TW201610441A - Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor - Google Patents

Method of identifying direction of multilayer ceramic capacitor, apparatus identifying direction of multilayer ceramic capacitor, and method of manufacturing multilayer ceramic capacitor Download PDF

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TW201610441A
TW201610441A TW104120375A TW104120375A TW201610441A TW 201610441 A TW201610441 A TW 201610441A TW 104120375 A TW104120375 A TW 104120375A TW 104120375 A TW104120375 A TW 104120375A TW 201610441 A TW201610441 A TW 201610441A
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magnetic flux
flux density
ceramic capacitor
multilayer ceramic
magnetic
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TW104120375A
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TWI557411B (en
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林章浩
高橋美奈子
笹岡嘉一
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村田製作所股份有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

Abstract

A method of identifying a direction of a multilayer ceramic capacitor includes the steps of transporting a plurality of multilayer ceramic capacitors in one line before each of a magnetism generator and a magnetic flux density measurement instrument, measuring a magnetic flux density with the magnetic flux density measurement instrument at the time when each of the plurality of multilayer ceramic capacitors passes before the magnetic flux density measurement instrument, and identifying a direction of stack of the multilayer ceramic capacitors based on the magnetic flux density measured in the step of measuring a magnetic flux density.

Description

積層陶瓷電容器之方向識別方法、積層陶瓷電容器之方向識別裝置、積層陶瓷電容器之製造方法 Direction identification method of laminated ceramic capacitor, direction identification device of laminated ceramic capacitor, and manufacturing method of laminated ceramic capacitor

本發明係關於積層陶瓷電容器之方向識別方法、積層陶瓷電容器之方向識別裝置、及積層陶瓷電容器之製造方法。 The present invention relates to a method for identifying a direction of a multilayer ceramic capacitor, a direction identifying device for a laminated ceramic capacitor, and a method for manufacturing a laminated ceramic capacitor.

積層陶瓷電容器包含沿一方向積層之複數個內部電極。因此，對於積層陶瓷電容器，有期望識別其內部電極之積層方向之需求。然而，例如於積層陶瓷電容器為正四角柱狀之情形時，則難以從外觀識別積層陶瓷電容器內部電極之積層方向。 The multilayer ceramic capacitor includes a plurality of internal electrodes laminated in one direction. Therefore, for a multilayer ceramic capacitor, there is a demand for identifying the direction of lamination of its internal electrodes. However, for example, when the multilayer ceramic capacitor is in the form of a regular square column, it is difficult to recognize the lamination direction of the internal electrodes of the multilayer ceramic capacitor from the appearance.

例如於日本特開平7-115033號公報(專利文獻1)中，揭示有並非著眼於外觀之可識別積層陶瓷電容器內部電極之積層方向的方法。具體而言，於專利文獻1中揭示有對並未引出內部電極層之一面施加固定磁場，測量積層陶瓷電容器之磁通密度，根據磁化之強度識別內部電極層之方向的方法。該方法係利用如下原理者，即於電容器配置於內部電極與磁通變得幾***行(至於電容器，則為內部電極相對於底面為垂直方向)之方位之狀態中，及於電容器配置於內部電極與磁通 變得幾近垂直(至於電容器，則為內部電極相對於底面為水平方向)之方位之狀態中，所測量之磁通密度不同。 For example, JP-A-7-115033 (Patent Document 1) discloses a method of not concentrating on the lamination direction of the internal electrodes of the configurable multilayer ceramic capacitor. Specifically, Patent Document 1 discloses a method of applying a fixed magnetic field to one surface of an internal electrode layer, measuring the magnetic flux density of the laminated ceramic capacitor, and identifying the direction of the internal electrode layer based on the strength of the magnetization. This method utilizes a principle in which the capacitor is disposed in a state in which the internal electrode and the magnetic flux are nearly parallel (as for the capacitor, the internal electrode is perpendicular to the bottom surface), and the capacitor is disposed inside. Electrode and flux The measured magnetic flux density differs in a state in which the orientation is nearly vertical (as for the capacitor, the internal electrode is horizontal with respect to the bottom surface).

然而，於內部電極之積層方向與磁通方向平行及內部電極之積層方向與磁通方向垂直之情形時所測量之磁通密度之差極小。且，所測量之磁通密度亦被磁石、感測探針(sensor probe)及電容器各者之位置關係大為左右。尤其是小型之積層陶瓷電容器，自其所測量之磁通密度所受磁石、感測探針及電容器各者之位置關係之影響尤甚。 However, the difference in magnetic flux density measured when the lamination direction of the internal electrodes is parallel to the magnetic flux direction and the lamination direction of the internal electrodes is perpendicular to the magnetic flux direction is extremely small. Moreover, the measured magnetic flux density is also greatly influenced by the positional relationship of each of the magnet, the sensor probe, and the capacitor. In particular, small-sized multilayer ceramic capacitors are particularly affected by the positional relationship of magnets, sensing probes, and capacitors from the measured magnetic flux density.

如此般，因於積層方向不同之情形時所測量之磁通密度之差較小，且視測量時之電容器之位置而定，所測量之磁通密度則大為不同，故專利文獻1所記載之方法難以準確地識別積層陶瓷電容器之積層方向。 As described above, the difference in magnetic flux density measured when the lamination direction is different is small, and the measured magnetic flux density is greatly different depending on the position of the capacitor at the time of measurement, and therefore, the patent document 1 describes The method is difficult to accurately identify the lamination direction of the laminated ceramic capacitor.

對該問題予以更具體之說明。例如，假設為對長度尺寸1mm、寬度尺寸0.5mm、高度尺寸0.5mm、靜電電容4.7μF之積層陶瓷電容器，以某一測定條件測量磁通密度之情形。該積層陶瓷電容器之內部電極之積層方向與磁通方向平行之情形時之，最大磁通密度約為53.6mT。另一方面，該積層陶瓷電容器之內部電極之積層方向與磁通方向垂直之情形時之，最大磁通密度約為52.3mT。因此，對該積層陶瓷電容器而言，其內部電極之積層方向與磁通方向平行及內部電極之積層方向與磁通方向垂直之情形時，磁通密度之最大值僅相差1.3mT。因此，內部電極之積層方向與磁通方向平行及垂直之情形之間之磁通密度之最大值之差，相對於內部電極之積層方向與磁通方向平行之情形時之磁通密度之最大值僅為2.4%。 The problem is more specifically explained. For example, a case is considered in which a magnetic layer density is measured under a certain measurement condition for a multilayer ceramic capacitor having a length dimension of 1 mm, a width dimension of 0.5 mm, a height dimension of 0.5 mm, and a capacitance of 4.7 μF. When the lamination direction of the internal electrodes of the multilayer ceramic capacitor is parallel to the magnetic flux direction, the maximum magnetic flux density is about 53.6 mT. On the other hand, when the lamination direction of the internal electrodes of the multilayer ceramic capacitor is perpendicular to the magnetic flux direction, the maximum magnetic flux density is about 52.3 mT. Therefore, in the case of the multilayer ceramic capacitor, when the lamination direction of the internal electrodes is parallel to the magnetic flux direction and the lamination direction of the internal electrodes is perpendicular to the magnetic flux direction, the maximum value of the magnetic flux density differs by only 1.3 mT. Therefore, the difference between the maximum value of the magnetic flux density between the lamination direction of the internal electrode and the magnetic flux direction is perpendicular to the maximum value of the magnetic flux density when the lamination direction of the internal electrode is parallel to the magnetic flux direction. Only 2.4%.

又，於積層陶瓷電容器之測量位置自積層陶瓷電容器之中心位置偏移0.3mm時之，內部電極之積層方向與磁通方向平行之積層陶瓷電容器之磁通密度成為約52.3mT，與內部電極之積層方向與磁通方向垂直之情形時之積層陶瓷電容器之磁通密度之最大值(測定位置為 積層陶瓷電容器之中心位置之情形時)變得幾近相同。藉此，於積層陶瓷電容器之測量位置出現0.3mm以上之變化之情形時，將難以識別積層陶瓷電容器之方向。該問題由於積層陶瓷電容器越小型化，例如各尺寸從長度尺寸1mm、寬度尺寸0.5mm、高度尺寸0.5mm變得越小，則越難以將測量位置決定於中心位置，而變得越加顯著。 Further, when the measurement position of the multilayer ceramic capacitor is shifted by 0.3 mm from the center position of the laminated ceramic capacitor, the magnetic flux density of the multilayer ceramic capacitor in which the lamination direction of the internal electrode is parallel to the magnetic flux direction becomes about 52.3 mT, and the internal electrode The maximum value of the magnetic flux density of the multilayer ceramic capacitor when the lamination direction is perpendicular to the magnetic flux direction (the measurement position is When the center position of the multilayer ceramic capacitor is changed, it becomes almost the same. Thereby, when a change of 0.3 mm or more occurs in the measurement position of the multilayer ceramic capacitor, it is difficult to identify the direction of the laminated ceramic capacitor. This problem is caused by the fact that the size of the multilayer ceramic capacitor is reduced, for example, the size of each of the multilayer ceramics is reduced from 1 mm in length, 0.5 mm in width, and 0.5 mm in height, and it becomes more difficult to determine the measurement position at the center position.

又，於專利文獻1所記載之方法中，必須以使磁性產生裝置與磁性感測器以介隔電容器而對向之方式配置。因此，專利文獻1所記載之方法存在磁性產生裝置與磁性感測器之配置上之制約。故而，專利文獻1所記載之電容器之方向識別裝置存在裝置設計之自由度較低之問題。 Further, in the method described in Patent Document 1, it is necessary to arrange the magnetic generating device and the magnetic sensor to face each other with a capacitor interposed therebetween. Therefore, the method described in Patent Document 1 has limitations in the arrangement of the magnetic generating device and the magnetic sensor. Therefore, the direction recognition device for a capacitor described in Patent Document 1 has a problem that the degree of freedom in device design is low.

本發明之主要目的在於提供一種可準確地識別積層陶瓷電容器之方向的方法。 SUMMARY OF THE INVENTION A primary object of the present invention is to provide a method for accurately identifying the direction of a laminated ceramic capacitor.

基於本發明之積層陶瓷電容器之方向識別方法係識別包含積層之複數個內部電極之積層陶瓷電容器之積層方向的方法。積層陶瓷電容器之方向識別方法，係包含如下之步驟：將1列複數個積層陶瓷電容器搬送至磁性產生裝置及磁通密度測量器之各者之前；於複數個積層陶瓷電容器之各者經由磁通密度測量器之前時，以磁通密度測量器測量磁通密度；及基於測量上述磁通密度之步驟中所測量之磁通密度而識別上述積層方向。 The direction identifying method of the multilayer ceramic capacitor according to the present invention is a method of identifying the lamination direction of a multilayer ceramic capacitor including a plurality of laminated internal electrodes. The method for identifying the direction of the multilayer ceramic capacitor includes the steps of: transporting one row of the plurality of laminated ceramic capacitors to each of the magnetic generating device and the magnetic flux density measuring device; and each of the plurality of laminated ceramic capacitors via the magnetic flux The magnetic flux density is measured by a magnetic flux density measuring device before the density measuring device; and the above-mentioned laminated direction is identified based on the magnetic flux density measured in the step of measuring the magnetic flux density.

於本發明之一形態中，於識別上述積層方向之步驟中，基於測量上述磁通密度之步驟中所測量之磁通密度，算出磁通密度之積分值，基於該磁通密度之積分值而識別上述積層方向。 In one aspect of the invention, in the step of identifying the layering direction, an integral value of the magnetic flux density is calculated based on the magnetic flux density measured in the step of measuring the magnetic flux density, based on the integral value of the magnetic flux density. Identify the above laminated direction.

於本發明之一形態中，磁性產生裝置與磁通密度測量器係相互對向。於測量上述磁通密度之步驟中，於複數個積層陶瓷電容器之各者經過磁性產生裝置與磁通密度測量器之間時，以磁通密度測量器測 量自磁性產生裝置產生之磁通之密度。 In one aspect of the invention, the magnetic generating device and the magnetic flux density measuring device are opposed to each other. In the step of measuring the magnetic flux density, when each of the plurality of laminated ceramic capacitors passes between the magnetic generating device and the magnetic flux density measuring device, the magnetic flux density measuring device measures The amount of magnetic flux generated from the magnetic generating device.

於本發明之一形態中，磁性產生裝置較磁通密度測量器配置於複數個積層陶瓷電容器之搬送方向之更上游側。本發明進而包含如下一步驟，即於測量上述磁通密度之步驟之前，對複數個積層陶瓷電容器之各者進行磁化。 In one aspect of the invention, the magnetic flux generating device is disposed on the upstream side of the conveying direction of the plurality of laminated ceramic capacitors. The present invention further includes a step of magnetizing each of the plurality of laminated ceramic capacitors before the step of measuring the magnetic flux density.

於本發明之一形態中，於搬送上述複數個積層陶瓷電容器之步驟中，以複數個積層陶瓷電容器經由線型搬送路徑之方式，搬送複數個積層陶瓷電容器。於測量上述磁通密度之步驟中，於複數個積層陶瓷電容器沿線型搬送路徑經過磁通密度測量器之前時，以磁通密度測量器測量磁通密度。 In one aspect of the present invention, in the step of transporting the plurality of laminated ceramic capacitors, a plurality of laminated ceramic capacitors are transported through a plurality of laminated ceramic capacitors via a linear transfer path. In the step of measuring the magnetic flux density, the magnetic flux density is measured by a magnetic flux density measuring device before a plurality of laminated ceramic capacitors pass the magnetic flux density measuring device along the linear transport path.

於本發明之一形態中，於搬送上述複數個積層陶瓷電容器之步驟中，以複數個積層陶瓷電容器被收容於沿圓形轉動體之外周而設之複數個收容部各者之狀態搬送。於測量上述磁通密度之步驟中，當複數個積層陶瓷電容器以收容於複數個收容部各者之狀態經過磁通密度測量器之前時，以磁通密度測量器測量磁通密度。 In one aspect of the present invention, in the step of transporting the plurality of laminated ceramic capacitors, a plurality of laminated ceramic capacitors are housed in a state in which a plurality of stacked ceramic capacitors are accommodated in a plurality of housing portions provided along the outer circumference of the circular rotating body. In the step of measuring the magnetic flux density, when a plurality of laminated ceramic capacitors are passed through the magnetic flux density measuring device in a state of being accommodated in each of the plurality of housing portions, the magnetic flux density is measured by a magnetic flux density measuring device.

於本發明之一形態中，於搬送上述複數個積層陶瓷電容器之步驟中，以複數個積層陶瓷電容器被收容於包裝體內所設之複數個空腔之各者之狀態搬送。於測量上述磁通密度之步驟中，當複數個積層陶瓷電容器以收容於複數個空腔之各者之狀態經過磁通密度測量器之前時，以磁通密度測量器測量磁通密度。 In one aspect of the present invention, in the step of transporting the plurality of laminated ceramic capacitors, a plurality of laminated ceramic capacitors are transported in a state in which each of a plurality of cavities provided in the package is accommodated. In the step of measuring the magnetic flux density, the magnetic flux density is measured by a magnetic flux density measuring instrument when a plurality of laminated ceramic capacitors are placed before the magnetic flux density measuring device in a state of being accommodated in each of the plurality of cavities.

基於本發明之積層陶瓷電容器組之製造方法，係包含如下之步驟：以上述任一項所記載之積層陶瓷電容器之方向識別方法識別上述積層方向；及將上述積層方向一致之複數個積層陶瓷電容器收容於包裝體內所設之複數個空腔之各者。 The method of manufacturing a multilayer ceramic capacitor package according to the present invention includes the steps of: recognizing the lamination direction by the direction identification method of the multilayer ceramic capacitor according to any one of the above aspects; and a plurality of laminated ceramic capacitors having the lamination direction Each of the plurality of cavities provided in the package body.

基於本發明之積層陶瓷電容器之方向識別裝置係識別包含積層之複數個內部電極之積層陶瓷電容器之積層方向的方向識別裝置。積 層陶瓷電容器之方向識別裝置，係包含：磁性產生裝置；磁通密度測量器；搬送裝置，其將一列複數個積層陶瓷電容器搬送至磁性產生裝置及磁通密度測量器各者之前；及方向識別部，其連接於磁通密度測量器，且基於磁通密度測量器所測量之磁通密度而識別上述積層方向。 The direction identifying device of the multilayer ceramic capacitor according to the present invention is a direction identifying device for identifying a stacking direction of a multilayer ceramic capacitor including a plurality of laminated internal electrodes. product The direction identification device of the layer ceramic capacitor includes: a magnetic generation device; a magnetic flux density measuring device; and a conveying device that transports a plurality of laminated ceramic capacitors before the magnetic generating device and the magnetic flux density measuring device; and direction recognition The portion is connected to the magnetic flux density measuring device and recognizes the above laminated direction based on the magnetic flux density measured by the magnetic flux density measuring device.

於本發明之一形態中，方向識別部係基於由磁通密度測量器所測量之磁通密度，算出磁通密度之積分值，並基於該磁通密度之積分值而識別上述積層方向。 In one aspect of the invention, the direction identifying unit calculates an integral value of the magnetic flux density based on the magnetic flux density measured by the magnetic flux density measuring device, and identifies the laminated direction based on the integrated value of the magnetic flux density.

於本發明之一形態中，磁性產生裝置與磁通密度測量器係相互對向。磁通密度測量器係於搬送裝置所搬送之複數個積層陶瓷電容器之各者經過磁性產生裝置與磁通密度測量器之間時，測量自磁性產生裝置產生之磁通之密度。 In one aspect of the invention, the magnetic generating device and the magnetic flux density measuring device are opposed to each other. The magnetic flux density measuring device measures the density of the magnetic flux generated from the magnetic generating device when each of the plurality of laminated ceramic capacitors carried by the conveying device passes between the magnetic generating device and the magnetic flux density measuring device.

於本發明之一形態中，磁性產生裝置較磁通密度測量器配置於複數個積層陶瓷電容器之搬送方向之更上游側。磁性產生裝置係於磁通密度測量器測量磁通密度之前，對複數個積層陶瓷電容器之各者進行磁化。 In one aspect of the invention, the magnetic flux generating device is disposed on the upstream side of the conveying direction of the plurality of laminated ceramic capacitors. The magnetic generating device magnetizes each of a plurality of laminated ceramic capacitors before the magnetic flux density measuring device measures the magnetic flux density.

於本發明之一形態中，搬送裝置包含線型搬送路徑，其將積層陶瓷電容器以直線狀搬送。磁通密度測量器設置於線型搬送路徑。 In one aspect of the invention, the conveying device includes a linear conveyance path that conveys the laminated ceramic capacitor in a straight line. The magnetic flux density measuring device is disposed on the linear transport path.

於本發明之一態樣中，搬送裝置包含圓形之轉動體，其係沿圓弧搬送積層陶瓷電容器。轉動體包含複數個收容部，其等逐個收納複數個積層陶瓷電容器。磁通密度測量器設置於轉動體。 In one aspect of the invention, the conveying device includes a circular rotating body that carries the laminated ceramic capacitor along a circular arc. The rotator includes a plurality of accommodating portions, and the plurality of laminated ceramic capacitors are housed one by one. The magnetic flux density measuring device is disposed on the rotating body.

於本發明之一形態中，搬送裝置搬送包含逐個收納複數個積層陶瓷電容器之複數個空腔之包裝體。包裝體經過磁通密度測量器之前。 In one aspect of the invention, the transport device transports a package including a plurality of cavities that accommodate a plurality of laminated ceramic capacitors one by one. The package passes before the flux density measurer.

於本發明之一形態中，轉動體係以固定間隔反復進行旋轉運動與停止。複數個收容部各者係於轉動體之旋轉運動時經過磁通密度測 量器之前，並停止於與磁通密度測量器不相重疊之位置。 In one aspect of the invention, the rotating system repeats the rotational motion and the stop at regular intervals. Each of the plurality of housing portions is subjected to magnetic flux density measurement during the rotational movement of the rotating body Before the gauge, stop at a position that does not overlap the flux density measurer.

根據本發明，可提供可準確地識別積層陶瓷電容器之方向之方法。 According to the present invention, a method of accurately identifying the direction of a laminated ceramic capacitor can be provided.

本發明之上述與其他目的、特徵、態樣及優點，可自與附加圖式相關連理解之關於本發明之以下之詳細說明予以明瞭。 The above and other objects, features, aspects and advantages of the present invention will become apparent from

1‧‧‧積層陶瓷電容器 1‧‧‧Multilayer ceramic capacitors

2‧‧‧積層陶瓷電容器組 2‧‧‧Multilayer Ceramic Capacitor Bank

3‧‧‧積層陶瓷電容器之方向識別裝置 3‧‧‧ Directional identification device for laminated ceramic capacitors

10‧‧‧素體 10‧‧‧ body

10a‧‧‧第1主表面 10a‧‧‧1st main surface

10b‧‧‧第1主表面 10b‧‧‧1st main surface

10c‧‧‧第1側面 10c‧‧‧1st side

10d‧‧‧第2側面 10d‧‧‧2nd side

10e‧‧‧第1端面 10e‧‧‧1st end

10f‧‧‧第2端面 10f‧‧‧2nd end face

11‧‧‧內部電極 11‧‧‧Internal electrodes

12‧‧‧內部電極 12‧‧‧Internal electrodes

14‧‧‧外部電極 14‧‧‧External electrode

15‧‧‧陶瓷部 15‧‧‧Department of Ceramics

20‧‧‧蓋帶 20‧‧ ‧ cover tape

21‧‧‧收容室 21‧‧‧ Containment room

31‧‧‧磁性產生裝置 31‧‧‧Magnetic generating device

32‧‧‧磁通密度測量器 32‧‧‧Magnetic density measuring device

33‧‧‧第1輥子 33‧‧‧1st roller

34‧‧‧第2輥子 34‧‧‧2nd roller

35‧‧‧搬送裝置 35‧‧‧Transporting device

36‧‧‧方向識別部 36‧‧‧ Direction Identification Department

41‧‧‧搬送裝置 41‧‧‧Transporting device

42‧‧‧搬送路徑 42‧‧‧Transportation path

43‧‧‧送風孔 43‧‧‧Air supply hole

44‧‧‧搬送路徑 44‧‧‧Transportation path

50‧‧‧球型送料器 50‧‧‧Ball feeder

51‧‧‧線型送料器 51‧‧‧Line Feeder

52‧‧‧搬送裝置 52‧‧‧Transporting device

53‧‧‧載帶 53‧‧‧ Carrier tape

54‧‧‧搬送台 54‧‧‧Transportation station

54a‧‧‧凹部 54a‧‧‧ recess

55‧‧‧方向識別裝置 55‧‧‧ Directional identification device

55a‧‧‧磁性產生裝置 55a‧‧‧Magnetic generating device

55b‧‧‧磁性產生裝置 55b‧‧‧Magnetic generating device

60‧‧‧磁性產生裝置 60‧‧‧Magnetic generating device

70‧‧‧貼片機 70‧‧‧SMT machine

71‧‧‧搬送載台 71‧‧‧Transporting station

72‧‧‧攝像部 72‧‧‧Photography Department

73‧‧‧控制部 73‧‧‧Control Department

74‧‧‧分揀部 74‧‧‧ sorting department

75‧‧‧靜電電容測定部 75‧‧‧Electrostatic capacitance measurement department

C‧‧‧中心軸 C‧‧‧ center axis

D1‧‧‧最大磁通密度 D1‧‧‧Maximum magnetic flux density

D2‧‧‧最大磁通密度 D2‧‧‧Maximum magnetic flux density

D3‧‧‧最大磁通密度 D3‧‧‧Maximum magnetic flux density

L‧‧‧長度方向 L‧‧‧ Length direction

Lm‧‧‧磁力線 Lm‧‧‧ magnetic line

P1‧‧‧位置 P1‧‧‧ position

P2‧‧‧位置 P2‧‧‧ position

P3‧‧‧位置 P3‧‧‧ position

P4‧‧‧位置 P4‧‧‧ position

P11‧‧‧位置 P11‧‧‧ position

P12‧‧‧位置 P12‧‧‧ position

P13‧‧‧位置 P13‧‧‧ position

P14‧‧‧位置 P14‧‧‧ position

P15‧‧‧位置 P15‧‧‧ position

P16‧‧‧位置 P16‧‧‧ position

T‧‧‧厚度方向 T‧‧‧ thickness direction

W‧‧‧寬度方向 W‧‧‧Width direction

圖1係本發明之第1實施形態之積層陶瓷電容器之方向識別裝置之模式側視圖。 Fig. 1 is a schematic side view showing a direction identifying device for a multilayer ceramic capacitor according to a first embodiment of the present invention.

圖2係本發明之第1實施形態之積層陶瓷電容器組之簡圖之剖視圖。 Fig. 2 is a cross-sectional view showing a schematic view of a multilayer ceramic capacitor package according to a first embodiment of the present invention.

圖3係本發明之第1實施形態之積層陶瓷電容器組之簡圖之俯視圖。 Fig. 3 is a plan view showing a schematic view of a multilayer ceramic capacitor bank according to a first embodiment of the present invention.

圖4係本發明之第1實施形態之積層陶瓷電容器組之簡圖之立體圖。 Fig. 4 is a perspective view showing a schematic view of a multilayer ceramic capacitor bank according to a first embodiment of the present invention.

圖5係圖4之線V-V之簡圖之剖視圖。 Figure 5 is a cross-sectional view of the diagram of line V-V of Figure 4.

圖6係磁性產生裝置與磁通密度測量器之間不存在積層陶瓷電容器之情形時之磁力線之模式圖。 Fig. 6 is a schematic view showing magnetic lines of force when there is no laminated ceramic capacitor between the magnetic generating device and the magnetic flux density measuring device.

圖7係以使內部電極與磁通方向變得垂直(至於電容器，內部電極相對於底面為水平方向)之方式，積層陶瓷電容器位於磁性產生裝置與磁通密度測量器之間之情形時之磁力線的模式圖。 Figure 7 is a diagram showing the manner in which the internal electrode and the magnetic flux direction are perpendicular (as for the capacitor, the internal electrode is horizontal with respect to the bottom surface), and the magnetic field line of the laminated ceramic capacitor is located between the magnetic generating device and the magnetic flux density measuring device. Pattern diagram.

圖8係以使內部電極與磁通方向變得水平(至於電容器，內部電極相對於底面為垂直方向)之方式，積層陶瓷電容器位於磁性產生裝置與磁通密度測量器之間之情形時之磁力線的模式圖。 Figure 8 is a diagram showing the manner in which the internal electrode and the magnetic flux direction are horizontal (as for the capacitor, the internal electrode is perpendicular to the bottom surface), and the magnetic field line of the laminated ceramic capacitor is located between the magnetic generating device and the magnetic flux density measuring device. Pattern diagram.

圖9係表示水平品及垂直品之磁通密度之模式性之圖表。 Fig. 9 is a graph showing the mode of magnetic flux density of horizontal products and vertical products.

圖10係表示水平品及垂直品之磁通密度之積分值之模式性之圖表。 Fig. 10 is a graph showing the mode of the integral value of the magnetic flux density of the horizontal product and the vertical product.

圖11係表示第2實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式側視圖。 Fig. 11 is a schematic side view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to a second embodiment.

圖12係表示第3實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式側視圖。 Fig. 12 is a schematic side view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to a third embodiment.

圖13係表示第4實施形態之積層陶瓷電容器之方向識別裝置之模式側視圖。 Fig. 13 is a schematic side view showing the direction identifying device of the multilayer ceramic capacitor of the fourth embodiment.

圖14係表示第5實施形態之積層陶瓷電容器之方向識別裝置之模式側視圖。 Fig. 14 is a schematic side view showing the direction identifying device of the multilayer ceramic capacitor of the fifth embodiment.

圖15係實驗例1之磁通密度之最大值之直方圖。 Fig. 15 is a histogram of the maximum value of the magnetic flux density of Experimental Example 1.

圖16係實驗例1之磁通密度之積分值之直方圖。 Fig. 16 is a histogram of the integral value of the magnetic flux density of Experimental Example 1.

圖17係第6實施形態之積層陶瓷電容器之方向識別裝置之模式俯視圖。 Fig. 17 is a schematic plan view showing the direction identifying device of the multilayer ceramic capacitor of the sixth embodiment.

圖18係圖17之方向識別裝置之主要部分剖視圖。 Figure 18 is a cross-sectional view showing the main part of the direction recognizing device of Figure 17.

圖19係本發明之第7實施形態之積層陶瓷電容器組之製造裝置之模式俯視圖。 Fig. 19 is a schematic plan view showing a manufacturing apparatus of a multilayer ceramic capacitor bank according to a seventh embodiment of the present invention.

圖20係本發明之第7實施形態之積層陶瓷電容器組之簡圖之剖視圖。 Figure 20 is a cross-sectional view showing a schematic view of a multilayer ceramic capacitor bank in a seventh embodiment of the present invention.

圖21係內部電極與磁通密度測量器平行之情形時之積層陶瓷電容器之磁通線之模式圖。 Fig. 21 is a schematic view showing a magnetic flux line of a multilayer ceramic capacitor in the case where the internal electrode is parallel to the magnetic flux density measuring device.

圖22係內部電極與磁通密度測量器垂直之情形時之積層陶瓷電容器之磁通線之模式圖。 Fig. 22 is a schematic view showing a magnetic flux line of a laminated ceramic capacitor in the case where the internal electrode is perpendicular to the magnetic flux density measuring device.

圖23係表示第8實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式俯視圖。 Fig. 23 is a schematic plan view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to an eighth embodiment.

圖24係表示第9實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式俯視圖。 Fig. 24 is a schematic plan view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to a ninth embodiment.

以下，參照圖對本發明之各實施形態進行說明。且，下述之實施形態僅為例示。本發明絕非限定於下述之實施形態。 Hereinafter, each embodiment of the present invention will be described with reference to the drawings. Further, the following embodiments are merely illustrative. The present invention is by no means limited to the following embodiments.

又，設為對實施形態等所參照之各圖式中之實質上具有相同功能之構件附加相同之符號而供參照。又，實施形態等所參照之圖式係模式性地記載者。故存在圖式中所繪物體之尺寸比例等與實際之物體尺寸比例等不同之情形。即使各圖式之間，亦存在物體之尺寸比例等有所不同之情形。具體之物體之尺寸比例等應參酌以下之說明而判斷之。 In addition, members having substantially the same functions in the respective drawings referred to in the embodiments and the like are denoted by the same reference numerals. Moreover, the drawings referred to in the embodiments and the like are schematically described. Therefore, there is a case where the size ratio of the object drawn in the drawing is different from the actual object size ratio. Even between the various patterns, there are cases where the size ratio of the objects is different. The specific size ratio of the object should be judged according to the following instructions.

(第1實施形態) (First embodiment)

於本實施形態中，對圖4及圖5所示之積層陶瓷電容器1之方向識別方法進行說明。首先，對成為識別對象之積層陶瓷電容器1之構成進行說明。 In the present embodiment, a method of identifying the direction of the multilayer ceramic capacitor 1 shown in FIGS. 4 and 5 will be described. First, the configuration of the multilayer ceramic capacitor 1 to be identified will be described.

(積層陶瓷電容器1之構成) (Composition of laminated ceramic capacitor 1)

如圖4及圖5所示，積層陶瓷電容器1包含陶瓷素體10。陶瓷素體10大致為長方體狀。具體而言，陶瓷素體10係正四角柱狀。陶瓷素體10具有：第1及第2主表面10a、10b；第1及第2側面10c、10d；第1及第2端面10e、10f(參照圖5)。第1及第2主表面10a、10b分別沿長度方向L及寬度方向W延伸。第1主表面10a與第2主表面10b相互平行。第1及第2側面10c、10d分別沿長度方向L及厚度方向T延伸。第1側面10c與第2側面10d相互平行。第1及第2端面10e、10f分別沿寬度方向W及厚度方向T延伸。第1端面10e與第2端面10f相互平行。 As shown in FIGS. 4 and 5, the multilayer ceramic capacitor 1 includes a ceramic body 10. The ceramic body 10 has a substantially rectangular parallelepiped shape. Specifically, the ceramic body 10 is in the form of a regular square column. The ceramic body 10 has first and second main surfaces 10a and 10b, first and second side faces 10c and 10d, and first and second end faces 10e and 10f (see FIG. 5). The first and second main surfaces 10a and 10b extend in the longitudinal direction L and the width direction W, respectively. The first main surface 10a and the second main surface 10b are parallel to each other. The first and second side faces 10c and 10d extend in the longitudinal direction L and the thickness direction T, respectively. The first side surface 10c and the second side surface 10d are parallel to each other. The first and second end faces 10e and 10f extend in the width direction W and the thickness direction T, respectively. The first end surface 10e and the second end surface 10f are parallel to each other.

陶瓷素體10之沿長度方向L之尺寸較佳為0.4mm以上且2.0mm以下，更佳為0.6mm以上且1.0mm以下。陶瓷素體10之沿寬度方向W之尺寸較佳為0.2mm以上且1.2mm以下，更佳為0.3mm以上且0.5mm以下。陶瓷素體10之沿厚度方向T之尺寸較佳為0.2mm以上且1.2mm以下，更佳為0.3mm以上且0.5mm以下。之所以沿長度方向L之尺寸 較佳為1.0mm以下，沿寬度方向W及沿厚度方向T之尺寸較佳為0.5mm以下，係緣於此種尺寸以下之小型品，其磁通密度之測定位置尤其容易自積層陶瓷電容器之中心位置變化。又，之所以沿長度方向L之尺寸較佳為0.6mm以上，沿寬度方向W之尺寸及沿厚度方向T之尺寸之各者較佳為0.3mm以上，係緣於內部電極之密度較高者更利於進行藉由磁通密度之方向識別。基於同樣原因，本發明適合靜電電容為1μF以上之積層陶瓷電容器。 The dimension of the ceramic element body 10 in the longitudinal direction L is preferably 0.4 mm or more and 2.0 mm or less, more preferably 0.6 mm or more and 1.0 mm or less. The dimension of the ceramic element body 10 in the width direction W is preferably 0.2 mm or more and 1.2 mm or less, more preferably 0.3 mm or more and 0.5 mm or less. The dimension of the ceramic element body 10 in the thickness direction T is preferably 0.2 mm or more and 1.2 mm or less, more preferably 0.3 mm or more and 0.5 mm or less. The reason why the length along the length L Preferably, it is 1.0 mm or less, and the dimension in the width direction W and the thickness direction T is preferably 0.5 mm or less, and the measurement of the magnetic flux density is particularly easy for the self-assembled ceramic capacitor. The center position changes. Further, the dimension in the longitudinal direction L is preferably 0.6 mm or more, and the dimension in the width direction W and the dimension in the thickness direction T are preferably 0.3 mm or more, which is higher in the density of the internal electrodes. It is more advantageous to identify the direction by the magnetic flux density. For the same reason, the present invention is suitable for a multilayer ceramic capacitor having an electrostatic capacitance of 1 μF or more.

陶瓷素體10例如可由以介電質陶瓷為主要成分之材料構成。作為介電質陶瓷之具體例，例如可舉出BaTiO3、CaTiO3、SrTiO3，或CaZrO3等。亦可對陶瓷素體10適當添加例如Mn化合物、Mg化合物、Si化合物、Co化合物、Ni化合物、及稀土類化合物等至少1種副成分。 The ceramic body 10 can be made of, for example, a material mainly composed of a dielectric ceramic. Specific examples of the dielectric ceramics include BaTiO 3 , CaTiO 3 , SrTiO 3 , or CaZrO 3 . At least one auxiliary component such as a Mn compound, a Mg compound, a Si compound, a Co compound, a Ni compound, and a rare earth compound may be appropriately added to the ceramic element body 10.

再者，所謂「大致長方體」，係指包含對角部或棱線部做出倒角之長方體，及角部或棱線部被磨圓之長方體。 In addition, the "substantially rectangular parallelepiped" refers to a rectangular parallelepiped including a chamfered corner portion or a ridge portion, and a rectangular parallelepiped in which the corner portion or the ridge portion is rounded.

如圖5所示，於陶瓷素體10之內部，設有複數個內部電極11、12。複數個內部電極11、12係沿厚度方向T積層。各內部電極11、12係於長度方向L及寬度方向W平行而設。於陶瓷素體10之內部，內部電極11與內部電極12係沿厚度方向T交替設置。於厚度方向T之相鄰之內部電極11與內部電極12之間，配置有陶瓷部15。亦即，厚度方向T之相鄰之內部電極11與內部電極12係介隔陶瓷部15而對向。 As shown in FIG. 5, a plurality of internal electrodes 11, 12 are provided inside the ceramic body 10. The plurality of internal electrodes 11, 12 are laminated in the thickness direction T. Each of the internal electrodes 11 and 12 is provided in parallel in the longitudinal direction L and the width direction W. Inside the ceramic body 10, the internal electrode 11 and the internal electrode 12 are alternately arranged in the thickness direction T. A ceramic portion 15 is disposed between the adjacent internal electrode 11 and the internal electrode 12 in the thickness direction T. That is, the adjacent internal electrodes 11 and the internal electrodes 12 in the thickness direction T are opposed to each other via the ceramic portion 15.

內部電極11被引出至第1端面10e。於第1端面10e上，設有外部電極13。外部電極13與內部電極11電性連接。內部電極12被引出至第2端面10f。於第2端面10f上，設有外部電極14。外部電極14與內部電極12電性連接。內部電極11、12可由Ni等磁性材料構成。外部電極13、14可由例如Ni、Cu、Ag、Pd、Au或Ag-Pd合金等之適合之導電材料構成。 The internal electrode 11 is led out to the first end face 10e. An external electrode 13 is provided on the first end face 10e. The external electrode 13 is electrically connected to the internal electrode 11. The internal electrode 12 is led out to the second end face 10f. An external electrode 14 is provided on the second end face 10f. The external electrode 14 is electrically connected to the internal electrode 12. The internal electrodes 11, 12 may be made of a magnetic material such as Ni. The external electrodes 13, 14 may be composed of a suitable conductive material such as Ni, Cu, Ag, Pd, Au or Ag-Pd alloy.

如圖2及圖3所示，積層陶瓷電容器1構成積層陶瓷電容器組2。積層陶瓷電容器組2具有蓋帶(taping)20。蓋帶20具有沿長邊方向空出間隔而設之長方體狀之收容室21。複數個收容室21各者中收容有積層陶瓷電容器1。俯視下，收容室21較積層陶瓷電容器1更大。因此，於收容室21內，積層陶瓷電容器1可於面方向變位。若收容室21內之積層陶瓷電容器1之位置於每個收容室21各不相同，則磁通密度測量之來自於積層陶瓷電容器之中心位置之變化量亦於每個收容室21各不相同。 As shown in FIGS. 2 and 3, the multilayer ceramic capacitor 1 constitutes a laminated ceramic capacitor group 2. The multilayer ceramic capacitor bank 2 has a taping 20. The cover tape 20 has a rectangular parallelepiped accommodation chamber 21 which is provided at intervals in the longitudinal direction. The multilayer ceramic capacitor 1 is housed in each of the plurality of storage chambers 21. The storage chamber 21 is larger than the multilayer ceramic capacitor 1 in plan view. Therefore, in the storage chamber 21, the laminated ceramic capacitor 1 can be displaced in the plane direction. If the position of the multilayer ceramic capacitor 1 in the storage chamber 21 is different for each of the storage chambers 21, the amount of change in the magnetic flux density measured from the center position of the multilayer ceramic capacitor is also different for each of the storage chambers 21.

再者，積層陶瓷電容器1除了如圖4所示之2端子型之積層陶瓷電容器以外，亦可為具備側面電極之3端子或多端子型之積層陶瓷電容器。 In addition to the two-terminal type multilayer ceramic capacitor shown in FIG. 4, the multilayer ceramic capacitor 1 may be a three-terminal or multi-terminal type multilayer ceramic capacitor including a side electrode.

(積層陶瓷電容器之方向識別裝置3之構成) (Composition of the direction identification device 3 of the laminated ceramic capacitor)

積層陶瓷電容器之方向識別裝置3係用於識別積層陶瓷電容器1之複數個內部電極11、12之積層方向的裝置。以下，於本說明書中，將「積層陶瓷電容器1之複數個內部電極11、12之積層方向」，記載為「積層陶瓷電容器1之積層方向」，或簡記為「積層方向」。 The direction identifying device 3 of the multilayer ceramic capacitor is a device for identifying the lamination direction of the plurality of internal electrodes 11 and 12 of the multilayer ceramic capacitor 1. In the present specification, the "layering direction of the plurality of internal electrodes 11 and 12 of the multilayer ceramic capacitor 1" is referred to as "the lamination direction of the laminated ceramic capacitor 1," or simply "the lamination direction".

如圖1所示，方向識別裝置3包含磁性產生裝置31與磁通密度測量器32。磁通密度測量器32係為能夠檢測磁性產生裝置31所產生之磁通密度而配置。磁通密度測量器32測量自磁性產生裝置31產生之磁通密度。詳細而言，磁通密度測量器32係以10kHz以上且100kHz以下之程度之間隔連續進行磁通密度之測定。 As shown in FIG. 1, the direction identifying device 3 includes a magnetic generating device 31 and a magnetic flux density measuring device 32. The magnetic flux density measuring device 32 is disposed to be capable of detecting the magnetic flux density generated by the magnetic generating device 31. The magnetic flux density measuring device 32 measures the magnetic flux density generated from the magnetic generating device 31. Specifically, the magnetic flux density measuring device 32 continuously measures the magnetic flux density at intervals of 10 kHz or more and 100 kHz or less.

方向識別裝置3進而包含搬送裝置35。搬送裝置35使積層陶瓷電容器1經過磁性產生裝置31與磁通密度測量器32之間。具體而言，搬送裝置35具有第1輥子33與第2輥子34。第1輥子33捲繞有積層陶瓷電容器組2，自該第1輥子33送出積層陶瓷電容器組2。經過磁性產生裝置31與磁通密度測量器32之間之積層陶瓷電容器組2被捲繞於第2輥子 34。 The direction identifying device 3 further includes a transport device 35. The transport device 35 passes the multilayer ceramic capacitor 1 between the magnetic generating device 31 and the magnetic flux density measuring device 32. Specifically, the conveying device 35 has a first roller 33 and a second roller 34. The laminated ceramic capacitor group 2 is wound around the first roller 33, and the multilayer ceramic capacitor group 2 is sent out from the first roller 33. The laminated ceramic capacitor group 2 passing between the magnetic generating device 31 and the magnetic flux density measuring device 32 is wound around the second roller 34.

磁通密度測量器32係至少於積層陶瓷電容器1經過磁通密度測量器32之前時測量磁通密度。磁通密度測量器32將測量結果輸出至方向識別部36。方向識別部36係基於自磁通密度測量器32輸出之磁通密度之測量結果，識別積層陶瓷電容器1之積層方向。方向識別部36係對積層陶瓷電容器組2中相互空出間隔而配置為一列之複數個積層陶瓷電容器1，依序進行該積層方向之識別。 The magnetic flux density measuring device 32 measures the magnetic flux density at least before the multilayer ceramic capacitor 1 passes through the magnetic flux density measuring device 32. The magnetic flux density measurer 32 outputs the measurement result to the direction identifying portion 36. The direction recognizing unit 36 identifies the lamination direction of the multilayer ceramic capacitor 1 based on the measurement result of the magnetic flux density output from the magnetic flux density measuring device 32. The direction identifying unit 36 sequentially recognizes the laminated direction of the plurality of laminated ceramic capacitors 1 which are arranged in a line with each other in the multilayer ceramic capacitor group 2.

於製造積層陶瓷電容器組2時，首先，製作積層陶瓷電容器1。其次，將所製作之積層陶瓷電容器1收容於蓋帶20內，而製作積層陶瓷電容器組2。其次，識別被收容於積層陶瓷電容器組2之積層陶瓷電容器1之積層方向。其結果，例如確認積層陶瓷電容器1之整列率，或於檢測出並非所期望之積層方向之積層陶瓷電容器1時，對該積層陶瓷電容器1進行標示，亦或除去該積層陶瓷電容器1。 When manufacturing the multilayer ceramic capacitor bank 2, first, the multilayer ceramic capacitor 1 is produced. Next, the produced multilayer ceramic capacitor 1 is housed in the cover tape 20 to form a laminated ceramic capacitor group 2. Next, the lamination direction of the multilayer ceramic capacitor 1 accommodated in the multilayer ceramic capacitor group 2 is identified. As a result, for example, when the multilayer ceramic capacitor 1 is confirmed, or when the multilayer ceramic capacitor 1 is not in the desired lamination direction, the multilayer ceramic capacitor 1 is marked or the multilayer ceramic capacitor 1 is removed.

(方向識別方法) (direction identification method)

其次，對方向識別部36所進行之積層陶瓷電容器1之方向識別方法進行說明。再者，於以下之說明中，將積層方向與磁通方向垂直者設為「水平品」(至於積層陶瓷電容器，內部電極相對於收容室21之底面為水平方向)，將平行者設為「垂直品」(至於積層陶瓷電容器，內部電極相對於收容室21之底面為垂直方向)。 Next, a method of identifying the direction of the multilayer ceramic capacitor 1 by the direction identifying unit 36 will be described. In the following description, the vertical direction of the lamination direction and the magnetic flux direction is referred to as "horizontal product" (as for the multilayer ceramic capacitor, the internal electrode is horizontal with respect to the bottom surface of the storage chamber 21), and the parallel is set to " Vertical product" (As for the multilayer ceramic capacitor, the internal electrodes are perpendicular to the bottom surface of the housing chamber 21).

首先，對本實施形態之方向識別方法之原理，一面參照圖6至圖8一面進行說明。例如，如圖6所示，於積層陶瓷電容器1並非位於磁性產生裝置31與磁通密度測量器32之間之狀態時，通過磁通密度測量器32之磁力線Lm之間隔變得最寬，換言之，每單位面積之磁力線Lm之條數減少，磁通密度成為較低值。 First, the principle of the direction identifying method of the present embodiment will be described with reference to Figs. 6 to 8 . For example, as shown in FIG. 6, when the multilayer ceramic capacitor 1 is not located between the magnetic generating device 31 and the magnetic flux density measuring device 32, the interval of the magnetic lines of force Lm passing through the magnetic flux density measuring device 32 becomes the widest, in other words, The number of magnetic lines of force Lm per unit area is reduced, and the magnetic flux density becomes a lower value.

如圖7及圖8所示，相較於積層陶瓷電容器1並非位於磁性產生裝置31與磁通密度測量器32之間之情形，於積層陶瓷電容器1位於磁性 產生裝置31與磁通密度測量器32之間時，通過磁通密度測量器32之磁力線Lm之間隔變窄。相較於積層陶瓷電容器1並非位於磁性產生裝置31與磁通密度測量器32之間之情形，於積層陶瓷電容器1位於磁性產生裝置31與磁通密度測量器32之間時，每單位面積之磁力線Lm之條數增多。圖8所示之積層方向與磁通方向平行(至於電容器，內部電極相對於底面為垂直方向)時較圖7所示之垂直(至於電容器，內部電極相對於底面為水平方向)時，通過磁通密度測量器32之磁力線Lm之間隔變窄。圖8所示之積層方向與磁通方向平行時之每單位面積之磁力線Lm之條數增多。 As shown in FIGS. 7 and 8, the multilayer ceramic capacitor 1 is located between the magnetic generating device 31 and the magnetic flux density measuring device 32, and the laminated ceramic capacitor 1 is located in the magnetic state. When the generating device 31 is between the magnetic flux density measuring device 32, the interval of the magnetic lines of force Lm passing through the magnetic flux density measuring device 32 is narrowed. In contrast to the case where the multilayer ceramic capacitor 1 is not located between the magnetic generating device 31 and the magnetic flux density measuring device 32, when the laminated ceramic capacitor 1 is positioned between the magnetic generating device 31 and the magnetic flux density measuring device 32, the unit area is The number of magnetic lines of flux Lm increases. The lamination direction shown in FIG. 8 is parallel to the magnetic flux direction (as for the capacitor, the internal electrode is perpendicular to the bottom surface) when it is perpendicular to the one shown in FIG. 7 (as for the capacitor, the internal electrode is horizontal with respect to the bottom surface), and the magnetic The interval of the magnetic lines of force Lm of the pass density measuring device 32 is narrowed. When the lamination direction shown in Fig. 8 is parallel to the magnetic flux direction, the number of magnetic lines of force Lm per unit area increases.

因此，如圖9所示，於積層方向與磁通方向平行時所測量之磁通密度高於垂直時。又，如圖10所示般，積層方向與磁通方向平行時所測量之磁通密度之積分值高於垂直時。 Therefore, as shown in Fig. 9, the magnetic flux density measured when the lamination direction is parallel to the magnetic flux direction is higher than the vertical direction. Further, as shown in Fig. 10, the integrated value of the magnetic flux density measured when the lamination direction is parallel to the magnetic flux direction is higher than that in the vertical direction.

因此，例如，可基於所測量之磁通密度之最大值而識別積層陶瓷電容器1之積層方向。例如，可基於所測量之磁通密度之積分值而識別積層陶瓷電容器1之積層方向。 Therefore, for example, the lamination direction of the laminated ceramic capacitor 1 can be identified based on the maximum value of the measured magnetic flux density. For example, the lamination direction of the laminated ceramic capacitor 1 can be identified based on the integrated value of the measured magnetic flux density.

自更準確地識別積層陶瓷電容器1之積層方向之觀點而言，較佳為基於所測量之磁通密度之積分值來識別積層方向。水平品之磁通密度之積分值D3與垂直品之磁通密度之積分值D4之差△d2(D4-D3)(參照圖10)，大於水平品之最大磁通密度D1與垂直品之最大磁通密度D2之差△d1(D2-D1)(參照圖9)。因此，基於△d2識別積層陶瓷電容器1之方向較基於△d1識別積層陶瓷電容器1之方向可提高識別精度。例如，即使因檢測積層陶瓷電容器1時之位置偏差而造成磁通密度之最大值不一致之情形時，藉由使用磁通密度之積分值，即可準確地識別積層陶瓷電容器1之積層方向。 From the viewpoint of more accurately identifying the lamination direction of the laminated ceramic capacitor 1, it is preferable to identify the lamination direction based on the integrated value of the measured magnetic flux density. The difference between the integral value D3 of the magnetic flux density of the horizontal product and the integral value D4 of the magnetic flux density of the vertical product Δd2 (D4-D3) (refer to FIG. 10), which is greater than the maximum magnetic flux density D1 of the horizontal product and the maximum of the vertical product. The difference Δd1 (D2-D1) between the magnetic flux densities D2 (refer to Fig. 9). Therefore, the direction in which the multilayer ceramic capacitor 1 is identified based on Δd2 can improve the recognition accuracy from the direction in which the laminated ceramic capacitor 1 is identified based on Δd1. For example, even when the maximum value of the magnetic flux density does not match due to the positional deviation when the ceramic capacitor 1 is laminated, the laminated direction of the multilayer ceramic capacitor 1 can be accurately identified by using the integral value of the magnetic flux density.

又，於使用磁通密度之積分值識別積層陶瓷電容器1之積層方向時，則必須檢測磁通密度之最大值。因此，必須增長磁性產生裝置31 與磁通密度測量器32之間之距離。故而，可抑制因測量積層陶瓷電容器1之磁通密度時之積層陶瓷電容器1之位置偏差所引起之方向識別精度之降低。 Further, when the laminated direction of the multilayer ceramic capacitor 1 is identified using the integral value of the magnetic flux density, it is necessary to detect the maximum value of the magnetic flux density. Therefore, it is necessary to grow the magnetic generating device 31 The distance from the magnetic flux density measurer 32. Therefore, it is possible to suppress a decrease in the direction recognition accuracy caused by the positional deviation of the multilayer ceramic capacitor 1 when the magnetic flux density of the multilayer ceramic capacitor 1 is measured.

尤其於內部電極11、12之積層層數較少之情形時，因△d1很容易變小，而導致△d2與△d1之差(△d2-△d1)很容易變大。因此，於內部電極11、12之積層層數較少之情形時，相較於使用磁通密度之最大值，較佳使用磁通密度之積分值來進行積層方向之識別。具體而言，使用磁通密度之積分值進行積層方向之識別更適合內部電極11、12之積層層數為100層以下之積層陶瓷電容器1。 In particular, when the number of layers of the internal electrodes 11 and 12 is small, Δd1 is easily reduced, and the difference (Δd2 - Δd1) between Δd2 and Δd1 is easily increased. Therefore, when the number of layers of the internal electrodes 11 and 12 is small, it is preferable to use the integral value of the magnetic flux density to identify the layering direction as compared with the maximum value of the magnetic flux density. Specifically, the identification of the lamination direction using the integral value of the magnetic flux density is more suitable for the multilayer ceramic capacitor 1 in which the number of layers of the internal electrodes 11 and 12 is 100 or less.

以下，對本發明之較佳之實施形態之另一例進行說明。於以下之說明中，對具有與上述第1實施形態實質上相同之功能之構件附加相同之符號而供參照，且不重複說明。 Hereinafter, another example of a preferred embodiment of the present invention will be described. In the following description, components having substantially the same functions as those of the above-described first embodiment are denoted by the same reference numerals, and the description thereof will not be repeated.

(第2實施形態) (Second embodiment)

於第1實施形態中，已針對對收容於積層陶瓷電容器組2之積層陶瓷電容器1進行磁通密度測量步驟之例進行說明。但本發明並非限定於此。 In the first embodiment, an example in which the magnetic flux density measuring step is performed on the multilayer ceramic capacitor 1 housed in the multilayer ceramic capacitor group 2 will be described. However, the invention is not limited thereto.

例如，如圖11所示，亦可一面由搬送裝置41於磁性產生裝置31與磁通密度測量器32之間搬送未被收容於蓋帶之積層陶瓷電容器1，一面識別其積層方向。亦可於使積層陶瓷電容器1經過磁性產生裝置31與磁通密度測量器32之間後，使積層陶瓷電容器1旋轉以使其積層方向一致；亦可除去並非所期望之積層方向之積層陶瓷電容器1。 For example, as shown in FIG. 11, the laminated ceramic capacitor 1 not accommodated in the cover tape may be conveyed between the magnetic generating device 31 and the magnetic flux density measuring device 32 by the transfer device 41, and the lamination direction may be recognized. Alternatively, after the multilayer ceramic capacitor 1 is passed between the magnetic generating device 31 and the magnetic flux density measuring device 32, the laminated ceramic capacitor 1 may be rotated to have the lamination direction thereof uniform; and the multilayer ceramic capacitor not having the desired lamination direction may be removed. 1.

(第3實施形態) (Third embodiment)

圖12係表示第3實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式側視圖。於本實施形態中，於搬送路徑42設有磁性產生裝置31與磁通密度測量器32。於搬送路徑42，由線型給料器(linear feeder)等給料器沿一列(沿一個方向)供給複數個積層陶瓷電容器1。 判定並非所期望之積層方向之積層陶瓷電容器1被自送風孔43噴出之氣體自搬送路徑42吹飛至搬送路徑44。被吹飛之積層陶瓷電容器1經由搬送路徑44而被予以回收或廢棄。 Fig. 12 is a schematic side view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to a third embodiment. In the present embodiment, the magnetic generation device 31 and the magnetic flux density measuring device 32 are provided on the transport path 42. In the transport path 42, a plurality of laminated ceramic capacitors 1 are supplied in a row (in one direction) by a feeder such as a linear feeder. It is determined that the gas discharged from the air supply hole 43 by the multilayer ceramic capacitor 1 which is not in the desired lamination direction is blown from the transport path 42 to the transport path 44. The laminated ceramic capacitor 1 that has been blown off is recovered or discarded via the transfer path 44.

沿搬送路徑42搬送之積層陶瓷電容器1例如可由蓋帶收容機收容於蓋帶，亦可例如由安裝機安裝至安裝基板等。 The multilayer ceramic capacitor 1 that is transported along the transport path 42 can be housed in the cover tape by, for example, a cover tape storage device, and can be attached to a mounting substrate or the like by, for example, a mounting machine.

(第4實施形態) (Fourth embodiment)

圖13係表示第4實施形態之積層陶瓷電容器之方向識別裝置之模式側視圖。第4實施形態之方向識別裝置構成蓋帶式電子零件組之製造裝置之一部分。 Fig. 13 is a schematic side view showing the direction identifying device of the multilayer ceramic capacitor of the fourth embodiment. The direction identifying device of the fourth embodiment constitutes a part of a manufacturing device of a cover tape type electronic component group.

於本實施形態中，於蓋帶式電子零件組之製造裝置，設有球型供料器50。球型供料器50中收容有複數個積層陶瓷電容器1。球型供料器50係藉由振動而對線型供料器51依序供給電子零件。 In the present embodiment, a ball feeder 50 is provided in the manufacturing apparatus of the cover tape type electronic component group. The ball type feeder 50 houses a plurality of laminated ceramic capacitors 1. The ball feeder 50 sequentially supplies the electronic components to the linear feeder 51 by vibration.

線型供料器51搬送藉由振動而供給之積層陶瓷電容器1。線型供料器51對搬送裝置52供給積層陶瓷電容器1。搬送裝置52將積層陶瓷電容器1搬送至載帶(Carrier Tape)53為止。搬送裝置52具有以中心軸C為中心而旋轉之圓板狀之搬送台54。 The linear feeder 51 conveys the multilayer ceramic capacitor 1 supplied by vibration. The linear feeder 51 supplies the multilayer ceramic capacitor 1 to the transfer device 52. The transport device 52 transports the multilayer ceramic capacitor 1 to the carrier tape 53. The conveying device 52 has a disk-shaped conveying table 54 that rotates around the central axis C.

具體而言，於本實施形態中，圓形之轉動體，即搬送台54係以中心軸C為中心而順時針旋轉。搬送台54具備複數個凹部(收容部)54a。複數個凹部54a係沿圓形轉動體之外周相互空出間隔而設置為一列。搬送台54之凹部54a係於位置P1，被自線型供料器51振動式地送入積層陶瓷電容器1。位置P1之被振動式地送入至凹部54a之積層陶瓷電容器1藉由搬送台54之旋轉，以中心軸C為中心沿圓周方向被搬送。 Specifically, in the present embodiment, the circular rotating body, that is, the transfer table 54 is rotated clockwise around the central axis C. The transfer table 54 includes a plurality of recesses (accommodating portions) 54a. The plurality of recesses 54a are arranged in a line along the outer circumference of the circular rotor. The concave portion 54a of the transfer table 54 is attached to the multilayer ceramic capacitor 1 in a vibrating manner from the linear feeder 51 at the position P1. The multilayer ceramic capacitor 1 that is vibrated into the concave portion 54a at the position P1 is conveyed in the circumferential direction around the central axis C by the rotation of the transfer table 54.

積層陶瓷電容器1被搬送至位置P3為止。積層陶瓷電容器1係於位置P3自搬送台54被收容於載帶53之收容室53a。於搬送路徑中之位於位置P1與位置P3之間之位置P2，設有方向識別裝置55。方向識別 裝置55包含磁性產生裝置31與磁通密度測量器32。 The multilayer ceramic capacitor 1 is transported to the position P3. The multilayer ceramic capacitor 1 is housed in the storage chamber 53a of the carrier tape 53 from the transfer table 54 at the position P3. A direction identifying means 55 is provided at a position P2 between the position P1 and the position P3 in the transport path. Direction recognition The device 55 includes a magnetic generating device 31 and a magnetic flux density measuring device 32.

由該方向識別裝置55識別積層陶瓷電容器1之積層方向。可於使積層陶瓷電容器1經過磁性產生裝置31與磁通密度測量器32之間後，使積層陶瓷電容器1旋轉以使其積層方向一致，亦可取出並非所期望之積層方向之積層陶瓷電容器1。於本實施形態中，亦可於將積層陶瓷電容器1收容於蓋帶之前，識別積層陶瓷電容器1之積層方向。 The direction identifying means 55 recognizes the lamination direction of the multilayer ceramic capacitor 1. After the multilayer ceramic capacitor 1 is passed between the magnetic generating device 31 and the magnetic flux density measuring device 32, the laminated ceramic capacitor 1 is rotated to make the lamination direction uniform, and the laminated ceramic capacitor 1 which is not in the desired lamination direction can be taken out. . In the present embodiment, the laminated direction of the multilayer ceramic capacitor 1 can be identified before the multilayer ceramic capacitor 1 is housed in the cover tape.

(第5實施形態) (Fifth Embodiment)

圖14係表示第5實施形態之積層陶瓷電容器之方向識別裝置之模式側視圖。圖14所示之方向識別裝置例如亦可具備介隔用於對安裝基板61進行安裝之貼片機70而配置之磁性產生裝置31與磁通密度測量器32。於該情形時，可於安裝前判別積層陶瓷電容器1之積層方向。再者，貼片機70亦可具備吸附噴嘴。 Fig. 14 is a schematic side view showing the direction identifying device of the multilayer ceramic capacitor of the fifth embodiment. The direction identifying device shown in FIG. 14 may include, for example, a magnetic generating device 31 and a magnetic flux density measuring device 32 that are disposed to interpose the mounter 70 for mounting the mounting substrate 61. In this case, the lamination direction of the multilayer ceramic capacitor 1 can be discriminated before mounting. Furthermore, the placement machine 70 may also be provided with an adsorption nozzle.

(實驗例1) (Experimental Example 1)

準備150個具有下述之設計參數之積層電容器。接著，以設為水平品之狀態，測定磁通密度之最大值，其後，於設為垂直品後，測定磁通密度之最大值。將結果顯示於圖15。以設為水平品之狀態，測定磁通密度之積分值，其後，於設為垂直品後，測定磁通密度之積分值。將結果顯示於圖16。再者，於圖15及圖16各者中，縱軸表示頻率、橫軸表示磁通密度。 150 multilayer capacitors having the following design parameters were prepared. Next, the maximum value of the magnetic flux density was measured in a state of being a horizontal product, and thereafter, the maximum value of the magnetic flux density was measured after being set as a vertical product. The results are shown in Fig. 15. The integrated value of the magnetic flux density was measured in a state of being a horizontal product, and thereafter, the integrated value of the magnetic flux density was measured after being set as a vertical product. The results are shown in Fig. 16. In addition, in each of FIGS. 15 and 16, the vertical axis represents the frequency and the horizontal axis represents the magnetic flux density.

自圖15所示之結果可知，於測量磁通密度之最大值時，存在水平品與垂直品不易出現磁通密度差之情形。另一方面，可知於測量磁通密度之積分值之情形時，水平品與垂直品容易產生磁通密度差。自該結果可知，藉由使用磁通密度之積分值，可準確地識別積層陶瓷電容器之方向。 As is apparent from the results shown in Fig. 15, when the maximum value of the magnetic flux density is measured, there is a case where the horizontal and vertical products are less likely to have a difference in magnetic flux density. On the other hand, it is known that when measuring the integral value of the magnetic flux density, the horizontal product and the vertical product are liable to cause a difference in magnetic flux density. From this result, it is understood that the direction of the laminated ceramic capacitor can be accurately identified by using the integral value of the magnetic flux density.

於本實驗例中，將積層陶瓷電容器之大小設為1mm×0.5mm×0.5mm，將內部電極設為以鎳為主要成分之電極，將內部電極之積層層 數設為40層，將積層陶瓷電容器之靜電電容設為0.1μF。 In the present experimental example, the size of the multilayer ceramic capacitor was set to 1 mm × 0.5 mm × 0.5 mm, and the internal electrode was set to an electrode mainly composed of nickel, and the internal electrode was laminated. The number was set to 40 layers, and the capacitance of the multilayer ceramic capacitor was set to 0.1 μF.

(第6實施形態) (Sixth embodiment)

圖17係表示第6實施形態之積層陶瓷電容器1之方向識別裝置之模式俯視圖。 Fig. 17 is a schematic plan view showing a direction identifying device of the multilayer ceramic capacitor 1 of the sixth embodiment.

如圖17所示，線型供料器51對旋轉式之搬送裝置52供給積層陶瓷電容器1。搬送裝置52將積層陶瓷電容器1搬送至載帶53為止。搬送裝置52具備以中心軸C為中心而旋轉之圓板狀之搬送台54、及供配置搬送台54之搬送載台71(參照圖18)。如圖17所示，於線型供料器51，設有產生磁性之磁性產生裝置60，藉由積層陶瓷電容器1經過該磁性產生裝置60前，積層陶瓷電容器1被予以磁化。磁性產生裝置60兼具藉由以磁力使積層陶瓷電容器1旋轉而使內部電極11、12之方向一致之功能。 As shown in FIG. 17, the linear feeder 51 supplies the laminated ceramic capacitor 1 to the rotary transfer apparatus 52. The transport device 52 transports the multilayer ceramic capacitor 1 to the carrier tape 53. The conveyance device 52 includes a disk-shaped transfer table 54 that rotates around the center axis C, and a transfer stage 71 on which the transfer table 54 is placed (see FIG. 18). As shown in Fig. 17, in the linear feeder 51, a magnetic generating device 60 for generating magnetism is provided, and the laminated ceramic capacitor 1 is magnetized before the multilayered ceramic capacitor 1 passes through the magnetic generating device 60. The magnetic generating device 60 also functions to rotate the laminated ceramic capacitor 1 by magnetic force to match the directions of the internal electrodes 11 and 12.

搬送台54於外周面具備複數個凹部54a，複數個凹部54a係沿搬送台54之圓周方向以等間隔設置。複數個凹部54a分別自搬送台54之外周面朝中心軸C延伸，且自搬送台54之一主表面貫通至另一主表面。如圖18所示，搬送台54設置於搬送載台71上，由該搬送載台71封閉凹部54a之下側。 The transfer table 54 has a plurality of concave portions 54a on the outer peripheral surface, and a plurality of concave portions 54a are provided at equal intervals in the circumferential direction of the transfer table 54. The plurality of concave portions 54a extend from the outer peripheral surface of the transfer table 54 toward the central axis C, and penetrate from one main surface of the transfer table 54 to the other main surface. As shown in FIG. 18, the conveyance stage 54 is provided in the conveyance stage 71, and the conveyance stage 71 closes the lower side of the recessed part 54a.

如圖17所示，於位於位置P11至位置P16之搬送路徑之位置P12，配置有靜電電容測定部75。由該靜電電容測定部75測定被收容於凹部54a之積層陶瓷電容器1之靜電電容。所測定之積層陶瓷電容器1之靜電電容被輸出至控制部73。 As shown in FIG. 17, the capacitance measuring unit 75 is disposed at the position P12 of the transport path from the position P11 to the position P16. The capacitance measuring unit 75 measures the capacitance of the multilayer ceramic capacitor 1 housed in the recess 54a. The capacitance of the multilayer ceramic capacitor 1 measured is output to the control unit 73.

於位於位置P12與位置P16之間之位置P13，設有構成方向識別裝置55之磁通密度測量部。磁通密度測量部係為識別積層陶瓷電容器1之積層方向，而測量積層陶瓷電容器1經過時之磁通密度。如圖18所示，磁通密度測量部具有磁性產生裝置55a與磁通密度測量器55b。磁性產生裝置55a與磁通密度測量器55b對向。由搬送裝置52所搬送之積 層陶瓷電容器1經過磁性產生裝置55a與磁通密度測量器55b之間。搬送積層陶瓷電容器1之搬送台54與搬送載台71位於磁性產生裝置55a與磁通密度測量器55b之間。 A magnetic flux density measuring unit constituting the direction identifying means 55 is provided at a position P13 between the position P12 and the position P16. The magnetic flux density measuring unit measures the direction of lamination of the laminated ceramic capacitor 1 and measures the magnetic flux density when the laminated ceramic capacitor 1 passes. As shown in FIG. 18, the magnetic flux density measuring section has a magnetic generating device 55a and a magnetic flux density measuring device 55b. The magnetic generating device 55a is opposed to the magnetic flux density measuring device 55b. The product carried by the transport device 52 The layer ceramic capacitor 1 passes between the magnetic generating device 55a and the magnetic flux density measuring device 55b. The transfer table 54 and the transfer stage 71 that transport the multilayer ceramic capacitor 1 are located between the magnetic generation device 55a and the magnetic flux density measuring device 55b.

於積層方向與磁性產生裝置55a及磁通密度測量器55b之排列方向垂直時及平行時，自磁性產生裝置55a經過積層陶瓷電容器1而到達至磁通密度測量器55b之磁通密度不盡相同。因此，藉由以磁通密度測量器55b檢測積層陶瓷電容器1經過磁性產生裝置55a與磁通密度測量器55b之間之彼時之磁通密度，可識別積層陶瓷電容器1之積層方向。磁通密度測量器55b將所檢測出之磁通密度輸出至方向識別部，即控制部73。控制部73對所測定之磁通密度進行適當運算處理，而求得例如上述之磁通密度之積分值。 When the lamination direction is perpendicular to and parallel to the arrangement direction of the magnetic generating device 55a and the magnetic flux density measuring device 55b, the magnetic flux density from the magnetic generating device 55a to the magnetic flux density measuring device 55b through the laminated ceramic capacitor 1 is different. . Therefore, the lamination direction of the laminated ceramic capacitor 1 can be identified by detecting the magnetic flux density of the laminated ceramic capacitor 1 between the magnetic generating device 55a and the magnetic flux density measuring device 55b by the magnetic flux density measuring device 55b. The magnetic flux density measuring device 55b outputs the detected magnetic flux density to the direction identifying unit, that is, the control unit 73. The control unit 73 performs an appropriate calculation process on the measured magnetic flux density to obtain, for example, the integral value of the magnetic flux density described above.

自更可靠地識別積層陶瓷電容器1之積層方向之觀點而言，搬送台54較佳由不鏽鋼、鋁、塑料、或陶瓷等非磁性體構成。又，搬送載台71較佳由不鏽鋼、鋁、塑料、或陶瓷等非磁性體構成。其中，搬送台54及搬送載台71較佳分別由耐磨耗性亦優異之氧化鋯構成。於該等情形時，可以更高之精度測定經過積層陶瓷電容器1之磁通密度。 The transfer table 54 is preferably made of a non-magnetic material such as stainless steel, aluminum, plastic, or ceramic from the viewpoint of more reliably identifying the lamination direction of the multilayer ceramic capacitor 1. Further, the transfer stage 71 is preferably made of a non-magnetic material such as stainless steel, aluminum, plastic, or ceramic. Among them, the transfer table 54 and the transfer stage 71 are preferably made of zirconia which is excellent in abrasion resistance. In such cases, the magnetic flux density passing through the multilayer ceramic capacitor 1 can be measured with higher accuracy.

如圖17所示，於搬送路徑中之位於位置P13與位置P16之間之位置P14，設有攝像部72。攝像部72係自上方拍攝積層陶瓷電容器1。所拍攝之圖像被輸出至控制部73。 As shown in FIG. 17, an imaging unit 72 is provided at a position P14 between the position P13 and the position P16 in the transport path. The imaging unit 72 captures the multilayer ceramic capacitor 1 from above. The captured image is output to the control unit 73.

於搬送路徑中位於位置P14與位置P16之間之位置P15，設有分揀部74。分揀部74連接於控制部73，其基於控制部73之指示而分揀積層陶瓷電容器1。具體而言，控制部73判斷自靜電電容測定部75輸出之靜電電容是否在預設之靜電電容之範圍(靜電電容之規格)內。且，控制部73判斷基於磁通密度所特定之積層方向是否與預設方向一致。控制部73係基於自攝像部72輸出之圖像，判斷積層陶瓷電容器1是否存在外觀不良。控制部73認定與上述3個條件中之任一者不相符之積層 陶瓷電容器1為不良品，並將其除去。 A sorting unit 74 is provided at a position P15 between the position P14 and the position P16 in the transport path. The sorting unit 74 is connected to the control unit 73, and sorts the multilayer ceramic capacitor 1 based on the instruction of the control unit 73. Specifically, the control unit 73 determines whether or not the electrostatic capacitance output from the capacitance measuring unit 75 is within the range of the predetermined electrostatic capacitance (the specification of the electrostatic capacitance). Further, the control unit 73 determines whether or not the lamination direction specified by the magnetic flux density coincides with the preset direction. The control unit 73 determines whether or not the multilayer ceramic capacitor 1 has an appearance defect based on the image output from the imaging unit 72. The control unit 73 identifies a laminate that does not match any of the above three conditions. The ceramic capacitor 1 is a defective product and is removed.

對本實施形態之靜電電容測定部75、磁通密度測量部(方向識別裝置55)、攝像部72、及分揀部74各者之配置，進行更具體之說明。搬送台54進行所謂間歇動作，即每隔固定間隔反復進行旋轉運動及停止。靜電電容測定部75、攝像部72、及分揀部74各者之位置係與搬送台54停止時之凹部54a之位置重疊。另一方面，磁通密度測量部之位置係與搬送台54之旋轉運動時凹部54a所經過之位置重疊。 The arrangement of each of the capacitance measuring unit 75, the magnetic flux density measuring unit (direction identifying device 55), the imaging unit 72, and the sorting unit 74 of the present embodiment will be described more specifically. The transfer table 54 performs an intermittent operation in which the rotational motion and the stop are repeated at regular intervals. The positions of the electrostatic capacitance measuring unit 75, the imaging unit 72, and the sorting unit 74 are overlapped with the position of the concave portion 54a when the transfer table 54 is stopped. On the other hand, the position of the magnetic flux density measuring unit overlaps with the position at which the concave portion 54a passes during the rotational movement of the transfer table 54.

亦即，於靜電電容測定部75、攝像部72、及分揀部74各者之位置與凹部54a之位置分別重疊時，磁通密度測量部(方向識別裝置55)之位置與凹部54a之位置並未重疊。反之，於磁通密度測量部(方向識別裝置55)之位置與凹部54a之位置重疊時，靜電電容測定部75、攝像部72、及分揀部74各者之位置與凹部54a之位置並不重疊。 In other words, when the position of each of the capacitance measuring unit 75, the imaging unit 72, and the sorting unit 74 overlaps with the position of the concave portion 54a, the position of the magnetic flux density measuring unit (direction identifying device 55) and the position of the concave portion 54a. Did not overlap. On the other hand, when the position of the magnetic flux density measuring unit (direction identifying device 55) overlaps with the position of the concave portion 54a, the position of each of the capacitance measuring unit 75, the imaging unit 72, and the sorting unit 74 and the position of the concave portion 54a are not overlapping.

再者，所謂靜電電容測定部75、攝像部72、分揀部74、及磁通密度測量部之各者之位置與凹部54a之位置重疊，意指搬送台54之圓周方向之靜電電容測量部75、攝像部72、分揀部74、及磁通密度測量部之各者之中心與任一凹部54a之一部分重疊。 In addition, the position of each of the capacitance measuring unit 75, the imaging unit 72, the sorting unit 74, and the magnetic flux density measuring unit overlaps with the position of the concave portion 54a, and means the capacitance measuring unit in the circumferential direction of the transfer table 54. 75. The center of each of the imaging unit 72, the sorting unit 74, and the magnetic flux density measuring unit partially overlaps one of the recesses 54a.

例如，於搬送台54以等間隔配置N個凹部54a，於搬送台54反復進行(360/N)度之旋轉運動與停止之情形時，靜電電容測定部75、攝像部72、及分揀部74各者之位置相互對於搬送台54之旋轉中心偏移(360/N)度之整數倍。另一方面，磁通密度測量部之位置與對於靜電電容測定部75、攝像部72、及分揀部74各者之配置偏移(360/N)度之整數倍之位置並不相同。 For example, when the N transfer portions 54a are arranged at equal intervals on the transfer table 54 and the transfer operation is repeated (360/N) degrees, the capacitance measuring unit 75, the imaging unit 72, and the sorting unit are performed. The position of each of the 74 is an integral multiple of the rotation center offset (360/N) of the transfer table 54. On the other hand, the position of the magnetic flux density measuring unit is not the same as the position of an integral multiple of the arrangement offset (360/N) of each of the capacitance measuring unit 75, the imaging unit 72, and the sorting unit 74.

於至此所說明之第1至第6實施形態中之任一種形態中，相鄰之積層陶瓷電容器1之間隔均會對積層方向之識別精度造成影響。積層方向係藉捕捉積層陶瓷電容器1經過磁通密度測量部時之磁通密度而識別。因此，若相鄰之積層陶瓷電容器1之間隔過窄，則磁通密度會 受到相鄰之積層陶瓷電容器1之影響，而造成積層方向之識別精度隨之降低。 In any of the first to sixth embodiments described above, the interval between the adjacent multilayer ceramic capacitors 1 affects the recognition accuracy of the stacking direction. The lamination direction is recognized by capturing the magnetic flux density when the multilayer ceramic capacitor 1 passes through the magnetic flux density measuring portion. Therefore, if the interval between adjacent multilayer ceramic capacitors 1 is too narrow, the magnetic flux density will Influenced by the adjacent laminated ceramic capacitor 1, the recognition accuracy of the stacking direction is lowered.

因此，較佳將相鄰之積層陶瓷電容器1之間隔設為積層陶瓷電容器1之經過方向之磁性產生裝置55a之尺寸之1/2以上。或者，較佳將相鄰之積層陶瓷電容器1之間隔設為積層陶瓷電容器1之經過方向之積層陶瓷電容器1之尺寸以上。 Therefore, it is preferable that the interval between the adjacent multilayer ceramic capacitors 1 is 1/2 or more of the size of the magnetic generating device 55a in the passing direction of the multilayer ceramic capacitor 1. Alternatively, it is preferable that the interval between the adjacent multilayer ceramic capacitors 1 is equal to or larger than the size of the multilayer ceramic capacitor 1 in the direction in which the multilayer ceramic capacitor 1 passes.

於至此所說明之第1至第6實施形態中，磁性產生裝置31與磁通密度測量器32對向配置，使積層陶瓷電容器1經過其等之間，而於接著要說明之第7實施形態中，磁性產生裝置31及磁通密度測量器32之配置與此不同。 In the first to sixth embodiments described above, the magnetic generating device 31 is disposed opposite to the magnetic flux density measuring device 32, and the laminated ceramic capacitor 1 is passed between them, and the seventh embodiment to be described later is described. The configuration of the magnetic generating device 31 and the magnetic flux density measuring device 32 is different.

(第7實施形態) (Seventh embodiment)

如圖19所示，於線型供料器51，設有產生磁性之磁性產生裝置60。藉由積層陶瓷電容器1經過該磁性產生裝置60之前，積層陶瓷電容器1被予以磁化。所謂積層陶瓷電容器1被磁化，意指使積層陶瓷電容器成為帶磁狀態。 As shown in Fig. 19, a magnetic generating device 60 for generating magnetism is provided in the linear feeder 51. The laminated ceramic capacitor 1 is magnetized before the multilayer ceramic capacitor 1 passes through the magnetic generating device 60. The laminated ceramic capacitor 1 is magnetized, meaning that the multilayer ceramic capacitor is brought into a magnetic state.

又，磁性產生裝置60兼具使線型供料器51所搬送之積層陶瓷電容器1之內部電極11、12之方向變得一致之功能。例如，於積層陶瓷電容器1之內部電極11、12之積層方向與水平方向平行之情形時，以使內部電極11、12之積層方向與上下方向平行之方式，利用自磁性產生裝置60產生之磁性使積層陶瓷電容器1旋轉90°。藉此，使經過設有磁性產生裝置60之部分之積層陶瓷電容器1之方向一致。但，未必要將所有積層陶瓷電容器1之方向設為一致。 Further, the magnetic generating device 60 has a function of matching the directions of the internal electrodes 11 and 12 of the multilayer ceramic capacitor 1 conveyed by the linear feeder 51. For example, when the lamination direction of the internal electrodes 11 and 12 of the multilayer ceramic capacitor 1 is parallel to the horizontal direction, the magnetic force generated by the self-magnetic generating device 60 is made such that the lamination direction of the internal electrodes 11 and 12 is parallel to the vertical direction. The multilayer ceramic capacitor 1 is rotated by 90°. Thereby, the direction of the multilayer ceramic capacitor 1 passing through the portion where the magnetic generating device 60 is provided is made uniform. However, it is not necessary to make the directions of all the laminated ceramic capacitors 1 uniform.

於搬送路徑中之位於位置P1與位置P3之間之位置P2，配置有磁性產生裝置55a。積層陶瓷電容器1由該磁性產生裝置55a進一步磁化。因此，於積層陶瓷電容器組2收容有經磁化後之積層陶瓷電容器1。再者，於本實施形態中，對設有磁性產生裝置55a與磁性產生裝置 60之2個磁性產生裝置之例進行說明。但，本發明並非限定於該構成。亦可僅設置1個磁性產生裝置。 A magnetic generating device 55a is disposed at a position P2 between the position P1 and the position P3 in the transport path. The multilayer ceramic capacitor 1 is further magnetized by the magnetic generating device 55a. Therefore, the magnetized multilayer ceramic capacitor 1 is housed in the multilayer ceramic capacitor group 2. Furthermore, in the present embodiment, the magnetic generating device 55a and the magnetic generating device are provided. An example of two magnetic generating devices of 60 will be described. However, the present invention is not limited to this configuration. It is also possible to provide only one magnetic generating device.

如圖20所示，於積層陶瓷電容器組2之下方，設有用於測量磁通密度之磁通密度測量器32。詳細而言，磁通密度測量器32係以10kHz以上且100kHz以下之程度之間隔連續進行磁通密度之測定。 As shown in Fig. 20, below the multilayer ceramic capacitor group 2, a magnetic flux density measuring device 32 for measuring magnetic flux density is provided. Specifically, the magnetic flux density measuring device 32 continuously measures the magnetic flux density at intervals of 10 kHz or more and 100 kHz or less.

於本實施形態中，藉由磁性產生裝置55a、60使積層陶瓷電容器1磁化(磁化步驟)。其次，利用磁通密度測量器32測量自磁化後之積層陶瓷電容器1產生之磁通之密度(磁通密度測量步驟)。於磁通密度測量步驟中，較佳測量磁化後之積層陶瓷電容器1經過磁通密度測量器32之前之彼時之磁通密度。 In the present embodiment, the multilayer ceramic capacitor 1 is magnetized by the magnetic generating devices 55a and 60 (magnetization step). Next, the magnetic flux density measuring device 32 measures the density of the magnetic flux generated by the magnetized multilayer ceramic capacitor 1 (magnetic flux density measuring step). In the magnetic flux density measuring step, it is preferable to measure the magnetic flux density of the magnetized multilayered ceramic capacitor 1 before passing through the magnetic flux density measuring device 32.

其次，由方向識別部36基於磁通密度之測量結果，識別積層陶瓷電容器1之內部電極11、12之積層方向(積層方向識別步驟)。可基於此時所測量之磁通密度之最大值或積分值，識別積層陶瓷電容器1之方向。其結果，例如可確認積層陶瓷電容器1之整列率，或於檢測出積層陶瓷電容器1之方向與所期望之方向不同之積層陶瓷電容器1之情形時，對該積層陶瓷電容器1進行標記，或除去該積層陶瓷電容器1。 Next, the direction identifying unit 36 identifies the stacking direction of the internal electrodes 11 and 12 of the multilayer ceramic capacitor 1 based on the measurement result of the magnetic flux density (the stacking direction identifying step). The direction of the laminated ceramic capacitor 1 can be identified based on the maximum value or integrated value of the magnetic flux density measured at this time. As a result, for example, when the multilayer ceramic capacitor 1 is detected, or when the multilayer ceramic capacitor 1 in which the direction of the multilayer ceramic capacitor 1 is different from the desired direction is detected, the laminated ceramic capacitor 1 is marked or removed. The multilayer ceramic capacitor 1.

對本實施形態之方向識別方法之原理，一面參照圖21及圖22一面進行說明。於磁通密度測量器32前不存在積層陶瓷電容器1時，則不以磁通密度測量器32進行實質性之磁通測量。另一方面，如圖21及圖22所示，於磁化後之積層陶瓷電容器1位於磁通密度測量器32前之情形時，來自積層陶瓷電容器1之磁力線經過磁通密度測量器32。因此，可由磁通密度測量器32測量磁通。其結果，如圖9、圖10所示，視積層陶瓷電容器1之積層方向而定，磁通密度之最大值及積分值亦不盡相同。 The principle of the direction identifying method of the present embodiment will be described with reference to Figs. 21 and 22 . When the build-up ceramic capacitor 1 is not present before the magnetic flux density measuring device 32, substantial magnetic flux measurement is not performed by the magnetic flux density measuring device 32. On the other hand, as shown in FIGS. 21 and 22, when the magnetized multilayer ceramic capacitor 1 is placed in front of the magnetic flux density measuring device 32, the magnetic lines of force from the laminated ceramic capacitor 1 pass through the magnetic flux density measuring device 32. Therefore, the magnetic flux can be measured by the magnetic flux density measuring device 32. As a result, as shown in FIGS. 9 and 10, depending on the lamination direction of the multilayer ceramic capacitor 1, the maximum value and the integral value of the magnetic flux density are also different.

於本實施形態中，因積層陶瓷電容器1已事先磁化，故未必需要 將磁性產生裝置55a、60與磁通密度測量器32對向配置。因此，磁性產生裝置55a、60與磁通密度測量器32之配置自由度隨之提高，方向識別裝置及製造裝置之構造上之限制因此減少。因此，例如可將方向識別裝置及製造裝置小型化。再者，亦可於進行積層陶瓷電容器1之方向識別後，對正磁化之積層陶瓷電容器1進行去磁處理。 In the present embodiment, since the multilayer ceramic capacitor 1 has been magnetized in advance, it is not necessarily required. The magnetic generating devices 55a and 60 are disposed opposite to the magnetic flux density measuring device 32. Therefore, the degree of freedom in arrangement of the magnetic generating devices 55a, 60 and the magnetic flux density measuring device 32 is increased, and the structural limitations of the direction identifying device and the manufacturing device are thus reduced. Therefore, for example, the direction identifying device and the manufacturing device can be miniaturized. Further, after the direction identification of the multilayer ceramic capacitor 1 is performed, the positively magnetized multilayer ceramic capacitor 1 may be subjected to demagnetization treatment.

(第8及第9實施形態) (Eighth and ninth embodiments)

圖23係表示第8實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式俯視圖。圖24係表示第9實施形態之積層陶瓷電容器之方向識別裝置之主要部分之模式俯視圖。 Fig. 23 is a schematic plan view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to an eighth embodiment. Fig. 24 is a schematic plan view showing a main part of a direction identifying device for a multilayer ceramic capacitor according to a ninth embodiment.

於第7實施形態中，已對由磁通密度測量器32識別被收容於積層陶瓷電容器組2之積層陶瓷電容器1之方向之例進行說明。但，本發明並非限定於此。 In the seventh embodiment, an example in which the direction of the multilayer ceramic capacitor 1 accommodated in the multilayer ceramic capacitor group 2 is recognized by the magnetic flux density measuring device 32 will be described. However, the invention is not limited thereto.

例如，如圖23所示，亦可將磁通密度測量器32設置於搬送裝置52。具體而言，於第8實施形態中，於搬送裝置52之位置P4配置磁通密度測量器32。又，例如，如圖24所示之第9實施形態，亦可將磁通密度測量器32設置於線型供料器51。因此，可於被收容至積層陶瓷電容器組2之前，於藉由搬送裝置52之搬送途中識別積層陶瓷電容器1之方向。 For example, as shown in FIG. 23, the magnetic flux density measuring device 32 may be provided in the conveying device 52. Specifically, in the eighth embodiment, the magnetic flux density measuring device 32 is disposed at the position P4 of the conveying device 52. Further, for example, as shown in the ninth embodiment shown in Fig. 24, the magnetic flux density measuring device 32 may be provided in the linear feeder 51. Therefore, the direction of the laminated ceramic capacitor 1 can be recognized during the conveyance by the transport device 52 before being stored in the multilayer ceramic capacitor group 2.

於第8及第9實施形態中，亦可於位置P4與位置P3之間進而設置：分揀部，其用於分揀積層陶瓷電容器1之方向並非所期望之積層方向之積層陶瓷電容器1；及整列部，其使積層陶瓷器電容器1旋轉以將之設為所期望之積層方向。分揀部亦可為取出內部電極11、12之積層方向並非所期望之積層陶瓷電容器1者。 In the eighth and ninth embodiments, a sorting unit for sorting the multilayer ceramic capacitor 1 in which the direction of the laminated ceramic capacitor 1 is not in the desired lamination direction may be further provided between the position P4 and the position P3; And an entire column that rotates the laminated ceramic capacitor 1 to set it in a desired lamination direction. The sorting unit may be one in which the lamination direction of the internal electrodes 11 and 12 is not the desired multilayer ceramic capacitor 1.

(實驗例2) (Experimental Example 2) (實施例1) (Example 1)

準備6個具有下述設計參數之積層陶瓷電容器。如圖19所示，僅 以由介隔線型供料器51而對向之1對永久磁石構成之磁性產生裝置60進行積層陶瓷電容器之磁化。再者，6個樣本中之3個係以內部電極與磁通密度測量器平行之方式配置，並測定磁通密度，其餘3個係以內部電極與磁通密度測量器垂直之方式配置，並測定磁通密度。將所測量之磁通密度之最大值顯示於表1。於表1中，記載為「水平」之樣本係以使內部電極與磁通密度測量器平行之方式配置，並測定磁通密度之樣本。於表1中，記載為「垂直」之樣本係以使內部電極與磁通密度測量器垂直之方式配置，並測定磁通密度之樣本。 Six laminated ceramic capacitors having the following design parameters were prepared. As shown in Figure 19, only The magnetic generation device 60 of the pair of permanent magnets opposed to the pair of linear magnets 51 is magnetized by the laminated ceramic capacitor. Furthermore, three of the six samples were arranged with the internal electrodes in parallel with the magnetic flux density measuring device, and the magnetic flux density was measured, and the other three were arranged such that the internal electrodes were perpendicular to the magnetic flux density measuring device, and The magnetic flux density was measured. The maximum value of the measured magnetic flux density is shown in Table 1. In Table 1, the sample described as "horizontal" was placed so that the internal electrode was parallel to the magnetic flux density measuring instrument, and the sample of the magnetic flux density was measured. In Table 1, the sample described as "vertical" is arranged such that the internal electrode is perpendicular to the magnetic flux density measuring instrument, and the sample of the magnetic flux density is measured.

(實施例2) (Example 2)

於以使實施例1中所使用之6個積層陶瓷電容器之磁通密度成為0.05mT以下之方式，進行積層陶瓷電容器之去磁後，將其再度作為樣本而使用於本實施例2中。於實施例2中，由具有與實施例1相同之構成之磁性產生裝置60，及設置於搬送裝置52，且由永久磁石構成之磁性產生裝置55a之2個磁性產生裝置，進行積層陶瓷電容器之磁化。6個樣本中之3個係以使內部電極與磁通密度測量器平行之方式配置，並測定磁通密度，其餘3個係以使內部電極與磁通密度測量器垂直之方式配置，並測定磁通密度。將所測量之磁通密度之最大值顯示於表1。 The demagnetization of the multilayer ceramic capacitor was carried out so that the magnetic flux density of the six multilayer ceramic capacitors used in the first embodiment was 0.05 mT or less, and this was again used as a sample in the second embodiment. In the second embodiment, the magnetic generating device 60 having the same configuration as that of the first embodiment and the two magnetic generating devices of the magnetic generating device 55a provided in the transfer device 52 and composed of permanent magnets are laminated. magnetization. Three of the six samples were arranged such that the internal electrodes were parallel to the magnetic flux density measuring device, and the magnetic flux density was measured, and the other three were arranged such that the internal electrodes were perpendicular to the magnetic flux density measuring device, and were measured. Magnetic flux density. The maximum value of the measured magnetic flux density is shown in Table 1.

於本實驗例中，將積層陶瓷電容器之大小設為1.15mm×0.65mm×0.65mm，將內部電極設為以鎳為主要成分之電極，將內部電極之積層層數設為430層，將積層陶瓷電容器之靜電電容設為10μF。 In the present experimental example, the size of the multilayer ceramic capacitor was set to 1.15 mm × 0.65 mm × 0.65 mm, and the internal electrode was an electrode mainly composed of nickel, and the number of layers of the internal electrode was 430, and the layer was laminated. The electrostatic capacitance of the ceramic capacitor was set to 10 μF.

自表1所示之結果可知，可藉由測量已事先磁化之積層陶瓷電容器之磁通密度，而識別積層陶瓷電容器之方向。又，藉由如實施例2般進行2次磁化，積層陶瓷電容器之磁通密度之測量值(最大值及積分值)變大，方向識別亦更為容易。 As is apparent from the results shown in Table 1, the direction of the laminated ceramic capacitor can be identified by measuring the magnetic flux density of the multilayered ceramic capacitor which has been previously magnetized. Further, by performing magnetization twice as in the second embodiment, the measured value (maximum value and integral value) of the magnetic flux density of the multilayer ceramic capacitor is increased, and direction recognition is also easier.

雖已對本發明之實施形態進行說明，但應理解為本次所揭示之實施形態之所有方面均為例示，而並非限制性者。本發明之範圍係由申請專利範圍揭示，且旨在包含與申請專利範圍為均等含義之變更，以及範圍內之所有變更。 The embodiments of the present invention have been described, but it is understood that all aspects of the embodiments disclosed herein are illustrative and not restrictive. The scope of the present invention is intended to be embraced by the appended claims

2‧‧‧積層陶瓷電容器組 2‧‧‧Multilayer Ceramic Capacitor Bank

3‧‧‧積層陶瓷電容器之方向識別裝置 3‧‧‧ Directional identification device for laminated ceramic capacitors

31‧‧‧磁性產生裝置 31‧‧‧Magnetic generating device

32‧‧‧磁通密度測量器 32‧‧‧Magnetic density measuring device

33‧‧‧第1輥子 33‧‧‧1st roller

34‧‧‧第2輥子 34‧‧‧2nd roller

35‧‧‧搬送裝置 35‧‧‧Transporting device

36‧‧‧方向識別部 36‧‧‧ Direction Identification Department

Claims (16)

一種積層陶瓷電容器之方向識別方法，其係識別包含積層之複數個內部電極之積層陶瓷電容器之積層方向之方法，其包含如下之步驟：將1列複數個積層陶瓷電容器搬送至磁性產生裝置及磁通密度測量器之各者之前；於上述複數個積層陶瓷電容器之各者經過上述磁通密度測量器之前時，以上述磁通密度測量器測量磁通密度；及基於測量上述磁通密度之步驟中所測量之上述磁通密度而識別上述積層方向。 A method for identifying a direction of a multilayer ceramic capacitor, which is a method for identifying a lamination direction of a multilayer ceramic capacitor including a plurality of laminated internal electrodes, comprising the steps of: transporting a plurality of laminated ceramic capacitors to a magnetic generating device and a magnetic body Before each of the plurality of multilayered ceramic capacitors, the magnetic flux density is measured by the magnetic flux density measuring device before each of the plurality of multilayer ceramic capacitors passes through the magnetic flux density measuring device; and the step of measuring the magnetic flux density based on the magnetic flux density measuring device The above-mentioned layering direction is identified by the above-described magnetic flux density measured in the above. 如請求項1之積層陶瓷電容器之方向識別方法，其中於識別上述積層方向之步驟中，基於測量上述磁通密度之步驟中所測量之上述磁通密度，算出磁通密度之積分值，基於上述磁通密度之積分值而識別上述積層方向。 The direction identifying method of the multilayer ceramic capacitor according to claim 1, wherein in the step of identifying the laminated direction, the integrated value of the magnetic flux density is calculated based on the magnetic flux density measured in the step of measuring the magnetic flux density, based on the above The integration value of the magnetic flux density is used to identify the above laminated direction. 如請求項1之積層陶瓷電容器之方向識別方法，其中上述磁性產生裝置與上述磁通密度測量器相互對向；且於測量上述磁通密度之步驟中，於上述複數個積層陶瓷電容器之各者經過上述磁性產生裝置與上述磁通密度測量器之間時，以上述磁通密度測量器測量自上述磁性產生裝置產生之磁通之密度。 The method of identifying a direction of a multilayer ceramic capacitor according to claim 1, wherein said magnetic generating means and said magnetic flux density measuring device are opposite to each other; and in said step of measuring said magnetic flux density, said plurality of laminated ceramic capacitors When passing between the magnetic generating means and the magnetic flux density measuring instrument, the density of the magnetic flux generated from the magnetic generating means is measured by the magnetic flux density measuring device. 如請求項1之積層陶瓷電容器之方向識別方法，其中上述磁性產生裝置較上述磁通密度測量器配置於上述複數個積層陶瓷電容器之搬送方向之更上游側；且該積層陶瓷電容器之方向識別方法進而包含如下之步驟：即於測量上述磁通密度之步驟之前，對上述複數個積層陶瓷電容 器之各者進行磁化。 The direction identifying method of the multilayer ceramic capacitor according to claim 1, wherein the magnetic generating device is disposed on a further upstream side of the transport direction of the plurality of laminated ceramic capacitors than the magnetic flux density measuring device; and the direction identifying method of the laminated ceramic capacitor Further comprising the steps of: said plurality of laminated ceramic capacitors before said step of measuring said magnetic flux density Each of the devices is magnetized. 如請求項1至4中任一項之積層陶瓷電容器之方向識別方法，其中於搬送上述複數個積層陶瓷電容器之步驟中，以上述複數個積層陶瓷電容器經由線型搬送路徑之方式，搬送上述複數個積層陶瓷電容器；且於測量上述磁通密度之步驟中，於上述複數個積層陶瓷電容器沿上述線型搬送路徑而經過上述磁通密度測量器之前時，以上述磁通密度測量器測量磁通密度。 The direction identifying method of the multilayer ceramic capacitor according to any one of claims 1 to 4, wherein, in the step of transporting the plurality of multilayer ceramic capacitors, the plurality of laminated ceramic capacitors are transported by the linear transport path In the step of measuring the magnetic flux density, the magnetic flux density is measured by the magnetic flux density measuring device before the plurality of laminated ceramic capacitors pass the magnetic flux density measuring device along the linear transport path. 如請求項1至4中任一項之積層陶瓷電容器之方向識別方法，其中於搬送上述複數個積層陶瓷電容器之步驟中，係以上述複數個積層陶瓷電容器被收容於沿圓形轉動體之外周而設之複數個收容部各者之狀態搬送；且於測量上述磁通密度之步驟中，當上述複數個積層陶瓷電容器以收容於上述複數個收容部各者之狀態經過上述磁通密度測量器之前時，以上述磁通密度測量器測量磁通密度。 The direction identifying method of the multilayer ceramic capacitor according to any one of claims 1 to 4, wherein in the step of transporting the plurality of laminated ceramic capacitors, the plurality of laminated ceramic capacitors are housed in the outer circumference of the circular rotating body In the step of measuring the magnetic flux density, the plurality of laminated ceramic capacitors are passed through the magnetic flux density measuring device in a state of being accommodated in each of the plurality of housing portions. Previously, the magnetic flux density was measured by the above magnetic flux density measurer. 如請求項1至4中任一項之積層陶瓷電容器之方向識別方法，其中於搬送上述複數個積層陶瓷電容器之步驟中，以上述複數個積層陶瓷電容器被收容於包裝體中所設之複數個空腔各者之狀態搬送；且於測量上述磁通密度之步驟中，當上述複數個積層陶瓷電容器以收容於上述複數個空腔各者之狀態經過上述磁通密度測量器之前時，以上述磁通密度測量器測量磁通密度。 The direction identifying method of the multilayer ceramic capacitor according to any one of claims 1 to 4, wherein, in the step of transporting the plurality of laminated ceramic capacitors, the plurality of laminated ceramic capacitors are accommodated in the package In the step of measuring the magnetic flux density, in the step of measuring the magnetic flux density, when the plurality of multilayer ceramic capacitors are placed in the state of each of the plurality of cavities before passing through the magnetic flux density measuring device, The magnetic flux density measurer measures the magnetic flux density. 一種積層陶瓷電容器組之製造方法，其包含如下步驟：以請求項1至4中任一項之積層陶瓷電容器之方向識別方法識別上述積層方向；及將上述積層方向一致之複數個積層陶瓷電容器收容於包裝體 中所設置之複數個空腔各者。 A method of manufacturing a multilayer ceramic capacitor bank, comprising the steps of: recognizing the lamination direction by a direction identification method of a multilayer ceramic capacitor according to any one of claims 1 to 4; and accommodating a plurality of laminated ceramic capacitors having the same lamination direction In the package Each of the plurality of cavities set in the individual. 一種積層陶瓷電容器之方向識別裝置，其係識別包含積層之複數個內部電極之積層陶瓷電容器之積層方向之方向識別裝置；其包含：磁性產生裝置；磁通密度測量器；搬送裝置，其將一列複數個之積層陶瓷電容器搬送至上述磁性產生裝置及上述磁通密度測量器各者之前；及方向識別部，其連接於上述磁通密度測量器，且基於上述磁通密度測量器所測量之磁通密度而識別上述積層方向。 A direction identifying device for a laminated ceramic capacitor, which is a direction identifying device for identifying a lamination direction of a multilayer ceramic capacitor including a plurality of laminated internal electrodes; comprising: a magnetic generating device; a magnetic flux density measuring device; and a conveying device, which will have a column a plurality of laminated ceramic capacitors are transferred to each of the magnetic generating device and the magnetic flux density measuring device; and a direction identifying portion connected to the magnetic flux density measuring device and based on the magnetic quantity measured by the magnetic flux density measuring device The above laminated direction is identified by the density. 如請求項9之積層陶瓷電容器之方向識別裝置，其中上述方向識別部係基於由上述磁通密度測量器所測量之上述磁通密度，算出磁通密度之積分值，並基於上述磁通密度之積分值而識別上述積層方向。 The direction identifying device of the multilayer ceramic capacitor of claim 9, wherein the direction identifying portion calculates an integral value of the magnetic flux density based on the magnetic flux density measured by the magnetic flux density measuring device, and based on the magnetic flux density The above-mentioned stacking direction is identified by the integral value. 如請求項9之積層陶瓷電容器之方向識別裝置，其中上述磁性產生裝置與上述磁通密度測量器係相互對向；且上述磁通密度測量器係於上述搬送裝置所搬送之上述複數個積層陶瓷電容器之各者經過上述磁性產生裝置與上述磁通密度測量器之間時，測量自上述磁性產生裝置產生之磁通之密度。 The direction identifying device of the multilayer ceramic capacitor according to claim 9, wherein the magnetic generating device and the magnetic flux density measuring device are opposite to each other; and the magnetic flux density measuring device is connected to the plurality of laminated ceramics conveyed by the conveying device Each of the capacitors measures the density of the magnetic flux generated from the magnetic generating device when passing between the magnetic generating device and the magnetic flux density measuring device. 如請求項9之積層陶瓷電容器之方向識別裝置，其中上述磁性產生裝置較上述磁通密度測量器配置於上述複數個積層陶瓷電容器之搬送方向之更上游側；且上述磁性產生裝置係於上述磁通密度測量器測量上述磁通密度之前，對上述複數個積層陶瓷電容器之各者進行磁化。 The direction identifying device of the multilayer ceramic capacitor according to claim 9, wherein the magnetic generating device is disposed on a further upstream side of the transport direction of the plurality of laminated ceramic capacitors than the magnetic flux density measuring device; and the magnetic generating device is coupled to the magnetic device Each of the plurality of laminated ceramic capacitors is magnetized before the density measuring device measures the magnetic flux density. 如請求項9至12中任一項之積層陶瓷電容器之方向識別裝置，其中上述搬送裝置包含線型搬送路徑，其係將上述積層陶瓷電容 器以直線狀搬送；且上述磁通密度測量器設置於上述線型搬送路徑。 The direction identifying device for a multilayer ceramic capacitor according to any one of claims 9 to 12, wherein the transfer device includes a line type transfer path, and the laminated ceramic capacitor is The device is transported in a straight line; and the magnetic flux density measuring device is disposed on the linear transport path. 如請求項9至12中任一項之積層陶瓷電容器之方向識別裝置，其中上述搬送裝置包含圓形之轉動體，其係沿圓弧搬送上述積層陶瓷電容器；且上述轉動體包含複數個收容部，其等沿上述轉動體之外周設置，且逐個收容上述複數個積層陶瓷電容器；上述磁通密度測量器設置於上述轉動體。 The direction identifying device for a multilayer ceramic capacitor according to any one of claims 9 to 12, wherein the conveying device comprises a circular rotating body that conveys the laminated ceramic capacitor along a circular arc; and the rotating body includes a plurality of housing portions And the like is disposed along the outer circumference of the rotating body, and accommodates the plurality of laminated ceramic capacitors one by one; the magnetic flux density measuring device is disposed on the rotating body. 如請求項9至12中任一項之積層陶瓷電容器之方向識別裝置，其中上述搬送裝置搬送包含逐個收容上述複數個積層陶瓷電容器之複數個空腔之包裝體；且上述包裝體經過上述磁通密度測量器之前。 The direction identifying device for a multilayer ceramic capacitor according to any one of claims 9 to 12, wherein the transfer device transports a package including a plurality of cavities of the plurality of laminated ceramic capacitors one by one; and the package passes the magnetic flux Before the density measurer. 如請求項14之積層陶瓷電容器之方向識別裝置，其中上述轉動體係以固定間隔反復進行旋轉運動與停止；且上述複數個收容部各者係於上述轉動體之旋轉運動時經過上述磁通密度測量器之前，並停止於與上述磁通密度測量器不相重疊之位置。 The direction identifying device of the multilayer ceramic capacitor of claim 14, wherein the rotating system repeatedly performs a rotational motion and a stop at a fixed interval; and each of the plurality of accommodating portions passes the magnetic flux density measurement during a rotational movement of the rotating body Before the device, and stopped at a position that does not overlap with the above-mentioned magnetic flux density measuring device.
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