TWI347447B - Array tester - Google Patents
Array testerInfo
- Publication number
- TWI347447B TWI347447B TW096140411A TW96140411A TWI347447B TW I347447 B TWI347447 B TW I347447B TW 096140411 A TW096140411 A TW 096140411A TW 96140411 A TW96140411 A TW 96140411A TW I347447 B TWI347447 B TW I347447B
- Authority
- TW
- Taiwan
- Prior art keywords
- array tester
- tester
- array
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G51/00—Conveying articles through pipes or tubes by fluid flow or pressure; Conveying articles over a flat surface, e.g. the base of a trough, by jets located in the surface
- B65G51/02—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases
- B65G51/03—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases over a flat surface or in troughs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2812/00—Indexing codes relating to the kind or type of conveyors
- B65G2812/16—Pneumatic conveyors
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- General Health & Medical Sciences (AREA)
- Fluid Mechanics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060104640A KR100756229B1 (en) | 2006-10-26 | 2006-10-26 | Array tester |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200827750A TW200827750A (en) | 2008-07-01 |
TWI347447B true TWI347447B (en) | 2011-08-21 |
Family
ID=38736756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096140411A TWI347447B (en) | 2006-10-26 | 2007-10-26 | Array tester |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2008134238A (en) |
KR (1) | KR100756229B1 (en) |
CN (1) | CN101136156B (en) |
TW (1) | TWI347447B (en) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101604075B (en) * | 2008-06-13 | 2013-04-10 | 统宝光电股份有限公司 | Lighting test electrostatic defending device of liquid crystal display panel and method |
KR101470591B1 (en) * | 2008-08-04 | 2014-12-11 | 주식회사 탑 엔지니어링 | An array tester |
KR101519618B1 (en) * | 2008-08-06 | 2015-05-13 | 주식회사 탑 엔지니어링 | Optic chuck for array tester and array tester having the same |
KR101002429B1 (en) * | 2008-10-06 | 2010-12-21 | 주식회사 탑 엔지니어링 | Array tester |
KR100911330B1 (en) * | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | Array tester, method for measuring a point of substrate of the same and method for measuring a position cordinate |
KR100911331B1 (en) * | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | Array tester and method for measuring a point of substrate of the same |
CN101833179B (en) * | 2009-03-13 | 2012-02-15 | 华映视讯(吴江)有限公司 | Detection gauge and method |
KR101089059B1 (en) * | 2009-08-03 | 2011-12-05 | 주식회사 탑 엔지니어링 | Apparatus for array test with cleaner of optic chuck |
KR101115879B1 (en) * | 2009-12-11 | 2012-02-22 | 주식회사 탑 엔지니어링 | Apparatus for testing array |
KR101052490B1 (en) * | 2009-12-31 | 2011-07-29 | 주식회사 탑 엔지니어링 | Array test device |
TWI467162B (en) * | 2011-04-18 | 2015-01-01 | Ind Tech Res Inst | Electro optical modulator electro optical sensor and detecting method thereof |
KR20130005128A (en) * | 2011-07-05 | 2013-01-15 | 주식회사 탑 엔지니어링 | Glass panel tranferring apparatus |
KR101316812B1 (en) * | 2012-02-22 | 2013-10-23 | 주식회사 넥스트아이 | A inspecting apparatus of LCD panel |
KR20170055064A (en) | 2015-11-10 | 2017-05-19 | 삼성전자주식회사 | Fabricating method of substrate |
CN107741658A (en) * | 2017-10-25 | 2018-02-27 | 武汉华星光电技术有限公司 | A kind of panel apparatus for baking |
CN108563047B (en) * | 2018-03-15 | 2021-10-01 | 京东方科技集团股份有限公司 | Line detection device and line detection method |
CN108572470B (en) * | 2018-04-24 | 2021-03-26 | 京东方科技集团股份有限公司 | Electrical measurement jig and control method thereof |
CN110715942A (en) * | 2018-07-11 | 2020-01-21 | 皓琪科技股份有限公司 | Automatic detection method and system for circuit board |
JP7143134B2 (en) * | 2018-07-26 | 2022-09-28 | 株式会社アドバンテスト | Load board and electronic component test equipment |
CN110596147A (en) * | 2019-08-23 | 2019-12-20 | 深圳市华星光电技术有限公司 | Method for reducing static electricity generation of array electrical property testing machine |
CN112201186A (en) * | 2020-10-10 | 2021-01-08 | 深圳市华星光电半导体显示技术有限公司 | Test component group |
CN116386488B (en) * | 2023-03-31 | 2024-05-28 | 惠科股份有限公司 | Detection method and detection equipment for electronic paper array substrate |
CN116609604B (en) * | 2023-05-31 | 2024-05-10 | 武汉云岭光电股份有限公司 | Electrostatic discharge testing system and method |
CN117630020B (en) * | 2024-01-25 | 2024-05-10 | 上海波创电气有限公司 | Detection device for surface defects of materials |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08304852A (en) * | 1995-04-28 | 1996-11-22 | Nec Corp | Method and device for inspecting liquid crystal display substrate |
JPH08316284A (en) * | 1995-05-15 | 1996-11-29 | Sony Corp | Conveyor for photomask |
JPH1152551A (en) * | 1997-07-29 | 1999-02-26 | Toshiba Corp | Exposure mask and method and device for evaluating its pattern |
JP4104728B2 (en) | 1998-03-25 | 2008-06-18 | フォトン・ダイナミクス・インコーポレーテッド | Liquid crystal drive substrate inspection apparatus and inspection method thereof |
JP3378795B2 (en) * | 1998-03-27 | 2003-02-17 | シャープ株式会社 | Display device inspection apparatus and inspection method |
JP3580550B1 (en) * | 2003-08-20 | 2004-10-27 | レーザーテック株式会社 | Pattern substrate defect correcting method, defect correcting apparatus, and pattern substrate manufacturing method |
-
2006
- 2006-10-26 KR KR1020060104640A patent/KR100756229B1/en not_active IP Right Cessation
-
2007
- 2007-10-26 TW TW096140411A patent/TWI347447B/en not_active IP Right Cessation
- 2007-10-26 JP JP2007278828A patent/JP2008134238A/en active Pending
- 2007-10-26 CN CN2007101655250A patent/CN101136156B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TW200827750A (en) | 2008-07-01 |
JP2008134238A (en) | 2008-06-12 |
CN101136156B (en) | 2011-02-02 |
KR100756229B1 (en) | 2007-09-07 |
CN101136156A (en) | 2008-03-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |