DE69926341D1 - Magnetoelektrischer Vorrichtung - Google Patents

Magnetoelektrischer Vorrichtung

Info

Publication number
DE69926341D1
DE69926341D1 DE69926341T DE69926341T DE69926341D1 DE 69926341 D1 DE69926341 D1 DE 69926341D1 DE 69926341 T DE69926341 T DE 69926341T DE 69926341 T DE69926341 T DE 69926341T DE 69926341 D1 DE69926341 D1 DE 69926341D1
Authority
DE
Germany
Prior art keywords
magnetoelectric device
magnetoelectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69926341T
Other languages
English (en)
Other versions
DE69926341T2 (de
Inventor
Kazuhito Tsukagoshi
Bruce W Alphenaar
Hiroshi Mizuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Europe Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Europe Ltd filed Critical Hitachi Europe Ltd
Publication of DE69926341D1 publication Critical patent/DE69926341D1/de
Application granted granted Critical
Publication of DE69926341T2 publication Critical patent/DE69926341T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/0036—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity
    • H01F1/0072—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity one dimensional, i.e. linear or dendritic nanostructures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00—Thin magnetic films, e.g. of one-domain structure
    • H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Hall/Mr Elements (AREA)
  • Magnetic Heads (AREA)
  • Thin Magnetic Films (AREA)
  • Measuring Magnetic Variables (AREA)
DE69926341T 1999-05-10 1999-05-10 Magnetoelektrischer Vorrichtung Expired - Lifetime DE69926341T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP99303615A EP1052520B1 (de) 1999-05-10 1999-05-10 Magnetoelektrischer Vorrichtung

Publications (2)

Publication Number Publication Date
DE69926341D1 true DE69926341D1 (de) 2005-09-01
DE69926341T2 DE69926341T2 (de) 2006-01-12

Family

ID=8241372

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69926341T Expired - Lifetime DE69926341T2 (de) 1999-05-10 1999-05-10 Magnetoelektrischer Vorrichtung

Country Status (4)

Country Link
EP (1) EP1052520B1 (de)
JP (1) JP2000323767A (de)
DE (1) DE69926341T2 (de)
ES (1) ES2245498T3 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002063693A1 (fr) * 2001-02-08 2002-08-15 Hitachi, Ltd. Dispositif electronique et source d'electronsavec nanotube de carbone
DE10133373A1 (de) * 2001-07-10 2003-01-30 Infineon Technologies Ag Magnetische Speichereinheit und magnetisches Speicherarray
US6643165B2 (en) 2001-07-25 2003-11-04 Nantero, Inc. Electromechanical memory having cell selection circuitry constructed with nanotube technology
US6574130B2 (en) 2001-07-25 2003-06-03 Nantero, Inc. Hybrid circuit having nanotube electromechanical memory
US6706402B2 (en) 2001-07-25 2004-03-16 Nantero, Inc. Nanotube films and articles
US6835591B2 (en) 2001-07-25 2004-12-28 Nantero, Inc. Methods of nanotube films and articles
US6781801B2 (en) * 2001-08-10 2004-08-24 Seagate Technology Llc Tunneling magnetoresistive sensor with spin polarized current injection
JP2003142755A (ja) * 2001-11-05 2003-05-16 Fujitsu Ltd 磁気抵抗センサ及びその製造方法
US6784028B2 (en) 2001-12-28 2004-08-31 Nantero, Inc. Methods of making electromechanical three-trace junction devices
JP2004146821A (ja) * 2002-10-03 2004-05-20 Sony Corp メモリ素子およびメモリ装置
JP4966483B2 (ja) * 2003-06-25 2012-07-04 パナソニック株式会社 磁気抵抗効果素子、および磁気抵抗効果素子を用いた磁気ヘッド、記録再生装置、メモリ素子、メモリアレイ、および磁気抵抗効果素子の製造方法
WO2005085890A2 (en) * 2004-03-01 2005-09-15 Cambridge University Technical Services Limited Magnetoresistive magnetic field sensor
JP2007531278A (ja) * 2004-03-22 2007-11-01 ジ・オハイオ・ステート・ユニバーシティ カーボンナノチューブアレイをベースとするスペーサー層を有するスピントロニックデバイス及び該デバイスの製造方法
ITTO20050758A1 (it) * 2005-10-26 2007-04-27 Fiat Ricerche Dispositivo di rilevazione di grandezze fisiche in particolare un campo magnetico a film sottile e relativo procedimento di rilevazione
EP1830410A1 (de) * 2006-02-24 2007-09-05 Hitachi, Ltd. Ein-Electron Tunnelbauelement
JP5119436B2 (ja) * 2006-12-28 2013-01-16 国立大学法人大阪大学 不揮発性メモリセルおよびその製造方法、抵抗可変型不揮発性メモリ装置、並びに不揮発性メモリセルの設計方法
JP5251281B2 (ja) 2008-06-11 2013-07-31 Ｔｄｋ株式会社 磁気センサー
JP5157676B2 (ja) * 2008-06-25 2013-03-06 Ｔｄｋ株式会社 磁気センサー
US7863700B2 (en) * 2008-06-30 2011-01-04 Qimonda Ag Magnetoresistive sensor with tunnel barrier and method
US7902616B2 (en) 2008-06-30 2011-03-08 Qimonda Ag Integrated circuit having a magnetic tunnel junction device and method
JP2010020826A (ja) 2008-07-09 2010-01-28 Tdk Corp 磁気センサー
US8000065B2 (en) 2009-01-28 2011-08-16 Tdk Corporation Magnetoresistive element and thin-film magnetic head
JP5144569B2 (ja) * 2009-03-24 2013-02-13 株式会社東芝 スピントランジスタ及び論理回路装置
JP2011018415A (ja) * 2009-07-10 2011-01-27 Tdk Corp 磁気センサ

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5390061A (en) * 1990-06-08 1995-02-14 Hitachi, Ltd. Multilayer magnetoresistance effect-type magnetic head
JP3217703B2 (ja) * 1995-09-01 2001-10-15 株式会社東芝 磁性体デバイス及びそれを用いた磁気センサ
JP2000504503A (ja) * 1996-12-02 2000-04-11 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 準２次元電子ガスを利用する横型磁電素子

Also Published As

Publication number Publication date
EP1052520B1 (de) 2005-07-27
EP1052520A1 (de) 2000-11-15
DE69926341T2 (de) 2006-01-12
ES2245498T3 (es) 2006-01-01
JP2000323767A (ja) 2000-11-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: HITACHI, LTD., TOKYO, JP