TW513751B - Electro-chemical deposition system - Google Patents

Electro-chemical deposition system Download PDF

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Publication number
TW513751B
TW513751B TW88120799A TW88120799A TW513751B TW 513751 B TW513751 B TW 513751B TW 88120799 A TW88120799 A TW 88120799A TW 88120799 A TW88120799 A TW 88120799A TW 513751 B TW513751 B TW 513751B
Authority
TW
Taiwan
Prior art keywords
electrolyte
patent application
scope
item
wafer
Prior art date
Application number
TW88120799A
Other languages
English (en)
Chinese (zh)
Inventor
Yezdi Dordi
Donald J Olgado
Ratson Morad
Peter Hey
Mark Denome
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/263,649 external-priority patent/US6254760B1/en
Priority claimed from US09/289,074 external-priority patent/US6258220B1/en
Priority claimed from US09/350,210 external-priority patent/US6267853B1/en
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of TW513751B publication Critical patent/TW513751B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors
    • C25D7/123Semiconductors first coated with a seed layer or a conductive layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • H01L21/2885Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/24Reinforcing the conductive pattern
    • H05K3/241Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Weting (AREA)
  • Electrodes Of Semiconductors (AREA)
TW88120799A 1998-11-30 2000-02-25 Electro-chemical deposition system TW513751B (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11020998P 1998-11-30 1998-11-30
US09/263,649 US6254760B1 (en) 1999-03-05 1999-03-05 Electro-chemical deposition system and method
US09/289,074 US6258220B1 (en) 1998-11-30 1999-04-08 Electro-chemical deposition system
US09/350,210 US6267853B1 (en) 1999-07-09 1999-07-09 Electro-chemical deposition system

Publications (1)

Publication Number Publication Date
TW513751B true TW513751B (en) 2002-12-11

Family

ID=27493736

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88120799A TW513751B (en) 1998-11-30 2000-02-25 Electro-chemical deposition system

Country Status (3)

Country Link
JP (2) JP4766579B2 (ja)
TW (1) TW513751B (ja)
WO (1) WO2000032835A2 (ja)

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TWI483333B (zh) * 2010-09-13 2015-05-01 Tokyo Electron Ltd 液體處理裝置、液體處理方法及記憶媒體
TWI681078B (zh) * 2017-06-30 2020-01-01 日商昭和電工股份有限公司 氟電解槽陽極安裝部、氟電解槽,及氟氣之製造方法

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WO2000003072A1 (en) 1998-07-10 2000-01-20 Semitool, Inc. Method and apparatus for copper plating using electroless plating and electroplating
US6773560B2 (en) 1998-07-10 2004-08-10 Semitool, Inc. Dry contact assemblies and plating machines with dry contact assemblies for plating microelectronic workpieces
US6258220B1 (en) 1998-11-30 2001-07-10 Applied Materials, Inc. Electro-chemical deposition system
US6309520B1 (en) 1998-12-07 2001-10-30 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
US6645356B1 (en) 1998-12-07 2003-11-11 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
TW483950B (en) 1998-12-31 2002-04-21 Semitool Inc Method, chemistry, and apparatus for high deposition rate solder electroplating on a microelectronic workpiece
EP1031647A3 (en) * 1999-02-19 2002-03-06 Solid State Equipment Corporation Apparatus and method for plating a wafer
US6837978B1 (en) 1999-04-08 2005-01-04 Applied Materials, Inc. Deposition uniformity control for electroplating apparatus, and associated method
US6582578B1 (en) * 1999-04-08 2003-06-24 Applied Materials, Inc. Method and associated apparatus for tilting a substrate upon entry for metal deposition
US6551488B1 (en) * 1999-04-08 2003-04-22 Applied Materials, Inc. Segmenting of processing system into wet and dry areas
US6557237B1 (en) * 1999-04-08 2003-05-06 Applied Materials, Inc. Removable modular cell for electro-chemical plating and method
US6585876B2 (en) * 1999-04-08 2003-07-01 Applied Materials Inc. Flow diffuser to be used in electro-chemical plating system and method
US7264698B2 (en) * 1999-04-13 2007-09-04 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
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JP4149620B2 (ja) * 1999-08-25 2008-09-10 株式会社荏原製作所 基板銅めっき処理方法
US20030213772A9 (en) * 1999-07-09 2003-11-20 Mok Yeuk-Fai Edwin Integrated semiconductor substrate bevel cleaning apparatus and method
US7645366B2 (en) 1999-07-12 2010-01-12 Semitool, Inc. Microelectronic workpiece holders and contact assemblies for use therewith
US6673216B2 (en) 1999-08-31 2004-01-06 Semitool, Inc. Apparatus for providing electrical and fluid communication to a rotating microelectronic workpiece during electrochemical processing
TW466561B (en) * 1999-10-06 2001-12-01 Ebara Corp Method and apparatus for cleaning substrates
US6454927B1 (en) * 2000-06-26 2002-09-24 Applied Materials, Inc. Apparatus and method for electro chemical deposition
US6709563B2 (en) 2000-06-30 2004-03-23 Ebara Corporation Copper-plating liquid, plating method and plating apparatus
US6576110B2 (en) * 2000-07-07 2003-06-10 Applied Materials, Inc. Coated anode apparatus and associated method
AT412043B (de) * 2000-07-12 2004-08-26 Ind Tech Res Inst Verfahren zum reinigen eines auf der rückseite mit metall verschmutzten wafers
CN100469948C (zh) * 2000-10-03 2009-03-18 应用材料有限公司 一旦进入金属沉积用来倾斜基片的方法和相关设备
TW519677B (en) * 2000-10-12 2003-02-01 Applied Materials Inc Deposition uniformity control for electroplating apparatus, and associated method
JP2006339665A (ja) * 2000-10-12 2006-12-14 Ebara Corp 半導体基板製造装置
US6569307B2 (en) * 2000-10-20 2003-05-27 The Boc Group, Inc. Object plating method and system
JP2002212786A (ja) * 2001-01-17 2002-07-31 Ebara Corp 基板処理装置
JP2002220692A (ja) * 2001-01-24 2002-08-09 Ebara Corp めっき装置及び方法
US7189647B2 (en) 2001-04-05 2007-03-13 Novellus Systems, Inc. Sequential station tool for wet processing of semiconductor wafers
WO2003007274A1 (en) * 2001-07-12 2003-01-23 James Hambleton Electro-chemical teaching unit
US7247222B2 (en) * 2002-07-24 2007-07-24 Applied Materials, Inc. Electrochemical processing cell
JP4303484B2 (ja) 2003-01-21 2009-07-29 大日本スクリーン製造株式会社 メッキ装置
KR100518788B1 (ko) * 2003-03-11 2005-10-05 삼성전자주식회사 감광액 도포 스핀 코팅 장치
JP4872199B2 (ja) * 2004-09-06 2012-02-08 ルネサスエレクトロニクス株式会社 半導体製造装置
KR100854373B1 (ko) 2006-12-29 2008-09-02 주식회사 포스코 산세조 내 염산액 샘플 채취장치
JP5321574B2 (ja) * 2010-12-17 2013-10-23 ルネサスエレクトロニクス株式会社 半導体製造装置の動作方法及び半導体装置の製造方法
CN105044370B (zh) * 2014-11-04 2017-03-08 长沙绿智电子科技有限公司 一种无人值守的重金属污水监测设备
JP6833557B2 (ja) * 2016-03-04 2021-02-24 株式会社荏原製作所 めっき装置及びめっき方法
KR102342006B1 (ko) * 2016-03-04 2021-12-22 가부시키가이샤 에바라 세이사꾸쇼 도금 장치 및 도금 방법
GB201701166D0 (en) * 2017-01-24 2017-03-08 Picofluidics Ltd An apparatus for electrochemically processing semiconductor substrates
DE112018007274B4 (de) * 2018-03-13 2021-12-02 Yamamoto-Ms Co., Ltd. Beschichtungsvorrichtung und Beschichtungssystem
CN110355025B (zh) * 2019-08-01 2020-11-27 宿迁市创盈知识产权服务有限公司 一种汽车零配件材料纳米改性设备
US11686208B2 (en) 2020-02-06 2023-06-27 Rolls-Royce Corporation Abrasive coating for high-temperature mechanical systems

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI483333B (zh) * 2010-09-13 2015-05-01 Tokyo Electron Ltd 液體處理裝置、液體處理方法及記憶媒體
TWI681078B (zh) * 2017-06-30 2020-01-01 日商昭和電工股份有限公司 氟電解槽陽極安裝部、氟電解槽,及氟氣之製造方法
US11492712B2 (en) 2017-06-30 2022-11-08 Showa Denko K.K. Anode mounting member of fluorine electrolytic cell, fluorine electrolytic cell, and method for producing fluorine gas

Also Published As

Publication number Publication date
WO2000032835A2 (en) 2000-06-08
JP4766579B2 (ja) 2011-09-07
JP2003528214A (ja) 2003-09-24
WO2000032835A8 (en) 2000-08-17
JP2009293134A (ja) 2009-12-17

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Legal Events

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GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees