WO2023127315A1 - Component sorting device - Google Patents

Component sorting device Download PDF

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Publication number
WO2023127315A1
WO2023127315A1 PCT/JP2022/041501 JP2022041501W WO2023127315A1 WO 2023127315 A1 WO2023127315 A1 WO 2023127315A1 JP 2022041501 W JP2022041501 W JP 2022041501W WO 2023127315 A1 WO2023127315 A1 WO 2023127315A1
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WO
WIPO (PCT)
Prior art keywords
inspection
turntable
counter
linear feeder
parts
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PCT/JP2022/041501
Other languages
French (fr)
Japanese (ja)
Inventor
大地 渡辺
太一 小久貫
良巳 山本
啓太 香川
Original Assignee
株式会社村田製作所
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Application filed by 株式会社村田製作所 filed Critical 株式会社村田製作所
Publication of WO2023127315A1 publication Critical patent/WO2023127315A1/en

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
    • B65G47/80—Turntables carrying articles or materials to be transferred, e.g. combined with ploughs or scrapers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Definitions

  • the present invention relates to a parts sorting device.
  • Patent Literature 1 discloses an appearance inspection device as such a component sorting device.
  • the appearance inspection apparatus disclosed in Patent Document 1 includes a linear feeder that conveys electronic components, a turntable that conveys electronic components conveyed by the linear feeder, and an imaging device that images the electronic components on the turntable, Appearance inspection of electronic parts is performed while conveying the electronic parts. As a result, non-defective products and defective products can be sorted out and discharged.
  • the visual inspection apparatus disclosed in Patent Document 1 electrifies the electronic components by conveying the electronic components with vibration in the linear feeder, and electrostatically attracts and conveys the electronic components with static electricity in the turntable.
  • the multilayer ceramic capacitor includes parts having the same size but different capacities.
  • electronic parts from the previous lot may remain on the linear feeder or turntable.
  • electronic components of a different type from the previous lot may be mixed with the electronic components in the current lot. If electronic components of the same size and different characteristics are mixed in in this way, the accuracy of sorting will be lowered even if the accuracy of appearance inspection is high.
  • An object of the present invention is to provide a parts sorting device that improves the accuracy of parts sorting.
  • a parts sorting apparatus is a parts sorting apparatus that inspects parts while conveying them, selects non-defective parts, and stores them in a case, comprising: a linear feeder that conveys the parts; A turntable for conveying parts, the turntable rotating at a rotation speed of 10000 rpm or more, a plurality of imaging devices respectively imaging a plurality of outer surfaces of the parts on the turntable, and the linear feeder.
  • a measuring device for measuring the characteristics of the component on the upper surface or on the turntable, and an inspection for performing a visual inspection of the component based on the imaging result from the imaging device, and selecting the non-defective product based on the result of the visual inspection.
  • a sorting controller for controlling the characteristics of the component on the upper surface or on the turntable, and an inspection for performing a visual inspection of the component based on the imaging result from the imaging device, and selecting the non-defective product based on the result of the visual inspection.
  • the linear feeder or the turntable on which the characteristics are measured by the measuring device transports the component while electrostatically attracting it, and the inspection and selection controller measures the characteristics of the component based on the measurement results from the measuring device. An inspection is performed, and the non-defective products are selected based on the results of the characteristic inspection.
  • FIG. 1 is a schematic plan view of an example of a component sorting device according to an embodiment, viewed from above; FIG. It is the schematic plan view which looked at another example of the components sorting apparatus which concerns on this embodiment from upper direction. It is the schematic plan view which expanded the II part in the components sorting apparatus shown in FIG. 1A or FIG. 1B.
  • FIG. 1B is a schematic side view of the component sorting device shown in FIG. 1A as seen from the side, and is a schematic side view with an enlarged II portion.
  • FIG. 1C is a schematic side view of the parts sorting device shown in FIG. 1B as seen from the side, and is a schematic side view with an enlarged II portion.
  • FIG. 1B is a sectional view taken along line IV-IV in the component sorting device shown in FIG. 1A or 1B; It is a schematic perspective view of the external appearance of components. It is a schematic perspective view of the appearance of a case.
  • FIG. 1A is a schematic plan view of an example of a component sorting device according to this embodiment viewed from above
  • FIG. 1B is a schematic plan view of another example of a component sorting device according to this embodiment viewed from above.
  • FIG. 2 is a schematic plan view enlarging the II portion of the component sorting apparatus shown in FIG. 1A or 1B.
  • 3A is a schematic side view of the parts sorting apparatus shown in FIG. 1A as seen from the side, and is a schematic side view with an enlarged portion II
  • FIG. 3B is a side view of the parts sorting apparatus shown in FIG. 1B. It is a schematic side view, and is a schematic side view in which the II portion is enlarged.
  • FIG. 4 is a sectional view taken along line IV-IV in the parts sorting apparatus shown in FIG. 1A or 1B. 1A to 4 show an XY orthogonal coordinate system.
  • the component sorting device 1 shown in FIGS. 1A, 2, 3A, and 4 is a device that inspects a plurality of electronic components 3 while sequentially conveying them, selects non-defective components, and stores them in a case 5.
  • the parts sorting apparatus 1 includes a linear feeder 10, a turntable 20, a plurality of imaging devices 30, a measuring device 40, a first ejection mechanism 50, a second ejection mechanism 60, a first counter 71, a second A counter 72 , a third counter 73 , a fourth counter 74 , and an inspection selection controller 80 are provided.
  • the electronic component 3 is a surface-mounted electronic component (also called a chip component) such as a multilayer ceramic capacitor. As shown in FIG. 5, for example, the electronic component 3 is arranged on each of two end surfaces of the laminated body 3a, which is formed by laminating a plurality of dielectric layers made of a ceramic material and one or more conductor layers, and the laminated body 3a. and two external electrodes 3b.
  • the laminate 3a ie, the electronic component 3 has a rectangular parallelepiped shape and includes two principal surfaces TS1 and TS2 facing each other in the lamination direction, two side surfaces WS1 and WS2 facing each other in the width direction intersecting the lamination direction, It has two end surfaces LS1 and LS2 that face each other in the length direction and intersect the width direction.
  • the case 5 is a box-shaped case, for example, as shown in FIG. 6, and accommodates a plurality of electronic components 3 therein.
  • the case 5 has only one doorway 5a that can be opened when the electronic component 3 is received and taken out, and can be closed when the electronic component 3 is accommodated.
  • the linear feeder 10 linearly conveys a plurality of electronic components 3 sequentially.
  • the linear feeder 10 may include a charging portion on the upstream side and an electrostatic attraction portion on the downstream side.
  • the linear feeder 10 is preferably made of a material such as SUS. Moreover, it is preferable that the linear feeder 10 is inclined with respect to the horizontal plane. As a result, in the charging portion on the upstream side of the linear feeder 10, the electronic component 3 can be charged by conveying the electronic component 3 by vibration.
  • an electrostatic chucking mechanism 12 is preferably provided below the electrostatic chucking portion on the downstream side of the linear feeder 10 .
  • the electronic component 3 can be electrostatically attracted and conveyed in the electrostatic attraction portion on the downstream side of the linear feeder 10 .
  • the linear feeder 10 does not have to be provided with the electrostatic adsorption mechanism 12 . That is, the linear feeder 10 may be the above-described charging portion in its entirety from the upstream side to the downstream side.
  • the turntable 20 sequentially rotates and conveys the plurality of electronic components 3 conveyed by the linear feeder 10 .
  • the turntable 20 has a guide mechanism 22 on the upstream side, and the guide mechanism 22 guides the electronic component 3 from the linear feeder 10 to the rotary transfer locus 21 .
  • the turntable 20 conveys the electronic component 3 along a rotational conveying locus 21 .
  • an electrostatic attraction mechanism 24 is preferably provided below the turntable 20 .
  • the electronic component 3 can be electrostatically attracted and conveyed.
  • the conveying speed of the turntable 20 is faster than the conveying speed of the linear feeder 10.
  • the rotation speed of the turntable 20 is preferably 10000 rpm or more.
  • the electronic components 3 can be spaced apart, and the appearance inspection of the end surfaces of the electronic components 3 can be performed. It should be noted that it does not have to be 10,000 revolutions/minute or more, it may be 9,000 revolutions/minute or more, or it may be 8,000 revolutions/minute or more.
  • the size of the electronic component 3 is about 0.25 mm ⁇ 10% in the length direction and about 0.125 mm ⁇ 13% in the width direction and thickness direction.
  • the turntable 20 is made of a material such as glass or resin and has transparency. Thereby, the appearance inspection of the back side of the electronic component 3 becomes possible.
  • the imaging device 30 is, for example, a camera.
  • Six imaging devices 30 are provided along the rotary transfer locus 21 of the turntable 20 .
  • the six imaging devices 30 respectively image six outer surfaces of the electronic component 3 on the turntable 20, namely two main surfaces TS1 and TS2, two side surfaces WS1 and WS2, and two end surfaces LS1 and LS2. .
  • the measuring device 40 includes, for example, a pair of probes for contacting external electrodes of the electronic component 3 and measures electrical characteristics of the electronic component 3 .
  • the measuring device 40 may be provided in the downstream electrostatic adsorption portion of the linear feeder 10 .
  • the measuring device 40 may be provided along the rotary transfer trajectory 21 of the turntable 20.
  • the linear feeder 10 may not be provided with the electrostatic adsorption mechanism 12 .
  • the measuring device 40 measures electrical properties of the electronic component 3 on the linear feeder 10 or on the turntable 20 . For example, if the electronic component 3 is a laminated ceramic capacitor, the measuring device 40 measures the capacitance of the electronic component 3 .
  • the electrostatic attraction portion or turntable 20 on the downstream side of the linear feeder 10 where electrical characteristics are measured by the measuring device 40 conveys the electronic component 3 while electrostatically attracting it. Thereby, it is possible to improve the measurement accuracy of the electrical characteristics.
  • the first discharge mechanism 50 discharges non-defective products from the turntable 20 selected by an inspection and selection controller 80, which will be described later, based on the results of visual inspection and electrical characteristic inspection. Housed in Case 5.
  • the method of discharging non-defective products by the first discharging mechanism 50 is not particularly limited, but examples thereof include air blowing, air suction, physical contact extrusion, and the like.
  • the first discharge mechanism 50 takes in the non-defective product from the turntable 20 by blowing air on the non-defective product on the turntable 20 according to a command from the inspection/selection controller 80.
  • the first ejection mechanism 50 has a tubular member 52 .
  • the tubular member 52 is a tubular member having a circular or polygonal cross section and extends from the turntable 20 to the entrance of the case 5 . Thereby, the tubular member 52 guides the non-defective electronic component 3 ejected from the turntable 20 to the entrance 5 a of the case 5 .
  • the second ejection mechanism 60 ejects the defective products selected by the inspection and selection controller 80 described later based on the result of the visual inspection or the result of the electrical property inspection from the turntable 20 and collects them in a collection box (not shown). .
  • the method for discharging defective products by the second discharging mechanism 60 may be the same as the method for discharging non-defective products by the first discharging mechanism 50 .
  • the second discharge mechanism 60 blows air onto the defective product on the turntable 20 according to the command from the inspection/selection controller 80, thereby removing the defective product from the turntable 20 to the inside. take in.
  • the second ejection mechanism 60 has a tubular member similar to the first ejection mechanism 50, and the tubular member guides the defective products ejected from the turntable 20 to the collection box (not shown).
  • the second ejection mechanism 60 is preferably provided upstream of the first ejection mechanism 50 .
  • the first counter 71 counts non-defective products ejected from the turntable 20 by the first ejecting mechanism 50 .
  • the first counter 71 is provided downstream of the first discharge mechanism 50 , that is, immediately before the case 5 . Thereby, the non-defective products housed in the case 5 can be accurately counted.
  • the first counter 71 may be further provided on the upstream side of the first ejection mechanism 50 . Thereby, it can be confirmed that the electronic component 3 remains in the first ejection mechanism 50 when the count numbers of the two first counters 71 are different.
  • Examples of the first counter 71 include, but are not limited to, a camera, an optical sensor, an eddy current sensor, and the like.
  • the eddy current sensor may be any known eddy current sensor or eddy current displacement sensor.
  • a high frequency signal is supplied from a resonance circuit to a sensor coil to generate a high frequency magnetic field from the sensor coil.
  • an eddy current is generated in the metal of the electronic component, changing the impedance of the sensor coil.
  • the voltage of the resonant circuit changes. By detecting this voltage change with a detection circuit, the passage of electronic parts can be counted.
  • the second counter 72 counts the defective products discharged from the turntable 20 by the second discharge mechanism 60 (not shown).
  • the second counter 72 may be similar to the first counter 71 .
  • the third counter 73 counts residual products remaining on the linear feeder 10 and the turntable 20 after the discharge of non-defective products by the first discharge mechanism 50 and the discharge of defective products by the second discharge mechanism 60 are completed.
  • the third counter 73 is not particularly limited, but may be a camera, a known line sensor, or the like.
  • the third counter 73 may be placed anywhere on the turntable 20 to count leftovers collected by the cleaning function on the linear feeder 10 and on the turntable 20 .
  • the collected residual items are collected in a collection box (not shown).
  • the fourth counter 74 is arranged relatively upstream of the linear feeder 10 and counts the electronic components 3 that are input.
  • the fourth counter 74 is not particularly limited, but may be a camera or the like.
  • the inspection and selection controller 80 controls the entire parts selection device 1 . Specifically, the inspection and selection controller 80 performs a visual inspection of the electronic component 3 based on the imaging result from the imaging device 30, and sorts out non-defective products and defective products based on the visual inspection result. The inspection and selection controller 80 also performs an electrical characteristic inspection (also referred to as verification) of the electronic component 3 based on the measurement results from the measuring device 40, and further sorts good products and defective products based on the results of the electrical characteristic inspection. .
  • the inspection and selection controller 80 controls the discharge of non-defective products by the first discharge mechanism 50.
  • the inspection/selection controller 80 controls the transfer speed of the linear feeder 10, the transfer speed of the turntable 20 (or the rotation speed and the length or radius of the rotary transfer trajectory), the measurement device 40 in the linear feeder 10 or the turntable 20. Based on information such as the position and the position of the imaging device 30 on the turntable 20 , the timing for discharging non-defective products from the first discharge mechanism 50 is calculated, and the first discharge mechanism 50 is commanded.
  • the inspection and selection controller 80 controls ejection of defective products by the second ejection mechanism 60 .
  • the inspection/selection controller 80 controls the transfer speed of the linear feeder 10, the transfer speed of the turntable 20 (or the rotation speed and the length or radius of the rotary transfer trajectory), the measurement device 40 in the linear feeder 10 or the turntable 20. Based on information such as the position of the imaging device 30 on the turntable 20 , the timing for ejecting the defective product from the second ejecting mechanism 60 is calculated, and the second ejecting mechanism 60 is commanded.
  • the inspection and selection controller 80 also controls the number of non-defective products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73. , to check whether the part sorting is normal or abnormal. For example, if the total number of counted non-defective products, defective products and remaining products is different from the number of appearance inspections or the number of electrical characteristic inspections, the inspection and selection controller 80 determines that the device is abnormal, and issues an alarm indicating the abnormality. may notify you.
  • the inspection and sorting controller 80 determines that the device is abnormal, and issues an alarm indicating the abnormality. may notify you.
  • the inspection selection controller 80 is composed of an arithmetic processor such as a DSP (Digital Signal Processor) or FPGA (Field-Programmable Gate Array). Various functions of the inspection and selection controller 80 are implemented by executing predetermined software (programs) stored in a storage unit, for example. Various functions of the inspection and selection controller 80 may be realized by cooperation of hardware and software, or may be realized only by hardware (electronic circuits).
  • arithmetic processor such as a DSP (Digital Signal Processor) or FPGA (Field-Programmable Gate Array).
  • Various functions of the inspection and selection controller 80 are implemented by executing predetermined software (programs) stored in a storage unit, for example.
  • Various functions of the inspection and selection controller 80 may be realized by cooperation of hardware and software, or may be realized only by hardware (electronic circuits).
  • the storage unit in the inspection and selection controller 80 is, for example, a rewritable memory such as EEPROM.
  • the storage unit stores predetermined software (programs) for executing various functions of the sorting controller.
  • the storage unit stores various setting values input from the outside, for example.
  • Various set values are the conveying speed of the linear feeder 10, the conveying speed of the turntable 20 (or the rotational speed and the length or radius of the rotational conveying locus), the position of the imaging device 30, the position of the measuring device 40, and the first discharge. It includes information about the position of the mechanism 50 and the position of the second ejection mechanism 60, good/bad criteria, and the like.
  • the linear feeder 10 that conveys the electronic components 3, the transparent turntable 20 that conveys the electronic components 3, and the electronic components 3 on the turntable 20 and an inspection and selection controller 80 that performs a visual inspection of the electronic components 3 based on the imaging results from the imaging devices 30 and selects non-defective products based on the results of the visual inspection.
  • an inspection and selection controller 80 that performs a visual inspection of the electronic components 3 based on the imaging results from the imaging devices 30 and selects non-defective products based on the results of the visual inspection.
  • the multilayer ceramic capacitor includes parts having the same size but different capacities.
  • electronic parts from the previous lot may remain on the linear feeder or turntable.
  • electronic components of a different type from the previous lot may be mixed with the electronic components in the current lot. If electronic components of the same size and different characteristics are mixed in in this way, the accuracy of sorting will be lowered even if the accuracy of appearance inspection is high.
  • the measuring device 40 for measuring the electrical characteristics of the electronic component 3 on the linear feeder 10 or on the turntable 20 is further provided, and the inspection and sorting controller 80 includes the measuring device Based on the measurement results from 40, the electrical characteristics of the electronic component 3 are inspected, and the non-defective products are selected based on the results of the electrical characteristics inspection.
  • the inspection and sorting controller 80 includes the measuring device Based on the measurement results from 40, the electrical characteristics of the electronic component 3 are inspected, and the non-defective products are selected based on the results of the electrical characteristics inspection.
