TW368712B - General burn-in device - Google Patents

General burn-in device

Info

Publication number
TW368712B
TW368712B TW085113678A TW85113678A TW368712B TW 368712 B TW368712 B TW 368712B TW 085113678 A TW085113678 A TW 085113678A TW 85113678 A TW85113678 A TW 85113678A TW 368712 B TW368712 B TW 368712B
Authority
TW
Taiwan
Prior art keywords
connection
grounding
transmission point
burn
power
Prior art date
Application number
TW085113678A
Other languages
English (en)
Inventor
Kyung-Mo Shin
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Application granted granted Critical
Publication of TW368712B publication Critical patent/TW368712B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW085113678A 1995-11-09 1996-11-08 General burn-in device TW368712B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950040484A KR100192575B1 (ko) 1995-11-09 1995-11-09 유니버셜 번-인 보오드

Publications (1)

Publication Number Publication Date
TW368712B true TW368712B (en) 1999-09-01

Family

ID=19433522

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085113678A TW368712B (en) 1995-11-09 1996-11-08 General burn-in device

Country Status (4)

Country Link
US (1) US5825171A (zh)
JP (1) JPH09178804A (zh)
KR (1) KR100192575B1 (zh)
TW (1) TW368712B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102043100B (zh) * 2009-10-09 2013-03-06 中芯国际集成电路制造(上海)有限公司 老化测试***

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6323670B1 (en) * 1999-02-11 2001-11-27 Taiwan Semiconductor Manufacturing Company PCB adapter for IC chip failure analysis
US6150829A (en) * 1999-04-05 2000-11-21 Qualitau, Inc Three-dimensional programmable connector
US6407564B1 (en) * 1999-08-04 2002-06-18 Taiwan Semiconductor Manufacturing Co., Ltd. Universal BGA board for failure analysis and method of using
KR100549571B1 (ko) * 1999-10-28 2006-02-08 주식회사 하이닉스반도체 메모리모듈의 인쇄회로기판
US6771089B1 (en) * 2002-05-29 2004-08-03 Advanced Micro Devices, Inc. Test fixture having an adjustable capacitance and method for testing a semiconductor component
US6815966B1 (en) * 2002-06-27 2004-11-09 Aehr Test Systems System for burn-in testing of electronic devices
US6880350B2 (en) * 2002-09-13 2005-04-19 Isothermal Systems Research, Inc. Dynamic spray system
JP4411056B2 (ja) * 2003-11-27 2010-02-10 エスペック株式会社 バーンイン基板、およびバーンイン装置
US20060290366A1 (en) * 2005-06-28 2006-12-28 Intel Corporation Monitoring multiple electronic devices under test
US7256597B2 (en) * 2005-09-08 2007-08-14 Texas Instruments Incorporated Device design-for-test and burn-in-board with minimal external components and increased testing capacity
US7733106B2 (en) * 2005-09-19 2010-06-08 Formfactor, Inc. Apparatus and method of testing singulated dies
JP2009204329A (ja) * 2008-02-26 2009-09-10 Nec Electronics Corp 回路ボード検査システム及び検査方法
US20140111239A1 (en) * 2012-10-22 2014-04-24 Qualcomm Incorporated Localized printed circuit board layer extender apparatus for relieving layer congestion near high pin-count devices
KR102214509B1 (ko) * 2014-09-01 2021-02-09 삼성전자 주식회사 반도체 장치용 테스트 소켓 및 그를 포함하는 테스트 장치
US10107856B2 (en) 2014-10-21 2018-10-23 Stmicroelectronics S.R.L. Apparatus for the thermal testing of electronic devices and corresponding method
US11726138B2 (en) * 2021-12-21 2023-08-15 Nanya Technology Corporation Method for testing semiconductor dies and test structure

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4777434A (en) * 1985-10-03 1988-10-11 Amp Incorporated Microelectronic burn-in system
JPH07123133B2 (ja) * 1990-08-13 1995-12-25 株式会社東芝 フィルムキャリア構造
US5659245A (en) * 1996-06-03 1997-08-19 Taiwan Semiconductor Manufacturing Company, Ltd. ESD bypass and EMI shielding trace design in burn-in board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102043100B (zh) * 2009-10-09 2013-03-06 中芯国际集成电路制造(上海)有限公司 老化测试***

Also Published As

Publication number Publication date
KR970030552A (ko) 1997-06-26
KR100192575B1 (ko) 1999-06-15
US5825171A (en) 1998-10-20
JPH09178804A (ja) 1997-07-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees