TW591347B - Resist remover composition - Google Patents

Resist remover composition Download PDF

Info

Publication number
TW591347B
TW591347B TW090112452A TW90112452A TW591347B TW 591347 B TW591347 B TW 591347B TW 090112452 A TW090112452 A TW 090112452A TW 90112452 A TW90112452 A TW 90112452A TW 591347 B TW591347 B TW 591347B
Authority
TW
Taiwan
Prior art keywords
photoresist
water
page
composition
amino
Prior art date
Application number
TW090112452A
Other languages
English (en)
Chinese (zh)
Inventor
Ji-Heum Baek
Chang-Il Oh
Jong-Sun Yoo
Original Assignee
Dongjin Semichem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongjin Semichem Co Ltd filed Critical Dongjin Semichem Co Ltd
Application granted granted Critical
Publication of TW591347B publication Critical patent/TW591347B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D35/00Filtering devices having features not specifically covered by groups B01D24/00 - B01D33/00, or for applications not specifically covered by groups B01D24/00 - B01D33/00; Auxiliary devices for filtration; Filter housing constructions
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/68Treatment of water, waste water, or sewage by addition of specified substances, e.g. trace elements, for ameliorating potable water
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/001Processes for the treatment of water whereby the filtration technique is of importance
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/28Treatment of water, waste water, or sewage by sorption
    • C02F1/283Treatment of water, waste water, or sewage by sorption using coal, charred products, or inorganic mixtures containing them
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/30Treatment of water, waste water, or sewage by irradiation
    • C02F1/32Treatment of water, waste water, or sewage by irradiation with ultraviolet light
    • C02F1/325Irradiation devices or lamp constructions
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/44Treatment of water, waste water, or sewage by dialysis, osmosis or reverse osmosis
    • C02F1/441Treatment of water, waste water, or sewage by dialysis, osmosis or reverse osmosis by reverse osmosis

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Hydrology & Water Resources (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Water Supply & Treatment (AREA)
  • Organic Chemistry (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
TW090112452A 2000-01-14 2001-05-23 Resist remover composition TW591347B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020000001773A KR100348434B1 (ko) 2000-01-14 2000-01-14 레지스트 리무버 조성물

Publications (1)

Publication Number Publication Date
TW591347B true TW591347B (en) 2004-06-11

Family

ID=19638688

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090112452A TW591347B (en) 2000-01-14 2001-05-23 Resist remover composition

Country Status (2)

Country Link
KR (1) KR100348434B1 (ko)
TW (1) TW591347B (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100756552B1 (ko) * 2001-06-23 2007-09-07 주식회사 동진쎄미켐 씬너 조성물
KR100646793B1 (ko) * 2001-11-13 2006-11-17 삼성전자주식회사 씬너 조성물
KR20040040087A (ko) * 2002-11-06 2004-05-12 삼성전자주식회사 포토레지스트용 스트리퍼 조성물

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4617251A (en) * 1985-04-11 1986-10-14 Olin Hunt Specialty Products, Inc. Stripping composition and method of using the same
JPS63231343A (ja) * 1987-03-20 1988-09-27 Hitachi Ltd レジストパタ−ンの剥離液
JPH05259066A (ja) * 1992-03-13 1993-10-08 Texas Instr Japan Ltd ポジ型フォトレジスト用剥離液および半導体装置の製造方法
KR100366974B1 (ko) * 1999-12-30 2003-01-14 유니켐스 (주) 드라이필름용 박리액 조성물 및 이를 이용한 드라이필름의박리방법

Also Published As

Publication number Publication date
KR100348434B1 (ko) 2002-08-10
KR20010073408A (ko) 2001-08-01

Similar Documents

Publication Publication Date Title
KR100286860B1 (ko) 포토레지스트 리무버 조성물
TWI360028B (en) Composition and method for photoresist removal
US5795702A (en) Photoresist stripping liquid compositions and a method of stripping photoresists using the same
TW556054B (en) Stripping composition
TWI545190B (zh) 光阻剝離劑組成物
EP1877870B1 (en) Non-aqueous photoresist stripper that inhibits galvanic corrosion
JP2007016232A (ja) カチオン塩含有残留物除去用の組成物及びそれを使用する方法
TW508478B (en) Resist stripper composition
KR20100076999A (ko) 포토레지스트 박리를 위한 화합물
TW200938624A (en) Semi-aqueous stripping and cleaning composition containing aminobenzenesulfonic acid
KR20080046073A (ko) 포토레지스트, 에칭 잔류물 및 barc를 제거하기 위한제제
JP3974295B2 (ja) パターン形成方法
CN101017333A (zh) 正型光致抗蚀剂剥离剂组合物
JP2003098691A (ja) レジスト除去用組成物及びこれを利用したレジスト除去方法
TWI270749B (en) Photoresist stripping liquid composition and a method of stripping photoresists using the same
JP4698123B2 (ja) レジスト除去剤組成物
TWI283338B (en) Photoresist remover composition
TW591347B (en) Resist remover composition
KR101341701B1 (ko) 레지스트 박리액 조성물 및 이를 이용한 레지스트의박리방법
TW526397B (en) Resist remover composition
US20040185370A1 (en) Resist remover composition
TW574610B (en) Resist remover composition
US6861210B2 (en) Resist remover composition
TWI228640B (en) Photoresist remover composition
KR20220034813A (ko) 포토레지스트 리무버 조성물

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees