200402676 玖、發明說明： 【發明所屬之技術領域】 本發明係有關一種顯示檢查方法等用於經由排列顯示 晶胞成矩陣形式形成之顯示面板，偵測該顯示面板之一電 極的斷路，以及一種供檢查電極間之短路用之顯示檢查方 法等。 【先前技術】 作為於經由將顯示晶胞排列成矩陣形式形成之電漿顯 示面板，檢查一電極斷路之習知方法，採用一種方法，使 用全表面顯示圖案，將顯示圖案拍攝為影像資料，以及經 由使用影像分析偵測缺陷。若如圖1A或圖2 A所示，於電 漿顯示面板3 0之一電極發生斷路，則其顯示線出現未發光 部分。因此經由比較斷路顯示線之梯度與該顯示線上下二 鄰近像素之梯度，或經由比較斷路顯示線之梯度與該顯示 線左右二鄰近像素之梯度，容易擷取線缺陷。 一顯示面板包括複數個列電極，行電極排列於垂直列電 極方向，以及R (紅）、G (綠）及B (藍）色顯示晶胞形成於列 電極與行電極之交叉點，此種顯示面板為已.知。於此種顯 示面板，當偵測得毗鄰電極間短路時，單色圖案（R、G或B 圖案）顯示於全顯示面板上。此種情況下，若毗鄰電極間發 生短路，則另一色顯示晶胞發光。因此可偵測得電極間的 短路。 若如圖 1B 圖所示，於顯示區上端部或下端部有一斷路 顯示線，或若如圖2B所示，於顯示區左端部或右端部有一 斷路顯示線，則由斷路引起之線缺陷梯度接近等於顯示區 5 312/發明說明書(補件)/92-10/921193 84 200402676 外側梯度，結果變成難以經由使用前述方法偵測斷路。另 一方面，若試圖比較於線缺陷部分梯度與顯示區一鄰近像 素梯度，則須嚴格於顯示區固定為水平不允許顯示區失 真。因此也難以採用此種方法。 【發明内容】 本發明之一目的係提供一種用於一顯示面板之顯示檢 查方法及顯示檢查裝置，該方法或裝置可牢靠地偵測於顯 示區上端部或下端部之線缺陷、或於顯示區左端部或右端 部之線缺陷。 有一型顯示面板，其中行電極係於顯示面板垂直方向分 割。於此型顯示面板，如圖3所示，於行方向分割之行電 極組1 0 1及1 0 2之行電極間短路，造成線缺陷，而妨礙正 常顯示。但當採用前述檢查方法，於全顯示面板上顯示單 色圖案時，上行電極與下行電極間之短路不影響顯示。因 此無法檢測得上行電極與下行電極間之短路。 本發明之另一目的係提供一種用於一顯示面板之顯示 檢查方法及顯示檢查裝置，其可檢查設置為彼此分開之上 行電極與下行電極間之短路。 此外，當電漿顯示面板之毗鄰列電極間發生短路時，有 一問題為暗線不會出現於全表面顯示面板，因而無法偵測 列電極間之短路。 本發明之另一目的係提供一種用於一顯示面板之顯示 檢查方法及顯示檢查裝置，其可牢靠地檢查列電極間之短 路。 前述發明目的可經由一種用於一顯示面板供檢查一顯 6 312/發明說明書(補件)/92-10/921193 84 200402676 示面板之線缺陷之顯示檢查方法，該顯示面板包括複數列 電極，以及複數行電極排列於垂直列電極方向，而形成顯 示晶胞於列電極與行電極之交叉點，該顯示晶胞係經由控 制於顯示區排列成矩陣形式之顯示晶胞的發光，該顯示檢 查方法具有下列各步驟：讓位於顯示區頂端或底端之顯示 晶胞列發光；經由使用一影像感測器偵測發光顯示晶胞、 位置接近發光顯示晶胞且係位於顯示區之顯示晶胞、以及 非發光且位於顯示區外側部分之顯示晶胞，且輸出一視訊 影像；基於該輸出視訊影像，對應位於頂端或底端之發光 晶胞列，而於列方向偵測亮線數目及長度；以及當亮線數 目及長度係小於預定值時，判定於對應顯示晶胞列之列電 極已經發生斷路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板之線 缺陷，該顯示面板包括複數列電.極，以及複數行電極排列 於垂直列電極方向，而形成顯示晶胞於列電極與行電極之 交叉點，該顯示晶胞係經由控制於顯示區排列成矩陣形式 之顯示晶胞的發光，該顯示檢查方法具有下列各步驟：讓位 於顯示區左端或右端之顯示晶胞列發光；經由使用一影像 感測器偵測發光顯示晶胞、位置接近發光顯示晶胞且係位 於顯示區之顯示晶胞、以及非發光且位於顯示區外側部分 之顯示晶胞，且輸出一視訊影像；基於該輸出視訊影像， 對應位於左端或右端之發光晶胞行，而於行方向偵測亮線 數目及長度；以及當亮線數目及長度係小於預定值時，判 定於對應顯示晶胞行之行電極已經發生斷路。 7 312/發明說明書(補件)/92-10/921193 84 200402676 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板之線 缺陷，該顯示面板包括複數列電極，以及複數行電極排列 於垂直列電極方向，而形成顯示晶胞於列電極與行電極之 交叉點，該顯示晶胞係排列於列方向，讓其發光色彩為三 色且彼此不同色，以及三色形成一像素，以及發光色彩相 同之顯示晶胞排列於行方向，經由控制於顯示區排列成矩 陣形之顯示晶胞之發光，該顯示面板顯示一影像，該顯示 檢查方法具有下列各步驟：讓位於顯示區左端或右端之顯 示晶胞列發光；經由使用一影像感測器偵測發光顯示晶 胞、位置接近發光顯示晶胞且係位於顯示區之顯示晶胞、 以及非發光且位於顯示區外側部分之顯示晶胞，且輸出一 視訊影像；基於該輸出視訊影像，對應位於左端或右端之 發光晶胞行，而於行方向偵測亮線數目及長度；以及當亮 線數目及長度係小於預定值時，判定於對應顯示晶胞行之 行電極已經發生斷路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板上介 於劃分行電極間之線缺陷，該顯示面板包括複數列電極， 以及複數行電極排列於垂直列電極方向，而形成顯示晶胞 於列電極與行電極之交叉點，行電極係於行方向於顯示區 分割，顯示面板係形成為可以經由分割所得之分割晝面形 成可能之同時選擇顯示晶胞，當取一列作單位時，顯示檢 查方法包含下列步驟：經由讓經由分割所得之上及下分割 晝面其中之一發單色光；經由使用一影像感測器偵測作為 8 312/發明說明書(補件)/92-10/921193 84 200402676 非發光分割晝面之上及下分割晝面之另一晝面，以及輸出 一視訊信號；基於該輸出視訊信號，於對應該上及下分割 晝面之另一晝面之顯示晶胞行，於一行方向偵測一亮線； 以及對應已經偵測得亮線之顯示晶胞行，判定介於分割列 電極間發生電極短路。 前述本發明之目的可經由一種顯示檢查方法達成，該顯 示檢查方法係用於一顯示面板，用以檢查一顯示面板上介 於劃分行電極間之線缺陷，該顯示面板包括複數列電極， 以及複數行電極排列於垂直列電極方向，而形成顯示晶胞 於列電極與行電極之交又點，該顯示晶胞係排列於列方 向，讓其發光色彩為三色且彼此相異，且形成一個像素； 以及其發光色彩為相同之顯示晶胞排列於行方向，行電極 係於行方向於顯示區分割，顯示面板係形成為可以經由分 割所得之分割晝面形成可能之同時選擇顯示晶胞，當取一 列作單位時，顯示檢查方法包含下列步驟：經由讓經由分割 所得之上及下分割晝面其中之一發單色光；經由使用一影 像感測器偵測作為非發光分割晝面之上及下分割晝面之另 一晝面，以及輸出一視訊信號；基於該輸出視訊信號，於 對應該上及下分割晝面之另一晝面之顯示晶胞行，於一行 方向偵測一亮線；以及對應已經偵測得亮線之顯示晶胞 行，判定介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查方法，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極·，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 312/發明說明書(補件)/92-10/92119384 9 200402676 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查方法包含下列步驟：讓顯 示區之顯示晶胞以鋸齒格形發光；經由使用一影像感測器 而偵測顯示區之顯示晶胞，以及輸出一視訊信號；基於該 輸出之視訊信號，而偵測於列方向之暗線；以及對應已經 γ貞測得暗線之顯不晶胞列’判定電極短路發生於列電極間。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交又點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓位於顯示區頂端或底端之顯示晶胞列發光； 一影像感測器，其係供偵測發光顯示晶胞、位置接近該發 光顯示晶胞且係位於顯示區之顯示晶胞、以及非發光且位 於顯示區外側部分之顯示晶胞，以及輸出一視訊信號；以 及一判定裝置，其係供基於由影像感測器輸出之視訊信 號，而於對應位於頂端或底端之顯示晶胞列之列方向，檢 查亮線數目及亮線長度，以及當該亮線數目及長度係小於 預定值時，判定於對應顯示晶胞列之列電極發生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 10 312/發明說明書(補件)/92-10/921193 84 200402676 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓位於顯示區左端或右端之顯示晶胞列發光； 一影像感測器，其係供偵測發光顯示晶胞、位置接近該發 光顯示晶胞且係位於顯示區之顯示晶胞、以及非發光且位 於顯示區外側部分之顯示晶胞，以及輸出一視訊信號；以 及一判定裝置，其係供基於由影像感測器輸出之視訊信 號，而於對應位於左端或右端之顯示晶胞行之行方向，檢 查亮線數目及亮線長度，以及當該亮線數目及長度係小於 預定值時，判定於對應顯示晶胞行之行電極發生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，顯示 晶胞排列於列方向，故其發光色彩為三色且彼此相異，且 形成一個像素，以及其發光色彩相同之該等顯示晶胞係排 列於行方向，該顯示面板係經由控制於一顯示區排列成矩 陣形式之顯示晶胞之發光而顯示一影像，該顯示檢查裝置 設置有：一發光裝置，其係供讓位於顯示區左端或右端之顯 示晶胞列發光；一影像感測器，其係供偵測發光顯示晶胞、 位置接近該發光顯示晶胞且係位於顯示區之顯示晶胞、以 及非發光且位於顯示區外側部分之顯示晶胞，以及輸出一 視訊信號；以及一判定裝置，其係供基於由影像感測器輸 出之視訊信號，而於對應位於左端或右端之顯示晶胞行之 行方向，檢查亮線數目及亮線長度，以及當該亮線數目及 長度係小於預定值時，判定於對應顯示晶胞行之行電極發 11 312/發明說明書(補件)/92-10/921193 84 200402676 生斷路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之分割行電極間之 線缺陷，該顯示面板包括複數列電極，以及複數行電極排 列於垂直列電極方向，而形成顯示晶胞於列電極與行電極 之交叉點，行電極於行方向於一顯示區分割，如此形成之 顯示面板可取一列作為單元，同時選擇經由分割所得之分 割晝面的顯示晶胞，該顯示檢查裝置裝配有：一發光裝置， 其係供經由分割所得之上分割晝面及下分割晝面其中之一 發單色光；一影像感測器，其係供經由使用一影像感測器 偵測上及下分割晝面之另一晝面作為非發光分割晝面，以 及輸出一視訊信號；一判定裝置，其係供基於該輸出視訊 信號，偵測於上及下分割晝面之另一晝面，對應一顯示晶 胞行於行方向之亮線，以及判定對應該偵測得亮線之顯示 晶胞行，介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之分割行電極間之 線缺陷，該顯示面板包括複數列電極，以及複數行電極排 列於垂直列電極方向，而形成顯示晶胞於列電極與行電極 之交叉點，顯示晶胞係排列於列方向，其發光色彩為三色 且彼此各異以及形成一個像素，以及發光色彩相同之顯示 晶胞係排列於行方向，行電極於行方向於一顯示區分割， 如此形成之顯示面板可取一列作為單元，同時選擇經由分 割所得之分割晝面的顯示晶胞，該顯示檢查裝置裝配有： 一發光裝置，其係供經由分割所得之上分割晝面及下分割 12 312/發明說明書(補件)/92-10/92119384 200402676 畫面其中之一發單色光；一影像感測器，其係供經由使用 一影像感測器偵測上及下分割晝面之另一晝面作為非發光 分割晝面，以及輸出一視訊信號；一判定裝置，其係供基 於該輸出視訊信號，偵測於上及下分割晝面之另一晝面， 對應一顯示晶胞行於行方向之亮線，以及判定對應該偵測 得亮線之顯示晶胞行，介於分割列電極間發生電極短路。 前述本發明之目的可經由一種供顯示面板用之顯示檢 查裝置，該方法係用於檢查一顯示面板之線缺陷，該顯示 面板包括複數列電極，以及複數行電極排列於垂直列電極 方向，而形成顯示晶胞於列電極與行電極之交叉點，該顯 示面板係經由控制於一顯示區排列成矩陣形式之顯示晶胞 之發光而顯示一影像，該顯示檢查裝置設置有：一發光裝 置，其係供讓顯示區之顯示晶胞以鋸齒格形發光；一影像 感測器，其係供經由使用一影像感測器偵測於顯示區之顯 示晶胞，以及輸出一視訊信號；一判定裝置，其係供基於 該輸出視訊信號而偵測於列方向之一暗線，以及判定對應 出現暗線之顯示晶胞列之列電極間發生電極短路。 【實施方式】 (第一具體實施例） 後文將參照圖 4至1 0說明根據本發明之供顯示面板用 之顯示檢查方法之具體實施例。 圖4為方塊圖顯示用於電漿顯示面板之顯示檢查方法之 檢查裝置組態。圖5為略圖顯示欲檢查之電漿顯示面板3 0 之電極配置。 如圖4所示，檢查裝置1 0 0包括一檢查器主體1，其係 13 312/發明說明書(補件)/92-10/921193 84 200402676 供於檢查時照明電漿顯示面板3 0，一 CCD攝影機2，供攝 取電漿顯示面板3 0之顯示面影像，一影像處理裝置3，供 接收來自CCD攝影機2之視訊影像以及一控制裝置4，供 控制檢查器主體1、CCD攝影機2及影像處理裝置3。影像 處理裝置3包括一影像處理區段3 a，供執行影像處理俾分 析發光圖案（容後詳述），一影像處理記憶體3 b，供儲存R、 G及B個別之由CCD攝影機2供給的影像資料，以及一影 像處理主題記憶體3 c，供暫時儲存影像處理主題資料。 如圖5所示，一定址驅動器1 1、一 X維持驅動器1 2以 及一 Y維持驅動器1 3皆連結至電漿顯示面板3 0之電極， 係設置於檢查器主體1。 如圖5所示，電衆顯示面板30包括行電極Dir、Dig、 Dlb、D2r、D2g、D2b、... Dmr ' Dmg 及 Dmb 以及列電極 XI 至Xn及列電極Y1至Yn設置於垂直行電極方向。如圖5 所示，行電極被指定而以所述順序重複關聯R晶胞、G晶 胞及Β晶胞。於顯示區3 0 a，R晶胞、G晶胞及Β晶胞係重 複形成於行電極與列電極X1至X η以及列電極Y1至Υ η之 交叉點。如圖5所示，R晶胞、G晶胞及Β晶胞係循序設置 成呈一集合處理，一像素係由該集合所形成。一額外顯示 區3 0 b係設置於該顯示區3 0 a外側。 如圖5所示，列電極X1至X η以及列電極Y1至Υ η係交 錯以梳狀形式設置，故由交互相對之兩邊伸出。列電極X1 至X η其中之一以及列電極Υ 1至Υ η其中之一被指定給一顯 不晶胞列。於'一晶胞内部’列電極XI至Xn以及列電極Υ1 至Υ η係並聯設置而彼此相對。 14 312/發明說明書(補件)/92-10/92119384 200402676 如圖5所示，行電極Dir、Dig、Dlb、D2r...Dmb係連 至定址驅動器1 1，列電極X1至X n係連結至X維持驅動 1 2，以及列電極Υ1至Υη係連結至Υ維持驅動器1 3。 現在說明電漿顯示面板3 0之驅動方法。 一作為驅動電漿顯示面板 3 0之時間間隔之欄位係由 數個子攔位S F1至S F Ν組成。如圖6所示，於各子欄位 供選擇欲點亮晶胞之定址間隔時間，以及一讓該定址間 時間被選定之晶胞持續點亮經歷一段預定時間之維持間 時間。供於前一欄位復置點亮狀態之復置間隔時間額外 供於第一子欄位S F 1之標頭部分。於此復置間隔時間， 部晶胞皆被復置為點亮晶胞（其中形成有壁電荷之晶胞） 或被復置為熄滅晶胞（其中未形成有壁電荷之晶胞）。前 情況下，預定晶胞被切換成熄滅晶胞。後述情況下，於 後之定址間隔時間，預定晶胞被切換成點亮晶胞。維持 隔時間以子攔位SF1、SF2、...SFN之順序逐步延長。經 改變連續被點亮之子欄位數目，可獲得預定之梯度顯示 於圖7所示各子攔位之定址間隔時間，逐線進行定址 描。換言之，於掃描脈波施加至形成第一線之列電極 之同時，依據對應第一線之一晶胞的定址資料之資料脈 DPI施加至行電極Dir、Dig、Dlb、D2r...Dmb。隨後於一 描脈波施加至形成第二線之列電極Υ 2之同時，依據對應 第二線之一晶胞之定址資料的定址脈波DP 2施加至行電 D 1 r、D 1 g、D 1 b、D 2 r…D m b。掃描脈波及資料脈波同時施 至第三線之一晶胞以及以相同方式施加至隨後各線之 胞。最後，一掃描脈波施加至形成第η線之列電極Υ η之 312/發明說明書(補件)/92-10/92119384 結 器 複 提 隔 隔 提 全 5 述 隨 間 由 Ο 掃 Υ1 波 掃 於 極 加 晶 同 15 200402676 時，依據對應第η線上一晶胞之定址資料的一資料解 係施加至行電極 Dir、Dig、Dlb、D2r...Dmb。於定 時間，預定晶胞由點亮晶胞切換成熄滅晶胞，或由 胞切換成點亮。 若如此完成定址掃描，則於子攔位的每個晶胞被 點亮晶胞或熄滅晶胞。於隨後之維持間隔時間，每 維持脈波，則只有點亮晶胞重複發光。於維持間隔〖 維持脈波及Y維持脈波以圖7所示之預定時序而重 至列電極X 1至X η以及列電極Y 1至Υ η。於最終子攔 設置一抹消間隔時間，供將全部晶胞皆設定為熄滅 經由重複前述攔位，使用動態圖像於電漿顯示3 之梯度呈現變成可能。 圖8顯示一範例，其中電漿顯示面板被分割成上 區，於各區之電極彼此分開。此種情況下，連結至 示面板3 1之定址驅動器1 1 a及1 1 b、X維持驅動器 1 2 b以及Y維持驅動器1 3 a及1 3 b係設置於檢查器 如圖8所示。 如圖8所示，電漿顯示面板31包括行電極D1 r ’ Dlb、D2r、D2g、D2b、…Dmr、Dmg A Dmb，歹,J 電極 X i 及列電極 Y1 至 Y i 設置於垂直行電極方向， DAlr、DAlg、DAlb、DA2r、DA2g、DA2b、".DAmr、 D A m b及列電極X i + 1至X n以及列電極Y i + 1至Y n設 直行電極方向。各行電極被指定為以引述的順序而 聯R晶胞、G晶胞及B晶胞。R晶胞、G晶胞及B晶 形成於行電極與列電極X1至X η及列電極Y1至Υ η 312/發明說明書(補件)/92-10/92 Π 93 84 l 波 DPn 址間隔 媳滅晶 設定為 次施加 時間，X 才炅施加 位 S F N， 晶胞。 ίι 板 3 0 區及下 電漿顯 1 2a及 主體， 、D 1 g、 XI至 行電極 DAmg、 置於垂 重複關 胞重複 之交叉 16 200402676 點。以圖5所示情況之相同方式，接續設置之一 R晶胞、 一 G晶胞以及一 B晶胞係以一組處理，一個像素係由該組 組成。 行電極 Dir、 Dig、 Dlb、 D2r、 D2g、 D2b、…Dmr、 Dmg、 Dmb連結至定址驅動器11a。行電極DAlr、DAlg、DAlb、 DA2r、DA2g、DA2b、…DAmr、DAmg、DAmb 連結至定址驅動 器1 1 b。列電極X 1至X i連結至X維持驅動器1 2 a。列電極 Y1至Y i連結至Y維持驅動器1 3 a。列電極X i + 1至Χη連結 至X維持驅動器1 2 b。列電極Y i +1至Υ η連結至Υ維持驅 動器1 3 b。 電漿顯示面板 3 1之驅動方法係類似前述電漿顯示面板 3 0之驅動方法。 現在說明經由使用檢查裝置 1 0 0執行電漿顯示面板 3 0 上端部及下端部之檢查程序。被分割為上區及下區之電漿 顯示面板3 1之檢查也係以相同方式執行。 如圖4所示，電漿顯示面板3 0設定於檢查器主體1。讓 頂端之一顯示晶胞列以及底端之一顯示晶胞列，亦即該電 漿顯示面板3 0之顯示區共二排顯示晶胞列發光。讓設置於 顯示晶胞列間之中間區顯示黑色（亦即讓其不發光）。進行 此種圖案之顯示。圖9A、9B、9C及9D依據是否有斷路而 顯示各種發光圖案。圖9 A顯示無斷路，對應頂端及底端之 二排顯示晶胞列有二橫條亮線之發光圖案。圖9 A所示圖案 為偵測斷路之該偵測圖案。圖9B顯示於底端之顯示晶胞列 有斷路，以及底端之亮線於中央被岔斷之發光圖案。圖9C 顯示於頂端及底端個別顯示晶胞列有斷路，以及於頂端及 17 312/發明說明書(補件)/92-10/921193 84 200402676 底端之各亮線於中央被岔斷之發光圖案。圖9D顯示於頂端 及底端之各顯示晶胞列有斷路，於頂端無亮線，而於底端 之亮線於中央岔斷之發光圖案。 以CCD攝影機2拍攝電漿顯示面板3 0之此種發光圖案。 顯示處理裝置3基於CCD攝影機2供給的影像資料而分析 發光圖案。 圖1 0為流程圖顯示檢查時進行之處理。圖1 0所示處理 係基於控制裝置4進行之控制執行。 於圖1 0之步驟S1，驅動脈波供給電漿顯示面板3 0，因 而藉檢查器主體1顯示前述偵測圖案。結果電漿顯示面板 3 0係以圖9 A至圖9 D所示之發光圖案而被點亮。此外，斷 路數目數值被初始化為0。隨後藉C C D攝影機2拍攝發光 圖案影像（步驟S2 )。拍照所得影像之影像資料由CCD攝影 機 2傳輸至影像處理裝置 3之影像處理記憶體 3 b (步驟 S 3 )。此處三色R、G及B之資料係分開傳輸。 隨後由儲存於影像處理記憶體 3 b之影像資料，將位於 電漿顯示面板 3 0頂端之顯示晶胞列含括區設定作為影像 處理區（步驟S 4 )。本區係設定為包括位置接近前述顯示晶 胞列且位在顯示區的顯示晶胞，以及不發光（亦即於黑顯示 區的顯不晶胞）以及位在顯不區外側部分（亦即位在顯不晶 胞列上方部分）之顯示晶胞。隨後，於預設區之影像資料被 儲存於影像處理主題記憶體3 c (步驟S 5 )。 隨後基於儲存於影像處理主題記憶體 3 c之影像資料， 而執行由位於頂端之顯示晶胞列擷取發光晶胞列之處理 (步驟S 6 )。隨後判定位於頂端之發光晶胞列是否於發光晶 18 312/發明說明書(補件)/92-10/921193 84 200402676 胞列之擷取處理被擷取。當判定為肯定，則處理前進至步 驟S 8。當判定為否定，則處理前進至步驟S 1 0 (步驟S 7 )。 於步驟S 8，擷取之發光晶胞列長度與電漿顯示面板3 0顯 示區之水平長度比對。隨後判定是否有一發光晶胞列之水 平長度係比電漿顯示面板3 0之顯示區之水平長度短。若判 定有此種發光晶胞列，則處理前進至步驟 S 1 0。若判定無 此種發光晶胞列，則處理前進至步驟S 1 1 (步驟S 9 )。於步 驟S 1 0，對列電極之斷路數目加1，且處理前進至步驟S 1卜 由儲存於影像處理記憶體 3 b之影像資料，包括位在電 漿顯示面板3 0頂端之顯示晶胞列之一區，於步驟S 1 1被設 定為影像處理區。此區被設定為包括不發光之顯不晶胞’ 以及位置接近前述顯示晶胞列之顯示區（亦即於黑顯示區 之顯示晶胞）以及位在顯示區外側部分（亦即位在顯示晶胞 列上方部分）之顯示晶胞。隨後預設區之影像資料被儲存於 影像處理主題記憶體3 c (步驟S 1 2 )。 隨後基於儲存於影像處理主題記憶體 3 c之影像資料， 執行由位於底端之顯示晶胞列擷取發光晶胞列之處理（步 驟S 1 3 )。隨後判定於發光晶胞列之擷取處理是否已經擷取 位於底端之發光晶胞列。當判定為肯定，則處理前進至步 驟S 1 5。當判定為否定，則處理前進至步驟S 1 7 (步驟S 1 4 )。 於步驟 S 1 5，擷取所得之發光晶胞列長度與電漿顯示面板 3 0之顯示區水平長度比較。隨後判定是否有水平長度比電 漿顯示面板3 0顯示區之水平長度更短的發光晶胞列。若判 定有此種發光晶胞列，則處理前進至步驟 S 1 7。若判定無 此種發光晶胞列，則完成處理。於步驟 S1 7，對列電極之 19 312/發明說明書(補件)/92-10/921193 84 200402676 斷路數目加1，以及完成處理。 藉此方式，於圖 1 0所示處理擷取於頂端之發光晶胞 (步驟S 6)。若未擷取發光晶胞列（步驟S 7為否），則斷 數目加1 (步驟S 1 0 )。發光晶胞列未被擷取之案例係對應 頂端顯示晶胞列未點亮之案例，如圖9D所示。表示頂端 顯示晶胞列為斷路。因此於此種情況下，斷路數目加 1 若被擷取之發光晶胞列長度係比電漿顯示面板 3 0之顯 區之水平長度短（步驟 S 9之「存在」），則對斷路數目 1 (步驟S 1 0 )。被擷取之發光晶胞列長度比顯示區水平長 更短之案例係對應於圖 9C所示之頂端發光晶胞列中央 岔斷案例。表示頂端之顯示晶胞列斷路。因此此種情況 對斷路數目加1。 此外於圖1 0所示處理，擷取於底端之發光晶胞列（步 S 1 3 )。若未擷取發光晶胞列（步驟S 1 4為否），則斷路數 加1 (步驟S 1 7 )。發光晶胞列未被擷取之案例係對應於底 顯示晶胞列未點亮之案例。表示底端之顯示晶胞列為 路。因此於此種情況下，斷路數目加 1。若被擷取之發 晶胞列長度係比電漿顯示面板 3 0之顯示區之水平長度 (步驟S 1 6之「存在」），則對斷路數目加1 (步驟S 1 7 )。 擷取之發光晶胞列長度比顯示區水平長度更短之案例係 應於圖9 B或9 D所示之底端發光晶胞列中央被岔斷案例 表示底端之顯示晶胞列斷路。因此此種情況下對斷路數 加 1 〇 例如以圖 9 A所示顯示圖案為例，於頂端之發光晶胞 被擷取（於步驟S 7為是），且該發光晶胞列長度不比電漿 312/發明說明書(補件)/92-10/921193 84 列 路 於 之 〇 示 加 度 被 下 驟 因 端 斷 光 短 被 對 〇 a 列 顯 20 200402676 示面板30顯示區之水平長度短（步驟S9為「不存在. 此外，於底端之發光晶胞列經擷取（於步驟S 1 4為是〕 該發光晶胞列長度不比電漿顯示面板 3 0之顯示區水 度短（步驟S 1 6為「不存在」）。因此此種情況下發現 端及底端之二顯示晶胞列並無列電極斷路。此種情況 圖1 0所示處理計數之斷路數目變成0。 以圖 9 B所示顯示圖案為例，於頂端之發光晶胞列 取（於步驟S 7為是），且該發光晶胞列長度不比電漿顯 板30顯示區之水平長度短（步驟S9為「不存在」）。企( 於底端之發光晶胞列經擷取（於步驟S 1 4為是），但發 胞列長度比電漿顯示面板 3 0顯示區之水平長度短（ S 1 6為「存在」）。因此此種情況下發現於頂端之顯示 列無斷路，但於底端之顯示晶胞列有列電極斷路。此 況下，圖1 0所示處理計數之斷路數目變成1。 例如，以圖 9 C所示顯示圖案為例，於頂端之發光 列經擷取（步驟S 7為是），但該發光晶胞列長度係比電 示面板3 0顯示區之水平長度短（步驟S 9為「存在」〕 外，於底端之發光晶胞列被擷取（於步驟S 1 4為是）， 發光晶胞列長度比電漿顯示面板 3 0顯示區之水平長 (步驟S 1 6為「存在」）。因此此種情況下發現於頂端 端之二顯示晶胞列皆有列電極斷路。此種情況下，e 所示處理中計數之斷路數目變成2。 以圖 9 D顯示圖案為例，於頂端之發光晶胞列未經 (於步驟S 7為否）。此外，於底端之發光晶胞列經擷ί 步驟S 1 4為是），但發光晶胞列長度比電漿顯示面板 312/發明說明書(補件)/92-10/921193 84 >，而 平長 於頂 下， 被擷 示面 :外， 光晶 :步驟 晶胞 種情 晶胞 漿顯 > 〇此 但該 度短 及底 I 1 0 擷取 艮（於 30顯 21 200402676 示區之水平長度短（步驟S 1 6為「存在」）。因而發現於頂 端及底端之顯示晶胞列皆有斷路。此種情況下圖1 0所示處 理之計數斷路數目變成2。 於根據本具體實施例之顯示面板之顯示檢查方法，只點 亮位在顯示區頂端及底端之顯示晶胞列之偵測圖案係如前 文說明使用。結果可確保此等顯示晶胞行與毗鄰於此等顯 示晶胞行之額外顯示區間之梯度差異。因此，可就位於頂 端及底端之顯示晶胞列是否有電極斷路牢靠地進行偵測。 前述具體實施例中，說明檢查於頂端及底端之單一顯示 晶胞列情況。但該具體實施例也可應用於同時檢查頂端或 底端之複數顯示晶胞列（例如二排顯示晶胞列）情況。此種 情況下，發光顯示晶胞列數目或斷路顯示晶胞列數目可基 於亮線厚度決定。 (第二具體實施例） 如圖4所示，電漿顯示面板3 0被設定於檢查器主體1。 致使於左端之一顯示晶胞行以及於右端之一顯示晶胞行， 亦即，電漿顯示面板3 0之顯示區共二顯示晶胞行發光。插 置於此等顯示晶胞行間之一中間區致使顯示黑（亦即讓其 不發光）。進行此種圖案之顯示。各個像素行包括三毗鄰顯 示晶胞行，亦即R、G及B顯示晶胞行。 圖11A、11B、11C及11D顯示依據是否有斷路而定之各 種發光圖案。圖11A顯示無斷路，於左端及右端各自有一 由三顯示晶胞行（R、G及B)組成之亮線對應一像素行之發 光圖案。此種情況下，於左端及右端共有六個顯示晶胞行 發光而無錯失部分。圖1 1 A所示發光圖案即為偵測得斷路 22 312/發明說明書(補件)/92-10/921193 84 200402676 之偵測圖案。圖 1 1 B顯示於右端之顯示晶胞行（R )有一 路，以及含括於右端亮線之顯示晶胞行（R)於中央被岔斷 發光圖案。圖1 1 C顯示右端之顯示晶胞行（R)有一斷路， 及含括於右端之亮線之顯示晶胞行（R)絲毫也未發光之 光圖案。圖1 1 D顯示於右端之顯示晶胞行有斷路之發光 案。以圖11 D為例，含括於右端亮線之顯示晶胞行（R)中 部分不發光，且顯示晶胞行（R)被劃分為上部及下部。 圖1 2為流程圖顯示檢查時進行之處理。圖1 2所示處 係基於控制裝置4進行之控制執行。 於圖1 2之步驟S 2 1，驅動脈波由檢查器主體1供給電 顯示面板3 0，因而顯示前述偵測圖案。結果電漿顯示面 3 0例如係以圖1 1 A至1 1 D所示發光圖案被點亮。此外， 路數目值最初為0。隨後藉CCD攝影機2拍攝發光圖案 像（步驟S22)。拍攝的影像之影像資料由CCD攝影機2 輸至影像處理裝置3之影像處理記憶體3 b (步驟S 2 3 )。 處R、G及B三色之資料係分開傳輸。 隨後由儲存於影像處理記憶體 3 b之影像資料，於電 顯示面板 3 0左端之像素行（三顯示晶胞行）之含括區設 作為影像處理區（步驟 S 2 4 )。此區係設定為包括位置接 前述顯示像素行且位於顯示區之顯示晶胞，以及包括未 光（亦即於黑顯示區之顯示晶胞）以及位於顯示區外側部 (亦即位於顯示晶胞行左側部分）之顯示晶胞。隨後於該 設區之影像資料儲存於影像處理主題記憶體 3 c (步 S25)。 接著基於儲存於影像處理主題記憶體 3 c之影像資料 312/發明說明書(補件)/92-10/92119384 斷 之 以 發 圖 間 理 漿 板 斷 影 傳 此 漿 定 近 發 分 預 驟 23 200402676 執行由位於左端之顯示晶胞行擷取一發> 理（步驟S 2 6 )。隨後判定位於左端之發光^ 該發光晶胞行之擷取處理中被擷取。於 下，處理前進至步驟 S28。於否定判定之 進至步驟S 3 0 (步驟S 2 7 )。於步驟S 2 8，擷 (R)長度與電漿顯示面板3 0之顯示區之水 後判定是否有一發光晶胞行（R)其垂直長 面板3 0之顯示區之垂直長度短。若判定有 (R )，則處理前進至步驟 S 3 0。若判定無 (R )，則處理前進至步驟S 3 1 (步驟S 2 9 )。 行電極之斷路數目加1，處理前進至步驟 於步驟 S 3 1，就全部三行形成位於左端 晶胞行（R、G及B )，判定步驟S 2 4至S 3 0 完成。於否定判定之情況下，處理返回步 對次一顯示晶胞行（例如G )重複步驟S 2 4 之處理。若於步驟S 3 1之判定為肯定，則 S 3 2。於已經就各色（R、G及 B)顯示晶胞 至S30之處理後，處理前進至步驟S32。 由儲存於影像處理記憶體 3b之影像資 位於電漿顯示面板 3 0右端之像素行（三！ 區作為一影像處理區（步驟 S 3 2 )。此區係 接近前述顯示像素行且位於顯示區之顯示 光（亦即於黑顯示區之顯示晶胞）以及位於 (亦即位於顯示晶胞行右侧部分）之顯示晶 區之影像資料儲存於影像處理主題記憶體 312/發明說明書(補件)/92-10/921193 84 L晶胞行（R )之處 3曰胞行（R)是否於 肯定判定之情況 情況下，處理前 取之發光晶胞行 平長度比較。隨 度係比電漿顯示 此種發光晶胞行 此種發光晶胞行 於步驟S30，對 S3 1° 之像素行之顯示 之處理是否已經 驟 S 2 4，於該處 以及隨後各步驟 處理前進至步驟 行執行步驟 S 2 4 料中，隨後設定 頁不晶胞行）含括 設定為包括位置 晶胞，以及未發 顯示區外側部分 胞。隨後於預設 3c(步驟 S33)。 24 200402676 隨後，基於儲存於影像處理主題記憶體3 c之影像資料， 執行由位於右端之顯不晶胞行之發光晶胞行（R)之掘取處 理（步驟 S 3 4 )。隨後判定於該發光晶胞行之擷取處理中， 位於右端之發光晶胞行（R)是否被擷取。若判定為肯定，則 處理前進至步驟 S 3 6。若判定為否定，則處理前進至步驟 S 3 8 (步驟S 3 5 )。於步驟S 3 6，擷取所得發光晶胞行（R )之長 度與電漿顯示面板3 0之顯示區垂直長度作比較。隨後判定 是否有一發光晶胞行（R)其垂直長度係比電漿顯示面板 3 0 顯示區之垂直長度短。若判定為此種發光晶胞行（R )，則處 理前進至步驟S 3 8。若判定無此種發光晶胞行（R )，則處理 前進至步驟S 3 9 (步驟S 3 7 )。於步驟S 3 8，對行電極之斷路 數目加1，且處理前進至步驟S 3 9。 於步驟 S 3 9，就形成位於右端之像素行之全部三顯示晶 胞行（R、G及B )，判定步驟S 3 2至S 3 8之處理是否已經完 成。若判定為否定，則處理返回步驟 S 3 2，此處就次一顯 示晶胞行（例如G )重複進行步驟S 3 2以及隨後各步驟之處 理。若於步驟S 3 9之判定為肯定，則完成處理。於就各色 (R、G及B )之顯示晶胞行已經執行步驟S 2 4至S 3 0之處理 後，處理完成。 如前文說明，於左端之發光晶胞行係於圖 1 2所示處理 被擷取（步驟 S 2 6 )。若發光晶胞行未被擷取（步驟 S 2 7為 否），則對斷路數目加1 (步驟S 3 0 )。發光晶胞行未被擷取 之情況係相當於圖 1 1 C所示發光晶胞行（此處於右端之發 光晶胞行）未被點亮的情況。表示左端之發光晶胞行斷路。 因此於此種情況下對斷路數目加 1。若被擷取之發光晶胞 25 312/發明說明補件)/92-10/921193 84 200402676 行之長度係比電漿顯示面板3 0之顯示區垂直長肩 S 2 9為「存在」），則對斷路數目加1 (步驟S 3 0 ) 之發光晶胞行長度比顯示區垂直長度短之情況係 1 1 Β及圖1 1 D所示之發光晶胞行（此處為右端發另 於中間被岔斷的情況。表示左端之發光晶胞行具 因此於此種情況下對斷路數目加1。 此外，於圖1 2所示處理，擷取於右端之一發光I 驟S 3 4 )。若發光晶胞行未被擷取（步驟S 3 5為否） 路數目加1 (步驟S 3 8 )。發光晶胞行未被擷取之情 於右端之發光晶胞行未被點亮之情況。表示於右 晶胞行斷路。因此此種情況下，對斷路數目加 1 取之發光晶胞行長度比電漿顯示面板 3 0之顯示 度短（步驟S 3 7為「存在」），則對斷路數目加1 (步 被擷取之發光晶胞行長度比顯示區垂直長度短之 當於右端發光晶胞行於中間被岔斷之情況。表示 光晶胞行斷路。因此於此種情況下斷路數目加1 < 例如以圖1 1 Α所示發光圖案為例，於左端之全 晶胞行皆被擷取（步驟S 2 7為是），而該發光晶胞 比電漿顯示面板3 0顯示區垂直長度短（步驟S 2 9 在」）。此外，於右端之全部三發光晶胞行皆被莽 S 3 5為是），且發光晶胞行長度不比電漿顯示面柄 區之垂直長度短（步驟S37為「不存在」）。因此 況下於左端及右端之顯示晶胞行皆未見行電極斷 圖1 2所示處理計數之斷路數目變成0。 以圖1 1 B所示發光圖案為例，於左端之全部三 312/發明說明書(補件)/92-10/921193 84 ί短（步驟 。被擷取 相當於圖 L晶胞行） 有斷路。 ^胞行（步 ，則對斷 況係相當 端之發光 。若被掘 區垂直長 驟 S 3 8 )。 情況係相 右端之發 部三發光 行長度不 為「不存 貢取（步驟 .30顯示 ，此種情 路。因此 發光晶胞 26 200402676 行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不比電 漿顯示面板3 0顯示區垂直長度短（步驟S 2 9為「不存在」）。 此外，於右端之全部三發光晶胞行皆被擷取（步驟 S 3 5為 是），但其中發光晶胞行（R)長度係比電漿顯示面板3 0之顯 示區垂直長度短（步驟S37為「存在」）。因此此種情況下 發現左端顯示晶胞行無斷路，但右端顯示晶胞行（R)有一行 電極斷路。因此圖1 2所示處理計數之斷路數目變成1。 例如以圖1 1 C所示發光圖案為例，於左端之全部三發光 晶胞行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不 比電漿顯示面板30顯示區垂直長度短（步驟S29為「不存 在」）。此外，右端之發光晶胞行中該發光晶胞行（R)未被 擷取（步驟S 3 5為否）。至於位在右端之另二發光晶胞行（G 及B )，步驟S 3 5之判定為是，以及步驟S 3 7之判定為「不 存在」。因此此種情況下發現左端之顯示晶胞行並無斷路， 但右端之顯示晶胞行（R )有行電極斷路。因此圖1 2所示處 理計數之斷路數目變成1。 以圖1 1 D所示發光圖案為例，於左端之全部三發光晶胞 行皆被擷取（步驟S 2 7為是），而該發光晶胞行長度不比電 漿顯示面板30顯示區垂直長度短（步驟S29為「不存在」）。 此外，右端之全部三發光晶胞行皆被擷取（步驟 S 3 5為 是），但發光晶胞行（R)長度係比電漿顯示面板3 0顯示區之 垂直長度短（步驟S 3 7為「存在」）。因此此種情況下發現 左端之顯示晶胞行並無斷路，但右端之顯示晶胞行（R)有行 電極斷路。因此圖1 2所示處理計數之斷路數目變成1。 根據本發明之顯示面板之顯示檢查方法中，只點亮位在 27 312/發明說明書(補件)/92-10/921193 84 200402676 顯示區左端及右端之顯示晶胞行之偵測圖案係如前 使用。結果可確保該等顯示晶胞行與毗鄰該等顯示 之額外顯示晶胞區間之梯度差異。因此可牢靠地就 端及右端之顯示晶胞行進行是否有行電極斷路。 前述具體實施例中，已經說明對形成於左端或右 像素行之複數個顯示晶胞行（三排顯示晶胞行）作 例。但該具體實施例也可應用於例如檢查單色顯示 及檢查於左端或右端之一顯示晶胞行之案例。 (第三具體實施例） 如圖1 3所示，連結至電漿顯示面板3 1之電極之 動器1 1 a及1 1 b、X維持驅動器1 2 a及1 2 b以及Y維 器1 3 a及1 3 b係設置於檢查器主體1。 如圖1 3所示，電漿顯示面板3 1被切割成上區及 各區之電極彼此分開。如圖1 3所示，行電極D1 r、 Dlb、D2r、D2g、D2b、…Dmr、Dmg 及 Dmb、歹1J 電極 X i及列電極Y 1至Y i設置於電漿顯示面板上區。行電 至D m b係連結至定址驅動器1 1 a。列電極X 1至X i 至X維持驅動器1 2 a。列電極Y1至Y i係連結至Y 動器1 3 a。 行電極 DAlr、DAlg、DAlb、DA2r、DA2g、DA2b、... DAmg及DAmb、歹1J電極Xi + 1至Xn及列電極Yi + 1至飞 置於電漿顯示面板3 1下區。行電極D A 1 r至D A m b係 定址驅動器1 1 b。列電極X i + 1至X n係連結至X維 器1 2 b。列電極Y i + 1至Υ η係連結至Y維持驅動器 如圖 1 3所示，行電極被指定成以引述之順序而 312/發明說明書(補件)/924 0/921193 84 文說明 晶胞行 位於左 端之一 檢查案 面板以 定址驅 持驅動 下區’ Dig、 XI至 極D 1 r 係連結 維持驅 .D Amr、 (η係設 連結至 持驅動 1 3b ° 重複關 28 200402676 聯R晶胞、G晶胞及B晶胞。於顯不區41 ^ R晶胞、G晶胞 及B晶胞分別係形成於行電極與列電極X 1至X η及列電極 Υ1至Υ η之交叉點。如圖1 3所示，接續設置之R晶胞、G 晶胞及Β晶胞係當成一組來處理，該組形成一個像素。額 外顯示區區域4 7係設置於顯示區4 1外側。 如圖1 3所示，列電極X1至X η及列電極Υ1至Υ η係交 錯梳狀設置，不會由彼此相對之兩邊伸出。列電極 X1至 X η其中之一以及列電極Υ 1至Υ η其中之一指定給一顯示晶 胞列。於一晶胞内部，列電極X1至X η及列電極Υ1至Υ η 係並聯設置，故彼此相對。 於顯示區4 1中間部分，行電極D 1 r至D m b及行電極D A 1 r 至D A m b縱向分開。行電極之排列將進一步說明如後。 現在將說明使用檢查裝置1 0 0檢查電漿顯示面板31之 行電極間短路之程序。 如圖4所示，電漿顯示面板31於檢查時係設定於檢查 器主體1，讓電漿顯示面板31顯示區41上區及下區之一 全部發單色光（例如R色）。此時讓另一區的全區顯示黑（亦 即讓其不發光）。 圖1 4 A、1 4 B及1 4 C顯示依據行電極間是否短路之發光 圖案。圖1 4 A顯示行電極間無短路，顯示區41之上區4 2 全體發單色光之情況。此時下區4 3並無發光晶胞。圖1 4 A 所示發光圖案即為檢查行電極間短路.之該種檢查圖案。圖 1 4 B為行電極間短路案例之發光圖案。圖1 4 C為略圖顯示 行電極間之短路。設置於上區之行電極組1 0 1之行電極與 設置於下區之行電極組1 0 2之行電極間之短路部分1 0 3顯 29 312/發明說明書(補件)/92-10/921193 84 200402676 示於圖1 4 C。若行電極間有此種短路，則設置於上區4 2之 行電極與設置於下區 4 3之行電極彼此透過短路部分 1 0 3 連結。於一線（亮線）1 0 4之晶胞發光，亮線1 0 4係順著行 電極組1 0 2之行電極連結至行電極組1 0 1之行電極。結果 變成可檢查行電極間之短路。 此種電漿顯示面板3 1之發光圖案以CCD攝影機2拍攝。 影像處理裝置3基於CCD攝影機2供給的影像資料而分析 發光圖案。 圖1 5為流程圖顯示檢查時進行的處理。圖1 5所示處理 係基於控制裝置4進行之控制執行。 於圖1 5步驟S 4 1，由檢查器主體1供給驅動脈波給電漿 顯示面板3 1來顯示前述偵測圖案。結果例如於圖1 4 A或圖 1 4 B所示發光圖案，電漿顯示面板3 1被點亮。指示是否有 短路位置的旗標值被初始化為一值，指示「無短路位置」。 隨後藉CCD攝影機2拍攝發光圖案影像（步驟S42)。拍攝 的影像由CCD攝影機2傳輸至影像處理裝置3之影像處理 記憶體3b(步驟S43)。三色R、G及B資料傳輸至分開記憶 體區。 隨後設定一記憶體區儲存發光色（R、G或B)變成影像處 理的主題，亦即設定變成影像處理主題之資料（步驟 S 4 4 )。隨後基於儲存於影像處理記憶體3 b之影像資料，求 出近似中間平分線之近似直線（步驟S 4 5 )。 ‘ 隨後於儲存於影像處理記憶體 3 b之影像資料中，未變 成發光之上區或下區全體設定為影像處理區（步驟 S46)。 此處影像處理區之設定係取步驟S 4 5處理求出之近似直線 30 312/發明說明書(補件)/92-10/921193 84 200402676 作為參考點。例如，若檢查圖案為圖1 4 A所 括下區43全區及中央平分線區域於步驟S46 像處理區。 接著基於儲存於影像處理主題記憶體 3 c 執行影像處理區發光點或發光線的擷取處理 此處發光點或發光線之擷取係就步驟S 4 4設 行。例如，以圖14 B所示發光圖案為例，發 係於亮線1 0 4擷取。以圖1 4 A所示發光圖案 或發光線未經擷取。 隨後於步驟S 4 8，決定藉步驟S 4 7之處理 發光點或發光線。若判定為肯定則處理前進 若判定為否定，則處理前進至步驟S 5 0。於多 行電極間存在有短路，指示是否有短路之旗 發光色指示「有短路位置」。然後處理由步驟 驟S 5 1。另一方面，於步驟S 5 0，行電極間之 存在，旗標值指示就相關發光色而言是否有 改變。然後處理由步驟S 5 0前進至步驟S 5 1 於步驟S 5 1判定於步驟S 4 1以及隨後各步 就R、G及B全部發光色而言是否已經結束。身 則處理返回步驟S 4 1而前進處理次一發光色 若判定為肯定，則結束圖1 5所示處理。步 之處理就個別發光色（R、G及B)已經執行後 理。200402676 发明 Description of the invention: [Technical field to which the invention belongs] The present invention relates to a display inspection method and the like for displaying a display panel formed by arranging display cells in a matrix form, detecting a disconnection of one of the electrodes of the display panel, and Display inspection method for checking short circuit between electrodes, etc. [Prior art] As a conventional method for checking a broken electrode by a plasma display panel formed by arranging display cells in a matrix, a method is adopted in which a full surface display pattern is used to capture a display pattern as image data, and Detect defects by using image analysis. If, as shown in FIG. 1A or FIG. 2A, one of the electrodes of the plasma display panel 30 is disconnected, a non-light emitting portion appears on its display line. Therefore, it is easy to capture line defects by comparing the gradient of the broken display line with the gradient of the two adjacent pixels on the display line, or by comparing the gradient of the broken display line with the gradient of the two adjacent pixels around the display line. A display panel includes a plurality of column electrodes, the row electrodes are arranged in the direction of the vertical column electrodes, and R (red), G (green), and B (blue) color display cells are formed at the intersections of the column electrodes and the row electrodes. The display panel is gone. know. In such a display panel, when a short circuit between adjacent electrodes is detected, a monochrome pattern (R, G, or B pattern) is displayed on the full display panel. In this case, if a short circuit occurs between adjacent electrodes, another color indicates that the unit cell emits light. Therefore, a short between electrodes can be detected. If there is a broken display line at the upper or lower end of the display area as shown in Figure 1B, or if there is a broken display line at the left or right end of the display area as shown in Figure 2B, the line defect gradient caused by the break It is close to the display area 5 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676. The outer gradient becomes difficult to detect the open circuit by using the aforementioned method. On the other hand, if you try to compare the gradient of the line defect part with the adjacent pixel gradient of the display area, it must be strictly fixed to the horizontal level of the display area. Distortion of the display area is not allowed. It is therefore difficult to adopt this method. SUMMARY OF THE INVENTION An object of the present invention is to provide a display inspection method and a display inspection device for a display panel. The method or device can reliably detect line defects at the upper or lower end of the display area, or at the display. Line defect at the left or right end of the zone. There is a type of display panel in which the row electrodes are divided in the vertical direction of the display panel. In this type of display panel, as shown in FIG. 3, the row electrodes of the row electrode groups 1101 and 102 which are divided in the row direction are short-circuited, causing line defects and preventing normal display. However, when the aforementioned inspection method is used to display a single-color pattern on a full display panel, the short circuit between the upward electrode and the downward electrode does not affect the display. Therefore, a short circuit between the up electrode and the down electrode cannot be detected. Another object of the present invention is to provide a display inspection method and a display inspection device for a display panel, which can inspect the short circuit between the upper electrode and the lower electrode which are arranged to be separated from each other. In addition, when a short circuit occurs between adjacent column electrodes of a plasma display panel, there is a problem in that dark lines do not appear on the full-surface display panel, and thus a short circuit between the column electrodes cannot be detected. Another object of the present invention is to provide a display inspection method and a display inspection device for a display panel, which can reliably inspect the short circuit between the column electrodes. The foregoing object of the invention can be achieved by a display inspection method for a display panel for inspecting a display 6 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 display panel for line defects, the display panel including a plurality of rows of electrodes, And a plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit cell controls the light emission of the display unit cells arranged in a matrix form in the display area. The method has the following steps: let the display cell row located at the top or bottom of the display area emit light; and use an image sensor to detect the light emitting display cell, which is close to the light emitting display cell and is located in the display area. And a non-luminous display cell located outside the display area and outputting a video image; based on the output video image, corresponding to the light emitting cell row at the top or bottom, and detecting the number of bright lines in the row direction and Length; and when the number and length of the bright lines are less than a predetermined value, it is determined that the column electrode corresponding to the display cell row has been disconnected. The foregoing object of the present invention can be achieved by a display inspection method, which is used for a display panel for inspecting a line defect of a display panel, the display panel includes a plurality of columns of electricity. The electrode and the plurality of row electrodes are arranged in the direction of the vertical column electrode to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit cell controls the light emission of the display unit cell arranged in a matrix form in the display area. The display inspection method has the following steps: let the display cell row located at the left or right end of the display area emit light; use an image sensor to detect the light emitting display cell, is located close to the light emitting display cell, and is a display located in the display area The unit cell and the non-luminous display unit cell located outside the display area and output a video image; based on the output video image, corresponding to the row of light-emitting unit cells located at the left or right end, and the number of bright lines in the row direction and Length; and when the number and length of the bright lines are less than a predetermined value, it is determined that the row electrode corresponding to the display cell row has been disconnected. 7 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 The aforementioned object of the present invention can be achieved by a display inspection method which is used for a display panel to inspect a line defect of a display panel. The display panel includes a plurality of column electrodes, and a plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrode and the row electrode. The display unit line is arranged in the column direction so that the light emitting color is The three colors are different from each other, and the three colors form a pixel, and the display cells with the same light emission color are arranged in the row direction. By controlling the light emission of the display cells arranged in a matrix shape in the display area, the display panel displays an image. The display inspection method has the following steps: let the display cell row located at the left or right end of the display area emit light; use an image sensor to detect the light-emitting display cell, is located close to the light-emitting display cell, and is located in the display area A display unit cell and a non-luminous display unit cell located outside the display area and outputting a video image; based on the output video Image, corresponding to the light emitting cell row at the left or right end, and detecting the number and length of bright lines in the row direction; and when the number and length of bright lines are less than a predetermined value, it is determined that the row electrode corresponding to the display cell row has occurred Open circuit. The foregoing object of the present invention can be achieved by a display inspection method for a display panel for inspecting a line defect between divided row electrodes on a display panel, the display panel including a plurality of columns of electrodes, and A plurality of row electrodes are arranged in the direction of the vertical column electrodes to form a display unit cell at the intersection of the column electrodes and the row electrodes. The row electrodes are divided in the row direction and the display area. The display panel is formed by dividing the day surface obtained by the division. When possible, the display unit cell is selected. When a column is taken as a unit, the display inspection method includes the following steps: by letting one of the upper and lower daylight surfaces obtained by the division emit monochromatic light; by using an image sensor to detect Detected as 8 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 Non-light-emitting segmented diurnal plane above and below the diurnal diurnal plane and output a video signal; based on the output video signal, the Detect a bright line in the direction of one line corresponding to the display cell row of the other day that should be divided up and down, and correspond to the detected bright line Display cell line, a short circuit between the electrodes is determined between electrodes divided column. The foregoing object of the present invention can be achieved by a display inspection method for a display panel for inspecting a line defect between divided row electrodes on a display panel, the display panel including a plurality of columns of electrodes, and A plurality of row electrodes are arranged in the direction of the vertical column electrode, and a display unit is formed at the intersection of the column electrode and the row electrode. The display unit line is arranged in the column direction so that the light emitting colors are three colors and are different from each other and form One pixel; and display cells with the same emission color are arranged in the row direction, the row electrode is divided in the row direction and the display area is divided, and the display panel is formed so that the divided day surface can be formed through the division while the display unit is selected. When a column is taken as a unit, the display inspection method includes the following steps: one of the upper and lower divided daylight planes is made to emit monochromatic light by segmentation; and the non-emission divided daylight plane is detected by using an image sensor The upper and lower sides of the day are divided into another day, and a video signal is output; based on the output video signal, the corresponding A display cell row on the other day surface of the lower divided day plane detects a bright line in one direction; and a display cell row corresponding to the detected bright line determines that an electrode short circuit occurs between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection method for a display panel, which is used to inspect a line defect of a display panel including a plurality of rows of electrodes, and a plurality of rows of electrodes arranged in a direction of a vertical column of electrodes, The display cell is formed at the intersection of the column electrode and the row electrode. The display 312 / Invention Specification (Supplement) / 92-10 / 92119384 9 200402676 display panel is a display cell arranged in a matrix form by controlling in a display area. The display inspection method includes the following steps: making the display cell of the display area emit light in a zigzag pattern; detecting the display cell of the display area by using an image sensor, and outputting a video signal Based on the output video signal, a dark line in the column direction is detected; and a 'display cell column' corresponding to the dark line that has been measured by the gamma line 'judgment electrode short circuit occurs between the column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. A display cell is formed at the intersection of the column electrode and the row electrode. The display panel displays an image by controlling the light emission of the display cells arranged in a matrix in a display area. The display inspection device is provided with a light-emitting device. , Which is used to give way to the display cell row at the top or bottom of the display area to emit light; an image sensor, which is used to detect the light-emitting display unit, which is close to the light-emitting display unit and is located in the display area A unit cell and a non-luminous display unit cell located outside the display area, and outputting a video signal; and a determining device for the video signal output by the image sensor, and correspondingly located at the top or bottom Display the direction of the unit cell row, check the number of bright lines and the length of the bright lines, and determine when the number and length of the bright lines are less than a predetermined value, determine The column electrode corresponding to the display cell row is disconnected. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. The display cell is formed at the intersection of the column electrode and the row electrode. The display panel is controlled by a display cell arranged in a matrix in a display area. 10 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 It emits light to display an image. The display inspection device is provided with: a light-emitting device for giving a display cell row at the left or right end of the display area to emit light; an image sensor for detecting a light-emitting display cell , A display unit cell located close to the light-emitting display unit cell and located in the display area, and a display unit cell which is non-luminous and located outside the display area, and outputs a video signal; The video signal output from the tester, and check the number of bright lines and the length of the bright lines corresponding to the direction of the display cell row at the left or right end, and The bright line length and the number of lines is less than the predetermined value, it is determined to display the corresponding row electrode line of the cell open circuit. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. The display unit cell is formed at the intersection of the column electrode and the row electrode, and the display unit cell is arranged in the column direction, so the light emitting colors are three colors and are different from each other, and a pixel is formed, and the display unit cells having the same light emitting color are formed. The display panel is arranged in a row direction. The display panel displays an image by controlling the light emission of display cells arranged in a matrix in a display area. The display inspection device is provided with a light emitting device for giving way to the display area. The left or right display cell line emits light; an image sensor for detecting a light-emitting display cell, a display cell located near the light-emitting display cell and located in the display area, and a non-light-emitting and located in the display area A display unit of the outer part, and outputting a video signal; and a judging device, which is based on the video output by the image sensor Signal, and check the number of bright lines and the length of the bright line in the direction corresponding to the display cell line located at the left or right end, and determine the line corresponding to the display cell line when the number and length of the bright lines are less than a predetermined value Electrode hair 11 312 / Invention specification (Supplement) / 92-10 / 921193 84 200402676 Open circuit. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used to inspect line defects between divided row electrodes of a display panel, the display panel includes a plurality of rows of electrodes, and the plurality of rows of electrodes are arranged vertically. The column electrode direction forms the display cell at the intersection of the column electrode and the row electrode, and the row electrode is divided in a display area in the row direction. The display panel thus formed can take one column as a unit, and at the same time select the divided daylight surface obtained by the division. A display unit, the display inspection device is equipped with: a light emitting device for emitting monochromatic light from one of the upper divided day surface and the lower divided day surface obtained through division; an image sensor for use An image sensor detects the other diurnal surface of the upper and lower divided diurnal surfaces as a non-luminous divided diurnal surface, and outputs a video signal; a determination device for detecting the upper and lower parts based on the output video signal Dividing the other day surface into a day line corresponds to a bright line showing a unit cell running in the row direction, and a display unit line that determines that a bright line should be detected. An electrode short occurs between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used to inspect line defects between divided row electrodes of a display panel, the display panel includes a plurality of rows of electrodes, and the plurality of rows of electrodes are arranged vertically. Column electrode direction to form a display unit cell at the intersection of the column electrode and the row electrode, the display unit line is arranged in the column direction, and its light emitting color is three colors, which are different from each other and form a pixel, and display crystals having the same light emitting color The cell lines are arranged in the row direction, and the row electrodes are divided in a display area in the row direction. The display panel thus formed can take one column as a unit, and at the same time select the display unit cell of the divided daylight surface obtained by the division. Light-emitting device, which is used for upper and lower division of the daytime surface and the lower division obtained by the division 12 312 / Invention Specification (Supplement) / 92-10 / 92119384 200402676 One of the pictures emits monochromatic light; an image sensor, which is For detecting the other day surface of the upper and lower divided day surfaces by using an image sensor as a non-light-emitting divided day surface, and outputting a video A judging device, which is based on the output video signal to detect the upper and lower divided day surfaces, corresponding to a bright line that displays the cell line in the row direction, and determines whether it should be detected The bright line shows the unit cell row, and an electrode short occurs between the divided column electrodes. The foregoing object of the present invention can be achieved by a display inspection device for a display panel. The method is used for inspecting line defects of a display panel, the display panel includes a plurality of rows of electrodes, and a plurality of rows of electrodes are arranged in a direction of a vertical column of electrodes. A display cell is formed at the intersection of the column electrode and the row electrode. The display panel displays an image by controlling the light emission of the display cells arranged in a matrix in a display area. The display inspection device is provided with a light emitting device. It is used to make the display unit cell in the display area emit light in a zigzag pattern; an image sensor is used to detect the display unit cell in the display area by using an image sensor and output a video signal; a judgment A device for detecting a dark line in a column direction based on the output video signal, and determining that an electrode short circuit occurs between column electrodes of a display cell row corresponding to the dark line. [Embodiment] (First specific embodiment) Hereinafter, a specific embodiment of a display inspection method for a display panel according to the present invention will be described with reference to Figs. 4 to 10. Fig. 4 is a block diagram showing a configuration of an inspection device for a display inspection method of a plasma display panel. FIG. 5 is a schematic diagram showing the electrode configuration of the plasma display panel 30 to be inspected. As shown in FIG. 4, the inspection device 100 includes an inspector main body 1, which is 13 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 for the illumination plasma display panel 30 during inspection. CCD camera 2 for capturing images on the display surface of plasma display panel 30, an image processing device 3 for receiving video images from CCD camera 2 and a control device 4 for controlling the inspector body 1, CCD camera 2 and images Processing device 3. The image processing device 3 includes an image processing section 3 a for performing image processing and analysis of luminous patterns (described later in detail), and an image processing memory 3 b for storing R, G, and B, each of which is supplied by the CCD camera 2 Image data, and an image processing theme memory 3c, for temporarily storing the image processing theme data. As shown in FIG. 5, the fixed address driver 11, an X sustain driver 12, and a Y sustain driver 13 are all connected to the electrodes of the plasma display panel 30, and are arranged on the inspector main body 1. As shown in Figure 5, the electric display panel 30 includes row electrodes Dir, Dig, Dlb, D2r, D2g, D2b ,. . . Dmr 'Dmg and Dmb, and the column electrodes XI to Xn and the column electrodes Y1 to Yn are disposed in the direction of the vertical row electrodes. As shown in FIG. 5, the row electrodes are designated to repeatedly associate the R cell, G cell, and B cell in the stated order. In the display area 30a, the R cell, the G cell, and the B cell system are repeatedly formed at the intersections of the row electrodes and the column electrodes X1 to X η and the column electrodes Y1 to Υ η. As shown in FIG. 5, the R cell, the G cell, and the B cell line are sequentially arranged to be processed in a set, and one pixel is formed by the set. An additional display area 30b is provided outside the display area 30a. As shown in FIG. 5, the column electrodes X1 to X η and the column electrodes Y1 to Υ η are interleaved and arranged in a comb shape, so they protrude from the opposite sides of each other. One of the column electrodes X1 to X η and one of the column electrodes Υ 1 to Υ η are assigned to a display cell column. The column electrodes XI to Xn and the column electrodes Υ1 to Υ η are arranged in parallel and opposed to each other in the 'one cell'. 14 312 / Invention Specification (Supplement) / 92-10 / 92119384 200402676 As shown in Figure 5, the row electrodes Dir, Dig, Dlb, D2r. . . Dmb is connected to the address driver 11, column electrodes X1 to X n are connected to the X sustain driver 1 2, and column electrodes Υ1 to Υη are connected to the Υ sustain driver 13. A driving method of the plasma display panel 30 will now be described. A field as a time interval for driving the plasma display panel 30 is composed of a plurality of sub-blocks S F1 to S F Ν. As shown in FIG. 6, in each sub-column, the addressing interval time of the unit cell to be lighted is selected, and a maintenance time period for allowing the selected unit cell to be continuously lit for a predetermined period of time. The reset interval for resetting the lighting state of the previous field is additionally provided for the header part of the first sub-field S F 1. During this reset interval, the unit cells are reset to light up the unit cells (units with wall charges formed in them) or to extinguish the unit cells (units without wall charges formed in them). In the former case, the predetermined unit cell is switched to the extinguished unit cell. In the case described later, the predetermined unit cell is switched to light up the unit cell at the subsequent addressing interval. Hold the SF1, SF2, and SF2 at intervals. . . The order of SFN is gradually extended. By changing the number of sub-fields that are continuously lit, a predetermined gradient can be displayed at the addressing interval of each sub-block shown in Figure 7, and the addressing is performed line by line. In other words, while the scanning pulse is applied to the column electrodes forming the first line, the pulse DPI is applied to the row electrodes Dir, Dig, Dlb, D2r according to the data pulse corresponding to the addressing data of a unit cell of the first line. . . Dmb. Subsequently, while a trace pulse is applied to the column electrode Υ 2 forming the second line, an address pulse DP 2 corresponding to the addressing data of a unit cell of the second line is applied to the line currents D 1 r, D 1 g, D 1 b, D 2 r ... D mb. The scanning pulse and the data pulse are applied simultaneously to one unit cell of the third line and to the cells of subsequent lines in the same manner. Finally, a scanning pulse wave is applied to the electrode forming the ηth line 之 312 / Invention Specification (Supplement) / 92-10 / 92119384 At the same time as the pole plus crystal 15 200402676, a data solution corresponding to the addressing data of a unit cell on the η line is applied to the row electrodes Dir, Dig, Dlb, D2r. . . Dmb. At a fixed time, the predetermined unit cell is switched from a lit unit cell to an extinguished unit cell, or from a unit cell to a lit unit. If the address scan is completed in this way, each unit cell stopped at the sub-unit is turned on or extinguished. In the subsequent sustaining interval, only the unit cell repeatedly emits light for each sustaining pulse. At the sustain interval, the sustain pulse and the Y sustain pulse are repeated to the column electrodes X 1 to X η and the column electrodes Y 1 to Υ η at a predetermined timing shown in FIG. 7. Set an erase interval in the final sub-block for all cell units to be turned off. By repeating the aforementioned block, it is possible to use a dynamic image to display the gradient display of the plasma display 3. FIG. 8 shows an example in which the plasma display panel is divided into upper regions, and the electrodes in each region are separated from each other. In this case, the addressing drivers 1 1 a and 1 1 b, the X sustaining driver 1 2 b, and the Y sustaining driver 1 3 a and 1 3 b connected to the display panel 31 are provided in the inspector as shown in FIG. 8. As shown in FIG. 8, the plasma display panel 31 includes row electrodes D1 r ′ Dlb, D2r, D2g, D2b,... Dmr, Dmg A Dmb, 歹, J electrodes X i and column electrodes Y1 to Y i are disposed on the vertical row electrodes. Direction, DAlr, DAlg, DAlb, DA2r, DA2g, DA2b, ". DAmr, D A m b and the column electrodes X i + 1 to X n and the column electrodes Y i + 1 to Y n are arranged in the direction of the straight electrode. Each row of electrodes is designated to connect the R cell, G cell, and B cell in the order cited. The R cell, G cell, and B crystal are formed on the row and column electrodes X1 to X η and the column electrodes Y1 to Υ η 312 / Instruction Manual (Supplement) / 92-10 / 92 Π 93 84 l wave DPn address interval The annihilation crystal is set to the second application time, and X is applied to the SFN cell. The plate 30 area and the lower plasma display 1 2a and the main body, D 1 g, XI to the row electrode DAmg, are placed at the intersection of vertical repeating cell repeating 16 200402676 points. In the same manner as in the case shown in FIG. 5, one R cell, one G cell, and one B cell system are successively disposed in a group, and one pixel system is composed of the group. The row electrodes Dir, Dig, Dlb, D2r, D2g, D2b, ... Dmr, Dmg, Dmb are connected to the address driver 11a. The row electrodes DAlr, DAlg, DAlb, DA2r, DA2g, DA2b, ... DAmr, DAmg, DAmb are connected to the address driver 1 1 b. The column electrodes X 1 to X i are connected to the X sustain driver 1 2 a. The column electrodes Y1 to Y i are connected to the Y sustain driver 1 3 a. The column electrodes X i + 1 to Xη are connected to the X sustain driver 1 2 b. The column electrodes Y i +1 to Υ η are connected to the Υ sustain driver 1 3 b. The driving method of the plasma display panel 31 is similar to the driving method of the plasma display panel 310 described above. Now, the inspection procedure of the upper end portion and the lower end portion of the plasma display panel 30 by using the inspection device 100 will be described. The inspection of the plasma display panel 31 divided into the upper and lower regions is also performed in the same manner. As shown in FIG. 4, a plasma display panel 30 is set on the inspector main body 1. Let one of the top display cell row and one of the bottom display cell row, that is, two rows of the display area of the plasma display panel 30 display the cell row to emit light. Make the middle area set between the display cell columns appear black (that is, make it not light). Display this pattern. 9A, 9B, 9C, and 9D display various light emitting patterns depending on whether there is an open circuit. Fig. 9A shows that there is no open circuit, and the two rows corresponding to the top and bottom show the light emitting pattern of the cell line with two bright lines. The pattern shown in FIG. 9A is the detection pattern for detecting an open circuit. Fig. 9B shows a light-emitting pattern in which the cell line at the bottom end is broken and the bright line at the bottom end is broken at the center. Figure 9C shows that the cell rows are broken at the top and bottom individually, and the bright lines at the bottom are broken at the center and 17 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676. pattern. FIG. 9D shows a light-emitting pattern in which each of the display cell rows at the top end and the bottom end has a broken line, there is no bright line at the top end, and the bright line at the bottom end is broken at the center. Such a light-emitting pattern of the plasma display panel 30 is captured by the CCD camera 2. The display processing device 3 analyzes the light emission pattern based on the image data supplied from the CCD camera 2. Fig. 10 is a flowchart showing the processing performed during the inspection. The processing shown in FIG. 10 is executed based on the control performed by the control device 4. At step S1 in FIG. 10, the pulse wave is driven to the plasma display panel 30, so the inspector body 1 displays the aforementioned detection pattern. As a result, the plasma display panel 30 is illuminated with the light emitting patterns shown in FIGS. 9A to 9D. In addition, the number of trips is initialized to zero. Then, the C C D camera 2 is used to capture a light-emitting pattern image (step S2). The image data of the photographed image is transmitted from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 3). The three colors of R, G and B are transmitted separately here. Subsequently, the image data stored in the image processing memory 3 b is used as the image processing area by setting the display cell row containing area at the top of the plasma display panel 30 as the image processing area (step S 4). This area is set to include a display unit located close to the aforementioned display unit array and located in the display area, and non-luminous (ie, a display unit in a black display area) and a portion outside the display area (ie, a location The unit cell is shown in the upper part of the display unit cell column. Subsequently, the image data in the preset area is stored in the image processing theme memory 3c (step S5). Then, based on the image data stored in the image processing subject memory 3c, a process of acquiring the light-emitting cell row from the display cell row located at the top is performed (step S6). Subsequently, it is determined whether the light-emitting cell array located at the top is in the light-emitting crystal. 18 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 When the determination is affirmative, the process proceeds to step S8. When the determination is negative, the process proceeds to step S 1 0 (step S 7). In step S8, the length of the captured light-emitting cell array is compared with the horizontal length of the display area 30 of the plasma display panel 30. It is then determined whether the horizontal length of a light-emitting cell row is shorter than the horizontal length of the display area of the plasma display panel 30. If it is determined that such a light-emitting cell array exists, the process proceeds to step S10. If it is determined that there is no such light-emitting cell array, the process proceeds to step S 1 1 (step S 9). At step S 1 0, the number of disconnection of the row electrode is increased by 1, and the process proceeds to step S 1 by the image data stored in the image processing memory 3 b, including the display cell located at the top of the plasma display panel 3 0 One area of the row is set as the image processing area in step S 1 1. This area is set to include a non-luminous display unit cell ', a display area (ie, a display unit cell in a black display area) located close to the aforementioned display unit cell row, and a portion outside the display area (ie, a display unit cell) The upper part of the cell column) shows the unit cell. The image data of the preset area is then stored in the image processing theme memory 3 c (step S 1 2). Then, based on the image data stored in the image processing theme memory 3c, a process of acquiring the light-emitting cell row from the display cell row at the bottom is performed (step S 1 3). Then, it is determined whether the light-emitting cell row capture process has captured the light-emitting cell row located at the bottom end. When the determination is affirmative, the process proceeds to step S 1 5. When the determination is negative, the process proceeds to step S 1 7 (step S 1 4). In step S15, the obtained length of the light-emitting cell row is compared with the horizontal length of the display area of the plasma display panel 30. It is then determined whether there is a light-emitting cell array having a horizontal length shorter than the horizontal length of the display area of the plasma display panel 30. If it is determined that such a light-emitting cell array exists, the process proceeds to step S 1 7. If it is determined that there is no such light-emitting cell array, the process is completed. At step S17, the column electrode 19 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 is added to the number of open circuits, and the process is completed. In this way, the light-emitting cell captured at the top is processed as shown in FIG. 10 (step S6). If the light-emitting cell row is not captured (No in step S7), the number of breaks is increased by 1 (step S10). The case where the light emitting cell row is not captured corresponds to the case where the top display cell row is not lit, as shown in FIG. 9D. Indicates that the top display unit cell column is open. Therefore, in this case, the number of disconnections is increased by 1. If the length of the captured light-emitting cell row is shorter than the horizontal length of the display area of the plasma display panel 30 ("existence" in step S9), the number of disconnections is calculated. 1 (step S 1 0). The case where the length of the captured light emitting cell row is shorter than the horizontal level of the display area corresponds to the case of the central branch of the top light emitting cell row shown in FIG. 9C. Indicates that the top display cell array is open. So in this case add 1 to the number of trips. In addition, in the processing shown in FIG. 10, the light-emitting cell row at the bottom is captured (step S 1 3). If the light-emitting cell array is not captured (No in step S 1 4), the number of disconnections is increased by 1 (step S 1 7). The case where the light emitting cell row is not captured corresponds to the case where the bottom display cell row is not lit. The display unit cells at the bottom end are listed as roads. So in this case, the number of trips is increased by one. If the length of the captured cell row is shorter than the horizontal length of the display area of the plasma display panel 30 ("existence" in step S 16), then the number of disconnections is increased by 1 (step S 1 7). The case where the length of the captured light emitting cell row is shorter than the horizontal length of the display area is the case where the center of the light emitting cell row at the bottom end shown in FIG. 9B or 9 D is broken off, indicating that the display cell row at the bottom end is broken. Therefore, in this case, add 1 to the number of disconnections. For example, using the display pattern shown in FIG. 9A as an example, the light-emitting cell at the top is captured (YES in step S7), and the length of the light-emitting cell row is no more than that of electricity. Slurry 312 / Invention Manual (Supplement) / 92-10 / 921193 84 The way in which the column is listed is shown to be lowered suddenly due to the light cut off at the end. It is displayed to 20a. 20 200402676 The horizontal length of the display area of the display panel 30 is short ( Step S9 is `` Does not exist. In addition, the light-emitting cell row at the bottom is extracted (YES at step S 1 4). The length of the light-emitting cell row is not shorter than the display area of the plasma display panel 30 (the step S 1 6 is "not present." ”). Therefore, in this case, it is found that the two ends of the end and the bottom end show that there is no disconnection of the column electrode. In this case, the number of interruptions in the process count shown in FIG. 10 becomes 0. The display pattern shown in FIG. 9B is For example, the light-emitting cell row at the top is taken (YES in step S7), and the length of the light-emitting cell row is not shorter than the horizontal length of the display area of the plasma display panel 30 (step S9 is "not present"). The light-emitting cell row at the bottom is captured (YES at step S 14), but the length of the cell row is shorter than the horizontal length of the display area of the plasma display panel 30 (S 16 is "existent"). Therefore In this case, it is found that there is no open circuit in the display column at the top, but there are open electrodes in the display cell column at the bottom. In this case, the number of open circuits in the process count shown in FIG. 10 becomes 1. For example, in FIG. 9C The display pattern shown is an example. The light-emitting column at the top is captured (YES in step S7), but the light-emitting crystal The column length is shorter than the horizontal length of the display area 30 of the electric display panel (step S9 is "existent"), and the light-emitting cell row at the bottom end is captured (YES in step S14), and the light-emitting cell is The length of the column is longer than the level of the display area of the plasma display panel 30 ("S" in step S16). Therefore, it is found in this case that the two rows of the top cells show that the column electrodes are open. In this case The number of open circuits counted in the process shown by e becomes 2. Taking the pattern shown in FIG. 9D as an example, the light-emitting cell row at the top is not (no at step S7). In addition, the light-emitting cell row at the bottom is Step S 1 4 is Yes), but the length of the light-emitting cell row is longer than that of the plasma display panel 312 / Invention Specification (Supplement) / 92-10 / 921193 84 > : Outside, light crystal: step unit cell seeding unit cell cytoplasm display> 〇 However, the degree is short and the bottom I 1 0 is extracted (in the horizontal display length of the display area at 30 display 21 200402676 is short (step S 1 6 is " Existence "). Therefore, it is found that the display cell rows at the top and bottom have broken circuits. In this case, the plan for processing shown in Figure 10 The number of open circuits becomes 2. In the display inspection method of the display panel according to this embodiment, the detection pattern that only lights up the display cell rows located at the top and bottom of the display area is used as described above. The results can ensure these The gradient difference between the display cell rows and the additional display intervals adjacent to these display cell rows. Therefore, it is possible to reliably detect whether the display cell rows at the top and bottom ends have electrodes disconnected. In the foregoing specific embodiments, Explains the case of checking a single display cell row at the top and bottom. However, this specific embodiment can also be applied to the case of simultaneously checking the top or bottom display unit cell rows (such as two rows of display cell rows). In this case, the number of light emitting display cell rows or the number of open circuit cell rows may be determined based on the thickness of the bright line. (Second Specific Embodiment) As shown in FIG. 4, a plasma display panel 30 is set to the inspector main body 1. As a result, one unit cell is displayed on the left end and one unit cell is displayed on the right end, that is, the display area of the plasma display panel 30 displays a total of two unit cell rows to emit light. Insertion in a middle region between the rows of these display cells causes the display to be black (i.e., to keep it from emitting light). Display such a pattern. Each pixel row includes three adjacent display cell rows, that is, R, G, and B display cell rows. 11A, 11B, 11C, and 11D show various light emitting patterns depending on whether there is an open circuit. Fig. 11A shows that there is no open circuit. At the left end and the right end, there is a light emitting pattern corresponding to one pixel row with a bright line consisting of three display cell rows (R, G, and B). In this case, a total of six display cells emit light at the left and right ends without missing parts. The luminous pattern shown in Fig. 1A is the detection pattern of the open circuit 22 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676. Fig. 1 1B shows that the display cell row (R) at the right end has one path, and the display cell row (R) containing the bright line at the right end is cut off at the center. Fig. 11C shows a light pattern in which the display cell row (R) at the right end has an open circuit, and the display cell row (R) containing a bright line at the right end does not emit light at all. Fig. 1 1 D shows a light-emitting case in which the cell line is broken at the right end. Taking FIG. 11D as an example, a part of the display unit row (R) including the bright line at the right end does not emit light, and the display unit row (R) is divided into an upper part and a lower part. Figure 12 is a flowchart showing the processing performed during the inspection. The positions shown in FIG. 12 are based on the control performed by the control device 4. At step S 2 1 in FIG. 12, the driving pulse wave is supplied from the inspector main body 1 to the display panel 30, so that the aforementioned detection pattern is displayed. As a result, the plasma display surface 30 is illuminated, for example, with the light emitting patterns shown in FIGS. 1A to 1D. In addition, the number of ways value is initially zero. Then, a luminescent camera image is captured by the CCD camera 2 (step S22). The image data of the captured image is input from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 2 3). The three colors of R, G and B are transmitted separately. Then, the image data stored in the image processing memory 3 b is set as the image processing area in the enclosed area of the pixel row (three display cell row) at the left end of the electric display panel 30 (step S 2 4). This area is set to include the display unit cell located in the display area next to the aforementioned display pixel row, and including the light (that is, the display unit cell in the black display area) and the outer portion of the display area (that is, the display unit cell). The left side of the row) shows the unit cell. The image data in the setting area is then stored in the image processing theme memory 3c (step S25). Then based on the image data 312 / Invention Manual (Supplement) / 92-10 / 92119384 stored in the image processing theme memory 3 c An extraction process from the display cell row at the left end is performed (step S 2 6). It is then determined that the light at the left end is captured in the capture process of the light-emitting cell row. Below, the process proceeds to step S28. If the determination is negative, the process proceeds to step S 3 0 (step S 2 7). At step S 28, the length of (R) and the water in the display area of the plasma display panel 30 are captured to determine whether there is a light-emitting cell row (R) whose vertical length is short. The vertical length of the display area of the panel 30 is short. If it is determined that there is (R), the process proceeds to step S 3 0. If it is determined that there is no (R), the process proceeds to step S 3 1 (step S 2 9). The number of disconnection of the row electrode is increased by 1, and the process proceeds to step S31. All three rows form the left-side unit cell row (R, G, and B), and it is determined that steps S24 to S30 are completed. In the case of a negative determination, the process returns to the step of repeating the process of step S 2 4 for the next display cell row (for example, G). If the determination at step S 3 1 is affirmative, then S 3 2. After the processes of displaying the unit cell to S30 for each color (R, G, and B) have been performed, the process proceeds to step S32. The image data stored in the image processing memory 3b is located in the pixel row (three! Area) at the right end of the plasma display panel 30 as an image processing area (step S 3 2). This area is close to the foregoing display pixel line and is located in the display area. The display data of the display light (that is, the display cell in the black display area) and the image data of the display crystal area (that is, the right part of the display cell row) are stored in the image processing theme memory 312 / invention manual (Supplement) ) / 92-10 / 921193 84 L cell line (R) place 3 means whether the cell line (R) is affirmative, compared with the flat length of the light-emitting cell line before processing. The degree is specific The display shows that this type of light-emitting cell is in step S30, and whether the processing of displaying the pixel row of S3 1 ° has been performed in step S2 4, and the processing at each step and subsequent steps proceeds to step-by-step and executes the step. In the S 2 4 material, the subsequent setting page does not include a unit cell), including a unit cell that is set to include a position, and a part of the cell outside the display area. Then, preset 3c (step S33). 24 200402676 Subsequently, based on the image data stored in the image processing theme memory 3c, the mining process of the light-emitting cell row (R) of the display-less cell row at the right end is performed (step S 3 4). It is then determined whether or not the light-emitting cell row (R) located at the right end is captured in the capturing process of the light-emitting cell row. If the determination is affirmative, the process proceeds to step S36. If the determination is negative, the process proceeds to step S 3 8 (step S 3 5). At step S 36, the length of the obtained light-emitting cell row (R) is compared with the vertical length of the display area of the plasma display panel 30. It is then determined whether there is a light-emitting cell row (R) whose vertical length is shorter than the vertical length of the display area of the plasma display panel 30. If it is determined that such a light-emitting cell row (R) is present, the process proceeds to step S38. If it is determined that there is no such light-emitting cell row (R), the process proceeds to step S39 (step S37). In step S38, the number of disconnections of the row electrode is increased by 1, and the process proceeds to step S39. At step S 39, all three display cell rows (R, G, and B) of the pixel row at the right end are formed, and it is determined whether the processes of steps S 3 2 to S 3 8 have been completed. If the determination is negative, the process returns to step S 3 2, where step S 3 2 and subsequent steps are repeated for the next displayed cell row (for example, G). If the determination at step S 39 is affirmative, the process is completed. After the display cell rows of each color (R, G, and B) have performed the processing of steps S 2 to S 30, the processing is completed. As described above, the light-emitting cell row at the left end is captured in the process shown in FIG. 12 (step S 2 6). If the light-emitting cell row has not been captured (No in step S 2 7), the number of disconnections is increased by 1 (step S 3 0). The case where the light-emitting cell row is not captured is equivalent to the case where the light-emitting cell row (here, the light-emitting cell row on the right end) shown in FIG. 11C is not illuminated. Indicates that the left-side light emitting cell is disconnected. Therefore, in this case, the number of open circuits is increased by one. If the captured luminous unit cell 25 312 / inventory description supplement) / 92-10 / 921193 84 200402676 is longer than the vertical long shoulder S 2 9 of the display area of the plasma display panel 30, it is "exist"), Then, the case where the length of the light-emitting cell row plus 1 (step S 3 0) is shorter than the vertical length of the display area is the light-emitting cell row shown in FIG. 1 1 B and FIG. The case where it is cut off in the middle. It indicates that the left-side light-emitting cell traveler therefore adds 1 to the number of broken circuits in this case. In addition, in the processing shown in FIG. 12, one light-emitting light at the right end is captured (Step S 3 4) . If the light-emitting cell row has not been captured (No in step S 3 5), the number of channels is increased by 1 (step S 3 8). When the light-emitting cell row is not captured The light-emitting cell row on the right is not lit. This is shown in the right cell line is open. Therefore, in this case, the length of the light-emitting cell row obtained by adding 1 to the number of disconnections is shorter than the display degree of the plasma display panel 30 (step S 37 is "existent"), then 1 is added to the number of disconnections (step is captured The length of the light-emitting cell row is shorter than the vertical length of the display area when the light-emitting cell at the right end is broken in the middle. It indicates that the light-emitting cell line is open. Therefore, the number of open circuits is increased by 1 in this case. < For example, taking the light emitting pattern shown in FIG. 1A as an example, all the whole cell rows at the left end are captured (YES in step S 2 7), and the light emitting cell is vertical to the display area of the plasma display panel 30. Short in length (step S 2 9 is in "). In addition, all three light-emitting cell rows at the right end are false), and the length of the light-emitting cell rows is not shorter than the vertical length of the plasma display surface handle region (step S37 is "not present"). Therefore, in the left and right display cell rows, no row electrode breaks were seen in the display cell row. The number of breaks in the process count shown in FIG. 12 becomes zero. Take the luminous pattern shown in Figure 1 1 B as an example. All three 312 / Invention Instructions (Supplements) / 92-10 / 921193 84 at the left end are short (steps. Equivalent to the cell line of Figure L). There is an open circuit. . ^ Cell line (step, the end of the situation is quite endemic. If the excavated area is vertical step S 3 8). The situation is that the length of the three luminous lines at the right end of the hairline is not "not saved" (shown in step .30, this way of thinking. Therefore, the luminescence cell 26 200402676 lines are all retrieved (YES in step S 2 7), and The length of the light-emitting cell row is not shorter than the vertical length of the display area of the plasma display panel 30 (step S 29 is "not present"). In addition, all three light-emitting cell rows at the right end are captured (step S 3 5 (Yes), but the length of the light-emitting cell row (R) is shorter than the vertical length of the display area of the plasma display panel 30 (“Existence” in step S37). Therefore, in this case, it is found that there is no open circuit at the left end. , But the right end shows that the cell row (R) has a row of electrode disconnection. Therefore, the number of disconnections in the process count shown in Figure 12 becomes 1. For example, taking the light-emitting pattern shown in Figure 1 1 C as an example, all three light-emitting unit cells at the left end The rows are all captured (YES in step S 2 7), and the length of the light-emitting cell row is not shorter than the vertical length of the display area of the plasma display panel 30 (step S29 is "not present"). In addition, the light-emitting cell row at the right end is The light-emitting cell row (R) is not captured (step S 3 5 is No). As for the other two light-emitting cell rows (G and B) located at the right end, the determination in step S 3 5 is yes, and the determination in step S 3 7 is "non-existent". Therefore, it is found in this case The left side shows that the cell line is not open, but the right side shows that the cell line (R) has a line electrode open. Therefore, the number of open counts in the process count shown in FIG. 12 becomes 1. Take the light emitting pattern shown in FIG. 1 1 D as an example All three light-emitting cell rows at the left end are captured (YES in step S 2 7), and the length of the light-emitting cell rows is not shorter than the vertical length of the display area of the plasma display panel 30 (step S29 is "not present") In addition, all three light-emitting cell rows at the right end are captured (YES in step S 35), but the length of the light-emitting cell row (R) is shorter than the vertical length of the display area of the plasma display panel 30 (step S 3 7 is "existence"). Therefore, in this case, it is found that there is no open circuit at the left display cell line, but there is a disconnection of the row electrode at the right display cell line (R). Becomes 1. In the display inspection method of the display panel according to the present invention, only the bit is lit 27 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 The detection patterns of the display cell rows at the left and right ends of the display area are used as before. The result can ensure that these display cell rows and adjacent displays In addition, the gradient difference of the unit cell interval is displayed. Therefore, it is possible to reliably determine whether there is a row electrode disconnection at the display cell row at the end and the right end. In the foregoing specific embodiments, the multiple displays formed at the left or right pixel row have been described The unit cell row (three rows showing the unit cell row) is taken as an example. However, this specific embodiment can also be applied to the case of checking a monochromatic display and checking the unit cell row displayed at one of the left or right end, for example. (Third embodiment) As shown in FIG. 13, actuators 1 1 a and 1 1 b connected to electrodes of the plasma display panel 3 1, X sustain drivers 1 2 a and 1 2 b, and Y-dimensional devices 1 3 a and 1 3 b are provided.于 Checker body 1. As shown in FIG. 13, the plasma display panel 31 is cut into the upper region and the electrodes of each region are separated from each other. As shown in FIG. 13, the row electrodes D1 r, Dlb, D2r, D2g, D2b,... Dmr, Dmg and Dmb, the J1J electrode X i and the column electrodes Y 1 to Yi are disposed in the upper area of the plasma display panel. The power to D m b is connected to the address driver 1 1 a. The column electrodes X 1 to X i to X sustain the driver 12 a. The column electrodes Y1 to Y i are connected to the Y actuator 1 3 a. Row electrodes DAlr, DAlg, DAlb, DA2r, DA2g, DA2b, ... DAmg and DAmb, 歹 1J electrodes Xi + 1 to Xn and column electrodes Yi + 1 to fly are placed in the lower area of the plasma display panel 31. The row electrodes D A 1 r to D A m b are address drivers 1 1 b. The column electrodes X i + 1 to X n are connected to the X-dimensional device 1 2 b. The column electrodes Yi + 1 to Υ η are connected to the Y sustain driver as shown in Figure 13 and the row electrodes are designated in the order of quotation and 312 / Invention Specification (Supplement) / 924 0/921193 84 One of the inspection panels is located at the left end of the drive panel to address the drive driver's lower area. Dig, XI to the pole D 1 r are connected to maintain the drive. D Amr, (η are connected to the drive 1 3b ° Repeatedly closed 28 200402676 R cell , G cell, and B cell. In the display region 41 ^ R cell, G cell, and B cell are formed at the intersections of the row and column electrodes X 1 to X η and the column electrodes Υ1 to Υ η, respectively. As shown in FIG. 13, the R cell, G cell, and B cell line successively disposed are treated as a group, and the group forms one pixel. The additional display area area 4 7 is arranged outside the display area 41. As shown in FIG. 13, the column electrodes X1 to X η and the column electrodes Υ1 to Υ η are arranged in a staggered comb shape, and will not protrude from opposite sides. One of the column electrodes X1 to X η and the column electrode Υ 1 One of Υ η is assigned to a display cell row. Inside a unit cell, the column electrodes X1 to X η and the column electrodes Υ1 to Υ η are connected in parallel. The row electrodes D 1 r to D mb and the row electrodes DA 1 r to DA mb are longitudinally separated in the middle part of the display area 41. The arrangement of the row electrodes will be further explained later. Now the use of the inspection device will be explained. 1 0 0 The procedure for checking the short circuit between the electrodes of the plasma display panel 31. As shown in FIG. 4, the plasma display panel 31 is set to the inspector main body 1 at the time of inspection, and the upper area of the display area 41 of the plasma display panel 31 is set. And one of the lower areas all emits monochromatic light (such as R color). At this time, the entire area of the other area is displayed black (that is, it is not allowed to emit light). Figure 1 4 A, 1 4 B, and 1 4 C display basis The luminous pattern of whether there is a short circuit between the row electrodes. Figure 1 4 A shows that there is no short circuit between the row electrodes, and the entire area 4 2 above the display area 41 emits monochromatic light. At this time, there is no light emitting cell in the lower area 43. Figure 1 The light-emitting pattern shown in 4 A is to check the short-circuit between the row electrodes. Such a check pattern. Figure 1 4 B is a light-emitting pattern in the case of a short-circuit between the row electrodes. Figure 1 4 C is a schematic diagram showing the short-circuit between the row electrodes. Row electrode group 1 0 1 row electrode and row electrode group 1 0 2 row electrode set in lower zone The short circuit part between 0 and 3 is 29 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 is shown in Figure 1 4 C. If there is such a short circuit between the row electrodes, it is set in the row of the upper area 4 2 The electrodes and the rows of electrodes arranged in the lower section 43 are connected to each other through the short-circuit part 1 0 3. The cells in the first line (bright line) 104 emit light, and the bright line 10 4 runs along the row electrode group 102 The electrodes are connected to the row electrodes of the row electrode group 101. As a result, short circuits between the row electrodes can be checked. The luminescent pattern of such a plasma display panel 31 is captured by a CCD camera 2. The image processing device 3 analyzes the light emission pattern based on the image data supplied from the CCD camera 2. Fig. 15 is a flowchart showing the processing performed during the inspection. The processing shown in FIG. 15 is executed based on the control performed by the control device 4. At step S 41 in FIG. 15, a driving pulse wave is supplied from the inspector body 1 to the plasma display panel 31 to display the aforementioned detection pattern. As a result, for example, in the light emitting pattern shown in FIG. 14A or FIG. 14B, the plasma display panel 31 is turned on. The flag value indicating whether there is a short-circuit position is initialized to a value indicating "no short-circuit position". Then, a luminescent camera image is captured by the CCD camera 2 (step S42). The captured image is transmitted from the CCD camera 2 to the image processing memory 3b of the image processing device 3 (step S43). Three-color R, G, and B data are transferred to separate memory areas. Then, a memory area is set to store the luminescent color (R, G, or B) as the subject of image processing, that is, the data that becomes the subject of image processing is set (step S 4 4). Then, based on the image data stored in the image processing memory 3b, an approximate straight line that approximates the middle bisector is obtained (step S 4 5). ‘Then, in the image data stored in the image processing memory 3 b, the entire upper or lower area that has not changed into light emission is set as the image processing area (step S46). The setting of the image processing area here takes the approximate straight line obtained in step S 4 5 processing 30 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 as a reference point. For example, if the inspection pattern is the whole area of the lower area 43 and the central bisector area included in FIG. 14A, the image processing area is performed in step S46. Then, based on the image processing theme memory 3c, the capture processing of the luminous points or luminous lines in the image processing area is performed. Here, the extraction of the luminous points or luminous lines is performed in step S 4 4. For example, taking the luminous pattern shown in FIG. 14B as an example, it is captured by the bright line 104. The luminous patterns or luminous lines shown in Fig. 1 4A have not been captured. Subsequently, in step S 4 8, it is decided to use the processing in step S 4 7 to emit light points or lines. If the determination is positive, the process proceeds. If the determination is negative, the process proceeds to step S50. There is a short circuit between multiple rows of electrodes, a flag indicating whether there is a short circuit. The illuminated color indicates "the location of a short circuit". Processing then proceeds from step S 51. On the other hand, at step S50, there is a gap between the row electrodes, and the flag value indicates whether there is a change in the relevant emission color. The process then proceeds from step S 50 to step S 5 1 at step S 5 1 to determine at step S 4 1 and subsequent steps as to whether all the emission colors of R, G, and B have ended. The processing returns to step S 41 and the processing proceeds to the next luminous color. If the determination is affirmative, the processing shown in FIG. 15 is ended. In the process, the individual emission colors (R, G, and B) have been processed.
就R、G及B各色而言，檢查是否有行電 藉前文說明之處理進行。對發光色R、G及B 312/發明說明書(補件)/92-10/92119384 示圖案，則包 被設定作為影 之影像資料， (步驟 S47)。 定之發光色執 光點或發光線 為例，發光點 是否已經擷取 至步驟 S49。 卜驟S49，判定 標值，就相關 S49前進至步 短路判定為不 短路位置並未 〇 驟進行的處理 会判定為否定， (例如G色）。 驟S41至 S50 ，結束全部處 極間之短路係 各色而言，係 31 200402676 基於旗標判定行電極間是否短路。 於根據本具體實施例之顯示面板之顯示檢查方法，只有 經由於縱向分割顯示面板形成的上區及下區其中之一才讓 其發光，於上區及下區之另一區的發光晶胞經擷取。因此 可確定偵測得行電極間之短路。 前述具體實施例中，顯示一範例，其中檢查有三發光色 晶胞排列之彩色顯示面板。但根據本發明之顯示面板之顯 示檢查方法也應用於檢查具有單色晶胞排列之單色顯示面 板。此種情況下只讓其中一區的晶胞發光，進行檢查另一 區是否有發光晶胞。 (第四具體實施例） 現在說明使用檢查裝置 1 0 0進行檢查電漿顯示面板 3 0 之列電極間是否短路之程序。被平分為上區及下區之電漿 顯示面板3 1之檢查也可以相同方式執行。 如圖4所示，電漿顯示面板3 0係設定於檢查器主體1。 讓具有鋸齒形格狀形式之發光圖案顯示於電漿顯示面板 3 0之顯示區。圖1 6 A顯示列電極間無短路之發光圖案。圖 1 6 A中，標示為「R」、「G」及「B」之各區分別表示紅、綠 及藍發光晶胞。其它區表示非發光晶胞。圖1 6 A所示圖案 即為偵測得列電極間短路之該種偵測圖案。電漿顯示面板 3 0中，R、G及B色顯示晶胞排列於列方向之R、G及B色 顯示晶胞如前文說明形成一個像素。因此如圖1 6 B所示， 顯示區3 0 a全面顯示白黑鋸齒格形圖案。 圖1 7 A至1 7 C顯示當列電極間有短路時之發光圖案。圖 1 7 A顯示顯示區3 0 a之列電極出現黑線1 1 1 (暗線）之範例。 32 312/發明說明書(補件)/92-10/92119384 200402676 如圖 1 7 B所示，包括原先應發光之顯示晶胞之二條顯示 線，於黑線1 1 1部分未發光。 圖1 7 C為略圖顯示列電極間之短路。如圖1 7 C所示，列 電極Y i與列電極X i + 1間短路，因而透過短路部分1 1 2分 別關聯毗鄰顯示晶胞。若出現此種由短路部分11 2引發的 短路，則含括於二線且對應於彼此短路之列電極之顯示晶 胞未發光。結果導致有黑線之發光圖案，如圖1 7 A及1 7 B 所示。 圖1 8為流程圖顯示檢查時進行的處理。圖1 8所示檢查 係基於控制裝置4進行之控制執行。 於圖1 8步驟S 6 1，由檢查器主體1供給驅動脈波給電漿 顯示面板3 0，俾顯示圖1 6所示檢查圖案。結果電漿顯示 面板3 0例如係以圖1 6 A及圖1 6 B或圖1 7 A及1 7 B所示發光 圖案而被點亮。隨後藉CCD攝影機2拍攝發光圖案影像（步 驟S 6 2 )。拍攝之影像之影像資料由CCD攝影機2傳輸至影 像處理裝置3之影像處理記憶體3 b (步驟S 6 3 )。此處R、G 及B三色資料係分開傳輸。 接著於儲存於影像處理記憶體 3 b之影像資料中，電漿 顯示面板3 0之顯示區3 0 a全部被設定為影像顯示區，如此 設定之影像顯示區之影像資料係儲存於影像處理主題記憶 體3 c (步驟S 6 4 )。 隨後，基於儲存於影像處理主題記憶體3 c之影像資料， 執行擷取顯示區3 0 a之黑線之處理（步驟S 6 5 )。隨後決定 步驟S 6 5進行黑線擷取處理時，黑線是否已經由顯示區3 0 a 被擷取（步驟 S 6 6 )。若判定為肯定，則執行列電極間有短 33 312/發明說明書(補件)/92-10/921193 84 200402676 路之顯示（步驟 S 6 7 )。若判定為否定，則執行列電極 短路之顯示（步驟S 6 8 )。於各情況下結束圖1 8之處ί! 若於步驟S65，發光圖案為圖16Α及圖16Β所示該 測圖案，則未出現黑線。由於此種情況下，步驟S 6 6 定導致否定，故判定列電極間並無短路。以圖1 7 Α及圈 所示發光圖案為例，擷取黑線。因此種情況下，步驟 之判定結果為肯定，故判定列電極間有短路。 如此於圖1 8所示處理，讓電漿顯示面板3 0顯示鋸 狀檢查圖案。此種情況下若列電極間有短路，則黑線 於對應線上。因此本具體實施例中，執行黑線擷取處3 驟S 6 5)。若擷取黑線，則判定列電極間有短路。若未 黑線，則判定列電極間並無短路（步驟S 6 6、S 6 8 )。結 確定偵測得列電極間是否短路。 前述具體實施例中已經說明具有R、G及B三發光 彩色顯示面板。但於單色顯示面板也可採用單色鋸齒 圖案作為檢查圖案。 第一至第四具體實施例舉例說明電漿顯示面板 查。根據本發明之顯示面板之顯示檢查方法也可寬廣 至其它顯示面板。 可未悖離本發明之精髓或必要特性而以其它形式 實施本發明。因此就各方面而言，此等具體實施例須 為舉例說明而非限制性，本發明之範圍係由隨附之申 利範圍而非由前文說明指示，因此落入申請專利範圍 義及相當範圍之全部變化意圖皆涵蓋於本發明之範圍 【圖式簡單說明】 312/發明說明書(補件)/92-10/921193 84 間無 〇 種偵 之判 1 7B S66 齒格 出現 !(步 擷取 果可 色之 格狀 之檢 應用 具體 考慮 請專 之定 34 200402676 圖1A及1B為略圖顯示習知檢查方法，其中圖1A為略 圖顯示中間部分之斷路，以及圖1 Β為略圖顯示端部斷路； 圖2Α及2Β為略圖顯示習知檢查方法，其中圖2Α為略 圖顯示中間部分之斷路，以及圖2Β為略圖顯示端部斷路； 圖3為略圖顯示習知檢查方法； 圖4為方塊圖顯示用於電漿顯示面板之顯示檢查方法之 檢查裝置組態； 圖5為略圖顯示欲檢查之電漿顯示面板之電極配置； 圖6為略圖顯示一攔位之組態； 圖7為流程圖顯示驅動脈波； 圖8為略圖顯示電漿顯示面板被平分為上區及下區之範 例； 圖9Α、9Β、9C及9D為略圖顯示依據是否有斷路之各種 發光圖案，其中圖9Α為略圖顯示並無斷路之情況，圖9Β 為略圖顯示底端顯示晶胞列有斷路之情況，圖9 C為略圖顯 示於頂端以及底端個別之顯示晶胞列有斷路之情況，以及 圖 9 D為略圖顯示於頂端以及底端個別之顯示晶胞列有斷 路之情況； 圖1 0為流程圖顯示檢查時進行的處理； 圖11Α、11Β、11C及11D為略圖顯示依據是否有斷路而 定之各種發光圖案，其中圖 11Α為略圖顯示無斷路之情 況，以及圖1 1 Β、1 1 C及1 1 D為略圖顯示右端顯示晶胞列有 斷路之情況； 圖1 2為流程圖顯示檢查時進行的處理； 圖1 3為略圖顯示欲檢查之電漿顯示面板之電極配置； 35 312/發明說明書(補件)/92-10/921193 84 200402676 圖1 4 A、1 4 B及1 4 C為略圖顯示依據行電極間是否有短 路而定之發光圖案，其中圖14A為略圖顯示行電極間無短 路之情況，圖1 4 B為略圖顯示行電極間有短路之情況，以 及圖1 4 C為略圖顯示行電極間有短路之情況； 圖1 5為流程圖顯示檢查時進行的處理； 圖 1 6 A及 1 6 B為略圖顯示列電極間並無短路之發光圖 案，其中圖16A為略圖顯示各晶胞是否發光以及圖16B為 略圖顯示鋸齒格狀圖案； 圖1 7 A、1 7 B及1 7 C為略圖顯示當列電極間有短路情況 之發光圖案，其中圖17A為略圖顯示全顯示區，圖17B為 略圖顯示圖1 7 A之部分放大視圖，以及圖1 7 C為略圖顯示 列電極間之短路部分；以及 圖1 8為略圖顯示行電極間有短路之情況。 (元件符號說明） 1 檢查器主體· 2 CCD攝影機 3 影像處理裝置 3a 影像處理區段 3b 影像處理記憶體 3c 影像處理主題記憶體 4 控制裝置 11 定址驅動器 1 1 a、1 1 b 定址驅動器 12 X維持驅動器 1 2 a、1 2 b X維持驅動器 36 312/發明說明書(補件)/92-10/921193 84 200402676 13 Y 維 持 驅： % 器 13a、 13b γ η [持驅動 30 電 漿 顯 示 面 板 3 0b 顯 示 區 30b 額 外 顯 示 區 區域 31 電 漿 顯 示 面 板 41 顯 示 區 42 上 區 43 下 區 100 檢 查 裝 置 10 1 行 電 極 組 102 行 電 極 組 103 短 路 部 104 亮 線 111 黑 線 112 短 路 部For each of the R, G, and B colors, check whether there is a line of credit. For the emission colors R, G, and B 312 / Invention Specification (Supplement) / 92-10 / 92119384, the package is set as the image data of the shadow, (step S47). For example, whether the light emitting point has been captured by step S49. In step S49, the target value is determined, and the relevant S49 is advanced to step S49. The short-circuit is determined to be not short-circuited. The processing performed in the step is determined to be negative (for example, G color). Steps S41 to S50, ending all short-circuits between electrodes. For each color, it is 31 200402676 to determine whether there is a short-circuit between the row electrodes based on the flag. In the display inspection method of the display panel according to this embodiment, only one of the upper and lower regions formed by vertically dividing the display panel is allowed to emit light, and the light-emitting cell in the other region of the upper and lower regions is allowed to emit light. After capture. Therefore, a short circuit between the detected electrodes can be determined. In the foregoing specific embodiment, an example is shown in which a color display panel having a three-emission color cell arrangement is examined. However, the display inspection method of a display panel according to the present invention is also applicable to inspect a monochrome display panel having a monochrome unit cell arrangement. In this case, let only the unit cell in one region emit light, and check whether there is a light-emitting cell in the other region. (Fourth specific embodiment) A procedure for inspecting whether the electrodes of the plasma display panel 30 are short-circuited using the inspection device 100 will now be described. The inspection of the plasma display panel 31, which is equally divided into an upper area and a lower area, can be performed in the same manner. As shown in FIG. 4, the plasma display panel 30 is set to the inspector main body 1. Let the light-emitting pattern with a zigzag grid form be displayed on the display area of the plasma display panel 30. FIG. 16A shows a light emitting pattern with no short circuit between the column electrodes. In Figure 16A, the areas labeled "R", "G", and "B" represent red, green, and blue light-emitting cells, respectively. The other regions represent non-luminescent cells. The pattern shown in Figure 16A is the type of detection pattern for detecting shorts between the column electrodes. In the plasma display panel 30, the R, G, and B color display cells are arranged in the column direction. The R, G, and B color display cells form a pixel as described above. Therefore, as shown in FIG. 16B, the display area 30a fully displays the white and black zigzag pattern. Figures 17A to 17C show the light-emitting patterns when there is a short circuit between the column electrodes. FIG. 17A shows an example in which black lines 1 1 1 (dark lines) appear on the electrodes in the column of the display area 30 a. 32 312 / Description of the Invention (Supplement) / 92-10 / 92119384 200402676 As shown in Fig. 1 7B, the two display lines including the display unit cell that should have been originally illuminated did not emit light on the black line 1 1 1 part. FIG. 17C is a schematic diagram showing a short circuit between column electrodes. As shown in FIG. 17C, the column electrode Yi and the column electrode Xi + 1 are short-circuited, and thus the short-circuited portions 1 12 are associated with adjacent display cells, respectively. If such a short-circuit caused by the short-circuit portion 11 2 occurs, the display cells included in the second electrode and corresponding to the short-circuited column electrodes do not emit light. As a result, a light-emitting pattern with black lines is shown in Figs. 17A and 17B. FIG. 18 is a flowchart showing the processing performed during the inspection. The inspection shown in FIG. 18 is performed based on the control performed by the control device 4. At step S 6 1 in FIG. 18, the driving pulse wave is supplied from the inspector main body 1 to the plasma display panel 30, and the inspection pattern shown in FIG. 16 is displayed. As a result, the plasma display panel 30 is illuminated, for example, with the light emitting patterns shown in FIGS. 16A and 16B or FIGS. 7A and 17B. Then, the CCD camera 2 is used to capture a light-emitting pattern image (step S 6 2). The image data of the captured image is transmitted from the CCD camera 2 to the image processing memory 3 b of the image processing device 3 (step S 6 3). The three-color data of R, G and B are transmitted separately here. Then, among the image data stored in the image processing memory 3 b, the display area 30 a of the plasma display panel 30 is all set as the image display area. The image data of the image display area thus set is stored in the image processing theme. Memory 3 c (step S 6 4). Subsequently, based on the image data stored in the image processing theme memory 3c, a process of acquiring a black line in the display area 30a is performed (step S65). Subsequently, it is determined whether or not the black line has been captured by the display area 30 a during the black line capturing process in step S 6 5 (step S 6 6). If the determination is affirmative, there is a short 33 312 / Invention Specification (Supplement) / 92-10 / 921193 84 200402676 between the row electrodes (step S 6 7). If the determination is negative, the display of the column electrode short circuit is performed (step S 6 8). In each case, the place in FIG. 18 is ended. If the light emission pattern is the measurement pattern shown in FIG. 16A and FIG. 16B in step S65, no black line appears. In this case, a negative result is obtained in step S 6 6, so it is determined that there is no short circuit between the column electrodes. Take the luminous pattern shown in Figure 17A and circle as an example to capture the black line. Therefore, in this case, the determination result of the step is positive, so it is determined that there is a short circuit between the column electrodes. In this way, as shown in FIG. 18, the plasma display panel 30 is caused to display a saw-shaped inspection pattern. In this case, if there is a short circuit between the column electrodes, the black line is on the corresponding line. Therefore, in this specific embodiment, the black line capturing step 3 is performed (S 6 5). If black lines are captured, it is determined that there is a short circuit between the column electrodes. If there is no black line, it is determined that there is no short circuit between the column electrodes (steps S 6 6 and S 6 8). Junction Determines whether shorts are detected between the column electrodes. The foregoing specific embodiments have been described as having R, G, and B three-emitting color display panels. However, a monochrome sawtooth pattern can also be used as a check pattern on a monochrome display panel. The first to fourth specific embodiments illustrate the plasma display panel. The display inspection method of the display panel according to the present invention can also be extended to other display panels. The present invention may be embodied in other forms without departing from the spirit or essential characteristics of the invention. Therefore, in terms of all aspects, these specific embodiments must be illustrative and not restrictive. The scope of the present invention is indicated by the scope of the appended claims instead of the foregoing description, and therefore falls within the scope and scope of patent application. All changes are intended to be within the scope of the present invention. [Schematic description of the diagram] 312 / Invention specification (Supplements) / 92-10 / 921193 84 There are no 0 kinds of detection judgments 1 7B S66 The tooth grid appears! (Step capture For specific consideration of the application of the fruit-colored grid, please refer to the specific 34 200402676 Figures 1A and 1B are sketches showing the conventional inspection method, of which Figure 1A is a sketch showing the middle part of the open circuit, and Figure 1B is a sketch showing the end of the open circuit Figures 2A and 2B are schematic diagrams showing a conventional inspection method, of which Figure 2A is a schematic diagram showing an open circuit in the middle portion, and Figure 2B is a schematic diagram showing an open circuit at the end; Figure 3 is a schematic diagram showing a conventional inspection method; and Figure 4 is a block diagram display. Configuration of inspection device used for display inspection method of plasma display panel; Figure 5 is a schematic diagram showing the electrode configuration of the plasma display panel to be inspected; Figure 6 is a diagram showing a configuration of a stop; Figure 7 The flow chart shows the driving pulse; Figure 8 is an example showing a plasma display panel divided into an upper area and a lower area; Figures 9A, 9B, 9C, and 9D are schematic views showing various light-emitting patterns based on whether there is an open circuit, of which Figure 9A In order to show that there is no open circuit, FIG. 9B is a schematic view showing a case where the cell line is open at the bottom, and FIG. 9 C is a schematic view showing a case where the cell line is open at the top and at the bottom, and FIG. 9 D is a schematic diagram showing the case where there is an open circuit in the individual display cell rows at the top and bottom; Fig. 10 is a flowchart showing the processing performed during inspection; Figs. 11A, 11B, 11C, and 11D are schematic diagrams that are based on whether there is an open circuit. Various luminous patterns, of which Figure 11A is a schematic diagram showing the case of no open circuit, and Figures 1 1 B, 1 1 C, and 1 1 D are schematic diagrams showing the case where the cell line is open at the right end; Figure 12 is a flowchart showing the inspection Figure 13 shows the electrode configuration of the plasma display panel to be inspected; 35 312 / Instruction Manual (Supplement) / 92-10 / 921193 84 200402676 Figure 1 4 A, 1 4 B, and 1 4 C For thumbnails The luminous pattern depends on whether there is a short circuit between the row electrodes. Among them, FIG. 14A is a schematic diagram showing the absence of a short circuit between the row electrodes, FIG. 14B is a diagram showing a situation where there is a short circuit between the row electrodes, and FIG. 14C is a diagram showing a row. There is a short circuit between the electrodes; Figure 15 is a flowchart showing the processing performed during the inspection; Figures 16 A and 16 B are schematic diagrams showing the light-emitting patterns without short circuits between the columns of electrodes, of which Figure 16A is a schematic diagram showing the unit cells 16B is a schematic diagram showing a zigzag pattern; Figs. 17A, 17B and 17C are schematic diagrams showing a light-emitting pattern when there is a short circuit between the column electrodes, of which FIG. 17A is a schematic diagram showing the full display area. 17B is an enlarged view showing a part of FIG. 17A, and FIG. 17C is a view showing a short circuit between column electrodes; and FIG. 18 is a view showing a short circuit between row electrodes. (Description of component symbols) 1 Inspector body 2 CCD camera 3 Image processing device 3a Image processing section 3b Image processing memory 3c Image processing theme memory 4 Control device 11 Addressing driver 1 1 a, 1 1 b Addressing driver 12 X Maintenance driver 1 2 a, 1 2 b X maintenance driver 36 312 / Invention Manual (Supplement) / 92-10 / 921193 84 200402676 13 Y Maintenance driver:% device 13a, 13b γ η [hold drive 30 plasma display panel 3 0b Display area 30b Additional display area 31 Plasma display panel 41 Display area 42 Upper area 43 Lower area 100 Inspection device 10 1 Row electrode group 102 Row electrode group 103 Short-circuit section 104 Bright line 111 Black line 112 Short-circuit section
312/發明說明書(補件)/92-10/921193 84 37312 / Invention Specification (Supplement) / 92-10 / 921193 84 37