CN105983543B - Electronic components test sorting device - Google Patents
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- CN105983543B CN105983543B CN201510058096.1A CN201510058096A CN105983543B CN 105983543 B CN105983543 B CN 105983543B CN 201510058096 A CN201510058096 A CN 201510058096A CN 105983543 B CN105983543 B CN 105983543B
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Abstract
The present invention provides a kind of electronic components test sorting device, there is feeding device, material collecting device, test device and conveying device, the feeding device accommodates the measured electronic elements of a plurality of electrical contacts upward, material collecting device accommodates a plurality of different grades of complete survey electronic components, test device is set to the top of test section, to execute test jobs to the electronic component of electrical contact upward, the conveying device is equipped with an at least pan feeding transporting arms, at least one discharging transporting arms and at least one test transporting arms, the electronic component of electrical contact at feeding device upward is transferred load to the test transporting arms positioned at the first exchange area from top by the pan feeding transporting arms system, the test transporting arms then carry electronic component from lower section and transfer load to test section, electronic component is electrically connected in a manner of upward with test device by electrical contact and executes test jobs, again will after complete survey Electronic component transfers load to the second exchange area, electronic component is transferred load to material collecting device from top by discharging transporting arms, and execute sorting operations.
Description
Technical field
The present invention relates to a kind of in the way of the transfer upward of electronic component electrical contact and test, with effective simplified conveying
Path, and reach the electronic components test sorting device that equipment cost is effectively reduced and promotes tested productivity.
Background technique
It presses, science and technology must could be completed in continuous research and development under innovation by many electronic circuit combinations in the past now
Work it is completely replaced by integrated circuit (integrated circuit, abbreviation IC), since IC is in process of production
By the processing program of multiple tracks, therefore in order to ensure product quality, dealer will do it circuit test work after IC completes
Industry, to detect IC in manufacturing process, if suffer damage, and then detect defective products.
Referring to Fig. 1, it is that No. 468329 electronic components of TaiWan, China invention I that the applicant had previously applied pick up material
Unit and its test equipment Patent Case of application, test equipment are lain on board 10 configured with feeding device 11, material collecting device
12, test device 13 and conveying device 14, the feeding device 11 accommodate a plurality of electrical contacts measured electronic elements directed downwardly, receive
Material device 12 accommodates a plurality of different grades of complete survey electronic components, and test device 13 is set to the lower section of test section, to electrical property
Contact electronic component directed downwardly executes test jobs, which is equipped with the pan feeding that one can make the axial movement of X-Y-Z tri- and moves
Load arm 141 and discharging transporting arms 142, respectively at the measured electronic elements of top transfer feeding device 11 and by complete survey electronics
Element transfers load to material collecting device 12 and classifies, separately in two sorrowful first for being respectively equipped with Y-Z bis- and moving axially of test device 13
Hold 143 and the second hold 144 measured electronic elements are moved into test device 13 respectively, and push execution test and make
Industry, in order to make electrical contact measured electronic elements directed downwardly in pan feeding transporting arms 141 that can hand to the first hold 143 or the second
Hold 144 moves into test device 13, and conveying device 14 is additionally provided with the first pan feeding microscope carrier 145 and the second pan feeding microscope carrier 146, and
After being placed in measured electronic elements from top for pan feeding transporting arms 141, the first pan feeding microscope carrier 145 and the second pan feeding microscope carrier 146 divide again
The side of the first hold 143 and the second hold 144, the first hold 143 and the second hold are not moved to as X axis
144 then make the axial movement of Y-Z bis- respectively, and can respectively will be on the first pan feeding microscope carrier 145 and the second pan feeding microscope carrier 146 from top
Measured electronic elements take out and move into test device 13 push execute test jobs；Separately in order to make the first hold 143 and
Electrical contact complete survey electronic component directed downwardly can hand to discharging transporting arms 142 and transfer load to material collecting device on second hold 144
12 classify, and conveying device 14 is additionally provided with the first discharging microscope carrier 147 and the second discharging microscope carrier 148, and in the first discharging microscope carrier
