201132421 六、發明說明： 【發明所屬之技術領域】 本發明係關於將複數電子零件並列搬送、檢査、分類 的電子零件特性檢査分類裝置。更詳而言之，係關於在一 個搬送用的旋轉圓盤暫時供給複數電子零件，對被前述圓 盤依序搬送而來的電子零件的電氣特性進行檢査，可根據 前述檢査的結果，來進行電子零件之分類的電子零件特性 檢査分類裝置。 【先前技術】 在習知之檢查電子零件之電氣特性且作分類的裝置中 ，一般所使用的方式係將電子零件1個1個逐個供給且搬送 至收納電子零件而進行旋轉的圓盤，以1個1個逐個進行檢 査等（專利文獻1 )。 〔先前技術文獻〕 〔專利文獻〕 〔專利文獻1〕日本特開2002-043194號公報 【發明內容】 (發明所欲解決之課題） 以用以衰減或遮斷電子機器之雜訊的電子零件而言， 尤其3端子電容器或LC濾波器等複合元件的需要急遽增加 。以往，檢查該等電子零件的電氣特性並作分類的裝置— 般係使用在收納電子零件而作旋轉的圓盤1個1個逐個供給 201132421 前述電子零件而搬送至檢査用電極的手段 由於必須全數檢査的關係，強烈要求其處 爲了使處理量增加，考慮備妥複數個前述 並列處理的方法。此僅爲備妥複數組複數 機構的裝置規模的擴大，而需要相稱的成 本發明之主要目的在提供保存習知的 構造’抑制硬體增大，可擴大處理量之電 分類裝置。 本發明之另一具體目的在提供可將電 供給至1個進行旋轉的圓盤，以進行搬送 電子零件特性檢査分類裝置。 (解決課題之手段） 爲達成前述目的，本發明之電子零件 置係將電子零件依序供給至進行旋轉的圓 搬送’而以檢査單元進行檢査，根據前述 零件作分類的電子零件特性檢査分類裝置 具有料袋群，可將電子零件以料袋單 進行保持搬送的圓盤； 將前述圓盤以料袋對單位進行旋轉驅 構； 以料袋對單位對前述料袋群供給電子 供給手段； 。前述電子零件 理速度的提升。 圓盤使其旋轉而 圓盤或該等驅動 本負擔。 檢査方法的基本 子零件特性檢査 子零件同時並列 、檢査、分類之 特性檢査分類裝 盤，使其保持、 檢査結果將電子 ，其特徵爲包含 位或料袋對單位 動的圓盤驅動機 零件的電子零件 • 6 - 201132421 與檢査項目數相對應配置在前述圓盤的旋動區域，由 具備有與成對的電子零件相對應的電極單元的檢査單元群 所構成，取得各電子零件的檢査資料的檢査手段； 根據依據所取得的檢査資料將電子零件作分類所得之 分類結果，將電子零件作分類之配置在前述圓盤之旋動區 域的分類裝置；及 對前述圓盤同時供給2個電子零件，以可檢査的方式 進行驅動，藉由前述檢査手段取得檢査資料，按照根據檢 査結果的分類而使前述分類裝置作分類的控制裝置。 本發明之請求項2所記載之電子零件特性檢査分類裝 置係在如請求項1所記載之電子零件特性檢査分類裝置中 前述檢査手段係可按所檢査的電氣特性的每個內容， 同時檢査2個電子零件， 前述分類裝置係根據前述檢査結果，將電子零件2個 同時根據各自的分類作分類。 本發明之請求項3所記載之電子零件特性檢査分類裝 置係在如請求項1所記載之電子零件特性檢査分類裝置中 前述電子零件供給手段係包含檢測電子零件可供給狀 態的零件感測器， 前述圓盤驅動機構係另外具備有將前述圓盤以料袋單 位進行旋轉驅動的機構， 前述控制裝置係根據前述零件感測器的輸出來控制前 201132421 述圓盤的旋轉，藉此以料袋對單位或料袋單位供給電子零 件。 (發明之效果） 藉由本發明，可提供一種電子零件特性檢査分類裝置 ，其係供給電子零件，將電子零件收納在進行旋轉的圓盤 ’對被前述圓盤依序搬送而來的電子零件的電氣特性進行 檢査’根據前述檢査的結果將電子零件作分類的裝置，圓 盤及其圓盤驅動機構爲一組，可得藉由將電子零件2個同 時供給至前述圓盤來進行搬送所得之並列處理的效果，可 闻速處理。 【實施方式】 在說明本發明之前，參照第1圖、第2圖來說明比較對 象裝置。該比較對象裝置係使用搬送1個電子零件用的圓 盤，來1個1個逐個進行檢査的系統。第1圖係顯示習知技 術中將電子零件1個1個逐個的處理爲前提的典型設計所得 之電子零件特性檢査分類裝置的配置圖。第2圖係顯示具 有作50分割之料袋（p0Cket)的圓盤作爲第1圖之裝置的搬 送用圓盤的具體例的平面圖。 如第2圖所示，圓盤2係具有用以收納電子零件的5 0個 料袋202，料袋202係被配置在將圓盤2作50分割之等分割 中心線20 1上的圓盤2的外周部。在屬於使用圓盤2的裝置 的第1圖中，從屬於用以1個1個逐個供給電子零件1的電子 -8- 201132421 零件供給手段的一列排出零件給料器6，將1個電子零件i 供給至圓盤2的料袋202。省略該收付裝置的圖示，例如使 用如取放裝置般的一般收付裝置。在檢査單元的電極單元 4的前端部例如被連接有計測器（圖示省略），其用以檢 査設置有被組裝用以與第5圖所示之電子零件1的端子電極 101、1〇2及103接觸的接觸子的接觸機構（圖示省略）的 電子零件1的電氣特性。電極單元4係按每個檢査項目（例 如電容、耐壓、漏電流等）被設置在電極單元上下動板5 上。若電子零件1被送至電極單元4的位置，藉由電極單元 上下動板5的動作，使電極單元4下降來執行檢査。若檢査 結束，電極單元4即上升。此外，用以根據檢査的結果來 分類電子零件1的機構（圖示省略）被設置在由電極單元 上下動板5至電子零件1的供給位置之間。圓盤2係在對料 袋2 0 2之電子零件1的供給結束、檢査結束、分類結束的時 點，藉由圓盤驅動機構3來進行1分割的間歇搬送。該動作 被反覆執行。 第5圖係顯示收納在圓盤2之料袋202及203的電子零件 1的姿勢的圖。以電子零件1之一例而言，顯示3端子電容 器的端子電極1、2及3 (元件符號101、102及103相對應） 。第5圖的（a )係顯示在所圖示電子零件1之姿勢狀態下 直接被收納在圓盤2的料袋202的情形，第5圖的（b )係顯 示在所圖示電子零件1之姿勢狀態下直接被收納在圓盤2的 料袋2 0 3的情形。其中，該構成亦在本發明之電子零件特 性檢査分類裝置中加以採用。本發明之電子零件特性檢査 -9 - 201132421 分類裝置有大部分沿襲習知裝置中所使用的基本構成。 接著，說明本發明之電子零件特性檢査分類裝置之實 施形態。 參照第3圖及第4圖，說明本發明之裝置。第3圖係顯 示本發明之電子零件特性檢査分類裝置中所使用之圓盤之 具體例的部分放大平面圖，顯示可同時搬送、檢査2個電 子零件的圓盤中的料袋的組合，放大顯示第4圖所示之具 有二個一對料袋的圓盤7的料袋部分的圖。如第3圖所示， 本發明之電子零件特性檢査分類裝置中，配置2個料'袋， 其用以以50等分割將圓盤7分割後的等分割中心線70丨平行 且等間隔地在圓盤7的外周部收納電子零件1，將該料袋設 爲一對。亦即’作50等分割的第1個—對料袋的料袋1&爲 二個一對料袋其中之一的702，lb爲二個一對料袋其中之 二的703。同樣地，將第2個二個一對料袋標記爲2a及2b， 將第50個二個~對料袋標記爲50a及5〇b。 第4圖所示之二列排出零件給料器8係在排出部的前端 具有檔止件板（圖不省略）’具有使電子零件1整列成2列 的功能。此外，2列整列的間隔係與圓盤7之二個一對料袋 的1 a與1 b的間隔相等。 使用取放單元（pick and place unit)等（圖示省略） ，將位於一列排出零件給料器8之前端部的2個電子零件j ’同時供Ια至屬於圓盤7之二個一對料袋的〗a與1 b。若供 給結束，圓盤7係藉由圓盤驅動機構3被旋轉1分割的份， 屬於接下來的料袋的5 0a與5 Ob被送至二列排出零件給料器 -10- 201132421 8之即ΐί而邰的位置。與前述同樣地，2個電子零件1被供給 至各個料袋。錯由如上所示之一連串動作，圓盤7及其圓 盤驅動機構3係爲一組，可同時搬送2個電子零件}。 在屬於使用—個一對料袋圓盤7之裝置的第*圖中，由 用以母2個供給電子零件丨的二列排出零件給料器8對圓盤7 的—個一對料袋7〇2及703供給2個電子零件1 (該供給手段 的圖不省略）。檢査單元係具備有電極單元4，在電極單 元4的前端部係設置有2組（set )例如組裝有用以與第5圖 所示之2個電子零件1 (其中一方係省略圖示）.的端子電極 101、102及103相接觸的接觸子的接觸機構（省略圖示） ’分別連接在用以檢查電子零件1之電氣特性的計測器（ 圖示省略）。電極單元4係按每個檢査項目（例如電容、 耐壓、漏電流等）作準備，被設置在電極單元上下動板5 上。若電子零件1的成對被送至電極單元4的位置（檢査位 置）’即藉由電極單元上下動板5的動作，電極單元4由脫 離位置下降而與電子零件1接觸，2個同時執行檢査。 若檢査一結束，電極單元4會上升。此外，用以根據 該檢査的結果，將2個電子零件1同時作分類的機構（圖示 省略）係被設置在由電極單元上下動板5至電子零件1的供 給位置之間。圓盤7係在對二個一對料袋7 02及703之電子 零件1的供給結束、檢査結束、分類結束的時點，藉由圓 盤驅動機構3來進行1分割的間歇搬送。