此工 件州將被吹入該無缺點物件容· ,,L 、 鬥風中。當—缺點工件50從 涊缺點物件容納盒旁經過時, + ^忍測态將偵得該工件50,而 空才又贺射元件則將因此偵測結果 Α 開々口運作。此工件50將 被吹入該缺點物件容納盒中。 丁 丁 m… T利用此-程序,吾人便可將 • 5 S為典缺點物件及缺點物件。 外部檢查裝置10除上述各裝 , 及其類似物之外,尚且有 一於像處理元件,其包括cC 内/、有 科心機j7a及其類似物、及一 8390.^; -19 - (CPU)、唯讀記憶體(rom)、及隨機存取 機3;广電控單元。該影像處理元件可對CCD攝影 機^及其類似物所拾取之影像進行影像處理,並判斷-工 :5〇究竟為無缺點物件或缺點物件。該影像處理元件尚具 、螢幕’其可提供各工件50六個表面之放大圖。操作員 研可檢視此螢幕而以目視方式判斷。 以下將說明如何利用一且古μ 、、^ 、 八有上述結構之外部檢查裝置10 進行外部檢查,其中係以—電容器晶片作為圖5所示之受檢 工件50。由該電容器晶片所形成之工件5〇係以陶资製成, 且具有形成於其兩末端部分之電極。工件5〇之長度為!公厘 ’垂直及水平寬度均設為0.5公厘。 檢查時,首先需將待檢查之工件5〇聚集在工件供應單元 2〇之漏斗24中,然後開啟外部檢查裝置1〇之電源開關,使 外部檢查裝置10内之各元件開始運作。在工件供應單元2〇 中,將有一預定數量之工件50從漏斗24之排放開口經由供 應滑槽25供應至進給器23。在此例中,當感測器26偵測出 進給斋23内之工件50減少時,漏斗24將被振動,俾從該排 放開口供應一工件50至進給器23。如此一來,進給器以内 便可常保一預定數量之工件5 〇。 供應至進給器23之工件50將在振動產生元件22之驅動下 離開工件接收部分23a,並聚集在工件輸送部分23b之後端 部分。聚集在工件輸送部分23b後端部分之工件50其縱向上 之轉角部分可與工件輸送部分2扑溝槽之凹槽部分23〇相匹 配;若令工件5 0彼此相鄰且頭尾相連,該等工件可在工件 83903 -20- 輸送部分,23b之溝槽内排成單列。之後,工件5〇將在振動產 生元件2 _之驅動下’沿凹槽邵分2 3 c前進至工件輸送部分 23b之末端’同時保持其在單列中之對準關係:錢便被送 往傾斜塊體34水平部分343之溝槽。 送達傾斜塊體34水平部分34a之工件5〇已不受振動之影 H此夕1,在各工件30《末端表面均接觸先行工件之末 端表面之情況下’各工件均將被其後之工件5〇推動,因而 移至水平部分34a之末端。當—工件5Q到達水平部分^之 末端時 ',其前端部分將向下傾斜,然後該工件便進入傾: 部分34b之溝槽中。該工件將沿傾斜部分地之溝槽下降。 該工件50之四個側面中有兩側面係沿形成傾斜部分3·溝 槽之兩側面滑動,如此一來便可在該工件5〇到達傾斜部分 糾之底端前’使該工件5〇具有正確之方向。然後,如圖5 :示’當所有工件50之方向—致時(其中工件之兩末端表面 ίτ、朝向一微傾表面之上、下祥,、 该寺工件50便將以傾斜方 式、從傾斜部分34b之底端向下排放至一空間内。 傾斜塊體34相對於影像拾取連接部^之^係經過於 足’俾使墜落之工件50穿過影像拾取連接部分3]内部 〈中央部分。當-工件50穿過影像拾取連接部㈣之中央 部分時,傳送感測器36可僧測出該工件5〇。照' 明元件^及 其類似物將因而啟動’並照亮該工件5〇之惻面。此外,咖 攝影機37a至37『則將拾取相關工件5〇對應表面a、b 及D之影像。 ' 換言之’CCD攝靡a至37何以正面相對… 593973 拾取工件50其表面A、B、C、影像。CCD攝影機37e 可透過反射鏡39a、從一略斜之方向拾取工件5〇頂面E之影 像’而C C D知}: 機3 7 f則可透過反射鏡3 9 b、從一略斜之方 向拾取工件50底面F之影像。然後再由一影像處理元件判定 以上述方式拾取之六個表面之影像品質。判定之方式係將 外部尺寸、污染、瑕疵、污染物之黏著、預作之記號是否 存在、及其類似項目與預定之標準進行比較。在此例中所 拾取之X個表面之放大影像可顯示在影像處理元件之螢幕 上,因此,操作員亦可從螢幕探知工件5 〇之哪一部分具有 何種缺點。 ^ 一品質業經判定之工件50將墜落至排放滑槽32a之溝槽 中’並沿排放滑槽32a之溝槽下降。而後該工件將墜落至分 類單兀40其旋轉台42之頂面,旋轉台42將攜載該工件5〇。 倘若茲工件:)0無缺點’該工件將被對應之空氣噴射元件吹 入無缺點物件客納盒中。倘若該工件5 〇具有缺點,該工件 將被對應之空氣噴射元件吹入缺點物件容納盒中。如此一 來,工件50便分為無缺點物件及缺點物件,然後聚集在對 應之容納盒内。 因此’根據此外邵檢查裝置1 〇,在傾斜塊體34之傾斜部 分34b中設有一溝槽,其角度係與工件5〇之轉角部分相同, 且工件:)0 F降時即沿該傾斜部分34b之溝槽移動。因此,所 有排放自傾斜塊體34之工件50均將被修正,俾使其姿態— 攻’且所有工件5 0均將沿一向下曲線、並循一傾钭方向墜 洛並穿過一芝間。再者,由於所設之CCD攝影機37a至37f 可在一工件50墜落並穿過該空間時,拾取其六個表面中、 。表w ’因此,吾人將可同時檢查該工件5〇之所有表面 此夕丨,由於用以將工件5 〇輸送至傾斜塊體3 4傾斜部分,仆 孓元件係由進給器23所形成,其中該進給器之溝槽係與傾 斜塊體34中傾斜部分34b及水平部分内之溝槽完全相同 且吾人僅需令進給器23產生振動即可使工件5〇朝水平部 分34a移動,因此,該輸送元件可採用極為簡單之結構。此 1,吾人可控制振動之次數,藉以透過進給器23控制工件 5_〇&lt;供應速度,進而控制工件50墜落之間距。此外,工件 j司達水平邯分34a後便不再受到振動,且將以固定之間距 ^不變疋姿態逐一墜落至傾斜部分34b,因此,即使傾斜部 (長度偏短,自傾斜部分34b底端排放之工件%仍將 -有%疋且規則之姿態。如此一來便可作準確之檢查。 「如圖6所示,工件5〇剛從傾斜部分34b之底端排放時,其 土洛路k &lt;角度係與傾斜部分34b之傾角相同,但該墜落路 伎如漸交為一垂直方向。因此,一如本具體實例之情形, 若將影像拾取位置設在傾斜部分州之底端附近,即使反射 J兄Ja及j )b所在之位置遠離工件5 〇之墜落路徑,吾人仍可 從特足位置拾取一工件5〇頂面及底片之影像,該等特定位 jl係非近可直接與工件5 〇頂面及底面正面相對之位置。如 此一來便可改良檢查之準確度。 此W在上逑具體實例所使用之結構中,CCD攝影機37e 及37f係透過反射鏡39&amp;及39b拾取一工件50頂面及底面之 鉍悚,然而,吾人亦可在不設反射鏡39a及39b之情況下, -23 - 直接以C C D攝影機拾取影像。在該種情況下’設置排放滑 槽3 2 a之位置最好更低,亦即距傾斜塊體3 4之底端更遠,俾 加大工件5 0墜落時穿過該空間之距離。由於此一作法可縮 短工件向前芽過空氣之距離,因此,安裝C C D攝影機所言 足空間可將如願地確保。 此外’吾人亦可縮小傾斜塊體34中傾斜部分34b之傾角(亦 即使其更接近水平),使吾人可從後方看見一墜落工件5〇之 0、面’並從兩方看見其底面。吾人亦可藉由此一作法,將 用^尨取違頂面及底面影像之攝影機之設置方式簡化 i 土可k直接與孩頂面及底面正面相對之位置拾取影像 此々丨,由於墜洛速度減慢,影像拾取位置之設定將更加 ,準,使檢查更為準確。此夕卜,根據本發明,當工件5〇暨 :時疋姿態從一傾斜狀態漸變至.一垂直方向、及當墜落路 ,傾斜狀態保持原狀時’亦可達相同之極佳效果。 【圖式簡單說明】 顯不〜根據本發明一具體實例之外 圖1係一前視立面圖 部檢查裝置。 . &amp;來罝中一 應滑槽之平面圖。 、 圖^係圖1區域a中所示部八、 m , 丨刀〈放大圖 W4係—檢查單元之平面圖。 斜路徑 圖5係一立體圖式, 態。 〜717 —工件從 圖6係一說明圖 顯示一工件之一墜落路徑及反射鏡之位 -24- 593973 置。 【圖式代k符號說 10 11 20 2 1 22 23 23 a 23b 23c 24 25 26 3 0 3 1 32 32a 32b 、 33e 3 3 33a 33b 33c 3 3d 明】 外部檢查裝置 基座部分 工件供應單元 活動基座 振動產生元件 進給器 工件接收部分 工件輸送部分 凹槽部分 漏斗 供應滑槽 感測器 檢查單元 下活動基座 基座板 排放滑槽 傳送開口 影像拾取連接部分 空間形成部分 底面部分 外殼部分 頂面部分593973 Description of the invention: [Technical field to which the invention belongs] The present invention relates to an external inspection device for a workpiece and an external inspection method for external inspection of each surface of a workpiece. The method is to use an image pickup unit Perform image pickup. [Prior Art] Traditionally, chips such as capacitors and sensors used in electronic equipment have been externally inspected with an image processing unit using a charge coupled device (C CD) camera. Japanese Patent Laid-Open Application (JP_A) No. 07-88442 discloses an example of such an external inspection device that can perform external inspection. The external inspection device performs external inspection of the workpiece by the following procedure. A rectangular parallelepiped workpiece is fed by a part feeder to a top portion of a tubular product chute and then passes through the interior of the product 'chute. A product cutting device installed at the bottom end of the product chute can make the posture of these workpieces consistent, but the surface will fall into a space after the photographing. The four cameras are facing the path of the falling workpiece, and the cameras located on the path of the workpiece and perpendicular to the path can pick up images of the four sides of the workpiece. However, in the above-mentioned conventional external inspection device, due to a vertical fall, four parallel to the fall direction are "seven-part inspection", but the disadvantage is that it is perpendicular to the entrance. "Bu will not be able to accept external inspection. In addition, the conveyance and movement of the workpiece on the top and bottom surfaces of the heading shall be controlled to control the misalignment and release of the pressure pin during field pickup inspection. ^ Limited to—the pressure pin; if you want r, and the release timing, and speed, The movement will be very complicated. Two workpieces are sent to the chute 593973. [Summary of the invention] The purpose of the invention is to solve the above problems for fat, Bennon, ,, and provide an external inspection device for workpieces, and to simplify, This kind of inspection method is based on the surface of the workpiece and the surface of the workpiece. It is easy to inspect the surface of the workpiece and make the inspection not only stop on the surface parallel to the falling direction of the workpiece, but also for all the workpieces. -The external inspection device of the workpiece has:-used to convey workpieces:-correction and discharge element 'which can pass the workpiece from the conveying element through a downwardly inclined inclined path And correct the workpiece for a long time ... / σ, so that each working mode is the same, and then each workpiece is discharged to a space; and an image in the piece, which is formed by a plurality of image pickup units, each image is picked up early It is possible to pick up a work piece discharged from the correction and discharge element, a cooking curve falling and passing through a space .. A surface image &gt; 七一 στ In the external inspection device for a work piece having the above-mentioned structure of the present invention, now Yu Zheng The discharge element is provided with an inclined path inclined downward, and the workpiece from the input will pass through the inclined path. When the workpiece passes the inclined path, the workpiece will be corrected, so that each workpiece has a Fix A times tragically. Then you can tilt the workpieces (all with the same posture): tilt down the soil-space 'down to make it fall along the downward curve ^ and pass through this time ^ In this example, When the workpiece has just been discharged from the correction and discharge element, the direction of the downward curve is consistent with the slope of the inclined path, but :: is a curve that gradually approaches a vertical direction. Therefore, if the image pickup position is set at work The arc-shaped blade of the fall path σ can be used for summer scenes.> The image pickup unit is set at a specific position, so that the note is waiting. 83903 -8-593973 The image pickup unit can face up from these image pickup positions »· j ^ Wanshi faced each surface of a workpiece separately. In this way, it can be directly picked-an image of any surface of the workpiece. In addition, when a workpiece is dropped and passed between α and Shiba, at the same time, it can pick up each surface of the workpiece. Under the circumstances that the inspection speed is increased, if the conveying element is allowed to continuously output the workpiece, the inspection will be 3 ~ Α. -And the double rate will be more-the external inspection device of the workpiece has: one for conveying the workpiece; 、 Sending components;-Correction and discharge components, which can correct the workpieces from the transport element, T &lt; make the directions of each workpiece consistent, and then discharge each workpiece to the intermediary; and _ the image formed by the image pickup unit Picking up the components, these are not the same as the pick-up unit of the center, and the position of the pickup unit does not prevent the correction and discharge of the T7 from the emission component. The image pickup unit can pick up the line along the fall path. y ,, M 'and two soil Los ^ work space through which the top and bottom faces to. Wherein at least one side of the image. In the external inspection device for a workpiece having the above structure of the present invention, if 4 (for example) a fall path through which a workpiece discharged into the space passes 2 an arc-shaped path along a downward curve, we can pick up the image The unit is located in a special position, so that when the workpiece reaches the image pickup position, the fall path can be opposite to the bottom and top surfaces of the workpiece (that is, the surface perpendicular to the arc path line). , So that you can pick up the top and bottom images. In this example, the falling path of a falling workpiece is gradually changed from an inclined downward direction to a vertical direction. Therefore, we can use a = set on the top to take 7L pieces and pick them directly from the opposite angle. The shadow of the top surface of the workpiece is hidden, and the image pickup element sighed below is used to pick the image of the bottom surface of f pieces from the opposite angle of the front side 593973. We can also add an image to an image pickup element, and Asia uses the image pickup element to pick up the image of the top and bottom surfaces of the workpiece represented by the front side of the mirror. In addition, if the falling path of the workpiece that is being attacked to cut into the space is a straight ~ straight path, we can also add an image pickup element to reflect the position of these mirrors can not hinder the falling path), and Use the shadow dan 1 and the components to pick up the top and bottom surfaces of the workpiece reflected by these mirrors :: Like in this example, 'I can also set the image pickup element in an unobstructed &amp;: Position 'and directly pick up the top and bottom images of the workpiece. Two external inspection devices for workpieces include:-Conveying elements, which can convey workpieces that are made of :: Open: parallelepiped workpieces; a correction and discharge element, which can allow 24 workpieces to pass through-downward slanting Tilt the path and correct: The workpieces 'align the orientation of each workpiece,' and then discharge each workpiece to an empty side image pickup element, which is formed by four image pickup units, and the image pickup unit such as a child can be Discharged from the modified Lai element ;: When the pieces fall along the downward curve and pass through the -space, pick the heart-shaped image of the work: the image on the surface of the downward curve; and-the top and bottom shadows are caused by-or two Formed by an image pick-up unit, such as :, where the position is not to hinder the correction and the arrangement of the discharge element, the workpiece falls along the downward curve and passes through the space downwards: '' and these images The pick-up unit can 'pick at least one of the top and bottom surfaces of the workpiece when the workpiece falls along the downward curve. In the external inspection device for normal components, the Xiu Dan discharge w-inclined path corrects the direction from the conveying element &lt; S3 901 -10-593973, so that the directions of each workpiece are consistent, and then the workpiece is tilted餮 · * Drain down into the space and make it fall along a downward curve. Therefore, if four image pickup units are set around the image pickup position, we can pick up the four images of the side of the workpiece parallel to the downward curve when the workpiece falls and passes through the space. In addition, if the direction of the image pickup unit is face to face toward the top and bottom surfaces of a workpiece that reaches the image pickup position, we can also pick up the images of the top and bottom surfaces of the workpiece. At this time, if a structure is used in which a reflector is provided, and the images of the top and bottom surfaces of the workpiece are picked up by these mirrors, we can choose the location of the image pickup unit (because the image pickup unit can be set to pick up There are many positions of the top and bottom images of the workpiece), and the design freedom of the device is improved. A workpiece external inspection device has: a slope having an upper end and a lower end; a correction element located on the slope and capable of controlling the direction of the workpiece so that the directions thereof are consistent; a workpiece supplier which can supply the workpiece to The upper end of the slope; and at least one image pickup unit that can pick up an image of a surface of the workpiece ejected from the lower end of the slope. In the external inspection device for a workpiece having the above structure of the present invention, the slope is the correcting element, which can correct the direction of the workpiece from the workpiece supplier, make the postures of the workpieces uniform, and tilt the workpieces downward Discharge to a space, and make the workpiece fall along a downward curve. In this example, a conveying element intended as a driving vibration generating device is not provided, so that the configuration of the external inspection device can be simplified. An external inspection method of a workpiece includes: a conveying step, in which work -11-pieces &lt;conveying; a repair, a two-step discharge step of one piece each, the M correction of the arrived workpiece is discharged to a stack, and And the workpiece will be tilted downwards 'where will be picked-dropped by the curve' and-the image of the image of the workpiece surface on the image picking step: ... In the external inspection method of the workpiece of the structure, the workpiece I ... the lower curve falls, and we can 'pick up the images of its various surfaces at that time, so five people; two ... 1 between the surface #. If a person can pick up all the workpieces:】 High "Check efficiency. I can pick up all the surface parts of the workpiece: = 卜 = 查 Γ has: ―Conveying step, which will be carried out the process of rectification and discharge '', which will correct the workpiece The door aligns the directions of the workpieces, and each of the workpieces will be discharged to ::-The image picking step, in which the top surface of the workpiece will be picked up for each position discharged into the space so as not to hinder the falling path of the workpiece An image of at least one of the surface and the bottom surface. In the external inspection method for a workpiece having the above-mentioned structure according to the present invention, if it works. r ,. Downward curve drop 'When a workpiece reaches the image pickup position, the positions opposite to the top surface and the bottom surface of the workpiece are not in the fall path. Therefore, ‘we can set the image pickup element at a position facing the top and bottom surfaces of the workpiece’ and pick up the image of the top and bottom surfaces of the workpiece. In this example, you can also use the mirror to pick up the image. In addition, if the workpiece is firmly fixed in a vertical direction, we can also set the mirror at a position that will not obstruct the fall path, and use the image pickup unit to pick up the images of the top and bottom surfaces of the workpiece through these mirrors. The image pickup unit is configured to not directly pick up images. Each position of the soil / mouth, and the external inspection method of the workpiece include: a workpiece that is made into a rectangular parallelepiped ... amending the existing row 0 will be transported to be corrected, 4, I Zhengdan discharge steps, which will have Reaching the workpiece, if the directions of the workpieces are the same, the workpiece will be tilted at 44 ± /, and the workpiece will be discharged into the space, and will fall along the downward curve;… T will take each discharge to the reading space in the taking step. : Image and pick up the Γ two image picking steps of each of its four surfaces that are parallel to the downward curve, and the middle will be discharged to the space for each one: two Γ a position that does not hinder the fall path of the workpiece Μ throws at least one of the faces. The present invention with the above structure can simultaneously inspect six workpieces on the surface of Y-Ding surface, so high efficiency + dry inspection can be performed. In addition, all surfaces can be inspected, and Improved inspection [Embodiment] 卞 Confirmation / individual reference diagrams to illustrate a specific example of the present invention. Figure 1 shows a grasp of the present invention <external inspection device 10. The bottom 4 of one of the external inspection device 10 by Zhengwan A plate-shaped base portion n is formed, and one of the base portions is formed into a holder II (not shown). On the top surface of the base portion η, a workpiece supply unit is provided, an inspection unit 30, And a sorting unit ⑽, the position of unit I on these tracks can be adjusted (that is, to the left or right of Fig. 1). Workpiece 应, application unit 2 &lt; bottom is made of a movable base 2 | Formed, the movable base is engaged with the track of the base portion 11. The movable base 21 is provided with various adjusting screws and fixing screws (not shown). To fix the position of the movable base 2 丨 SVJO. ^, The method is to move the movable base 2 1 along the orbit to make it reach any position on the base part 丨 1 Set 'and then tighten the fixing screws. In addition, you can adjust the movable base 2 by replacing the adjustment screws 2 1 in a vertical direction and front to back direction (the part closest to the reader in the figure is the front), relative At the position of the base portion 1 1. A vibration generating element 22 is installed on the top surface of the movable base 21, and a vibration generating mechanism having a motor or the like is installed therein. In addition, it is used to place the workpiece 5 0 (See Fig. 5) The feeder 2 3 fed to the inspection unit 3 is mounted on the top surface of the vibration generating element 22. Above the feeder 23 is a funnel 24 which can temporarily hold 1 workpiece 50. In the funnel 24 One end is provided with a supply chute 25 at the bottom, which can supply the workpiece 50 in the hopper 24 to the feeder 23. A discharge opening for discharging the workpiece 50 to the supply chute 25 is provided. The part connected to the supply chute 25 in the hopper 24. In addition, the position of the hopper 24 on the rear end portion of the top surface of the movable base 21 is higher than that of the feeder 23 with a support portion on the rear end portion. Installation position. Figure 2 shows the structure of feeder 23, hopper 24, and supply chute 25. In other words, the 'feeder 23 is horizontally arranged, and is formed by a wide, planar workpiece receiving portion 23a formed on the end of the feeder 23 (that is, the lower part of FIG. 2), and a feeder formed on the feeder 23. The narrow, groove-shaped workpiece transporting portion 23b at the rear end of the feeder 23 is formed. The cross-sectional structure of the workpiece transporting portion 23b is formed at a position where a substantial middle portion forms a groove portion 23c in its longitudinal direction. V-shaped groove structure. Both sides forming the V-shaped groove are at a 43-degree angle with a horizontal plane. Therefore, the angle between the two sides is set to 90 degrees. Workpiece receiving 4 + 2 ja and workpiece conveying section 2 3 b is an independent entity, and the end part of the workpiece conveying -14-part 23b $ extends outward toward the inspection unit 30 and beyond the end part of the workpiece receiving part 23a. The workpiece receiving portion 23a can be vibrated by the driving of the vibration generating element 22, and the workpiece 50 supplied from the hopper 24 through the supply chute 25 is moved to the rear end of the workpiece conveying portion 23b. The workpiece conveying portion 23b can be vibrated by the driving of the vibration generating element, so that the workpieces 50 from the workpiece receiving portion 23a are lined up in the groove groove portion 23c and moved to the end of the workpiece conveying portion 2 . A sensor% is provided on one side portion of the supply chute 25, which can detect the workpiece 50 in the feeder 23. When the sensor 26 detects that the workpiece 50 in the feeder 23 is reduced, a vibrating element (not shown) can cause the hopper 24 to vibrate and release a workpiece 50 to the supply chute 25. Furthermore, in addition to the feeder 23, we can also use a belt conveyor, a rubber conveyor, an air conveyor, etc. as a conveying element. In addition, the conveying element is not limited to the structure of a driving vibration generating device ′, and a slope structure may be used instead. In other words, a workpiece supply unit can be provided with a slope with upper and lower levels; a correction element that is set on the slope and can control a workpiece with a uniform attitude; and a workpiece supplier that can supply workpieces To the upper end of the slope. The inspection unit 30 is formed in such a manner that a main body portion capable of performing inspection operations is placed on a top surface of a lower movable base 31. The movable base 31 is engaged with the track on the base portion Π, and can be fixed at any position on the track of the base portion 丨. The upper end portion of the movable base 31 is bent toward the end portion of the feeder 23 in the workpiece supply unit 20, and a flat base plate 32 is provided at the top thereof, and the top surface of the base plate 32 is fed forward.詻 2 3 inclined, inclined. As shown in FIG. 3 (the enlarged view of the area indicated by the symbol a 83903 -15 in FIG. 1), on the base plate 32. &lt; Ayang 5 has-discharge slip ma ', which can be discharged in the inspection unit 3 The workpiece 50 having completed the image pickup operation has been completed, and the base plate 32 is also provided with a bottom surface film feed opening 32b for picking up the workpiece 50. ~ When the end side of one of the bottom surfaces of the base plate 32 reaches the correct position on the top surface of the movable base 3, the base plate 32 is fixed. Drain chute = mounted on one side of the movable base 31, on the peripheral portion of the opening 321), and the portion forming the surface portion has a semicircular groove-shaped cross section. A portion of the opening facing the groove surface of the discharge chute 3 2 a forms a space. The top surface of the base plate j 2 is provided with a connecting portion μ for picking up an image. The formed channel can connect the groove of the workpiece conveying portion Bb in the feeding portion 23 and the groove of the discharge chute 32 a, and the connection Some parts are provided with corresponding members and the like which can pick up the image of each surface of the workpiece 50 separately. The image pickup connection portion 33 is formed by the following parts: a short but cylindrical space <Hands 33a, a bottom surface portion 33b, which is installed on the bottom surface of the space forming portion 33ai, and a housing Shao 33c, which Located at the outer periphery of the space forming portion and the bottom surface portion 33b; and a top surface portion 33d, which is installed on the top surface of the space forming portion 33a and the housing portion 33 (.) Formed by the space forming portion 33a and the housing portion 33c A total of four transfer openings 33e (only two of which are shown in Fig. 3) arranged at equal intervals along the circumference are provided on one side portion, which pass from the inner peripheral surface of the space forming portion 33a to the outer peripheral surface of the outer shell portion 33c. An opening 33f ′ is provided in the center of the bottom surface portion 33b. Its diameter is smaller than the diameter of the opening in the base plate 32 and smaller than the opening of the space forming portion 33a. The top portion -16 of one of the discharge slides 32a passes through,口 33f, and-extending straight to the vicinity of the center of the space forming portion 33a. In addition, the center of the top surface portion 33d is provided with::, J, the same port jg, which is directly π in the space to form the opening of the Shaofen 33a Diameter, but too, I 7, the diameter of the mouth 33f in the Yuchen plane Shaofen 33b.-The inclined block 34 is installed on the side of the opening ^ and one of the top surfaces of the inclined block J 4 is made by-horizontal, 7, It is formed by 3ZU and a tilting and inclined part 8 3 4 b, and the inclined part is inclined by the horizontal part 8 and knife 4 a and the end is inclined downward. The tilting ghost body 34 is installed on the image pickup company '~ coffee The rear part of the horizontal part version is located at the end of the second delivery part 2 in the feeder 23. A V-shaped groove is provided in the horizontal part w and the inclined part 34b of the inclined block 34. The grooves formed in the workpiece conveying part are exactly the same, and the grooves are knife-shaped ",,,,, w ^» T wi 1¾. The grooves of the section 23b. They are located in the inclined part 34 inclined part 3 Ί \ groove The lower end portion extends approximately to the image. The pickup connection portion 33 is near the center of the internal space and above the discharge chute 32a. The groove and the discharge chute located in the inclined block 34 are inclined to each other. Parallel. The groove and the discharge chute 32a inside the inclined part 3 of the inclined block 34 are perpendicular to the image pickup The top surface of the connecting portion 33 and the base plate 32. Please note that the installation of the inclined block 34 is such that its rear end portion is very close but does not actually touch the end portion of the workpiece conveying portion 2313. 'So-the workpiece conveying portion 23b The vibration will not be transmitted to the inclined block 34. Therefore, the inclined block 34 can stop the array of workpieces 50 from the feeder 23 that are still vibrating upon arrival, and stop the vibration, and send it to the horizontal portion 34a. The end portion. Then, the workpieces will slide along the inclined slope 34b. The workpiece 50 will be discharged from the bottom end of the inclined portion 34b to a space, and dropped to the groove portion of the discharge chute 32a. In addition, cS39 () 3 17-’is also possible-inclined tube instead of inclined block 34. As shown in FIG. 4, the four lighting elements 35 ^ 3 讣, 35 °, and the like (only three lighting elements are shown in FIG. 4) are equally spaced along the circumference of the image pickup connection portion 33.涊 Four lighting elements can illuminate a workpiece 50 and the side that fell from the inclined block $ 4. A transmission sensor which can be used as an image pickup initiator is mounted on the inner peripheral surface of the image pickup connection portion 33 and its space forming portion 33a. The transfer sensor can detect a fall from the inclined block 34 to the workpiece 50. The illuminating element 35a and the like can perform the lighting operation when a workpiece 50 is detected by the transfer sensor 36. In addition, four CCD cameras 37a, 37b, 37c, and 37d are provided around the image pickup connection Shaofen 33. When a workpiece 50 falls from the inclined block M, the four CCD cameras can pick up the side images through the four transfer openings 33e. In addition, the two CCD cameras 37e. And 37f are set on the image pickup connection. The four blades J J are up, η, and square, and they can pick up images of the top and bottom surfaces of the workpiece 50. A reflecting mirror 39a is mounted on a top surface of the image pickup connection portion 33 through a bracket 38a. The CCD camera 37e can use the 3% reflection of this mirror to pick up an image of the top surface of a workpiece 50. In addition, a reflecting mirror 3 is mounted on a bottom surface of the base plate 32 via a bracket 38b. The CCD camera 37f can use the reflection of the reflecting mirror 39b to pick up the image of the bottom surface of a workpiece 50. At this time, the lighting effect of the lighting element 35a and the like can make the image taken by the CCD camera 37a and the like bright and clear. The classification unit 40 is formed by a movable base 41 which forms a lower end portion of the classification unit and a rotating stage 4 2 which forms an upper end portion thereof. The movable base 4 is engaged with the orbit of the base part 1 丨, so that we can adjust the position of the movable base 41 1 -IS- 593973. A driving mechanism is provided in the movable base 41, which has «* an electric motor or the like capable of rotating the rotary table 42. The rotating table 42 is a driving mechanism connected to the movable base 41 through a rotating shaft 43. The top surface of the turntable 42 is formed of a circular plate-shaped rubber plate 42a. A peripheral portion of the rubber plate 422 faces a bottom end portion of the discharge chute 32a, and a turntable 42 is horizontally mounted on the movable base 41. Two air ejection elements (not shown) are installed on the rotary table 42 million d and the surrounding sides at predetermined intervals. — The defect-free object storage box and a defective object storage box (not shown in the figure, both of which contain the workpiece 50) are located below the rotary table 42-the end portions facing the air jet elements. A sensor for detecting the heart corresponding to the workpiece 50 is installed near the air ejection elements. The sorting unit 40 can use the rotation of the rotary table 42 to receive the workpiece s o ^ // 忤 50 that has been inspected and has fallen from the discharge chute 3 2 a. Then the sorting unit 40 will make the workpieces 50 on the outer surface of one of the top surface of the square turntable 4 2 on the eight μ I ferrule f5 knife, line up at a predetermined interval, and then send them to the two objects for milking. Each box. When a flawless workpiece) passes by the flawless object accommodating box. The sensor will detect the workpiece when it's at the center of work:) 0, and the air jet element will be daggered, and the operation will start as a result. . The state of this work piece will be blown into the content of the defect-free object. When the —defective workpiece 50 passes by the 涊 defective object storage box, the + ^ tolerance test state will detect the workpiece 50, and the empty and convection element will therefore detect the result Α opening operation. This workpiece 50 will be blown into the defective article holding box.丁丁 m… T With this program, we can use 5 S as a typical defective object and defective object. In addition to the above-mentioned devices, and the like, the external inspection device 10 also has an image processing element, which includes a cC /, a core unit j7a and the like, and an 8390. ^; -19-(CPU) , Read-only memory (rom), and random access machine 3; radio and television control unit. The image processing element can perform image processing on the images picked up by the CCD camera ^ and the like, and judge whether -50 is a defect-free object or a defect object. The image processing element also has a screen, which can provide enlarged views of six surfaces of each workpiece 50. The operator can view this screen and judge visually. The following will describe how to perform an external inspection using the external inspection device 10 having the above structure, wherein a capacitor chip is used as the workpiece 50 to be inspected as shown in FIG. 5. The workpiece 50 formed from the capacitor wafer is made of ceramic material and has electrodes formed on both end portions thereof. The length of the workpiece 50 is! Mm ', and the vertical and horizontal widths are set to 0.5mm. During the inspection, the workpieces 50 to be inspected must first be gathered in the hopper 24 of the workpiece supply unit 20, and then the power switch of the external inspection device 10 is turned on, so that the components in the external inspection device 10 start to operate. In the workpiece supply unit 20, a predetermined number of workpieces 50 are supplied from the discharge opening of the hopper 24 to the feeder 23 via the supply chute 25. In this example, when the sensor 26 detects a decrease in the number of workpieces 50 in the feed 23, the hopper 24 will be vibrated, and a workpiece 50 will be supplied from the discharge opening to the feeder 23. In this way, a predetermined number of workpieces 50 can be maintained within the feeder. The workpiece 50 supplied to the feeder 23 will leave the workpiece receiving portion 23a under the driving of the vibration generating element 22, and will be collected at the rear end portion of the workpiece conveying portion 23b. The longitudinal corner portion of the workpiece 50 gathered at the rear end portion of the workpiece conveying portion 23b can match the groove portion 23 of the groove of the workpiece conveying portion 2. If the workpieces 50 are adjacent to each other and the head and tail are connected, the The workpieces can be arranged in a single row in the groove of the workpiece 83903 -20- conveying part, 23b. After that, the workpiece 50 will be 'advancing along the groove 2 3 c to the end of the workpiece conveying portion 23 b' driven by the vibration generating element 2 _ while maintaining its alignment relationship in a single row: the money is sent to the tilt The groove of the horizontal portion 343 of the block 34. The workpiece 50 which has been delivered to the horizontal portion 34a of the inclined block 34 is no longer affected by the vibration. H1, in the case where each of the workpieces 30 "end surfaces contact the leading surface of the preceding workpiece, 'each workpiece will be It is pushed by 50 and thus moved to the end of the horizontal portion 34a. When the workpiece 5Q reaches the end of the horizontal portion ^, its front end portion will tilt downward, and then the workpiece enters the groove of the tilting portion 34b. The workpiece will descend along the groove of the inclined portion. Two sides of the four sides of the workpiece 50 slide along the two sides forming the inclined portion 3. The grooves can be used to make the workpiece 50 have before the workpiece 50 reaches the bottom end of the inclined portion. The right direction. Then, as shown in Fig. 5: When the directions of all the workpieces 50 are the same (where the two end surfaces of the workpieces are facing τ, above and below a slightly inclined surface, the temple workpieces 50 will be tilted, The bottom end of the portion 34b is discharged downward into a space. The inclined block 34 passes through the foot with respect to the image pickup connecting portion ^ to pass the falling workpiece 50 through the image pickup connecting portion 3] inside the central portion. When the workpiece 50 passes through the central portion of the image pickup connection 连接, the conveyance sensor 36 can detect the workpiece 50. The illumination element ^ and the like will be activated accordingly and illuminate the workpiece 50. In addition, the coffee cameras 37a to 37 "will pick up the images of the relevant workpieces 50 corresponding to the surfaces a, b, and D. 'In other words, how does the CCD capture a to 37 face to face ... 593973 Pick up the workpiece 50 and its surface A, B, C, image. The CCD camera 37e can pick up the image of the workpiece 50 top surface E from a slightly oblique direction through the reflecting mirror 39a, and the CCD knows that: The camera 3 7 f can see through the reflecting mirror 3 9 b. Pick up the image of the bottom surface F of the workpiece 50 in a slightly oblique direction. The processing element judges the image quality of the six surfaces picked up in the above manner. The judgment method is to compare the external dimensions, pollution, defects, adhesion of pollutants, the existence of pre-made marks, and the like with predetermined standards. The magnified image of the X surfaces picked up in this example can be displayed on the screen of the image processing element, so the operator can also detect from the screen which part of the workpiece 50 has any disadvantages. ^ A quality-qualified workpiece 50 will fall into the groove of the discharge chute 32a 'and descend along the groove of the discharge chute 32a. Then the workpiece will fall to the top surface of the rotary table 42 of the classification unit 40, and the rotary table 42 will carry the workpiece 5〇. If the workpiece :) 0 no defect 'The workpiece will be blown into the non-defective object container by the corresponding air jet element. If the workpiece 50 has a defect, the workpiece will be blown into the defective object accommodating box by the corresponding air jet element. In this way, the workpiece 50 is divided into non-defective objects and defective objects, and then gathered in the corresponding receiving box. Therefore, according to the inspection device 10, a groove is provided in the inclined portion 34b of the inclined block 34, the angle of which is the same as the angular portion of the workpiece 50, and the workpiece :) along the inclined portion when 0F is lowered The groove of 34b moves. Therefore, all the workpieces 50 that are discharged from the inclined block 34 will be corrected to make their posture-attack, and all the workpieces 50 will fall along a downward curve and follow a tilting direction and pass through a Shiba . Furthermore, since the CCD cameras 37a to 37f are provided, when a workpiece 50 falls and passes through the space, it can pick up six of its surfaces. Table w 'Therefore, we will be able to inspect all the surfaces of the workpiece 50 at the same time. Since the workpiece 50 is used to transport the workpiece 50 to the inclined block 34, the servo element is formed by the feeder 23. The groove of the feeder is exactly the same as the groove in the inclined portion 34b and the horizontal portion of the inclined block 34, and we only need to make the feeder 23 vibrate to move the workpiece 50 toward the horizontal portion 34a. Therefore, the conveying element can adopt an extremely simple structure. For this, we can control the number of vibrations, thereby controlling the workpiece 5_〇 &lt; supply speed through the feeder 23, and then control the distance between the workpieces 50 falling. In addition, the workpiece j will be no longer vibrated after being horizontally divided 34a, and will fall to the inclined portion 34b one by one with a fixed interval ^, so even if the inclined portion (the length is shorter, the bottom of the inclined portion 34b The workpieces discharged at the end will still have a regular and regular attitude. In this way, accurate inspection can be performed. "As shown in Fig. 6, when the workpiece 50 is just discharged from the bottom of the inclined portion 34b, The angle of the road k is the same as the inclination of the inclined portion 34b, but the falling road trick gradually intersects a vertical direction. Therefore, as in the case of this specific example, if the image pickup position is set at the bottom of the inclined portion state Nearby, even if the position where the reflection of the brothers Ja and j) b is far from the falling path of the workpiece 50, we can still pick up the image of the top surface and the film of the workpiece 50 from the special position. These specific bits jl are not near Positions directly opposite the top and bottom surfaces of the workpiece 50. This improves the accuracy of the inspection. In the structure used in the above example, the CCD cameras 37e and 37f are transmitted through the mirror 39 &amp; and 39b Pick up a workpiece 50 And the bottom of the bismuth, however, we can also pick up the image directly with a CCD camera without the mirrors 39a and 39b. In this case, the position of the discharge chute 3 2 a is the best Lower, that is, farther from the bottom end of the inclined block 34, increase the distance that the workpiece passes through the space when the 50 falls. Because this method can shorten the distance that the workpiece shoots forward through the air, the installation The sufficient space of the CCD camera can be ensured as desired. In addition, we can also reduce the inclination angle of the inclined portion 34b in the inclined block 34 (even if it is closer to horizontal), so that we can see a falling workpiece from the rear. , 面 'and see the bottom surface from both sides. I can also use this method to simplify the setting of the camera that takes the image of the top and bottom surfaces. 可可 k is directly opposite the top and bottom of the child. Picking up the image at this position. Because the falling speed is slowed down, the setting of the image pickup position will be more accurate and the inspection will be more accurate. Moreover, according to the present invention, when the workpiece 50 °: Tilt status fades to. It can also achieve the same excellent effect in the vertical direction and when the sloped state is maintained in the original state when falling down. [Simplified illustration of the drawing] Shown ~ According to a specific example of the present invention, FIG. 1 is a front elevation view Inspection device. &Amp; Plan view of a suitable chute in Laiyang. Figure ^ shows the part VIII, m, and knife shown in area a of Figure 1 (Enlarged view W4 series-plan view of the inspection unit. Slant path Figure 5 series A three-dimensional diagram, state. ~ 717 —The workpiece from Figure 6 is an explanatory diagram showing the fall path of one of the workpieces and the position of the mirror -24-593973. [Schematic symbol k says 10 11 20 2 1 22 23 23 a 23b 23c 24 25 26 3 0 3 1 32 32a 32b, 33e 3 3 33a 33b 33c 3 3d Description] External inspection device base part workpiece supply unit movable base vibration generating element feeder workpiece receiving part workpiece receiving part groove Part of the hopper supply chute sensor inspection unit under the movable base base plate discharge chute transfer opening image pickup connection part space formation part bottom part part housing part top part

593973 33f、33g 開口 34 * 傾斜塊體 34a 水平部分 34b 傾斜部分 3 5 a-3 5 c 照明元件 3 6 傳送感測器 37a-37f 電荷耦合裝置(CCD)攝影機 38a 、 38b 托架 39a 、 39b 反射鏡 40 分類單元 41 活動基座 42 旋轉台 42a -橡膠板 43 轉軸 50 工件 A-D 表面 E 頂面 F 底面 -26 -593973 33f, 33g Opening 34 * Inclined block 34a Horizontal portion 34b Inclined portion 3 5 a-3 5 c Illumination element 3 6 Transmission sensor 37a-37f Charge-coupled device (CCD) camera 38a, 38b Bracket 39a, 39b Reflection Mirror 40 Sorting unit 41 Mobile base 42 Rotary table 42a-Rubber plate 43 Rotary shaft 50 Workpiece AD Surface E Top surface F Bottom surface -26-

Claims (1)

拾、申請專利範圍: 1 · 一種主件外部檢查裝置,包括: - 一用以輸送工件之輸送元件; 一修正暨排放元件,其可令來自該輸送元件之工件通 過一向下傾斜之傾斜路徑,並修正各工件之方向,使各 工件足妥恶一致,然後將各工件排放至一空間;及 一影像拾取元件,其係由複數個影像拾取單元所形成 ,各影像拾取單元均可拾取一排放自該修正暨排放元件 然k沿一向下曲線墜落並通過一空間之工件其一表面 之影像。 2·—種工件外部檢查裝置,包括: —用以輸送工件之輸送元件; 、I正暨排放兀件,其可修正來自該輸送元件之工件 万向,使各工件〈方向—致,然後將各工件排放至一 空間;及 1小/今re、乂早兀π町风,说亍 :::拾取單元之位置不致阻礙該修正暨排放元件所排 今,..件〜墜洛路偟,且該等影像拾取單元可拾取沿 疼豐落路徑墜落並通過一命 心 〜 二間 &lt; 工件其頂面與底面至 y其中一面之影像。 申Μ專利範圍第1項之工体、 工件外邵檢查裝置,包括: —側面影像拾取元件,Jt佴 /、加由四個影像拾取單元所形 件之工件沿一向下曲線墜落並i 体’、巧影像拾取單元可在各個排放自該修正暨排放元 吨過一空間時,分別拾取 該工件四個平行於該向下曲線之表面之影像;及 -谓、底面影像拾取元件’其係由—或兩個影像拾取 單元所形成’該等影像拾取單元之位置不致阻礙該修正 暨排放元件所排放之工件沿該向下曲線墜落並通過一 空間時所行經之向下曲線’且該等影像拾取單元可在工 件沿該向下曲線墜落並通過一空間時,拾取工件頂面與 底面至少其中一面之影像。 一種工件外部檢查裝置,包括: 一斜坡,其具有一上端及一下端; 一修正元件,其料該斜坡,且可控制工件之方向, 使其方向一致; 一工件供應器,其可將工件供鹿 丫 才忏仏應芏琢斜坡之上端;及 土少一個私像拾取單元,其 、 」b取处琢斜坡下端排出 '^工件其一表面之影像。 —種工件外部檢查方法,包括·· 一輸送步驟,其中將進行工件之輸送; —修正暨排放步驟,並中悴 ,# 、 、 /、中和k正已到達之工件之方向 W使各工件 &lt; 方向—致,玉苴 下-、广、 /、中工件將以傾斜方式向 〜放ϋ間’並沿一向下曲線墜落;及 —影像拾取步驟,其中將拾 二二 a , 谈排攻至一空間、並 —向下曲線墜落之工件其各表面之影像。 如申請專利範圍第5項之工件外部檢杳 I拾取步驟,其中將針對各 # &lt; 不致阻礙該工件墜落路 tΚ兔拾取钱 ,從―卞从丨泡此〜—,.一 h之土琢芝間之墜落 :¾工件 593973 與底面至少其中一面之影像。 7 . 一種工件外部檢查方法’包括· 一輸送步騾,其中將輸送被製成矩形平行六面體之工 件; 一修正暨排放步,驟,其中將修正已到達之工件之方向 ,俾使各工件之方向一致,且其中工件將以傾斜方式向 下排放至一空間,並沿一向下曲線墜落; 一側面影像拾取步驟,其中將針對各個排放至該空間 之墜落工件,拾取其四個平行於該向下曲線之表面中各 表面之影像;及 一影像拾取步驟,其中將針對各個排放至該空間之墜 落工件,從一不致阻礙該工件墜落路徑之位置拾取該工 件頂面與底面至少其中一面之影像。 X.V)() ΛScope of patent application: 1 · An external inspection device for a main part, comprising:-a conveying element for conveying a workpiece; a correction and discharge element that allows the workpiece from the conveying element to pass through an inclined path inclined downward, And correct the orientation of each workpiece so that the workpieces are consistent with each other, and then discharge each workpiece to a space; and an image pickup element formed by a plurality of image pickup units, each of which can pick up a discharge An image of the surface of the workpiece falling from the correction and discharge element R along a downward curve and passing through a space. 2 · —A workpiece external inspection device, including: — a conveying element for conveying the work piece; and a discharge element, which can correct the workpiece universality from the conveying element, so that each work piece is in the same direction, and then Each piece of work is discharged to a space; and 1 small / now re, 乂 早 木 π 町 风, said 亍 ::: The location of the pick-up unit will not hinder the correction and the discharge of components.... ~~ And these image pickup units can pick up images that fall along the path of painful abundance and pass through Yimingxin ~ Erjian <the top and bottom surfaces of the workpiece to one of y. Apparatus for inspection of workpieces and workpieces in the scope of application of patent No. 1 includes: —Side image pickup elements, Jt 佴 /, and workpieces formed by four image pickup units fall along a downward curve and i-body ' The Qiao image pickup unit can pick up the images of the surface of the workpiece parallel to the downward curve when each discharge passes through a space from the correction and emission yuan; and-the bottom image pickup element -Or formed by two image pickup units 'the positions of the image pickup units do not prevent the workpiece discharged by the correction and discharge element from falling down the downward curve and passing through a space' and the images The picking unit can pick up images of at least one of the top surface and the bottom surface of the workpiece when the workpiece falls along the downward curve and passes through a space. An external inspection device for a workpiece includes: a slope having an upper end and a lower end; a correction element that anticipates the slope and can control the direction of the workpiece so that the directions are consistent; a workpiece supplier that can supply the workpiece Luyacai should sculpt the upper end of the slope; and one private image pick-up unit in the soil, which is taken from the bottom of the sloping slope and ejected from the image of one surface of the workpiece. -A method for external inspection of workpieces, including a conveying step, in which workpieces will be conveyed;-a correction and discharge step, and the middle, #,, /, and the direction of the workpiece that k has reached to make each workpiece &lt; Orientation, to the bottom, the jade-down, wide, /, and middle workpieces will be tilted to ~ put down between the 'and fall along a downward curve; and-image picking step, which will pick up two two a, talk about attack To a space, and-the image of each surface of the workpiece falling down curve. For example, the external inspection of the workpiece in the patent application No. 5 picking step, which will pick up money for each &lt; not hinder the workpiece falling road tK rabbit, from 卞 卞 bubble this ~ ~, ... The fall of Shiba: ¾ image of at least one of the workpiece 5937973 and the bottom surface. 7. A method for external inspection of workpieces includes: a conveying step in which a workpiece made into a rectangular parallelepiped is conveyed; a correction and discharge step, in which the direction of the workpiece that has been reached is corrected, so that each The directions of the workpieces are the same, and the workpieces will be discharged downward to a space in an inclined manner and fall along a downward curve; a side image picking step, in which four falling workpieces will be picked up parallel to each of the falling workpieces discharged to the space. An image of each surface of the downwardly curved surface; and an image picking step in which at least one of the top surface and the bottom surface of the workpiece is picked up from a position that does not obstruct the falling path of the workpiece for each falling workpiece discharged into the space Image. X.V) () Λ
TW092115090A 2002-06-06 2003-06-03 Exterior inspection apparatus for workpieces and exterior inspection method TW593973B (en)

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Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4446089B2 (en) * 2004-07-01 2010-04-07 株式会社 東京ウエルズ Work transfer system
CN100403014C (en) * 2005-05-10 2008-07-16 浙江工业大学 On-line automatic device for monitoring press quality of outer casing of crystal oscillator
JP2007007608A (en) * 2005-07-01 2007-01-18 Hyuu Brain:Kk Minute object inspection device
WO2007014782A1 (en) * 2005-08-04 2007-02-08 Helms Technologie Gmbh Apparatus for visually checking the surface of bulk material particles
WO2010059130A1 (en) * 2008-11-19 2010-05-27 Ust Technology Pte. Ltd. An apparatus and method for inspecting an object
CN101858738B (en) * 2010-05-20 2012-03-28 曹旭阳 Equipment for testing pins of electronic element products automatically
CN102288131A (en) * 2011-05-12 2011-12-21 上海大学 Adaptive stripe measurement device of 360-degree contour error of object and method thereof
CN103364406B (en) * 2012-09-28 2014-12-17 洛阳久德轴承模具技术有限公司 Bearing rolling element detector based on high-resolution CCD (Charge Coupled Device) technology
KR101693684B1 (en) * 2015-04-06 2017-01-06 나승옥 Work appearance inspection apparatus and method by the same
KR102419427B1 (en) 2016-05-12 2022-07-12 코그넥스코오포레이션 Calibration for vision systems
CN107219230A (en) * 2017-05-31 2017-09-29 惠州市纬讯科技有限公司 A kind of inductance appearance images acquisition method
US11196967B1 (en) * 2020-06-03 2021-12-07 He Tong Technology Co., Ltd. Image inspection device

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4350442A (en) * 1976-05-19 1982-09-21 Accusort Corporation Light and color detecting scanner for a sorting apparatus
JPS595030B2 (en) * 1976-05-27 1984-02-02 宗嗣 田浦 Automatic fruit processing method for fruits, etc.
US4330062A (en) * 1978-06-21 1982-05-18 Sunkist Growers, Inc. Method and apparatus for measuring the surface color of an article
GB2142426B (en) * 1983-06-30 1986-09-17 Gunsons Sortex Ltd Sorting machine and method
JP2812466B2 (en) * 1988-09-29 1998-10-22 株式会社 マキ製作所 Bottom imaging device for articles
JPH0788442A (en) * 1993-07-30 1995-04-04 Taiyo Yuden Co Ltd Visual inspection device for work
JPH09196856A (en) * 1996-01-23 1997-07-31 Tsubakimoto Chain Co Surface inspecting method, and device and prism therefor
DE19627225A1 (en) * 1996-07-05 1998-01-08 Focke & Co Method and device for opto-electrical scanning of packaging, in particular cigarette packs
US6064759A (en) * 1996-11-08 2000-05-16 Buckley; B. Shawn Computer aided inspection machine
JPH1191924A (en) * 1997-09-25 1999-04-06 Kubota Corp Conveying device for agricultural product and measuring device using it
US6384421B1 (en) * 1999-10-07 2002-05-07 Logical Systems Incorporated Vision system for industrial parts

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