147 and second discharging microscope carrier 148 respectively behind the side that X axis is moved to the first hold 143 and the second hold 144, supply
First hold 143 and the second hold 144 have been placed in survey electronic component, the first discharging microscope carrier 147 and the second discharging from top
Microscope carrier 148 makees X axis movement respectively again, so that discharging transporting arms 142 carry the first discharging microscope carrier 147 and the second discharging from top
Complete survey electronic component on platform 148 transfers load to material collecting device 12 and classifies.The design is due under pan feeding transporting arms 141, first
Pressure arm 143, the second hold 144 and discharging transporting arms 142 are all transfer electronic component to be drawn from top, therefore work as pan feeding transfer
When measured electronic elements on arm 141 will hand to the first hold 143 or the second hold 144 immigration test device 13, or
Person be the complete survey electronic component on the first hold 143 or the second hold 144 to hand to discharging transporting arms 142 transfer load to receipts
When expecting device 12, it is necessary to by the first pan feeding microscope carrier 145 and the second pan feeding microscope carrier 146 or the first discharging microscope carrier 147 and
Second discharging microscope carrier 148 provides transfer effect, could make the exchange transfer of electronic component；However, due to the conveying device
14 must be provided with the first pan feeding microscope carrier 145, the second pan feeding microscope carrier 146, first discharging microscope carrier 147 and the second discharging microscope carrier 148, because
There is following problem in this:
1. mechanism and transport path are complex: the input unit 14 can make the first of X axis movement due to must be provided with
Pan feeding microscope carrier 145, the second pan feeding microscope carrier 146, first discharging microscope carrier 147 and the second discharging microscope carrier 148, therefore not only mechanism is more
Complexity, and must be discharged by the first pan feeding microscope carrier 145, the second pan feeding microscope carrier 146, first microscope carrier 147 and the second discharging microscope carrier
148 make the mobile transfer of X axis, and increase the complexity of transport path, and influence the cost of equipment.
2. the number and the time that exchange transfer are more: the pan feeding transporting arms 141 of the input unit 14 are due to that must pass through the
The transfer of one pan feeding microscope carrier 145 and the second pan feeding microscope carrier 146, measured electronic elements could be handed to the first hold 143 or
Second hold 144 moves into test device 13 and the first hold 143 and the second hold 144 must be by the first discharging
Complete survey electronic component could be handed to discharging transporting arms 142 and transfer load to receipts by the transfer of microscope carrier 147 or the second discharging microscope carrier 148
Expect device 12, therefore the number for not only exchanging transfer is more, and causes the overlong time of exchange transfer, and influences the production of test
Energy.
Summary of the invention
In view of this, the present inventor with its research and development engaged in relevant industries for many years and makes experience then, for current institute face
The problem of facing further investigation, research by long-term endeavour with study, research and create eventually it is a kind of not only can effectively reduce equipment at
This, and can effectively promote the testing classification equipment of tested productivity, and the shortcomings that be effectively improved background technique, this is of the invention
Design aim.
To achieve the above object, the technical solution adopted by the present invention is that:
A kind of electronic components test sorting device, which is characterized in that include:
Board: test section, the first exchange area and the second exchange area are equipped with；
Feeding device: it is set on the board, accommodates the measured electronic elements of a plurality of electrical contacts upward；
Material collecting device: being set on the board, accommodates a plurality of different grades of complete survey electronic components；
Test device: it is set up in the top of the test section of the board, and is equipped with test board and probe, to electrical contact court
On electronic component execute test jobs；
Conveying device: being set on the board, which is equipped with an at least pan feeding transporting arms, at least one discharging transporting arms
And at least one test transporting arms, the pan feeding transporting arms from the top at the feeding device by electrical contact upward electronics to be measured member
Part transfers load to first exchange area, which is displaced into the first exchange area, test section and the second exchange area of the board
Between, which carries measured electronic elements, and the side by the measured electronic elements with electrical contact upward from lower section
Formula executes test jobs, which transfers load to the material collecting device for the complete survey electronic component and execute sorting operations.
The electronic components test sorting device, the pan feeding transporting arms of the conveying device, which are equipped at least one first and pick and place, inhales
Mouth, the pan feeding transporting arms simultaneously make the axial movement of X-Y-Z tri-, which are transferred load to first exchange area.
The electronic components test sorting device, the discharging transporting arms of the conveying device, which are equipped at least one second and pick and place, inhales
Mouth, the discharging transporting arms simultaneously make the axial movement of X-Y-Z tri-, transfer load to the complete survey electronic component from the top of second exchange area
The material collecting device.
The electronic components test sorting device, the conveying device are equipped with the first test transporting arms and the second test transfer
Arm, the first test transporting arms and the second test transporting arms are respectively equipped at least one pick-and-place suction nozzle or hold seat, and move respectively
Between first exchange area, the test section and second exchange area.
The electronic components test sorting device, the first exchange area and the second exchange area of the board are respectively arranged on the survey
It tries below the first side-lower and the second side in area, third friendship is respectively equipped with above the first upper side and second side of the test section
Change area and the 4th exchange area.
The electronic components test sorting device, the conveying device are equipped with the first test transporting arms and the second test transfer
Arm, the first test transporting arms are displaced between first exchange area, the test section and second exchange area, which moves
Load arm is then displaced between the third exchange area, the test section and the 4th exchange area.
The electronic components test sorting device, the pan feeding transporting arms by the measured electronic elements transfer load to respectively this
One exchange area and the third exchange area.
The electronic components test sorting device, the discharging transporting arms are exchanged from second exchange area and the 4th respectively
The top transfer in the area complete survey electronic component.
The electronic components test sorting device, the board is equipped with blank panel device, the blank panel device and to move disk device
Transfer empty tray.
The electronic components test sorting device, the board are equipped with alignment device, which is equipped with a plurality of
Accommodating hole is equipped with pusher shoe in the side of each accommodating hole, for the measured electronic elements contraposition in the pan feeding transporting arms.
Compared with prior art, the invention has the advantages that:
The present invention provides a kind of electronic components test sorting device, is from top using pan feeding transporting arms by feeding device
The electronic component exchange of place's electrical contact upward transfers load to the test transporting arms positioned at the first exchange area, and the test transporting arms are under
Side's carrying electronic component simultaneously transfers load to test section, by electronic component by electrical contact upward in a manner of be set to above test section
Test device is electrically connected and executes test jobs, and electronic component is transferred load to the second exchange area again after complete survey, is moved by discharging
Electronic component exchange is transferred load to material collecting device from top by load arm, and executes sorting operations；In this way, being electrically connected with using electronic component
The mode of point transfer upward and test can be not necessary to setting and provide the pan feeding microscope carrier and discharging microscope carrier of effect of transferring to, and then can have
Effect simplifies the internal structure of an organization and transport path, reaches the Practical Benefit that equipment cost is effectively reduced.
The present invention provides a kind of electronic components test sorting device, is from top using pan feeding transporting arms by feeding device
The electronic component of place's electrical contact upward transfers load to the test transporting arms positioned at the first exchange area, which holds from lower section
Carry electronic component and simultaneously transfer load to test section, by electronic component by electrical contact upward in a manner of with the test that is set to above test section
Device is electrically connected and executes test jobs, and electronic component is transferred load to the second exchange area again after complete survey, by discharging transporting arms
Electronic component exchange is transferred load into material collecting device from top, and executes sorting operations；In this way, utilizing electronic component electrical contact court
The mode of upper transfer and test can be not necessary to provide the effect of transferring to by pan feeding microscope carrier and discharging microscope carrier, and then can effectively letter
Change the number of exchange transfer and the time of reduction exchange transfer, reaches the Practical Benefit for effectively promoting tested productivity.
Detailed description of the invention
Fig. 1 is the schematic diagram of the test equipment of TaiWan, China invention No. 468329 Patent Cases of I；
Fig. 2 is the configuration diagram of first embodiment of the invention；
Fig. 3 is the illustrative view (one) of first embodiment of the invention；
Fig. 4 is the illustrative view (two) of first embodiment of the invention；
Fig. 5 is the part schematic side view of Fig. 4；
Fig. 6 is the illustrative view (three) of first embodiment of the invention；
Fig. 7 is the part schematic side view of Fig. 6；
Fig. 8 is the illustrative view (four) of first embodiment of the invention；
Fig. 9 is the part schematic side view of Fig. 8；
Figure 10 is the illustrative view (five) of first embodiment of the invention；
Figure 11 is the part schematic side view of Figure 10；
Figure 12 is the illustrative view (six) of first embodiment of the invention；
Figure 13 is the configuration diagram of second embodiment of the invention；
Figure 14 is the illustrative view (one) of second embodiment of the invention；
Figure 15 is the illustrative view (two) of second embodiment of the invention；
Figure 16 is the part schematic side view of Figure 15；
Figure 17 is the illustrative view (three) of second embodiment of the invention；
Figure 18 is the part schematic side view of Figure 17；
Figure 19 is the illustrative view (four) of second embodiment of the invention；
Figure 20 is the part schematic side view of Figure 19；
Figure 21 is the illustrative view (five) of second embodiment of the invention；
Figure 22 is the part schematic side view of Figure 21；
Figure 23 is the illustrative view (six) of second embodiment of the invention；
Figure 24 is the illustrative view (seven) of second embodiment of the invention；
Figure 25 is the part schematic side view of Figure 24.
Description of symbols: [existing part] 10- board；11- feeding device；12- material collecting device；13- test device；
14- conveying device；141- pan feeding transporting arms；142- discharging transporting arms；The first hold of 143-；The second hold of 144-；145-
First pan feeding microscope carrier；146- the second pan feeding microscope carrier；The discharging microscope carrier of 147- first；The discharging microscope carrier of 148- second；[part of the present invention]
20- board；21- feeding device；22- material collecting device；23- test device；231- test board；232- probe；24- blank panel device；
241- moves disk device；25- conveying device；251- pan feeding transporting arms；2511- first picks and places suction nozzle；252- discharging transporting arms；2521-
Second picks and places suction nozzle；253- first tests transporting arms；2531- first holds seat；254- second tests transporting arms；2541- second is held
Seat；26- alignment device；261- accommodating hole；262- pusher shoe；The test section 30-；The first exchange area 31-；The second exchange area 32-；
33- third exchange area；The 4th exchange area 34-；40- electronic component.
Specific embodiment
To make your juror make further understanding to the present invention, hereby lifts preferred embodiment and simultaneously cooperate schema, be described in detail
As after:
Referring to Fig. 2, the testing classification equipment of first embodiment of the invention, lies on board 20 configured with feeding device
21, material collecting device 22, test device 23, blank panel device 24, conveying device 25 and alignment device 26, separately with regional space for,
The board 20 is equipped with test section 30, positioned at the first exchange area 31 of 30 first side of test section, and is located at 30 second side of test section
The second exchange area 32, which accommodates the measured electronic elements of a plurality of electrical contacts upward, and material collecting device 22 holds
Receive a plurality of different grades of complete survey electronic components, 23 system of test device is set up in the top of the test section 30 of board 20, mainly
Equipped with test board 231 and plurality of probes 232, to execute test jobs, blank panel dress to the electronic component of electrical contact upward
It sets 24 systems and the empty tray on feeding device 21 is transferred load into blank panel dress for storing a plurality of empty trays, and using disk device 241 is moved
24 storages are set, or the empty tray on blank panel device 24 is transferred load into material collecting device 22, which is equipped with an at least pan feeding
Transporting arms 251, at least one discharging transporting arms 252 and at least one test transporting arms, in this present embodiment, which is equipped with
First test transporting arms 253 and the second test transporting arms 254, the pan feeding transporting arms 251 are equipped at least one first and pick and place suction nozzle
2511, and the axial movement of X-Y-Z tri- can be made from top, by the measured electronic elements transfer of electrical contact at feeding device 21 upward
To being located at the first exchange area 31 of 30 first side of test section, the first test transporting arms 253 and the second test transporting arms 254 are divided
Not She You at least one pick-and-place suction nozzle or hold seat, in this present embodiment, the first test transporting arms 253 and the second test transporting arms
254, which are respectively equipped at least 1 first, holds seat 2531 and second holds seat 2541, the first test transporting arms 253 and the second test transfer
Arm 254 can respectively from lower section carry electronic component, and make X-Y-Z tri- axial movement in the first exchange area 31, test section 30 and
Positioned at second exchange area 32 of 30 second side of test section, and from lower section, carrying comes from pan feeding transporting arms in 31 position of the first exchange area
251 measured electronic elements, and measured electronic elements are transferred load into test section 30, make measured electronic elements with electrical contact upward
Mode and the probe 232 of test device 23 be electrically connected and execute test jobs, after completing test and surveying, then by complete survey electronics
Element transfers load at the second exchange area 32, which is equipped at least one second and picks and places suction nozzle 2521, and can be from top
Make the axial movement of X-Y-Z tri-, the complete survey electronic component in the first test transporting arms 253 or the second test transporting arms 254 is exchanged
Material collecting device 22 is transferred load to, and executes sorting operations；Separately since be possible to can not for the measured electronic elements at feeding device 21
Accurate bearing makes the first of pan feeding transporting arms 251 to pick and place suction nozzle 2511 and is drawing electronics member to be measured on the position in charging tray
When part, which can not be accurately positioned on the first pick-and-place suction nozzle 2511, therefore in can be equipped on board 20
One alignment device 26, which is equipped with a plurality of accommodating holes 261, and is equipped with pusher shoe in the side of each accommodating hole 261
262, it, can be first by the measured electronic elements transfer after which draws measured electronic elements at feeding device 21
To the accommodating hole 261 of alignment device 26, and suction nozzle 2511 is picked and placed with first and is kept in the state of adsorbing measured electronic elements, by
The unilateral pushing tow measured electronic elements of each pusher shoe 262, move against each measured electronic elements in the another of each accommodating hole 261
Side, and pick and place each measured electronic elements accurate contraposition on suction nozzle 2511 in first, it is further continued for be aligned by pan feeding transporting arms 251
Measured electronic elements afterwards transfer load at the first exchange area 31, can accurately carry out subsequent test jobs.
Referring to Fig. 3, testing classification equipment of the invention its when starting actuation, the first test transporting arms 253 and second
Test transporting arms 254 are located at the first exchange area 31 and the second exchange area 32, and pan feeding transporting arms 251 are then in feeding device 21
The measured electronic elements 40 of electrical contact upward are drawn from top in place.
Fig. 4, Fig. 5 are please referred to, then pan feeding transporting arms 251 transfer load to the measured electronic elements 40 of electrical contact upward pair
At the accommodating hole 261 of position device 26, and to keep in the state of adsorbing measured electronic elements, by the unilateral pushing tow of each pusher shoe 262
Measured electronic elements 40 move against each measured electronic elements 40 in the other side of each accommodating hole 261, and make each electronics to be measured
40 accurate contraposition of element picks and places on suction nozzle 2511 in the first of pan feeding transporting arms 251.
Fig. 5, Fig. 6 are please referred to, then the measured electronic elements 40 of electrical contact upward are transferred load to by pan feeding transporting arms 251
At one exchange area 31, since the first test transporting arms 253 are located at first exchange area 31, the first test transporting arms 253
On first hold seat 2531 and can carry the measured electronic elements 40 from pan feeding transporting arms 251 from lower section, and make electronics to be measured member
Part 40 keeps the direction of electrical contact upward.
