TWI340826B - - Google Patents

Info

Publication number
TWI340826B
TWI340826B TW096121698A TW96121698A TWI340826B TW I340826 B TWI340826 B TW I340826B TW 096121698 A TW096121698 A TW 096121698A TW 96121698 A TW96121698 A TW 96121698A TW I340826 B TWI340826 B TW I340826B
Authority
TW
Taiwan
Application number
TW096121698A
Other languages
Chinese (zh)
Other versions
TW200811432A (en
Inventor
Kunihiro Mizuno
Keiichi Kurasho
Takaharu Suzuki
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200811432A publication Critical patent/TW200811432A/en
Application granted granted Critical
Publication of TWI340826B publication Critical patent/TWI340826B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8848—Polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Liquid Crystal (AREA)
TW096121698A 2006-07-12 2007-06-15 Liquid crystal panel inspection method and image processor TW200811432A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006191210A JP4842034B2 (en) 2006-07-12 2006-07-12 Liquid crystal panel inspection method and image processing apparatus

Publications (2)

Publication Number Publication Date
TW200811432A TW200811432A (en) 2008-03-01
TWI340826B true TWI340826B (en) 2011-04-21

Family

ID=39076574

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096121698A TW200811432A (en) 2006-07-12 2007-06-15 Liquid crystal panel inspection method and image processor

Country Status (3)

Country Link
JP (1) JP4842034B2 (en)
KR (1) KR100829891B1 (en)
TW (1) TW200811432A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4960161B2 (en) * 2006-10-11 2012-06-27 日東電工株式会社 Inspection data processing apparatus and inspection data processing method
JP5274622B2 (en) * 2011-06-27 2013-08-28 富士フイルム株式会社 Defect inspection apparatus and method
WO2018146890A1 (en) 2017-02-09 2018-08-16 ソニー株式会社 Information processing device, information processing method, and recording medium
CN109559308B (en) * 2018-11-29 2022-11-04 太原理工大学 Machine vision-based liquid crystal panel polaroid code spraying detection method and device
CN111722422B (en) * 2020-06-10 2023-05-02 深圳市华星光电半导体显示技术有限公司 Liquid crystal panel detection method and liquid crystal panel

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10160628A (en) 1996-11-29 1998-06-19 Advantest Corp Image quality inspection device for lcd panel
JPH1195182A (en) * 1997-09-18 1999-04-09 Advantest Corp Method for inspecting image quality of liquid crystal display panel
JP3533946B2 (en) * 1998-06-25 2004-06-07 セイコーエプソン株式会社 Liquid crystal display panel inspection apparatus and liquid crystal display panel inspection method
JP2004170495A (en) * 2002-11-18 2004-06-17 Micronics Japan Co Ltd Method and device for inspecting substrate for display
JP2004287368A (en) * 2003-01-27 2004-10-14 Tokyo Electron Ltd Inspecting device
JP2004239674A (en) 2003-02-04 2004-08-26 Minato Electronics Inc Apparatus and method for inspecting displaying element in flat liquid crystal display
JP2006023295A (en) 2004-06-10 2006-01-26 Canon Inc Birefringence-measuring method and birefringence measuring apparatus using the same
KR20060044032A (en) * 2004-11-11 2006-05-16 삼성전자주식회사 Test system for display panel and method of testing thereof
KR20060054836A (en) * 2004-11-16 2006-05-23 주식회사 쓰리비 시스템 Method and apparatus for inspecting secondary contamination in a liquid crystal display module
JP4884738B2 (en) * 2005-09-26 2012-02-29 株式会社日本マイクロニクス LCD panel inspection equipment

Also Published As

Publication number Publication date
KR100829891B1 (en) 2008-05-16
KR20080006454A (en) 2008-01-16
TW200811432A (en) 2008-03-01
JP2008020588A (en) 2008-01-31
JP4842034B2 (en) 2011-12-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees