TW200643420A - Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus - Google Patents
Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatusInfo
- Publication number
- TW200643420A TW200643420A TW095119127A TW95119127A TW200643420A TW 200643420 A TW200643420 A TW 200643420A TW 095119127 A TW095119127 A TW 095119127A TW 95119127 A TW95119127 A TW 95119127A TW 200643420 A TW200643420 A TW 200643420A
- Authority
- TW
- Taiwan
- Prior art keywords
- display panel
- inspecting apparatus
- inspecting
- rotation
- turntable
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optics & Photonics (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
A rotation-type display panel inspecting apparatus includes a turntable rotatably mounted on a base and inspection units mounted on the turntable for inspecting display panels. The turntable rotates at regular angles, and the inspection units are installed on a rotation axis of the turntable at the respective regular angles, According to the inspecting apparatus, display panels are successively inspected to enhance a yield.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050047333A KR100732344B1 (en) | 2005-06-02 | 2005-06-02 | Rotation inspecting apparatus of flat panel display |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200643420A true TW200643420A (en) | 2006-12-16 |
TWI295731B TWI295731B (en) | 2008-04-11 |
Family
ID=37484204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095119127A TWI295731B (en) | 2005-06-02 | 2006-05-30 | Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4388035B2 (en) |
KR (1) | KR100732344B1 (en) |
CN (1) | CN100498888C (en) |
TW (1) | TWI295731B (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101169528B (en) * | 2007-11-28 | 2010-06-09 | 庄添财 | Liquid crystal display screen on-line manufacture process and its apparatus |
CN101320145B (en) * | 2008-07-21 | 2010-06-16 | 友达光电股份有限公司 | Panel sampling inspection device and method |
US8432540B2 (en) * | 2010-03-31 | 2013-04-30 | Cooper S.K. Kuo | Support mechanism for inspection systems |
KR101126687B1 (en) | 2011-12-21 | 2012-03-29 | 한동희 | Inspecting apparatus of pannel for display |
CN103149515B (en) * | 2013-03-05 | 2015-08-19 | 清华大学 | A kind of for the space charge measurement device in dielectric long-term ageing process |
CN103196656B (en) * | 2013-03-13 | 2016-03-02 | 广东威创视讯科技股份有限公司 | A kind of projector test platform |
KR101362330B1 (en) * | 2013-08-21 | 2014-02-12 | 한동희 | Inspecting apparatus of pannel for display |
JP6229510B2 (en) * | 2014-01-24 | 2017-11-15 | 株式会社豊田自動織機 | Aging equipment |
CN104700758B (en) * | 2015-01-28 | 2017-12-01 | 北京欣奕华科技有限公司 | A kind of flicker value writing machine |
CN104637427B (en) * | 2015-03-12 | 2017-05-24 | 合肥京东方光电科技有限公司 | Detection jig |
CN106526922B (en) * | 2017-01-04 | 2019-12-06 | 京东方科技集团股份有限公司 | Substrate repairing method and device, pressing mechanism and substrate repairing equipment |
CN107797317A (en) * | 2017-12-04 | 2018-03-13 | 苏州广林达电子科技有限公司 | A kind of a pair ten of aging dedicated platform |
JP2019158442A (en) * | 2018-03-09 | 2019-09-19 | シャープ株式会社 | Display panel inspection system and display panel inspection method |
CN109533822B (en) * | 2018-11-22 | 2020-04-07 | 苏州精濑光电有限公司 | Panel detection method |
KR101996937B1 (en) | 2019-02-01 | 2019-07-05 | (주)제이스텍 | Logistics for display panel inspection machine |
CN110988558B (en) * | 2019-12-20 | 2022-06-07 | 京东方科技集团股份有限公司 | Touch screen testing system and method |
CN113851065B (en) * | 2020-06-09 | 2023-08-22 | 华为技术有限公司 | Display panel testing device and display panel testing box |
CN112908175B (en) * | 2021-02-03 | 2022-07-12 | 武汉华星光电半导体显示技术有限公司 | Flexible display device can curl |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990026542A (en) * | 1997-09-25 | 1999-04-15 | 왕중일 | Chip inspection device |
JP2000147045A (en) | 1998-11-05 | 2000-05-26 | Kyoei Sangyo Kk | Inspection device for printed wiring board |
JP2000321545A (en) | 1999-03-05 | 2000-11-24 | Ricoh Co Ltd | Liquid crystal panel inspection apparatus |
JP2002277502A (en) | 2001-01-12 | 2002-09-25 | Nidec-Read Corp | Substrate inspection device and substrate inspection method |
KR100358322B1 (en) * | 2001-02-12 | 2002-10-25 | 주식회사 디이엔티 | Handler for testing LCD |
-
2005
- 2005-06-02 KR KR1020050047333A patent/KR100732344B1/en not_active IP Right Cessation
-
2006
- 2006-05-26 JP JP2006147195A patent/JP4388035B2/en active Active
- 2006-05-30 CN CNB2006100784762A patent/CN100498888C/en not_active Expired - Fee Related
- 2006-05-30 TW TW095119127A patent/TWI295731B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR20060125336A (en) | 2006-12-06 |
CN100498888C (en) | 2009-06-10 |
JP4388035B2 (en) | 2009-12-24 |
KR100732344B1 (en) | 2007-06-27 |
TWI295731B (en) | 2008-04-11 |
JP2006338009A (en) | 2006-12-14 |
CN1873744A (en) | 2006-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |