TW201806105A - 用於半導體裝置的封裝優化的系統及方法 - Google Patents

用於半導體裝置的封裝優化的系統及方法 Download PDF

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TW201806105A
TW201806105A TW105131900A TW105131900A TW201806105A TW 201806105 A TW201806105 A TW 201806105A TW 105131900 A TW105131900 A TW 105131900A TW 105131900 A TW105131900 A TW 105131900A TW 201806105 A TW201806105 A TW 201806105A
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substrate
interconnects
interconnection
die
interconnect
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TW105131900A
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TWI716468B (zh
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格蘭 瑞訥
丹尼爾 李徹特
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艾馬克科技公司
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Abstract

所提供為用於優化晶圓/基板上的半導體裝置的數目的揭示。所述優化包括有效率地佈置、切割和包裝所述裝置。

Description

用於半導體裝置的封裝優化的系統及方法
本發明涉及半導體裝置,且更明確地說,涉及一種用於半導體裝置的封裝優化的方法和系統。
相關申請的交叉引用
本申請案參考以下申請案、主張其優先權且主張其權益:題為“用於平面外連接的焊料結構(Solder Structures for Out of Plane Connections)”且於2006年2月27日申請的美國專利7,659,621。所述申請案的內容在此被以引用的方式全部併入本文中。
電子器件行業正在各種裝置中使用更多積體電路(IC),包含例如智慧手機的移動裝置。為了針對這些較小裝置提供不斷增加的功能性,需要更小的半導體元件。得到較小IC的一個方式為使電晶體和晶粒上的電路佈局小型化。小型化的另一方式為保持包裝的IC盡可能小,同是仍提供對於IC與印刷電路(PC)板上的其它元件通信需要的互連件。
互連件可被認為是用於半導體的電接點的通稱,且焊料球、焊接凸點(有或無金屬支柱)、襯墊等可為電接點的具體類型。
通過比較此類系統與如在本申請的其餘部分中參看圖式闡述的本發明的一些態樣,常規和傳統方法的進一步限制和劣勢將對所屬領 域的技術人員變得顯而易見。
一種用於半導體晶粒的封裝優化的方法和系統,實質上如在所述圖中的至少一個中所展示和/或關於所述圖中的至少一個所描述,且如在申請專利範圍中更完整地闡述。
將從以下描述和圖式更充分理解本發明的各種優勢、態樣和新穎特徵以及其所說明的實施例的細節。
100‧‧‧積體電路(IC)
102‧‧‧晶粒
104‧‧‧包裝基板
106‧‧‧凸塊
107‧‧‧電子裝置
109‧‧‧印刷電路板
110‧‧‧包裝
112‧‧‧互連件
120‧‧‧包裝
122‧‧‧互連件
125‧‧‧水平間距
127‧‧‧垂直間距
300‧‧‧晶圓
302‧‧‧晶粒
304‧‧‧晶粒
306‧‧‧行
308‧‧‧行
310‧‧‧鋸控制器
312‧‧‧記憶體
320‧‧‧切塊鋸
500‧‧‧晶粒
501‧‧‧互連件
502‧‧‧邊緣
503‧‧‧邊緣互連件
504‧‧‧邊緣
506‧‧‧邊緣
510‧‧‧列
512‧‧‧列
514‧‧‧行
550‧‧‧晶粒
570‧‧‧蛇形切割
572‧‧‧蛇形切割
574‧‧‧蛇形切割
600‧‧‧電鍍圖案
600a‧‧‧焊料儲存器
600b‧‧‧互連件圖案
600c‧‧‧互連件
602‧‧‧俯視圖
604‧‧‧側視圖
606‧‧‧俯視圖
608‧‧‧側視圖
700‧‧‧晶粒
702‧‧‧互連件
800‧‧‧晶粒
802‧‧‧高應力軸線
804‧‧‧互連件
900‧‧‧晶粒
902‧‧‧互連件
1000‧‧‧晶粒
1002‧‧‧互連件
1010‧‧‧晶粒
1012‧‧‧互連件
1013、1015、1017、1019‧‧‧徑向軸線
1020‧‧‧晶粒
1022‧‧‧橢圓形互連件
1023‧‧‧徑向軸線
1024‧‧‧橢圓形互連件
1025‧‧‧徑向軸線
1027‧‧‧徑向軸線
1102-1112‧‧‧晶粒
1200‧‧‧晶圓
1202‧‧‧晶粒
1204‧‧‧晶圓
1302‧‧‧3個互連件三角形配置
1304‧‧‧4個互連件三角形配置
1306‧‧‧5個互連件X形配置
1308‧‧‧7個互連件六邊形配置
1310‧‧‧8個互連件正方形配置
1312‧‧‧9個互連件正方形配置
1402‧‧‧3個互連件三角形配置
1404‧‧‧4個互連件三角形配置
1406‧‧‧5個個互連件X形配置
1408‧‧‧7個互連件六邊形配置
1410‧‧‧8個互連件正方形配置
1412‧‧‧9個互連件正方形配置
1500、1510‧‧‧晶粒
1600‧‧‧9個互連件正方形配置在晶圓上的晶粒佈局
1602‧‧‧單一晶粒的拉出圖
1604‧‧‧晶粒佈局
1700‧‧‧7個互連件六邊形配置在晶圓上的晶粒佈局
1702‧‧‧單一晶粒的拉出圖
1704‧‧‧直切割下的矩形晶粒佈局
1706‧‧‧直切割下的六邊形晶粒佈局
1800‧‧‧5個互連件X形配置在晶圓上的晶粒佈局
1802‧‧‧單一晶粒的拉出圖
1804‧‧‧直切割下的晶粒佈局
1900‧‧‧4個互連件三角形配置的在晶圓上的晶粒佈局
1902‧‧‧單一晶粒的拉出圖
1904‧‧‧直切割下的晶粒佈局
2000‧‧‧3個互連件三角形配置的在晶圓上的晶粒佈局
2002‧‧‧單一晶粒的拉出圖
2004‧‧‧直切割下的晶粒佈局
2100-2112‧‧‧步驟
從結合附圖進行的對各種實例實施例的以下描述,這些和/或其它態樣將變得顯而易見且更易於瞭解。
圖1A為說明包裝上晶粒的圖。
圖1B為說明包裝的晶粒在電子裝置中的使用的圖。
圖1C為說明具有用於互連件的正方形網格封裝的晶粒的圖。
圖1D為說明具有用於互連件的交錯的六邊形封裝的晶粒的圖。
圖2為比較正方形網格封裝與交錯的六邊形封裝的封裝方法的曲線圖。
圖3為說明通過鋸切可供本發明的實施例使用的晶粒對在晶粒的邊緣處的互連件的效應的圖。
圖4為說明鋸切可供本發明的實施例使用的晶粒的效應的曲線圖。
圖5A說明當切塊根據本發明的實施例的晶粒時蛇形鋸口的實例。
圖5B說明當切塊根據本發明的實施例的晶粒時蛇形鋸口的實例。
圖6說明在可供本發明的實施例使用的回焊後在晶粒的邊緣處的互連件的實例。
圖7說明在可供本發明的實施例使用的晶粒的邊緣處的互連件的實例。
圖8說明晶粒上的應力軸線的實例。
圖9A說明在根據本發明的實施例的晶粒上的橢圓形互連件的實例。
圖9B說明用於根據本發明的實施例的橢圓形互連件的間距和空間的實例。
圖10A說明在根據本發明的實施例的晶粒上的實例橢圓形互連件。
圖10B說明在根據本發明的實施例的晶粒上的實例橢圓形互連件。
圖10C說明在根據本發明的實施例的晶粒上的實例橢圓形互連件。
圖11說明用於根據本發明的實施例的晶粒的晶粒形狀和互連件圖案的各種實例。
圖12說明根據本發明的實施例的八互連件正方形晶粒的實 例。
圖13為比較根據本發明的實施例的晶圓上的不同形狀的晶粒的數目的曲線圖。
圖14為比較根據本發明的實施例的晶粒的不同形狀上的互連件的密度的曲線圖。
圖15A為可供本發明的實施例使用的晶圓級扇出的說明。
圖15B為用於規則正方形網格配置的互連件間距的說明。
圖15C為用於根據本發明的實施例的六邊形網格配置的實例互連件間距的說明。
圖16為根據本發明的實施例的9個互連件正方形晶粒的實例的說明。
圖17為根據本發明的實施例的7個互連件六邊形晶粒的實例的說明。
圖18為根據本發明的實施例的5個互連件X形晶粒的實例的說明。
圖19為根據本發明的實施例的4個互連件三角形晶粒的實例的說明。
圖20為根據本發明的實施例的3個互連件三角形晶粒的實例的說明。
圖21為用於製造根據本發明的實施例的晶粒的實例高階流程圖。
以下論述通過提供其實例來提出本發明的各種態樣。此類實例是非限制性的,並且由此本發明的各種態樣的範圍應不必受所提供的實例的任何特定特性限制。在以下論述中,短語“舉例來說”、“例如”和“示範性”是非限制性的且通常與“借助於實例而非限制”、“例如且非限制”和類似者同義。
如本文中所利用,“和/或”意味著由“和/或”接合的列表中的項目中的任何一或多個。作為實例,“x和/或y”意味著三元素集合{(x),(y),(x,y)}中的任何元素。換句話說,“x和/或y”意味著“x和y中的一個或兩個”。作為另一實例,“x、y和/或z”意味著七元素集合{(x),(y),(z),(x,y),(x,z),(y,z),(x,y,z)}中的任何元素。換句話說,“x、y和/或z”意味著“x、y和z中的一或多個”。
包含本文中使用的描述性或技術性術語的所有術語應被解釋為具有對所屬領域的一般技術人員明顯的意義。當術語具有含糊不清的意義(歸因於語言的演化、先例或新技術的出現)時,在本發明中使用的術語的意義應首先由其在本發明中的使用和/或定義來澄清。接著應澄清所述術語,如同在本發明時所屬領域的一般技術人員將已理解所述術語。
本文中所使用的術語僅出於描述特定實例的目的,且並不希望限制本發明。如本文中所使用,除非上下文另有清晰指示,否則單數形式也希望包含複數形式。將進一步理解,術語“包括”、“包含”、“具有”和類似者當在本說明書中使用時指定陳述的特徵、數目、步驟、操作、元件和/或元件的存在,但不排除一或多個其它特徵、數目、步驟、操作、元件、元件和/或其群組的存在或添加。
將理解,雖然術語第一、第二等可在本文中用以描述各種元件,但這些元件不應受這些術語限制。這些術語僅用以將一個元件與另一元件區分開來。因此,舉例來說,在不脫離本發明的教示的情況下,下文論述的第一元件、第一元件或第一區段可被稱為第二元件、第二元件或第二區段。類似地,例如“上部”、“上方”、“下部”、“下方”、“側”、“側向”、“水平”、“垂直”和類似者的各種空間術語可用於以相對方式將一個元件與另一元件區分開來。然而,應理解,元件可以不同方式定向,例如,在不脫離本發明的教示內容的情況下,半導體裝置可以側向轉動使得其“頂”表面水平地朝向且其“側”表面垂直地朝向。
還將理解,除非另有明確指示,否則術語耦合、連接、附接和類似者包含直接和間接(例如,用***元件)耦合、連接、附接等。舉例來說,如果元件A耦合到元件B,那麼元件A可通過中間信號分配結構間接耦合到元件B,元件A可直接耦合到元件B(例如,直接黏附到、直接焊接到、通過直接金屬到金屬結合而附接等)等。
