TW200643420A - Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus - Google Patents

Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus

Info

Publication number
TW200643420A
TW200643420A TW095119127A TW95119127A TW200643420A TW 200643420 A TW200643420 A TW 200643420A TW 095119127 A TW095119127 A TW 095119127A TW 95119127 A TW95119127 A TW 95119127A TW 200643420 A TW200643420 A TW 200643420A
Authority
TW
Taiwan
Prior art keywords
display panel
inspecting apparatus
inspecting
rotation
turntable
Prior art date
Application number
TW095119127A
Other languages
Chinese (zh)
Other versions
TWI295731B (en
Inventor
Yun-Kwang Cheon
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200643420A publication Critical patent/TW200643420A/en
Application granted granted Critical
Publication of TWI295731B publication Critical patent/TWI295731B/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

A rotation-type display panel inspecting apparatus includes a turntable rotatably mounted on a base and inspection units mounted on the turntable for inspecting display panels. The turntable rotates at regular angles, and the inspection units are installed on a rotation axis of the turntable at the respective regular angles, According to the inspecting apparatus, display panels are successively inspected to enhance a yield.
TW095119127A 2005-06-02 2006-05-30 Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus TWI295731B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050047333A KR100732344B1 (en) 2005-06-02 2005-06-02 Rotation inspecting apparatus of flat panel display

Publications (2)

Publication Number Publication Date
TW200643420A true TW200643420A (en) 2006-12-16
TWI295731B TWI295731B (en) 2008-04-11

Family

ID=37484204

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119127A TWI295731B (en) 2005-06-02 2006-05-30 Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus

Country Status (4)

Country Link
JP (1) JP4388035B2 (en)
KR (1) KR100732344B1 (en)
CN (1) CN100498888C (en)
TW (1) TWI295731B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169528B (en) * 2007-11-28 2010-06-09 庄添财 Liquid crystal display screen on-line manufacture process and its apparatus
CN101320145B (en) * 2008-07-21 2010-06-16 友达光电股份有限公司 Panel sampling inspection device and method
US8432540B2 (en) * 2010-03-31 2013-04-30 Cooper S.K. Kuo Support mechanism for inspection systems
KR101126687B1 (en) 2011-12-21 2012-03-29 한동희 Inspecting apparatus of pannel for display
CN103149515B (en) * 2013-03-05 2015-08-19 清华大学 A kind of for the space charge measurement device in dielectric long-term ageing process
CN103196656B (en) * 2013-03-13 2016-03-02 广东威创视讯科技股份有限公司 A kind of projector test platform
KR101362330B1 (en) * 2013-08-21 2014-02-12 한동희 Inspecting apparatus of pannel for display
JP6229510B2 (en) * 2014-01-24 2017-11-15 株式会社豊田自動織機 Aging equipment
CN104700758B (en) * 2015-01-28 2017-12-01 北京欣奕华科技有限公司 A kind of flicker value writing machine
CN104637427B (en) * 2015-03-12 2017-05-24 合肥京东方光电科技有限公司 Detection jig
CN106526922B (en) * 2017-01-04 2019-12-06 京东方科技集团股份有限公司 Substrate repairing method and device, pressing mechanism and substrate repairing equipment
CN107797317A (en) * 2017-12-04 2018-03-13 苏州广林达电子科技有限公司 A kind of a pair ten of aging dedicated platform
JP2019158442A (en) * 2018-03-09 2019-09-19 シャープ株式会社 Display panel inspection system and display panel inspection method
CN109533822B (en) * 2018-11-22 2020-04-07 苏州精濑光电有限公司 Panel detection method
KR101996937B1 (en) 2019-02-01 2019-07-05 (주)제이스텍 Logistics for display panel inspection machine
CN110988558B (en) * 2019-12-20 2022-06-07 京东方科技集团股份有限公司 Touch screen testing system and method
CN113851065B (en) * 2020-06-09 2023-08-22 华为技术有限公司 Display panel testing device and display panel testing box
CN112908175B (en) * 2021-02-03 2022-07-12 武汉华星光电半导体显示技术有限公司 Flexible display device can curl

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990026542A (en) * 1997-09-25 1999-04-15 왕중일 Chip inspection device
JP2000147045A (en) 1998-11-05 2000-05-26 Kyoei Sangyo Kk Inspection device for printed wiring board
JP2000321545A (en) 1999-03-05 2000-11-24 Ricoh Co Ltd Liquid crystal panel inspection apparatus
JP2002277502A (en) 2001-01-12 2002-09-25 Nidec-Read Corp Substrate inspection device and substrate inspection method
KR100358322B1 (en) * 2001-02-12 2002-10-25 주식회사 디이엔티 Handler for testing LCD

Also Published As

Publication number Publication date
KR20060125336A (en) 2006-12-06
CN100498888C (en) 2009-06-10
JP4388035B2 (en) 2009-12-24
KR100732344B1 (en) 2007-06-27
TWI295731B (en) 2008-04-11
JP2006338009A (en) 2006-12-14
CN1873744A (en) 2006-12-06

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees