SG11201908988TA - Reconfigurable laser stimulated lock-in thermography for micro-crack detection - Google Patents
Reconfigurable laser stimulated lock-in thermography for micro-crack detectionInfo
- Publication number
- SG11201908988TA SG11201908988TA SG11201908988TA SG11201908988TA SG 11201908988T A SG11201908988T A SG 11201908988TA SG 11201908988T A SG11201908988T A SG 11201908988TA SG 11201908988T A SG11201908988T A SG 11201908988TA
- Authority
- SG
- Singapore
- Prior art keywords
- sample
- crack
- scratch
- international
- hole
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
208 CHOPPER CONTROLLER r.12 FIG. 2 214 200 O kr) N GC 1-1 00 O 1-1 N O (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 04 October 2018 (04.10.2018) W I PO I PCT IiiimmomitiaotiolomonoionlloomomovoimIE (10) International Publication Number WO 2018/182530 Al (51) International Patent Classification: GO1N 25/72 (2006.01) (21) International Application Number: PCT/SG2018/050159 (22) International Filing Date: 29 March 2018 (29.03.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 10201702564S 29 March 2017 (29.03.2017) SG (71) Applicant: AGENCY FOR SCIENCE, TECHNOLO- GY AND RESEARCH [SG/SG]; 1 Fusionopolis Way, #20-10, Connexis North Tower, Singapore 138632 (SG). (72) Inventors: DING, Lu; c/o Institute of Materials Research and Engineering, 2 Fusionopolis Way, #08-03, Innovis, Singapore 138634 (SG). TENG, Jinghua; c/o Institute of Materials Research and Engineering, 2 Fusionopolis Way, #08-03, Innovis, Singapore 138634 (SG). (74) Agent: SPRUSON & FERGUSON (ASIA) PTE LTD; P.O. Box 1531, Robinson Road Post Office, Singapore 903031 (SG). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, (54) Title: RECONFIGURABLE LASER STIMULATED LOCK-IN THERMOGRAPHY FOR MICRO-CRACK DETECTION (57) : Systems and methods for laser stimulated lock-in thermography (LLT) crack detection are provided. The system includes a spatial light modulator and a controller. The spatial light modulator reflects a laser beam to focus the laser beam onto a sample for detection of a crack, hole or scratch. The controller is coupled to the spatial light modulator and controls operation of the spatial light modulator to switch focus of the laser beam onto the sample between a plurality of LLT focus configurations for detection of the crack, hole or scratch on the sample. The method includes using a first one of the plurality of LLT configurations for coarse scanning of the sample to detect a crack, hole or scratch on the sample and, when a crack, hole or scratch is detected on the sample, switching to a second one of the plurality of LLT configurations for fine scanning of the crack, hole or scratch on the sample to determine one or more parameters of the crack, hole or scratch on the sample. [Continued on next page] WO 2018/182530 Al MIDEDIMOMOIDEIREEM31110111011100110INVOIS SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Declarations under Rule 4.17: of inventorship (Rule 4.17 (iv)) Published: with international search report (Art. 21(3)) in black and white; the international application as filed contained color or greyscale and is available for download from PATENTSCOPE
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201702564S | 2017-03-29 | ||
PCT/SG2018/050159 WO2018182530A1 (en) | 2017-03-29 | 2018-03-29 | Reconfigurable laser stimulated lock-in thermography for micro-crack detection |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201908988TA true SG11201908988TA (en) | 2019-10-30 |
Family
ID=63676435
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201908988T SG11201908988TA (en) | 2017-03-29 | 2018-03-29 | Reconfigurable laser stimulated lock-in thermography for micro-crack detection |
Country Status (3)
Country | Link |
---|---|
US (2) | US11397158B2 (en) |
SG (1) | SG11201908988TA (en) |