Fig. 8, Fig. 9 are please referred to, then measured electronic elements 40 are transferred load to test section 30 by the first test transporting arms 253, and
Jacking is electrically connected measured electronic elements 40 in a manner of upward with the probe 232 of test device 23 by electrical contact and executes survey
Study industry.While measured electronic elements 40 are transferred load to test section 30 by the first test transporting arms 253, pan feeding transporting arms 251
It will be moved to again at feeding device 21, draw next batch electrical contact measured electronic elements 40 upward from top, and position
The second test transporting arms 254 in the second exchange area 32 can be then moved at the first exchange area 31, be carried by pan feeding transporting arms 251
The measured electronic elements 40 of the next batch electrical contact of transfer upward.
Figure 10, Figure 11 are please referred to, after the electronic component 40 in the first test transporting arms 253 completes test survey, the first test
Transporting arms 253 can transfer load to complete survey electronic component 40 at second exchange area 32, and the transporting arms 252 that discharge then are moved to the second friendship
It changes at area 32, and draws the complete survey electronic component 40 in the first test transporting arms 253 from top.At the same time, the second test moves
Load arm 254 is after carrying the measured electronic elements 40 of next batch electrical contact upward, it will transfers load to test section 30, and jacks
The measured electronic elements 40 of the batch are made with the probe 232 of test device 23 to be electrically connected and hold in a manner of upward by electrical contact
Row test jobs.
Figure 12 is please referred to, the exchange of complete survey electronic component 40 is transferred load to material collecting device 22 by the transporting arms 252 that then discharge, and is held
Row sorting operations.At the same time, the first test transporting arms 253 positioned at the second exchange area 32 can then be moved to the first exchange area 31
Place, carrying next batch electrical contact measured electronic elements 40 upward, and then with the second test transporting arms 254 alternately in the
Transfer electronic component between one exchange area 31, test section 30 and the second exchange area 32.
Please refer to Figure 13, the testing classification equipment of second embodiment of the invention, in the feeding device configured on board 20
21, material collecting device 22, test device 23, blank panel device 24, alignment device 26, the pan feeding transporting arms 251 of conveying device 25 and go out
Material 252 system of transporting arms is identical to first embodiment, therefore it will not go into details.The testing classification equipment difference of second embodiment is this
The first exchange area 31 and the second exchange area 32 of board 20 are respectively arranged below the first side-lower and second side of test section 30, and
Third exchange area 33 and the 4th exchange area 34 are respectively equipped with above the first upper side and second side of the test section 30, and this is defeated
It send the first of device 25 to test 253 system of transporting arms and makees the axial movement of X-Y-Z tri- in the first exchange area 31, test section 30 and the second friendship
Change between area 32, the conveying device 25 second test transporting arms 254 then make X-Y-Z tri- axial movement in third exchange area 33,
Between test section 30 and the 4th exchange area 34, with alternate transfer electronic component.
Please refer to Figure 14, the testing classification equipment of second embodiment of the invention its when starting actuation, the first test transfer
Arm 253 and the second test transporting arms 254 are located at the first exchange area 31 and the 4th exchange area 34, and pan feeding transporting arms 251 are then
The measured electronic elements 40 of electrical contact upward are drawn from top at feeding device 21.
Figure 15, Figure 16 are please referred to, then pan feeding transporting arms 251 transfer load to the measured electronic elements 40 of electrical contact upward
At the accommodating hole 261 of alignment device 26, and to keep in the state of adsorbing measured electronic elements, pushed up by each pusher shoe 262 is unilateral
Measured electronic elements 40 are pushed away, move against each measured electronic elements 40 in the other side of each accommodating hole 261, and make each electricity to be measured
40 accurate contraposition of subcomponent picks and places on suction nozzle 2511 in the first of pan feeding transporting arms 251.
Figure 17, Figure 18 are please referred to, then pan feeding transporting arms 251 transfer load to the measured electronic elements 40 of electrical contact upward
At first exchange area 31, since the first test transporting arms 253 are located at first exchange area 31, the first test transporting arms
First on 253, which holds seat 2531, to carry the measured electronic elements 40 from pan feeding transporting arms 251 from lower section, and makes electronics to be measured
Element 40 keeps the direction of electrical contact upward.
Figure 19, Figure 20 are please referred to, then measured electronic elements 40 are transferred load to test section 30 by the first test transporting arms 253,
And jack make measured electronic elements 40 by electrical contact upward in a manner of with the electric connection of the probe 232 of test device 23 and execute
Test jobs.While measured electronic elements 40 are transferred load to test section 30 by the first test transporting arms 253, pan feeding transporting arms
251 will be moved to again at feeding device 21, draw the measured electronic elements 40 of next batch electrical contact upward from top, and
The second test transporting arms 254 positioned at the 4th exchange area 34 can be then moved at third exchange area 33, be carried by pan feeding transporting arms
251 transfers simultaneously complete the measured electronic elements 40 of the next batch electrical contact of contraposition upward.
Figure 21, Figure 22 are please referred to, after the electronic component 40 in the first test transporting arms 253 completes test survey, the first test
Transporting arms 253 can transfer load to complete survey electronic component 40 at second exchange area 32, and the transporting arms 252 that discharge then are moved to the second friendship
It changes at area 32, and draws the complete survey electronic component 40 in the first test transporting arms 253 from top.At the same time, the second test moves
After load arm 254 carries the measured electronic elements 40 of next batch electrical contact upward at third exchange area 33, it will transfer load to
Test section 30, and jack make the measured electronic elements 40 of the batch by electrical contact upward in a manner of with the probe of test device 23
232 are electrically connected and execute test jobs.
Figure 23 is please referred to, the exchange of complete survey electronic component 40 is transferred load to material collecting device 22 by the transporting arms 252 that then discharge, and is held
Row sorting operations.At the same time, the first test transporting arms 253 positioned at the second exchange area 32 can then be moved to the first exchange area 31
Place, carrying is by 251 transfer of pan feeding transporting arms and completes the measured electronic elements 40 of the next batch electrical contact of contraposition upward.
Figure 24, Figure 25 are please referred to, after the electronic component 40 in the second test transporting arms 254, which completes test, to be surveyed, second is surveyed
Examination transporting arms 254 can transfer load to complete survey electronic component 40 at the 4th exchange area 34, and the transporting arms 252 that discharge then are moved to the 4th
At exchange area 34, and the complete survey electronic component 40 in the second test transporting arms 254 is drawn from top.At the same time, the first test
Transporting arms 253 will transfer load to test section 30, and jacking makes side of the measured electronic elements 40 of the batch with electrical contact upward
The probe 232 of formula and test device 23 is electrically connected and executes test jobs, and then alternately moves with the second test transporting arms 254
Carry electronic component.
To sum up illustrate, the present invention can be not necessary to be arranged in the way of the transfer upward of electronic component electrical contact and test
The pan feeding microscope carrier and discharging microscope carrier of effect of transferring to are provided, and then can effectively be simplified the internal structure of an organization and transport path, and simplify exchange transfer
Number and reduction exchange transfer time, reach be effectively reduced equipment cost and promoted tested productivity Practical Benefit.
Claims (6)
1. a kind of electronic components test sorting device, which is characterized in that include:
Board: being equipped with test section and a plurality of exchange areas, and the first side-lower and second side of the test section are respectively arranged below with the
The first upper side and second side top of one exchange area and the second exchange area, the test section are respectively equipped with third exchange area and the 4th
Exchange area；
Feeding device: it is set on the board, accommodates the measured electronic elements of a plurality of electrical contacts upward；
Material collecting device: being set on the board, accommodates a plurality of different grades of complete survey electronic components；
Test device: being set up in the top of the test section of the board, and be equipped with test board and probe, with to electrical contact upward
Electronic component executes test jobs；
Conveying device: being set on the board, which is equipped with an at least pan feeding transporting arms, at least one discharging transporting arms, the
One test transporting arms and the second test transporting arms, the pan feeding transporting arms from the top at the feeding device by electrical contact upward
Measured electronic elements transfer load to first exchange area and the third exchange area, which is displaced into the of the board
Between one exchange area, test section and the second exchange area, which is then displaced into the third exchange area of the board, surveys
It tries between area and the 4th exchange area, the first test transporting arms and the second test transporting arms carry measured electronic elements from lower section,
And the measured electronic elements are executed into test jobs in a manner of upward by electrical contact, the discharging transporting arms are respectively from the second exchange
The complete survey electronic component is transferred load to the material collecting device and executes sorting operations by area and the 4th exchange area.
2. electronic components test sorting device according to claim 1, which is characterized in that the pan feeding transfer of the conveying device
Arm is equipped at least one first and picks and places suction nozzle, which simultaneously makees the axial movement of X-Y-Z tri-, by the measured electronic elements transfer
To first exchange area.
3. electronic components test sorting device according to claim 1, which is characterized in that the discharging transfer of the conveying device
Arm is equipped at least one second and picks and places suction nozzle, which simultaneously makees the axial movement of X-Y-Z tri-, from the top of second exchange area
The complete survey electronic component is transferred load into the material collecting device.
4. electronic components test sorting device according to claim 1, which is characterized in that the conveying device be equipped with this
One test transporting arms and the second test transporting arms are respectively equipped at least one pick-and-place suction nozzle or hold seat.
5. electronic components test sorting device according to claim 1, which is characterized in that the board is filled equipped with blank panel
It sets, the blank panel device and to move disk device transfer empty tray.
6. electronic components test sorting device according to claim 1, which is characterized in that the board is equipped with contraposition dress
It sets, which is equipped with a plurality of accommodating holes, pusher shoe is equipped in the side of each accommodating hole, in the pan feeding transporting arms
Measured electronic elements contraposition.
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| CN108996179A (en) * | 2017-06-07 | 2018-12-14 | 鸿劲精密股份有限公司 | The flattening mechanism of electronic component carrier and its job class equipment of application |
| CN107639043B (en) * | 2017-09-26 | 2020-06-09 | 武汉华星光电技术有限公司 | Panel classification moves and carries device |
| CN108480238A (en) * | 2018-05-18 | 2018-09-04 | 广州立杏科技有限公司 | A kind of energy-efficient coronary artery bypass surgery medical sterilizing equipment |
| KR102653937B1 (en) * | 2018-07-17 | 2024-04-02 | 삼성전자주식회사 | Test method for semiconductor devices and test system for semiconductor devices |
| CN108873666A (en) * | 2018-07-28 | 2018-11-23 | 江西省东龙实业股份有限公司 | A kind of detection timepiece movement current tester |
| CN113493114A (en) * | 2020-04-01 | 2021-10-12 | 百尼尔机械股份有限公司 | Taking and placing device for testing high-frequency electronic element |
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| CN1464312A (en) * | 2002-06-07 | 2003-12-31 | 达司克科技股份有限公司 | Machine allocation of IC test processor and process for making the same |
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| CN101308707B (en) * | 2007-05-15 | 2011-04-06 | 鸿劲科技股份有限公司 | Sorting machine for memory IC detection |
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| CN102189082B (en) * | 2010-03-10 | 2013-06-26 | 鸿劲科技股份有限公司 | Electronic component test classifier |
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| CN101412027A (en) * | 2007-10-16 | 2009-04-22 | 鸿劲科技股份有限公司 | Automatic testing and sorting machine for wafer |
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