1225233 玖、發明說明： 【發明所屬之技術領域】 本發明係有關一種顯示檢查方法等用於經由排列顯示 晶胞成矩陣形式形成之顯示面板，偵測該顯示面板之一電 極的斷路，以及一種供檢查電極間之短路用之顯示檢查方 法等。 【先前技術】 作為於經由將顯示晶胞排列成矩陣形式形成之電漿顯 示面板，檢查一電極斷路之習知方法，採用一種方法，使 用全表面顯示圖案，將顯示圖案拍攝為影像資料，以及經 由使用影像分析偵測缺陷。若如圖1 A或圖2 A所示，於電 漿顯示面板3 0之一電極發生斷路，則其顯示線出現未發光 部分。因此經由比較斷路顯示線之梯度與該顯示線上下二 鄰近像素之梯度，或經由比較斷路顯示線之梯度與該顯示 線左右二鄰近像素之梯度，容易擷取線缺陷。 一顯示面板包括複數個列電極，行電極排列於垂直列電 極方向，以及R (紅）、G (綠）及B (藍）色顯示晶胞形成於列 電極與行電極之交叉點，此種顯示面板為已知。於此種顯 示面板，當偵測得毗鄰電極間短路時，單色圖案（R、G或B 圖案）顯示於全顯示面板上。此種情況下，若毗鄰電極間發 生短路，則另一色顯示晶胞發光。因此可偵測得電極間的 短路。 若如圖 1B 圖所示，於顯示區上端部或下端部有一斷路 顯示線，或若如圖2B所示，於顯示區左端部或右端部有一 斷路顯示線，則由斷路引起之線缺陷梯度接近等於顯示區 5 312/發明說明書(補件)/92-10/921193 84 1225233 外側梯度，結果變成難以經由使用前述方法偵測斷路。另 一方面，若試圖比較於線缺陷部分梯度與顯示區一鄰近像 素梯度，則須嚴格於顯示區固定為水平不允許顯示區失 真。因此也難以採用此種方法。 【發明内容】 本發明之一目的係提供一種用於一顯示面板之顯示檢 查方法及顯示檢查裝置，該方法或裝置可牢靠地偵測於顯 示區上端部或下端部之線缺陷、或於顯示區左端部或右端 部之線缺陷。 有一型顯示面板，其中行電極係於顯示面板垂直方向分 割。於此型顯示面板，如圖3所示，於行方向分割之行電 極組1 0 1及1 0 2之行電極間短路，造成線缺陷，而妨礙正 常顯示。但當採用前述檢查方法，於全顯示面板上顯示單 色圖案時，上行電極與下行電極間之短路不影響顯示。因 此無法檢測得上行電極與下行電極間之短路。 本發明之另一目的係提供一種用於一顯示面板之顯示 檢查方法及顯示檢查裝置，其可檢查設置為彼此分開之上 行電極與下行電極間之短路。 此外，當電漿顯示面板之毗鄰列電極間發生短路時，有 一問題為暗線不會出現於全表面顯示面板，因而無法偵測 列電極間之短路。 本發明之另一目的係提供一種用於一顯示面板之顯示 檢查方法及顯示檢查裝置，其可牢靠地檢查列電極間之短 路。 前述發明目的可經由一種用於一顯示面板供檢查一顯 6 312/發明說明書(補件)/92-10/921193 84 1225233 示面板之線缺陷之顯示檢查方法，該顯示面板包括複數列 電極，以及複數行電極排列於垂直列電極方向，而形成顯 示晶胞於列電極與行電極之交叉點，該顯示晶胞係經由控 制於顯示區排列成矩陣形式之顯示晶胞的發光，該顯示檢 查方法具有下列各步驟：讓位於顯示區頂端或底端之顯示 晶胞列發光；經由使用一影像感測器偵測發光顯示晶胞、 位置接近發光顯示晶胞且係位於顯示區之顯示晶胞、以及 非發光且位於顯示區外側部分之顯示晶胞，且輸出一視訊 影像；基於該輸出視訊影像，對應位於頂端或底端之發光 晶胞列，而於列方向偵測亮線數目及長度；以及當亮線數 目及長度係小於預定值時，判定於對應顯示晶胞列之列電 極已經發生斷路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板之線 缺陷，該顯示面板包括複數列電極，以及複數行電極排列 於垂直列電極方向，而形成顯示晶胞於列電極與行電極之 交叉點，該顯示晶胞係經由控制於顯示區排列成矩陣形式 之顯示晶胞的發光，該顯示檢查方法具有下列各步驟：讓位 於顯示區左端或右端之顯示晶胞列發光；經由使用一影像 感測器偵測發光顯示晶胞、位置接近發光顯示晶胞且係位 於顯示區之顯示晶胞、以及非發光且位於顯示區外側部分 之顯示晶胞，且輸出一視訊影像；基於該輸出視訊影像， 對應位於左端或右端之發光晶胞行，而於行方向偵測亮線 數目及長度；以及當亮線數目及長度係小於預定值時，判 定於對應顯示晶胞行之行電極已經發生斷路。 7 312/發明說明書(補件)/92-10/921193 84 1225233 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板之線 缺陷，該顯示面板包括複數列電極，以及複數行電極排列 於垂直列電極方向，而形成顯示晶胞於列電極與行電極之 交叉點，該顯示晶胞係排列於列方向，讓其發光色彩為三 色且彼此不同色，以及三色形成一像素，以及發光色彩相 同之顯示晶胞排列於行方向，經由控制於顯示區排列成矩 陣形之顯示晶胞之發光，該顯示面板顯示一影像，該顯示 檢查方法具有下列各步驟：讓位於顯示區左端或右端之顯 示晶胞列發光；經由使用一影像感測器偵測發光顯示晶 胞、位置接近發光顯示晶胞且係位於顯示區之顯示晶胞、 以及非發光且位於顯示區外側部分之顯示晶胞，且輸出一 視訊影像；基於該輸出視訊影像，對應位於左端或右端之 發光晶胞行，而於行方向偵測亮線數目及長度；以及當亮 線數目及長度係小於預定值時，判定於對應顯示晶胞行之 行電極已經發生斷路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板上介 於劃分行電極間之線缺陷，該顯示面板包括複數列電極， 以及複數行電極排列於垂直列電極方向，而形成顯示晶胞 於列電極與行電極之交叉點，行電極係於行方向於顯示區 分割，顯示面板係形成為可以經由分割所得之分割晝面形 成可能之同時選擇顯示晶胞，當取一列作單位時，顯示檢 查方法包含下列步驟：經由讓經由分割所得之上及下分割 晝面其中之一發單色光；經由使用一影像感測器偵測作為 8 312/發明說明書(補件)/92-10/92119384 1225233 非發光分割晝面之上及下分割晝面之另一晝面，以及輸出 一視訊信號；基於該輸出視訊信號，於對應該上及下分割 晝面之另一晝面之顯示晶胞行，於一行方向偵測一亮線； 以及對應已經偵測得亮線之顯示晶胞行，判定介於分割列 電極間發生電極短路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板上介 於劃分行電極間之線缺陷，該顯示面板包括複數列電極， 以及複數行電極排列於垂直列電極方向，而形成顯示晶胞 於列電極與行電極之交叉點，該顯示晶胞係排列於列方 向，讓其發光色彩為三色且彼此相異，且形成一個像素； 以及其發光色彩為相同之顯示晶胞排列於行方向，行電極 係於行方向於顯示區分割，顯示面板係形成為可以經由分 割所得之分割晝面形成可能之同時選擇顯示晶胞，當取一 列作單位時，顯示檢查方法包含下列步驟：經由讓經由分割 所得之上及下分割晝面其中之一發單色光；經由使用一影 像感測器偵測作為非發光分割晝面之上及下分割晝面之另 一晝面，以及輸出一視訊信號；基於該輸出視訊信號，於 對應該上及下分割晝面之另一晝面之顯示晶胞行，於一行 方向偵測一亮線；以及對應已經偵測得亮線之顯示晶胞 行，判定介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查方法，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 9 312/發明說明書(補件)/92-10/921193 84 1225233 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查方法包含下列步驟：讓顯 示區之顯示晶胞以鋸齒格形發光；經由使用一影像感測器 而彳貞測顯示區之顯示晶胞，以及輸出一視訊信號；基於該 輸出之視訊信號，而偵測於列方向之暗線；以及對應已經 偵測得暗線之顯示晶胞列，判定電極短路發生於列電極間。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓位於顯示區頂端或底端之顯示晶胞列發光； 一影像感測器，其係供偵測發光顯示晶胞、位置接近該發 光顯示晶胞且係位於顯示區之顯示晶胞、以及非發光且位 於顯示區外側部分之顯示晶胞，以及輸出一視訊信號；以 及一判定裝置，其係供基於由影像感測器輸出之視訊信 號，而於對應位於頂端或底端之顯示晶胞列之列方向，檢 查亮線數目及亮線長度，以及當該亮線數目及長度係小於 預定值時，判定於對應顯示晶胞列之列電極發生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 10 312/發明說明書(補件)/92-10/92119384 1225233 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓位於顯示區左端或右端之顯示晶胞列發光； 一影像感測器，其係供偵測發光顯示晶胞、位置接近該發 光顯示晶胞且係位於顯示區之顯示晶胞、以及非發光且位 於顯示區外側部分之顯示晶胞，以及輸出一視訊信號；以 及一判定裝置，其係供基於由影像感測器輸出之視訊信 號，而於對應位於左端或右端之顯示晶胞行之行方向，檢 查亮線數目及亮線長度，以及當該亮線數目及長度係小於 預定值時，判定於對應顯示晶胞行之行電極發生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，顯示 晶胞排列於列方向，故其發光色彩為三色且彼此相異，且 形成一個像素，以及其發光色彩相同之該等顯示晶胞係排 列於行方向，該顯示面板係經由控制於一顯示區排列成矩 陣形式之顯示晶胞之發光而顯示一影像，該顯示檢查裝置 設置有：一發光裝置，其係供讓位於顯示區左端或右端之顯 示晶胞列發光；一影像感測器，其係供偵測發光顯示晶胞、 位置接近該發光顯示晶胞且係位於顯示區之顯示晶胞、以 及非發光且位於顯示區外側部分之顯示晶胞，以及輸出一 視訊信號；以及一判定裝置，其係供基於由影像感測器輸 出之視訊信號，而於對應位於左端或右端之顯示晶胞行之 行方向，檢查亮線數目及亮線長度，以及當該亮線數目及 長度係小於預定值時，判定於對應顯示晶胞行之行電極發 11 312/發明說明書(補件)/92-10/921193 84 1225233 生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之分割行電極間之 線缺陷，該顯示面板包括複數列電極，以及複數行電極排 列於垂直列電極方向，而形成顯示晶胞於列電極與行電極 之交叉點，行電極於行方向於一顯示區分割，如此形成之 顯示面板可取一列作為單元，同時選擇經由分割所得之分 割晝面的顯示晶胞，該顯示檢查裝置裝配有：一發光裝置， 其係供經由分割所得之上分割晝面及下分割晝面其中之一 發單色光；一影像感測器，其係供經由使用一影像感測器 偵測上及下分割畫面之另一晝面作為非發光分割晝面，以 及輸出一視訊信號；一判定裝置，其係供基於該輸出視訊 信號，偵測於上及下分割畫面之另一晝面，對應一顯示晶 胞行於行方向之亮線，以及判定對應該偵測得亮線之顯示 晶胞行，介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之分割行電極間之 線缺陷，該顯示面板包括複數列電極，以及複數行電極排 列於垂直列電極方向，而形成顯示晶胞於列電極與行電極 之交叉點，顯示晶胞係排列於列方向，其發光色彩為三色 且彼此各異以及形成一個像素，以及發光色彩相同之顯示 晶胞係排列於行方向，行電極於行方向於一顯示區分割， 如此形成之顯示面板可取一列作為單元，同時選擇經由分 割所得之分割晝面的顯示晶胞，該顯示檢查裝置裝配有： 一發光裝置，其係供經由分割所得之上分割晝面及下分割 12 312/發明說明書(補件)/92-10/92119384 1225233 晝面其中之一發單色光；一影像感測器，其係供經由使用 一影像感測器偵測上及下分割畫面之另一晝面作為非發光 分割晝面，以及輸出一視訊信號；一判定裝置，其係供基 於該輸出視訊信號，偵測於上及下分割晝面之另一晝面， 對應一顯示晶胞行於行方向.之亮線，以及判定對應該偵測 得亮線之顯示晶胞行，介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓顯示區之顯示晶胞以鋸齒格形發光；一影像 感測器，其係供經由使用一影像感測器偵測於顯示區之顯 示晶胞，以及輸出一視訊信號；一判定裝置，其係供基於 該輸出視訊信號而偵測於列方向之一暗線，以及判定對應 出現暗線之顯示晶胞列之列電極間發生電極短路。 【實施方式】 (第一具體實施例） 後文將參照圖4至1 0說明根據本發明之供顯示面板用 之顯示檢查方法之具體實施例。 圖4為方塊圖顯示用於電漿顯示面板之顯示檢查方法之 檢查裝置組態。圖5為略圖顯示欲檢查之電漿顯示面板3 0 之電極配置。 如圖4所示，檢查裝置1 0 0包括一檢查器主體1，其係 13 312/發明說明書(補件)/92-10/921193 84 1225233 供於檢查時照明電漿顯示面板3 Ο，一 CCD攝影機2，供攝 取電漿顯示面板3 0之顯示面影像，一影像處理裝置3，供 接收來自CCD攝影機2之視訊影像以及一控制裝置4，供 控制檢查器主體1、CCD攝影機2及影像處理裝置3。影像 處理裝置3包括一影像處理區段3 a，供執行影像處理俾分 析發光圖案（容後詳述），一影像處理記憶體3 b，供儲存R、 G及B個別之由CCD攝影機2供給的影像資料，以及一影 像處理主題記憶體3 c，供暫時儲存影像處理主題資料。 如圖5所示，一定址驅動器1 1、一 X維持驅動器1 2以 及一 Y維持驅動器1 3皆連結至電漿顯示面板3 0之電極， 係設置於檢查器主體1。 如圖5所示，電衆顯示面板30包括行電極Dir、Dig、 Dlb、D2r、D2g、D2b、…Dmr、Dmg 及 Dmb 以及列電極 XI 至Xn及列電極Y1至 Yn設置於垂直行電極方向。如圖5 所示，行電極被指定而以所述順序重複關聯R晶胞、G晶 胞及Β晶胞。於顯示區3 0 a，R晶胞、G晶胞及Β晶胞係重 複形成於行電極與列電極X1至X η以及列電極Y1至Υ η之 交叉點。如圖5所示，R晶胞、G晶胞及Β晶胞係循序設置 成呈一集合處理，一像素係由該集合所形成。一額外顯示 區3 0 b係設置於該顯示區3 0 a外側。 如圖5所示，列電極X1至X η以及列電極Y1至Υ η係交 錯以梳狀形式設置，故由交互相對之兩邊伸出。列電極X1 至X η其中之一以及列電極Υ 1至Υ η其中之一被指定給一顯 示晶胞列。於一晶胞内部，列電極X1至X η以及列電極Υ1 至Υ η係並聯設置而彼此相對。 14 312/發明說明書(補件)/92-10/921193 84 1225233 如圖5所示，行電極Dir、Dig、Dlb、D2r...Dmb係連 至定址驅動器1 1，列電極X 1至X n係連結至X維持驅動 1 2，以及列電極Υ1至Υη係連結至Υ維持驅動器1 3。 現在說明電漿顯示面板3 0之驅動方法。 一作為驅動電漿顯示面板 3 0之時間間隔之欄位係由 數個子攔位S F1至S F Ν組成。如圖6所示，於各子攔位 供選擇欲點亮晶胞之定址間隔時間，以及一讓該定址間 時間被選定之晶胞持續點亮經歷一段預定時間之維持間 時間。供於前一欄位復置點亮狀態之復置間隔時間額外 供於第一子欄位SF 1之標頭部分。於此復置間隔時間， 部晶胞皆被復置為點亮晶胞（其中形成有壁電荷之晶胞） 或被復置為熄滅晶胞（其中未形成有壁電荷之晶胞）。前 情況下，預定晶胞被切換成熄滅晶胞。後述情況下，於 後之定址間隔時間，預定晶胞被切換成點亮晶胞。維持 隔時間以子欄位SF1、SF2、...SFN之順序逐步延長。經 改變連續被點亮之子欄位數目，可獲得預定之梯度顯示 於圖7所示各子欄位之定址間隔時間，逐線進行定址 描。換言之，於掃描脈波施加至形成第一線之列電極 之同時，依據對應第一線之一晶胞的定址資料之資料脈 DPI施加至行電極Dir、Dig、Dlb、D2r...Dmb。隨後於一 描脈波施加至形成第二線之列電極Υ 2之同時，依據對應 第二線之一晶胞之定址資料的定址脈波DP2施加至行電 D 1 r、D 1 g、D 1 b、D 2 r…D in b。掃描脈波及資料脈波同時施 至第三線之一晶胞以及以相同方式施加至隨後各線之 胞。最後，一掃描脈波施加至形成第η線之列電極Υ η之 312/發明說明書(補件)/92-10/921193 84 結 器 複 提 隔 隔 提 全 j 述 隨 間 由 〇 掃 Υ1 波 掃 於 極 加 晶 同 15 1225233 時，依據對應第η線上一晶胞之定址資料的一資料朋 係施加至行電極 Dir、Dig、Dlb、D2r...Dmb。於定 時間，預定晶胞由點亮晶胞切換成熄滅晶胞，或由 胞切換成點亮。 若如此完成定址掃描，則於子攔位的每個晶胞被 點亮晶胞或熄滅晶胞。於隨後之維持間隔時間，每 維持脈波，則只有點亮晶胞重複發光。於維持間隔1 維持脈波及Y維持脈波以圖7所示之預定時序而重 至列電極X 1至X η以及列電極Y 1至Υ η。於最終子欄 設置一抹消間隔時間，供將全部晶胞皆設定為熄滅 經由重複前述攔位，使用動態圖像於電漿顯示3 之梯度呈現變成可能。 圖8顯示一範例，其中電漿顯示面板被分割成上 區，於各區之電極彼此分開。此種情況下，連結至 示面板3 1之定址驅動器1 1 a及1 1 b、X維持驅動器 1 2 b以及Y維持驅動器1 3 a及1 3 b係設置於檢查器 如圖8所示。 如圖8所示，電漿顯示面板31包括行電極D1 r ’ Dlb、D2r、D2g、D2b、…Dmr、Dmg 及 Dmb，列電極 X i 及列電極 Y1 至 Y i 設置於垂直行電極方向， DAlr、DAlg、DAlb、DA2r、DA2g、DA2b、".DAmr、 D A m b及列電極X i + 1至X n以及列電極Y i + 1至Y n設 直行電極方向。各行電極被指定為以引述的順序而 聯R晶胞、G晶胞及B晶胞。R晶胞、G晶胞及B晶 形成於行電極與列電極X1至X η及列電極Y1至Υ η 312/發明說明書(補件)/92-10/92119384 ί 波 DPn 址間隔 媳滅晶 設定為 次施加 時間，X 複施加 位 S F N， 晶胞。 &板 3 0 區及下 電漿顯 1 2a及 主體， ' Dig' XI至 行電極 DAmg、 置於垂 重複關 胞重複 之交叉 16 1225233 點。以圖5所示情況之相同方式，接續設置之一 R晶胞、 一 G晶胞以及一 B晶胞係以一組處理，一個像素係由該組 組成。 行電極 Dir、Dig、Dlb、D2r、D2g、D2b、... D m r ^ Dmg、 Dmb連結至定址驅動器11a。行電極DAlr、DAlg、DAlb、 DA2r、DA2g、DA2b、".DAmr、DAmg、DAmb 連結至定址驅動 器1 1 b。列電極X1至X i連結至X維持驅動器1 2 a。列電極 Y 1至Y i連結至Y維持驅動器1 3 a。列電極X i + 1至Xn連結 至X維持驅動器1 2 b。列電極Y i +1至Υ η連結至Y維持驅 動器1 3b。 電漿顯示面板 3 1之驅動方法係類似前述電漿顯示面板 3 0之驅動方法。 現在說明經由使用檢查裝置 1 0 0執行電漿顯示面板 3 0 上端部及下端部之檢查程序。被分割為上區及下區之電漿 顯示面板3 1之檢查也係以相同方式執行。 如圖4所示，電漿顯示面板30設定於檢查器主體1。讓 頂端之一顯示晶胞列以及底端之一顯示晶胞列，亦即該電 漿顯示面板3 0之顯示區共二排顯示晶胞列發光。讓設置於 顯示晶胞列間之中間區顯示黑色（亦即讓其不發光）。進行 此種圖案之顯示。圖9A、9B、9C及9D依據是否有斷路而 顯示各種發光圖案。圖9 A顯示無斷路，對應頂端及底端之 二排顯示晶胞列有二橫條亮線之發光圖案。圖9 A所示圖案 為偵測斷路之該偵測圖案。圖9B顯示於底端之顯示晶胞列 有斷路，以及底端之亮線於中央被岔斷之發光圖案。圖9C 顯示於頂端及底端個別顯示晶胞列有斷路，以及於頂端及 17 312/發明說明書(補件)/92-10/921193 84 1225233 底端之各亮線於中央被岔斷之發光圖案。圖9D顯示於頂端 及底端之各顯示晶胞列有斷路，於頂端無亮線，而於底端 之亮線於中央岔斷之發光圖案。 以C C D攝影機2拍攝電漿顯示面板3 0之此種發光圖案。 顯示處理裝置3基於C C D攝影機2供給的影像資料而分析 發光圖案。 圖1 0為流程圖顯示檢查時進行之處理。圖1 0所示處理 係基於控制裝置4進行之控制執行。 於圖1 0之步驟S1，驅動脈波供給電漿顯示面板3 0，因 而藉檢查器主體1顯示前述偵測圖案。結果電漿顯示面板 3 0係以圖9 A至圖9 D所示之發光圖案而被點亮。此外，斷 路數目數值被初始化為0。隨後藉C C D攝影機2拍攝發光 圖案影像（步驟S2 )。拍照所得影像之影像資料由CCD攝影 機 2傳輸至影像處理裝置 3之影像處理記憶體 3 b (步驟 S 3 )。此處三色R、G及B之資料係分開傳輸。 隨後由儲存於影像處理記憶體 3 b之影像資料，將位於 電漿顯示面板 3 0頂端之顯示晶胞列含括區設定作為影像 處理區（步驟S 4 )。本區係設定為包括位置接近前述顯示晶 胞列且位在顯示區的顯示晶胞，以及不發光（亦即於黑顯示 區的顯示晶胞）以及位在顯示區外側部分（亦即位在顯示晶 胞列上方部分）之顯示晶胞。隨後，於預設區之影像資料被 儲存於影像處理主題記憶體3 c (步驟S 5 )。 隨後基於儲存於影像處理主題記憶體 3 c之影像資料， 而執行由位於頂端之顯示晶胞列擷取發光晶胞列之處理 (步驟S 6 )。隨後判定位於頂端之發光晶胞列是否於發光晶 18 312/發明說明書(補件)/92-10/921193 84 1225233 胞列之擷取處理被擷取。當判定為肯定，則處理前進至步 驟S 8。當判定為否定，則處理前進至步驟S 1 0 (步驟S 7 )。 於步驟S 8，擷取之發光晶胞列長度與電漿顯示面板3 0顯 示區之水平長度比對。隨後判定是否有一發光晶胞列之水 平長度係比電漿顯示面板3 0之顯示區之水平長度短。若判 定有此種發光晶胞列，則處理前進至步驟 S 1 0。若判定無 此種發光晶胞列，則處理前進至步驟S 1 1 (步驟S 9 )。於步 驟S 1 0，對列電極之斷路數目加1，且處理前進至步驟S 1 1。 由儲存於影像處理記憶體 3 b之影像資料，包括位在電 漿顯示面板3 0頂端之顯示晶胞列之一區，於步驟S 1 1被設 定為影像處理區。此區被設定為包括不發光之顯示晶胞， 以及位置接近前述顯示晶胞列之顯示區（亦即於黑顯示區 之顯示晶胞）以及位在顯示區外侧部分（亦即位在顯示晶胞 列上方部分）之顯示晶胞。隨後預設區之影像資料被儲存於 影像處理主題記憶體3 c (步驟S 1 2 )。 隨後基於儲存於影像處理主題記憶體 3 c之影像資料， 執行由位於底端之顯示晶胞列擷取發光晶胞列之處理（步 驟S 1 3 )。隨後判定於發光晶胞列之擷取處理是否已經擷取 位於底端之發光晶胞列。當判定為肯定，則處理前進至步 驟S 1 5。當判定為否定，則處理前進至步驟S 1 7 (步驟S 1 4 )。 於步驟 S 1 5，擷取所得之發光晶胞列長度與電漿顯示面板 3 0之顯示區水平長度比較。隨後判定是否有水平長度比電 漿顯示面板3 0顯示區之水平長度更短的發光晶胞列。若判 定有此種發光晶胞列，則處理前進至步驟 S 1 7。若判定無 此種發光晶胞列，則完成處理。於步驟 S1 7，對列電極之 19 312/發明說明書(補件)/92-10/92119384 1225233 斷路數目加l，以及完成處理。 藉此方式，於圖 1 0所示處理擷取於頂端之發光晶胞列 (步驟S 6)。若未擷取發光晶胞列（步驟S 7為否），則斷路 數目加1 (步驟S 1 0 )。發光晶胞列未被擷取之案例係對應於 頂端顯示晶胞列未點亮之案例，如圖9 D所示。表示頂端之 顯示晶胞列為斷路。因此於此種情況下，斷路數目加 1。 若被擷取之發光晶胞列長度係比電漿顯示面板 3 0之顯示 區之水平長度短（步驟 S 9之「存在」），則對斷路數目加 1 (步驟S 1 0 )。被擷取之發光晶胞列長度比顯示區水平長度 更短之案例係對應於圖 9C所示之頂端發光晶胞列中央被 岔斷案例。表示頂端之顯示晶胞列斷路。因此此種情況下 對斷路數目加1。 此外於圖1 0所示處理，擷取於底端之發光晶胞列（步驟 S 1 3 )。若未擷取發光晶胞列（步驟S 1 4為否），則斷路數目 加1 (步驟S 1 7 )。發光晶胞列未被擷取之案例係對應於底端 顯示晶胞列未點亮之案例。表示底端之顯示晶胞列為斷 路。因此於此種情況下，斷路數目加 1。若被擷取之發光 晶胞列長度係比電漿顯示面板 3 0之顯示區之水平長度短 (步驟S 1 6之「存在」），則對斷路數目加1 (步驟S 1 7 )。被 擷取之發光晶胞列長度比顯示區水平長度更短之案例係對 應於圖9 B或9 D所示之底端發光晶胞列中央被岔斷案例。 表示底端之顯示晶胞列斷路。因此此種情況下對斷路數目 加1。 例如以圖 9 A所示顯示圖案為例，於頂端之發光晶胞列 被擷取（於步驟S 7為是），且該發光晶胞列長度不比電漿顯 20 312/發明說明書(補件)/92-10/921193 84 1225233 示面板30顯示區之水平長度短（步驟S9為「不存在」） 此外，於底端之發光晶胞列經擷取（於步驟S 1 4為是）， 度 長 列S1一一 胞眾之 晶 + 端 步 光 C 底 發短及 該度端 ο 3 為 示 顯 平於下 水現況 區發情 示下種 顯況此 之情。 種路 此斷 板此極 面因電 示。列 顯}無 漿tj並 電 列 比t胞 不^晶 圖 數 路 斷 之 數 ^-0 S 處 示9B 所 ο 11 圖 以 例 為 案 圖 示 顯 示 所 成 變 被 列 胞 晶 光 發 之 端 頂 於 將水 ) ^¾ ~I 比在 不存 度不 長 Γ 為 列 9 胞 S 晶 驟 光步 發i( 短 度 長 平 水 7之 S 區 驟示 步顯 於 ο (3 取板 是 為 該 且 示 顯 外 此 光步發“ 但短 度 ) 長 是平 為水 14之 S 區 驟示 步顯 i ο ( 3 取 擷板 經面 列示 胞顯 晶將水 光電 發比 之度 端長 底 列 於胞 在 存 而 長 頂 擷 面 J 晶 驟 胞 情 胞 顯 此 該 短 底 1 0 取 於 顯 3 曰 晶 箱 示此 顯。 之路 端斷 頂極 於電 現列 發有 下列 況胞 情 晶 種示 此顯 此之 因端 〇 底 於 數 路 斷 之 數 tt ?·ιa 處 示 所 ο 11 路圖 為斷， 〇〇 無下 CO 列況 但 成 變 ， 取 如擷 例經 列 圖 以 晶漿 光電 發比 之係 端度 頂 長 於列 ， 胞 例晶 為光 案發 圖該 示但 顯 A 示是 所為 C 7 9CS 驟 步 為 9 S 驟 步 :取 擷 被 列 胞 晶 光 發 之 端 η 3 底 板於 面 ， 示外 短 度 平 水 之 區 示 顯 電 比 度 長 列 胞 晶 光 發 在 存 厂 為 6 11 S 驟 步 比白 列 胞 晶 示 顯二 之 端 驟 步 於 在是 存為 長端 平頂 水於 之現 區發 示 下 顯況 } 潰。 3種路 板此斷 面此極 示因電 顯。列 漿}有 下 況 青 種 此 但度及 圖 擷 經 未 列 胞 晶 光 發 〇 之 2 端 成頂 變於 ΡΠ ， 數例 路為 斷案 之 圖 數示 計顯 中 D 理9 處圖 示 以 所 否 } 為 是 7 為 S 4 雜 一—_ ..S 步 於 驟 步 ο 取 3 擷板 經面 列示 胞顯 晶漿 光電 發比 之 度 端長 底列 於胞 ， 晶 外光 此發 〇 但 312/發明說明書(補件)/92-10/921193 84 21 1225233 示區之水平長度短（步驟S16為「存在」）。因而發現於頂 端及底端之顯示晶胞列皆有斷路。此種情況下圖1 0所示處 理之計數斷路數目變成2。 於根據本具體實施例之顯示面板之顯示檢查方法，只點 亮位在顯示區頂端及底端之顯示晶胞列之偵測圖案係如前 文說明使用。結果可確保此等顯示晶胞行與毗鄰於此等顯 示晶胞行之額外顯示區間之梯度差異。因此，可就位於頂 端及底端之顯示晶胞列是否有電極斷路牢靠地進行偵測。 前述具體實施例中，說明檢查於頂端及底端之單一顯示 晶胞列情況。但該具體實施例也可應用於同時檢查頂端或 底端之複數顯示晶胞列（例如二排顯示晶胞列）情況。此種 情況下，發光顯示晶胞列數目或斷路顯示晶胞列數目可基 於允線厚度決定。 (第二具體實施例） 如圖4所示，電漿顯示面板3 0被設定於檢查器主體1。 致使於左端之一顯示晶胞行以及於右端之一顯示晶胞行， 亦即，電漿顯示面板3 0之顯示區共二顯示晶胞行發光。插 置於此等顯示晶胞行間之一中間區致使顯示黑（亦即讓其 不發光）。進行此種圖案之顯示。各個像素行包括三毗鄰顯 示晶胞行，亦即R、G及B顯示晶胞行。 圖11A、11B、11C及11D顯示依據是否有斷路而定之各 種發光圖案。圖11A顯示無斷路，於左端及右端各自有一 由三顯示晶胞行（R、G及B)組成之亮線對應一像素行之發 光圖案。此種情況下，於左端及右端共有六個顯示晶胞行 發光而無錯失部分。圖1 1 A所示發光圖案即為偵測得斷路 22 31W發明說明書(補件)/92-10/921193 84 1225233 之偵測圖案。圖 1 1 B顯示於右端之顯示晶胞行（R )有一 路，以及含括於右端亮線之顯示晶胞行（R)於中央被岔斷 發光圖案。圖1 1 C顯示右端之顯示晶胞行（R)有一斷路， 及含括於右端之亮線之顯示晶胞行（R)絲毫也未發光之 光圖案。圖1 1 D顯示於右端之顯示晶胞行有斷路之發光 案。以圖1 1 D為例，含括於右端亮線之顯示晶胞行（R)中 部分不發光，且顯示晶胞行（R)被劃分為上部及下部。 圖1 2為流程圖顯示檢查時進行之處理。圖1 2所示處 係基於控制裝置4進行之控制執行。 於圖1 2之步驟S 2 1，驅動脈波由檢查器主體1供給電 顯示面板3 0，因而顯示前述偵測圖案。結果電漿顯示面 3 0例如係以圖1 1 A至1 1 D所示發光圖案被點亮。此外， 路數目值最初為0。隨後藉CCD攝影機2拍攝發光圖案 像（步驟S22)。拍攝的影像之影像資料由CCD攝影機2 輸至影像處理裝置3之影像處理記憶體3 b (步驟S 2 3 )。 處R、G及B三色之資料係分開傳輸。 隨後由儲存於影像處理記憶體 3 b之影像資料，於電 顯示面板 3 0左端之像素行（三顯示晶胞行）之含括區設 作為影像處理區（步驟 S 2 4 )。此區係設定為包括位置接 前述顯示像素行且位於顯示區之顯示晶胞，以及包括未 光（亦即於黑顯示區之顯示晶胞）以及位於顯示區外側部 (亦即位於顯示晶胞行左側部分）之顯示晶胞。隨後於該 設區之影像資料儲存於影像處理主題記憶體 3 c (步 S25)。 接著基於儲存於影像處理主題記憶體 3 c之影像資料 312/發明說明書(補件)/92-10/921193 84 斷 之 以 發 圖 間 理 漿 板 斷 影 傳 此 漿 定 近 發 分 預 驟 23 1225233 執行由位於左端之顯示晶胞行擷取一發夕 理（步驟S 2 6 )。隨後判定位於左端之發光E 該發光晶胞行之擷取處理中被擷取。於 下，處理前進至步驟 S28。於否定判定之 進至步驟S 3 0 (步驟S 2 7 )。於步驟S 2 8，擷 (R)長度與電蒙顯示面板30之顯示區之水 後判定是否有一發光晶胞行（R)其垂直長 面板3 0之顯示區之垂直長度短。若判定有 (R)，則處理前進至步驟 S30。若判定無 (R )，則處理前進至步驟S 3 1 (步驟S 2 9 )。 行電極之斷路數目加1，處理前進至步驟 於步驟 S 3 1，就全部三行形成位於左端 晶胞行（R、G及B )，判定步驟S 2 4至S 3 0 完成。於否定判定之情況下，處理返回步 對次一顯示晶胞行（例如G )重複步驟S 2 4 之處理。若於步驟S 3 1之判定為肯定，則 S 3 2。於已經就各色（R、G及 B)顯示晶胞 至S30之處理後，處理前進至步驟S32。 由儲存於影像處理記憶體 3b之影像資 位於電漿顯示面板 3 0右端之像素行（三I 區作為一影像處理區（步驟 S 3 2 )。此區係 接近前述顯示像素行且位於顯示區之顯示 光（亦即於黑顯示區之顯示晶胞）以及位於 (亦即位於顯示晶胞行右側部分）之顯示晶 區之影像資料儲存於影像處理主題記憶體 312/發明說明書(補件)/92-10/921193 84 6晶胞行（R)之處 ?曰胞行（R )是否於 肯定判定之情況 情況下，處理前 取之發光晶胞行 平長度比較。隨 度係比電漿顯示 此種發光晶胞行 此種發光晶胞行 於步驟S30，對 S31。 之像素行之顯示 之處理是否已經 驟 S 2 4，於該處 以及隨後各步驟 處理前進至步驟 行執行步驟 S 2 4 料中，隨後設定 i示晶胞行）含括 設定為包括位置 晶胞，以及未發 顯示區外側部分 胞。隨後於預設 3c(步驟 S33)。 24 1225233 隨後，基於儲存於影像處理主題記憶體3 c之影像資料， 執行由位於右端之顯示晶胞行之發光晶胞行（R)之擷取處 理（步驟 S 3 4 )。隨後判定於該發光晶胞行之擷取處理中， 位於右端之發光晶胞行（R)是否被擷取。若判定為肯定，則 處理前進至步驟 S 3 6。若判定為否定，則處理前進至步驟 S 3 8 (步驟S 3 5 )。於步驟S 3 6，擷取所得發光晶胞行（R )之長 度與電漿顯示面板3 0之顯示區垂直長度作比較。隨後判定 是否有一發光晶胞行（R)其垂直長度係比電漿顯示面板 3 0 顯不區之垂直長度短。若判定為此種發光晶胞行（R)’則處 理前進至步驟S 3 8。若判定無此種發光晶胞行（R )，則處理 前進至步驟S 3 9 (步驟S 3 7 )。於步驟S 3 8，對行電極之斷路 數目加1，且處理前進至步驟S3 9。 於步驟 S 3 9，就形成位於右端之像素行之全部三顯示晶 胞行（R、G及B )，判定步驟S 3 2至S 3 8之處理是否已經完 成。若判定為否定，則處理返回步驟 S32，此處就次一顯 示晶胞行（例如 G )重複進行步驟S 3 2以及隨後各步驟之處 理。若於步驟S 3 9之判定為肯定，則完成處理。於就各色 (R、G及B )之顯示晶胞行已經執行步驟S 2 4至S 3 0之處理 後，處理完成。 如前文說明，於左端之發光晶胞行係於圖 1 2所示處理 被擷取（步驟 S 2 6 )。若發光晶胞行未被擷取（步驟 S 2 7為 否），則對斷路數目加1 (步驟S 3 0 )。發光晶胞行未被擷取 之情況係相當於圖 1 1 C所示發光晶胞行（此處於右端之發 光晶胞行）未被點亮的情況。表示左端之發光晶胞行斷路。 因此於此種情況下對斷路數目加 1。若被擷取之發光晶胞 25 312/發明說明書(補件)/92-10/921193 84 1225233 行之長度係比電漿顯示面板3 0之顯示區垂直長方 S 2 9為「存在」），則對斷路數目加1 (步驟S 3 0 ) 之發光晶胞行長度比顯示區垂直長度短之情況係 1 1 Β及圖1 1 D所示之發光晶胞行（此處為右端發另 於中間被岔斷的情況。表示左端之發光晶胞行具 因此於此種情況下對斷路數目加1。 此外，於圖1 2所示處理，擷取於右端之一發光差 驟S 3 4 )。若發光晶胞行未被擷取（步驟S 3 5為否） 路數目加1 (步驟S 3 8 )。發光晶胞行未被擷取之情 於右端之發光晶胞行未被點亮之情況。表示於右 晶胞行斷路。因此此種情況下，對斷路數目加 1 取之發光晶胞行長度比電漿顯示面板 3 0之顯示 度短（步驟S 3 7為「存在」），則對斷路數目加1 (步 被擷取之發光晶胞行長度比顯示區垂直長度短之 當於右端發光晶胞行於中間被岔斷之情況。表示 光晶胞行斷路。因此於此種情況下斷路數目加1 ^ 例如以圖1 1 Α所示發光圖案為例，於左端之全 晶胞行皆被擷取（步驟S 2 7為是），而該發光晶胞 比電漿顯示面板3 0顯示區垂直長度短（步驟S 2 9 在」）。此外，於右端之全部三發光晶胞行皆被揭 S 3 5為是），且發光晶胞行長度不比電漿顯示面板 區之垂直長度短（步驟S37為「不存在」）。因此 況下於左端及右端之顯示晶胞行皆未見行電極斷 圖1 2所示處理計數之斷路數目變成0。 以圖1 1 B所示發光圖案為例，於左端之全部三 312/發明說明書(補件)/92-10/92119384 [短（步驟 。被掘取 相當於圖 L晶胞行） 有斷路。 ^胞行（步 ，則對斷 況係相當 端之發光 。若被擷 區垂直長 驟 S 3 8 ) 〇 情況係相 右端之發 部三發光 行長度不 為「不存 i取（步驟 30顯示 ，此種情 路。因此 發光晶胞 26 1225233 行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不比電 漿顯示面板3 0顯示區垂直長度短（步驟S 2 9為「不存在」）。 此外，於右端之全部三發光晶胞行皆被擷取（步驟 S 3 5為 是），但其中發光晶胞行（R)長度係比電漿顯示面板3 0之顯 示區垂直長度短（步驟S37為「存在」）。因此此種情況下 發現左端顯示晶胞行無斷路，但右端顯示晶胞行（R)有一行 電極斷路。因此圖1 2所示處理計數之斷路數目變成1。 例如以圖1 1 C所示發光圖案為例，於左端之全部三發光 晶胞行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不 比電漿顯示面板3 0顯示區垂直長度短（步驟S 2 9為「不存 在」）。此外，右端之發光晶胞行中該發光晶胞行（R)未被 擷取（步驟S 3 5為否）。至於位在右端之另二發光晶胞行（G 及B )，步驟S 3 5之判定為是，以及步驟S 3 7之判定為「不 存在」。因此此種情況下發現左端之顯示晶胞行並無斷路， 但右端之顯示晶胞行（R )有行電極斷路。因此圖1 2所示處 理計數之斷路數目變成1。 以圖1 1 D所示發光圖案為例，於左端之全部三發光晶胞 行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不比電 漿顯示面板30顯示區垂直長度短（步驟S29為「不存在」）。 此外，右端之全部三發光晶胞行皆被擷取（步驟 S 3 5為 是），但發光晶胞行（R)長度係比電漿顯示面板3 0顯示區之 垂直長度短（步驟S 3 7為「存在」）。因此此種情況下發現 左端之顯示晶胞行並無斷路，但右端之顯示晶胞行（R)有行. 電極斷路。因此圖1 2所示處理計數之斷路數目變成1。 根據本發明之顯示面板之顯示檢查方法中，只點亮位在 27 312/發明說明書(補件)/92· 10/921193 84 1225233 顯示區左端及右端之顯示晶胞行之偵測圖案係如前 使用。結果可確保該等顯示晶胞行與毗鄰該等顯示 之額外顯示晶胞區間之梯度差異。因此可牢靠地就 端及右端之顯示晶胞行進行是否有行電極斷路。 前述具體實施例中，已經說明對形成於左端或右 像素行之複數個顯示晶胞行（三排顯示晶胞行）作 例。但該具體實施例也可應用於例如檢查單色顯示 及檢查於左端或右端之一顯示晶胞行之案例。 (第三具體實施例） 如圖1 3所示，連結至電漿顯示面板3 1之電極之 動器1 1 a及1 1 b、X維持驅動器1 2 a及1 2 b以及Y維 器13a及13b係設置於檢查器主體1。 如圖1 3所示，電漿顯示面板3 1被切割成上區及 各區之電極彼此分開。如圖1 3所示，行電極D1 r、 Dlb、D2r、D2g、D2b、…Dmr、Dmg 及 Dmb、列電極 X i及列電極Y 1至Y i設置於電漿顯示面板上區。行電 至D m b係連結至定址驅動器1 1 a。列電極X 1至X i 至X維持驅動器1 2 a。列電極Y1至Y i係連結至Y 動器1 3 a。 行電極 DAlr、DAlg、DAlb、DA2r、DA2g、DA2b、... DAmg及DAmb、列電極Xi + 1至Xn及列電極Yi + 1至 置於電聚顯示面板3 1下區。行電極D A 1 r至D A m b係 定址驅動器1 1 b。列電極X i + 1至X n係連結至X維 器1 2 b。列電極Y i + 1至Υ η係連結至Y維持驅動器 如圖 1 3所示，行電極被指定成以引述之順序而 312/發明說明書(補件)/92-10/921193 84 文說明 晶胞行 位於左 端之一 檢查案 面板以 定址驅 持驅動 下區’ Dig、 XI至 極D 1 r 係連結 維持驅 D A m r、 7 η係設 連結至 持驅動 1 3b ° 重複關 28 1225233 聯R晶胞、G晶胞及B晶胞。於顯示區4 1，R晶胞、G晶胞 及B晶胞分別係形成於行電極與列電極X 1至X η及列電極 Υ1至Υ η之交叉點。如圖1 3所示，接續設置之R晶胞、G 晶胞及Β晶胞係當成一組來處理，該組形成一個像素。額 外顯示區區域4 7係設置於顯示區4 1外側。 如圖1 3所示，列電極X1至X η及列電極Υ1至Υ η係交 錯梳狀設置，不會由彼此相對之兩邊伸出。列電極 X1至 X η其中之一以及列電極Υ 1至Υ η其中之一指定給一顯示晶 胞列。於一晶胞内部，列電極X1至X η及列電極Υ1至Υ η 係並聯設置，故彼此相對。 於顯示區4 1中間部分，行電極D 1 r至D m b及行電極D A 1 r 至D A m b縱向分開。行電極之排列將進一步說明如後。 現在將說明使用檢查裝置1 0 0檢查電漿顯示面板3 1之 行電極間短路之程序。 如圖 4所示，電漿顯示面板 31於檢查時係設定於檢查 器主體1，讓電漿顯示面板31顯示區41上區及下區之一 全部發單色光（例如R色）。此時讓另一區的全區顯示黑（亦 即讓其不發光）。 圖1 4 A、1 4 B及 1 4 C顯示依據行電極間是否短路之發光 圖案。圖14A顯示行電極間無短路，顯示區41之上區42 全體發單色光之情況。此時下區4 3並無發光晶胞。圖1 4 A 所示發光圖案即為檢查行電極間短路之該種檢查圖案。圖 1 4 B為行電極間短路案例之發光圖案。圖1 4 C為略圖顯示 行電極間之短路。設置於上區之行電極組1 0 1之行電極與 設置於下區之行電極組1 0 2之行電極間之短路部分1 0 3顯 29 312/發明說明書(補件)/92-10/921193 84 1225233 示於圖1 4 C。若行電極間有此種短路，則設置於上區4 2之 行電極與設置於下區 4 3之行電極彼此透過短路部分 1 0 3 連結。於一線（亮線）1 0 4之晶胞發光，亮線1 0 4係順著行 電極組1 0 2之行電極連結至行電極組1 0 1之行電極。結果 變成可檢查行電極間之短路。 此種電漿顯示面板3 1之發光圖案以CCD攝影機2拍攝。 影像處理裝置3基於CCD攝影機2供給的影像資料而分析 發光圖案。 圖1 5為流程圖顯示檢查時進行的處理。圖1 5所示處理 係基於控制裝置4進行之控制執行。 於圖1 5步驟S 4 1，由檢查器主體1供給驅動脈波給電漿 顯示面板3 1來顯示前述偵測圖案。結果例如於圖1 4 A或圖 1 4 B所示發光圖案，電漿顯示面板3 1被點亮。指示是否有 短路位置的旗標值被初始化為一值，指示「無短路位置」。 隨後藉CCD攝影機2拍攝發光圖案影像（步驟S42)。拍攝 的影像由CCD攝影機2傳輸至影像處理裝置3之影像處理 記憶體3 b (步驟S 4 3 )。三色R、G及B資料傳輸至分開記憶 體區。 隨後設定一記憶體區儲存發光色（R、G或B )變成影像處 理的主題，亦即設定變成影像處理主題之資料（步驟 S 4 4 )。隨後基於儲存於影像處理記憶體3 b之影像資料，求 出近似中間平分線之近似直線（步驟S 4 5 )。 隨後於儲存於影像處理記憶體 3 b之影像資料中，未變 成發光之上區或下區全體設定為影像處理區（步驟 S46)。 此處影像處理區之設定係取步驟S 4 5處理求出之近似直線 30 312/發明說明書(補件)/92-10/921193 84 1225233 作為參考點。例如，若檢查圖案為圖1 4 A所 括下區43全區及中央平分線區域於步驟S46 像處理區。 接著基於儲存於影像處理主題記憶體 3 c 執行影像處理區發光點或發光線的擷取處理 此處發光點或發光線之擷取係就步驟S 4 4設 行。例如，以圖14 B所示發光圖案為例，發 係於亮線1 0 4擷取。以圖1 4 A所示發光圖案 或發光線未經擷取。 隨後於步驟S 4 8，決定藉步驟S 4 7之處理 發光點或發光線。若判定為肯定則處理前進 若判定為否定，則處理前進至步驟S 5 0。於3 行電極間存在有短路，指示是否有短路之旗 發光色指示「有短路位置」。然後處理由步驟 驟S 5 1。另一方面，於步驟S 5 0，行電極間之 存在，旗標值指示就相關發光色而言是否有 改變。然後處理由步驟S 5 0前進至步驟S 5 1 於步驟S 5 1判定於步驟S 4 1以及隨後各步 就R、G及B全部發光色而言是否已經結束。身 則處理返回步驟S 4 1而前進處理次一發光色 若判定為肯定，則結束圖1 5所示處理。步 之處理就個別發光色（R、G及B)已經執行後 理。1225233 发明 Description of the invention: [Technical field to which the invention belongs] The present invention relates to a display inspection method and the like for a display panel formed by arranging display cells in a matrix form, detecting a disconnection of one of the electrodes of the display panel, and a Display inspection method for checking short circuit between electrodes, etc. [Prior art] As a conventional method for checking a broken electrode by a plasma display panel formed by arranging display cells in a matrix, a method is adopted in which a full surface display pattern is used to capture a display pattern as image data, and Detect defects by using image analysis. If, as shown in FIG. 1A or FIG. 2A, one of the electrodes of the plasma display panel 30 is disconnected, a non-emission part of the display line appears. Therefore, it is easy to capture line defects by comparing the gradient of the broken display line with the gradient of the two adjacent pixels on the display line, or by comparing the gradient of the broken display line with the gradient of the two adjacent pixels around the display line. A display panel includes a plurality of column electrodes, the row electrodes are arranged in the direction of the vertical column electrodes, and R (red), G (green), and B (blue) color display cells are formed at the intersections of the column electrodes and the row electrodes. The display panel is known. In such a display panel, when a short circuit between adjacent electrodes is detected, a monochrome pattern (R, G, or B pattern) is displayed on the full display panel. In this case, if a short circuit occurs between adjacent electrodes, another color indicates that the unit cell emits light. Therefore, a short between electrodes can be detected. If there is a broken display line at the upper or lower end of the display area as shown in Figure 1B, or if there is a broken display line at the left or right end of the display area as shown in Figure 2B, the line defect gradient caused by the break It is close to the display area 5 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233. The outer gradient becomes difficult to detect the open circuit by using the aforementioned method. On the other hand, if you try to compare the gradient of the line defect part with the adjacent pixel gradient of the display area, it must be strictly fixed to the horizontal level of the display area. Distortion of the display area is not allowed. It is therefore difficult to adopt this method. SUMMARY OF THE INVENTION An object of the present invention is to provide a display inspection method and a display inspection device for a display panel. The method or device can reliably detect line defects at the upper or lower end of the display area, or at the display. Line defect at the left or right end of the zone. There is a type of display panel in which the row electrodes are divided in the vertical direction of the display panel. In this type of display panel, as shown in FIG. 3, the row electrodes of the row electrode groups 1101 and 102 which are divided in the row direction are short-circuited, causing line defects and preventing normal display. However, when the aforementioned inspection method is used to display a single-color pattern on a full display panel, the short circuit between the upward electrode and the downward electrode does not affect the display. Therefore, a short circuit between the up electrode and the down electrode cannot be detected. Another object of the present invention is to provide a display inspection method and a display inspection device for a display panel, which can inspect the short circuit between the upper electrode and the lower electrode which are arranged to be separated from each other. In addition, when a short circuit occurs between adjacent column electrodes of a plasma display panel, there is a problem in that dark lines do not appear on the full-surface display panel, and thus a short circuit between the column electrodes cannot be detected. Another object of the present invention is to provide a display inspection method and a display inspection device for a display panel, which can reliably inspect the short circuit between the column electrodes. The foregoing object of the invention can be achieved by a display inspection method for a display panel for inspecting a display 6 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233, the display panel including a plurality of rows of electrodes, And a plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit cell controls the light emission of the display unit cells arranged in a matrix form in the display area. The method has the following steps: let the display cell row located at the top or bottom of the display area emit light; and use an image sensor to detect the light emitting display cell, which is close to the light emitting display cell and is located in the display area. And a non-luminous display cell located outside the display area and outputting a video image; based on the output video image, corresponding to the light emitting cell row at the top or bottom, and detecting the number of bright lines in the row direction and Length; and when the number and length of the bright lines are less than a predetermined value, it is determined that the column electrode corresponding to the display cell row has been disconnected. The foregoing object of the present invention can be achieved by a display inspection method for a display panel for inspecting line defects of a display panel, the display panel including a plurality of rows of electrodes, and a plurality of rows of electrodes arranged in a vertical column. The display unit cell forms the display cell at the intersection of the column electrode and the row electrode. The display unit cell controls the light emission of the display unit cells arranged in a matrix form in the display area. The display inspection method has the following steps: The display cell row at the left or right end of the display area emits light; by using an image sensor to detect the light-emitting display cell, the display unit located near the light-emitting display cell and located in the display area, and the non-light-emitting and located in the display area The display unit cell on the outer part outputs a video image; based on the output video image, the number and length of bright lines are detected in the row direction corresponding to the light-emitting unit cell row at the left or right end; and when the number and length of bright lines are When it is less than the predetermined value, it is determined that the row electrode corresponding to the row of the display cell has been disconnected. 7 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 The aforementioned object of the present invention can be achieved by a display inspection method, which is used for a display panel to inspect line defects of a display panel. The display panel includes a plurality of column electrodes, and a plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit line is arranged in the column direction so that the light emitting color is The three colors are different from each other, and the three colors form a pixel, and the display cells with the same light emission color are arranged in the row direction. By controlling the light emission of the display cells arranged in a matrix shape in the display area, the display panel displays an image. The display inspection method has the following steps: let the display cell row located at the left or right end of the display area emit light; use an image sensor to detect the light-emitting display cell, is located close to the light-emitting display cell, and is located in the display area A display unit cell and a non-luminous display unit cell located outside the display area and outputting a video image; based on the output video image , Corresponding to the light emitting cell row at the left or right end, and detecting the number and length of bright lines in the row direction; and when the number and length of the bright lines are less than a predetermined value, it is determined that the row electrode of the corresponding display cell row has been disconnected . The foregoing object of the present invention can be achieved by a display inspection method for a display panel for inspecting a line defect between divided row electrodes on a display panel, the display panel including a plurality of columns of electrodes, and A plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrodes and the row electrodes. The row electrodes are divided in the row direction and the display area. The display panel is formed by dividing the day surface obtained by the division. When possible, the display unit cell is selected. When a column is taken as a unit, the display inspection method includes the following steps: by letting one of the upper and lower daylight surfaces obtained by the division emit monochromatic light; by using an image sensor to detect Detected as 8 312 / Invention Specification (Supplement) / 92-10 / 92119384 1225233 Non-light-emitting segmented day surface above and below the segmented day surface, and output a video signal; based on the output video signal, The display cell line of the other day surface should be divided up and down, and a bright line should be detected in one direction; and the corresponding bright line should be detected. Illustrates cell line, a short circuit between the electrodes is determined between electrodes divided column. The foregoing object of the present invention can be achieved by a display inspection method for a display panel for inspecting a line defect between divided row electrodes on a display panel, the display panel including a plurality of columns of electrodes, and The plurality of row electrodes are arranged in the direction of the vertical column electrode to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit line is arranged in the column direction so that the light emitting colors are three colors and are different from each other and form one. Pixels; and display cells with the same luminous color are arranged in the row direction, the row electrodes are divided in the row direction and the display area is divided, and the display panel is formed so that the divided display day cells can be formed through the division while the display cell is selected, When a row is taken as a unit, the display inspection method includes the following steps: by causing one of the upper and lower divided daylight planes obtained by the division to emit monochromatic light; and by using an image sensor to detect the non-illuminated divided daylight planes Divides the other day surface up and down, and outputs a video signal; based on the output video signal, A display cell row on the other day surface of the lower divided day plane detects a bright line in one direction; and a display cell row corresponding to the detected bright line determines that an electrode short circuit occurs between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection method for a display panel, which is used to inspect a line defect of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in the direction of the vertical columns of electrodes, and The display cell is formed at the intersection of the column electrode and the row electrode. The display panel 9 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 The display panel is controlled by a display cell arranged in a matrix in a display area. The display inspection method includes the following steps: making the display unit cell in the display area emit light in a zigzag pattern; detecting the display unit cell in the display area by using an image sensor, and outputting a video Signal; based on the output video signal, a dark line detected in the column direction; and a display cell row corresponding to the detected dark line, determining that an electrode short circuit occurs between the column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. A display cell is formed at the intersection of the column electrode and the row electrode. The display panel displays an image by controlling the light emission of the display cells arranged in a matrix in a display area. The display inspection device is provided with a light emitting device. It is used to give light to the display cell array located at the top or bottom of the display area; an image sensor is used to detect the light-emitting display cell, which is close to the light-emitting display cell and is located in the display area And a display cell that is non-luminous and located outside the display area, and outputs a video signal; and a determination device, which is based on the video signal output by the image sensor, and corresponding to the top or bottom Display the direction of the unit cell row, check the number of bright lines and the length of the bright lines, and determine when the number and length of the bright lines are less than a predetermined value. The column electrode corresponding to the display cell row is disconnected. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. The display cell is formed at the intersection of the column electrode and the row electrode. The display panel is controlled by a display cell arranged in a matrix in a display area. 10 312 / Invention Specification (Supplement) / 92-10 / 92119384 1225233 An image is displayed. The display inspection device is provided with: a light-emitting device for giving light to the display cell row at the left or right end of the display area; an image sensor for detecting the light-emitting display cell, A display unit cell located close to the light-emitting display unit and located in the display area, and a display unit unit which is non-luminous and located outside the display area, and outputs a video signal; and a determining device for detecting the image based on The video signal output from the monitor, and check the number of bright lines and the length of the bright lines corresponding to the direction of the display cell row at the left or right end, and when The number of the bright line and the line length is less than the predetermined value, it is determined to display the corresponding row electrode line of the cell open circuit. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. The display unit cell is formed at the intersection of the column electrode and the row electrode, and the display unit cell is arranged in the column direction, so the light emitting colors are three colors and are different from each other, and a pixel is formed, and the display unit cells having the same light emitting color are formed. The display panel is arranged in a row direction. The display panel displays an image by controlling the light emission of display cells arranged in a matrix in a display area. The display inspection device is provided with a light emitting device for giving way to the display area. The left or right display cell line emits light; an image sensor for detecting a light-emitting display cell, a display cell located near the light-emitting display cell and located in the display area, and a non-light-emitting and located in the display area A display unit of the outer part, and outputting a video signal; and a judging device, which is based on the video output by the image sensor Signal, and check the number of bright lines and the length of the bright line in the direction corresponding to the display cell line located at the left or right end, and determine the line corresponding to the display cell line when the number and length of the bright lines are less than a predetermined value Electrode hair 11 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 Open circuit. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used to inspect line defects between divided row electrodes of a display panel, the display panel includes a plurality of rows of electrodes, and the plurality of rows of electrodes are arranged vertically. The column electrode direction forms the display cell at the intersection of the column electrode and the row electrode, and the row electrode is divided in a display area in the row direction. The display panel thus formed can take one column as a unit, and at the same time select the divided daylight surface obtained by the division. A display unit, the display inspection device is equipped with: a light emitting device for emitting monochromatic light from one of the upper divided day surface and the lower divided day surface obtained through division; an image sensor for use An image sensor detects the other day surface of the upper and lower divided screens as a non-light-emitting divided day surface and outputs a video signal; a determination device for detecting the upper and lower divisions based on the output video signal The other day surface of the picture corresponds to a bright line of a display cell traveling in the row direction, and a display cell row which is judged to be a bright line that should be detected. An electrode short occurs between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used to inspect line defects between divided row electrodes of a display panel, the display panel includes a plurality of rows of electrodes, and the plurality of rows of electrodes are arranged vertically. Column electrode direction to form a display unit cell at the intersection of the column electrode and the row electrode, the display unit line is arranged in the column direction, and its light emitting color is three colors, which are different from each other and form a pixel, and display crystals having the same light emitting color The cell lines are arranged in the row direction, and the row electrodes are divided in a display area in the row direction. The display panel thus formed can take one column as a unit, and at the same time select the display unit cell of the divided daylight surface obtained by the division. The display inspection device is equipped with: Light-emitting device, which is used to divide the upper and lower divisions of the daylight surface and the lower division 12 312 / Invention Specification (Supplement) / 92-10 / 92119384 1225233 One of the daylight surfaces emits monochromatic light; an image sensor, which It is used to detect the other day surface of the upper and lower divided frames as a non-light-emitting divided day surface by using an image sensor, and output a video signal. ; A determining means for based on the output video signal is based, to detect the other day the upper and lower split surface side of the day, a display cell row corresponding to the row direction. The bright line and the display cell row corresponding to the detected bright line, an electrode short between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. A display cell is formed at the intersection of the column electrode and the row electrode. The display panel displays an image by controlling the light emission of the display cells arranged in a matrix in a display area. The display inspection device is provided with a light emitting device. It is used to make the display unit cell in the display area emit light in a zigzag pattern; an image sensor is used to detect the display unit cell in the display area by using an image sensor and output a video signal; a judgment A device for detecting a dark line in a column direction based on the output video signal, and determining that an electrode short circuit occurs between column electrodes of a display cell row corresponding to the dark line. [Embodiment] (First specific embodiment) Hereinafter, a specific embodiment of a display inspection method for a display panel according to the present invention will be described with reference to Figs. 4 to 10. Fig. 4 is a block diagram showing a configuration of an inspection device for a display inspection method of a plasma display panel. FIG. 5 is a schematic diagram showing the electrode configuration of the plasma display panel 30 to be inspected. As shown in FIG. 4, the inspection device 100 includes an inspector main body 1, which is 13 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 and is used to illuminate the plasma display panel 3 during inspection. CCD camera 2 for capturing images on the display surface of plasma display panel 30, an image processing device 3 for receiving video images from CCD camera 2 and a control device 4 for controlling the inspector body 1, CCD camera 2 and images Processing device 3. The image processing device 3 includes an image processing section 3 a for performing image processing and analysis of luminous patterns (described later in detail), and an image processing memory 3 b for storing R, G, and B, each of which is supplied by the CCD camera 2 Image data, and an image processing theme memory 3c, for temporarily storing the image processing theme data. As shown in FIG. 5, the fixed address driver 11, an X sustain driver 12, and a Y sustain driver 13 are all connected to the electrodes of the plasma display panel 30, and are arranged on the inspector main body 1. As shown in FIG. 5, the electric display panel 30 includes row electrodes Dir, Dig, Dlb, D2r, D2g, D2b,... Dmr, Dmg, and Dmb, and column electrodes XI to Xn and column electrodes Y1 to Yn. . As shown in FIG. 5, the row electrodes are designated to repeatedly associate the R cell, G cell, and B cell in the stated order. In the display area 30a, the R cell, the G cell, and the B cell system are repeatedly formed at the intersections of the row electrodes and the column electrodes X1 to X η and the column electrodes Y1 to Υ η. As shown in FIG. 5, the R cell, the G cell, and the B cell line are sequentially arranged to be processed in a set, and one pixel is formed by the set. An additional display area 30b is provided outside the display area 30a. As shown in FIG. 5, the column electrodes X1 to X η and the column electrodes Y1 to Υ η are interleaved and arranged in a comb shape, so they protrude from the opposite sides of each other. One of the column electrodes X1 to X η and one of the column electrodes Υ 1 to Υ η are assigned to a display cell column. Inside a unit cell, the column electrodes X1 to X η and the column electrodes Υ1 to Υ η are arranged in parallel to face each other. 14 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 As shown in Figure 5, the row electrodes Dir, Dig, Dlb, D2r. . . Dmb is connected to the address driver 11, column electrodes X 1 to X n are connected to the X sustain driver 12, and column electrodes Υ1 to Υη are connected to the Υ sustain driver 13. A driving method of the plasma display panel 30 will now be described. A field as a time interval for driving the plasma display panel 30 is composed of a plurality of sub-blocks S F1 to S F Ν. As shown in FIG. 6, in each of the sub-blocks, the addressing interval time for the unit cell to be lighted is selected, and a maintenance time period for which the unit cell whose time between the addresses is selected is continuously lit for a predetermined period of time. The reset interval for resetting the lighting state of the previous field is additionally provided for the header part of the first sub-field SF 1. During this reset interval, the unit cells are reset to light up the unit cells (units with wall charges formed in them) or to extinguish the unit cells (units without wall charges formed in them). In the former case, the predetermined unit cell is switched to the extinguished unit cell. In the case described later, the predetermined unit cell is switched to light up the unit cell at the subsequent addressing interval. Keep sub-fields at intervals of SF1, SF2. . . The order of SFN is gradually extended. By changing the number of subfields that are continuously lit, a predetermined gradient can be displayed at the addressing interval of each subfield shown in Figure 7, and the addressing is performed line by line. In other words, while the scanning pulse is applied to the column electrodes forming the first line, the pulse DPI is applied to the row electrodes Dir, Dig, Dlb, D2r according to the data pulse corresponding to the addressing data of a unit cell of the first line. . . Dmb. Subsequently, while a trace pulse is applied to the column electrode Υ 2 forming the second line, an address pulse DP2 corresponding to the addressing data of a unit cell of the second line is applied to the line power D 1 r, D 1 g, D 1 b, D 2 r ... D in b. The scanning pulse and the data pulse are applied simultaneously to one unit cell of the third line and to the cells of subsequent lines in the same manner. Finally, a scanning pulse wave is applied to the electrodes forming the ηth line 之 312 / Invention Specification (Supplement) / 92-10 / 921193 84 The complete device repeats the separation and the whole j is described by the sweep from time to time. When scanning at the pole plus crystal as 15 1225233, a data system corresponding to the addressing data of a unit cell on the η line is applied to the row electrodes Dir, Dig, Dlb, D2r. . . Dmb. At a fixed time, the predetermined unit cell is switched from a lit unit cell to an extinguished unit cell, or from a unit cell to a lit unit. If the address scan is completed in this way, each unit cell stopped at the sub-unit is turned on or extinguished. In the subsequent sustaining interval, only the unit cell repeatedly emits light for each sustaining pulse. The sustain pulses and Y sustain pulses at the sustain interval 1 are repeated to the column electrodes X 1 to X η and the column electrodes Y 1 to Υ η at a predetermined timing shown in FIG. 7. Set a erase interval in the final sub-column for all cell units to be turned off. By repeating the aforementioned stop, it becomes possible to use a dynamic image to display the gradient display of plasma display 3. FIG. 8 shows an example in which the plasma display panel is divided into upper regions, and the electrodes in each region are separated from each other. In this case, the addressing drivers 1 1 a and 1 1 b, the X sustaining driver 1 2 b, and the Y sustaining driver 1 3 a and 1 3 b connected to the display panel 31 are provided in the inspector as shown in FIG. 8. As shown in FIG. 8, the plasma display panel 31 includes row electrodes D1 r ′ Dlb, D2r, D2g, D2b,... Dmr, Dmg, and Dmb. The column electrodes X i and the column electrodes Y1 to Y i are disposed in the direction of the vertical row electrodes. DAlr, DAlg, DAlb, DA2r, DA2g, DA2b, ". DAmr, D A m b and the column electrodes X i + 1 to X n and the column electrodes Y i + 1 to Y n are arranged in the direction of the straight electrode. Each row of electrodes is designated to connect the R cell, G cell, and B cell in the order cited. The R cell, G cell, and B crystal are formed on the row and column electrodes X1 to X η and the column electrodes Y1 to Υ η 312 / Description of the Invention (Supplement) / 92-10 / 92119384 ί Wave DPn Address Interval annihilation crystal Set the secondary application time, X multiple application SFN, unit cell. & plate 30 area and lower plasma display 12a and main body, 'Dig' XI to row electrode DAmg, placed at the intersection of vertical repeat cell repeat 16 1625233 points. In the same manner as in the case shown in FIG. 5, one R cell, one G cell, and one B cell system are successively disposed in a group, and one pixel system is composed of the group. Row electrodes Dir, Dig, Dlb, D2r, D2g, D2b,. . . D m r ^ Dmg, Dmb are connected to the address driver 11a. Row electrodes DAlr, DAlg, DAlb, DA2r, DA2g, DA2b, ". DAmr, DAmg, DAmb are connected to the addressing drive 1 1 b. The column electrodes X1 to X i are connected to the X sustain driver 1 2 a. The column electrodes Y 1 to Yi are connected to the Y sustain driver 1 3 a. The column electrodes X i + 1 to Xn are connected to the X sustain driver 1 2 b. The column electrodes Y i +1 to Υ η are connected to the Y sustain driver 1 3b. The driving method of the plasma display panel 31 is similar to the driving method of the plasma display panel 310 described above. Now, the inspection procedure of the upper end portion and the lower end portion of the plasma display panel 30 by using the inspection device 100 will be described. The inspection of the plasma display panel 31 divided into the upper and lower regions is also performed in the same manner. As shown in FIG. 4, the plasma display panel 30 is set on the inspector main body 1. Let one of the top display cell row and one of the bottom display cell row, that is, two rows of the display area of the plasma display panel 30 display the cell row to emit light. Make the middle area set between the display cell columns appear black (that is, make it not light). Display this pattern. 9A, 9B, 9C, and 9D display various light emitting patterns depending on whether there is an open circuit. Fig. 9A shows that there is no open circuit, and the two rows corresponding to the top and bottom show the light emitting pattern of the cell line with two bright lines. The pattern shown in FIG. 9A is the detection pattern for detecting an open circuit. Fig. 9B shows a light-emitting pattern in which the cell line at the bottom end is broken and the bright line at the bottom end is broken at the center. FIG. 9C shows that the cell rows are broken at the top and bottom respectively, and the bright lines at the bottom and 17 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 at the bottom end are broken off in the center. pattern. FIG. 9D shows a light-emitting pattern in which each of the display cell rows at the top end and the bottom end has a broken line, there is no bright line at the top end, and the bright line at the bottom end is broken at the center. Such a light-emitting pattern of the plasma display panel 30 is captured by a CC camera D2. The display processing device 3 analyzes the light emission pattern based on the image data supplied from the CC camera 2. Fig. 10 is a flowchart showing the processing performed during the inspection. The processing shown in FIG. 10 is executed based on the control performed by the control device 4. At step S1 in FIG. 10, the pulse wave is driven to the plasma display panel 30, so the inspector body 1 displays the aforementioned detection pattern. As a result, the plasma display panel 30 is illuminated with the light emitting patterns shown in FIGS. 9A to 9D. In addition, the number of trips is initialized to zero. Then, the C C D camera 2 is used to capture a light-emitting pattern image (step S2). The image data of the photographed image is transmitted from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 3). The three colors of R, G and B are transmitted separately here. Subsequently, the image data stored in the image processing memory 3 b is used as the image processing area by setting the display cell row containing area at the top of the plasma display panel 30 as the image processing area (step S 4). This area is set to include a display unit located close to the aforementioned display unit row and located in the display area, and not emitting light (ie, a display unit cell in a black display area) and a portion outside the display area (that is, located in a display area) The upper part of the unit cell column) shows the unit cell. Subsequently, the image data in the preset area is stored in the image processing theme memory 3c (step S5). Then, based on the image data stored in the image processing subject memory 3c, a process of acquiring the light-emitting cell row from the display cell row located at the top is performed (step S6). Subsequently, it is determined whether or not the light-emitting cell array at the top is in the light-emitting crystal 18 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 When the determination is affirmative, the process proceeds to step S8. When the determination is negative, the process proceeds to step S 1 0 (step S 7). In step S8, the length of the captured light-emitting cell array is compared with the horizontal length of the display area 30 of the plasma display panel 30. It is then determined whether the horizontal length of a light-emitting cell row is shorter than the horizontal length of the display area of the plasma display panel 30. If it is determined that such a light-emitting cell array exists, the process proceeds to step S10. If it is determined that there is no such light-emitting cell array, the process proceeds to step S 1 1 (step S 9). In step S 1 0, the number of disconnection of the column electrodes is increased by 1, and the process proceeds to step S 1 1. The image data stored in the image processing memory 3 b includes an area of a display cell row located at the top of the plasma display panel 30 and is set as an image processing area in step S 1 1. This area is set to include a non-luminous display unit cell, and a display area (ie, a display unit cell in a black display area) positioned close to the aforementioned display unit cell row, and a portion located outside the display area (ie, a display unit cell). The upper part of the column) shows the unit cell. The image data of the preset area is then stored in the image processing theme memory 3 c (step S 1 2). Then, based on the image data stored in the image processing theme memory 3c, a process of acquiring the light-emitting cell row from the display cell row at the bottom is performed (step S 1 3). Then, it is determined whether the light-emitting cell row capture process has captured the light-emitting cell row located at the bottom end. When the determination is affirmative, the process proceeds to step S 1 5. When the determination is negative, the process proceeds to step S 1 7 (step S 1 4). In step S15, the obtained length of the light-emitting cell row is compared with the horizontal length of the display area of the plasma display panel 30. It is then determined whether there is a light-emitting cell array having a horizontal length shorter than the horizontal length of the display area of the plasma display panel 30. If it is determined that such a light-emitting cell array exists, the process proceeds to step S 1 7. If it is determined that there is no such light-emitting cell array, the process is completed. In step S17, add 19 to the column electrode 19 312 / Invention Specification (Supplement) / 92-10 / 92119384 1225233 to open the number of breaks, and complete the process. In this way, the light-emitting cell array captured at the top is processed as shown in FIG. 10 (step S6). If the light-emitting cell row is not captured (No in step S7), the number of disconnections is increased by 1 (step S10). The case where the light emitting cell row is not captured corresponds to the case where the top display cell row is not lit, as shown in FIG. 9D. Indicates that the display cell at the top is listed as an open circuit. So in this case, the number of trips is increased by one. If the length of the captured light-emitting cell row is shorter than the horizontal length of the display area of the plasma display panel 30 ("Existence" in step S 9), then the number of disconnections is increased by 1 (step S 1 0). The case where the length of the captured light emitting cell row is shorter than the horizontal length of the display area corresponds to the case where the center of the top light emitting cell row is branched as shown in FIG. 9C. Indicates that the top display cell array is open. So in this case add 1 to the number of disconnects. In addition, in the processing shown in FIG. 10, the light-emitting cell row at the bottom is captured (step S 1 3). If the light-emitting cell array is not captured (No in step S 1 4), the number of disconnections is increased by 1 (step S 1 7). The case where the light emitting cell row is not captured corresponds to the case where the bottom display cell row is not lit. The display unit cell at the bottom end is listed as an open circuit. So in this case, the number of trips is increased by one. If the length of the captured light-emitting cell row is shorter than the horizontal length of the display area of the plasma display panel 30 ("existence" in step S 16), add 1 to the number of disconnections (step S 1 7). The case where the length of the captured light emitting cell row is shorter than the horizontal length of the display area corresponds to the case where the center of the bottom light emitting cell row is broken off as shown in FIG. 9B or 9D. It indicates that the display cell row at the bottom is open. So in this case add 1 to the number of trips. For example, taking the display pattern shown in FIG. 9A as an example, the light-emitting cell row at the top is captured (YES at step S7), and the length of the light-emitting cell row is not longer than that of the plasma display 20 312 / Invention Specification (Supplement) ) / 92-10 / 921193 84 1225233 The horizontal length of the display area of the display panel 30 is short (“Non-existence” in step S9) In addition, the light-emitting cell array at the bottom end is extracted (YES in step S 1 4), The long line S1 is a crystal of a group of people + the end step light C is short and the end ο 3 is to show that it is in the state of the current situation and shows the situation. This kind of circuit is caused by electric indication on this pole and this pole. Display} No slurry tj parallel current ratio than t cell ^ crystal figure number of broken lines ^-0 S 9B shown ο 11 Figures are taken as an example to show the end of the transformed cell crystal light In the water) ^ ¾ ~ I ratio is absent and not long Γ is the column 9 cell S crystal flash step i (the short step of the S zone of the long flat water 7 is shown in ο (3 the board is taken for this and The display shows the light step "but short." The length is flat in the S area of the water. 14 Step display i ο (3 Take the pick-up board and display the cell display crystal to display the water photoelectricity ratio. In the presence of the cell, the long top surface of the J-crystal suddenly appears on the cell. The short bottom 10 is taken on the display 3, and the crystal box shows this display. The broken end of the road end shows the following conditions. This shows the cause of this manifestation. The bottom is at the number tt? · Ιa where the number of roads is broken. The 11 road is broken, and the situation of CO is not changed but it is changed. The ratio of the plasma photoelectricity ratio is longer than that of the column. The cell case is shown in the light case, but the A shows it is C 7 9CS. The step is 9 S. Step: Take the end η 3 of the light emitted by the column cell crystal, and the bottom plate is on the surface. The column cell display shows that the end of the second step is suddenly displayed in the present area where it is stored as a long-end flat-topped water column}. The three types of road boards and this section are extremely displayed due to electric display. In the following case, this kind of degree and the figure are changed to PΠ by the two ends of the non-listed cell crystal light. Several examples are shown in the digital display of the case where the case is broken. 7 is a miscellaneous one for S 4 —_. . Step S is in step ο Take 3 pick-up plates and display the photoelectron emission ratio of the cell display crystalline plasma. The end of the cell is long and the bottom is listed in the cell. Extra crystal light is issued. But 312 / Invention Specification (Supplement) / 92-10 / 921193 84 21 1225233 The horizontal length of the display area is short (step S16 is "exist"). Therefore, it is found that the display cell rows at the top end and the bottom end are all open. In this case, the number of count interruptions in the processing shown in Fig. 10 becomes two. In the display inspection method of the display panel according to the specific embodiment, only the detection patterns of the display cell rows that are brightly positioned at the top and bottom of the display area are used as described above. The results ensure a gradient difference between these display cell rows and the additional display intervals adjacent to these display cell rows. Therefore, it is possible to reliably detect whether there is an electrode disconnection in the display cell array at the top and bottom ends. In the foregoing specific embodiments, the case of checking a single display cell array at the top and bottom is explained. However, this specific embodiment can also be applied to the case of simultaneously checking a plurality of display unit cell rows (for example, two rows display unit cell rows) at the top or bottom. In this case, the number of light emitting display cell rows or the number of open circuit cell rows may be determined based on the allowable line thickness. (Second Specific Embodiment) As shown in FIG. 4, a plasma display panel 30 is set to the inspector main body 1. As a result, one unit cell is displayed on the left end and one unit cell is displayed on the right end, that is, the display area of the plasma display panel 30 displays a total of two unit cell rows to emit light. Insertion in a middle region between the rows of these display cells causes the display to be black (i.e., to keep it from emitting light). Display such a pattern. Each pixel row includes three adjacent display cell rows, that is, R, G, and B display cell rows. 11A, 11B, 11C, and 11D show various light emitting patterns depending on whether there is an open circuit. Fig. 11A shows that there is no open circuit. At the left end and the right end, there is a light emitting pattern corresponding to one pixel row with a bright line consisting of three display cell rows (R, G, and B). In this case, a total of six display cells emit light at the left and right ends without missing parts. The luminous pattern shown in Figure 1A is the detection pattern of the open circuit 22 31W invention specification (Supplement) / 92-10 / 921193 84 1225233. Fig. 1 1B shows that the display cell row (R) at the right end has one path, and the display cell row (R) containing the bright line at the right end is cut off at the center. Fig. 11C shows a light pattern in which the display cell row (R) at the right end has an open circuit, and the display cell row (R) containing a bright line at the right end does not emit light at all. Fig. 1 1 D shows a light-emitting case in which the cell line is broken at the right end. Taking Figure 1D as an example, the part of the display cell row (R) including the bright line at the right end does not emit light, and the display cell row (R) is divided into an upper part and a lower part. Figure 12 is a flowchart showing the processing performed during the inspection. The positions shown in FIG. 12 are based on the control performed by the control device 4. At step S 2 1 in FIG. 12, the driving pulse wave is supplied from the inspector main body 1 to the display panel 30, so that the aforementioned detection pattern is displayed. As a result, the plasma display surface 30 is illuminated, for example, with the light emitting patterns shown in FIGS. 1A to 1D. In addition, the number of ways value is initially zero. Then, a luminescent camera image is captured by the CCD camera 2 (step S22). The image data of the captured image is input from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 2 3). The three colors of R, G and B are transmitted separately. Then, the image data stored in the image processing memory 3 b is set as the image processing area in the enclosed area of the pixel row (three display cell row) at the left end of the electric display panel 30 (step S 2 4). This area is set to include the display unit cell located in the display area next to the aforementioned display pixel row, and including the light (that is, the display unit cell in the black display area) and the outer portion of the display area (that is, the display unit cell). The left side of the row) shows the unit cell. The image data in the setting area is then stored in the image processing theme memory 3c (step S25). Then based on the image data 312 / Invention Manual (Supplement) / 92-10 / 921193 84 stored in the image processing theme memory 3 c 1225233 A fetching process is performed by the display cell row at the left end (step S 2 6). It is then determined that the light-emitting E located at the left end is captured in the capturing process of the light-emitting cell row. Below, the process proceeds to step S28. If the determination is negative, the process proceeds to step S 3 0 (step S 2 7). At step S 28, the length of (R) and the water in the display area of the display panel 30 are captured to determine whether there is a row of light emitting cells (R) whose vertical length is short. The vertical length of the display area of panel 30 is short. If it is determined that (R) is present, the process proceeds to step S30. If it is determined that there is no (R), the process proceeds to step S 3 1 (step S 2 9). The number of disconnection of the row electrode is increased by 1, and the process proceeds to step S31. All three rows form the left-side unit cell row (R, G, and B), and it is determined that steps S24 to S30 are completed. In the case of a negative determination, the process returns to the step of repeating the process of step S 2 4 for the next display cell row (for example, G). If the determination at step S 3 1 is affirmative, then S 3 2. After the processes of displaying the unit cell to S30 for each color (R, G, and B) have been performed, the process proceeds to step S32. The image data stored in the image processing memory 3b is located in the pixel row at the right end of the plasma display panel 30 (the three I regions are used as an image processing region (step S 3 2). This region is close to the foregoing display pixel row and is located in the display region. The display data of the display light (that is, the display cell in the black display area) and the image data of the display crystal area (that is, the right part of the display cell row) are stored in the image processing theme memory 312 / Invention Manual (Supplement) / 92-10 / 921193 84 6 Where is the cell line (R)? If the cell line (R) is affirmative, compare the flat length of the light-emitting cell line before processing. The degree is proportional to the plasma Displaying such a light-emitting cell This type of light-emitting cell is processed in step S30 to S31. Whether the processing of displaying the pixel row has been performed in step S 2 4 and the processing in each step and subsequent steps proceeds to step line and executes step S 2 (4) In the material, the unit cell is subsequently set to i), including the unit cell that is set to include the position, and the part of the cell outside the display area. Then, preset 3c (step S33). 24 1225233 Subsequently, based on the image data stored in the image processing theme memory 3c, the fetching process of the light-emitting cell row (R) of the display cell row at the right end is performed (step S 3 4). It is then determined whether or not the light-emitting cell row (R) located at the right end is captured in the capturing process of the light-emitting cell row. If the determination is affirmative, the process proceeds to step S36. If the determination is negative, the process proceeds to step S 3 8 (step S 3 5). At step S 36, the length of the obtained light-emitting cell row (R) is compared with the vertical length of the display area of the plasma display panel 30. It is then determined whether there is a light emitting cell row (R) whose vertical length is shorter than the vertical length of the plasma display panel 30 display area. If it is determined that such a light-emitting cell row (R) 'is present, the process proceeds to step S38. If it is determined that there is no such light-emitting cell row (R), the process proceeds to step S39 (step S37). In step S38, the number of disconnections of the row electrode is increased by 1, and the process proceeds to step S39. At step S 39, all three display cell rows (R, G, and B) of the pixel row at the right end are formed, and it is determined whether the processes of steps S 3 2 to S 3 8 have been completed. If the determination is negative, the process returns to step S32, where step S 3 2 and subsequent steps are repeated for the next displayed cell row (for example, G). If the determination at step S 39 is affirmative, the process is completed. After the display cell rows of each color (R, G, and B) have performed the processing of steps S 2 to S 30, the processing is completed. As described above, the light-emitting cell row at the left end is captured in the process shown in FIG. 12 (step S 2 6). If the light-emitting cell row has not been captured (No in step S 2 7), the number of disconnections is increased by 1 (step S 3 0). The case where the light-emitting cell row is not captured is equivalent to the case where the light-emitting cell row (here, the light-emitting cell row on the right end) shown in FIG. 11C is not illuminated. Indicates that the left-side light emitting cell is disconnected. Therefore, in this case, the number of open circuits is increased by one. If the captured light-emitting cell 25 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 is longer than the vertical rectangular S 2 9 of the display area of the plasma display panel 30, it is "exist") , Then the case where the length of the light-emitting cell row plus 1 (step S 3 0) is shorter than the vertical length of the display area is 1 1 Β and the light-emitting cell row shown in FIG. In the case of being broken in the middle, it indicates that the left-side light-emitting cell traveler therefore adds 1 to the number of disconnections in this case. In addition, in the processing shown in FIG. 12, one light-emitting step S 3 4 is taken at the right end. ). If the light-emitting cell row has not been captured (No in step S 3 5), the number of channels is increased by 1 (step S 3 8). When the light-emitting cell row is not captured The light-emitting cell row on the right is not lit. This is shown in the right cell line is open. Therefore, in this case, the length of the light-emitting cell row obtained by adding 1 to the number of disconnections is shorter than the display degree of the plasma display panel 30 (step S 37 is "existent"), then 1 is added to the number of disconnections (step is captured The length of the light-emitting cell row is shorter than the vertical length of the display area when the light-emitting cell at the right end is broken in the middle. It indicates that the light-emitting cell row is broken. Therefore, in this case, the number of broken cells is increased by 1 ^ The luminous pattern shown in 1 1 A is taken as an example, and all the whole cell rows at the left end are captured (YES in step S 2 7), and the luminous cell is shorter than the vertical length of the display area 30 of the plasma display panel (step S 2 9 in "). In addition, all three light-emitting cell rows at the right end are exposed (S 3 5 is Yes), and the length of the light-emitting cell rows is not shorter than the vertical length of the plasma display panel area (step S37 is" not present " "). Therefore, in the left and right display cell rows, no row electrode breaks were seen in the display cell row. The number of breaks in the process count shown in FIG. 12 becomes zero. Take the luminous pattern shown in Figure 11B as an example, all three at the left end 312 / Invention Specification (Supplements) / 92-10 / 92119384 [Short (step. Being excavated is equivalent to the L cell line in Figure L) has an open circuit. ^ Cell line (step, it is a fairly light emitting for the fault condition. If the captured area is vertically long step S 3 8) 〇 Case is the length of the three light emitting line at the right end of the phase is not "not stored i take (step 30 shows Therefore, the light-emitting cell 26 1225233 rows are all captured (YES in step S 2 7), and the length of the light-emitting cell row is not shorter than the vertical length of the plasma display panel 30 display area (step S 2 9 Is "not present". In addition, all three light-emitting cell rows at the right end are captured (YES in step S 35), but the length of the light-emitting cell row (R) is longer than that of the plasma display panel 30. The vertical length of the display area is short ("Existence" in step S37). Therefore, in this case, it is found that the left end shows that the cell row has no open circuit, but the right end shows that the cell row (R) has one electrode open circuit. Therefore, the processing count shown in Fig. 12 The number of open circuits becomes 1. For example, taking the light-emitting pattern shown in FIG. 1 1C as an example, all three light-emitting cell rows at the left end are captured (YES in step S 2 7), and the length of the light-emitting cell row is not more than that of electricity. The display panel 30 has a short vertical length of the display area (step S 2 9 is "not present In addition, the light-emitting cell row (R) in the right-side light-emitting cell row has not been captured (No in step S 35). As for the other two light-emitting cell rows (G and B) at the right end, step The judgment of S 3 5 is yes, and the judgment of step S 3 7 is "not present". Therefore, in this case, it is found that there is no open circuit in the display cell row at the left end, but there is a row electrode in the display cell row (R) at the right end. Open circuit. Therefore, the number of open circuits in the process count shown in FIG. 12 becomes 1. Taking the light emitting pattern shown in FIG. 1 1 D as an example, all three light emitting cell rows at the left end are captured (YES in step S 2 7). And the length of the light-emitting cell row is not shorter than the vertical length of the display area of the plasma display panel 30 (step S29 is "not present"). In addition, all three light-emitting cell rows at the right end are captured (YES in step S 35). However, the length of the light-emitting cell row (R) is shorter than the vertical length of the display area of the plasma display panel 30 (step S 37 is "exist"). Therefore, in this case, it is found that the display cell row at the left end is not broken. , But the right end shows that the unit cell row (R) has a row. The electrode is open. Therefore, the number of interrupts in the process count shown in FIG. 12 becomes one. In the display inspection method of the display panel according to the present invention, only the detection patterns of the display cell rows at the left and right ends of the display area are illuminated at 27 312 / Invention Specification (Supplement) / 92 · 10/921193 84 1225233. Before use. The results can ensure gradient differences between the rows of display cells and the extra display cell intervals adjacent to the displays. Therefore, it is possible to reliably display whether the row electrode is open at the end and the right side of the cell. In the foregoing specific embodiments, an example has been described of a plurality of display cell rows (three rows of display cell rows) formed at the left or right pixel row. However, this specific embodiment can also be applied to the case where, for example, a monochrome display is checked and a cell line is displayed on one of the left or right ends. (Third Specific Embodiment) As shown in FIG. 13, the actuators 1 1 a and 1 1 b connected to the electrodes of the plasma display panel 31, the X sustain driver 1 2 a and 1 2 b, and the Y-dimensional device 13 a And 13b are provided in the inspector main body 1. As shown in FIG. 13, the plasma display panel 31 is cut into the upper region and the electrodes of each region are separated from each other. As shown in FIG. 13, the row electrodes D1 r, Dlb, D2r, D2g, D2b,... Dmr, Dmg, and Dmb, the column electrodes X i and the column electrodes Y 1 to Yi are disposed in the upper area of the plasma display panel. The power to D m b is connected to the address driver 1 1 a. The column electrodes X 1 to X i to X sustain the driver 12 a. The column electrodes Y1 to Y i are connected to the Y actuator 1 3 a. Row electrodes DAlr, DAlg, DAlb, DA2r, DA2g, DA2b,. . . DAmg and DAmb, the column electrodes Xi + 1 to Xn, and the column electrodes Yi + 1 to are placed in the lower area of the electropolymer display panel 31. The row electrodes D A 1 r to D A m b are address drivers 1 1 b. The column electrodes X i + 1 to X n are connected to the X-dimensional device 1 2 b. The column electrodes Y i + 1 to Υ η are connected to the Y sustain driver as shown in Figure 13 and the row electrodes are designated in the order of quotation 312 / Invention Specification (Supplement) / 92-10 / 921193 84 The cell line is located at one of the left end of the inspection panel to address the driving area under the driver 'Dig, XI to the pole D 1 r series link to maintain the driver DA mr, 7 η set to link to the driver 1 3b ° Repeat off 28 1225233 Link R cell , G cell and B cell. In the display area 41, the R cell, the G cell, and the B cell are formed at intersections of the row electrodes and the column electrodes X 1 to X η and the column electrodes Υ1 to Υ η, respectively. As shown in FIG. 13, the R cell, G cell, and B cell system successively disposed are treated as a group, and the group forms a pixel. The additional display area area 4 7 is arranged outside the display area 41. As shown in FIG. 13, the column electrodes X1 to X η and the column electrodes Υ1 to Υ η are arranged in a staggered comb shape and do not protrude from opposite sides of each other. One of the column electrodes X1 to X η and one of the column electrodes Υ 1 to Υ η are assigned to a display cell column. Inside a unit cell, the column electrodes X1 to X η and the column electrodes Υ1 to Υ η are arranged in parallel and therefore face each other. In the middle part of the display area 41, the row electrodes D 1 r to D m b and the row electrodes D A 1 r to D A m b are longitudinally separated. The arrangement of the row electrodes will be further described later. The procedure for inspecting the short circuit between the electrodes of the plasma display panel 31 using the inspection device 100 will now be described. As shown in FIG. 4, the plasma display panel 31 is set to the inspector main body 1 during inspection, so that all of the upper and lower areas of the display area 41 of the plasma display panel 31 emit monochromatic light (for example, R color). At this time, the whole area of the other area is displayed in black (that is, it is not made to emit light). Figures 1 4 A, 1 4 B, and 1 4 C show the luminous patterns according to whether there is a short circuit between the row electrodes. FIG. 14A shows the case where there is no short circuit between the row electrodes, and the entire area 42 above the display area 41 emits monochromatic light. At this time, the lower region 43 has no light-emitting unit cell. The light emitting pattern shown in Fig. 1 4A is the kind of inspection pattern for inspecting shorts between row electrodes. Figure 1 4B shows the light-emitting pattern in the case of a short circuit between row electrodes. Figure 1 4 C is a schematic diagram showing a short circuit between the row electrodes. The short circuit between the row electrode set 1 0 1 in the upper zone and the row electrode set 1 2 2 in the lower zone 1 0 3 display 29 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 is shown in Figure 1 4C. If there is such a short-circuit between the row electrodes, the row electrode provided in the upper region 4 2 and the row electrode provided in the lower region 43 are connected to each other through the short-circuit portion 1 0 3. The unit cell of the first line (bright line) 104 emits light, and the bright line 104 is connected along the row electrode of the row electrode group 102 to the row electrode of the row electrode group 101. As a result, short circuits between the row electrodes can be checked. The luminescent pattern of such a plasma display panel 31 is captured by a CCD camera 2. The image processing device 3 analyzes the light emission pattern based on the image data supplied from the CCD camera 2. Fig. 15 is a flowchart showing the processing performed during the inspection. The processing shown in FIG. 15 is executed based on the control performed by the control device 4. At step S 41 in FIG. 15, a driving pulse wave is supplied from the inspector body 1 to the plasma display panel 31 to display the aforementioned detection pattern. As a result, for example, in the light emitting pattern shown in FIG. 14A or FIG. 14B, the plasma display panel 31 is turned on. The flag value indicating whether there is a short-circuit position is initialized to a value indicating "no short-circuit position". Then, a luminescent camera image is captured by the CCD camera 2 (step S42). The captured image is transmitted from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 4 3). Three-color R, G, and B data are transferred to separate memory areas. Then, a memory area is set to store the luminescent color (R, G, or B) as the subject of image processing, that is, the data that becomes the subject of image processing is set (step S 4 4). Then, based on the image data stored in the image processing memory 3b, an approximate straight line that approximates the middle bisector is obtained (step S 4 5). Subsequently, in the image data stored in the image processing memory 3b, the entire upper or lower area that has not changed into light emission is set as the image processing area (step S46). The setting of the image processing area here is based on the approximate straight line obtained in step S 4 5 processing 30 312 / Invention Specification (Supplement) / 92-10 / 921193 84 1225233 as a reference point. For example, if the inspection pattern is the whole area of the lower area 43 and the central bisector area included in FIG. 14A, the image processing area is performed in step S46. Then, based on the image processing theme memory 3c, the capture processing of the luminous points or luminous lines in the image processing area is performed. Here, the extraction of the luminous points or luminous lines is performed in step S 4 4. For example, taking the luminous pattern shown in FIG. 14B as an example, it is captured by the bright line 104. The luminous patterns or luminous lines shown in Fig. 1 4A have not been captured. Subsequently, in step S 4 8, it is decided to use the processing in step S 4 7 to emit light points or lines. If the determination is positive, the process proceeds. If the determination is negative, the process proceeds to step S50. There is a short circuit between the 3 rows of electrodes, a flag indicating whether there is a short circuit. Processing then proceeds from step S 51. On the other hand, at step S50, there is a gap between the row electrodes, and the flag value indicates whether there is a change in the relevant emission color. The process then proceeds from step S 50 to step S 5 1 at step S 5 1 to determine at step S 4 1 and subsequent steps as to whether all the emission colors of R, G, and B have ended. The processing returns to step S 41 and the processing proceeds to the next luminous color. If the determination is affirmative, the processing shown in FIG. 15 is ended. In the process, the individual emission colors (R, G, and B) have been processed.
就R、G及B各色而言，檢查是否有行電 藉前文說明之處理進行。對發光色R、G及B 312/發明說明書(補件)/92-10/921193 84 示圖案，則包 被設定作為影 之影像資料， (步驟 S 4 7 )。 定之發光色執 光點或發光線 為例，發光點 是否已經擷取 至步驟 S 4 9。 「驟S 4 9，判定 標值，就相關 S49前進至步 短路判定為不 短路位置並未 驟進行的處理 F判定為否定， (例如G色）。 鄉S41至 S50 ，結束全部處 極間之短路係 各色而言，係 31 1225233 基於旗標判定行電極間是否短路。 於根據本具體實施例之顯示面板之顯示檢查方法，只有 經由於縱向分割顯示面板形成的上區及下區其中之一才讓 其發光，於上區及下區之另一區的發光晶胞經擷取。因此 可確定偵測得行電極間之短路。 前述具體實施例中，顯示一範例，其中檢查有三發光色 晶胞排列之彩色顯示面板。但根據本發明之顯示面板之顯 示檢查方法也應用於檢查具有單色晶胞排列之單色顯示面 板。此種情況下只讓其中一區的晶胞發光，進行檢查另一 區是否有發光晶胞。 (第四具體實施例） 現在說明使用檢查裝置1 0 0進行檢查電漿顯示面板 3 0 之列電極間是否短路之程序。被平分為上區及下區之電漿 顯示面板3 1之檢查也可以相同方式執行。 如圖4所示，電漿顯示面板3 0係設定於檢查器主體1。 讓具有鋸齒形格狀形式之發光圖案顯示於電漿顯示面板 3 0之顯示區。圖1 6 A顯示列電極間無短路之發光圖案。圖 1 6 A中，標示為「R」、「G」及「B」之各區分別表示紅、綠 及藍發光晶胞。其它區表示非發光晶胞。圖1 6 A所示圖案 即為偵測得列電極間短路之該種偵測圖案。電漿顯示面板 3 0中，R、G及B色顯示晶胞排列於列方向之R、G及B色 顯示晶胞如前文說明形成一個像素。因此如圖1 6 B所示， 顯示區3 0 a全面顯示白黑鋸齒格形圖案。 圖1 7 A至1 7 C顯示當列電極間有短路時之發光圖案。圖 1 7 A顯示顯示區3 0 a之列電極出現黑線1 1 1 (暗線）之範例。 32 312/發明說明書(補件)/92-10/92119384 1225233 如圖 1 7 B所示，包括原先應發光之顯示晶胞之二條顯示 線，於黑線1 1 1部分未發光。 圖1 7 C為略圖顯示列電極間之短路。如圖1 7 C所示，列 電極Y i與列電極X i + 1間短路，因而透過短路部分1 1 2分 別關聯毗鄰顯示晶胞。若出現此種由短路部分1 1 2引發的 短路，則含括於二線且對應於彼此短路之列電極之顯示晶 胞未發光。結果導致有黑線之發光圖案，如圖1 7 A及1 7 B 所示。 圖1 8為流程圖顯示檢查時進行的處理。圖1 8所示檢查 係基於控制裝置4進行之控制執行。 於圖1 8步驟S 6 1，由檢查器主體1供給驅動脈波給電漿 顯示面板3 0，俾顯示圖1 6所示檢查圖案。結果電漿顯示 面板3 0例如係以圖1 6 A及圖1 6 B或圖1 7 A及1 7 B所示發光 圖案而被點亮。隨後藉CCD攝影機2拍攝發光圖案影像（步 驟S 6 2 )。拍攝之影像之影像資料由CCD攝影機2傳輸至影 像處理裝置3之影像處理記憶體3 b (步驟S 6 3 )。此處R、G 及B三色資料係分開傳輸。 接著於儲存於影像處理記憶體 3 b之影像資料中，電漿 顯示面板3 0之顯示區3 0 a全部被設定為影像顯示區，如此 設定之影像顯示區之影像資料係儲存於影像處理主題記憶 體3 c (步驟S 6 4 )。 隨後，基於儲存於影像處理主題記憶體3 c之影像資料， 執行擷取顯示區3 0 a之黑線之處理（步驟S 6 5 )。隨後決定 步驟S 6 5進行黑線擷取處理時，黑線是否已經由顯示區3 0 a 被擷取（步驟 S 6 6 )。若判定為肯定，則執行列電極間有短 33 312/發明說明書(補件)/92-10/92119384 1225233 路之顯示（步驟 S 6 7 )。若判定為否定，則執行列電極 短路之顯示（步驟S 6 8 )。於各情況下結束圖1 8之處3 若於步驟S65，發光圖案為圖16A及圖16B所示該 測圖案，則未出現黑線。由於此種情況下，步驟S 6 6 定導致否定，故判定列電極間並無短路。以圖1 7 A及靥 所示發光圖案為例，擷取黑線。因此種情況下，步驟 之判定結果為肯定，故判定列電極間有短路。 如此於圖1 8所示處理，讓電漿顯示面板3 0顯示鋸 狀檢查圖案。此種情況下若列電極間有短路，則黑線 於對應線上。因此本具體實施例中，執行黑線擷取處ϊ 驟S 6 5 )。若擷取黑線，則判定列電極間有短路。若未 黑線，則判定列電極間並無短路（步驟S 6 6、S 6 8 )。結 確定偵測得列電極間是否短路。 前述具體實施例中已經說明具有 R、G及B三發光 彩色顯示面板。但於單色顯示面板也可採用單色鋸齒 圖案作為檢查圖案。 第一至第四具體實施例舉例說明電漿顯示面板 查。根據本發明之顯示面板之顯示檢查方法也可寬廣 至其它顯示面板。 可未悖離本發明之精髓或必要特性而以其它形式 實施本發明。因此就各方面而言，此等具體實施例須 為舉例說明而非限制性，本發明之範圍係由隨附之申 利範圍而非由前文說明指示，因此落入申請專利範圍 義及相當範圍之全部變化意圖皆涵蓋於本發明之範圍 【圖式簡單說明】 312/發明說明書(補件)/92-10/921193 84 間無 f 〇 種偵 之判 I 17B S66 齒格 出現 I (步 擷取 果可 色之 格狀 之檢 應用 具體 考慮 請專 之定 34 1225233 圖1A及1B為略圖顯示習知檢查方法，其中圖1A為略 圖顯示中間部分之斷路，以及圖1 Β為略圖顯示端部斷路； 圖2Α及2Β為略圖顯示習知檢查方法，其中圖2Α為略 圖顯示中間部分之斷路，以及圖2Β為略圖顯示端部斷路； 圖3為略圖顯示習知檢查方法； 圖4為方塊圖顯示用於電漿顯示面板之顯示檢查方法之 檢查裝置組態； 圖5為略圖顯示欲檢查之電漿顯示面板之電極配置； 圖6為略圖顯示一欄位之組態； 圖7為流程圖顯示驅動脈波； 圖8為略圖顯示電漿顯示面板被平分為上區及下區之範 例； 圖9Α、9Β、9C及9D為略圖顯示依據是否有斷路之各種 發光圖案，其中圖9Α為略圖顯示並無斷路之情況，圖9Β 為略圖顯示底端顯示晶胞列有斷路之情況，圖9C為略圖顯 示於頂端以及底端個別之顯示晶胞列有斷路之情況，以及 圖 9 D為略圖顯示於頂端以及底端個別之顯示晶胞列有斷 路之情況； 圖1 0為流程圖顯示檢查時進行的處理； 圖11Α、11Β、11C及11D為略圖顯示依據是否有斷路而 定之各種發光圖案，其中圖11Α為略圖顯示無斷路之情 況，以及圖1 1 Β、1 1 C及1 1 D為略圖顯示右端顯示晶胞列有 斷路之情況； 圖1 2為流程圖顯示檢查時進行的處理； 圖1 3為略圖顯示欲檢查之電漿顯示面板之電極配置； 35 312/發明說明書(補件)/92-10/921193 84 1225233 圖1 4 A、1 4 B及1 4 C為略圖顯示依據行電極間是否有短 路而定之發光圖案，其中圖14A為略圖顯示行電極間無短 路之情況，圖1 4 B為略圖顯示行電極間有短路之情況，以 及圖1 4 C為略圖顯示行電極間有短路之情況； 圖1 5為流程圖顯示檢查時進行的處理； 圖 1 6 A及 1 6 B為略圖顯示列電極間並無短路之發光圖 案，其中圖16A為略圖顯示各晶胞是否發光以及圖16B為 略圖顯不鑛齒格狀圖案； 圖1 7 A、1 7 B及 1 7 C為略圖顯示當列電極間有短路情況 之發光圖案，其中圖17A為略圖顯示全顯示區，圖17B為 略圖顯示圖1 7 A之部分放大視圖，以及圖1 7 C為略圖顯示 列電極間之短路部分；以及 圖1 8為略圖顯示行電極間有短路之情況。 (元件符號說明） 1 檢查器主體- 2 CCD攝影機 3 影像處理裝置 3a 影像處理區段 3b 影像處理記憶體 3c 影像處理主題記憶體 4 控制裝置 11 定址驅動器 1 1 a、1 1 b 定址驅動器 12 X維持驅動器 1 2 a、1 2 b X維持驅動器 36 312/發明說明書(補件)/92-10/921193 84 1225233 13 Y 維 持 驅 動 器 13a、 13b Y維持驅動 30 電 漿 顯 示 面 板 30a 顯 示 區 30b 額 外 顯 示 區 區域 3 1 電 漿 顯 示 面 板 41 顯 示 區 42 上 區 43 下 區 100 檢 查 裝 置 10 1 行 電 極 組 1 02 行 電 極 組 1 03 短 路 部 1 04 亮 線 111 黑 線 112 短 路 部For each of the R, G, and B colors, check whether there is a line of credit. For the emission colors R, G, and B 312 / Invention Specification (Supplement) / 92-10 / 921193 84, the package is set as the image data of the shadow, (step S 4 7). For example, determine the light emitting point or light emitting line, and if the light emitting point has been captured, go to step S 49. "Step S 4 9, determine the target value, and proceed to step S49 to step short-circuit. It is determined that the short-circuit is not short-circuited. The process F is determined to be negative (for example, G color). Townships S41 to S50, ending all the inter-pole In terms of colors, the short circuit is 31 1225233 based on the flag to determine whether there is a short circuit between the row electrodes. In the display inspection method of the display panel according to this embodiment, only one of the upper and lower regions formed by vertically dividing the display panel is used. Only let it emit light, and the light-emitting cell in the other area of the upper area and the lower area is captured. Therefore, the short circuit between the row electrodes can be determined. In the foregoing specific embodiment, an example is shown in which three light-emitting colors are checked. A color display panel with a unit cell arrangement. However, the display inspection method of a display panel according to the present invention can also be used to inspect a monochrome display panel with a single unit cell arrangement. In this case, only the unit cells in one region are illuminated. Check whether there is a light-emitting cell in another area. (Fourth embodiment) Now, it will be described whether a short circuit between the electrodes in the column of the plasma display panel 30 is inspected using the inspection device 100. Procedure. The inspection of the plasma display panel 31 divided into upper and lower areas can also be performed in the same way. As shown in FIG. 4, the plasma display panel 30 is set to the inspector main body 1. It has a zigzag grid. The light-emitting pattern in the form of a shape is displayed in the display area of the plasma display panel 30. Fig. 16 A shows a light-emitting pattern without short circuit between the row electrodes. In Fig. 16 A, it is marked as "R", "G", and "B" Each region represents a red, green, and blue light-emitting cell, respectively. The other regions represent non-luminescent cells. The pattern shown in Figure 16A is the type of detection pattern for detecting shorts between the column electrodes. In the plasma display panel 30, the R, G, and B color display cells are arranged in the column direction. The R, G, and B color display cells form a pixel as described above. Therefore, as shown in FIG. 16B, the display area 30a fully displays the white and black zigzag pattern. Figures 17A to 17C show the light-emitting patterns when there is a short circuit between the column electrodes. FIG. 17A shows an example in which black lines 1 1 1 (dark lines) appear on the electrodes in the column of the display area 30 a. 32 312 / Explanation of the Invention (Supplement) / 92-10 / 92119384 1225233 As shown in Figure 1 7B, the two display lines including the display cell that should have been lighted originally, did not emit light on the black line 1 1 1. FIG. 17C is a schematic diagram showing a short circuit between column electrodes. As shown in FIG. 17C, the column electrode Yi and the column electrode Xi + 1 are short-circuited, and thus the short-circuited portions 1 12 are associated with adjacent display cells, respectively. If such a short-circuit caused by the short-circuit portion 1 12 occurs, the display cells including the second-line and corresponding row electrodes of the short-circuit with each other do not emit light. As a result, a light-emitting pattern with black lines is shown in Figs. 17A and 17B. FIG. 18 is a flowchart showing the processing performed during the inspection. The inspection shown in FIG. 18 is performed based on the control performed by the control device 4. At step S 6 1 in FIG. 18, the driving pulse wave is supplied from the inspector main body 1 to the plasma display panel 30, and the inspection pattern shown in FIG. 16 is displayed. As a result, the plasma display panel 30 is illuminated, for example, with the light emitting patterns shown in FIGS. 16A and 16B or FIGS. 7A and 17B. Then, the CCD camera 2 is used to capture a light-emitting pattern image (step S 6 2). The image data of the captured image is transmitted from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 6 3). The three-color data of R, G and B are transmitted separately here. Then, among the image data stored in the image processing memory 3 b, the display area 30 a of the plasma display panel 30 is all set as the image display area. The image data of the image display area thus set is stored in the image processing theme. Memory 3 c (step S 6 4). Subsequently, based on the image data stored in the image processing theme memory 3c, a process of acquiring a black line in the display area 30a is performed (step S65). Subsequently, it is determined whether or not the black line has been captured by the display area 30 a during the black line capturing process in step S 6 5 (step S 6 6). If the determination is affirmative, there is a short 33 312 / invention specification (supplement) / 92-10 / 92119384 1225233 between the row electrodes (step S 6 7). If the determination is negative, the display of the column electrode short circuit is performed (step S 6 8). In each case, the points in FIG. 18 are finished. 3 In step S65, the light emission pattern is the test pattern shown in FIGS. 16A and 16B, and no black line appears. In this case, a negative result is obtained in step S 6 6, so it is determined that there is no short circuit between the column electrodes. Take the luminous patterns shown in Fig. 17 A and 靥 as examples to capture black lines. Therefore, in this case, the determination result of the step is positive, so it is determined that there is a short circuit between the column electrodes. In this way, as shown in FIG. 18, the plasma display panel 30 is caused to display a saw-shaped inspection pattern. In this case, if there is a short circuit between the column electrodes, the black line is on the corresponding line. Therefore, in this specific embodiment, the black line capturing step S 6 5 is performed. If black lines are captured, it is determined that there is a short circuit between the column electrodes. If there is no black line, it is determined that there is no short circuit between the column electrodes (steps S 6 6 and S 6 8). Junction Determines whether shorts are detected between the column electrodes. The foregoing specific embodiments have been described as having R, G, and B three-emitting color display panels. However, a monochrome sawtooth pattern can also be used as a check pattern on a monochrome display panel. The first to fourth specific embodiments illustrate the plasma display panel. The display inspection method of the display panel according to the present invention can also be extended to other display panels. The present invention may be embodied in other forms without departing from the spirit or essential characteristics of the invention. Therefore, in terms of all aspects, these specific embodiments must be illustrative and not restrictive. The scope of the present invention is indicated by the scope of the appended claims instead of the foregoing description, and therefore falls within the scope and scope of patent application. All changes are intended to be within the scope of the present invention. [Simplified illustration of the drawings] 312 / Invention specification (Supplement) / 92-10 / 921193 84 No f ○ Judgment of detection I 17B S66 Tooth appearance I (step For specific consideration of the application of fruit-like grids, please refer to the specific 34 1225233. Figures 1A and 1B are schematic diagrams showing conventional inspection methods, of which Figure 1A is a schematic diagram showing the middle part of the open circuit, and Figure 1B is a schematic diagram showing the end Open circuit; Figures 2A and 2B are schematic diagrams showing conventional inspection methods, of which Figure 2A is a schematic diagram showing open circuit in the middle section, and Figure 2B is a schematic diagram showing open circuit at the end; Figure 3 is a schematic diagram showing a conventional inspection method; and Figure 4 is a block diagram. Shows the configuration of the inspection device used for the display inspection method of the plasma display panel; Figure 5 is a schematic diagram showing the electrode configuration of the plasma display panel to be inspected; Figure 6 is a diagram showing a column configuration; 7 is a flowchart showing driving pulses; FIG. 8 is an example showing a plasma display panel being divided into an upper area and a lower area; FIGS. 9A, 9B, 9C, and 9D are schematic views showing various light-emitting patterns based on whether there is an open circuit. FIG. 9A is a schematic view showing a case where there is no open circuit, FIG. 9B is a schematic view showing a case where a cell line is open at the bottom, and FIG. 9C is a schematic view showing a case where the cell line is open at the top and the bottom, and 9 D is a schematic diagram showing the case where there is an open circuit at the top and bottom of the individual display cell rows; Figure 10 is a flowchart showing the processing performed during inspection; Figures 11A, 11B, 11C, and 11D are schematic diagrams showing whether there is an open circuit. Various luminous patterns are determined. Among them, FIG. 11A is a schematic diagram showing a case where there is no open circuit, and FIGS. 1 Β, 1 1 C, and 1 1 D are schematic diagrams showing a case where the cell row is open at the right end; and FIG. 12 is a flowchart showing inspection. Figure 1 3 shows the electrode configuration of the plasma display panel to be inspected; 35 312 / Invention Manual (Supplement) / 92-10 / 921193 84 1225233 Figure 1 4 A, 1 4 B, and 1 4 C is a thumbnail The luminous pattern depends on whether there is a short circuit between the row electrodes. Among them, FIG. 14A is a schematic diagram showing the absence of a short circuit between the row electrodes, FIG. 14B is a diagram showing a situation where there is a short circuit between the row electrodes, and FIG. 14C is a diagram showing a row electrode. There is a short circuit between them; Figure 15 is a flowchart showing the processing performed during the inspection; Figures 16 A and 16 B are light-emitting patterns showing that there is no short-circuit between the column electrodes, and Figure 16A is a schematic showing whether each cell is Luminescence and FIG. 16B are schematic diagrams showing a non-mineral tooth-like pattern; FIGS. 17 A, 17 B, and 17 C are schematic diagrams showing luminous patterns when there is a short circuit between the column electrodes, and FIG. 17A is a schematic diagram showing the entire display area. FIG. 17B is a schematic enlarged view of a part of FIG. 17A, and FIG. 17C is a schematic view of a short circuit between column electrodes; and FIG. 18 is a schematic view of a short circuit between row electrodes. (Description of component symbols) 1 Inspector body-2 CCD camera 3 Image processing device 3a Image processing section 3b Image processing memory 3c Image processing theme memory 4 Control device 11 Addressing driver 1 1 a, 1 1 b Addressing driver 12 X Maintenance driver 1 2 a, 1 2 b X maintenance driver 36 312 / Invention Manual (Supplement) / 92-10 / 921193 84 1225233 13 Y maintenance driver 13a, 13b Y maintenance driver 30 Plasma display panel 30a Display area 30b Additional display Area 3 1 Plasma display panel 41 Display area 42 Upper area 43 Lower area 100 Inspection device 10 1 Row electrode group 1 02 Row electrode group 1 03 Short-circuit section 1 04 Bright line 111 Black line 112 Short-circuit section
312/發明說明書(補件)/92-10/921193 84 37312 / Invention Specification (Supplement) / 92-10 / 921193 84 37