TW484109B - Apparatus and method for inspecting screen of displaying device - Google Patents
Apparatus and method for inspecting screen of displaying device Download PDFInfo
- Publication number
- TW484109B TW484109B TW090101428A TW90101428A TW484109B TW 484109 B TW484109 B TW 484109B TW 090101428 A TW090101428 A TW 090101428A TW 90101428 A TW90101428 A TW 90101428A TW 484109 B TW484109 B TW 484109B
- Authority
- TW
- Taiwan
- Prior art keywords
- pattern
- frame synchronization
- signal
- image
- synchronization signal
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 13
- 238000007689 inspection Methods 0.000 claims abstract description 59
- 230000001360 synchronised effect Effects 0.000 claims description 16
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 13
- 230000002079 cooperative effect Effects 0.000 claims description 4
- 230000002708 enhancing effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 9
- 101150097247 CRT1 gene Proteins 0.000 description 7
- 238000007792 addition Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 235000012054 meals Nutrition 0.000 description 2
- 210000004556 brain Anatomy 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/02—Diagnosis, testing or measuring for television systems or their details for colour television signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30121—CRT, LCD or plasma display
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Synchronizing For Television (AREA)
- Synchronisation In Digital Transmission Systems (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2000-0003297A KR100448188B1 (ko) | 2000-01-24 | 2000-01-24 | 화질검사장치 및 화질검사방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW484109B true TW484109B (en) | 2002-04-21 |
Family
ID=19641012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW090101428A TW484109B (en) | 2000-01-24 | 2001-01-20 | Apparatus and method for inspecting screen of displaying device |
Country Status (5)
Country | Link |
---|---|
US (1) | US6690818B2 (ko) |
JP (1) | JP2001268601A (ko) |
KR (1) | KR100448188B1 (ko) |
CN (1) | CN1186948C (ko) |
TW (1) | TW484109B (ko) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100422295B1 (ko) * | 2002-05-18 | 2004-03-11 | 엘지.필립스 엘시디 주식회사 | 디스플레이 장치의 화질 분석 방법 및 시스템 |
US7170550B2 (en) * | 2003-07-03 | 2007-01-30 | Sony Corporation | Television data management system |
US20050012820A1 (en) * | 2003-07-03 | 2005-01-20 | Sony Corporation | Data management process for television assembly |
US20050122414A1 (en) * | 2003-12-09 | 2005-06-09 | Voss James S. | Digital camera system and method for maximizing television viewing area |
KR100556247B1 (ko) * | 2003-12-24 | 2006-03-03 | 삼성전자주식회사 | 화질 평가 장치 및 그 제어방법 |
CN100584046C (zh) * | 2005-12-27 | 2010-01-20 | 鸿富锦精密工业(深圳)有限公司 | 多媒体装置测试***及其方法 |
CN101651845B (zh) * | 2009-08-21 | 2011-03-30 | 中国电子技术标准化研究所 | 一种显示设备运动图像清晰度测试方法 |
CN102256156B (zh) * | 2011-07-13 | 2013-04-24 | 广东长虹电子有限公司 | 电视机开关机试验控制方法及*** |
KR101981685B1 (ko) * | 2012-10-04 | 2019-08-28 | 삼성전자주식회사 | 디스플레이 장치, 사용자 단말 장치, 외부 장치, 디스플레이 방법, 데이터 수신 방법 및 데이터 전송 방법 |
TWI512277B (zh) * | 2013-01-04 | 2015-12-11 | Taiwan Power Testing Technology Co Ltd | 顯示器之檢測設備 |
TWI710778B (zh) | 2019-12-04 | 2020-11-21 | 瑞軒科技股份有限公司 | 自動化測試系統及其裝置 |
TWI748297B (zh) * | 2019-12-04 | 2021-12-01 | 瑞軒科技股份有限公司 | 自動化測試方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4894718A (en) * | 1989-03-29 | 1990-01-16 | Acer Incorporated | Method and system for testing video |
JP2846428B2 (ja) | 1990-07-18 | 1999-01-13 | 株式会社アドバンテスト | 論理比較回路 |
KR100291720B1 (ko) | 1991-10-25 | 2001-06-01 | 구자홍 | 비데오카세트레코더의 문자예약녹화방법 |
JPH0654352A (ja) * | 1992-07-31 | 1994-02-25 | Hoei:Kk | 画像表示装置の試験装置 |
US5638175A (en) * | 1994-01-24 | 1997-06-10 | Display Inspection Systems, Inc. | Differential phase contrast inspection system with multiple detectors |
US6252626B1 (en) * | 1994-06-13 | 2001-06-26 | Image Processing Systems, Inc. | Test and alignment system for electronic display devices |
TW410524B (en) | 1994-07-14 | 2000-11-01 | Advantest Corp | LCD panel image quality examining device and LCD image sampling method |
KR0143517B1 (ko) | 1994-09-15 | 1998-07-15 | 구자홍 | 텔레비젼 화질검사 방법 |
JPH08125890A (ja) | 1994-10-21 | 1996-05-17 | Sony Corp | ビデオカメラ |
JPH08201750A (ja) | 1995-01-24 | 1996-08-09 | Advantest Corp | Lcdパネル画質検査装置用カメラ装置 |
EP1708169A1 (en) * | 1995-02-01 | 2006-10-04 | Seiko Epson Corporation | Driving circuit and active matrix substrate and liquid crystal display device including it |
US5796425A (en) | 1995-05-16 | 1998-08-18 | Mitsubishi Denki Kabushiki Kaisha | Elimination of the effect of difference in vertical scanning frequency between a display and a camera imaging the display |
KR100189178B1 (ko) | 1995-05-19 | 1999-06-01 | 오우라 히로시 | 패널 화질 검사 장치 및 화질 보정 방법 |
JPH09200613A (ja) * | 1996-01-19 | 1997-07-31 | Sony Corp | 固体撮像素子の欠陥検出装置 |
JP3710189B2 (ja) | 1996-02-06 | 2005-10-26 | キヤノン株式会社 | 撮像装置 |
KR100198527B1 (ko) | 1996-05-20 | 1999-06-15 | 구자홍 | 규칙적 미세패턴의 결함 검사장치 |
JPH1048149A (ja) | 1996-08-02 | 1998-02-20 | Ricoh Co Ltd | 画像欠陥検出方法及び装置 |
KR19990004172A (ko) * | 1997-06-27 | 1999-01-15 | 구자홍 | 디지탈 오디오 수신기의 타이밍 동기장치 |
KR100257741B1 (ko) * | 1997-12-11 | 2000-06-01 | 구자홍 | 리니어 고체 촬상 소자 카메라의 동기 신호 발생장치 |
JPH11225346A (ja) * | 1998-02-05 | 1999-08-17 | Hitachi Ltd | ディスプレイモニタ画像検査方法とその装置 |
KR100287855B1 (ko) | 1999-01-19 | 2001-04-16 | 구자홍 | 화질 테스트 장치 |
-
2000
- 2000-01-24 KR KR10-2000-0003297A patent/KR100448188B1/ko not_active IP Right Cessation
-
2001
- 2001-01-20 TW TW090101428A patent/TW484109B/zh not_active IP Right Cessation
- 2001-01-22 US US09/765,409 patent/US6690818B2/en not_active Expired - Fee Related
- 2001-01-22 CN CNB011021799A patent/CN1186948C/zh not_active Expired - Fee Related
- 2001-01-23 JP JP2001014657A patent/JP2001268601A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
US6690818B2 (en) | 2004-02-10 |
JP2001268601A (ja) | 2001-09-28 |
KR100448188B1 (ko) | 2004-09-10 |
CN1186948C (zh) | 2005-01-26 |
US20010016060A1 (en) | 2001-08-23 |
CN1312658A (zh) | 2001-09-12 |
KR20010076040A (ko) | 2001-08-11 |
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Legal Events
Date | Code | Title | Description |
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GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |