TW200511502A - Protection circuit for semiconductor device and semiconductor device including the same - Google Patents

Protection circuit for semiconductor device and semiconductor device including the same

Info

Publication number
TW200511502A
TW200511502A TW093124046A TW93124046A TW200511502A TW 200511502 A TW200511502 A TW 200511502A TW 093124046 A TW093124046 A TW 093124046A TW 93124046 A TW93124046 A TW 93124046A TW 200511502 A TW200511502 A TW 200511502A
Authority
TW
Taiwan
Prior art keywords
semiconductor device
shielded line
signal
protection circuit
start point
Prior art date
Application number
TW093124046A
Other languages
English (en)
Inventor
Noriaki Matsuno
Original Assignee
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Ind Co Ltd filed Critical Matsushita Electric Ind Co Ltd
Publication of TW200511502A publication Critical patent/TW200511502A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/86—Secure or tamper-resistant housings
    • G06F21/87—Secure or tamper-resistant housings by means of encapsulation, e.g. for integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Security & Cryptography (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Storage Device Security (AREA)
TW093124046A 2003-08-28 2004-08-11 Protection circuit for semiconductor device and semiconductor device including the same TW200511502A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003303823A JP4748929B2 (ja) 2003-08-28 2003-08-28 保護回路および半導体装置

Publications (1)

Publication Number Publication Date
TW200511502A true TW200511502A (en) 2005-03-16

Family

ID=34214010

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093124046A TW200511502A (en) 2003-08-28 2004-08-11 Protection circuit for semiconductor device and semiconductor device including the same

Country Status (6)

Country Link
US (2) US7256599B2 (zh)
EP (1) EP1670059A4 (zh)
JP (1) JP4748929B2 (zh)
CN (2) CN101330074B (zh)
TW (1) TW200511502A (zh)
WO (1) WO2005022635A1 (zh)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006228910A (ja) * 2005-02-16 2006-08-31 Matsushita Electric Ind Co Ltd 半導体装置
US8099783B2 (en) 2005-05-06 2012-01-17 Atmel Corporation Security method for data protection
JP4749160B2 (ja) * 2006-01-18 2011-08-17 シャープ株式会社 集積回路
EP1984871A2 (en) * 2006-02-09 2008-10-29 Nxp B.V. Circuit arrangement, data processing device comprising such circuit arrangement as well as method for identifying an attack on such circuit arrangement
US7535242B2 (en) * 2006-05-03 2009-05-19 Rambus Inc. Interface test circuit
DE102006027682B3 (de) * 2006-06-14 2008-01-31 Infineon Technologies Ag Integrierte Schaltungsanordnung und Verfahren zum Betreiben einer integrierten Schaltungsanordnung
KR100815177B1 (ko) 2006-07-20 2008-03-19 주식회사 하이닉스반도체 반도체 장치
KR101299602B1 (ko) 2007-03-27 2013-08-26 삼성전자주식회사 리버스 엔지니어링을 보호하는 집적회로
KR101185371B1 (ko) * 2007-09-13 2012-09-25 브로드콤 코포레이션 메쉬 그리드 보호 시스템 및 방법
WO2009037758A1 (ja) * 2007-09-19 2009-03-26 Fujitsu Limited 電源装置および電子機器
US8502396B2 (en) 2007-12-06 2013-08-06 Broadcom Corporation Embedded package security tamper mesh
FR2935078B1 (fr) * 2008-08-12 2012-11-16 Groupe Des Ecoles De Telecommunications Get Ecole Nationale Superieure Des Telecommunications Enst Procede de protection du decryptage des fichiers de configuration de circuits logiques programmables et circuit mettant en oeuvre le procede
EP2211289A1 (en) * 2009-01-22 2010-07-28 Robert Bosch GmbH Method and control device for protecting a sensor against manipulation
JP5460251B2 (ja) * 2009-11-13 2014-04-02 株式会社日立製作所 情報処理装置
US20110255253A1 (en) * 2010-04-17 2011-10-20 Andrew Campbell Protective serpentine track for card payment terminal
JP2012053788A (ja) * 2010-09-02 2012-03-15 Canon Inc 半導体集積回路装置
JP2012074674A (ja) * 2010-09-02 2012-04-12 Canon Inc 半導体集積回路装置
JP5761947B2 (ja) 2010-09-02 2015-08-12 キヤノン株式会社 半導体集積回路装置
US8779787B2 (en) * 2011-11-16 2014-07-15 Arm Limited Apparatus and method for determining variation in a predetermined physical property of a circuit
US8776260B2 (en) 2012-09-25 2014-07-08 Broadcom Corporation Mesh grid protection system
CN202855734U (zh) * 2012-10-23 2013-04-03 北京同方微电子有限公司 用于智能卡的有源防护装置
FR2998684B1 (fr) * 2012-11-28 2014-11-21 Soitec Solar Gmbh Controle d'un dispositif traqueur solaire
DE102013205729A1 (de) 2013-03-28 2014-10-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren mit einem Träger mit Schaltungsstrukturen
US20160253524A1 (en) * 2013-07-16 2016-09-01 Mitsubishi Electric Corporation Semiconductor device
JP6340935B2 (ja) * 2014-06-16 2018-06-13 大日本印刷株式会社 Ｉｃチップ、異常検知処理方法、及びプログラム
US10669668B2 (en) 2017-11-28 2020-06-02 Mark Goodson Clothes dryer fire reduction system
US10839109B2 (en) * 2018-11-14 2020-11-17 Massachusetts Institute Of Technology Integrated circuit (IC) portholes and related techniques
CN112005249A (zh) * 2019-03-05 2020-11-27 华为技术有限公司 一种用于裸片保护的电路、裸片及集成电路
DE102021111472A1 (de) 2021-05-04 2022-11-10 Markus Geiger Manipulationssichere Vorrichtung zum Schutz eines elektronischen Speicherelements gegen Auslesen
US11877390B2 (en) 2021-08-30 2024-01-16 International Business Machines Corporation Fabricating tamper-respondent sensors with random three-dimensional security patterns
CN115513145B (zh) * 2022-11-17 2023-03-10 灿芯半导体(上海)股份有限公司 一种防窥探，防篡改，低功耗屏蔽罩

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58209136A (ja) * 1982-05-31 1983-12-06 Toshiba Corp 自己試験機能を有する集積回路
JP3048429B2 (ja) 1991-08-14 2000-06-05 株式会社東芝 半導体集積回路装置
JPH05167020A (ja) * 1991-12-13 1993-07-02 Nec Ibaraki Ltd 半導体理論集積回路
US5389738A (en) 1992-05-04 1995-02-14 Motorola, Inc. Tamperproof arrangement for an integrated circuit device
US5675645A (en) 1995-04-18 1997-10-07 Ricoh Company, Ltd. Method and apparatus for securing executable programs against copying
FR2740553B1 (fr) * 1995-10-26 1997-12-05 Sgs Thomson Microelectronics Procede de detection de presence de passivation dans un circuit integre
US5796682A (en) * 1995-10-30 1998-08-18 Motorola, Inc. Method for measuring time and structure therefor
JP3037191B2 (ja) 1997-04-22 2000-04-24 日本電気アイシーマイコンシステム株式会社 半導体装置
KR100710936B1 (ko) * 1998-11-05 2007-04-24 인피니언 테크놀로지스 아게 집적 회로용 보호 회로
JP3524450B2 (ja) * 1999-11-09 2004-05-10 キヤノン株式会社 集積回路およびその評価方法
JP3735835B2 (ja) * 1999-11-12 2006-01-18 株式会社山武 集積回路装置および校正方法
JP2001166009A (ja) * 1999-12-14 2001-06-22 Matsushita Electric Ind Co Ltd 診断機能を有する半導体集積回路
JP2001177064A (ja) * 1999-12-17 2001-06-29 Hitachi Ltd 診断回路及び半導体集積回路
JP2001244414A (ja) * 2000-02-29 2001-09-07 Nippon Telegr & Teleph Corp <Ntt> 半導体集積回路
DE10101330A1 (de) 2001-01-13 2002-07-18 Philips Corp Intellectual Pty Elektrische oder elektronische Schaltungsanordnung und Verfahren zum Schützen der selben von Manipulation und/oder Missbrauch
US7065656B2 (en) * 2001-07-03 2006-06-20 Hewlett-Packard Development Company, L.P. Tamper-evident/tamper-resistant electronic components
JPWO2003015169A1 (ja) * 2001-08-07 2004-12-02 株式会社ルネサステクノロジ 半導体装置およびｉｃカード
JP2003296680A (ja) * 2002-03-29 2003-10-17 Hitachi Ltd データ処理装置
US7005874B2 (en) * 2004-06-28 2006-02-28 International Business Machines Corporation Utilizing clock shield as defect monitor

Also Published As

Publication number Publication date
JP4748929B2 (ja) 2011-08-17
CN1839475A (zh) 2006-09-27
EP1670059A4 (en) 2010-06-09
US20070257683A1 (en) 2007-11-08
CN101330074A (zh) 2008-12-24
EP1670059A1 (en) 2006-06-14
US7256599B2 (en) 2007-08-14
JP2005072514A (ja) 2005-03-17
WO2005022635A1 (ja) 2005-03-10
US20050047047A1 (en) 2005-03-03
CN100511681C (zh) 2009-07-08
CN101330074B (zh) 2010-09-01
US7345497B2 (en) 2008-03-18

Similar Documents

Publication Publication Date Title
TW200511502A (en) Protection circuit for semiconductor device and semiconductor device including the same
TW200701585A (en) Apparatus and method of protecting battery packs
FR2870350B1 (fr) Dispositif de mesure d&#39;un courant electrique, capteur de courant, declencheur electrique et dispositif de coupure comportant un tel dispositif de mesure
WO2008046053A8 (en) Current limit detector
WO2007047860A3 (en) Method of detecting faults using graduated fault detection levels
NO20004051L (no) Festeanordning for en elektronisk pakke for dekk
ATE448009T1 (de) Schlagkraftmesseinrichtung
WO2007085711A3 (fr) Dispositif de mesure de courant continu a forte dynamique de mesure, declencheur electronique comportant un tel dispositif de mesure et dispositif de coupure ayant un tel declencheur
NO20006585D0 (no) Posisjonsfinner, måleapparat med posisjonsfinner samt målesystem
DE69926341D1 (de) Magnetoelektrischer Vorrichtung
WO2008005709A3 (en) Over voltage protection circuit for gfci devices
DE69402350T3 (de) Messschaltung für Widerstandssensor, insbesondere Krafstoffmesser
DE50206010D1 (de) Messvorrichtung zum berührungslosen Erfassen von Schwingungen eines Objektes
GB2464771B (en) Low voltage protection
DE50100651D1 (de) Schutzvorrichtung für einen elektrischen verbraucher
DE69943293D1 (de) Fehlerschutzgerät
IL152281A0 (en) Device and method for measuring magnetic field(s) with calibration superimposed on the measurement, and corresponding uses
WO2007043015A3 (en) Improved proximity detection method
DE112006004123A5 (de) Differentialschutzverfahren und Differentialschutzeinrichtung
DE60235323D1 (de) Rs mit niedriger genauigkeit über einem kommunikationsbus
DE19983048T1 (de) Schutzvorrichtung für Meßgerät
WO2007082855A3 (de) Messgerät mit signaleinheit
DK1666406T3 (da) Tyverisikringsanordning
DE50003272D1 (de) Wegmessvorrichtung
ATE454079T1 (de) Verfahren zur überprüfung der elektrischen sicherheit eines haushaltsgeräts und entsprechendes haushaltgerät