  • sorting of non-defective products and defective products based on detailed specifications of electrical characteristics is performed separately, for example, after manufacturing and before inputting to this device.
  • This is a simple electrical characteristic inspection for the purpose of sorting electronic components of the same size/different characteristics from the previous lot that are mixed in with the electronic components of the current lot when they remain on a feeder, turntable, or the like.
  • the measuring device 40 may be provided on the linear feeder 10 side. In this case, even if the rotation speed of the turntable 20 is as high as 10,000 rpm or more in order to shorten the inspection and sorting time, the electrical characteristic inspection becomes easy. Alternatively, the measuring device 40 may be provided on the turntable 20 side. In this case, it becomes easy to calculate the discharge timing of the non-defective product or the defective product.
  • the linear feeder 10 or the turntable 20 on which electrical characteristics are measured by the measuring device 40 transports the electronic components 3 while electrostatically attracting them. Thereby, the accuracy of the electrical property inspection can be improved.
  • the first counter 71 that counts the non-defective products discharged by the first discharging mechanism 50 and the second counter that counts the defective products discharged by the second discharging mechanism 60 72, and a third counter 73 for counting residual products remaining on the linear feeder 10 and the turntable 20 after the discharge of non-defective products by the first discharge mechanism 50 and the discharge of defective products by the second discharge mechanism 60 are completed.
  • the inspection and sorting controller 80 based on the number of good products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73, Checks whether parts sorting is normal or abnormal. As a result, it is possible to confirm anomalies in component sorting where the number of output electronic components does not match the number of input electronic components for each processing lot. can be prevented. Thereby, the accuracy of component selection can be further improved.
  • the present invention is not limited to the above-described embodiments, and various modifications and variations are possible.
  • the form provided with the second ejection mechanism 60 that ejects the defective product from the turntable 20 has been exemplified.
  • the present invention is not limited to this, and for example, a form without the second ejection mechanism 60 may be employed.
  • the parts sorting apparatus 1 may eject the defective products from the turntable 20 immediately after the image pickup by the image pickup device 30 and the appearance inspection. Further, the parts sorting apparatus 1 may discharge the defective products from the linear feeder 10 or the turntable 20 immediately after the measurement by the measuring device 40 and the electrical property inspection.
  • the defective product collection function may be arranged over the entire circumference of the turntable 20 and/or the entire lateral side of the linear feeder 10 .
  • the inspection and selection controller 80 has a function of performing visual inspection of electronic components based on the imaging result from the imaging device 30, as an example.
  • each imaging device 30 may have a visual inspection function.
  • each of the imaging devices 30 may have a function of ejecting defective products from the turntable 20 immediately after the appearance inspection, as in the modification described above.
  • the inspection and selection controller 80 has a function of inspecting the electrical characteristics of electronic components based on the measurement results from the measuring device 40, as an example.
  • the present invention is not limited to this, and the measuring device 40 may have the electrical property inspection function.
  • each of the measuring devices 40 may have the function of discharging defective products from the linear feeder 10 or the turntable 20 immediately after the electrical property inspection, as in the above modification.
  • the measuring device 40 measures the electrical characteristics of the electronic component 3 as an example.
  • the present invention is not limited to this, and the measuring device 40 can be applied to a mode for measuring various properties other than electrical properties.
  • the inspection/selection controller 80 performs various characteristic inspections of the electronic component 3 based on the measurement results from the measuring device 40, and sorts out non-defective products and defective products based on the results of these characteristic inspections.

Abstract

Provided is a component sorting device that improves component sorting accuracy. A component sorting device 1 comprises: a linear feeder 10 that conveys components; a turntable 20 that conveys the components conveyed by the linear feeder 10; an imaging device 30 that images an outer surface of the components on the turntable 20; a measurement device 40 that measures characteristics of the components on the linear feeder 10; and a scanning-sorting controller 80 that performs appearance scanning of the components on the basis of imaging results from the imaging device 30, and that sorts superior components on the basis of appearance scanning results. The linear feeder 10, which is subjected to measurement of characteristics by the measurement device 40, conveys the components while electrostatically adsorbing the components, and the scanning-sorting controller 80 performs characteristics scanning of the components on the basis of measurement results from the measurement device 40, and also sorts non-defective components on the basis of characteristics scanning results.

Description

部品選別装置Parts sorting device
　本発明は、部品選別装置に関する。 The present invention relates to a parts sorting device.
　積層セラミックコンデンサ等の表面実装型の電子部品（チップ部品ともいう。）の良品および不良品を選別する装置がある。特許文献１には、このような部品選別装置として外観検査装置が開示されている。特許文献１に開示の外観検査装置は、電子部品を搬送するリニアフィーダと、リニアフィーダによって搬送された電子部品を搬送するターンテーブルと、ターンテーブル上の電子部品を撮像する撮像デバイスとを備え、電子部品を搬送しながら電子部品の外観検査を行う。これにより、良品および不良品を選別して排出することができる。 There is a device that sorts out non-defective and defective surface-mounted electronic components (also called chip components) such as multilayer ceramic capacitors. Patent Literature 1 discloses an appearance inspection device as such a component sorting device. The appearance inspection apparatus disclosed in Patent Document 1 includes a linear feeder that conveys electronic components, a turntable that conveys electronic components conveyed by the linear feeder, and an imaging device that images the electronic components on the turntable, Appearance inspection of electronic parts is performed while conveying the electronic parts. As a result, non-defective products and defective products can be sorted out and discharged.
　また、特許文献１に開示の外観検査装置は、リニアフィーダにおいて、振動により電子部品を搬送することによって、電子部品を帯電させ、ターンテーブルにおいて、静電気により電子部品を静電吸着して搬送する。 In addition, the visual inspection apparatus disclosed in Patent Document 1 electrifies the electronic components by conveying the electronic components with vibration in the linear feeder, and electrostatically attracts and conveys the electronic components with static electricity in the turntable.
特開２０１７－４４５７９号公報JP 2017-44579 A
　このような部品選別装置では、製造ロットごとに異なる種類の電子部品の検査および選別を行うことがある。例えば、表面実装型の電子部品には、同一サイズであっても特性が異なる部品がある。より具体的には、積層セラミックコンデンサには、同一サイズであっても容量が異なる部品がある。 In such a parts sorting device, different types of electronic parts may be inspected and sorted for each production lot. For example, among surface-mounted electronic components, there are components that have different characteristics even if they are the same size. More specifically, the multilayer ceramic capacitor includes parts having the same size but different capacities.
　また、このような部品選別装置では、前回ロットの電子部品がリニアフィーダまたはターンテーブル等に残ってしまうことがある。このような場合に、今回ロットの電子部品の種類が前回ロットの電子部品の種類と異なると、今回ロットの電子部品に、種類が異なる前回ロットの電子部品が紛れ込んでしまう可能性がある。このように同サイズ／異特性の電子部品が紛れ込んでしまうと、例え外観検査の精度が高くとも、選別の精度が低下してしまう。 In addition, in such a parts sorting device, electronic parts from the previous lot may remain on the linear feeder or turntable. In such a case, if the type of electronic components in the current lot differs from the type of electronic components in the previous lot, electronic components of a different type from the previous lot may be mixed with the electronic components in the current lot. If electronic components of the same size and different characteristics are mixed in in this way, the accuracy of sorting will be lowered even if the accuracy of appearance inspection is high.
　本発明は、部品選別の精度を向上する部品選別装置を提供することを目的とする。 An object of the present invention is to provide a parts sorting device that improves the accuracy of parts sorting.
　本発明に係る部品選別装置は、部品を搬送しながら検査し、良品を選別してケースに収容する部品選別装置であって、前記部品を搬送するリニアフィーダと、前記リニアフィーダによって搬送された前記部品を搬送するターンテーブルであって、１００００回転／分以上の回転数で回転する前記ターンテーブルと、前記ターンテーブル上の前記部品における複数の外面をそれぞれ撮像する複数の撮像デバイスと、前記リニアフィーダ上または前記ターンテーブル上の前記部品の特性を測定する測定デバイスと、前記撮像デバイスからの撮像結果に基づいて前記部品の外観検査を行い、前記外観検査の結果に基づいて前記良品を選別する検査選別コントローラとを備える。前記測定デバイスによる特性の測定が行われる前記リニアフィーダまたは前記ターンテーブルは、前記部品を静電吸着しながら搬送し、前記検査選別コントローラは、前記測定デバイスからの測定結果に基づいて前記部品の特性検査を行い、更に前記特性検査の結果に基づいて前記良品を選別する。 A parts sorting apparatus according to the present invention is a parts sorting apparatus that inspects parts while conveying them, selects non-defective parts, and stores them in a case, comprising: a linear feeder that conveys the parts; A turntable for conveying parts, the turntable rotating at a rotation speed of 10000 rpm or more, a plurality of imaging devices respectively imaging a plurality of outer surfaces of the parts on the turntable, and the linear feeder. A measuring device for measuring the characteristics of the component on the upper surface or on the turntable, and an inspection for performing a visual inspection of the component based on the imaging result from the imaging device, and selecting the non-defective product based on the result of the visual inspection. a sorting controller. The linear feeder or the turntable on which the characteristics are measured by the measuring device transports the component while electrostatically attracting it, and the inspection and selection controller measures the characteristics of the component based on the measurement results from the measuring device. An inspection is performed, and the non-defective products are selected based on the results of the characteristic inspection.
　本発明によれば、部品選別装置における部品選別の精度を向上することができる。 According to the present invention, it is possible to improve the accuracy of component selection in the component selection device.
本実施形態に係る部品選別装置の一例を上方からみた概略平面図である。1 is a schematic plan view of an example of a component sorting device according to an embodiment, viewed from above; FIG. 本実施形態に係る部品選別装置の他の一例を上方からみた概略平面図である。It is the schematic plan view which looked at another example of the components sorting apparatus which concerns on this embodiment from upper direction. 図１Ａまたは図１Ｂに示す部品選別装置におけるII部分を拡大した概略平面図である。It is the schematic plan view which expanded the II part in the components sorting apparatus shown in FIG. 1A or FIG. 1B. 図１Ａに示す部品選別装置を側方からみた概略側面図であって、II部分を拡大した概略側面図である。FIG. 1B is a schematic side view of the component sorting device shown in FIG. 1A as seen from the side, and is a schematic side view with an enlarged II portion. 図１Ｂに示す部品選別装置を側方からみた概略側面図であって、II部分を拡大した概略側面図である。FIG. 1C is a schematic side view of the parts sorting device shown in FIG. 1B as seen from the side, and is a schematic side view with an enlarged II portion. 図１Ａまたは図１Ｂに示す部品選別装置におけるIV-IV線断面図である。FIG. 1B is a sectional view taken along line IV-IV in the component sorting device shown in FIG. 1A or 1B; 部品の外観の概略斜視図である。It is a schematic perspective view of the external appearance of components. ケースの外観の概略斜視図である。It is a schematic perspective view of the appearance of a case.
　以下、添付の図面を参照して本発明の実施形態の一例について説明する。なお、各図面において同一または相当の部分に対しては同一の符号を附すこととする。 An example of an embodiment of the present invention will be described below with reference to the accompanying drawings. In each drawing, the same reference numerals are given to the same or corresponding parts.
　図１Ａは、本実施形態に係る部品選別装置の一例を上方からみた概略平面図であり、図１Ｂは、本実施形態に係る部品選別装置の他の一例を上方からみた概略平面図である。図２は、図１Ａまたは図１Ｂに示す部品選別装置におけるII部分を拡大した概略平面図である。図３Ａは、図１Ａに示す部品選別装置を側方からみた概略側面図であって、II部分を拡大した概略側面図であり、図３Ｂは、図１Ｂに示す部品選別装置を側方からみた概略側面図であって、II部分を拡大した概略側面図である。図４は、図１Ａまたは図１Ｂに示す部品選別装置におけるIV-IV線断面図である。なお、図１Ａ～図４には、ＸＹ直交座標系が示されている。 FIG. 1A is a schematic plan view of an example of a component sorting device according to this embodiment viewed from above, and FIG. 1B is a schematic plan view of another example of a component sorting device according to this embodiment viewed from above. FIG. 2 is a schematic plan view enlarging the II portion of the component sorting apparatus shown in FIG. 1A or 1B. 3A is a schematic side view of the parts sorting apparatus shown in FIG. 1A as seen from the side, and is a schematic side view with an enlarged portion II, and FIG. 3B is a side view of the parts sorting apparatus shown in FIG. 1B. It is a schematic side view, and is a schematic side view in which the II portion is enlarged. FIG. 4 is a sectional view taken along line IV-IV in the parts sorting apparatus shown in FIG. 1A or 1B. 1A to 4 show an XY orthogonal coordinate system.
　図１Ａ、図２、図３Ａおよび図４に示す部品選別装置１は、複数の電子部品３を順次に搬送しながら検査し、良品を選別してケース５に収容する装置である。部品選別装置１は、リニアフィーダ１０と、ターンテーブル２０と、複数の撮像デバイス３０と、測定デバイス４０と、第１排出機構５０と、第２排出機構６０と、第１カウンタ７１と、第２カウンタ７２と、第３カウンタ７３と、第４カウンタ７４と、検査選別コントローラ８０とを備える。 The component sorting device 1 shown in FIGS. 1A, 2, 3A, and 4 is a device that inspects a plurality of electronic components 3 while sequentially conveying them, selects non-defective components, and stores them in a case 5. The parts sorting apparatus 1 includes a linear feeder 10, a turntable 20, a plurality of imaging devices 30, a measuring device 40, a first ejection mechanism 50, a second ejection mechanism 60, a first counter 71, a second A counter 72 , a third counter 73 , a fourth counter 74 , and an inspection selection controller 80 are provided.
　電子部品３は、積層セラミックコンデンサ等の表面実装型の電子部品（チップ部品ともいう。）である。電子部品３は、例えば図５に示すように、セラミック材料からなる複数の誘電体層と１または複数の導体層とが積層された積層体３ａと、積層体３aの２つの端面の各々に配置された２つの外部電極３ｂとを備える。積層体３ａ、すなわち電子部品３は、直方体形状であり、積層方向に相対する２つの主面ＴＳ１およびＴＳ２と、積層方向に交差する幅方向に相対する２つの側面ＷＳ１およびＷＳ２と、積層方向および幅方向に交差する長さ方向に相対する２つの端面ＬＳ１およびＬＳ２とを有する。 The electronic component 3 is a surface-mounted electronic component (also called a chip component) such as a multilayer ceramic capacitor. As shown in FIG. 5, for example, the electronic component 3 is arranged on each of two end surfaces of the laminated body 3a, which is formed by laminating a plurality of dielectric layers made of a ceramic material and one or more conductor layers, and the laminated body 3a. and two external electrodes 3b. The laminate 3a, ie, the electronic component 3, has a rectangular parallelepiped shape and includes two principal surfaces TS1 and TS2 facing each other in the lamination direction, two side surfaces WS1 and WS2 facing each other in the width direction intersecting the lamination direction, It has two end surfaces LS1 and LS2 that face each other in the length direction and intersect the width direction.
　ケース５は、例えば図６に示すように、箱状のケースであり、その内部に複数の電子部品３を収容する。ケース５は、電子部品３の受け入れおよび取り出しの際に開き、電子部品３の収容の際には閉じることが可能である出入口５ａを１つだけ有する。 The case 5 is a box-shaped case, for example, as shown in FIG. 6, and accommodates a plurality of electronic components 3 therein. The case 5 has only one doorway 5a that can be opened when the electronic component 3 is received and taken out, and can be closed when the electronic component 3 is accommodated.
　図１Ａ、図２および図３Ａに示すように、リニアフィーダ１０は、複数の電子部品３を順次に直線的に搬送する。リニアフィーダ１０は、上流側に帯電部分を含み、下流側に静電吸着部分を含んでいてもよい。 As shown in FIGS. 1A, 2 and 3A, the linear feeder 10 linearly conveys a plurality of electronic components 3 sequentially. The linear feeder 10 may include a charging portion on the upstream side and an electrostatic attraction portion on the downstream side.
　リニアフィーダ１０は、ＳＵＳ等の材料からなると好ましい。また、リニアフィーダ１０は水平面に対して傾斜していると好ましい。これにより、リニアフィーダ１０の上流側の帯電部分において、振動によって電子部品３を搬送することにより、電子部品３を帯電させることができる。 The linear feeder 10 is preferably made of a material such as SUS. Moreover, it is preferable that the linear feeder 10 is inclined with respect to the horizontal plane. As a result, in the charging portion on the upstream side of the linear feeder 10, the electronic component 3 can be charged by conveying the electronic component 3 by vibration.
　図１Ａおよび図３Ａに示すように、リニアフィーダ１０の下流側の静電吸着部分の下側には、静電吸着機構１２が設けられていると好ましい。これにより、リニアフィーダ１０の下流側の静電吸着部分において、電子部品３を静電吸着して搬送することができる。 As shown in FIGS. 1A and 3A, an electrostatic chucking mechanism 12 is preferably provided below the electrostatic chucking portion on the downstream side of the linear feeder 10 . As a result, the electronic component 3 can be electrostatically attracted and conveyed in the electrostatic attraction portion on the downstream side of the linear feeder 10 .
　なお、図１Ｂおよび図３Ｂに示すように、リニアフィーダ１０には静電吸着機構１２が設けられていなくともよい。すなわち、リニアフィーダ１０は、上流側から下流側までの全体において、上述した帯電部分であってもよい。 Note that, as shown in FIGS. 1B and 3B, the linear feeder 10 does not have to be provided with the electrostatic adsorption mechanism 12 . That is, the linear feeder 10 may be the above-described charging portion in its entirety from the upstream side to the downstream side.
　ターンテーブル２０は、リニアフィーダ１０によって搬送された複数の電子部品３を順次に回転搬送する。図１Ａおよび図２に示すように、ターンテーブル２０は、上流側にガイド機構２２を有し、ガイド機構２２によって、リニアフィーダ１０からの電子部品３を、回転搬送軌跡２１に導く。ターンテーブル２０は、回転搬送軌跡２１に沿って電子部品３を搬送する。 The turntable 20 sequentially rotates and conveys the plurality of electronic components 3 conveyed by the linear feeder 10 . As shown in FIGS. 1A and 2 , the turntable 20 has a guide mechanism 22 on the upstream side, and the guide mechanism 22 guides the electronic component 3 from the linear feeder 10 to the rotary transfer locus 21 . The turntable 20 conveys the electronic component 3 along a rotational conveying locus 21 .
　図３Ａに示すように、ターンテーブル２０の下側には、静電吸着機構２４が設けられていると好ましい。これにより、電子部品３を静電吸着して搬送することができる。 As shown in FIG. 3A, an electrostatic attraction mechanism 24 is preferably provided below the turntable 20 . Thereby, the electronic component 3 can be electrostatically attracted and conveyed.
　ターンテーブル２０の搬送速度は、リニアフィーダ１０の搬送速度よりも速い。ターンテーブル２０の回転速度は、１００００回転／分以上の回転数であると好ましい。これにより、図２および図３Ａに示すように、電子部品３の間隔を空けることができ、電子部品３の端面側の外観検査が可能となる。なお、１００００回転／分以上でなくてもよく、９０００回転／分以上でもよく、８０００回転／分以上でもよい。そのとき、電子部品３のサイズは、長さ方向寸法は０．２５ｍｍ±１０％であり、幅方向寸法および厚み方向寸法は０．１２５ｍｍ±１３％程度である。 The conveying speed of the turntable 20 is faster than the conveying speed of the linear feeder 10. The rotation speed of the turntable 20 is preferably 10000 rpm or more. As a result, as shown in FIGS. 2 and 3A, the electronic components 3 can be spaced apart, and the appearance inspection of the end surfaces of the electronic components 3 can be performed. It should be noted that it does not have to be 10,000 revolutions/minute or more, it may be 9,000 revolutions/minute or more, or it may be 8,000 revolutions/minute or more. At that time, the size of the electronic component 3 is about 0.25 mm±10% in the length direction and about 0.125 mm±13% in the width direction and thickness direction.
　ターンテーブル２０は、ガラスまたは樹脂等の材料からなり、透明性を有する。これにより、電子部品３の裏面側の外観検査が可能となる。 The turntable 20 is made of a material such as glass or resin and has transparency. Thereby, the appearance inspection of the back side of the electronic component 3 becomes possible.
　図１Ａに示すように、撮像デバイス３０は、例えばカメラである。ターンテーブル２０の回転搬送軌跡２１に沿って、６個の撮像デバイス３０が設けられている。６個の撮像デバイス３０は、ターンテーブル２０上の電子部品３の６個の外面、すなわち２つの主面ＴＳ１およびＴＳ２、２つの側面ＷＳ１およびＷＳ２、および２つの端面ＬＳ１およびＬＳ２、をそれぞれ撮像する。 　As shown in FIG. 1A, the imaging device 30 is, for example, a camera. Six imaging devices 30 are provided along the rotary transfer locus 21 of the turntable 20 . The six imaging devices 30 respectively image six outer surfaces of the electronic component 3 on the turntable 20, namely two main surfaces TS1 and TS2, two side surfaces WS1 and WS2, and two end surfaces LS1 and LS2. .
　測定デバイス４０は、例えば電子部品３の外部電極に接触するための一対のプローブを含み、電子部品３の電気特性を測定する。図１Ａに示すように、測定デバイス４０は、リニアフィーダ１０の下流側の静電吸着部分に設けられてもよい。或いは、図１Ｂに示すように、測定デバイス４０は、ターンテーブル２０の回転搬送軌跡２１に沿って設けられてもよい。この場合、上述したように、また図３Ｂに示すように、リニアフィーダ１０には静電吸着機構１２が設けられていなくともよい。測定デバイス４０は、リニアフィーダ１０上またはターンテーブル２０上の電子部品３の電気特性を測定する。例えば、電子部品３が積層セラミックコンデンサである場合、測定デバイス４０は電子部品３の容量を測定する。 The measuring device 40 includes, for example, a pair of probes for contacting external electrodes of the electronic component 3 and measures electrical characteristics of the electronic component 3 . As shown in FIG. 1A, the measuring device 40 may be provided in the downstream electrostatic adsorption portion of the linear feeder 10 . Alternatively, as shown in FIG. 1B, the measuring device 40 may be provided along the rotary transfer trajectory 21 of the turntable 20. FIG. In this case, as described above and as shown in FIG. 3B, the linear feeder 10 may not be provided with the electrostatic adsorption mechanism 12 . The measuring device 40 measures electrical properties of the electronic component 3 on the linear feeder 10 or on the turntable 20 . For example, if the electronic component 3 is a laminated ceramic capacitor, the measuring device 40 measures the capacitance of the electronic component 3 .
　上述したように、測定デバイス４０による電気特性の測定が行われるリニアフィーダ１０の下流側の静電吸着部分またはターンテーブル２０は、電子部品３を静電吸着しながら搬送する。これにより、電気特性の測定精度を高めることが可能である。 As described above, the electrostatic attraction portion or turntable 20 on the downstream side of the linear feeder 10 where electrical characteristics are measured by the measuring device 40 conveys the electronic component 3 while electrostatically attracting it. Thereby, it is possible to improve the measurement accuracy of the electrical characteristics.
　図１Ａおよび図４に示すように、第１排出機構５０は、後述する検査選別コントローラ８０によって外観検査の結果および電気特性検査の結果に基づいて選別された良品を、ターンテーブル２０から排出してケース５に収容する。第１排出機構５０による良品の排出方法は、特に限定されないが、エアー吹付、エアー吸引、物理的接触押出、等が挙げられる。例えば、第１排出機構５０は、良品が搬送されてきた場合、検査選別コントローラ８０からの指令に従って、ターンテーブル２０上の良品にエアーを吹き付けることにより、良品をターンテーブル２０から内部に取り込む。 As shown in FIGS. 1A and 4, the first discharge mechanism 50 discharges non-defective products from the turntable 20 selected by an inspection and selection controller 80, which will be described later, based on the results of visual inspection and electrical characteristic inspection. Housed in Case 5. The method of discharging non-defective products by the first discharging mechanism 50 is not particularly limited, but examples thereof include air blowing, air suction, physical contact extrusion, and the like. For example, when a non-defective product is conveyed, the first discharge mechanism 50 takes in the non-defective product from the turntable 20 by blowing air on the non-defective product on the turntable 20 according to a command from the inspection/selection controller 80. - 特許庁
　第１排出機構５０は、管状部材５２を有する。管状部材５２は、断面円形または断面多角形の管状の部材であり、ターンテーブル２０からケース５の出入口まで延在する。これにより、管状部材５２は、ターンテーブル２０から排出された良品である電子部品３を、ケース５の出入口５ａまで導く。 The first ejection mechanism 50 has a tubular member 52 . The tubular member 52 is a tubular member having a circular or polygonal cross section and extends from the turntable 20 to the entrance of the case 5 . Thereby, the tubular member 52 guides the non-defective electronic component 3 ejected from the turntable 20 to the entrance 5 a of the case 5 .
　第２排出機構６０は、後述する検査選別コントローラ８０によって外観検査の結果または電気特性検査の結果に基づいて選別された不良品を、ターンテーブル２０から排出して回収箱（図示省略）に回収する。第２排出機構６０による不良品の排出方法は、第１排出機構５０による良品の排出方法と同様であればよい。例えば、第２排出機構６０は、不良品が搬送されてきた場合、検査選別コントローラ８０からの指令に従って、ターンテーブル２０上の不良品にエアーを吹き付けることにより、不良品をターンテーブル２０から内部に取り込む。 The second ejection mechanism 60 ejects the defective products selected by the inspection and selection controller 80 described later based on the result of the visual inspection or the result of the electrical property inspection from the turntable 20 and collects them in a collection box (not shown). . The method for discharging defective products by the second discharging mechanism 60 may be the same as the method for discharging non-defective products by the first discharging mechanism 50 . For example, when a defective product is conveyed, the second discharge mechanism 60 blows air onto the defective product on the turntable 20 according to the command from the inspection/selection controller 80, thereby removing the defective product from the turntable 20 to the inside. take in.
　また、第２排出機構６０は、第１排出機構５０と同様に管状部材を有し、管状部材によって、ターンテーブル２０から排出された不良品を回収箱まで導く（図示省略）。第２排出機構６０は、第１排出機構５０の上流側に設けられていると好ましい。 In addition, the second ejection mechanism 60 has a tubular member similar to the first ejection mechanism 50, and the tubular member guides the defective products ejected from the turntable 20 to the collection box (not shown). The second ejection mechanism 60 is preferably provided upstream of the first ejection mechanism 50 .
　図１Ａおよび図４に示すように、第１カウンタ７１は、第１排出機構５０によってターンテーブル２０から排出された良品をカウントする。第１カウンタ７１は、第１排出機構５０の下流側、すなわちケース５の直前、に設けられる。これにより、ケース５に収容される良品を正確にカウントすることができる。
なお、第１カウンタ７１は、更に第１排出機構５０の上流側にも設けられてもよい。これにより、２つの第１カウンタ７１のカウント数が異なる場合に、第１排出機構５０内に電子部品３が残留することを確認することができる。 As shown in FIGS. 1A and 4 , the first counter 71 counts non-defective products ejected from the turntable 20 by the first ejecting mechanism 50 . The first counter 71 is provided downstream of the first discharge mechanism 50 , that is, immediately before the case 5 . Thereby, the non-defective products housed in the case 5 can be accurately counted.
Note that the first counter 71 may be further provided on the upstream side of the first ejection mechanism 50 . Thereby, it can be confirmed that the electronic component 3 remains in the first ejection mechanism 50 when the count numbers of the two first counters 71 are different.
　第１カウンタ７１としては、特に限定されないが、カメラ、光センサ、渦電流センサ等が挙げられる。渦電流センサは、公知の渦電流センサ、渦電流式変位センサであればよい。例えば、共振回路からセンサコイルに高周波信号を供給し、センサコイルから高周波磁界を発生させる。この磁界内に金属を含む電子部品が近づくと、電子部品の金属に渦電流が発生し、センサコイルのインピーダンスが変化する。すると共振回路の電圧が変化する。この電圧変化を検波回路によって検出することによって、電子部品の通過をカウントすることができる。 Examples of the first counter 71 include, but are not limited to, a camera, an optical sensor, an eddy current sensor, and the like. The eddy current sensor may be any known eddy current sensor or eddy current displacement sensor. For example, a high frequency signal is supplied from a resonance circuit to a sensor coil to generate a high frequency magnetic field from the sensor coil. When an electronic component containing metal approaches this magnetic field, an eddy current is generated in the metal of the electronic component, changing the impedance of the sensor coil. Then the voltage of the resonant circuit changes. By detecting this voltage change with a detection circuit, the passage of electronic parts can be counted.
　第２カウンタ７２は、第２排出機構６０によってターンテーブル２０から排出される不良品をカウントする（図示省略）。第２カウンタ７２は、第１カウンタ７１と同様であればよい。 The second counter 72 counts the defective products discharged from the turntable 20 by the second discharge mechanism 60 (not shown). The second counter 72 may be similar to the first counter 71 .
　第３カウンタ７３は、第１排出機構５０による良品の排出および第２排出機構６０による不良品の排出の終了後、リニアフィーダ１０およびターンテーブル２０に残留する残留品をカウントする。第３カウンタ７３としては、特に限定されないが、カメラまたは公知のラインセンサ等が挙げられる。例えばカメラの場合、第３カウンタ７３はターンテーブル２０上の任意の位置に配置され、リニアフィーダ１０上およびターンテーブル２０上の清浄機能により集められた残留品をカウントしてもよい。なお、集められた残留品は回収箱に回収される（図示省略）。 The third counter 73 counts residual products remaining on the linear feeder 10 and the turntable 20 after the discharge of non-defective products by the first discharge mechanism 50 and the discharge of defective products by the second discharge mechanism 60 are completed. The third counter 73 is not particularly limited, but may be a camera, a known line sensor, or the like. For example, in the case of a camera, the third counter 73 may be placed anywhere on the turntable 20 to count leftovers collected by the cleaning function on the linear feeder 10 and on the turntable 20 . The collected residual items are collected in a collection box (not shown).
　第４カウンタ７４は、リニアフィーダ１０の比較的に上流側に配置され、入力される電子部品３をカウントする。第４カウンタ７４としては、特に限定されないが、カメラ等が挙げられる。 The fourth counter 74 is arranged relatively upstream of the linear feeder 10 and counts the electronic components 3 that are input. The fourth counter 74 is not particularly limited, but may be a camera or the like.
　検査選別コントローラ８０は、部品選別装置１全体を制御する。具体的には、検査選別コントローラ８０は、撮像デバイス３０からの撮像結果に基づいて電子部品３の外観検査を行い、外観検査の結果に基づいて良品および不良品を選別する。また、検査選別コントローラ８０は、測定デバイス４０からの測定結果に基づいて電子部品３の電気特性検査（ベリファイともいう。）を行い、更に電気特性検査の結果に基づいて良品および不良品を選別する。 The inspection and selection controller 80 controls the entire parts selection device 1 . Specifically, the inspection and selection controller 80 performs a visual inspection of the electronic component 3 based on the imaging result from the imaging device 30, and sorts out non-defective products and defective products based on the visual inspection result. The inspection and selection controller 80 also performs an electrical characteristic inspection (also referred to as verification) of the electronic component 3 based on the measurement results from the measuring device 40, and further sorts good products and defective products based on the results of the electrical characteristic inspection. .
　また、検査選別コントローラ８０は、第１排出機構５０による良品の排出を制御する。例えば、検査選別コントローラ８０は、リニアフィーダ１０の搬送速度、ターンテーブル２０の搬送速度（或いは、回転速度、および、回転搬送軌跡長さまたは半径）、リニアフィーダ１０またはターンテーブル２０における測定デバイス４０の位置、ターンテーブル２０における撮像デバイス３０の位置等の情報から、良品を第１排出機構５０から排出するタイミングを算出して、第１排出機構５０に指令する。 In addition, the inspection and selection controller 80 controls the discharge of non-defective products by the first discharge mechanism 50. For example, the inspection/selection controller 80 controls the transfer speed of the linear feeder 10, the transfer speed of the turntable 20 (or the rotation speed and the length or radius of the rotary transfer trajectory), the measurement device 40 in the linear feeder 10 or the turntable 20. Based on information such as the position and the position of the imaging device 30 on the turntable 20 , the timing for discharging non-defective products from the first discharge mechanism 50 is calculated, and the first discharge mechanism 50 is commanded.
　また、検査選別コントローラ８０は、第２排出機構６０による不良品の排出を制御する。例えば、検査選別コントローラ８０は、リニアフィーダ１０の搬送速度、ターンテーブル２０の搬送速度（或いは、回転速度、および、回転搬送軌跡長さまたは半径）、リニアフィーダ１０またはターンテーブル２０における測定デバイス４０の位置、ターンテーブル２０における撮像デバイス３０の位置等の情報から、不良品を第２排出機構６０から排出するタイミングを算出して、第２排出機構６０に指令する。 Also, the inspection and selection controller 80 controls ejection of defective products by the second ejection mechanism 60 . For example, the inspection/selection controller 80 controls the transfer speed of the linear feeder 10, the transfer speed of the turntable 20 (or the rotation speed and the length or radius of the rotary transfer trajectory), the measurement device 40 in the linear feeder 10 or the turntable 20. Based on information such as the position of the imaging device 30 on the turntable 20 , the timing for ejecting the defective product from the second ejecting mechanism 60 is calculated, and the second ejecting mechanism 60 is commanded.
　また、検査選別コントローラ８０は、第１カウンタ７１によってカウントされた良品の数、第２カウンタ７２によってカウントされた不良品の数、および、第３カウンタ７３によってカウントされた残留品の数に基づいて、部品選別の正常または異常の確認を行う。
　例えば、検査選別コントローラ８０は、カウントされた良品、不良品および残留品の総和の数が、外観検査の数または電気特性検査の数と異なる場合、装置の異常と判定し、異常を示すアラームを通知してもよい。
　或いは、検査選別コントローラ８０は、カウントされた良品、不良品および残留品の総和の数が、第４カウンタ７４によってカウントされた入力数と異なる場合、装置の異常と判定し、異常を示すアラームを通知してもよい。 The inspection and selection controller 80 also controls the number of non-defective products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73. , to check whether the part sorting is normal or abnormal.
For example, if the total number of counted non-defective products, defective products and remaining products is different from the number of appearance inspections or the number of electrical characteristic inspections, the inspection and selection controller 80 determines that the device is abnormal, and issues an alarm indicating the abnormality. may notify you.
Alternatively, if the counted total number of non-defective products, defective products, and remaining products is different from the input number counted by the fourth counter 74, the inspection and sorting controller 80 determines that the device is abnormal, and issues an alarm indicating the abnormality. may notify you.
　検査選別コントローラ８０は、例えば、ＤＳＰ（Digital Signal Processor）、ＦＰＧＡ（Field-Programmable Gate Array）等の演算プロセッサで構成される。検査選別コントローラ８０の各種機能は、例えば記憶部に格納された所定のソフトウェア（プログラム）を実行することで実現される。検査選別コントローラ８０の各種機能は、ハードウェアとソフトウェアとの協働で実現されてもよいし、ハードウェア（電子回路）のみで実現されてもよい。 The inspection selection controller 80 is composed of an arithmetic processor such as a DSP (Digital Signal Processor) or FPGA (Field-Programmable Gate Array). Various functions of the inspection and selection controller 80 are implemented by executing predetermined software (programs) stored in a storage unit, for example. Various functions of the inspection and selection controller 80 may be realized by cooperation of hardware and software, or may be realized only by hardware (electronic circuits).
　検査選別コントローラ８０における記憶部は、例えばＥＥＰＲＯＭ等の書き換え可能なメモリである。記憶部は、選別コントローラの各種機能を実行するための所定のソフトウェア（プログラム）を格納する。また、記憶部は、例えば外部から入力された各種設定値を格納する。各種設定値は、リニアフィーダ１０の搬送速度、ターンテーブル２０の搬送速度（或いは、回転速度、および、回転搬送軌跡長さまたは半径）、撮像デバイス３０の位置、測定デバイス４０の位置、第１排出機構５０の位置、および第２排出機構６０の位置に関する情報、および良品／不良品の判定基準、等を含む。 The storage unit in the inspection and selection controller 80 is, for example, a rewritable memory such as EEPROM. The storage unit stores predetermined software (programs) for executing various functions of the sorting controller. In addition, the storage unit stores various setting values input from the outside, for example. Various set values are the conveying speed of the linear feeder 10, the conveying speed of the turntable 20 (or the rotational speed and the length or radius of the rotational conveying locus), the position of the imaging device 30, the position of the measuring device 40, and the first discharge. It includes information about the position of the mechanism 50 and the position of the second ejection mechanism 60, good/bad criteria, and the like.
　以上説明したように、本実施形態の部品選別装置１によれば、電子部品３を搬送するリニアフィーダ１０と、電子部品３を搬送する透明なターンテーブル２０と、ターンテーブル２０上の電子部品３の６つの外面をそれぞれ撮像する６つの撮像デバイス３０と、撮像デバイス３０からの撮像結果に基づいて電子部品３の外観検査を行い、外観検査の結果に基づいて良品を選別する検査選別コントローラ８０とを備える。これにより、複数の電子部品３を搬送しながら外観検査し、良品を選別してケース５に収容することができる。 As described above, according to the component sorting apparatus 1 of the present embodiment, the linear feeder 10 that conveys the electronic components 3, the transparent turntable 20 that conveys the electronic components 3, and the electronic components 3 on the turntable 20 and an inspection and selection controller 80 that performs a visual inspection of the electronic components 3 based on the imaging results from the imaging devices 30 and selects non-defective products based on the results of the visual inspection. Prepare. Thus, the electronic components 3 can be visually inspected while being transported, and the non-defective products can be selected and accommodated in the case 5 .
　ここで、このような部品選別装置では、製造ロットごとに異なる種類の電子部品の検査および選別を行うことがある。例えば、表面実装型の電子部品には、同一サイズであっても特性が異なる部品がある。より具体的には、積層セラミックコンデンサには、同一サイズであっても容量が異なる部品がある。 Here, in such a parts sorting device, different types of electronic parts may be inspected and sorted for each production lot. For example, among surface-mounted electronic components, there are components that have different characteristics even if they are the same size. More specifically, the multilayer ceramic capacitor includes parts having the same size but different capacities.
　また、このような部品選別装置では、前回ロットの電子部品がリニアフィーダまたはターンテーブル等に残ってしまうことがある。このような場合に、今回ロットの電子部品の種類が前回ロットの電子部品の種類と異なると、今回ロットの電子部品に、種類が異なる前回ロットの電子部品が紛れ込んでしまう可能性がある。このように同サイズ／異特性の電子部品が紛れ込んでしまうと、例え外観検査の精度が高くとも、選別の精度が低下してしまう。 In addition, in such a parts sorting device, electronic parts from the previous lot may remain on the linear feeder or turntable. In such a case, if the type of electronic components in the current lot differs from the type of electronic components in the previous lot, electronic components of a different type from the previous lot may be mixed with the electronic components in the current lot. If electronic components of the same size and different characteristics are mixed in in this way, the accuracy of sorting will be lowered even if the accuracy of appearance inspection is high.
　この点に関し、本実施形態の部品選別装置１によれば、リニアフィーダ１０上またはターンテーブル２０上の電子部品３の電気特性を測定する測定デバイス４０を更に備え、検査選別コントローラ８０は、測定デバイス４０からの測定結果に基づいて電子部品３の電気特性検査を行い、更に電気特性検査の結果に基づいて良品を選別する。これにより、種類が異なる前回ロットの電子部品が、リニアフィーダまたはターンテーブル等に残ってしまい、今回ロットの電子部品に紛れ込んでしまっても、電気特性検査の結果に基づいて同サイズ／異特性の電子部品を不良品として選別することができ、部品選別の精度を向上することができる。 Regarding this point, according to the component sorting apparatus 1 of the present embodiment, the measuring device 40 for measuring the electrical characteristics of the electronic component 3 on the linear feeder 10 or on the turntable 20 is further provided, and the inspection and sorting controller 80 includes the measuring device Based on the measurement results from 40, the electrical characteristics of the electronic component 3 are inspected, and the non-defective products are selected based on the results of the electrical characteristics inspection. As a result, even if the electronic parts of the previous lot of different types remain in the linear feeder or turntable, etc., and are mixed in with the electronic parts of the current lot, we will check the results of the electrical characteristics inspection to ensure that they are of the same size/different characteristics. Electronic components can be sorted out as defective products, and the accuracy of component sorting can be improved.
　なお、詳細な電気特性の仕様に対する良品および不良品の選別は、例えば製造後であって本装置への入力前に別途行われることとし、上述した電気特性検査は、前回ロットの電子部品がリニアフィーダまたはターンテーブル等に残ってしまう場合に、今回ロットの電子部品に紛れ込んだ前回ロットの同サイズ／異特性の電子部品を選別することを目的とした簡易な電気特性検査とする。 It should be noted that the sorting of non-defective products and defective products based on detailed specifications of electrical characteristics is performed separately, for example, after manufacturing and before inputting to this device. This is a simple electrical characteristic inspection for the purpose of sorting electronic components of the same size/different characteristics from the previous lot that are mixed in with the electronic components of the current lot when they remain on a feeder, turntable, or the like.
　測定デバイス４０はリニアフィーダ１０側に設けられてもよい。この場合、検査選別時間の短縮化のためにターンテーブル２０の回転速度が１００００回転／分以上と速い場合であっても、電気特性検査が容易となる。
　或いは、測定デバイス４０はターンテーブル２０側に設けられてもよい。この場合、良品または不良品の排出タイミングの算出が容易となる。 The measuring device 40 may be provided on the linear feeder 10 side. In this case, even if the rotation speed of the turntable 20 is as high as 10,000 rpm or more in order to shorten the inspection and sorting time, the electrical characteristic inspection becomes easy.
Alternatively, the measuring device 40 may be provided on the turntable 20 side. In this case, it becomes easy to calculate the discharge timing of the non-defective product or the defective product.
　また、本実施形態の部品選別装置１によれば、測定デバイス４０による電気特性の測定が行われるリニアフィーダ１０またはターンテーブル２０は、電子部品３を静電吸着しながら搬送する。これにより、電気特性検査の精度を向上することができる。 Further, according to the component sorting apparatus 1 of the present embodiment, the linear feeder 10 or the turntable 20 on which electrical characteristics are measured by the measuring device 40 transports the electronic components 3 while electrostatically attracting them. Thereby, the accuracy of the electrical property inspection can be improved.
　また、本実施形態の部品選別装置１によれば、第１排出機構５０によって排出された良品をカウントする第１カウンタ７１と、第２排出機構６０によって排出された不良品をカウントする第２カウンタ７２と、第１排出機構５０による良品の排出および第２排出機構６０による不良品の排出の終了後、リニアフィーダ１０およびターンテーブル２０に残留する残留品をカウントする第３カウンタ７３とを更に備え、検査選別コントローラ８０は、第１カウンタ７１によってカウントされた良品の数、第２カウンタ７２によってカウントされた不良品の数、および、第３カウンタ７３によってカウントされた残留品の数に基づいて、部品選別の正常または異常の確認を行う。これにより、処理ロットごとに、電子部品の出力数と入力数とが合わない部品選別の異常を確認することができ、次の処理ロットの電子部品に前の処理ロットの電子部品が紛れ込んでしまうことを防止することができる。これにより、部品選別の精度を更に向上することができる。 Further, according to the parts sorting apparatus 1 of this embodiment, the first counter 71 that counts the non-defective products discharged by the first discharging mechanism 50 and the second counter that counts the defective products discharged by the second discharging mechanism 60 72, and a third counter 73 for counting residual products remaining on the linear feeder 10 and the turntable 20 after the discharge of non-defective products by the first discharge mechanism 50 and the discharge of defective products by the second discharge mechanism 60 are completed. , the inspection and sorting controller 80, based on the number of good products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73, Checks whether parts sorting is normal or abnormal. As a result, it is possible to confirm anomalies in component sorting where the number of output electronic components does not match the number of input electronic components for each processing lot. can be prevented. Thereby, the accuracy of component selection can be further improved.
　以上、本発明の実施形態について説明したが、本発明は上述した実施形態に限定されることなく、種々の変更および変形が可能である。上述した実施形態では、不良品をターンテーブル２０から排出する第２排出機構６０を備える形態について例示した。しかし、本発明はこれに限定されず、例えば第２排出機構６０を備えない形態であってもよい。この場合、部品選別装置１は、撮像デバイス３０による撮像および外観検査後、直ちに不良品をターンテーブル２０から排出してもよい。また、部品選別装置１は、測定デバイス４０による測定および電気特性検査後、直ちに不良品をリニアフィーダ１０またはターンテーブル２０から排出してもよい。この場合、ターンテーブル２０の外周全体、および／または、リニアフィーダ１０の側方全体に、不良品回収機能を配置してもよい。 Although the embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments, and various modifications and variations are possible. In the above-described embodiment, the form provided with the second ejection mechanism 60 that ejects the defective product from the turntable 20 has been exemplified. However, the present invention is not limited to this, and for example, a form without the second ejection mechanism 60 may be employed. In this case, the parts sorting apparatus 1 may eject the defective products from the turntable 20 immediately after the image pickup by the image pickup device 30 and the appearance inspection. Further, the parts sorting apparatus 1 may discharge the defective products from the linear feeder 10 or the turntable 20 immediately after the measurement by the measuring device 40 and the electrical property inspection. In this case, the defective product collection function may be arranged over the entire circumference of the turntable 20 and/or the entire lateral side of the linear feeder 10 .
　また、上述した実施形態では、検査選別コントローラ８０が撮像デバイス３０からの撮像結果に基づいて電子部品の外観検査を行う機能を有する形態について例示した。しかし、本発明はこれに限定されず、撮像デバイス３０の各々が外観検査機能を有してもよい。また、撮像デバイス３０の各々が、上述の変形例のように、外観検査後に直ちに不良品をターンテーブル２０から排出する機能を有してもよい。 In addition, in the above-described embodiment, the inspection and selection controller 80 has a function of performing visual inspection of electronic components based on the imaging result from the imaging device 30, as an example. However, the present invention is not limited to this, and each imaging device 30 may have a visual inspection function. Also, each of the imaging devices 30 may have a function of ejecting defective products from the turntable 20 immediately after the appearance inspection, as in the modification described above.
　また、上述した実施形態では、検査選別コントローラ８０が測定デバイス４０からの測定結果に基づいて電子部品の電気特性検査を行う機能を有する形態について例示した。しかし、本発明はこれに限定されず、測定デバイス４０が電気特性検査機能を有してもよい。また、測定デバイス４０の各々が、上述の変形例のように、電気特性検査後に直ちに不良品をリニアフィーダ１０またはターンテーブル２０から排出する機能を有してもよい。 In addition, in the above-described embodiment, the inspection and selection controller 80 has a function of inspecting the electrical characteristics of electronic components based on the measurement results from the measuring device 40, as an example. However, the present invention is not limited to this, and the measuring device 40 may have the electrical property inspection function. Also, each of the measuring devices 40 may have the function of discharging defective products from the linear feeder 10 or the turntable 20 immediately after the electrical property inspection, as in the above modification.
　また、上述した実施形態では、測定デバイス４０が電子部品３の電気特性を測定する形態について例示した。しかし、本発明はこれに限定されず、測定デバイス４０は電気特性以外の種々の特性を測定する形態にも適用可能である。この場合、検査選別コントローラ８０は、測定デバイス４０からの測定結果に基づいて電子部品３の種々の特性検査を行い、この特性検査の結果に基づいて良品および不良品を選別することとなる。 Also, in the above-described embodiment, the measuring device 40 measures the electrical characteristics of the electronic component 3 as an example. However, the present invention is not limited to this, and the measuring device 40 can be applied to a mode for measuring various properties other than electrical properties. In this case, the inspection/selection controller 80 performs various characteristic inspections of the electronic component 3 based on the measurement results from the measuring device 40, and sorts out non-defective products and defective products based on the results of these characteristic inspections.
　１　部品選別装置
　３　電子部品
　５　ケース
　５ａ　出入口
　１０　リニアフィーダ
　１２　静電吸着機構
　２０　ターンテーブル
　２１　回転搬送軌跡
　２２　ガイド機構
　２４　静電吸着機構
　３０　撮像デバイス
　４０　測定デバイス
　５０　第１排出機構
　５２　管状部材
　６０　第２排出機構
　７１　第１カウンタ
　７２　第２カウンタ
　７３　第３カウンタ
　７４　第４カウンタ
　８０　検査選別コントローラ 1 Component Sorting Device 3 Electronic Component 5 Case 5a Doorway 10 Linear Feeder 12 Electrostatic Attraction Mechanism 20 Turntable 21 Rotation Conveyance Trajectory 22 Guide Mechanism 24 Electrostatic Attraction Mechanism 30 Imaging Device 40 Measurement Device 50 First Ejection Mechanism 52 Tubular Member 60 th 2 discharge mechanism 71 first counter 72 second counter 73 third counter 74 fourth counter 80 inspection and selection controller

Claims (5)

  1. 　部品を搬送しながら検査し、良品を選別してケースに収容する部品選別装置であって、
    　前記部品を搬送するリニアフィーダと、
    　前記リニアフィーダによって搬送された前記部品を搬送するターンテーブルであって、、１００００回転／分以上の回転数で回転する前記ターンテーブルと、
    　前記ターンテーブル上の前記部品における複数の外面をそれぞれ撮像する複数の撮像デバイスと、
    　前記リニアフィーダ上または前記ターンテーブル上の前記部品の特性を測定する測定デバイスと、
    　前記撮像デバイスからの撮像結果に基づいて前記部品の外観検査を行い、前記外観検査の結果に基づいて前記良品を選別する検査選別コントローラと、
    を備え、
    　前記測定デバイスによる特性の測定が行われる前記リニアフィーダまたは前記ターンテーブルは、前記部品を静電吸着しながら搬送し、
    　前記検査選別コントローラは、前記測定デバイスからの測定結果に基づいて前記部品の特性検査を行い、更に前記特性検査の結果に基づいて前記良品を選別する、
    部品選別装置。     A parts sorting device that inspects parts while conveying them, sorts non-defective parts, and stores them in a case,
    a linear feeder that conveys the component;
    a turntable for conveying the parts conveyed by the linear feeder, the turntable rotating at a rotation speed of 10000 rpm or more;
    a plurality of imaging devices respectively imaging a plurality of outer surfaces of the component on the turntable;
    a measuring device for measuring properties of the part on the linear feeder or on the turntable;
    an inspection and selection controller that performs a visual inspection of the component based on the imaging result from the imaging device and selects the non-defective product based on the result of the visual inspection;
    with
    The linear feeder or the turntable on which the characteristics are measured by the measuring device transports the component while electrostatically attracting it,
    The inspection and selection controller performs a characteristic inspection of the component based on the measurement results from the measuring device, and further selects the non-defective product based on the result of the characteristic inspection.
    Parts sorting device.
  2. 　前記検査選別コントローラによって前記外観検査の結果および前記特性検査の結果に基づいて選別された前記良品を、前記ターンテーブルから排出して前記ケースに収容する第１排出機構と、
    　前記第１排出機構によって排出された前記良品をカウントする第１カウンタと、
    を更に備える、請求項１に記載の部品選別装置。     a first ejection mechanism for ejecting the non-defective products selected by the inspection and selection controller based on the results of the appearance inspection and the results of the characteristic inspection from the turntable and storing them in the case;
    a first counter that counts the non-defective products discharged by the first discharge mechanism;
    The parts sorting device of claim 1, further comprising:
  3. 　前記第１カウンタはカメラを含む、請求項２に記載の部品選別装置。 The parts sorting device according to claim 2, wherein the first counter includes a camera.
  4. 　前記第１カウンタは渦電流センサを含む、請求項２に記載の部品選別装置。 The parts sorting device according to claim 2, wherein the first counter includes an eddy current sensor.
  5. 　前記検査選別コントローラによって前記外観検査の結果または前記特性検査の結果に基づいて選別された不良品を、前記ターンテーブルから排出する第２排出機構と、
    　前記第２排出機構によって排出された前記不良品をカウントする第２カウンタと、
    　前記第１排出機構による前記良品の排出および前記第２排出機構による前記不良品の排出の終了後、前記リニアフィーダおよび前記ターンテーブルに残留する残留品をカウントする第３カウンタと、
    を更に備え、
    　前記検査選別コントローラは、前記第１カウンタによってカウントされた前記良品の数、第２カウンタによってカウントされた前記不良品の数、および、前記第３カウンタによってカウントされた前記残留品の数に基づいて、部品選別の正常または異常の確認を行う、
    請求項２～４のいずれか１項に記載の部品選別装置。     a second ejection mechanism for ejecting from the turntable defective products selected by the inspection and selection controller based on the result of the appearance inspection or the result of the characteristic inspection;
    a second counter that counts the defective products discharged by the second discharge mechanism;
    a third counter for counting residual products remaining on the linear feeder and the turntable after the discharge of the non-defective products by the first discharge mechanism and the discharge of the defective products by the second discharge mechanism;
    further comprising
    The inspection and sorting controller, based on the number of non-defective items counted by the first counter, the number of defective items counted by the second counter, and the number of remaining items counted by the third counter , to check the normality or abnormality of part sorting,
    The parts sorting device according to any one of claims 2 to 4.
PCT/JP2022/041501 2021-12-27 2022-11-08 Component sorting device WO2023127315A1 (en)

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