WO (1) | WO2018182530A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110657747A (en) * | 2019-08-27 | 2020-01-07 | 中国十七冶集团有限公司 | Laser scanning type crack observation instrument and observation method thereof |
CN111323454B (en) * | 2020-03-06 | 2022-04-15 | 中国计量大学 | Method for detecting cracks through laser thermal imaging |
CN113447527B (en) * | 2021-06-11 | 2022-10-25 | 西安交通大学 | Dual-mode laser infrared thermal imaging detection system and method |
Family Cites Families (23)
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GB2273994A (en) * | 1992-12-18 | 1994-07-06 | Morphometrix Inc | Process microscopy system |
CA2126481C (en) | 1994-06-22 | 2001-03-27 | Andreas Mandelis | Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids |
US7427753B2 (en) * | 2005-06-16 | 2008-09-23 | Applied Materials, Israel, Ltd. | Method of cross-section milling with focused ion beam (FIB) device |
US7709794B2 (en) * | 2008-02-05 | 2010-05-04 | Kla-Tencor Corporation | Defect detection using time delay lock-in thermography (LIT) and dark field LIT |
JP5664549B2 (en) * | 2009-07-16 | 2015-02-04 | 日本電気株式会社 | Capture device, capture method, and capture program |
KR101908749B1 (en) * | 2010-12-16 | 2018-10-16 | 케이엘에이-텐코 코포레이션 | Wafer inspection |
KR101320358B1 (en) * | 2012-06-12 | 2013-10-23 | 한국과학기술원 | Laser lock-in thermography device for nondestructive evaluation |
DE102012107316B4 (en) * | 2012-08-09 | 2019-08-14 | Solarzentrum Stuttgart GmbH | Method and device for testing photovoltaic modules |
EP2840408B1 (en) * | 2013-08-23 | 2016-02-10 | DCG Systems, Inc. | LIT method for identifying hot spots at different depth localizations |
CN104422715B (en) | 2013-08-23 | 2017-03-15 | 南京诺威尔光电***有限公司 | Laser scanning thermal wave imaging method and device based on dynamic child window technology |
US9494468B2 (en) * | 2013-10-01 | 2016-11-15 | Infineon Technologies Ag | Method of examining a substrate and corresponding device |
US9500599B2 (en) * | 2014-01-23 | 2016-11-22 | Samsung Electronics Co., Ltd. | Surface inspection apparatus for semiconductor chips |
US9772297B2 (en) | 2014-02-12 | 2017-09-26 | Kla-Tencor Corporation | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection |
EP2952884B1 (en) * | 2014-06-04 | 2019-07-03 | DCG Systems GmbH | Method for examination of a sample by means of the lock-in thermography |
US9810650B2 (en) * | 2014-10-20 | 2017-11-07 | Andreas Mandelis | Systems and methods for performing truncated-correlation photothermal coherence tomography |
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ITUB20152385A1 (en) * | 2015-07-22 | 2017-01-22 | Alenia Aermacchi Spa | METHOD AND NON-DESTRUCTIVE THERMOGRAPHIC INSPECTION SYSTEM FOR DETECTION AND MEASUREMENT OF DEFECTIVE IN COMPOSITE MATERIAL STRUCTURES |
EP3394579B1 (en) * | 2015-12-21 | 2023-09-20 | Verily Life Sciences LLC | Systems and methods for determining an identity of a probe in a target based on colors and locations of two or more fluorophores in the probe and in the target |
CN106932437A (en) | 2015-12-31 | 2017-07-07 | 南京诺威尔光电***有限公司 | Laser scanning heat wave lock is mutually imaged System and method for |
US20170328990A1 (en) * | 2016-05-11 | 2017-11-16 | Texas Instruments Incorporated | Scalable field of view scanning in optical distance measurement systems |
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JP2018044881A (en) | 2016-09-15 | 2018-03-22 | 株式会社東芝 | Crack inspection apparatus and crack inspection method |
-
2018
- 2018-03-29 US US16/498,814 patent/US11397158B2/en active Active
- 2018-03-29 WO PCT/SG2018/050159 patent/WO2018182530A1/en active Application Filing
- 2018-03-29 SG SG11201908988T patent/SG11201908988TA/en unknown
-
2022
- 2022-06-16 US US17/842,391 patent/US11714055B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
WO2018182530A1 (en) | 2018-10-04 |
US11714055B2 (en) | 2023-08-01 |
US20220307999A1 (en) | 2022-09-29 |
US20200041432A1 (en) | 2020-02-06 |
US11397158B2 (en) | 2022-07-26 |
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