該動作反覆執行。 藉由如上所示之手段’圓盤7及其圓盤驅動機構3係爲一組 ，且可將電子零件的檢査及分類同時處理2個。 -11 - 201132421 本發明之電子零件特性檢査分類裝置的控制裝置1 1係 使前述一連串動作序列統合執行。按照控制程式，發生由 端子11a〜lie對各部的控制訊號，使圓盤7以料袋對單位 的移動間距（其中，在特殊案例中供裝塡料袋單位的電子 零件之用的料袋單位的移動間距（參照第3圖））旋轉驅 動，由屬於電子零件供給手段的二列排出零件給料器8， 以料袋對單位供給電子零件。檢査手段係由具備有與檢査 項目數相對應配置在圓盤7的旋動區域而可與成對的電子 零件相對應而在接觸位置與脫離位置間移動的電極單元4 的檢査單元群所構成，使其取得各電子零件的檢査資料。 電極單元4的接觸位置與脫離位置間的移動係與圓盤的移 動同步。被配置在分類位置10的分類裝置係根據基於所取 得的檢査資料而將各自的電子零件作分類的分類結果，將 電子零件分別作分類（使電子零件掉落在位於分類位置10 的分類箱）。供分類之用的運算係在控制裝置1 1進行。分 類裝置的控制以料袋單位進行係與已知的裝置沒有不同。 接著，參照第6圖及第7圖，說明與前述不同的使用形 態。假想在二列排出零件給料器8的某些不良情形、或二 列排出零件給料器8內的電子零件1的剩餘量變少，而在二 列中的一列的前端部未被供給電子零件1的情形，而設置 若在屬於電子零件供給手段的二列排出零件給料器8的前 端部有2個電子零件、或僅可供給1個電子零件的狀態時， 檢測其是位於哪一側的零件感測器（周知的光電感測器， 未圖示）。 -12- 201132421 在應對圓盤7的二個一對料袋7 〇 2及7 0 3供給電子零件i 的時序’藉由前述感測器的檢測，而有2個電子零件1時， 係以傳送料袋702及703的2個一對份的方式使圓盤7旋轉， 將2個電子零件1同時供給至二個—對料袋7 〇 2及7 0 3。在應 對圓盤7的二個一對料袋7 〇 2及7 0 3供給電子零件1的時序， 藉由前述感測器的檢測而僅有1個電子零件1時，係以對2 個一對料袋7 0 2及7 0 3 1個1個逐個供給電子零件的方式控制 圓盤7的旋轉間距。該控制的方法係如以下所示。 第6圖係顯示以本發明之電子零件特性檢査分類裝置I 個1個逐個供給電子零件時的供給順序（A ) 、 ( b )、( C)的說明圖’用以說明當將二列排出零件給料器8的二列 設爲a、b時，關於在a列的前端部有電子零件1，在b列沒 有電子零件1的情形的控制方法的圖。 使圓盤7的料袋1 a朝a列的位置旋轉（（a )的圖）。 在該狀態下，將a列所具有的電子零件1藉由未圖示的供給 手段供給至料袋1 a。在供給結束而使圓盤7旋轉的時序時 ，藉由前述感測器的檢測訊號而在b列有電子零件1時，不 會使圓盤7旋轉而將b列的電子零件1藉由未圖示的供給手 段供給至料袋1 b ( ( B )的圖）’藉由前述感測器的檢測 訊號而在a列有電子零件1時，使圓盤7以料袋丨b位於a列前 端部的方式旋轉，將a列的電子零件1藉由未圖示的供給手 段供給至料袋1 b ( ( C )的圖）。在此，在（B )的圖中’ 若在a列亦有電子零件1時，由於在料袋1 a已經被供給有電 子零件1，因此予以忽略。此外，在（C )的圖中，當在b -13- 201132421 列亦有電子零件1時係予以忽略。 接著，第7圖係顯示以本發明之電子零件特性檢査分 類裝置1個1個逐個供給電子零件時的其他供給順序（D ) 、(E) 、（ F )的說明圖，用以說明當將二列排出零件給 料器8的二列設爲a、b時，關於在b列的前端部有電子零件 1、在a列沒有電子零件1的情形的控制方法的圖。 使圓盤7的料袋ia旋轉至b列的位置（（〇 )的圖）。 在該狀態下’將在b列所具有的電子零件1藉由未圖示的供 給手段供給至料袋1 a。在供給結束而使圓盤7旋轉的時序 時，若藉由前述感測器的檢測訊號而在b列有電子零件1時 ’係使圓盤7以料袋1 b位於b列前端部的方式旋轉，將b列 的電子零件1藉由未圖示的供給手段供給至料袋lb ( (E) 的圖）’藉由前述感測器的檢測訊號，若在a列有電子零 件1時，使圓盤7以料袋1 b位於a列前端部的方式旋轉，將a 列的電子零件1藉由未圖示的供給手段供給至料袋丨b (( F )的圖）。在此，在（E )的圖中’若在a列亦有電子零件 1時’由於在料袋1 a已經被供給有電子零件1，因此予以忽 略。此外，在（F )的圖中’當在b列亦有電子零件1時係 予以忽略。 如以上說明所示’藉由控制圓盤7的旋轉，圓盤7及其 圓盤驅動機構3係爲一組，可同時處理2個電子零件的檢査 及分類。若爲未進行如上所示之控制，而單純地按每1分 割間歇傳送圓盤7的方法，若在&列或b列僅有1個電子零件 時’在圓盤7內的料袋，電子零件形成缺漏狀態，裝置的 -14 - 201132421 處理能力會降低。 以上針對電子零件2個同時並列處理詳加說明，但是 該原理亦同樣可適用在並列3個以上來進行處理時，如上 所示之變形亦屬於本發明之技術範圍內。 【圖式簡單說明】 第1圖係顯示習知技術中將電子零件1個1個逐個的處 理爲前提的典型設計所得之電子零件特性檢査分類裝置（ 比較對象裝置）的配置圖。 第2圖係顯示具有作50分割之料袋的圓盤作爲第丨圖之 裝置的搬送用圓盤的具體例的平面圖。 第3圖係顯示在本發明之電子零件特性檢査分類裝置 中所使用的圓盤的具體例的局部放大平面圖，顯示可同時 搬送、檢査2個電子零件的圓盤中的料袋的組合的圖。 第4圖係顯示本發明之電子零件特性檢査分類裝置的 構成圖。 第5圖係用以說明收納在圓盤之料袋的電子零件的姿 勢的斜視圖。 第ό圖係顯示以本發明之電子零件特性檢査分類裝置1 個1個逐個供給電子零件時的供給順序（A ) 、 （ β )、（ C )的說明圖。 第7圖係顯示以本發明之電子零件特性檢査分類裝置1 個1個逐個供給電子零件時的其他供給順序（D ) 、 （ e ) 、（F )的說明圖。 -15 - 201132421 【主要元件符號說明】 1 :電子零件 2 :圓盤 3 :圓盤驅動機構 4:檢査單元的電極單元 5:電極單元上下動板 6 :電子零件供給手段（一列排出零件給料器） 7:圓盤（二個一對料袋圓盤） 8 :電子零件供給手段（二列排出零件給料器） 1 〇 :分類位置 Π :控制裝置 1 1 a~ lie ：端子 1 0 1 :端子電極1 1 0 2 :端子電極2 1 0 3 :端子電極3 201、701 :等分割中心線 202 ' 203 ：料袋 702 :二個一對料袋其中之1 703:二個一對料袋其中之2 -16-201132421 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to an electronic component characteristic inspection and classification device for transporting, inspecting, and classifying a plurality of electronic components in parallel. More specifically, it is possible to temporarily supply a plurality of electronic components in one rotating disk for transport, and to inspect the electrical characteristics of the electronic components sequentially transported by the disk, and to perform the inspection based on the result of the above-described inspection. Electronic component characteristic inspection and classification device for classification of electronic components. [Prior Art] In the conventional device for inspecting and classifying the electrical characteristics of electronic components, a method is generally used in which one electronic component is supplied one by one and transported to a disk that accommodates the electronic component and rotated. Each of them is inspected one by one (Patent Document 1). [Prior Art] [Patent Document 1] [Patent Document 1] JP-A-2002-043194 SUMMARY OF INVENTION [Problem to be Solved by the Invention] An electronic component for attenuating or blocking noise of an electronic device is used. In other words, the demand for composite components such as 3-terminal capacitors or LC filters is rapidly increasing. In the past, the means for inspecting the electrical characteristics of the electronic components and classifying them is generally used as one of the means for supplying the electronic components and rotating them one by one, and the electronic components are supplied to the inspection electrodes one by one. In the relationship of inspection, it is strongly required to prepare for the above-mentioned parallel processing in order to increase the amount of processing. This is only an enlargement of the scale of the apparatus for preparing a complex array complex mechanism, and the main object of the invention is to provide a structure for preserving a conventional structure, an apparatus for suppressing an increase in the number of hardenings, and an apparatus for increasing the throughput. Another specific object of the present invention is to provide a disk capable of supplying electricity to a rotating disk for carrying out an electronic component characteristic inspection and sorting device. (Means for Solving the Problem) In order to achieve the above object, the electronic component according to the present invention is configured to sequentially supply an electronic component to a circular transfer that performs rotation, and is inspected by an inspection unit, and the electronic component characteristic inspection and classification device is classified according to the above-described components. a disc having a bag group for holding and transporting electronic parts in a bag form; rotating the disk in units of bags; and supplying an electron supply means to the group of bags in units of bags; The aforementioned electronic parts are improved in speed. The disc makes it rotate and the disc or the drives are burdened. The basic sub-component characteristics of the inspection method are checked. The sub-parts are simultaneously juxtaposed, inspected, and classified. The inspection is performed on the classification and loading, so that the inspection results are electronic, and the characteristics are the disc drive parts that contain the bit or the bag to the unit. Electronic parts • 6 - 201132421 The number of inspection items is placed in the rotation area of the disk, and is composed of an inspection unit group including electrode units corresponding to the pair of electronic components, and the inspection data of each electronic component is acquired. a means for classifying the electronic components according to the classification result obtained by classifying the electronic components according to the obtained inspection data, classifying the electronic components into the swirling region of the disk; and supplying two electrons to the disk simultaneously The parts are driven in an inspectable manner, and the inspection data is acquired by the above-described inspection means, and the classification means is classified according to the classification of the inspection results. The electronic component characteristic inspection and classification device according to claim 2 of the present invention is characterized in that, in the electronic component characteristic inspection and classification device according to claim 1, the inspection means can simultaneously check each of the contents of the electrical characteristics to be inspected. In the electronic component, the sorting device classifies the two electronic components according to the respective classifications based on the inspection results. The electronic component characteristic inspection and classification device according to the invention of claim 1, wherein the electronic component supply device includes a component sensor that detects a supplyable state of the electronic component. The disk drive mechanism is further provided with a mechanism for rotationally driving the disk in a bag unit, and the control device controls the rotation of the disk of the first 201132421 based on the output of the component sensor, thereby using the bag. Supply electronic parts to units or bag units. According to the present invention, it is possible to provide an electronic component characteristic inspection and classification device which supplies an electronic component and stores the electronic component in a rotating disk 'for electronic components that are sequentially conveyed by the disk Inspection of electrical characteristics 'A device for classifying electronic components based on the results of the above-mentioned inspection, a disk and a disk drive mechanism thereof, which can be transported by feeding two electronic components to the disk at the same time. The effect of the parallel processing can be processed at a speed. [Embodiment] Before describing the present invention, a comparative object device will be described with reference to Figs. 1 and 2 . This comparison target device uses a disk for transporting one electronic component, and one system is inspected one by one. Fig. 1 is a view showing the arrangement of an electronic component characteristic inspection and sorting device obtained by a typical design in which one electronic processing is performed one by one in the prior art. Fig. 2 is a plan view showing a specific example of a disk having a 50-part pocket (p0Cket) as a transporting disk of the apparatus of Fig. 1. As shown in Fig. 2, the disc 2 has 50 pockets 202 for accommodating electronic components, and the pockets 202 are arranged on a disc which divides the disc 2 into 50-divided center lines 20 1 . The outer perimeter of 2. In the first drawing belonging to the apparatus using the disk 2, it is subordinate to a row of the discharge part feeder 6 for one electron supply unit 1 to supply one-piece electronic parts 1 one by one, and one electronic component i It is supplied to the pocket 202 of the disc 2. The illustration of the receiving device is omitted, and for example, a general receiving device such as a pick-and-place device is used. A measuring device (not shown) is connected to the distal end portion of the electrode unit 4 of the inspection unit, for example, for inspecting the terminal electrodes 101 and 1 2 provided with the electronic component 1 shown in FIG. And the electrical characteristics of the electronic component 1 of the contact mechanism (not shown) of the contact contact with 103. The electrode unit 4 is provided on the upper and lower movable plates 5 of the electrode unit for each inspection item (e.g., capacitance, withstand voltage, leakage current, etc.). When the electronic component 1 is sent to the position of the electrode unit 4, the electrode unit 4 is lowered by the action of the electrode unit up and down the movable plate 5 to perform inspection. When the inspection is completed, the electrode unit 4 rises. Further, a mechanism (not shown) for classifying the electronic component 1 based on the result of the inspection is provided between the upper and lower movable plates 5 of the electrode unit to the supply position of the electronic component 1. The disk 2 is intermittently conveyed by the disk drive mechanism 3 at the time when the supply of the electronic component 1 of the material bag 203 is completed, the inspection is completed, and the classification is completed. This action is executed repeatedly. Fig. 5 is a view showing the posture of the electronic component 1 housed in the pockets 202 and 203 of the disk 2. In the case of an electronic component 1, the terminal electrodes 1, 2, and 3 of the 3-terminal capacitor are shown (corresponding to the component symbols 101, 102, and 103). (a) of Fig. 5 shows a case where the electronic component 1 is placed in the pocket 202 of the disk 2 in the posture state of the illustrated electronic component 1, and (b) of Fig. 5 is shown in the illustrated electronic component 1. In the posture state, it is directly accommodated in the bag 2 0 3 of the disk 2. Among them, this configuration is also employed in the electronic component characteristic inspection and classification device of the present invention. The electronic component characteristic inspection of the present invention -9 - 201132421 The classification device has a basic structure which is mostly used in conventional devices. Next, an embodiment of the electronic component characteristic inspection and classification device of the present invention will be described. The apparatus of the present invention will be described with reference to Figs. 3 and 4. Fig. 3 is a partially enlarged plan view showing a specific example of a disk used in the electronic component characteristic inspection and classification device of the present invention, showing a combination of pockets in a disk which can simultaneously convey and inspect two electronic components, and enlarged display. Figure 4 is a view of the pocket portion of the disc 7 having two pairs of pockets. As shown in Fig. 3, in the electronic component characteristic inspection and classification device of the present invention, two material 'bags are arranged for dividing the equally divided center lines 70 which are divided by the disk 7 by 50 or the like in parallel and at equal intervals. The electronic component 1 is housed in the outer peripheral portion of the disk 7, and the bag is a pair. That is, the first bag of the 50-division-to-bee bag 1& is one of the two pair of bags 702, lb is 703 of two of the pair of bags. Similarly, the second two pairs of pockets are labeled 2a and 2b, and the 50th pair of pockets are labeled 50a and 5〇b. The two-row discharge part feeder 8 shown in Fig. 4 has a stopper plate (not shown) at the tip end of the discharge portion, and has a function of arranging the electronic components 1 in two rows. Further, the interval between the two columns is equal to the interval between 1 a and 1 b of the two pairs of pockets of the disk 7. Using a pick and place unit or the like (not shown), the two electronic parts j' located at the front end of the one-row discharge part feeder 8 are simultaneously supplied with Ια to two pairs of pockets belonging to the disc 7. 〗 〖a and 1 b. When the supply is completed, the disk 7 is rotated by one portion by the disk drive mechanism 3, and the 50a and 5ob belonging to the next bag are sent to the two-row discharge part feeder -10- 201132421 8 Ϊ́ί邰's location. In the same manner as described above, two electronic components 1 are supplied to the respective pockets. The error is caused by a series of actions as shown above, and the disk 7 and its disk drive mechanism 3 are grouped together, and two electronic parts can be transferred at the same time}. In the figure * which belongs to the apparatus which uses a pair of bag discs 7, a pair of pockets 7 of the disc 7 are discharged from the two rows of the parts for feeding the two electronic parts of the mother. 〇2 and 703 supply two electronic components 1 (the drawing of the supply means is not omitted). The inspection unit includes the electrode unit 4, and two sets (sets) are provided at the front end portion of the electrode unit 4, for example, for assembly and two electronic components 1 shown in Fig. 5 (one of which is omitted from illustration). The contact means (not shown) of the contacts in which the terminal electrodes 101, 102, and 103 are in contact with each other are connected to a measuring device (not shown) for inspecting the electrical characteristics of the electronic component 1. The electrode unit 4 is prepared for each inspection item (e.g., capacitance, withstand voltage, leakage current, etc.) and is disposed on the electrode unit up/down plate 5. When the pair of electronic components 1 are sent to the position (inspection position) of the electrode unit 4, that is, by the action of the electrode unit moving up and down the plate 5, the electrode unit 4 is lowered from the disengaged position and comes into contact with the electronic component 1, and two are simultaneously executed. an examination. If the inspection is completed, the electrode unit 4 will rise. Further, a mechanism (not shown) for simultaneously classifying the two electronic components 1 based on the result of the inspection is provided between the electrode unit up/down plate 5 and the supply position of the electronic component 1. The disk 7 is intermittently conveyed by the disk drive mechanism 3 at the time when the supply of the electronic components 1 of the pair of pockets 702 and 703 is completed, the inspection is completed, and the classification is completed. This action is repeated. The disc 7 and its disk drive mechanism 3 are grouped by the means as described above, and the inspection and classification of the electronic components can be simultaneously processed by two. -11 - 201132421 The control device 1 1 of the electronic component characteristic inspection and classification device of the present invention integrates the above-described series of operation sequences. According to the control program, the control signals of the respective parts by the terminals 11a to lie are generated, so that the disc 7 is moved by the pocket to the unit (wherein, in a special case, the unit for supplying the electronic parts of the pocket unit) The moving pitch (refer to FIG. 3) is rotationally driven, and the two-part discharge part feeder 8 belonging to the electronic component supply means supplies the electronic parts in units of the material bags. The inspection means is constituted by an inspection unit group including the electrode unit 4 which is disposed in the rotation region of the disk 7 in correspondence with the number of inspection items and which is movable between the contact position and the release position in correspondence with the pair of electronic components. To obtain inspection data for each electronic component. The movement between the contact position and the disengagement position of the electrode unit 4 is synchronized with the movement of the disk. The sorting device disposed at the sorting position 10 classifies the electronic components according to the classification result of classifying the respective electronic components based on the acquired inspection data (the electronic components are dropped in the sorting box at the sorting position 10) . The calculation for classification is performed by the control device 11. The control of the sorting device is performed in a bag unit and is not different from known devices. Next, a different use form from the above will be described with reference to Figs. 6 and 7. It is assumed that there are some disadvantages in the two-row discharge part feeder 8, or that the remaining amount of the electronic parts 1 in the two-row discharge part feeder 8 becomes small, and the front end portion of one of the two columns is not supplied with the electronic component 1. In the case where two electronic components are provided at the front end portion of the two-row discharge component feeder 8 belonging to the electronic component supply means, or only one electronic component can be supplied, the sense of the component on which side is located is detected. Detector (known optical detector, not shown). -12- 201132421 The timing of supplying the electronic parts i to the two pairs of pockets 7 〇 2 and 703 of the disc 7 is detected by the aforementioned sensor, and when there are two electronic parts 1, The disk 7 is rotated by transferring two pairs of the bags 702 and 703, and the two electronic components 1 are simultaneously supplied to the two-feed pockets 7 〇 2 and 703. When the electronic component 1 is supplied to the two pair of pockets 7 〇 2 and 703 of the disk 7, when there is only one electronic component 1 by the detection of the sensor, two pairs are used. The rotation pitch of the disk 7 is controlled in such a manner that the material bags 7 0 2 and 7 0 3 1 are supplied one by one. The method of this control is as follows. Fig. 6 is a view showing the supply sequence (A), (b), and (C) when the electronic component characteristic inspection and classification device of the present invention is supplied one by one to supply electronic components one by one to explain when the two columns are discharged. When the two rows of the parts feeder 8 are a and b, the control method of the case where the electronic component 1 is provided in the front-end part of a row, and the electronic component 1 is not shown in the b-row. The bag 1a of the disk 7 is rotated toward the position of the a column (Fig. (a)). In this state, the electronic component 1 included in the column a is supplied to the bag 1a by a supply means (not shown). When the supply is completed and the disk 7 is rotated, when the electronic component 1 is listed in the b row by the detection signal of the sensor, the disk 7 is not rotated, and the electronic component 1 of the column b is not The supply means shown in the figure is supplied to the bag 1 b (the view of (B)). When the electronic component 1 is listed in a by the detection signal of the sensor, the disk 7 is placed in the column a in the bag b The tip end portion is rotated, and the electronic component 1 in the row a is supplied to the bag 1 b (Fig. (C)) by a supply means (not shown). Here, in the figure of (B), when the electronic component 1 is also present in the column a, since the electronic component 1 is already supplied to the bag 1a, it is ignored. In addition, in the figure of (C), when there is an electronic part 1 in the column b-13-201132421, it is ignored. Next, Fig. 7 is an explanatory view showing other supply orders (D), (E), and (F) when one electronic component inspection and sorting device of the present invention is supplied one by one, for explaining that When the two rows of the two-row discharge part feeder 8 are a and b, the control method of the case where the electronic component 1 is provided in the front-end part of the b-column, and the electronic component 1 is not in the a row is shown. The pocket ia of the disk 7 is rotated to the position of the column b (the diagram of (〇)). In this state, the electronic component 1 included in the column b is supplied to the bag 1a by a supply means (not shown). When the supply is completed and the disk 7 is rotated, if the electronic component 1 is listed in the b column by the detection signal of the sensor, the disk 7 is placed in the front end of the b row. Rotating, the electronic component 1 of the column b is supplied to the bag lb (Fig. (E) by a supply means (not shown).] By the detection signal of the sensor, if the electronic component 1 is listed in a, The disk 7 is rotated such that the pocket 1 b is located at the front end portion of the row a, and the electronic component 1 of the row a is supplied to the pocket 丨 b (Fig. F) by a supply means (not shown). Here, in the diagram of (E), 'when the electronic component 1 is also present in the column a', since the electronic component 1 is already supplied to the pocket 1a, it is omitted. In addition, in the figure of (F) 'When there is also an electronic part 1 in column b, it is ignored. As shown in the above description, by controlling the rotation of the disk 7, the disk 7 and its disk drive mechanism 3 are grouped, and the inspection and classification of two electronic components can be simultaneously processed. In the case where the control as described above is not performed, the disc 7 is intermittently transported by one division, and if there is only one electronic component in the & column or column b, the pocket in the disc 7 is The electronic components form a leaky state, and the processing capacity of the device -14324324 will be reduced. The above description of the simultaneous parallel processing of the electronic components is described in detail, but the same principle is also applicable to the case where three or more of the electronic components are processed in parallel, and the above-described variations are also within the technical scope of the present invention. [Brief Description of the Drawings] Fig. 1 is a layout view showing an electronic component characteristic inspection and classification device (comparison target device) obtained by a typical design in which one electronic component is processed one by one in the prior art. Fig. 2 is a plan view showing a specific example of a transfer disk having a disk having a 50-divided bag as a device of the first drawing. Fig. 3 is a partially enlarged plan view showing a specific example of a disk used in the electronic component characteristic inspection and classification device of the present invention, showing a combination of pockets in a disk which can simultaneously convey and inspect two electronic components. . Fig. 4 is a view showing the configuration of an electronic component characteristic inspection and classification device of the present invention. Fig. 5 is a perspective view for explaining the posture of an electronic component housed in a bag of a disk. The figure is an explanatory view showing the supply sequences (A), (β), and (C) when one electronic component is supplied one by one in the electronic component characteristic inspection and classification device of the present invention. Fig. 7 is an explanatory view showing other supply orders (D), (e), and (F) when the electronic component characteristic inspection and classification device of the present invention supplies electronic components one by one. -15 - 201132421 [Explanation of main component symbols] 1 : Electronic component 2 : Disc 3 : Disc drive mechanism 4 : Electrode unit of inspection unit 5 : Electrode unit up and down plate 6 : Electronic component supply means (one row of discharge parts feeder 7: Disc (two pairs of bag discs) 8 : Electronic parts supply means (two rows of discharge parts feeder) 1 〇: Classification position Π : Control device 1 1 a~ lie : Terminal 1 0 1 : Terminal Electrode 1 1 0 2 : terminal electrode 2 1 0 3 : terminal electrode 3 201, 701 : equal split center line 202 ' 203 : material bag 702 : two pairs of pockets 1 703: two pairs of pockets Of 2 -16-