在圖式中,為了清晰起見,可放大結構、層、區域等的尺寸(例如,絕對和/或相對尺寸)。雖然此類尺寸通常指示實例實施方案,但其並非限制性。舉例來說,如果將結構A說明為大於區域B,那麼此通常指示實例實施方案,但結構A通常不需要大於結構B,除非另有指示。另外,在圖式中,類似參考標號可在整個論述中指類似元件。
軟體元件可指可執行代碼和/或在可定址存儲媒體中由可執行代碼使用的資料。因此,軟體元件可為(例如)物件導向的軟體元件、類別元件和任務元件,且可包含處理常式、函數、屬性、程式、副程式、 程式碼的段、驅動程式、固件、微代碼、電路、資料、資料庫、資料結構、表、陣列或變數。
在本發明的實施例中的術語“單元”意味著執行具體功能的軟體元件或硬體元件。由“單元”提供的功能可被劃分成額外元件和“單元”。
現在將詳細參考實施例,在附圖中說明所述實施例的實例。就此而言,本實施例可以具有不同形式並且不應被解釋為限於本文中所闡述的描述。
在以下描述中,為了易於解釋,將提及(例如)在兩個鄰近互連件(例如,凸塊、球、柱、支柱、襯墊、多種類型的互連結構中的任何者等)的中心之間0.4mm的間距。為了本發明的目的,這可被稱作實例間距。本發明還將提及(例如)具有0.25mm直徑的圓形互連件,所述圓形互連件可被作為標準圓形互連件參考,且因此,在鄰近互連件(例如,凸塊)的邊緣之間可存在0.15mm的空間。然而,應理解,這些尺寸以及本發明中的其它尺寸可隨不同設計和/或技術而改變。因此,不應以任何方式將本發明中的任何陳述的尺寸看作限制本發明的任一實施例。
如在本發明中使用的基板為一般術語,其可指(例如)半導體晶粒的主體或其上放置晶粒和晶粒連接到的基底或材料,例如,其中有***件、層壓物基板和/或無芯基板。因此,雖然為了易於描述可關於晶粒描述本發明的各種實施例,但應認識到,本發明的此類實施例的範圍不限於晶粒,而也可大體延伸到基板。
本發明的態樣可為包含互連件的半導體晶粒,其中互連件具 有沿著半導體晶粒的邊緣的邊緣互連件,且邊緣中的至少一個為非線性的。本發明的另一態樣可為包含多個互連件的半導體晶粒,其中所述多個互連件為非圓形互連件,每一者具有和軸和次軸。本發明的再一態樣可為半導體晶粒,其具有第一互連件列,所述第一互連件列關於鄰近第一互連件列的第二互連件列水平偏移,其中第一互連件列的鄰近互連件與第二互連件列的鄰近互連件具有第一間距,且第一間距與從第一互連件列的線通過中心到第二互連件列的線通過中心的垂直距離不同。
在以下描述中,未詳細描述熟知功能或構造以便不因不必要的細節而使實施例模糊不清。
圖1A為說明包裝上晶粒的圖。參看圖1,展示包括晶粒102和包裝基板104的積體電路(IC)100。尤其,包裝基板104提供互連結構以用於將晶粒102上的電路電連接到可為其它IC和/或印刷電路板(PCB)的外部線路(未展示)。如圖1中所展示的互連結構為凸塊106,其可包括焊料凸塊和/或金屬支柱結構。然而,互連結構也可為(例如)焊料球、金屬襯墊以及任何其它合適的結構。包裝基板104可比晶粒102大得多,這是由於對於可擬合於晶粒102的表面上的較多凸塊106的需求。
增大的包裝大小佔據印刷電路板(PCB)上有價值的佔據面積,尤其當使用晶粒102的裝置需要小型化時。可使用較小間距來增大晶粒上的互連件的密度,但歸因於組合件裝備容差和基板技術,存在限制。此限制可能夠用新裝備來克服,但可為組裝者不能承受的額外費用。
可通過使用使晶粒102比固持功能電路所必要大一點使得可將更多凸塊106放置於晶粒102上的方案來得到一些額外增益。然而,雖 然這可使包裝的IC 100比將凸塊106放置於包裝基板104上的情況小一點,但這導致每一半導體晶圓更少的晶粒。
圖1B為說明包裝的晶粒在電子裝置中的使用的圖。參看圖1B,展示可為(例如)智慧型電話、MP3播放機、數碼相機等的電子裝置107。電子裝置107包括具有IC 100的印刷電路板109。IC 100可為(例如)微處理器、記憶體、用於與外部裝置(未展示)通信的輸入/輸出介面等。在一些情況下,IC 100可包括這些和/或其它功能性作為晶圓上系統,且可包含在IC 100的非易失性部分上的可執行代碼。
圖1C為說明具有用於互連件的正方形網格封裝的晶粒的圖。參看圖1C,展示包裝110的實例,其中互連件112佈置在具有0.4mm的間距的網格中。在許多情況下,包裝可比基板大得多,這是由於對於互連結構將信號輸入到基板和從基板輸出信號的需求。
圖1D為說明具有用於互連件的交錯的六邊形封裝的晶粒的圖。參看圖1D,展示具有用於互連件122的六邊形封裝配置的包裝120。因為互連件在列間水平地偏移,所以其可(例如)具有(例如)0.4mm的水平間距125,但從一個列的中心到下一個列的中心的垂直距離127可比水平間距125或圖1C的網格中的列靠在一起,同時維持互連件之間的相同最小間隔,由此允許更多列在相同垂直距離中擬合。因此,對於此實例,互連件密度可從正方形網格配置的589個互連件/cm2增大到六邊形封裝配置的693個互連件/cm2,從而導致超過17%的互連件密度增大。可看出,從正方形陣列到六邊形陣列的切換將導致每包裝更多的互連件。
圖2為比較正方形網格封裝與交錯的六邊形封裝的封裝方 法的曲線圖。參看圖2,展示展示互連件的數目對晶粒大小的曲線圖。如可看出,對於相同晶粒大小,互連件的數目對於六邊形封裝配置始終比對於正方形網格封裝配置高,其中晶粒大小在長度上範圍從3mm到10mm。曲線圖的趨勢還展示,隨著晶粒大小增大,對於相同晶粒大小,六邊形封裝配置繼續能夠提供比正方形網格配置多的互連件。
圖3為說明通過鋸切可供本發明的實施例使用的晶粒對在晶粒的邊緣處的互連件的效應的圖。參看圖3,展示包括多個晶粒(包含晶粒302和304)的晶圓300、鋸控制器310和切塊鋸320。為了能夠使用晶粒,晶粒302和304(其它未展示)需要從晶圓300自由切割(或切塊或切除或單切)。當進行直切割以將晶粒302與晶粒304分開時,也可部分切割一些互連件,由此通常將其毀壞得不能用作電連接。
可看出,行308中的互連件由切塊鋸320切割,使得其不能被使用。另外,雖然行306中的互連件可顯得為整體,但歸因於機械應力、切屑等,可存在對互連件的結構損壞,因為切割工具(例如,切塊鋸320)可能已太過靠近行306中的互連件。舉例來說,切塊鋸320中的套爪可擊中互連件且造成互連件的損壞。
舉例來說,當使用切塊鋸時,互連件可通常距密封環25μm或更大,且密封環可通常距切割鋸片的中心40μm。因此,在切割鋸片的每一側上到可使用的互連件可通常存在65μm的緩衝。雖然互連件可形成於密封環上,但在切割期間,互連件可仍然被損壞。
切塊鋸320可(例如)由鋸控制器310控制。鋸控制器310可執行存儲在記憶體312中的指令,其中記憶體312可包括易失性和非易失 性記憶體,且也可包括其它類型的存儲裝置,包含(例如)硬碟驅動器。
圖4為說明鋸切可供本發明的實施例使用的晶粒的效應的曲線圖。參看圖4,展示使用典型後退規則用於分離晶粒對本發明的實施例的每個給定大小的互連件的曲線圖,借此使用優化的後退規則來分離晶粒。可針對晶粒和晶圓的具體實施方案以及用於切塊的技術來優化後退規則。如可看出,存在當使用優化的後退規則切割時互連件的數目比當使用正常後退規則切割時高的情況,且存在當互連件的數目對於優化的後退規則切割與對於正常直切割相同時的情況。
圖5A說明當切塊根據本發明的實施例的晶粒時蛇形鋸口。參看圖5A,展示具有互連件501的鄰近晶粒500和550,其中互連件501中的一些沿著列510和512,以及沿著行514。列510、512和行514可具有形成於密封環上的互連件501。當使用切塊鋸片用於直切割時,密封環上的互連件501可在切塊鋸片的每一側上後退多達65μm,其中可能對密封環上的互連件501造成損壞。然而,通過將非線性切割(非線性鋸口或蛇形切割)用於邊緣502、504和506,可將列510和512上的所有互連件501以及行514上的所有互連件保持為整體,且因此可用於到和來自晶粒500的電信號。在晶粒的邊緣處的在列510、512和行514上的互連件501可被稱作邊緣互連件503,或邊緣凸塊。因此,晶粒500與晶粒550之間的邊界(鋸口)可(例如)並非直的,而是圍繞在晶粒500和550的邊緣處的邊緣互連件503。因此,晶粒500和550的邊緣互連件501可被佈置使得晶粒500和550的邊緣互連件503可相互擬合。
可用合適的工具(例如,等離子切塊工具,其可通常在切割 道的中心的每一側上需要10μm)來進行針對邊緣502、504和506的蛇形切割(非線性切割/鋸口)。因此,關於在每一側上的切塊鋸片的附加55μm可允許額外的列和/或行,即使進行直切割。將較窄切割道與蛇形切割組合可允許額外列/行的互連件501。然而,注意,本發明的範圍不受特定類型的切割工具的用戶限制。
另外,蛇形切割還可包含形成非線性邊緣的其它切割。舉例來說,蛇形切割可形成圓非線性邊緣(如所展示),或其可為導致鋸齒形邊緣的三角形(鋸齒形)切割,或圍繞互連件的任何其它類型的切割。
圖5B說明當鋸切根據本發明的實施例的晶粒時蛇形鋸口的實例。參看圖5B,展示在將導致晶粒的不同邊緣的邊緣互連件周圍的3個不同類型的蛇形切割的實例。舉例來說,蛇形切割570展示在邊緣互連件周圍的三角形蛇形切割,蛇形切割572展示在邊緣互連件周圍的梯形蛇形切割,且蛇形切割574展示在邊緣互連件周圍的正方形(矩形)蛇形切割。雖然未展示,但蛇形切割可包括不同類型的切割的混合。舉例來說,蛇形切割可包括圖5A的彎曲切割和/或圖5B中展示的各種類型的切割的混合。並且,雖然在圖5B中展示三個不同類型的蛇形切割,但本發明的各種實施例可包括不導致晶粒的直(線性)邊緣的其它類型的蛇形切割。
圖6說明在可供本發明的實施例使用的回焊後在晶粒的邊緣處的互連件。2006年2月27日申請的美國專利7,659,621通過引用併入到本發明,如同在本文中充分地闡述。參看圖6,展示包括焊料儲存器600a和互連件圖案600b的電鍍圖案600的若干視圖。存在在鋸道的邊緣處的電鍍圖案600的俯視圖602和在鋸道的邊緣處的電鍍圖案600的側視圖604。 在從晶圓切塊後,通過焊料回焊工藝放置晶粒,其中焊料聚集於互連件圖案600b上以形成如俯視圖606和側視圖608中所展示的互連件600c。焊料儲存器600a使互連件600c大於互連件圖案600b,使得互連件600c懸於晶粒的邊緣之上。本申請人已展示,90μm互連件可懸於晶粒的邊緣之上多達25μm。互連件圖案600b不必為圓形下凸塊金屬化(UBM)互連件。
圖7說明在可供本發明的實施例使用的晶粒的邊緣處的互連件。參看圖7,展示形成於晶粒700的邊緣上的互連件702。互連件702如關於圖6所解釋類似地形成,且互連件702(例如,邊緣襯墊或邊緣凸塊)是通過利用另外可能尚未使用的晶粒佔據面積來添加。
圖8說明晶粒上的應力軸線。參看圖8,展示晶粒800上的兩個對角線高應力軸線802。雖然僅展示這兩個軸線,但應理解,高應力軸線可大體從晶粒的中心向外輻射。從晶粒的中心向外輻射的軸線也被稱作徑向軸線。因此,當設計互連件804時,應認真地賦予其足夠的機械強度以承受應力,尤其沿著高應力軸線802,應力可在晶粒的製造工藝期間和在晶粒800的包裝期間出現。另外,互連件804應能夠將足夠的輸入電流載運到晶粒800和從晶粒800載運足夠的輸出電流。因此,可存在對互連件可有多小的限制。然而,替代方案可為使用兩個或更多個互連件載運用於相同信號或電力傳送的電流。
圖9A說明在根據本發明的實施例的晶粒上的橢圓形互連件的實例。參看圖9A,展示在晶粒900上橢圓形成形的互連件902。雖然展示這些互連件902在從中心輻射的方向上細長,但各種實施例可具有在不同方向上細長的互連件902。細長互連件902可被稱為具有主(長)軸和次 (短)軸。
晶粒900中的主軸的對準可在晶粒900的不同區域間有所不同。這可歸因於在具體區中的互連件902的具體需求。舉例來說,互連件902的主軸可能需要在具體方向上對準以使在那個區中的密度或晶粒/基板的總密度最大化。這可取決於晶粒/基板大小、基板熱膨脹係數和/或應用的溫度範圍。應用可為晶圓製造的工藝、從晶圓切塊晶粒、晶粒在基板上的放置、基板的切塊、進一步包裝、波峰焊接、回流焊接等。應用也可為晶粒/基板將用於的環境。當將不同技藝或技術用於以上提到的應用中的任一者或其它應用時,也可將其它準則評估為需要用於互連件902的形狀和對準。
在9A的實例中,可看出使用的佈局圖案具有從晶粒900的中心實質上徑向的互連件902的主軸的對準。然而,也可預期到其它佈局圖案,且本發明的各種實施例不限於任何具體佈局圖案。類似地,雖然將互連件902展示為卵形,但本發明不必受如此限制。其它非圓形形狀可用於非圓形互連件。舉例來說,互連件902可為有或無圓拐角的矩形、細長多面體形狀、蛋形、弧形等。
而在一些情況下,應力可為非圓形互連件的對準中的分析的部分,當應力並非用於互連件密度優化的因素時,可使用非圓形互連件。舉例來說,一些晶粒可具有較低應力,但可能需要比圓形互連件的情況下所可能要的互連件多的互連件。因此,可在各種方向上且根據許多佈局圖案針對各種原因對準非圓形互連件。
圖9B說明用於根據本發明的實施例的橢圓形互連件的間距 和空間的實例。在本發明的各種實施例中,互連件902可被佈置為250μm長(主軸)乘125μm寬(次軸),在橢圓形互連件之間具有0.15mm的相同空間,如對於具有0.4mm間距的圓形互連件。然而,橢圓形互連件902的沿著次軸的間距可相對於圓形互連件400μm的間距減小約33%到275μm。其它方向上的間距也可減小,但不如沿著次軸多。因此,雖然互連件之間的空間針對設計規則或組裝目的可仍然相同,但較小間距允許較大互連件密度。
本發明的各種實施例可具有不限於描述的尺寸的非圓形互連件(例如,凸塊)。舉例來說,不同於在主要橢圓形軸線中的長度為大致標準互連件的長度(0.25mm),其可較長或較短。並且,雖然將次橢圓形軸線中的寬度描述為沿著主橢圓形軸線的長度的實質上一半,但那個寬度也可變化為比沿著主橢圓形軸線的長度的一半寬或窄。
圖10A說明在根據本發明的實施例的晶粒上的橢圓形互連件。參看圖10A,展示具有橢圓形互連件1002的晶粒1000。通過使次橢圓形軸線為約主橢圓形軸線的長度的約一半且將間隔保持為實質上與具有0.4mm間距的圓形互連件相同,可使互連件密度大於1050個互連件/cm2。為了比較,如先前所敘述,在標準0.4mm間距且正方形網格封裝下的圓形互連件的互連件密度為576/cm2。可按需要變化橢圓形互連件1002的間隔和/或間距。另外,可使用極座標而非笛卡爾座標佈置橢圓形互連件1002。除了可能增大互連件密度之外,使用極座標可輔助佈線到互連件1002從互連件1002佈線。
圖10B說明在根據本發明的實施例的晶粒上的實例橢圓形 互連件。參看圖10B,展示具有橢圓形互連件1012的晶粒1010。如在圖10A和圖10B可看出,存在在晶粒上佈置橢圓形互連件的不同方式。舉例來說,如在圖10B中可看出,橢圓形互連件1012的並非所有列都沿著晶粒1010的徑向軸線(例如,1013、1015、1017、1019)延伸或與所述徑向軸線對準。一些橢圓形互連件沿著平行於徑向軸線的線對準。各種佈局圖案可用於本發明的實施例,且在晶粒上的橢圓形互連件的具體佈局可取決於各種設計考慮,例如,應力線(軸線)、晶粒/基板大小、基板熱膨脹係數和/或應用的溫度範圍等。
圖10C說明在根據本發明的實施例的晶粒上的橢圓形互連件。參看圖10C,展示具有橢圓形互連件1022和1024的晶粒1020。類似於圖10B的橢圓形互連件1012佈置橢圓形互連件1022。然而,橢圓形互連件1024的主軸垂直於橢圓形互連件1022的主軸。這可是出於應力容差和/或互連件密度優化,或先前提到的其它考慮。因此,晶粒可具有橢圓形互連件,其中出於多種原因,其相應主軸在不同方向上對準。再次,為了說明,展示晶粒1020的一些徑向軸線(1023、1025、1027、1029)。各種佈局圖案可用於本發明的實施例,且在晶粒上的橢圓形互連件的具體佈局可取決於各種設計考慮,例如,應力線(軸線)、晶粒/基板大小、基板熱膨脹係數和/或應用的溫度範圍等。
圖11說明用於根據本發明的實施例的晶粒的各種晶粒形狀和互連件圖案。對於具有低互連件計數的晶粒,可使用不同晶粒形狀優化每晶圓的晶粒(DPW)的數目。然而,應注意,具有較高互連件計數的晶粒也可使用不同晶粒形狀來將每晶粒互連件的數目和/或每晶圓的晶粒的數 目最大化。參看圖11,展示可按以上描述的蛇形方式切割的6晶粒形狀,其中所有互連件(例如,凸塊)處於0.4mm間距。晶粒1102展示在正方形網格配置中的9個互連件,其具有在晶粒1102的周邊處的互連件周圍的蛇形切割。晶粒1104展示在正方形配置中的8個互連件,其具有在頂部上的一列3個互連件、在中間的一列2個互連件和在底部上的一列3個互連件,具有在晶粒1104的周邊周圍的蛇形切割。
晶粒1106展示在六邊形配置中的一共7個互連件,其中6個互連件在周邊且一個互連件在中心,具有在晶粒1106的周邊處的6個互連件周圍的蛇形切割。晶粒1108展示在X形配置中的一共5個互連件,其中4個互連件在周邊且一個互連件在中心,具有在4個周邊互連件周圍的蛇形切割。晶粒1110展示4個互連件三角形配置,其中3個互連件在周邊且一個互連件在中心。蛇形切割是在晶粒1110的周邊處的3個互連件周圍。晶粒1112展示在三角形配置中的一共3個互連件,具有在3個互連件周圍的蛇形切割。
雖然為了簡明起見已展示僅六個配置,但應理解,各種實施例可每晶粒具有不同數目個互連件,和因此不同幾何配置。另外,還可存在針對給定數目個互連件的不同幾何配置。幾何配置可為規則的或不規則的。
圖12說明根據本發明的實施例的八互連件正方形晶粒的實例。參看圖12,展示具有8個互連件正方形配置晶粒的晶圓1200,其可使用蛇形切割來切割。可看出,晶圓1200在每一晶粒的周邊具有邊緣互連件,其與在鄰近晶粒的周邊處的邊緣互連件擬合。因此,在第一晶粒的邊緣處 的邊緣互連件與第二晶粒的鄰近邊緣處的邊緣互連件之間畫一條直線可能並不可能。並且,舉例來說,第一晶粒的列(或行)與第二晶粒的鄰近列(或行)之間的間隔(或間距)可小於第一晶粒的鄰近列(或行)之間的間隔(或間距)。晶粒1202為可使用蛇形切割從晶圓切塊的晶粒的實例。晶圓1204是為了比較而展示,且為類似於晶圓1200的晶圓,除了所述晶粒是使用直切割來切割之外。
本申請人估計如果使用蛇形切割將晶粒分開,可在200mm晶圓上製造32,124個晶粒。這比如果使用直切割分開晶粒來自同一晶圓的26,548個晶粒的數目增大大致21%。與當使用直切割分開晶粒時的約681個互連件/cm2相比,具有蛇形切割的互連件密度為大致825個互連件/cm2。
圖13為比較根據本發明的實施例的晶圓上的不同形狀的晶粒的數目的曲線圖。參看圖13,展示關於圖11論述的6晶粒配置的曲線圖。對角線條紋指示針對具有蛇形切割的6晶粒配置中的每一個的來自200mm晶圓的晶粒的估計的數目,且點線圖案指示針對具有直切割的相同配置的來自200mm晶圓的晶粒的估計的數目。
如從針對3個互連件三角形配置的1302可看出,晶粒的估計的數目在蛇形切割下為105,961,且在直切割下為66,866。通過使用蛇形切割,這在晶粒的數目上增加大於58%。
如從針對4個互連件三角形配置的1304可看出,晶粒的估計的數目在蛇形切割下為73,504,且在直切割下為65,458。通過使用蛇形切割,這在晶粒的數目上增加大於12%。
如從針對5個互連件X形配置的1306可看出,晶粒的估計 的數目在蛇形切割下為77,964,且在直切割下為43,207。通過使用蛇形切割,這在晶粒的數目上增加大於80%。
如從針對7個互連件六邊形配置的1308可看出,晶粒的估計的數目在蛇形切割下為40,250,且在直切割下為27,878。通過使用蛇形切割,這在晶粒的數目上增加大於44%。
如從針對8個互連件正方形配置的1310可看出,晶粒的估計的數目在蛇形切割下為32,124,且在直切割下為26,462。通過使用蛇形切割,這在晶粒的數目上增加大於21%。
如從針對9個互連件正方形配置的1312可看出,晶粒的估計的數目在蛇形切割下為27,829,且在直切割下為25,170。通過使用蛇形切割,這在晶粒的數目上增加大於10%。
因此,取決於互連件的數目,每200mm晶圓可存在10%到80%的晶粒增加。
圖14為比較根據本發明的實施例的晶粒的不同形狀上的互連件的密度的曲線圖。參看圖14,展示關於圖11論述的6晶粒配置的曲線圖。對角線條紋指示針對具有蛇形切割的6晶粒配置中的每一個的來自估計的互連件密度,且點線圖案指示針對具有直切割的相同配置的晶粒的估計的互連件密度。
如從針對3個互連件三角形配置的1402可看出,估計的互連件密度在蛇形切割下為1,018個互連件/cm2,且在直切割下為643個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於58%。
如從針對4個互連件三角形配置的1404可看出,估計的互 連件密度在蛇形切割下為943個互連件/cm2,且在直切割下為816個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於15%。
如從針對5個互連件X形配置的1406可看出,估計的互連件密度在蛇形切割下為1,250個互連件/cm2,且在直切割下為693個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於80%。
如從針對7個互連件六邊形配置的1408可看出,估計的互連件密度在蛇形切割下為906個互連件/cm2,且在直切割下為627個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於44%。
如從針對8個互連件正方形配置的1410可看出,估計的互連件密度在蛇形切割下為827個互連件/cm2,且在直切割下為681個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於21%。
如從針對9個互連件正方形配置的1412可看出,估計的互連件密度在蛇形切割下為807個互連件/cm2,且在直切割下為730個互連件/cm2。通過使用蛇形切割,這在互連件密度上增大大於10%。
因此,取決於互連件的數目,對於每晶圓的晶粒數,可存在從10%到80%的互連件密度的增大。至此描述的實施例可增大互連件密度和/或每晶圓的晶粒數。
如圖13和圖14中所展示,雖然互連件密度增大可來自於互連件的間距的減小,但其它因素也可開始起作用。這些因素可為(例如)晶粒的形狀和佈局、道寬、互連件直徑和互連件到晶粒邊距。因此,雖然一個等式可能不能夠準確地描述不同實施方案,但非常粗略的關係由以下給出: %面積的改變=((1+%CP)2)-1 等式1其中%CP為間距的改變的%。間距的減小對於%CP將為負值。
圖15A為晶圓級扇出的說明,且圖15B為對於規則正方形網格配置的互連件間距的說明。參看圖15A,展示7mm×7mm晶粒1500和8mm×8mm晶粒1510。雖然晶粒1500對於所有電路可能足夠大,但其可能並不對於電路所需要的所有輸入/輸出互連件足夠大。因此,對於附加互連件,可能需要較大晶粒。在0.4mm(400μm)間距下,晶粒1500可通常擬合17×17互連件網格,一共289個互連件。互連件當中的分開在圖15B中展示,在互連件當中的水平和垂直上具有0.4mm間距。在0.4mm間距下,較大晶粒1510可通常擬合19×19互連件網格,一共361個互連件。
圖15C為用於根據本發明的實施例的六邊形網格配置的實例的互連件間距的說明。參看圖15C,展示互連件的修改的六邊形陣列,其中圓形互連件(例如,凸塊或襯墊)的交替列被偏移,具有413μm的水平互連件間距和400μm的對角線互連件間距。然而,因為鄰近列之間的垂直分隔小於300μm,所以對於17行乘21列的佈局,有可能具有四個額外列,一共357個互連件。
另外,可使用蛇形切割將晶粒靠在一起封裝,如較早先所描述。舉例來說,晶粒可在鄰近晶粒的80μm內。舉例來說,可用等離子切塊來進行蛇形切割。鄰近晶粒的邊緣互連件也可相互擬合以幫助更靠近的間隔。
因此,如同8mm×8mm晶粒1520,可用7mm×7mm晶粒1510製造幾乎相同數目個互連件(357對361),其中較小晶粒1510為較大 晶粒1520的大小的約76%。且蛇形切塊通過使切塊道比在直切割情況下窄而減少了可使用的晶粒區的浪費。
具體晶粒的此描述為本發明的實施例的實例。各種其它晶粒可具有不同水平間距、列之間的垂直分隔和/或對角線間距。
圖16為根據本發明的實施例的9個互連件正方形晶粒的實例的說明。參看圖16,展示對於9個互連件正方形配置的在晶圓上的晶粒佈局1600的實例,具有針對單一晶粒的拉出圖1602。可從具有805個互連件/cm2的互連件密度的200mm實例收穫估計的27,829個晶粒。這在每晶圓的晶粒上相對於直切割下的晶粒佈局1604增加11%。這其中的部分是歸因於晶粒被佈置使得個別晶粒與鄰近晶粒擬合以減少未使用的晶圓材料。可看出,在每一晶粒的邊緣(或周邊)處的邊緣互連件擬合在鄰近晶粒的邊緣(或周邊)處的邊緣互連件。
圖17為根據本發明的實施例的7個互連件六邊形晶粒的實例的說明。參看圖17,展示對於7個互連件六邊形配置的在晶圓上的晶粒佈局1700的實例,具有針對單一晶粒的拉出圖1702。可從具有905個互連件/cm2的互連件密度的200mm晶圓收穫估計的40,250個晶粒。這在每晶圓的晶粒上相對於直切割下的矩形晶粒佈局1704增加44%,且在每晶圓的晶粒上相對於直切割下的六邊形晶粒佈局1706增加12%。這其中的部分是歸因於個別晶粒擬合鄰近晶粒以減少未使用的晶圓材料。可看出,在每一晶粒的邊緣(或周邊)處的邊緣互連件擬合在鄰近晶粒的邊緣(或周邊)處的邊緣互連件。
圖18為根據本發明的實施例的5個互連件X形晶粒的實例 的說明。參看圖18,展示對於5個互連件X形配置在晶圓上的晶粒佈局1800的實例,具有針對單一晶粒的拉出圖1802。可從具有1250個互連件/cm2的互連件密度的200mm實例收穫估計的77,964個晶粒。這在每晶圓的晶粒上相對於直切割下的晶粒佈局1804增加80%。這其中的部分是歸因於個別晶粒擬合鄰近晶粒以減少未使用的晶圓材料。可看出,在每一晶粒的邊緣(或周邊)處的邊緣互連件擬合在鄰近晶粒的邊緣(或周邊)處的邊緣互連件。
圖19為根據本發明的實施例的4個互連件三角形晶粒的實例的說明。參看圖19,展示對於4個互連件三角形配置的在晶圓上的晶粒佈局1900的實例,具有針對單一晶粒的拉出圖1902。可從具有943個互連件/cm2的互連件密度的200mm實例收穫估計的73,500個晶粒。這在每晶圓的晶粒上相對於直切割下的晶粒佈局1904增加12%。這其中的部分是歸因於個別晶粒擬合鄰近晶粒以減少未使用的晶圓材料。可看出,在每一晶粒的邊緣(或周邊)處的邊緣互連件擬合在鄰近晶粒的邊緣(或周邊)處的邊緣互連件。
圖20為根據本發明的實施例的3個互連件三角形晶粒的實例的說明。參看圖20,展示對於3個互連件三角形配置的在晶圓上的晶粒佈局2000的實例,具有針對單一晶粒的拉出圖2002。可從具有1018個互連件/cm2的互連件密度的200mm實例收穫估計的105,960個晶粒。這在每晶圓的晶粒上相對於直切割下的晶粒佈局2004增加58%。這其中的部分是歸因於個別晶粒擬合鄰近晶粒以減少未使用的晶圓材料。可看出,在每一晶粒的邊緣(或周邊)處的邊緣互連件擬合在鄰近晶粒的邊緣(或周邊)處的邊緣互連件。
因此,取決於晶粒上的互連件的數目,可使用不同晶粒形狀優化使晶粒與其相鄰晶粒擬合。雖然已關於晶粒上的六個不同數目的互連件展示六個不同形狀,但本發明的各種實施例不必受如此限制。不同晶粒形狀可用於不同數目個互連件,且通常,對於給定數目個互連件,可存在可使用的不同晶粒形狀。
圖21為用於製造根據本發明的實施例的晶粒的高階流程圖的實例。參看圖21,在2100,進行輸入/輸出互連件(例如,凸塊)的確定。所述許多互連件還可包含(例如)接地和電力互連件。在2102,確定晶粒的大小。晶粒大小將顧及可放置於晶粒上的圓形互連件的總數。在2104,進行關於是否需要邊緣互連件的確定。舉例來說,如果需要少量附加互連件,那麼情況可能是這樣。
在2106,可進行關於非圓形互連件是否適當的確定。舉例來說,如果每晶粒的互連件的數目仍然小於所要的數目且非圓形互連件可應對對於輸入/輸出信號的功率要求,那麼其可為適當的。另外,本發明的各種實施例可佈置互連件使得具有較高功率要求的某些互連件為圓形且應對較低功率的其它互連件為非圓形,或分配若干非圓形互連件來應對功率。因此,晶粒可具有一個、兩個或更多個不同互連件形狀(例如,凸塊或襯墊),在互連件之間具有適當間距和空間。互連件之間的間距和空間可針對不同設計而不同。
在2108,按適當晶粒大小、用於晶粒的電路佈局和互連件選擇和放置來製造晶圓。取決於可用的晶粒密度優化和技術的等級,晶圓可佈置有用於蛇形切割的非線性邊緣,或具有直邊緣。在2110,可將製造 的晶圓分成個別晶粒,且在2112,可包裝晶粒以供在用於電/電子裝置的電路模組中使用。
雖然描述了流程圖的實例,但各種實施例可使用不同演算法來確定如何使晶圓上的晶粒的數目最大化。並且,雖然流程圖參考晶圓和晶粒(如先前所解釋),但流程圖也可參考其上放置許多晶粒且電連接到基板且接著分成個別基板的基板,或大體需要將基板分成較小部分的情況。
因此,本發明的各種實施例描述包括互連件501的基板500,其中互連件501包括沿著基板的邊緣的邊緣互連件503,且邊緣502中的至少一個為非線性。額外實施例還揭示包括互連件1002的基板1000,其中所述互連件1002中的多個為非圓形互連件,且每一非圓形互連件具有主軸和次軸。其它實施例揭示基板120,其包括第一互連件列,所述第一互連件列關於鄰近第一互連件列的第二互連件列水平偏移,其中第一互連件列中的鄰近互連件與第二互連件列中的鄰近互連件具有第一間距125,且第一間距125與從第一互連件列的線通過中心到第二互連件列的線通過中心的垂直距離127不同。
本發明的各種實施例可寫為電腦程式且可實施於使用非暫時性電腦可讀記錄媒體執行程式的通用數位電腦中。
非暫時性電腦可讀記錄媒體可包含(例如)磁性存儲媒體(例如,ROM、軟碟、硬碟等)、光學記錄媒體(例如,CD-ROM或DVD)等。
雖然本發明的各種實施例已參看圖來描述,但所屬領域的一般技術人員應理解,在不脫離如由所附申請專利範圍定義的本發明的精神和範圍的情況下,可在其中進行形式和細節的各種改變。因此,以上實施 例和其所有態樣只是實例且並非限制性。
500‧‧‧晶粒
501‧‧‧互連件
502‧‧‧邊緣
503‧‧‧邊緣互連件
504‧‧‧邊緣
510‧‧‧列
512‧‧‧列
514‧‧‧行
550‧‧‧晶粒

Claims (20)

  1. 一種包括互連件的基板,其中所述互連件包括沿著所述基板的邊緣的邊緣互連件,且所述邊緣中的至少一個為非線性。
  2. 根據申請專利範圍第1項所述的基板,其中所述互連件包括具有主軸和次軸的多個非圓形互連件。
  3. 根據申請專利範圍第2項所述的基板,其中所述多個非圓形互連件中的至少一個的所述主軸實質上垂直於:所述基板的徑向軸線,或平行於所述基板的徑向軸線的線。
  4. 根據申請專利範圍第1項所述的基板,其中所述邊緣互連件被配置以當回焊所述基板的焊料時形成懸掛於對應的邊緣上的互連件。
  5. 根據申請專利範圍第1項所述的基板,其中所述基板的周邊追隨所述邊緣互連件中的個別者的輪廓。
  6. 根據申請專利範圍第1項所述的基板,其中在所述基板上的第一互連件列關於鄰近所述第一互連件列的第二互連件列水平地偏移,且所述第一互連件列的鄰近互連件與所述第二互連件列的鄰近互連件具有第一間距,且所述第一間距與從所述第一互連件列的線通過中心到所述第二互連件列的線通過中心的垂直距離不同。
  7. 一種包括互連件的基板,其中所述互連件中的多個是非圓形互連件,且每一非圓形互連件具有主軸和次軸。
  8. 根據申請專利範圍第7項所述的基板,其中所述非圓形互連件中的至少一個被配置以具有所述次軸的實質上兩倍長的所述主軸。
  9. 根據申請專利範圍第7項所述的基板,其中所述非圓形互連件中的 至少一個的所述主軸實質上垂直於:所述基板的徑向軸線,或平行於所述基板的徑向軸線的線。
  10. 根據申請專利範圍第7項所述的基板,其中在所述基板的邊緣附近的所述非圓形互連件關於在所述基板的中心附近的所述非圓形互連件中的至少一個旋轉實質上90度。
  11. 根據申請專利範圍第7項所述的基板,其中所述基板包括直邊緣。
  12. 根據申請專利範圍第7項所述的基板,其中所述基板包括非線性邊緣。
  13. 根據申請專利範圍第7項所述的基板,其中所述多個互連件包括具有與所述基板的徑向軸線對準的主軸的第一互連件集合和具有與平行於所述基板的所述徑向軸線的線對準的主軸的第二互連件集合。
  14. 根據申請專利範圍第7項所述的基板,其中所述多個互連件包括具有相互平行的主軸的第一互連件集合和具有相互平行的主軸的第二互連件集合,其中所述第一互連件集合的所述主軸垂直於所述第二互連件集合的所述主軸。
  15. 一種基板,其包括第一互連件列,所述第一互連件列關於鄰近所述第一互連件列的第二互連件列水平地偏移,其中所述第一互連件列的鄰近互連件與所述第二互連件列的鄰近互連件具有第一間距,且所述第一間距與從所述第一互連件列的線通過中心到所述第二互連件列的線通過中心的垂直距離不同。
  16. 根據申請專利範圍第15項所述的基板,其中所述互連件包括沿著主軸的方向比在次軸的方向上長的多個非圓形互連件。
  17. 根據申請專利範圍第16項所述的基板,其中所述多個非圓形互連件中的每一個的所述主軸實質上垂直於:所述基板的徑向軸線,或平行於所述基板的徑向軸線的線。
  18. 根據申請專利範圍第15項所述的基板,其中所述互連件中的一或多個為經形成以當回焊所述基板的焊料時使所述邊緣互連件的一部分懸掛於對應的邊緣上的邊緣互連件。
  19. 根據申請專利範圍第15項所述的基板,其中所述基板的至少一個邊緣為非線性。
  20. 根據申請專利範圍第15項所述的基板,其中所述基板的周邊追隨沿著所述基板的周邊的所述互連件的個別者的輪廓。
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