TW201205101A - Voltage supply device - Google Patents

Voltage supply device Download PDF

Info

Publication number
TW201205101A
TW201205101A TW100104909A TW100104909A TW201205101A TW 201205101 A TW201205101 A TW 201205101A TW 100104909 A TW100104909 A TW 100104909A TW 100104909 A TW100104909 A TW 100104909A TW 201205101 A TW201205101 A TW 201205101A
Authority
TW
Taiwan
Prior art keywords
voltage
integrated circuit
test
power supply
terminal
Prior art date
Application number
TW100104909A
Other languages
English (en)
Chinese (zh)
Inventor
Akira Higuchi
Akimasa Yuzurihara
Daisuke Sakamaki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW201205101A publication Critical patent/TW201205101A/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
TW100104909A 2010-04-16 2011-02-15 Voltage supply device TW201205101A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010095141A JP2011226854A (ja) 2010-04-16 2010-04-16 電圧を供給する装置

Publications (1)

Publication Number Publication Date
TW201205101A true TW201205101A (en) 2012-02-01

Family

ID=44798434

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100104909A TW201205101A (en) 2010-04-16 2011-02-15 Voltage supply device

Country Status (4)

Country Link
JP (1) JP2011226854A (ja)
KR (1) KR101374339B1 (ja)
TW (1) TW201205101A (ja)
WO (1) WO2011129044A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106405441B (zh) * 2016-11-13 2023-08-04 深圳市迅特通信技术股份有限公司 一种光模块的老化测试装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2977593B2 (ja) 1990-09-25 1999-11-15 安藤電気株式会社 Ｉｃテスタの３値出力回路
JP3196756B2 (ja) 1999-02-24 2001-08-06 日本電気株式会社 半導体集積回路測定装置
JP2003215165A (ja) 2002-01-22 2003-07-30 Shibasoku:Kk 電源回路
US7290192B2 (en) * 2003-03-31 2007-10-30 Advantest Corporation Test apparatus and test method for testing plurality of devices in parallel
US7453258B2 (en) * 2004-09-09 2008-11-18 Formfactor, Inc. Method and apparatus for remotely buffering test channels
WO2009125491A1 (ja) 2008-04-11 2009-10-15 株式会社アドバンテスト ドライバ回路および試験装置

Also Published As

Publication number Publication date
WO2011129044A1 (ja) 2011-10-20
KR101374339B1 (ko) 2014-03-17
JP2011226854A (ja) 2011-11-10
KR20120034618A (ko) 2012-04-12

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