TW201205101A - Voltage supply device - Google Patents
Voltage supply device Download PDFInfo
- Publication number
- TW201205101A TW201205101A TW100104909A TW100104909A TW201205101A TW 201205101 A TW201205101 A TW 201205101A TW 100104909 A TW100104909 A TW 100104909A TW 100104909 A TW100104909 A TW 100104909A TW 201205101 A TW201205101 A TW 201205101A
- Authority
- TW
- Taiwan
- Prior art keywords
- voltage
- integrated circuit
- test
- power supply
- terminal
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010095141A JP2011226854A (ja) | 2010-04-16 | 2010-04-16 | 電圧を供給する装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201205101A true TW201205101A (en) | 2012-02-01 |
Family
ID=44798434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100104909A TW201205101A (en) | 2010-04-16 | 2011-02-15 | Voltage supply device |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2011226854A (ja) |
KR (1) | KR101374339B1 (ja) |
TW (1) | TW201205101A (ja) |
WO (1) | WO2011129044A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106405441B (zh) * | 2016-11-13 | 2023-08-04 | 深圳市迅特通信技术股份有限公司 | 一种光模块的老化测试装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2977593B2 (ja) | 1990-09-25 | 1999-11-15 | 安藤電気株式会社 | Icテスタの3値出力回路 |
JP3196756B2 (ja) | 1999-02-24 | 2001-08-06 | 日本電気株式会社 | 半導体集積回路測定装置 |
JP2003215165A (ja) | 2002-01-22 | 2003-07-30 | Shibasoku:Kk | 電源回路 |
US7290192B2 (en) * | 2003-03-31 | 2007-10-30 | Advantest Corporation | Test apparatus and test method for testing plurality of devices in parallel |
US7453258B2 (en) * | 2004-09-09 | 2008-11-18 | Formfactor, Inc. | Method and apparatus for remotely buffering test channels |
WO2009125491A1 (ja) | 2008-04-11 | 2009-10-15 | 株式会社アドバンテスト | ドライバ回路および試験装置 |
-
2010
- 2010-04-16 JP JP2010095141A patent/JP2011226854A/ja not_active Withdrawn
-
2011
- 2011-02-10 KR KR1020117027384A patent/KR101374339B1/ko active IP Right Grant
- 2011-02-10 WO PCT/JP2011/000778 patent/WO2011129044A1/ja active Application Filing
- 2011-02-15 TW TW100104909A patent/TW201205101A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2011129044A1 (ja) | 2011-10-20 |
KR101374339B1 (ko) | 2014-03-17 |
JP2011226854A (ja) | 2011-11-10 |
KR20120034618A (ko) | 2012-04-12 |
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